CN220866373U

CN220866373U - Photoelectric debugging device

Info

Publication number: CN220866373U
Application number: CN202322525672.1U
Authority: CN
Inventors: 张岩; 陈迪明
Original assignee: Wap Intelligence Storage Equipment Zhejiang Co Ltd
Current assignee: Wap Intelligence Storage Equipment Zhejiang Co Ltd
Priority date: 2023-09-18
Filing date: 2023-09-18
Publication date: 2024-04-30
Anticipated expiration: 2033-09-18

Abstract

The utility model belongs to the field of logistics storage, and discloses a photoelectric debugging device which comprises a guide rail, a first clamp, a second clamp, a clamping piece, a baffle and a locking piece, wherein the first clamp is connected to one end of the guide rail; the second clamp is arranged on the guide rail in a sliding manner; the clamping piece is rotationally connected to the first clamp; the second clamp is in threaded connection with the clamping piece; the baffle is arranged on the guide rail in a sliding way; the locking piece is arranged on the baffle. On the basis of guide rail, first anchor clamps, second anchor clamps and clamp dress piece cooperate, can install photoelectric debugging device on the equipment that awaits measuring, after the installation is accomplished, the baffle can be nimble adjust and shelter from the distance to carry out high-efficient test, the locking piece can lock the baffle on the guide rail, thereby when the test, avoided the drunkenness of baffle, guaranteed the accuracy of test result, after the test is accomplished, can conveniently demolish photoelectric debugging device from the equipment that awaits measuring, in order to reach the purpose that need not with the help of other instruments can single completion test operation.

Description

Photoelectric debugging device

Technical Field

The utility model relates to the field of logistics storage, in particular to a photoelectric debugging device.

Background

Along with automation, unmanned and intelligent of modern logistics storage, the four-way shuttle which can realize unmanned carrying is widely applied to links such as classification, transfer and placement of goods. Through the shuttle, unmanned reciprocating type goods transfer can be realized to reach the purpose of practicing thrift the manpower, reduction workman intensity of labour and improvement work efficiency.

The four-way shuttle of prior art need carry out photoelectric debugging before formal work to ensure the accuracy and the security of its work, and the technician need be through measuring tool measurement distance earlier, and then the light screen shelters from the photoelectric signal that the shuttle sent in approximate distance department, and the process is loaded down with trivial details, wastes time and energy, hardly this operation of single completion.

Disclosure of utility model

The utility model aims to provide a photoelectric debugging device, so that a technician can finish photoelectric debugging by a single person on the premise of ensuring debugging precision and efficiency.

To achieve the purpose, the utility model adopts the following technical scheme:

the photoelectric debugging device comprises:

a guide rail;

the first clamp is connected to one end of the guide rail;

the second clamp is arranged on the guide rail in a sliding manner;

the clamping piece is rotationally connected with the first clamp, and the second clamp is in threaded connection with the clamping piece;

the baffle is arranged on the guide rail in a sliding manner and is positioned at one side of the second clamp, which is away from the first clamp;

The locking piece is arranged on the baffle plate and is provided with a locking state and an unlocking state, the baffle plate is locked on the guide rail in the locking state, and the baffle plate can slide on the guide rail in the unlocking state.

Preferably, the guide rail is provided with a plurality of first limiting holes, the first limiting holes are sequentially arranged at intervals along the length direction of the guide rail, and the locking piece can be clamped in any one of the first limiting holes.

Preferably, the guide rail is provided with graduations along the length direction.

Preferably, the first jig includes:

The clamping piece is rotatably connected with the first positioning block;

The first clamping block is connected to one end of the first positioning block, which is away from the guide rail, a first clamping groove is formed in one side of the first clamping block, which is towards the second clamp, and the penetrating direction of the first clamping groove is perpendicular to the length direction of the guide rail.

Preferably, the second jig includes:

the second positioning block is sleeved on the guide rail in a sliding way and is in threaded connection with the clamping piece;

The second clamping block is connected to the second positioning block, a second clamping groove is formed in one side, facing the first clamping block, of the second clamping block, and the penetrating direction of the second clamping groove is perpendicular to the length direction of the guide rail.

Preferably, rubber pads are laid in the first clamping groove and/or the second clamping groove.

Preferably, the clamping member comprises an adjusting rod and an adjusting handle connected to one end of the adjusting rod, the adjusting rod is rotatably connected to the first clamp, and the second clamp is in threaded connection with the adjusting rod.

Preferably, the baffle includes:

The adjusting block is arranged on the guide rail in a sliding manner, and the locking piece is arranged on the adjusting block;

And the plate body is detachably connected with the adjusting block.

Preferably, a threaded hole is formed in one side of the adjusting block, and the locking piece is screwed into the threaded hole.

