CN221100857U - Switching testing arrangement and switching test equipment - Google Patents

Abstract

The application provides a switching testing device and switching testing equipment, and relates to the technical field of charging. The switching testing device comprises: an adapter and a first connector; the first connector of the adapter is used for connecting charging equipment, and the second connector of the adapter is used for respectively connecting equipment to be charged; the first connector is connected with the first connector and the second connector respectively through a preset conductor; the first connector is used for connecting a second connector in the testing device, and the second connector and the first connector are connectors matched with each other. Therefore, the application can realize high-power and low-power charge and discharge test by connecting the first connector with the second connector, and can realize diversity of test functions by matching connection of the second connector and the first connector, and has small whole volume and convenient use.

Description

Switching testing arrangement and switching test equipment

Technical Field

The application relates to the technical field of charging, in particular to a switching test device and switching test equipment.

Background

With the development of new energy automobile technology, the corresponding new energy automobile detection technology is also continuously developed, and the requirements for high-power switching test equipment between a charging pile and an electric automobile are increasing.

The most widely used high-power transfer test equipment in the market at present is a high-power transfer test equipment additionally arranged between a charging device and an electric automobile, so that the charging pile and the electric automobile are respectively connected at an input interface and an output interface of the high-power transfer test equipment, and a liquid cooling device is additionally arranged at the output interface of the electric automobile so as to realize the transmission of high-power signals.

However, the high-power switching test equipment added with the liquid cooling device in the prior art has the problems of large whole volume, inconvenient use and single test function.

Disclosure of utility model

The application aims to provide a switching test device and switching test equipment, which can realize high-power and low-power charge and discharge tests through the switching test device, and are small in overall size and convenient to use.

In order to achieve the above purpose, the technical scheme adopted by the embodiment of the application is as follows:

In a first aspect, an embodiment of the present application provides a transit testing device, including: an adapter and a first connector;

The first connector of the adapter is used for connecting charging equipment, and the second connector of the adapter is used for respectively connecting equipment to be charged; the first connector is connected with the first connector and the second connector through a preset conductor respectively;

The first connector is used for connecting a second connector in the testing device, and the second connector and the first connector are connectors matched with each other.

Optionally, the power pin in the first connector is connected with the power pin in the second connector through a preset conductor, and the ground pin in the first connector and the ground pin in the second connector are respectively connected with a first ground pin and a second ground pin in the first connector;

The pilot signal pin in the first connector and the pilot signal pin in the second connector are respectively connected with the first pilot signal pin and the second pilot signal pin in the first connector;

The ground pin in the first connector and the ground pin in the second connector are also respectively connected to the first ground pin and the second ground pin in the first connector.

Optionally, the preset conductor includes, but is not limited to, a copper bar.

Optionally, the power pin in the first connector and the power pin in the second connector are also connected to the power pin in the first connector, respectively.

Optionally, the temperature pin in the first connector and the temperature pin in the second connector are connected to the first temperature pin and the second pin, respectively.

Optionally, the switching test device further includes: the probe of the current sensor is connected between the power pin in the first connector and the power pin in the second connector;

the current sensor is also connected to a current pin in the first connector.

Optionally, the switching test device further includes: the two wiring terminals of the mechanical switch are connected between a preset signal pin in the second connector and a corresponding pin in the first connector; the preset signal pin is a connection detection pin in the second joint;

The operating part of the mechanical switch is arranged on the shell of the switching testing device.

In a second aspect, an embodiment of the present application provides a transit test device, including: the switching test device and the test device according to the first aspect, wherein the test device includes: a second connector and a test device;

The first connector in the switching test device is connected with the second connector, and the second connector is connected with the test equipment.

Optionally, the test device is a first test device, and the first pilot signal pin and the second pilot signal pin in the second connector are respectively connected with the first pilot signal pin and the second pilot signal pin in the first test device;

The first grounding pin and the second grounding pin in the second connector are respectively connected with the first grounding pin and the second grounding pin in the first test equipment;

corresponding switch units are respectively arranged between a first guide pin and a second guide pin in the first test equipment and between a first grounding pin and a second grounding pin in the first test equipment.

Optionally, the test device is a second test device, a first pilot signal pin and a second pilot signal pin in the second connector are respectively connected with a first pilot signal pin and a second pilot signal pin in the second test device, and a first ground pin and a second ground pin in the second connector are respectively connected with a first ground pin and a second ground pin in the second test device;

the first temperature detection pin and the second temperature detection pin in the second connector are respectively connected with the first temperature detection pin and the second temperature detection pin in the second test equipment;

The power pin in the second connector is connected with the power pin in the second test equipment; the current pin in the second connector is connected with the current pin in the second test equipment;

Corresponding switch units are respectively arranged between the first guide pin and the second guide pin in the second test equipment and between the first grounding pin and the second grounding pin in the second test equipment; each pin in the second test equipment is connected with the acquisition control unit in the second test equipment.

