CN221303340U - Microwave probe seat - Google Patents

Microwave probe seat Download PDF

Info

Publication number
CN221303340U
CN221303340U CN202322753775.3U CN202322753775U CN221303340U CN 221303340 U CN221303340 U CN 221303340U CN 202322753775 U CN202322753775 U CN 202322753775U CN 221303340 U CN221303340 U CN 221303340U
Authority
CN
China
Prior art keywords
probe
microwave
base
fixed
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202322753775.3U
Other languages
Chinese (zh)
Inventor
韩雄
钱锋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Flyingman Precision Instrument Co ltd
Original Assignee
Suzhou Flyingman Precision Instrument Co ltd
Filing date
Publication date
Application filed by Suzhou Flyingman Precision Instrument Co ltd filed Critical Suzhou Flyingman Precision Instrument Co ltd
Application granted granted Critical
Publication of CN221303340U publication Critical patent/CN221303340U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

The utility model provides a microwave probe seat, belongs to microwave detection technical field, including base, fixed base plate, probe locating plate, microwave circuit board, microwave wire integrated pencil and probe, fixed base plate and microwave wire integrated pencil are installed on the base, and the probe locating plate is fixed in fixed base plate, and probe and microwave circuit board are fixed in the probe locating plate, and the probe is located between probe locating plate and the microwave circuit board, and microwave wire integrated pencil and microwave circuit board electric connection, microwave circuit board and probe electric connection. With the design, when a microscope is used for testing a sample, a microwave signal is provided for the probe so as to test more characteristics of the sample.