Preferably, a clamping groove is formed in the other side of the adjusting block, and the plate body is clamped in the clamping groove.

The utility model has the beneficial effects that:

On the basis of guide rail, first anchor clamps, second anchor clamps and clamp dress piece cooperate, can conveniently install photoelectric debugging device on the equipment that awaits measuring, after the installation is accomplished, the baffle can be nimble adjust and shelter from the distance to carry out high-efficient test, the locking piece can lock the baffle on the guide rail, thereby when the test, the drunkenness of baffle has been avoided, the accuracy of test result has been guaranteed, after the test is accomplished, can conveniently demolish photoelectric debugging device from the equipment that awaits measuring, the commonality is strong, the simple operation, labour saving and time saving, need not to accomplish test operation by a single person with the help of other instruments.

Drawings

FIG. 1 is a schematic diagram of a single bit architecture of an optoelectronic debug apparatus according to an embodiment of the present utility model;

Fig. 2 is a schematic view of another orientation of the optical and electrical debugging device according to an embodiment of the present utility model.

In the figure:

1. a guide rail; 11. a first limiting hole;

2. A first clamp; 21. a first positioning block; 22. a first clamping block; 221. a first clamping groove;

3. a second clamp; 31. a second positioning block; 32. a second clamping block; 321. a second clamping groove;

4. A clamping member; 41. an adjusting rod; 42. an adjusting handle;

5. A baffle; 51. an adjusting block; 511. a threaded hole; 512. a clamping groove; 52. a plate body;

6. A locking member.

Detailed Description

Embodiments of the present utility model are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar parts throughout, or parts having like or similar functions. The embodiments described below by referring to the drawings are illustrative and intended to explain the present utility model and should not be construed as limiting the utility model.

In the description of the present utility model, unless explicitly stated and limited otherwise, the terms "connected," "connected," and "fixed" are to be interpreted broadly, as for example, they may be fixedly connected, or may be detachably connected, or may be electrically connected, or may be directly connected, or may be indirectly connected through an intermediary, or may be in communication with one another in two elements or in an interaction relationship between two elements. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.

In the description of the present utility model, unless explicitly stated and limited otherwise, a first feature "above" or "below" a second feature may include the first feature and the second feature being in direct contact, or may include the first feature and the second feature not being in direct contact but being in contact by another feature therebetween. Moreover, a first feature being "above," "over" and "on" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature includes the first feature being directly under and obliquely below the second feature, or simply means that the first feature is less level than the second feature.

The technical scheme of the utility model is further described below by the specific embodiments with reference to the accompanying drawings.

As shown in fig. 1-2, the present utility model provides an optoelectronic debugging device, which comprises a guide rail 1, a first clamp 2, a second clamp 3, a clamping member 4, a baffle 5 and a locking member 6. Wherein, first anchor clamps 2 are connected in the one end of guide rail 1, and second anchor clamps 3 slide to set up on guide rail 1, and clamp 4 rotates to be connected in first anchor clamps 2, and second anchor clamps 3 spiro union is in clamp 4, and baffle 5 slides to set up on guide rail 1, is located one side that second anchor clamps 3 deviate from first anchor clamps 2, and locking piece 6 sets up on baffle 5, has locking state and unblock state, under the locking state, baffle 5 locks on guide rail 1, under the unblock state, baffle 5 can slide on guide rail 1.

According to the photoelectric debugging device, the first clamp 2, the second clamp 3 and the clamping piece 4 are matched on the basis of the guide rail 1, so that the photoelectric debugging device can be conveniently installed on equipment to be tested, after the installation is finished, the shielding distance of the baffle plate 5 can be flexibly adjusted, and therefore efficient testing is performed, the baffle plate 5 can be locked on the guide rail 1 by the locking piece 6, when testing is performed, the movement of the baffle plate 5 is avoided, the accuracy of a test result is ensured, and after testing is finished, the photoelectric debugging device can be conveniently removed from the equipment to be tested, so that the aim of completing testing operation by a single person without using other tools is fulfilled.

In this embodiment, the guide rail 1, the first clamp 2 and the second clamp 3 may be made of plastic or steel, the locking member 6 may be a bolt, and the baffle 5 may be made of plastic or metal capable of reflecting callback test light.

Specifically, as shown in fig. 1-2, the guide rail 1 includes a plurality of first limiting holes 11, the plurality of first limiting holes 11 are sequentially arranged at intervals along the length direction of the guide rail 1, the locking piece 6 can be clamped in any one of the first limiting holes 11, when the locking piece 6 is clamped in the first limiting hole 11, the locking piece 6 is in a locking state, the baffle plate 5 cannot slide along the guide rail 1, when the locking piece 6 is separated from the first limiting hole 11, the locking piece 6 is in an unlocking state, and the baffle plate 5 can slide along the guide rail 1. According to the arrangement, the locking state and the unlocking state of the locking piece 6 can be freely switched according to the requirements of photoelectric debugging, whether the baffle 5 can slide along the guide rail 1 is controlled, and the debugging accuracy and the operation efficiency are improved.

