CN220931953U - Collector plating film thickness detection device - Google Patents
Collector plating film thickness detection device Download PDFInfo
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- CN220931953U CN220931953U CN202322888566.XU CN202322888566U CN220931953U CN 220931953 U CN220931953 U CN 220931953U CN 202322888566 U CN202322888566 U CN 202322888566U CN 220931953 U CN220931953 U CN 220931953U
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- 238000001514 detection method Methods 0.000 title claims abstract description 97
- 238000007747 plating Methods 0.000 title claims description 29
- 230000007246 mechanism Effects 0.000 claims abstract description 47
- 239000011248 coating agent Substances 0.000 claims abstract description 21
- 238000000576 coating method Methods 0.000 claims abstract description 21
- 239000007788 liquid Substances 0.000 claims description 58
- 238000001802 infusion Methods 0.000 claims description 21
- 238000012546 transfer Methods 0.000 claims description 12
- 239000010410 layer Substances 0.000 description 57
- 238000000034 method Methods 0.000 description 19
- 238000012360 testing method Methods 0.000 description 17
- 238000001816 cooling Methods 0.000 description 7
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- 238000006243 chemical reaction Methods 0.000 description 2
- 239000011247 coating layer Substances 0.000 description 2
- 230000001276 controlling effect Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000013475 authorization Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000012938 design process Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000001493 electron microscopy Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
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- 229910052744 lithium Inorganic materials 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
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Abstract
The utility model discloses a current collector coating thickness detection device. The collector coating thickness detection device comprises a main body, a conveying mechanism and a detection mechanism. The main body is provided with a first chamber; the conveying mechanism is arranged on the main body and positioned outside the first chamber, and is at least used for conveying the heat-conducting medium to the first chamber; the detection mechanism is arranged in the first cavity, the detection mechanism comprises a first electrode assembly and a first temperature detection element, the first electrode assembly is used for electrifying a current collector to be detected, and the first temperature detection element is used for detecting the temperature of the heat conducting medium in the first cavity. The current collector coating thickness detection device does not need to cut and slice the current collector to be detected, and can rapidly detect and obtain the thickness of the coating on the current collector.
Description
Technical Field
The utility model relates to the technical field of current collector detection, in particular to a current collector coating thickness detection device.
Background
The composite current collector is a composite conductive film with copper or aluminum plated on two sides of a high polymer base film, and can be used in a lithium battery to improve the safety and energy density of the battery compared with the traditional current collector.
The thickness of the coating layer of the composite current collector is very thin, usually 1-4 μm, and is very inconvenient to measure. The prior art typically uses electron microscopy to measure the composite current collector coating thickness. But use the electron microscope to detect, need to be with the product cutting film-making that awaits measuring, complex operation and consuming time are long, and detection speed is slow.
Disclosure of utility model
The utility model mainly aims to provide a current collector plating film thickness detection device which can quickly detect and obtain the thickness of a plating film on a current collector without cutting and flaking the current collector to be detected.
According to an aspect of the present utility model, there is provided a current collector plating film thickness detection device including:
The device comprises a main body, wherein a first chamber is arranged on the main body;
The conveying mechanism is arranged on the main body and positioned outside the first chamber, and is at least used for conveying the heat conducting medium to the first chamber;
the detection mechanism is arranged in the first cavity and comprises a first electrode assembly and a first temperature detection element, the first electrode assembly is used for electrifying a current collector to be detected, and the first temperature detection element is used for detecting the temperature of the heat conducting medium in the first cavity.
Further, a first heat insulating layer is arranged on the inner wall surface of the first chamber.
Further, a second chamber is further arranged on the main body, the second chamber is in accordance with the shape of the first chamber, and the conveying mechanism is used for conveying the heat conducting medium to the second chamber; the current collector coating thickness detection device further comprises:
The comparison mechanism is arranged in the second cavity and comprises a second electrode assembly and a second temperature detection element, the second electrode assembly is used for electrifying a conductive element with a known resistance, and the second temperature detection element is used for detecting the temperature of the heat conducting medium in the second cavity.