Description

Microwave probe seat
Technical Field
The utility model relates to the technical field of microwave detection, in particular to a microwave probe seat.
Background
AFM atomic force microscope is a scientific instrument with atomic level high resolution, and is widely used in research and experiment fields such as materials science, biochemistry, metallurgy, organic chemistry, polymer and nano-materials science. In the existing AFM atomic force microscope, the probe cannot receive microwave signals in the process of testing the sample, and more characteristics of the sample are difficult to test.
Disclosure of utility model
In order to facilitate an atomic force microscope to provide microwave signals for a microwave probe in a sample testing process, the utility model provides a microwave probe seat, and the specific technical scheme is as follows:
The utility model provides a microwave probe seat, includes base, fixed baseplate, probe locating plate, microwave circuit board, the integrated pencil of microwave wire and probe, fixed baseplate with the integrated pencil of microwave wire install in the base, the microwave probe locating plate is fixed in fixed baseplate, the probe with the microwave circuit board is fixed in the probe locating plate, the probe is located the probe locating plate with between the microwave circuit board, the integrated pencil of microwave wire with microwave circuit board electric connection, the microwave circuit board with probe electric connection.
Further, the microwave circuit board is provided with a first contact, the microwave probe is provided with a second contact, and the first contact is in contact conduction with the second contact.
Further, the microwave probe seat comprises an elastic pressing sheet, the elastic pressing sheet is fixed on the fixed substrate, the probe is positioned between the elastic pressing sheet and the microwave circuit board, and the pressure generated by deformation of the elastic pressing sheet enables the probe to be clung to the microwave circuit board.
Further, the elastic pressing piece comprises a mounting portion and an elastic portion, wherein the mounting portion is fixed with the fixed substrate, and the elastic portion is inclined relative to the mounting portion and abuts against the microwave probe.
Further, the microwave probe seat comprises a cover plate, and the microwave wire integrated harness is located between the cover plate and the base.
Further, a positioning groove is formed in the probe positioning plate, and the probe is installed in the positioning groove.
Further, the microwave probe seat comprises a reflector, and the reflector is fixed on the bottom surface of the base.
Further, the base is provided with a light-passing groove, and the light beam reflected by the reflector is emitted to the probe through the light-passing groove.
Further, the microwave probe seat comprises a fixing piece, and the fixing piece is arranged on the side face of the base.
Further, the fixing piece is a magnet.
The utility model has the beneficial effects that: when a microscope is used for testing a sample, a microwave probe seat is used for providing a microwave signal for the probe so as to test more characteristics of the sample.
Drawings
Fig. 1 is a perspective view of a microwave probe holder;
Fig. 2 is a perspective view of a base of the microwave probe stand of fig. 1;
FIG. 3 is a partial block diagram of the microwave probe mount of FIG. 1;
FIG. 4 is an exploded view of a part of the microwave probe stand of FIG. 1;
FIG. 5 is an exploded view of another partial structure of the microwave probe mount of FIG. 1;
FIG. 6 is an enlarged view of a partial structure of the microwave probe holder of FIG. 1;
fig. 7 is a perspective view of an elastic pressing piece of the microwave probe holder of fig. 1.
In the figure: 1. a base; 11. a first mounting groove; 12. a second mounting groove; 13. a third mounting groove; 2. fixing the substrate; 3. a probe positioning plate; 31. a positioning groove; 4. a microwave circuit board; 41. a first contact; 5. a probe; 51. a second contact; 6. a microwave wire integrated harness; 61. a cover plate; 7. elastic tabletting; 71. a mounting part; 72. an elastic part; 8. a reflective mirror; 81. a light transmission groove; 9. and (3) a magnet.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
The utility model is further described below in connection with fig. 1-7:
A microwave probe seat comprises a base 1, a fixed base plate 2, a probe positioning plate 3, a microwave circuit board 4, a probe 5, a microwave wire integrated harness 6, a cover plate 61, an elastic pressing sheet 7, a reflector 8 and a magnet 9.
In this embodiment, the base 1 is provided with a first mounting groove 11, a second mounting groove 12, and a third mounting groove 13, the first mounting groove 11 being located on the left of the second mounting groove 12, and the third mounting groove 13 being located on the side of the base 1.
The microwave wire integrated harness 6 is installed in the first installation groove 11, and the microwave wire integrated harness is electrically connected with the microwave circuit board 4, specifically, in this embodiment, the cover plate 61 is fixed on the base 1, and is used for fixing the microwave wire integrated harness 6; the fixed substrate 2 is fixed in the second mounting groove 12; the magnet 9 is fixed in the third mounting groove 13 for fixing the microwave probe holder, and in particular, in this embodiment, the surface of the magnet 9 is slightly lower than the side surface of the base 1.
A mirror 8 is fixed to the bottom surface of the base 1 to reflect the laser light incident from the outside to the probe 5. The base 1 is provided with a light-passing groove 81, and the light-passing groove 81 is positioned above the reflector 8.
The probe positioning board 3 is provided with a positioning groove 31, the probe 5 is fixed in the positioning groove 31 and is electrically connected with the microwave circuit board 4, specifically, in the embodiment, the microwave circuit board 4 is provided with a first contact 41, the probe 5 is provided with a second contact 51, and the first contact 41 and the second contact 51 are in contact conduction, so that microwave signals are transmitted from the microwave circuit board 4 to the probe 5; the probe head of the probe 5 extends out of the probe positioning plate 3 and is suspended above the light transmission groove 81.
The elastic pressing piece 7 includes a mounting portion 71 and an elastic portion 72, the mounting portion 71 is fixed on the fixed substrate 2, the elastic portion 72 is inclined relative to the mounting portion 71 and presses the probe 5, and the pressure generated by deformation of the elastic portion 72 tightly presses the probe 5 on the microwave circuit board 4.
The base 1 is located the bottom of microwave probe seat for support and fix other articles, fixed base plate 2 is fixed in base 1, and probe locating plate 3 is fixed in fixed base plate 2, and microwave circuit board 4 is fixed in probe locating plate 3, and probe 5 is located between microwave circuit board 4 and probe locating plate 3.
The working process of the microwave probe seat comprises the following steps: the microwave signal is transmitted to the microwave circuit board 4 from the microwave wire integrated harness 6, and is transmitted to the probe 5 from the microwave circuit board 4 through the contact conduction of the first contact 41 and the second contact 51, so that the microwave signal is provided for the probe 5 in the sample detection process.
The utility model has the beneficial effects that: by means of a microwave probe holder, a microwave signal is provided to the probe 5 for measuring further properties of the sample when the sample is tested by means of a microscope.
The above-described embodiments of the present utility model do not limit the scope of the present utility model. Any of various other corresponding changes and modifications made according to the technical idea of the present utility model should be included in the scope of the claims of the present utility model.