In the present embodiment, the penetrating direction of the first limiting hole 11 is perpendicular to the longitudinal direction of the guide rail 1. In other embodiments, a limit groove may be provided to cooperate with the locking member 6.

Specifically, the first clamp 2 includes a first positioning block 21 and a first clamping block 22. Wherein, first locating block 21 is fixed in the one end of guide rail 1, and clamp 4 rotates to be connected in first locating block 21, and first clamp piece 22 is connected in the one end that first locating block 21 deviates from guide rail 1, and one side that first clamp piece 22 was towards second anchor clamps 3 is provided with first clamp groove 221, and the direction of lining up of first clamp groove 221 is perpendicular to the length direction of guide rail 1. By means of the arrangement, the clamping firmness of the first clamp 2 can be effectively improved, when the edge of the fixing surface is not smooth enough or the shape is irregular, the first clamping groove 221 can be clamped with the edge of the clamping part of the equipment to be tested, and the applicability of the photoelectric debugging device is improved.

More specifically, the second clamp 3 includes a second positioning block 31 and a second clamping block 32. The second positioning block 31 is slidably sleeved on the guide rail 1 and is in threaded connection with the clamping piece 4, the second clamping block 32 is connected to the second positioning block 31, a second clamping groove 321 is formed in one side, facing the first clamping block 22, of the second clamping block 32, and the penetrating direction of the second clamping groove 321 is perpendicular to the length direction of the guide rail 1. In the above arrangement, the second positioning block 31 can be driven to move towards the first positioning block 21 by rotating the clamping member 4 until the first positioning block 21 and the second positioning block 31 are closed, and at this time, the first clamping groove 221 and the second clamping groove 321 are matched to perform clamping fixation, so that the connection between the photoelectric testing device and the clamping part of the device to be tested is firmer.

Of course, in other embodiments, the first clamping block 22 and the second clamping block 32 may not be provided at the same time, and only one of them may be retained. The above arrangement can also enable the first clamping block 22 to be matched with the second positioning block 31 for clamping by rotating the clamping piece 4, or enable the second clamping block 32 to be matched with the first positioning block 21 for clamping, so that the photoelectric testing device is fixed, and the structure is simpler and is not easy to damage.

Specifically, rubber pads are laid in the first clamping groove 221 and/or the second clamping groove 321. Above-mentioned setting, when the fixed surface is comparatively smooth, be unfavorable for this photoelectricity debugging device to fix, the rubber pad increases the frictional force between first clamping groove 221, second clamping groove 321 and the fixed surface, makes fixed more firm to reduce the probability that the debugging error appears.

In this embodiment, rubber pads are laid in the first clamping groove 221 and the second clamping groove 321, so that the clamping effect is better.

Specifically, the clamping member 4 may be a bolt including an adjusting lever 41 and an adjusting handle 42 connected to one end of the adjusting lever 41, the adjusting lever 41 is rotatably connected to the first clamp 2, and the second clamp 3 is screw-coupled to the adjusting lever 41. The debugging personnel can rotate the adjusting handle 42 by hand, and can drive the first clamp 2 and the second clamp 3 to move in opposite directions. By the arrangement, a debugging person can fix the photoelectric debugging equipment at the position to be detected by only rotating the adjusting handle 42 by hand without using tools, so that the debugging operation is more convenient.

Specifically, the shutter 5 includes an adjustment block 51 slidably provided on the guide rail 1 and a plate body 52 detachably connected to the adjustment block 51, and the lock 6 is provided on the adjustment block 51. By the arrangement, the baffle plate 5 can slide on the guide rail 1 more stably and reliably, and the plate bodies 52 with different specifications can be replaced according to test requirements, so that the universality of the photoelectric debugging device is improved.

More specifically, one side of the adjustment block 51 is provided with a screw hole 511, and the locking member 6 is screwed into the screw hole 511. When the baffle plate 5 is moved to a position required for debugging, the locking piece 6 can be rotated, so that the locking piece 6 penetrates out of the threaded hole 511 and stretches into the first limiting hole 11, at the moment, the locking piece 6 is in a locking state, and the baffle plate 5 cannot slide along the guide rail 1; when the position of the baffle plate 5 needs to be changed, the locking piece 6 can be reversely rotated, so that the locking piece 6 is pulled out of the first limiting hole 11, the locking piece 6 is in an unlocking state, and the baffle plate 5 can slide along the guide rail 1. Above-mentioned setting, debugging personnel can be bare-handed the manual locking piece 6 to switch locking state and unlocking state, thereby control baffle 5 is fixed in guide rail 1, and locking piece 6 locking is effectual, easy operation can bare-handed completion.