Further, the inner wall surface of the second chamber is provided with a second heat insulating layer.
Further, the first electrode assembly and the second electrode assembly each include an anode electrode and a cathode electrode, the anode electrode and the cathode electrode are spaced apart, and detachable conductive clips are arranged on the anode electrode and the cathode electrode.
Further, the conveying mechanism includes:
A liquid storage container for storing the heat-conducting medium;
The infusion tube comprises a first infusion tube and a second infusion tube, two ends of the first infusion tube are respectively communicated with the first cavity and the liquid storage container, and two ends of the second infusion tube are respectively communicated with the second cavity and the liquid storage container;
The liquid return pipe comprises a first liquid return pipe and a second liquid return pipe, two ends of the first liquid return pipe are respectively communicated with the bottom of the first cavity and the liquid storage container, and two ends of the second liquid return pipe are respectively communicated with the second cavity and the liquid storage container.
Further, the current collector coating thickness detection device further includes:
And the temperature control system is arranged on the main body and used for controlling the temperature of the heat conducting medium in the liquid storage container.
Further, agitators are arranged in the first chamber and the second chamber.
Further, the first temperature detecting element and the second temperature detecting element each include a thermocouple.
Further, liquid level detection elements are arranged in the first cavity and the second cavity.
According to the utility model, the main body, the conveying mechanism and the detecting mechanism are arranged on the current collector plating film thickness detecting device, the heat conducting medium is conveyed to the first cavity on the main body through the conveying mechanism, the first electrode assembly is used for supplying power to the current collector placed in the first cavity, the first temperature detecting element is used for detecting the temperature of the heat conducting medium, and the thickness h of the conductive layer on the current collector can be obtained through conversion by combining a specific physical calculation formula. Compared with the prior art that the product needs to be cut and flaked and the electron microscope is adopted for observation and measurement, the current collector plating film thickness detection device can more rapidly detect and convert the thickness h of the conductive layer on the current collector, and is short in time consumption and higher in detection efficiency.
Drawings
The accompanying drawings, which are included to provide a further understanding of the utility model and are incorporated in and constitute a part of this specification, illustrate embodiments of the utility model and together with the description serve to explain the utility model and do not constitute a limitation on the utility model. In the drawings:
Fig. 1 is a schematic structural diagram of a current collector plating film thickness detection device according to an embodiment of the present utility model;
fig. 2 is a side view of a current collector coating thickness detection device according to an embodiment of the present utility model;
Fig. 3 is a flowchart of a method for detecting a thickness of a current collector plating film according to an embodiment of the present utility model.
Wherein the above figures include the following reference numerals:
10. A main body; 11. a first chamber; 12. a second chamber; 20. a conveying mechanism; 21. a liquid storage container; 22. a first infusion tube; 23. a second infusion tube; 24. a first liquid return pipe; 25. a second liquid return pipe; 30. a detection mechanism; 31. a first electrode assembly; 32. a first temperature detecting element; 40. a first insulating layer; 50. a contrast mechanism; 51. a second electrode assembly; 52. a second temperature detecting element; 60. a conductive element; 70. a second insulating layer; 80. a temperature control system; 90. a current collector; 100. a stirrer.
Detailed Description
It should be noted that, without conflict, the embodiments of the present utility model and features of the embodiments may be combined with each other. The utility model will be described in detail below with reference to the drawings in connection with embodiments.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of exemplary embodiments according to the present utility model. As used herein, the singular is also intended to include the plural unless the context clearly indicates otherwise, and furthermore, it is to be understood that the terms "comprises" and/or "comprising" when used in this specification are taken to specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof.
The relative arrangement of the components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present utility model unless it is specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective parts shown in the drawings are not drawn in actual scale for convenience of description. Techniques, methods, and apparatus known to one of ordinary skill in the relevant art may not be discussed in detail, but should be considered part of the authorization specification where appropriate. In all examples shown and discussed herein, any specific values should be construed as merely illustrative, and not a limitation. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further discussion thereof is necessary in subsequent figures.
Referring to fig. 1 to 2, according to an embodiment of the present utility model, there is provided a current collector plating film thickness detection device including a main body 10, a conveying mechanism 20, and a detection mechanism 30.