The transfer test device and the transfer test equipment provided by the application have the beneficial effects that:

The embodiment of the application provides a switching test device and switching test equipment, wherein the switching test device comprises: an adapter and a first connector; the first connector of the adapter is used for connecting charging equipment, the second connector of the adapter is used for connecting equipment to be charged respectively, the first connector is connected with the second connector through a preset conductor, and the first connector is connected with the first connector and the second connector respectively; the first connector is used for connecting a second connector in the testing device, and the second connector and the first connector are connectors matched with each other. Therefore, various test signals of the charging equipment can be transmitted to the testing device through the first connector through the charging equipment connected with the first connector of the adapter, and meanwhile, various test signals of the equipment to be charged can be transmitted to the testing device through the first connector through the equipment to be charged through the second connector of the adapter, so that the charging and discharging between the charging equipment and the equipment to be charged are tested through the testing device, and further the charging and discharging test between the charging equipment and the equipment to be charged is realized; the charge and discharge test can be completed or realized only by adopting simple connection, so that the switching test device provided by the application is more convenient to use; furthermore, the diversity of the test function can be realized through the matching connection of the second connector and the first connector; meanwhile, compared with the scheme of adding the liquid cooling device in the prior art, the switching test device can realize the functions of high-power and low-power transmission by only directly connecting the first connector and the second connector through the preset conductor, so that the size of the switching test device is relatively smaller.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

Fig. 1 is a schematic structural diagram of a switching test device according to an embodiment of the present application;

Fig. 2 is a schematic structural diagram of a switching test device according to a second embodiment of the present application;

fig. 3 is a schematic structural diagram of a switching test device according to an embodiment of the present application;

fig. 4 is a schematic structural diagram of a switching test device according to an embodiment of the present application;

Fig. 5 is a schematic structural diagram III of a switching test device according to an embodiment of the present application;

fig. 6 is a schematic diagram illustrating an internal structure of a switching test device according to an embodiment of the present application;

fig. 7 is a schematic structural diagram of a switching test device according to an embodiment of the present application;

FIG. 8 is a schematic diagram of an internal structure of a switching test device according to an embodiment of the present application;

fig. 9 is a schematic diagram of a switching test device according to an embodiment of the present application;

Fig. 10 is a schematic diagram of an internal structure of a switching test device according to an embodiment of the present application;

fig. 11 is a schematic structural diagram of a switching test device according to an embodiment of the present application;

Fig. 12 is a schematic diagram of an internal structure of a switching test device according to an embodiment of the present application;

fig. 13 is a schematic structural diagram seventh of a switching test device according to an embodiment of the present application;

Fig. 14 is a schematic structural diagram of a switching test device according to an embodiment of the present application;

Fig. 15 is a schematic diagram showing an internal structure of a switching test device according to an embodiment of the present application;

fig. 16 is a schematic structural diagram of a switching test device according to an embodiment of the present application;

fig. 17 is a schematic structural diagram III of a switching test device according to an embodiment of the present application;

FIG. 18 is a schematic diagram illustrating an internal structure of a testing device according to an embodiment of the present application;

Fig. 19 is a schematic structural diagram of a switching test device according to an embodiment of the present application;

fig. 20 is a schematic diagram of an internal structure of a switching test device according to an embodiment of the present application.

Detailed Description

For the purpose of making the objects, technical solutions and advantages of the embodiments of the present application more apparent, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments of the present application. The components of the embodiments of the present application generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the application, as presented in the figures, is not intended to limit the scope of the application, as claimed, but is merely representative of selected embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.

It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.

In the description of the present utility model, it should be understood that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," "outer," and the like indicate orientations or positional relationships based on those shown in the drawings, or those conventionally put in place when the inventive product is used, or those conventionally understood by those skilled in the art, merely for convenience in describing the present utility model and simplifying the description, and do not indicate or imply that the apparatus or element to be referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model.

Furthermore, the terms "first," "second," "third," and the like are used merely to distinguish between descriptions and should not be construed as indicating or implying relative importance.

In the description of the present application, it should also be noted that, unless explicitly specified and limited otherwise, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present application will be understood in specific cases by those of ordinary skill in the art.

It should be noted that the features of the embodiments of the present application may be combined with each other without conflict.

The following provides a detailed description of a transfer test device and a transfer test apparatus according to an embodiment of the present application with reference to the accompanying drawings.

Aiming at the high-power transfer test equipment which is most applied to the market at present, the high-power transfer test equipment is additionally arranged between the charging equipment and the electric automobile, and a liquid cooling device is additionally arranged at an output interface of the electric automobile so as to realize the transmission of high-power signals, so that the high-power transfer test equipment has the advantages of large whole volume, inconvenient use and single test function. The application provides a transfer testing device and transfer testing equipment, which are used for solving the problems of large whole volume, inconvenient use and single testing function of high-power transfer testing equipment, so as to realize high-power charge and discharge testing, and have the advantages of small whole volume and convenient use.

In order to clearly describe the embodiment of the present application, an example of a switching test device is provided, and a detailed description of an example of a switching test device provided by the present application is provided below with reference to the accompanying drawings. Fig. 1 is a schematic structural diagram of a switching test device according to an embodiment of the present application. As shown in fig. 1, the transit test device 300 includes: switching test device 100 and test device 200.

Wherein the test apparatus 200 comprises: a second connector 210 and a test device 220.

