CN220795400U - Testing device of chip testing and sorting machine - Google Patents
Testing device of chip testing and sorting machine Download PDFInfo
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- CN220795400U CN220795400U CN202322365062.XU CN202322365062U CN220795400U CN 220795400 U CN220795400 U CN 220795400U CN 202322365062 U CN202322365062 U CN 202322365062U CN 220795400 U CN220795400 U CN 220795400U
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- 238000012360 testing method Methods 0.000 title claims abstract description 79
- 239000000523 sample Substances 0.000 claims abstract description 92
- 230000003028 elevating effect Effects 0.000 claims description 2
- 230000001105 regulatory effect Effects 0.000 abstract description 4
- 208000025962 Crush injury Diseases 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
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Abstract
The utility model discloses a testing device of a chip testing and sorting machine, which comprises a probe seat, a lifting mechanism for driving the probe seat to move up and down, a probe inserted on the probe seat, a position fine adjustment mechanism for adjusting the relative position of the probe and a testing chip, and a pressure fine adjustment mechanism for adjusting the pressure of the probe and the testing chip, wherein the pressure fine adjustment mechanism is arranged on the probe seat. According to the utility model, the force of the probe is regulated by the pressure fine-tuning mechanism, so that the problems of crushing a test chip or poor contact with the test chip are avoided, and the yield is improved; the test chips with different thicknesses and different specifications are subjected to calibration of the test points by operators through the position fine adjustment mechanism, so that the production efficiency is greatly improved, repeated machine adjustment is avoided, the production problems of chip crush injury, poor contact test failure and the like are avoided, the replacement of the chip specification machine adjustment is very convenient, and the yield and benefit are greatly improved.
Description
Technical Field
The utility model relates to the technical field of chip testing, in particular to a testing device of a chip testing and sorting machine.
Background
The existing laser chip is tested one by one, a mechanical direct probe is adopted for testing, the chip is extremely easy to be crushed each time, or the poor contact test is not passed, the test force is debugged, the downward pressure is high, only the repeated debugging can be realized, the working time is increased for an operator, the bad part is easily caused by the missing working procedure, the potential safety hazard is caused, the cost is wasted, the efficiency is low, the repeated debugging is needed manually when the specification of the test chip is replaced, the test effect is achieved, the working time is very high, the production cannot be quickly regulated when each specification is replaced, and the efficiency is low.
Disclosure of Invention
The utility model aims to provide a testing device of a chip testing and sorting machine, which is used for solving the problems in the background technology.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides a testing arrangement of chip test sorter, testing arrangement includes the probe seat and is used for driving the elevating system of probe seat reciprocates, install the probe on the probe seat, testing arrangement still includes the position fine setting mechanism that is used for adjusting probe and test chip relative position and is used for adjusting the pressure fine setting mechanism of probe and test chip pressure, pressure fine setting mechanism sets up on the probe seat.
Further, the position fine adjustment mechanism comprises a first fine adjustment mechanism and a Z-axis fine adjustment mechanism which are respectively arranged at two ends of the lifting mechanism and used for driving the probe seat to move along the Y-axis and the X-axis directions and move along the Z-axis directions.
Further, the first fine adjustment mechanism comprises a Y-axis fine adjustment mechanism for driving the probe seat to move along the Y-axis direction and an X-axis fine adjustment mechanism for driving the probe seat to move along the X-axis direction, and the Y-axis fine adjustment mechanism and the X-axis fine adjustment mechanism are overlapped up and down in a staggered manner by 90 degrees.
Further, the Y-axis fine adjustment mechanism comprises a Y-axis fixing plate, a Y-axis moving plate and a Y-axis handle embedded in the Y-axis moving plate and used for driving the Y-axis moving plate to move relative to the Y-axis fixing plate.
Further, the X-axis fine adjustment mechanism comprises an X-axis fixing plate, an X-axis moving plate and an X-axis handle embedded in the X-axis moving plate and used for driving the X-axis moving plate to move relative to the X-axis fixing plate, and the X-axis fixing plate is fixedly arranged on the Y-axis moving plate
Further, the Z-axis fine adjustment mechanism comprises a Z-axis fixing plate, a Z-axis moving plate and a Z-axis handle embedded in the Z-axis moving plate and used for driving the Z-axis moving plate to move relative to the Z-axis fixing plate.