Wherein the main body 10 is provided with a first chamber 11; the conveying mechanism 20 is arranged on the main body 10 and is positioned outside the first chamber 11, and the conveying mechanism 20 is at least used for conveying the heat-conducting medium to the first chamber 11; the detection mechanism 30 is disposed in the first chamber 11, the detection mechanism 30 includes a first electrode assembly 31 and a first temperature detection element 32, the first electrode assembly 31 is used for energizing the current collector 90 to be detected, and the first temperature detection element 32 is used for detecting the temperature of the heat conducting medium in the first chamber 11.
When the thickness of the current collector 90 is detected by the current collector plating film thickness detection device in the present embodiment, the current collector 90 is first placed in the first chamber 11 and electrically connected to the first electrode assembly 31, then the heat transfer medium is transferred to the first chamber 11 by the transfer mechanism 20, and then the first electrode assembly 31 is turned on to supply power to the current collector 90. Then, the temperature of the heat conductive medium is detected by the first temperature detecting element 32, and the thickness of the conductive layer on the current collector 90 is calculated based on the detection result.
In actually detecting and calculating the thickness of the conductive layer of current collector 90, different parameter variations may be controlled to detect the thickness of the conductive layer of current collector 90. For example, in the case of actually detecting the thickness of the conductive layer of the current collector 90, when the current collector 90 is supplied with power by the first electrode assembly 31, the heat conductive medium in the first chamber 11 may be sequentially detected twice by the first temperature detecting element 32, and the temperature values may be recorded twice, respectively. Thereafter, using the temperature value, the amount of heat released by the current collector 90, i.e., q=cmΔt, can be calculated, where c is the specific heat capacity of the heat transfer medium, c is a known amount when the heat transfer medium is fixed, m is the mass of the heat transfer medium in the first chamber 11, and Δt is the difference between the temperatures measured before and after the first temperature detecting element 32, and can be directly calculated. Then, the resistance of the conductive layer on the current collector 90 can be obtained by performing calculation according to the formula q=i 2 Rt, where I is the current provided by the first electrode assembly 31 to the current collector 90, R is the resistance of the conductive layer on the current collector 90, and t is the power supply time of the first electrode assembly 31. Finally, the thickness h of the conductive layer of the current collector 90 may be calculated using the formula r=ρl/S and the formula s=h×d, where ρ is the resistivity of the conductive layer of the current collector 90, S is the cross-sectional area of the conductive layer, d is the width of the conductive layer of the current collector 90, L is the length of the conductive layer of the current collector 90, ρ is known, and thus the thickness h of the conductive layer can be calculated.
That is, in the present embodiment, by providing the main body 10, the conveying mechanism 20, and the detecting mechanism 30 on the current collector plating film thickness detecting device, the heat-conducting medium is conveyed to the first chamber 11 on the main body 10 by the conveying mechanism 20, the current collector 90 placed in the first chamber 11 is powered by the first electrode assembly 31, the temperature of the heat-conducting medium is detected by the first temperature detecting element 32, and the thickness h of the conductive layer on the current collector 90 can be obtained by conversion in combination with a specific physical calculation formula. Compared with the prior art, which needs to cut and slice the product and adopts the mode of electron microscope observation and measurement, the current collector plating film thickness detection device in the embodiment can detect and convert the thickness h of the conductive layer on the current collector 90 more rapidly, and has short time consumption and higher detection efficiency.
As shown in fig. 1 and 2, the main body 10 in this embodiment may be a box structure, and the first chamber 11 is preferably a closed cavity, so as to avoid the influence of the external environment on the heat conducting medium or the current collector 90 in the first chamber 11. Further, in order to improve the detection accuracy of the detection device, the first heat insulating layer 40 is provided on the inner wall surface of the first chamber 11 in this embodiment, and the first heat insulating layer 40 may be, for example, a heat insulating foam or a heat insulating foam. By the action of the first heat insulating layer 40, the heat transfer medium in the first chamber 11 can be isolated from the external environment, and heat exchange between the heat transfer medium and the external environment can be avoided, so that the detection accuracy of the current collector plating film thickness detection device in the present embodiment can be improved.