The first connector 120 in the switching test device 100 is connected to the second connector 210, the second connector 210 is connected to the test apparatus 220, so that various test signal data in the switching test device 100 can be transmitted to the test apparatus 220 through the second connector 210 matched with the first connector 120, and the test apparatus 220 can perform a functional test according to the received various test signal data in the switching test device 100, for example, the functional test may be a voltage or current or a message data condition of the charging apparatus and the to-be-charged apparatus in the charging and discharging processes, which is not limited herein. The charging device can be understood as a charging pile, and the device to be charged can be understood as an electric vehicle.

It should be noted that, since the second connector 210 and the first connector 120 are connectors that are matched with each other, various signal pins in the second connector 210 are disposed corresponding to the first connector 120, and if the first connector 120 is a male connector, the second connector 210 is a female connector; if the first connector 120 is a female connector, the second connector 210 is a male connector.

In one possible implementation manner, another working schematic diagram of the switching test device 300 may be described in detail with reference to the accompanying drawings, as shown in fig. 2, and fig. 2 is a schematic diagram of a second structure of the switching test device according to the embodiment of the present application. In the example of fig. 2, during the charge and discharge testing process of the charging device and the device to be charged, various test signal data during the charge and discharge testing process can be transmitted to the testing device 220 through the first connector 111 and the second connector 112 in the switching testing device 100 and the second connector 210 matched with the first connector 120, so that the functional test result of the various test signal data during the charge and discharge testing process can be determined according to the testing function of the testing device 220, and meanwhile, the functional test result can be transmitted to the upper computer or other terminals in a preset manner. The preset mode may be selected according to practical situations, for example, the preset mode may be selected as a communication mode or the like.

It should be noted that, the display manner of the functional test result in the above embodiment is only an example, and should not be construed as limiting the present application. In addition, it should be further noted that the test function of the test device 220 may be selected according to the test item, and the switching test apparatus and the test device may be connected through the connector cable (i.e., the first connector 120 and the second connector 210 are connected in a matching manner) so as to perform the functional test of the test item.

The embodiment of the application provides a switching test device, which can comprise: switching testing arrangement and testing arrangement, testing arrangement can include: a second connector and a test device; the first connector in the switching test device is connected with the second connector, and the second connector is connected with the test equipment. Therefore, various test signals of the charging equipment and the equipment to be charged can be transmitted to the testing equipment through the second connector matched with the first connector by the charging equipment connected with the first connector of the adapter and the equipment to be charged connected with the second connector, so that the charging and discharging between the charging equipment and the equipment to be charged are tested through the testing function of the testing equipment, and further the charging and discharging testing between the charging equipment and the equipment to be charged is realized; the charge and discharge test can be completed or realized only by adopting simple connection, so that the switching test equipment provided by the application is more convenient to use; and further, the diversity of the test functions can be realized through various test functions of the test equipment.

An example of a switching test device according to the present application will be described in detail with reference to the accompanying drawings. Fig. 3 is a schematic structural diagram of a switching test device according to an embodiment of the present application. As shown in fig. 3, the transit test device 100 includes: an adapter 110 and a first connector 120.

The first connector 111 of the adapter 110 is used for connecting charging equipment, the second connector 112 of the adapter 110 is used for connecting equipment to be charged respectively, the first connector 111 is connected with the second connector 112, so that various test signals in the charging equipment can be transmitted to the equipment to be charged through the first connector 111 and the second connector 112 of the adapter 110, or various test signals in the equipment to be charged can be transmitted to the charging equipment through the second connector 112 and the first connector 111 of the adapter 110; meanwhile, since the first connector 111 is connected with the second connector 112, the charge and discharge test between the equipment to be charged and the charging equipment can be realized through the second connector 112 connected with the first connector 111; and secondly, the first connector is connected with the second connector through a preset conductor, so that high-power charge and discharge testing is realized, wherein the preset conductor can be selected according to actual conditions.

The first joint 111 and the second joint 112 are also connected to the first connector 120, respectively; the first connector 120 is used for connecting a second connector in the testing device, the second connector and the first connector 120 are connectors matched with each other, so that various testing signals in the charging equipment corresponding to the first connector 111 and various testing signals in the equipment to be charged corresponding to the second connector 112 are transmitted to the testing device through the first connector 120 and the second connector through the second connector and the first connector 120, and the testing functions of diversity are achieved.

Wherein, since the first connector 111 in the adapter 110 is used for connecting to the charging device, the first connector 111 can be understood as the connector of the charging gun holder; similarly, the second connector 112 is used to connect to a device to be charged, and the second connector 112 may be understood as a connector of a charging gun head.

In a possible implementation manner, fig. 4 is a schematic structural diagram of a switching test device according to an embodiment of the present application. As shown in fig. 4, the first connector 120 may be a jack, which is not limited herein, and the jack is the number of external cables of the first connector 111 and the second connector 112, which is not limited herein. Taking the charging test of the device to be charged as an example, when the device to be charged is in the process of performing the charging test, the charging device transmits an electric signal to the second connector 112 through the first connector 111 of the adapter 110 so as to be transmitted to the device to be charged through the second connector 112, and in this process, since the first connector 111 and the second connector 112 are respectively connected with the first connector 120, the second connector in the testing device connected with the first connector 120 can be used for collecting data such as the charging electric signal and the like in the process of performing the charging test on the device to be charged, so as to realize the data test of the device to be charged in the charging process.