Further, the pressure fine-tuning comprises a probe arm arranged on the probe seat, an adjusting screw and a pressure spring, wherein the adjusting screw and the pressure spring are arranged on the probe arm, a probe hole is formed in the probe arm, the probe is inserted into the probe hole, the bottom of the adjusting screw is screwed into the probe arm, and the pressure spring is sleeved on the outer side of the adjusting screw and is abutted between the end face of the probe arm and the head of the adjusting screw.
Further, one end of the probe arm is fixed on the probe seat, and the other end of the probe arm extends outwards away from the probe seat.
Further, the lifting mechanism comprises a lifting cylinder and a lifting sliding rail, the lifting sliding rail is arranged on a fixed block, the lifting sliding rail is embedded with a lifting sliding block, and the probe seat is arranged on the lifting sliding block.
Compared with the prior art, the utility model has the beneficial effects that: according to the utility model, the force of the probe is regulated by the pressure fine-tuning mechanism, so that the problems of crushing a test chip or poor contact with the test chip are avoided, and the yield is improved; the test chips with different thicknesses and different specifications are subjected to calibration of the test points by operators through the position fine adjustment mechanism, so that the production efficiency is greatly improved, repeated machine adjustment is avoided, the production problems of chip crush injury, poor contact test failure and the like are avoided, the replacement of the chip specification machine adjustment is very convenient, and the yield and benefit are greatly improved.
Drawings
FIG. 1 is a schematic diagram of a test apparatus of a chip test handler according to the present utility model;
FIG. 2 is a schematic diagram of a first fine adjustment mechanism in a testing apparatus of a chip testing sorter according to the present utility model;
in the figure, a 1-probe seat, a 11-probe, a 12-probe contact, a 2-lifting mechanism, a 21-lifting cylinder, a 31-Y axis fine adjustment mechanism, a 311-Y axis fixing plate, a 312-Y axis moving plate, a 313-Y axis handle, a 32-Y axis fine adjustment mechanism, a 321-X axis fixing plate, a 322-X axis moving plate, a 323-X axis handle, a 33-Z axis fine adjustment mechanism, a 331-Z axis fixing plate, a 332-Z axis moving plate, a 333-Z axis handle, a 4-pressure fine adjustment mechanism, a 41-probe arm, a 42-adjusting screw, a 43-pressure spring, a 5-supporting seat and a 6-fixing block.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
As shown in fig. 1-2, the present embodiment provides a testing device of a chip testing and sorting machine, the testing device includes a probe holder 1 and a lifting mechanism 2 for driving the probe holder 1 to move up and down, a probe 11 is inserted on the probe holder 1, the testing device further includes a position fine adjustment mechanism for adjusting the relative position of the probe 11 and a testing chip and a pressure fine adjustment mechanism 4 for adjusting the pressure between the probe 11 and the testing chip, in the present embodiment, the position fine adjustment mechanism includes a first fine adjustment mechanism and a Z-axis fine adjustment mechanism 33 respectively disposed at two ends of the lifting mechanism for driving the probe holder 1 to move along the Y-axis and the X-axis directions and move along the Z-axis directions, the first fine tuning mechanism comprises a Y-axis fine tuning mechanism 31 for driving the probe seat 1 to move along the Y-axis direction and an X-axis fine tuning mechanism 32 for driving the probe seat 1 to move along the X-axis direction, wherein the Y-axis fine tuning mechanism 31 and the X-axis fine tuning mechanism 32 are overlapped up and down in a staggered way, the testing device also comprises a supporting seat 5 and a fixed block 6, the first fine tuning mechanism is fixedly arranged on the top surface of the supporting seat 5, the fixed block 6 is in a reverse L shape, one right-angle surface of the fixed block 6 is fixedly connected with the first fine tuning mechanism, the other right-angle surface is fixedly connected with the lifting mechanism 2, the other surface of the lifting mechanism 2 is connected with the Z-axis fine tuning mechanism 33, the other surface of the Z-axis fine tuning mechanism 33 is fixedly connected with the probe seat 1, the pressure