In order to further discharge the influence of the external environment on the detection and calculation result of the thickness of the conductive layer of the current collector 90, the body 10 of the current collector plating thickness detection device in this embodiment is further provided with a second chamber 12, and the second chamber 12 conforms to the shape of the first chamber 11, and the conveying mechanism 20 can simultaneously convey the heat-conducting medium to the first chamber 11 and the second chamber 12. The current collector coating thickness detection device further comprises a comparison mechanism 50, the comparison mechanism 50 is disposed in the second chamber 12, the comparison mechanism 50 comprises a second electrode assembly 51 and a second temperature detection element 52, the second electrode assembly 51 is used for energizing the conductive element 60 with a known resistance, the second temperature detection element 52 is used for detecting the temperature of the heat conducting medium in the second chamber 12, and optionally, the conductive element 60 in the embodiment can be a conductive wire, a conductive sheet or the like.
In this embodiment, the second chamber 12 is provided, and the comparison mechanism 50 is correspondingly provided in the second chamber 12 to energize and detect the conductive element 60 with a known resistance, so as to discharge detection errors caused by environmental influences.
Specifically, by providing the contrast mechanism 50 and the second chamber 12 to detect different physical quantities, different physical principles may be utilized to measure and scale the thickness of the conductive layer on the current collector 90.
For example:
scheme 1 (time):
In this embodiment, a same environment may be established to replace the current collector 90 with the conductive element 60 with a known resistance for comparison test, the mass of the current, the heat-conducting medium and the heat-conducting medium for comparison test are the same as those in the first chamber 11, the resistance of the conductive element 60 is R1, and the resistance of the current collector 90 to be tested is R, at this time, the test may be performed in the second chamber 12 for a period of time t2, and the temperature of the heat-conducting medium in the second chamber 12 reaches a certain temperature, and then the test is performed for a period of time t1 when the temperature of the heat-conducting medium in the second chamber 12 reaches the same temperature as that in the first chamber 11. Since the temperatures of the first chamber 11 and the second chamber are the same, q1=q2, I are equal, then r=r1t2/t 1. From this, R is calculated, and then the thickness h of the conductive layer of the current collector 90 is calculated using the formula r=ρl/S and the formula s=h×d. Therefore, the calculation steps can be reduced by setting the comparison test, the influence of the environment is eliminated, and the obtained result is more accurate.
Scheme 2 (regulated current):
And establishing the same environment to replace the current collector 90 with the conductive element 60 with the known resistance for comparison test, wherein the mass of the heat conducting medium and the mass of the heat conducting medium for comparison test are the same, the resistance of the conductive element 60 is R 1, and the resistance of the current collector 90 to be tested to be electrically measured is R. The first chamber 11 and the second chamber 12 are tested simultaneously (the first chamber 11 is started for more than ten seconds and then the reference chamber is restarted, so that the heating current of the reference chamber can be regulated by analyzing the temperature rise condition of the test chamber within the time difference range), the current of the second chamber 12 is dynamically regulated and recorded, the temperature rise curve of the second chamber 12 is consistent with the temperature rise curve of the first chamber 11, the temperature of the first chamber 11 and the temperature rise curve of the second chamber 12 are the same after a certain time, the square I 1 2 of the current in the process is integrated, and the heat Q of two environments is the same, so that the method can be obtained From this, R can be calculated, and then the thickness h of the conductive layer of the current collector 90 is calculated using the formula r=ρl/S and the formula s=h×d. Similarly, the embodiment can exclude the influence of the environment by setting the comparison test, and the obtained result is more accurate.
Further, the inner wall surface of the second chamber 12 is provided with a second heat insulating layer 70. The second insulating layer 70 may be a structure such as a heat insulating foam or a heat insulating foam. By the action of the second heat insulating layer 70, the heat transfer medium in the second chamber 12 can be isolated from the external environment, and heat exchange between the heat transfer medium and the external environment can be avoided, so that the detection accuracy of the current collector plating film thickness detection device in the present embodiment can be improved.