In one possible implementation manner, taking the discharging test of the device to be charged as an example, when the device to be charged is in the process of performing the discharging test, the device to be charged transmits an electric signal to the first connector 111 through the second connector 112 of the adapter 110 so as to be transmitted to the charging device through the first connector 111, and in this process, since the first connector 111 and the second connector 112 are respectively connected with the first connector 120, the second connector in the testing device connected with the first connector 120 can be used for collecting data such as the discharging electric signal and the like in the process of performing the discharging test on the device to be charged, so as to realize the data test on the device to be charged in the discharging process.

It should be noted that, the first connector is connected with the second connector through the preset conductor to realize the high-power charge and discharge test, and the low-power charge and discharge test can be performed. There is no limitation in this regard.

The embodiment of the application provides a switching test device, a switching joint and a first connector; the first connector of the adapter is used for connecting charging equipment, the second connector of the adapter is used for connecting equipment to be charged respectively, the first connector is connected with the second connector through a preset conductor, and the first connector and the second connector are connected with the first connector respectively; the first connector is used for connecting a second connector in the testing device, and the second connector and the first connector are connectors matched with each other. Therefore, various test signals of the charging equipment can be transmitted to the testing device through the first connector through the charging equipment connected with the first connector of the adapter, and meanwhile, various test signals of the equipment to be charged can be transmitted to the testing device through the first connector through the equipment to be charged through the second connector of the adapter, so that the charging and discharging between the charging equipment and the equipment to be charged are tested through the testing device, and further the charging and discharging test between the charging equipment and the equipment to be charged is realized; the charge and discharge test can be completed or realized only by adopting simple connection, so that the switching test device provided by the application is more convenient to use; furthermore, the diversity of the test function can be realized through the matching connection of the second connector and the first connector; meanwhile, compared with the scheme of adding the liquid cooling device in the prior art, the switching test device can realize the functions of high-power and low-power transmission by only directly connecting the first connector and the second connector through the preset conductor, so that the size of the switching test device is relatively smaller.

On the basis of fig. 3, the following continues to describe in detail an example of a switching test device provided by the present application in connection with the accompanying drawings. Fig. 5 is a schematic structural diagram of a switching test device according to an embodiment of the present application. In the example of fig. 5, the power pin DC in the first connector 111 is connected to the power pin DC in the second connector 112 through a preset conductor, so that the charging device is connected to the power pin DC in the second connector 112 connected to the device to be charged through the power pin DC in the first connector 111, and further the device to be charged and the power line of the charging device can be directly connected, so as to provide preconditions for providing transmission of high-power electrical signals and low-power electrical signals; the ground pin PE in the first connector 111 and the ground pin PE in the second connector 112 are respectively connected to the first ground pin PE1 and the second ground pin PE2 in the first connector 120, so that the ground pin PE in the first connector 111 is grounded through the first ground pin PE1 in the first connector 120, and the ground pin PE in the second connector 112 is connected to the second ground pin PE2 in the first connector 120, thereby playing a role of ground protection. The pilot signal pin in the first connector 111 and the pilot signal pin in the second connector are respectively connected with the first pilot signal pin and the second pilot signal pin in the first connector 120, so that a pilot signal line between the charging device and the device to be charged can be conducted through the first pilot signal pin and the second pilot signal pin in the first connector 120, and preconditions are provided for charge and discharge testing or other functional testing between the charging device and the device to be charged.

Wherein the power pin DC in the first connector 111 may comprise: DC+ and DC-; the power pin DC in the second connector 112 may include: DC+ and DC-; the pilot pins in the first connector 111 may include: a charging connection confirmation line pin CC, a charging communication line pin S, and a low voltage auxiliary power supply pin a, wherein the charging connection confirmation line pin CC may include: CC1 and CC2; the charging communication line pin S may include: s+ and S-; the low voltage auxiliary power supply pin a may include: a+ and A-. Fig. 6 is a schematic diagram of an internal structure of a switching test device according to an embodiment of the application. In the example of fig. 6, the power pin DC in the first connector 111 is connected to the power pin DC in the second connector 112, the ground pin PE in the first connector 111 and the ground pin PE in the second connector 112 are connected to the first connector 120, respectively, and the pilot signal pin in the first connector 111 and the pilot signal pin in the second connector are connected to the first connector 120, respectively, i.e. the first connector 120 can connect both the ground pin PE and the pilot signal pin in the adapter 110 to the first connector 120 to provide a test basis for the test device.

It should be noted that, in the above embodiment, the pin connection relationship is applicable to the charging gun stand of different charging standards and the connector of the charging gun head of the standard corresponding to the charging gun stand, for example, the connector standard of the charging gun stand of the charging device is international 2015, and the connector standard of the charging gun head of the device to be charged is also international 2015. Different charging standards can be selected according to practical situations, such as national standard 2015+, chaoji, european standard, japanese standard and the like.