fine tuning mechanism 3 is arranged on the probe seat 1, and the whole structure is in a 7 shape; the Y-axis fine adjustment mechanism 31 comprises a Y-axis fixing plate 311, a Y-axis moving plate 312 and a Y-axis handle 313 embedded in the Y-axis moving plate 312 for driving the Y-axis moving plate 312 to move relative to the Y-axis fixing plate 311, the Y-axis fixing plate 311 and the Y-axis moving plate 312 are fixedly connected through springs, meanwhile, a slide rail is arranged on the Y-axis fixing plate 311, a slide block is arranged on the Y-axis moving plate 312 and embedded in the slide rail, so that the Y-axis moving plate 312 can move relative to the Y-axis fixing plate 311 under the driving of the Y-axis handle 313, the X-axis fine adjustment mechanism 32 comprises an X-axis fixing plate 321, an X-axis moving plate 322 and an X-axis handle 323 embedded in the X-axis moving plate 322 for driving the X-axis moving plate 322 to move relative to the X-axis fixing plate 321, the X-axis fixing plate 321 and the X-axis moving plate 322 are fixedly connected through springs, meanwhile, the X-axis fixing plate 321 is provided with a sliding rail, the X-axis moving plate 322 is provided with a sliding block, the sliding block is embedded in the sliding rail, so that the X-axis moving plate 322 can move relative to the X-axis fixing plate 311 under the driving of the X-axis handle 323, the X-axis fixing plate 321 is fixedly arranged on the Y-axis moving plate 312, the Z-axis fine adjustment mechanism 33 comprises a Z-axis fixing plate 331, a Z-axis moving plate 332 and a Z-axis handle 333 embedded in the Z-axis moving plate 332 and used for driving the Z-axis moving plate 332 to move relative to the Z-axis fixing plate 331, the Z-axis fixing plate 331 and the Z-axis moving plate 332 are fixedly connected through a spring, meanwhile, the Z-axis fixing plate 331 is provided with a sliding rail, the Z-axis moving plate 332 is provided with a sliding block, the sliding block is embedded in the sliding rail, so that the Z-axis moving plate 332 can move relative to the Z-axis fixing plate 311 under the driving of the Z-axis handle 333, the pressure fine adjustment mechanism 4 comprises a probe arm 41 arranged on the probe seat 1, an adjusting screw 42 and a pressure spring 43 arranged on the probe arm 41, a probe hole is formed in the probe arm 41, the probe 11 is inserted into the probe hole, one end of the probe 41 arm is fixed on the probe seat 1, the other end of the probe arm deviates from the probe seat 1 and extends outwards, the bottom of the adjusting screw 42 is screwed into the probe arm 41, the pressure spring 43 is sleeved on the outer side of the adjusting screw 42 and is abutted between the end face of the probe arm 41 and the head of the adjusting screw 43, the lifting mechanism 2 comprises a lifting cylinder 21 and a lifting slide rail, the lifting slide rail is arranged on the fixed block 6, the lifting slide rail is embedded with a lifting slide block, and the probe seat 1 is arranged on the lifting slide block.
When the utility model works, according to the test chips with different thicknesses and different specifications, the Y-axis handle 313, the X-axis adjusting handle 323 and the Z-axis adjusting handle 333 are manually adjusted to adjust the front and back, left and right, upper and lower positions of the test chips, the test chips are adjusted, the lifting mechanism 4 drives the probe 11 to descend for testing, the probe 11 is in contact with the test chips to jack up, the probe contact 12 is triggered, the test is started after receiving signals, the adjusting screw 42 is manually adjusted by controlling force, the force of the probe 11 is adjusted, and the test chips are prevented from being crushed.
According to the utility model, the force of the probe is regulated by the pressure fine-tuning mechanism, so that the problems of crushing a test chip or poor contact with the test chip are avoided, and the yield is improved; the test chips with different thicknesses and different specifications are subjected to calibration of the test points by operators through the position fine adjustment mechanism, so that the production efficiency is greatly improved, repeated machine adjustment is avoided, the production problems of chip crush injury, poor contact test failure and the like are avoided, the replacement of the chip specification machine adjustment is very convenient, and the yield and benefit are greatly improved.
