CN220872528U - Power chip testing device - Google Patents
Power chip testing device Download PDFInfo
- Publication number
- CN220872528U CN220872528U CN202322566107.XU CN202322566107U CN220872528U CN 220872528 U CN220872528 U CN 220872528U CN 202322566107 U CN202322566107 U CN 202322566107U CN 220872528 U CN220872528 U CN 220872528U
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- China
- Prior art keywords
- outer frame
- test board
- power chip
- testing
- chip testing
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- 238000012360 testing method Methods 0.000 title claims abstract description 97
- 230000007246 mechanism Effects 0.000 claims abstract description 25
- 230000000087 stabilizing effect Effects 0.000 claims abstract description 12
- 238000004804 winding Methods 0.000 claims description 17
- 230000000694 effects Effects 0.000 claims description 8
- 238000001816 cooling Methods 0.000 claims description 7
- 230000000149 penetrating effect Effects 0.000 claims description 5
- 230000003044 adaptive effect Effects 0.000 claims description 2
- 238000009434 installation Methods 0.000 abstract description 5
- 230000006978 adaptation Effects 0.000 abstract description 3
- 230000006835 compression Effects 0.000 abstract description 3
- 238000007906 compression Methods 0.000 abstract description 3
- 210000004907 gland Anatomy 0.000 abstract description 3
- 230000017525 heat dissipation Effects 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000009975 flexible effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model belongs to the technical field of electronic testing, and particularly discloses a power chip testing device which comprises an outer frame, wherein an operating table is arranged on the outer surface of the outer frame, a testing plate is movably installed at the top of the outer frame, a pushing mechanism for determining the installation position of the testing plate is arranged at the top of the outer frame, an arc pressing groove is formed in the outer surface of the testing plate, a stabilizing mechanism for fixing the testing plate is arranged at the top of the outer frame, and an inner testing box is arranged in the outer frame. This power chip testing arrangement can let the cardboard push away and move to the exact position along the test board through pushing away tight mechanism, and cooperation stabilizing mean can let spacing compression table gland in the indent of test board to accomplish the installation to the test board, only need the release adaptation cassette when dismantling the test board to the spacing of V type inserted bar can, in order to reach the purpose that the test board is tested to the chip of different models.
Description
Technical Field
The application relates to the technical field of electronic testing, in particular to a power chip testing device.
Background
The power chip testing device is special equipment for testing and verifying a power chip, and the power chip is an integrated circuit chip special for power management and power conversion and is commonly used in the fields of power adapters, DC-DC converters and battery management systems.
Most of the existing power chip testing devices are integrated, so that a testing board is difficult to detach from an outer frame, chips with different specifications and models cannot be tested, and for chips with specific specifications, the testing device cannot provide necessary testing functions and modules, so that all performances and parameters of the chips cannot be tested sufficiently.
Disclosure of utility model
In view of the above, the present utility model is directed to solving the drawbacks of the prior art, and provides a power chip testing device for solving the problems of the prior art.
In order to achieve the above purpose, the utility model provides a power chip testing device, which comprises an outer frame, wherein an operation console is arranged on the outer surface of the outer frame, a testing plate is movably arranged at the top of the outer frame, a pushing mechanism for determining the installation position of the testing plate is arranged at the top of the outer frame, an arc pressing groove is formed in the outer surface of the testing plate, a stabilizing mechanism for fixing the testing plate is arranged at the top of the outer frame, an inner testing box is arranged in the outer frame, and an air cooling mechanism for improving the heat dissipation effect of the inner testing box is arranged in the outer frame.
Preferably, the pushing mechanism comprises a telescopic frame movably connected to the inner side of the top of the outer frame, a spring is arranged on the inner side of the telescopic frame, a clamping plate is fixedly connected to one end of the telescopic frame, which is close to the test plate, and the position of the test plate can be determined through the pushing mechanism so as to be matched with the stabilizing mechanism to fix the test plate.
Preferably, the stabilizing mechanism comprises a fixed table fixedly connected to the top of the outer frame, a table shaft is fixedly arranged on the outer surface of the fixed table in a penetrating mode, a limiting pressing table is rotatably connected to the outer surface of the table shaft, and the stabilizing mechanism can be used for stably installing the testing board after flexibly replacing the type of the testing board.
Preferably, the V-shaped inserted link is movably inserted into the inner side of the outer frame, a screw is sleeved on the inner surface of the outer frame in a threaded manner, an adaptive clamping seat is arranged at one end of the screw close to the V-shaped inserted link, an arc-shaped groove is formed in the top of the V-shaped inserted link, and the V-shaped inserted link is convenient to stably press and hold by a limiting pressing table.
Preferably, the air cooling mechanism comprises an air cooler fixedly arranged on the outer surface of the inner test box, the output end of the air cooler is fixedly connected with a winding pipe, and the winding pipe is uniformly wound along the outer surface of the inner test box.