The embodiment of the application provides a switching test device, wherein a power pin in a first connector is connected with a power pin in a second connector through a preset conductor, and a grounding pin in the first connector and a grounding pin in the second connector are respectively connected with a first grounding pin and a second grounding pin in a first connector; the pilot pin in the first connector and the pilot pin in the second connector are connected to the first pilot pin and the second pilot pin, respectively. Therefore, the application can be connected with the power pin in the second connector through the power pin in the first connector, provides preconditions for transmission of high-power electric signals and low-power electric signals, and simultaneously, can be respectively connected with the first guide signal pin and the second guide signal pin in the first connector through the guide signal pin in the first connector and the guide signal pin in the second connector, and provides preconditions for charge and discharge test or other functional test of charging equipment and equipment to be charged.

Alternatively, in one possible implementation, the preset conductor may be selected according to the actual situation, for example, the preset conductor includes, but is not limited to, copper bars. For example, the power pins DC in the first connector 111 are directly connected to the power pins DC in the second connector 112 through copper bars, so as to realize high-power and low-power transmission between the charging device and the device to be charged in a manner of directly connecting through copper bars.

For example, since the charging gun head corresponding to the charging device and the charging gun seat corresponding to the device to be charged in the prior art are directly connected by adopting a common wire, the power line between the charging gun head and the charging gun seat can only transmit the current with the maximum current of 300A, but in the application, since the charging gun head corresponding to the charging device and the charging gun seat corresponding to the device to be charged are directly connected by adopting a copper bar, the maximum current of the power line between the charging gun head and the charging gun seat can reach 800A.

It should be noted that the numbers in the above embodiments are only for example, and should not be construed as limiting the application.

On the basis of fig. 5, the following continues to describe in detail an example of a switching test device provided by the present application with reference to the accompanying drawings. Fig. 7 is a schematic structural diagram of a switching test device according to an embodiment of the present application. In the example of fig. 7, the power pins DC in the first joint 111 and the power pins DC in the second joint 112 are also connected to the power pins DC in the first connector 120, respectively, to connect the power pins DC of the first joint 111 and the second joint 112 in the adapter 110 with the power pins DC in the first connector 120, to provide preconditions for power testing in a charge-discharge test between the charging device and the device to be charged.

Fig. 8 is a schematic diagram illustrating an internal structure of a switching test device according to an embodiment of the present application. In the example of fig. 8, the power pin DC in the first connector 111 is connected to the power pin DC in the second connector 112, and the power pin DC is connected to the first connector 120, the ground pin PE in the first connector 111 and the ground pin PE in the second connector 112 are connected to the first connector 120, respectively, and the pilot pin in the first connector 111 and the pilot pin in the second connector are connected to the first connector 120, respectively, i.e. the first connector 120 can connect the ground pin PE and the pilot pin and the power pin DC in the adapter 110 to the first connector 120 to provide a test basis for the test device.

On the basis of fig. 7, the following continues to describe in detail an example of a switching test device provided by the present application with reference to the accompanying drawings. Fig. 9 is a schematic structural diagram of a switching test device according to an embodiment of the present application. In the example of fig. 8, temperature pin DC _{Temperature (temperature)} in first header 111 and temperature pin DC _{Temperature (temperature)} in second header 112 are connected to first temperature pin DC _{Temperature (temperature) 1} and second pin DC _{Temperature (temperature) 2} in first connector 120, respectively, to connect temperature pins DC _{Temperature (temperature)} of first header 111 and second header 112 in adapter 110 with first temperature pin DC _{Temperature (temperature) 1} and second pin DC _{Temperature (temperature) 2} in first connector 120, to provide preconditions for temperature testing in a charge-discharge test between a charging device and a device to be charged.

The temperature pins DC _{Temperature (temperature)} in the first connector 111 and the temperature pin DC _{Temperature (temperature)} in the second connector 112 are respectively provided with a preset temperature threshold value with the same number, and the preset temperature threshold value may be selected according to practical situations, for example, the preset temperature threshold value may be selected to be 120 degrees. When the temperature pins DC _{Temperature (temperature)} in the first connector 111 and the temperature pin DC _{Temperature (temperature)} in the second connector 112 exceed a preset temperature threshold (e.g. 120 degrees), the charging can be forcibly triggered to stop, so as to protect the safe use of the charging device and the device to be charged.

Fig. 10 is a schematic diagram illustrating an internal structure of a switching test device according to an embodiment of the present application. In the example of fig. 10, the power pin DC in the first connector 111 is connected to the power pin DC in the second connector 112, and the power pin DC is connected to the first connector 120, the ground pin PE in the first connector 111 and the ground pin PE in the second connector 112 are respectively connected to the first connector 120, and the pilot pin in the first connector 111 and the pilot pin in the second connector are respectively connected to the first connector 120, i.e. the first connector 120 can connect the ground pin PE and the pilot pin and the power pin DC in the adapter 110 to the first connector 120, and the first connector 111 and the temperature pin DC _{Temperature (temperature)} of the second connector 112 are both connected to the first connector 120 to provide a test basis for the test device.

On the basis of fig. 9, the following continues to describe in detail an example of a switching test device provided by the present application with reference to the accompanying drawings. Fig. 11 is a schematic structural diagram of a switching test device according to an embodiment of the present application. In the example of fig. 11, the transit test device 100 further comprises: a current sensor 130.