Although the present utility model has been described with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described, or equivalents may be substituted for elements thereof, and any modifications, equivalents, improvements and changes may be made without departing from the spirit and principles of the present utility model.
Claims (9)
1. The utility model provides a testing arrangement of chip test sorter, testing arrangement includes the probe seat and is used for driving the elevating system of probe seat reciprocates, install the probe on the probe seat, its characterized in that: the testing device further comprises a position fine adjustment mechanism for adjusting the relative position of the probe and the testing chip and a pressure fine adjustment mechanism for adjusting the pressure of the probe and the testing chip, and the pressure fine adjustment mechanism is arranged on the probe seat.
2. The test apparatus of a chip test handler according to claim 1, wherein: the position fine adjustment mechanism comprises a first fine adjustment mechanism and a Z-axis fine adjustment mechanism which are respectively arranged at two ends of the lifting mechanism and used for driving the probe seat to move along the Y-axis and the X-axis directions and move along the Z-axis directions.
3. The test apparatus of a chip test handler according to claim 2, wherein: the first fine tuning mechanism comprises a Y-axis fine tuning mechanism used for driving the probe seat to move along the Y-axis direction and an X-axis fine tuning mechanism used for driving the probe seat to move along the X-axis direction, and the Y-axis fine tuning mechanism and the X-axis fine tuning mechanism are overlapped in a staggered manner up and down by 90 degrees.
4. A test apparatus of a chip test handler according to claim 3, wherein: the Y-axis fine adjustment mechanism comprises a Y-axis fixing plate, a Y-axis moving plate and a Y-axis handle embedded in the Y-axis moving plate and used for driving the Y-axis moving plate to move relative to the Y-axis fixing plate.
5. The test apparatus of a chip test handler according to claim 4, wherein: the X-axis fine adjustment mechanism comprises an X-axis fixing plate, an X-axis moving plate and an X-axis handle embedded in the X-axis moving plate and used for driving the X-axis moving plate to move relative to the X-axis fixing plate, and the X-axis fixing plate is fixedly arranged on the Y-axis moving plate.
6. The test apparatus of a chip test handler according to claim 2, wherein: the Z-axis fine adjustment mechanism comprises a Z-axis fixing plate, a Z-axis moving plate and a Z-axis handle embedded in the Z-axis moving plate and used for driving the Z-axis moving plate to move relative to the Z-axis fixing plate.
7. The test apparatus of a chip test handler according to claim 1, wherein: the pressure fine-tuning mechanism comprises a probe arm arranged on the probe seat, an adjusting screw and a pressure spring, wherein the adjusting screw and the pressure spring are arranged on the probe arm, a probe hole is formed in the probe arm, the probe is inserted into the probe hole, the bottom of the adjusting screw is screwed into the probe arm, and the pressure spring is sleeved on the outer side of the adjusting screw and is abutted between the end face of the probe arm and the head of the adjusting screw.
8. The test apparatus of a chip test handler of claim 7, wherein: one end of the probe arm is fixed on the probe seat, and the other end of the probe arm extends outwards away from the probe seat.
9. The test apparatus of a chip test handler according to claim 1, wherein: the lifting mechanism comprises a lifting cylinder and a lifting sliding rail, the lifting sliding rail is arranged on a fixed block, the lifting sliding rail is embedded with a lifting sliding block, and the probe seat is arranged on the lifting sliding block.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322365062.XU CN220795400U (en) | 2023-09-01 | 2023-09-01 | Testing device of chip testing and sorting machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322365062.XU CN220795400U (en) | 2023-09-01 | 2023-09-01 | Testing device of chip testing and sorting machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220795400U true CN220795400U (en) | 2024-04-16 |
Family
ID=90653529
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322365062.XU Active CN220795400U (en) | 2023-09-01 | 2023-09-01 | Testing device of chip testing and sorting machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220795400U (en) |
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2023
- 2023-09-01 CN CN202322365062.XU patent/CN220795400U/en active Active
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