In other embodiments, the threaded hole 511 may be replaced by a non-threaded through hole, and the locking member 6 may be directly inserted through the through hole and into the first limiting hole 11. The locking and unlocking state can be switched by inserting and pulling the locking piece 6, so that the structure is simpler and the device is not easy to damage.

More specifically, the other side of the adjustment block 51 is provided with a clamping groove 512, and the plate body 52 is clamped in the clamping groove 512. The above arrangement makes the disassembly and assembly of the adjusting block 51 and the plate 52 more convenient.

In other embodiments, the adjusting block 51 and the plate 52 may be fixed by fastening members such as bolts.

Specifically, the guide rail 1 is provided with graduations in the longitudinal direction. Above-mentioned setting for the distance of debugging personnel accessible scale direct readout photometry photoelectric position to baffle 5 makes the measurement process more convenient, improves the operating efficiency.

It is to be understood that the above examples of the present utility model are provided for clarity of illustration only and are not limiting of the embodiments of the present utility model. Other variations or modifications of the above teachings will be apparent to those of ordinary skill in the art. It is not necessary here nor is it exhaustive of all embodiments. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the utility model are desired to be protected by the following claims.

Claims

1. An optoelectronic debug apparatus, comprising:

A guide rail (1);

A first clamp (2) connected to one end of the guide rail (1);

the second clamp (3) is arranged on the guide rail (1) in a sliding manner;

The clamping piece (4) is rotationally connected to the first clamp (2), and the second clamp (3) is in threaded connection with the clamping piece (4);

The baffle plate (5) is arranged on the guide rail (1) in a sliding manner and is positioned at one side of the second clamp (3) away from the first clamp (2);

The locking piece (6) is arranged on the baffle plate (5) and is provided with a locking state and an unlocking state, the baffle plate (5) is locked on the guide rail (1) in the locking state, and the baffle plate (5) can slide on the guide rail (1) in the unlocking state.

2. The photoelectric debugging device according to claim 1, wherein the guide rail (1) is provided with a plurality of first limiting holes (11), the plurality of first limiting holes (11) are sequentially arranged at intervals along the length direction of the guide rail (1), and the locking piece (6) can be clamped in any one of the first limiting holes (11) to be in the locking state.

3. The optoelectronic tuning device according to claim 1, wherein the guide rail (1) is provided with graduations along the length direction.

4. The optoelectronic tuning device according to claim 1, wherein the first clamp (2) comprises:

A first positioning block (21) fixed at one end of the guide rail (1), and the clamping piece (4) is rotatably connected to the first positioning block (21);

The first clamping block (22) is connected to one end of the first positioning block (21) deviating from the guide rail (1), a first clamping groove (221) is formed in one side of the first clamping block (22) facing the second clamp (3), and the penetrating direction of the first clamping groove (221) is perpendicular to the length direction of the guide rail (1).

5. The optoelectronic tuning device according to claim 4, wherein the second fixture (3) comprises:

The second positioning block (31) is sleeved on the guide rail (1) in a sliding manner and is screwed with the clamping piece (4);

The second clamping block (32) is connected to the second positioning block (31), a second clamping groove (321) is formed in one side, facing the first clamping block (22), of the second clamping block (32), and the penetrating direction of the second clamping groove (321) is perpendicular to the length direction of the guide rail (1).

6. The optoelectronic tuning device according to claim 5, wherein rubber pads are laid in the first clamping groove (221) and/or the second clamping groove (321).

7. The optoelectronic tuning device according to claim 1, wherein the clamping member (4) comprises an adjusting lever (41) and an adjusting handle (42) connected to one end of the adjusting lever (41), the adjusting lever (41) is rotatably connected to the first clamp (2), and the second clamp (3) is screwed to the adjusting lever (41).

8. The electro-optical commissioning device according to any one of claims 1-7, wherein the baffle (5) comprises:

The adjusting block (51) is arranged on the guide rail (1) in a sliding manner, and the locking piece (6) is arranged on the adjusting block (51);

and the plate body (52) is detachably connected with the adjusting block (51).

9. The optoelectronic tuning device according to claim 8, wherein one side of the adjusting block (51) is provided with a threaded hole (511), the locking member (6) being screwed into the threaded hole (511).

10. The optoelectronic tuning assembly as claimed in claim 8, wherein the other side of the adjustment block (51) is provided with a clamping groove (512), and the plate (52) is clamped in the clamping groove (512).