Preferably, the outer surface of the outer frame is fixedly provided with an air outlet pipe in a penetrating mode, one end of the air outlet pipe is fixedly communicated with one end, far away from the air cooler, of the winding pipe, and a fan is arranged at the bottom of the outer frame.
Compared with the prior art, the utility model has the following beneficial effects:
1. This power chip testing arrangement can let the cardboard push away and move to the exact position along the test board through pushing away tight mechanism, and cooperation stabilizing mean can let spacing compression table gland in the indent of test board to accomplish the installation to the test board, only need the release adaptation cassette when dismantling the test board to the spacing of V type inserted bar can, in order to reach the purpose that the test board is tested to the chip of different models.
2. The power chip testing device is characterized in that the air cooler injects cold air flow into the winding pipe, the cold air flow can be uniformly distributed on the outer surface of the inner testing box along with the winding pipe, and the air flow is exchanged in the outer frame by matching with the fan, so that the effect of uniformly and rapidly radiating the inner testing box is achieved.
Drawings
FIG. 1 is a schematic diagram of the overall structure of the present application;
FIG. 2 is a schematic view of the internal structure of the outer frame of the present application;
FIG. 3 is a schematic view of the structure of the junction of the surfaces of the test plate according to the present application;
FIG. 4 is an enlarged view of FIG. 3 a in accordance with the present application;
FIG. 5 is an enlarged view of the application at b in FIG. 3;
fig. 6 is a schematic view of a surface structure of an adapter card holder according to the present application.
Wherein: 1. an outer frame; 2. a console; 3. a test board; 4. a telescopic frame; 5. a spring; 6. a clamping plate; 7. arc pressing grooves; 8. a fixed table; 9. a table shaft; 10. limiting press table; 11. v-shaped inserted link; 12. a screw; 13. an adapter card seat; 14. an inner test box; 15. an air cooler; 16. winding a tube; 17. an air outlet pipe; 18. a fan.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
Referring to fig. 1-6, a power chip testing device comprises an outer frame 1, wherein an operation table 2 is arranged on the outer surface of the outer frame 1, a testing board 3 is movably arranged at the top of the outer frame 1, a pushing mechanism for determining the installation position of the testing board 3 is arranged at the top of the outer frame 1, an arc pressing groove 7 is formed in the outer surface of the testing board 3, a stabilizing mechanism for fixing the testing board 3 is arranged at the top of the outer frame 1, an inner testing box 14 is arranged in the outer frame 1, and an air cooling mechanism for improving the heat dissipation effect of the inner testing box 14 is arranged in the outer frame 1.
Through above-mentioned technical scheme, the device accessible pushes away tight mechanism and stabilizing mean and carries out fixed mounting after changing test board 3 when using, and forced air cooling mechanism can effectively promote the radiating effect of interior test box 14, provides safe operational environment for the chip test.
Specifically, pushing mechanism includes swing joint at the inboard expansion bracket 4 in outer frame 1 top, and the inboard of expansion bracket 4 is provided with spring 5, and the one end fixedly connected with cardboard 6 that expansion bracket 4 is close to test board 3.
Through above-mentioned technical scheme, expansion bracket 4 can carry out horizontal migration under the elasticity flexible effect of spring 5, and then carries out the forward pushing through cardboard 6 to the position of test board 3 and stabilize.
Specifically, the stabilizing mean includes fixed station 8 of fixed connection at outer frame 1 top, and fixed station 8's surface is fixed wears to be equipped with platform axle 9, and the outward appearance of platform axle 9 rotates and is connected with spacing compression table 10.
Through above-mentioned technical scheme, the both ends of spacing platform 10 are the arc design, can gland respectively in pressing arc groove 7 inside and V type inserted bar 11 top to fix test board 3.
Specifically, the inside activity of outer frame 1 has pegged graft and has been had V type inserted bar 11, and the internal surface screw thread of outer frame 1 has cup jointed screw rod 12, and the one end that screw rod 12 is close to V type inserted bar 11 is provided with adaptation cassette 13.
Through the technical scheme, the tip V-shaped design at the bottom of the V-shaped inserted rod 11 can be just inserted into the adapting clamping seat 13, and the adapting clamping seat 13 can relatively limit the V-shaped inserted rod 11.
Specifically, the air cooling mechanism comprises an air cooler 15 fixedly arranged on the outer surface of the inner test box 14, the output end of the air cooler 15 is fixedly connected with a winding pipe 16, and the winding pipe 16 is uniformly wound along the outer surface of the inner test box 14.
Through the technical scheme, the winding pipe 16 is uniformly wound on the outer surface of the inner test box 14, so that the cold air flow output by the air cooler 15 can rapidly and uniformly dissipate heat of the inner test box 14.
Specifically, the outer surface of the outer frame 1 is fixedly provided with an air outlet pipe 17 in a penetrating manner, one end of the air outlet pipe 17 is fixedly communicated with one end of the winding pipe 16 far away from the air cooler 15, and the bottom of the outer frame 1 is provided with a fan 18.