Further, the first electrode assembly 31 and the second electrode assembly 51 in the present embodiment each include a positive electrode and a negative electrode, which are spaced apart, and a detachable conductive clip (not shown) is provided on each of the positive electrode and the negative electrode. In actual testing, the two ends of the current collector 90 and the conductive element 60 are respectively electrically connected with the positive electrode and the negative electrode through the conductive clips, so that the structure is simple, the disassembly and assembly are more convenient, and the detection efficiency of the current collector plating film thickness detection device in the embodiment can be improved. In the present utility model, the conductive clip is detachable, and the conductive clip can be replaced, and the current collector 90 can be tested for single-sided overcurrent or double-sided overcurrent. Alternatively, the conductive clip in this embodiment may be a metal clip or the like capable of clamping the current collector 90 and the conductive element 60, and any other modification forms within the concept of the present utility model are within the scope of the present utility model.
Further, the agitators 100 are disposed in the first chamber 11 and the second chamber 12 in the present embodiment, and in the present embodiment, by disposing the agitators 100 in the first chamber 11 and the second chamber 12, the heat-conducting medium in the first chamber 11 and the second chamber 12 can be rapidly agitated and mixed, so as to ensure temperature balance of the heat-conducting medium everywhere, further ensure accuracy of detection results of the first temperature detecting element 32 and the second temperature detecting element 52, and finally, thickness of the conductive layer on the current collector 90 in the present embodiment can be converted more accurately.
Alternatively, the first temperature detecting element 32 and the second temperature detecting element 52 each include a thermocouple, however, in other embodiments of the present utility model, the first temperature detecting element 32 and the second temperature detecting element 52 may also be a thermometer, etc., and any other modifications that are within the spirit of the present utility model are within the scope of the present utility model.
Further, in this embodiment, the first chamber 11 and the second chamber 12 are both provided with a liquid level detecting element, which may be a liquid level float or the like, and by the action of the liquid level detecting element, the liquid levels in the first chamber 11 and the second chamber 12 can be detected, so that the liquid levels in the first chamber 11 and the second chamber 12 remain the same, and the current collector 90 and the conductive element 60 can be conveniently tested and compared.
As shown in fig. 1, the delivery mechanism 20 in this embodiment includes a liquid reservoir 21, an infusion tube, and a return tube.
Wherein the liquid storage container 21 is used for storing a heat-conducting medium; the infusion tube comprises a first infusion tube 22 and a second infusion tube 23, two ends of the first infusion tube 22 are respectively communicated with the first chamber 11 and the liquid storage container 21, and two ends of the second infusion tube 23 are respectively communicated with the second chamber 12 and the liquid storage container 21; the liquid return pipe comprises a first liquid return pipe 24 and a second liquid return pipe 25, wherein two ends of the first liquid return pipe 24 are respectively communicated with the bottom of the first chamber 11 and the liquid storage container 21, and two ends of the second liquid return pipe 25 are respectively communicated with the second chamber 12 and the liquid storage container 21.
In the practical use process, a liquid pump structure can be arranged on the first infusion tube 22, the second infusion tube 23, the first liquid return tube 24 and the second liquid return tube 25, and under the action of the liquid storage container 21, the infusion tube, the liquid return tube and the liquid pump structure, a heat conducting medium can be conveyed to the first chamber 11 and the second chamber 12 when a test is needed, and after the test is finished, the heat conducting medium in the first chamber 11 and the second chamber 12 is pumped back to the liquid storage container 21, and then enters the first chamber 11 and the second chamber 12 for next detection when the temperature of the heat conducting medium returns to the initial temperature, so that the structure is simple and the use is convenient.