The probe of the current sensor 130 is connected between the power pin DC in the first connector 111 and the power pin DC in the second connector 112, so as to detect the current transmission condition of the charging device and the device to be charged in the charging process; the current sensor 130 is further connected to a current pin in the first connector 120, so that power supply and signal lines of the current sensor 130 are all led into the first connector 120, so that the test device is convenient to use, and preconditions are provided for current testing in charge and discharge testing between the charging equipment and the equipment to be charged.

Note that, since the power pin DC in the first connector 111 and the power pin DC in the second connector 112 each include: DC+ and DC-; the current sensor 130 may be disposed between the power pin DC-in the first connector 111 and the power pin DC-in the second connector 112 or between the power pin dc+ in the first connector 111 and the power pin dc+ in the second connector 112, without limitation.

Fig. 12 is a schematic diagram illustrating an internal structure of a switching test device according to an embodiment of the present application. In the example of fig. 12, the probe connection of the current sensor 130 is arranged between the power pin DC in the first joint 111 and the power pin DC in the second joint 112, the power pin DC in the first joint 111 is connected to the power pin DC in the second joint 112, and the power pin DC is connected to the first connector 120, the ground pin PE in the first joint 111 and the ground pin PE in the second joint 112 are connected to the first connector 120, respectively, the pilot pin in the first joint 111 and the pilot pin in the second joint are connected to the first connector 120, respectively, i.e. the first connector 120 can connect both the ground pin PE and the pilot pin as well as the power pin DC in the adapter 110 to the first connector 120, and the temperature pins DC _{Temperature (temperature)} of the first joint 111 and the second joint 112 are connected to the first connector 120, respectively, to provide a test basis for the test device.

Fig. 13 is a schematic structural diagram of a switching test device according to an embodiment of the present application. In the example of fig. 13, the current sensor 130 may be either externally visible on the exterior surface of the patch test device 100 or internally hidden. There is no limitation in this regard.

The embodiment of the application provides a switching testing device, which further comprises: the probe of the current sensor is connected between the power pin in the first joint and the power pin in the second joint; the current sensor is also connected to a current pin in the first connector. Therefore, the application can detect the current conditions of the charging equipment and the equipment to be charged in the charging and discharging process through the current sensor, and simultaneously, the power supply and the signal wires of the current sensor can be all led into the first connector for the testing device to use, thereby providing preconditions for the testing equipment to the current conditions of the charging equipment and the equipment to be charged in the charging and discharging process.

On the basis of fig. 11, the following continues to describe in detail an example of a switching test device provided by the present application with reference to the accompanying drawings. Fig. 14 is a schematic structural diagram of a switching test device according to an embodiment of the present application. In the example of fig. 14, the transit test device 100 further comprises: a mechanical switch 140.

Wherein, two terminals of the mechanical switch 140 are connected between the preset signal pin CC1 in the second connector 112 and the corresponding pin in the first connector 120; the preset signal pin CC1 is a connection detection pin in the second connector 112; the predetermined signal pin CC1 is also a connection detection pin of the pilot signal pins in the first connector 111. The operation portion of the mechanical switch 140 is disposed on the housing of the switching test device 100, that is, the mechanical switch 140 can be manually operated to be turned on or off outside the switching test device 100, for example, if the mechanical switch 140 is manually operated to be turned off outside the switching test device 100, the precondition of the connection detection condition of the charging device and the device to be charged in the charging and discharging process can be provided by the corresponding preset signal pin CC1 in the first guide signal pin of the first connector 120.

It should be noted that, in a conventional case, the mechanical switch 140 is in a closed state, and only under the control of an external force, the mechanical switch 140 is in an open state, so as to trigger the charging device to stop charging.

Fig. 15 is a schematic diagram showing an internal structure of a switching test device according to an embodiment of the present application. In the example of fig. 15, the probe connection of the current sensor 130 is arranged between the power pin DC in the first joint 111 and the power pin DC in the second joint 112, the power pin DC in the first joint 111 is connected with the power pin DC in the second joint 112, and the power pin DC is connected with the first connector 120, the ground pin PE in the first joint 111 and the ground pin PE in the second joint 112 are respectively connected with the first connector 120, the pilot signal pin in the first joint 111 and the pilot signal pin in the second joint are respectively connected with the first connector 120, i.e. the first connector 120 can connect both the ground pin PE and the pilot signal pin in the adapter 110 and the power pin DC in the first joint 111 and the temperature pin DC _{Temperature (temperature)} of the second joint 112 to the first connector 120, and a mechanical switch K1 is arranged on the preset signal pin CC1 in the pilot signal pin in the first joint 111 to provide a test basis for the test device.

Fig. 16 is a schematic structural diagram of a switching test device according to an embodiment of the present application. In the example of fig. 16, the mechanical switch 140 (or K1) may be externally displayed on the outer surface of the patch test device 100 or may be internally hidden. There is no limitation in this regard.

The embodiment of the application provides a switching testing device, which further comprises: the two wiring terminals of the mechanical switch are connected between a preset signal pin in the second connector and a corresponding pin in the first connector; the preset signal pin is a connection detection pin in the second joint; the operating part of the mechanical switch is arranged on the shell of the switching testing device. Therefore, the application can control the connection detection condition of the charging equipment and the equipment to be charged in the charging and discharging process through the external operation part of the mechanical switch, thereby providing a precondition for signal connection confirmation in the testing device.