Through the above technical scheme, the cold air flow in the winding pipe 16 is finally discharged from the air outlet pipe 17, and the fan 18 can further improve the heat dissipation effect.
Working principle: when the device is used, the chip performs relevant tests on the test board 3, various parameters can be regulated through the control table 2, when different types of chips are required to be tested, different test boards 3 can be installed in a replaceable manner, when the device is installed, the test board 3 is firstly placed in a concave part at the top of the outer frame 1, the expansion bracket 4 is matched with the spring 5 to elastically expand and contract, so that the clamping plate 6 pushes the test board 3 to horizontally slide to the other inner side against the top of the outer frame 1, then the limiting pressing table 10 is rotated along the table shaft 9, one end of the limiting pressing table 10 is pressed in the arc pressing groove 7 formed in the surface of the test board 3, meanwhile, the other end of the limiting pressing table 10 is pressed against the top of the V-shaped inserted rod 11, the V-shaped inserted rod 11 is limited by the adapting clamping seat 13, the limiting pressing table 10 is indirectly enabled to stably press the test board 3, the purpose of replacing the test board 3 is achieved, when the test board 3 is disassembled and written, only the screw 12 is required to be continuously rotated, the adapting clamping seat 13 is slightly moved forward, the V-shaped inserting rod 11 is just inserted into the V-shaped surface of the adapting clamping seat 13, the limiting pressing table 10 can be slightly rotated to prevent the limiting pressing table from propping against the arc pressing groove 7, the test board 3 can be easily taken out, cold air flow is injected into the winding pipe 16 by the air cooler 15 in the process of testing the chip on the test board 3 in the inner test box 14, so that the cold air flow can be uniformly and partially arranged on the outer surface of the inner test box 14 along with the winding pipe 16, the air flow in the outer frame 1 is exchanged by the fan 18, the effect of uniformly and rapidly radiating the inner test box 14 is achieved, and the cold air flow in the winding pipe 16 is finally discharged from the air outlet pipe 17.
Although embodiments of the present application have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the application, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. The utility model provides a power chip testing arrangement, includes outer frame (1), its characterized in that: the outer surface of outer frame (1) is provided with controls platform (2), the top movable mounting of outer frame (1) has test board (3), the top of outer frame (1) is provided with the tight mechanism of pushing away that is used for confirming test board (3) mounted position, arc pressing groove (7) have been seted up to the surface of test board (3), the top of outer frame (1) is provided with the stabilizing mean who is used for fixed test board (3), the inside of outer frame (1) is provided with interior test box (14), the inside of outer frame (1) is provided with the forced air cooling mechanism that is used for improving interior test box (14) radiating effect.
2. The power chip testing apparatus according to claim 1, wherein: the pushing mechanism comprises a telescopic frame (4) movably connected to the inner side of the top of the outer frame (1), a spring (5) is arranged on the inner side of the telescopic frame (4), and a clamping plate (6) is fixedly connected to one end, close to the test plate (3), of the telescopic frame (4).
3. The power chip testing apparatus according to claim 1, wherein: the stabilizing mechanism comprises a fixed table (8) fixedly connected to the top of the outer frame (1), a table shaft (9) is fixedly arranged on the outer surface of the fixed table (8) in a penetrating mode, and a limiting pressing table (10) is rotatably connected to the outer surface of the table shaft (9).
4. The power chip testing apparatus according to claim 1, wherein: the novel socket is characterized in that a V-shaped inserting rod (11) is movably inserted into the inner side of the outer frame (1), a screw (12) is sleeved on the inner surface of the outer frame (1) in a threaded mode, and an adaptive clamping seat (13) is arranged at one end, close to the V-shaped inserting rod (11), of the screw (12).
5. The power chip testing apparatus according to claim 1, wherein: the air cooling mechanism comprises an air cooler (15) fixedly arranged on the outer surface of the inner test box (14), the output end of the air cooler (15) is fixedly connected with a winding pipe (16), and the winding pipe (16) is uniformly wound along the outer surface of the inner test box (14).
6. The power chip testing apparatus according to claim 5, wherein: an air outlet pipe (17) is fixedly arranged on the outer surface of the outer frame (1) in a penetrating mode, one end of the air outlet pipe (17) is fixedly communicated with one end, far away from the air cooler (15), of the winding pipe (16), and a fan (18) is arranged at the bottom of the outer frame (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322566107.XU CN220872528U (en) | 2023-09-21 | 2023-09-21 | Power chip testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322566107.XU CN220872528U (en) | 2023-09-21 | 2023-09-21 | Power chip testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220872528U true CN220872528U (en) | 2024-04-30 |
Family
ID=90807968
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322566107.XU Active CN220872528U (en) | 2023-09-21 | 2023-09-21 | Power chip testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220872528U (en) |
-
2023
- 2023-09-21 CN CN202322566107.XU patent/CN220872528U/en active Active
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| GR01 | Patent grant |