Further, the current collector coating thickness detection device further comprises a temperature control system 80, wherein the temperature control system 80 is arranged on the main body 10 and is used for controlling the temperature of the heat conducting medium in the liquid storage container 21. After each test, the warmed heat-conducting liquid is returned to the liquid storage container 21, and the temperature control system 80 performs a cooling treatment on the liquid in the liquid storage container, so that the temperature of the heat-conducting medium flowing into the first chamber 11 and the second chamber 12 at each test is constant. Optionally, the temperature control system in this embodiment includes a cooling device, a controller, and a detecting element, where the cooling device is used to cool the heat conducting medium in the liquid storage container 21, the detecting element may be a temperature sensor, etc. configured to detect the temperature of the heat conducting medium in the liquid storage container 21, and the controller is electrically connected to the detecting element and controls the working condition of the cooling device. Specifically, after the detection element detects that the temperature of the heat-conducting medium in the liquid storage container 21 reaches the predetermined value, the controller controls the cooling device to stop cooling, ensuring that the temperature in the liquid storage container 21 remains constant. In this embodiment, the cooling device may be a heat exchanger or the like, and any other modification forms under the concept of the present utility model are within the scope of the present utility model.
The heat conducting medium in this embodiment is a medium that has a small specific heat capacity and does not react with the current collector, such as oil, so that the change in heat of the environment is more easily measured. In the actual design process, the current collector thickness detection device is further provided with a calculation module, and the calculation module can be a computer or other structures, and can calculate the aforementioned physical parameters, so that the detection efficiency of the current collector thickness detection device in the embodiment can be further improved.
As shown in fig. 1 to 3, according to another aspect of the present utility model, there is also provided a current collector thickness detection method. The current collector thickness detection method is implemented by adopting the current collector coating thickness detection device. In this embodiment, the method for detecting the thickness of the current collector coating mainly includes three steps, and the three steps will be described in detail below.
In actually detecting the thickness of the coating layer, i.e., the conductive layer, on the current collector 90, the detection may be performed according to different physical principles. Three different methods are listed in the utility model for detection, and are specifically as follows:
Method 1: measuring temperature
Step S1: a sample of the current collector 90 is placed in the first chamber 11, and a heat transfer medium is introduced into the first chamber 11 by the transfer mechanism 20, and then an electric current is introduced into the current collector 90 by the first electrode assembly 31.
Step S2: the first temperature detecting element 32 detects a temperature change of the heat-conducting medium in the first chamber 11. In the test process, the temperature of the heat conducting medium in the first chamber 11 is detected twice by using the first temperature detecting element 32.
Step S3: the heat Q generated when the current collector 90 is energized is calculated from the detection result of the first temperature detecting element 32, the resistance R of the conductive layer of the current collector 90 is calculated from Q, and the thickness h of the conductive layer of the current collector 90 is calculated from the resistance R.
Specifically, in this step, first, the temperature difference Δt detected by the heat conducting medium twice is calculated according to the detection result of the first temperature detecting element 32 twice, the heat Q generated when the current collector 90 is electrified is calculated by using the formula q=cmΔt, the resistance R of the conductive layer of the current collector 90 is calculated by using the formula q=i 2 Rt, where c is the specific heat capacity of the heat conducting medium, c is a fixed time, m is the mass of the heat conducting medium in the first chamber 11, I is the electrified current of the first electrode assembly 31, and T is the electrified time of the first electrode assembly 31. Finally, calculating the thickness h of the conductive layer of the current collector 90 by using a formula r=ρl/S and a formula s=h×d, wherein ρ is the resistivity of the conductive layer of the current collector 90, S is the cross-sectional area of the conductive layer, d is the width of the conductive layer of the current collector 90, L is the length of the conductive layer of the current collector 90, ρ is known, and thus the thickness h of the conductive layer can be calculated.
Method 2: time measurement
The method is substantially the same as method 1 except that: step S1 in this embodiment further includes: the conductive element 60 of known resistance is placed in the second chamber 12 of the current collector plating film thickness detection device, and the heat conductive medium of the same mass as the first chamber 11 is introduced into the second chamber 12 by the conveying mechanism 20, and then the second electrode assembly 51 of the current collector plating film thickness detection device is used to supply current to the conductive element 60, and the supply current to the first electrode assembly 31 and the second electrode assembly 51 is made the same.