Based on the above analysis of the transit test device 100, the following continues to describe in detail an example of a transit test apparatus provided by the present application in conjunction with the accompanying drawings. Fig. 17 is a schematic structural diagram III of a switching test device according to an embodiment of the present application. In the example of fig. 17, the test device 220 is a first test device, and the first pilot signal pin and the second pilot signal pin in the second connector 210 are respectively connected to the first pilot signal pin and the second pilot signal pin in the first test device 220, so as to transmit various test signal data in the switching test apparatus to the first pilot signal pin and the second pilot signal pin in the first test device 220 through the first pilot signal pin and the second pilot signal pin in the second connector 210; the first grounding pin and the second grounding pin in the second connector are respectively connected with the first grounding pin and the second grounding pin in the first test equipment; corresponding switch units are respectively arranged between a first guide pin and a second guide pin in the first test equipment and between a first grounding pin and a second grounding pin in the first test equipment, for example, a switch unit K2 is connected between the first grounding pin and the second grounding pin, a switch unit K3 is connected between the first guide pin and the second guide pin, and the switch units (K2 and K3) are used for controlling the first connector 111 and the second connector 112 in the test device 200 to be closed and opened, so that fault injection test in charge and discharge test between the charging equipment and the equipment to be charged is realized, and fault problems encountered in the test process are further checked and processed.

The switch unit in the first test device 220 may be an external switch unit, and may be controlled manually or by a computer. The first test device 220 is a test device for fault injection of an object to be tested, and the first test device 220 may be selected according to practical situations, for example, the first test device 220 may be a BOB (Break-Out Box) test device.

Fig. 18 is a schematic diagram illustrating an internal structure of a switching test device according to an embodiment of the present application. In the example of fig. 18, the second connector 210 is connected to the BOB testing device 220, various test signals in the transfer testing apparatus are introduced into the BOB testing device 220 through the second connector 210 mated with the first connector 120, and then the closing and opening test of the charging gun head signal (i.e., the first connector 111) and the charging gun base signal (i.e., the second connector 112) can be achieved by manually controlling the closing or opening of the switching units (K2 and K3). Wherein, switch units are arranged between the same guide signal pins in the switch units K3.

The embodiment of the application provides switching test equipment, wherein the test equipment is first test equipment, and a first guide signal pin and a second guide signal pin in a second connector are respectively connected with the first guide signal pin and the second guide signal pin in the first test equipment; the first grounding pin and the second grounding pin in the second connector are respectively connected with the first grounding pin and the second grounding pin in the first test equipment; corresponding switch units are respectively arranged between the first guide pin and the second guide pin in the first test equipment and between the first grounding pin and the second grounding pin in the first test equipment. Therefore, the application can carry out on-off test on various test signal data in the switching test device through the test function of the first test equipment, thereby realizing the on-off test of the charging gun head signal and the charging gun seat signal.

Based on the above analysis of the transit test device 100, the following continues to describe in detail an example of a transit test apparatus provided by the present application in conjunction with the accompanying drawings. Fig. 19 is a schematic structural diagram of a switching test device according to an embodiment of the present application. In the example of fig. 19, the test device 220 is a second test device.

Wherein the first pilot pin and the second pilot pin in the second connector 210 are respectively connected to the first pilot pin and the second pilot pin in the second test device 220, and the first ground pin and the second ground pin in the second connector 210 are respectively connected to the first ground pin and the second ground pin in the second test device 220; the first temperature detection pin and the second temperature detection pin in the second connector 210 are respectively connected to the first temperature detection pin and the second temperature detection pin in the second test device 220; the power pins in the second connector 210 are connected to the power pins in the second test device 220; the current pins in the second connector 210 are connected to the current pins in the second test device 220; corresponding switch units are respectively arranged between the first guide pin and the second guide pin in the second test equipment 220 and between the first grounding pin and the second grounding pin in the second test equipment 220, such as a switch unit K2 is connected between the first grounding pin and the second grounding pin, and a switch unit K3 is connected between the first guide pin and the second guide pin so as to control the closing and opening of the first joint 111 and the second joint 112 in the test device 200 through the switch units (K2 and K3); each pin in the second test device 220 is connected to the acquisition control unit 221 in the second test device 220, so that various test signals transmitted by each pin in the second connector 210 are acquired by the acquisition control unit 221 in the second test device 220, and a function of data acquisition in a charge and discharge test between the charging device and the device to be charged is realized.

It should be noted that, in addition to the test signal data mentioned in the above description, other data, such as voltage or current waveform diagrams, data protection, etc., are not limited herein.

The second testing device 220 may be a testing device capable of performing data collection testing, and may be selected according to practical situations.