Claims (10)

1. The utility model provides a microwave probe seat, includes base, fixed substrate, probe locating plate, its characterized in that: the microwave probe comprises a base, a probe locating plate, a probe, a microwave wire integrated wiring harness and a probe, wherein the base is arranged on the base, the probe locating plate is fixed on the base, the probe and the microwave wire integrated wiring harness are fixed on the probe locating plate, the probe is located between the probe locating plate and the microwave wire board, the microwave wire integrated wiring harness is electrically connected with the microwave wire board, and the microwave wire board is electrically connected with the probe.
2. The microwave probe mount of claim 1, wherein: the microwave circuit board is provided with a first contact, the microwave probe is provided with a second contact, and the first contact is in contact conduction with the second contact.
3. The microwave probe mount of claim 1, wherein: the microwave probe seat comprises an elastic pressing sheet, the elastic pressing sheet is fixed on the fixed substrate, the probe is positioned between the elastic pressing sheet and the microwave circuit board, and the pressure generated by deformation of the elastic pressing sheet enables the microwave probe to be clung to the microwave circuit board.
4. A microwave probe mount according to claim 3, wherein: the elastic pressing piece comprises a mounting part and an elastic part, wherein the mounting part is fixed with the fixed substrate, and the elastic part is inclined relative to the mounting part and abuts against the probe.
5. The microwave probe mount of claim 1, wherein: the microwave probe seat comprises a cover plate, and the microwave wire integrated harness is positioned between the cover plate and the base.
6. The microwave probe mount of claim 1, wherein: the probe locating plate is provided with a locating groove, and the probe is installed in the locating groove.
7. The microwave probe mount of claim 1, wherein: the microwave probe seat comprises a reflector, and the reflector is fixed on the bottom surface of the base.
8. The microwave probe mount of claim 7, wherein: the base is provided with a light-passing groove, and the light beam reflected by the reflector is emitted to the probe through the light-passing groove.
9. The microwave probe mount of claim 1, wherein: the microwave probe seat comprises a fixing piece, and the fixing piece is arranged on the side face of the base.
10. The microwave probe mount of claim 9, wherein: the fixing piece is a magnet.
CN202322753775.3U 2023-10-13 Microwave probe seat Active CN221303340U (en)

Publications (1)

Publication Number Publication Date
CN221303340U true CN221303340U (en) 2024-07-09

Family

ID=

Similar Documents

Publication Publication Date Title
JP4522975B2 (en) Probe card
CN221303340U (en) Microwave probe seat
CN102053171B (en) Micron-nano thermal detecting and sensing component
CN115184756A (en) Wafer detection system
JP2007155735A (en) Electric contact apparatus and electric inspection apparatus for inspecting subject electric component
CN215449355U (en) Tester capable of testing multiple packaging types
CN217425653U (en) Hall effect measures with sample platform of taking probe
CN219590346U (en) Atomic force microscope probe seat
CN220872623U (en) Closed-loop motor test fixture
CN218647812U (en) Tool for measuring turn-on stroke of microswitch
EP1074981A2 (en) Optical pickup
JP2585597B2 (en) Circuit board inspection equipment
CN215575246U (en) High accuracy test module
CN112082678A (en) Multi-degree-of-freedom self-adaptive stress detection probe clamp
CN102192702A (en) Method for operating digital display height measurement instrument
CN218416681U (en) Fixture and test device for testing microphone module
CN213337901U (en) No PIN hole lamp slat tool
CN220794514U (en) Sensor load testing device
CN221303549U (en) Magnetic steel magnetic field detects frock
CN216900618U (en) Sample stress applying device of atomic force microscope
CN211457366U (en) Positioning structure for loudspeaker quality detection system
CN212092323U (en) Low-temperature testing tool
CN221260073U (en) Vehicle circuit board modal testing device
CN220357099U (en) Cantilever beam replacement device for vacuum atomic force microscope
CN217846376U (en) Inductance and resistance test equipment for electronic element

Legal Events

Date Code Title Description
GR01 Patent grant