In step S2, the temperature of the heat-conducting medium in the first chamber 11 is detected by the first temperature detecting element 32 until the temperature of the heat-conducting medium reaches tstart, and the energization time T1 of the first electrode assembly 31 is recorded; the temperature of the heat-conducting medium in the second chamber 12 is detected by the second temperature detecting element 52 until the temperature of the heat-conducting medium reaches tstart, and the energization time T2 of the second electrode assembly 51 is recorded.
In step S3, the resistance R of the conductive layer of the current collector 90 is calculated according to the same principle of temperature change in the first chamber 11 and the second chamber 12, that is, q1=q2, using the formula r=r1t2/t 1, where R1 is the resistance of the conductive element 60. Finally, calculating the thickness h of the conductive layer of the current collector 90 by using a formula r=ρl/S and a formula s=h×d, wherein ρ is the resistivity of the conductive layer of the current collector 90, S is the cross-sectional area of the conductive layer, d is the width of the conductive layer of the current collector 90, L is the length of the conductive layer of the current collector 90, ρ is known, and thus the thickness h of the conductive layer can be calculated.
Method 3: the method of adjusting the current is substantially the same as method 1, except that step S1 of the method further comprises: placing the conductive element 60 with known resistance into the second chamber 12 of the current collector coating thickness detection device, introducing a heat conducting medium with the same mass as the first chamber 11 into the second chamber 12 by using the conveying mechanism 20, and then introducing current to the conductive element 60 by using the second electrode assembly 51 of the current collector coating thickness detection device;
In step S2, the temperatures in the first chamber 11 and the second chamber 12 are monitored by the first temperature detecting element 32 and the second temperature detecting element 52, respectively, and the supply currents of the first electrode assembly 31 and the second electrode assembly 51 are adjusted so that the temperature rise curve in the first chamber 11 is the same as the temperature rise curve in the second chamber 12;
in step S3, the square of the current in step S2 is integrated, and the formula is used according to the principle that the temperature change of the heat-conducting medium in the first chamber 11 and the second chamber 12 is the same in the same time The resistance R of the conductive layer of the current collector 90 is calculated, where R 1 is the resistance of the conductive element 60, I 1 is the supply current of the second electrode assembly 51, I 2 is the supply current of the first electrode assembly 31, which is measured during the test, is a constant known amount, and t is the supply time of the first electrode assembly 31 and the second electrode assembly 51, which are the same. Finally, calculating the thickness h of the conductive layer of the current collector 90 by using a formula r=ρl/S and a formula s=h×d, wherein ρ is the resistivity of the conductive layer of the current collector 90, S is the cross-sectional area of the conductive layer, d is the width of the conductive layer of the current collector 90, L is the length of the conductive layer of the current collector 90, ρ is known, and thus the thickness h of the conductive layer can be calculated.
From the three methods described above, it can be known that:
According to the embodiment, on the basis of the structure of the current collector coating thickness detection device, a current collector coating thickness detection method can be provided, when the current collector coating thickness detection device detects, a current collector sample is placed in a heat insulation environment, the current collector is electrified, heat Q generated by the electrified current collector is obtained through calculation of temperature change of the detection environment, then resistance R of a current collector conducting layer is obtained through calculation of the Q, and thickness h of the current collector conducting layer can be obtained through calculation according to the R. The method for detecting the thickness of the current collector coating is simple to operate, the detection result can be obtained quickly through computer calculation, the average thickness of the coating is obtained through testing, and measurement errors caused by uneven thickness are avoided.
Spatially relative terms, such as "above … …," "above … …," "upper surface on … …," "above," and the like, may be used herein for ease of description to describe one device or feature's spatial location relative to another device or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "above" or "over" other devices or structures would then be oriented "below" or "beneath" the other devices or structures. Thus, the exemplary term "above … …" may include both orientations "above … …" and "below … …". The device may also be positioned in other different ways (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.
In addition, the terms "first", "second", etc. are used to define the components, and are only for convenience of distinguishing the corresponding components, and the terms have no special meaning unless otherwise stated, and therefore should not be construed as limiting the scope of the present utility model.
The above is only a preferred embodiment of the present utility model, and is not intended to limit the present utility model, but various modifications and variations can be made to the present utility model by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model should be included in the protection scope of the present utility model.