Fig. 20 is a schematic diagram showing an internal structure of a switching test device according to an embodiment of the present application. In the example of fig. 20, the transfer test apparatus 100 and the test apparatus 200 are connected, and the signal of the first connector 111 in the transfer test apparatus 100 is led to the acquisition control unit 221 in the second test device 220 through the second connector 210 mated with the first connector 120, and the signal of the first connector 111 (such as the charging gun head side signal) and the signal of the second connector 112 (such as the charging gun seat side signal) are connected through the switch units (such as K2 and K3) in the second test device 220, so as to realize the closing and opening test of the charging gun head signal and the charging gun seat signal. Because each test signal data can be connected into the acquisition control unit 221, the acquisition control of signals at two ends of the charging equipment (such as a charging gun head) and the equipment to be charged (such as a charging gun seat) can be realized, and then the function of data acquisition is realized. Wherein, switch units are arranged between the same guide signal pins in the switch units K3.

In fig. 20, the power supply signals (v+ and V-) and the output signals (i+ and I-) are input signals and output signals of the current sensor 130.

The embodiment of the application provides switching test equipment, wherein the test equipment is second test equipment, a first guide signal pin and a second guide signal pin in a second connector are respectively connected with the first guide signal pin and the second guide signal pin in the second test equipment, and a first grounding pin and a second grounding pin in the second connector are respectively connected with the first grounding pin and the second grounding pin in the second test equipment; the first temperature detection pin and the second temperature detection pin in the second connector are respectively connected with the first temperature detection pin and the second temperature detection pin in the second test equipment; the power pin in the second connector is connected with the power pin in the second test equipment; the current pin in the second connector is connected with the current pin in the second test equipment; corresponding switch units are respectively arranged between the first guide pin and the second guide pin in the second test equipment and between the first grounding pin and the second grounding pin in the second test equipment; each pin in the second test equipment is connected with the acquisition control unit in the second test equipment. Therefore, the application can perform data acquisition test on various test signal data in the switching test device through the function test of the data acquisition of the second test equipment, thereby realizing the function of data acquisition in the charge and discharge test between the charging equipment and the equipment to be charged.

The above description is only of the preferred embodiments of the present application and is not intended to limit the present application, but various modifications and variations can be made to the present application by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the protection scope of the present application.

Claims (10)

1. A transfer test device, the transfer test device comprising: an adapter and a first connector;

the first connector of the adapter is used for connecting charging equipment, and the second connector of the adapter is used for connecting equipment to be charged;

the first connector is connected with the first connector and the second connector through a preset conductor respectively;

The first connector is used for connecting a second connector in the testing device, and the second connector and the first connector are connectors matched with each other.

2. The transit testing device of claim 1, wherein the power pin in the first connector is connected to the power pin in the second connector by a predetermined conductor, and the ground pin in the first connector and the ground pin in the second connector are connected to a first ground pin and a second ground pin, respectively;

The pilot signal pin in the first connector and the pilot signal pin in the second connector are respectively connected with the first pilot signal pin and the second pilot signal pin in the first connector.

3. The transit testing device of claim 2, wherein the predetermined conductors include, but are not limited to, copper bars.

4. The transit testing device of claim 2, wherein the power pin in the first header and the power pin in the second header are further respectively connected to the power pin in the first connector.

5. The transit testing device of claim 1, wherein the temperature pin in the first header and the temperature pin in the second header are connected to a first temperature pin and a second pin in the first connector, respectively.

6. The transit testing device of claim 1, wherein the transit testing device further comprises: the probe of the current sensor is connected between the power pin in the first connector and the power pin in the second connector;

the current sensor is also connected to a current pin in the first connector.

7. The transit testing device of claim 1, wherein the transit testing device further comprises: the two wiring terminals of the mechanical switch are connected between a preset signal pin in the second connector and a corresponding pin in the first connector; the preset signal pin is a connection detection pin in the second joint;

The operating part of the mechanical switch is arranged on the shell of the switching testing device.

8. A transit testing apparatus, the transit testing apparatus comprising: the switching test device, test device of any of the preceding claims 1-7, the test device comprising: a second connector and a test device;

The first connector in the switching test device is connected with the second connector, and the second connector is connected with the test equipment.

9. The transit test device of claim 8, wherein the test device is a first test device, and the first and second pilot pins in the second connector are connected to the first and second pilot pins in the first test device, respectively;

The first grounding pin and the second grounding pin in the second connector are respectively connected with the first grounding pin and the second grounding pin in the first test equipment;

corresponding switch units are respectively arranged between a first guide pin and a second guide pin in the first test equipment and between a first grounding pin and a second grounding pin in the first test equipment.

10. The transition testing device defined in claim 8, wherein the testing device is a second testing device, wherein a first pilot pin and a second pilot pin in the second connector are connected to a first pilot pin and a second pilot pin in the second testing device, respectively, and wherein a first ground pin and a second ground pin in the second connector are connected to a first ground pin and a second ground pin in the second testing device, respectively;

the first temperature detection pin and the second temperature detection pin in the second connector are respectively connected with the first temperature detection pin and the second temperature detection pin in the second test equipment;

the power pin in the second connector is connected with the power pin in the second test equipment;

The current pin in the second connector is connected with the current pin in the second test equipment;

Corresponding switch units are respectively arranged between the first guide pin and the second guide pin in the second test equipment and between the first grounding pin and the second grounding pin in the second test equipment; each pin in the second test equipment is connected with the acquisition control unit in the second test equipment.