Claims (10)
1. A current collector plating film thickness detection device, characterized by comprising:
A main body (10), wherein a first chamber (11) is arranged on the main body (10);
A conveying mechanism (20), wherein the conveying mechanism (20) is arranged on the main body (10) and is positioned outside the first chamber (11), and the conveying mechanism (20) is at least used for conveying a heat conducting medium to the first chamber (11);
The detection mechanism (30), detection mechanism (30) set up in first cavity (11), detection mechanism (30) include first electrode subassembly (31) and first temperature detection element (32), first electrode subassembly (31) are used for treating the electric current collector (90) of detection, first temperature detection element (32) are used for detecting the temperature of heat conduction medium in first cavity (11).
2. The current collector plating film thickness detection device according to claim 1, wherein a first heat insulating layer (40) is provided on an inner wall surface of the first chamber (11).
3. The current collector plating film thickness detection device according to claim 1, wherein a second chamber (12) is further provided on the main body (10), the second chamber (12) conforms to the shape of the first chamber (11), and the conveying mechanism (20) is configured to convey the heat-conducting medium to the second chamber (12); the current collector coating thickness detection device further comprises:
The comparison mechanism (50), the comparison mechanism (50) set up in second cavity (12), comparison mechanism (50) include second electrode subassembly (51) and second temperature detection element (52), second electrode subassembly (51) are used for the electric conduction element (60) of known resistance, second temperature detection element (52) are used for detecting the temperature of heat conduction medium in second cavity (12).
4. The current collector plating film thickness detection device according to claim 3, wherein the inner wall surface of the second chamber (12) is provided with a second heat insulating layer (70).
5. A current collector plating film thickness detection device according to claim 3, wherein the first electrode assembly (31) and the second electrode assembly (51) each include a positive electrode and a negative electrode, the positive electrode and the negative electrode are spaced apart, and detachable conductive clips are provided on each of the positive electrode and the negative electrode.
6. A current collector plating film thickness detection apparatus according to claim 3, wherein the conveying mechanism (20) includes:
-a reservoir (21), the reservoir (21) being adapted to store the heat transfer medium;
The infusion tube comprises a first infusion tube (22) and a second infusion tube (23), two ends of the first infusion tube (22) are respectively communicated with the first chamber (11) and the liquid storage container (21), and two ends of the second infusion tube (23) are respectively communicated with the second chamber (12) and the liquid storage container (21);
The liquid return pipe comprises a first liquid return pipe (24) and a second liquid return pipe (25), two ends of the first liquid return pipe (24) are respectively communicated with the bottom of the first cavity (11) and the liquid storage container (21), and two ends of the second liquid return pipe (25) are respectively communicated with the second cavity (12) and the liquid storage container (21).
7. The current collector plating film thickness detection device according to claim 6, further comprising:
And a temperature control system (80), wherein the temperature control system (80) is arranged on the main body (10) and is used for controlling the temperature of the heat conducting medium in the liquid storage container (21).
8. A current collector plating film thickness detection apparatus according to claim 3, wherein a stirrer (100) is provided in each of the first chamber (11) and the second chamber (12).
9. A current collector plating film thickness detection device according to claim 3, wherein the first temperature detection element (32) and the second temperature detection element (52) each include a thermocouple.
10. A current collector plating film thickness detection device according to claim 3, wherein liquid level detection elements are provided in both the first chamber (11) and the second chamber (12).
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| Application Number | Priority Date | Filing Date | Title |
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| CN202322888566.XU CN220931953U (en) | 2023-10-26 | 2023-10-26 | Collector plating film thickness detection device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322888566.XU CN220931953U (en) | 2023-10-26 | 2023-10-26 | Collector plating film thickness detection device |
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| CN220931953U true CN220931953U (en) | 2024-05-10 |
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| CN202322888566.XU Active CN220931953U (en) | 2023-10-26 | 2023-10-26 | Collector plating film thickness detection device |
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2023
- 2023-10-26 CN CN202322888566.XU patent/CN220931953U/en active Active
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