CN220795361U

CN220795361U - Power equipment testing arrangement

Info

Publication number: CN220795361U
Application number: CN202321683424.3U
Authority: CN
Inventors: 戴留兴
Original assignee: Suzhou Jingshi Intelligent Equipment Co ltd
Current assignee: Suzhou Jingshi Intelligent Equipment Co ltd
Priority date: 2023-06-29
Filing date: 2023-06-29
Publication date: 2024-04-16
Anticipated expiration: 2033-06-29

Abstract

The utility model relates to a power equipment testing device, comprising: the device to be tested comprises an AC/DC device, a PCS device and an inverter device, and comprises at least one power port, at least one signal port and at least one communication port; the power grid simulation device is connected with the equipment to be tested through the first power port; the RLC load is connected with the equipment to be tested through the first power port; the bidirectional high-voltage direct current source is connected with the equipment to be tested through the second power port; the high-voltage electronic load is connected with the equipment to be tested through the second power port; and the conditioning circuit is connected with the equipment to be tested through the first signal port. The power equipment testing device can realize testing without power equipment in one set of testing system, saves time for building, moving and dismantling a testing platform, and saves labor cost.

Description

Power equipment testing arrangement

Technical Field

The utility model relates to the field of power equipment testing, in particular to a power equipment testing device.

Background

With the increasing popularity of new energy industry, the research on equipment related to batteries is increased, the commonly used equipment comprises AC/DC equipment, PCS equipment and inverter equipment, and the testing of the equipment needs a special testing platform, and once the factory is in mass production, the testing of various equipment needs to be built with different testing platforms, the building, moving and dismantling of the testing platform needs a great deal of time, a great deal of manpower and material resources are consumed, and the cost of enterprises is increased.

Disclosure of utility model

The utility model provides a power equipment testing device, which aims at solving at least one of the technical problems existing in the prior art. The utility model provides a power equipment testing device which can realize testing without power equipment in a set of testing system, and common power equipment comprises AC/DC equipment, PCS equipment and inverter equipment, wherein the different power equipment can be tested in the same testing platform, so that the time for building, moving, refitting and dismantling the testing platform is greatly saved, and the labor cost is saved.

The technical scheme of the utility model is a power equipment testing device, which is characterized by comprising: the device to be tested comprises at least one power port, at least one signal port and at least one communication port; the power grid simulation device is connected with the equipment to be tested through a first power port; the RLC load is connected with the equipment to be tested through the first power port; the bidirectional high-voltage direct current source is connected with the equipment to be tested through a second power port; the high-voltage electronic load is connected with the equipment to be tested through the second power port; and the conditioning circuit is connected with the equipment to be tested through a first signal port.

Further, the power analyzer is further connected with the power grid simulation device in sequence, a first channel of the power analyzer is connected with the device to be tested and the power grid simulation device through the first power port, a second channel of the power analyzer is connected with the device to be tested, the bidirectional high-voltage direct-current source and the high-voltage electronic load through the second power port, and the power analyzer is respectively connected with a first oscilloscope port and a second oscilloscope port of the oscilloscope.

The device to be tested, the power grid simulation device, the RLC load, the bidirectional high-voltage direct current source, the high-voltage electronic load and the conditioning circuit are respectively connected with the upper computer.

Further, the power grid simulation device, the RLC load, the bidirectional high-voltage direct current source, the high-voltage electronic load and the conditioning circuit are respectively connected with the upper computer through RJ45 network cables.

Further, when the device to be tested is an AC/DC device, the power grid simulation device is configured to generate an input of an AC input end of the AC/DC device, and the power grid simulation device is a programmable AC power supply; when the equipment to be tested is inverter equipment, the power grid simulation device is used for simulating various voltage working conditions and absorbing alternating current output of the inverter equipment, and the power grid simulation device is a feedback power grid simulation device; when the equipment to be tested is PCS equipment, the power grid simulation device is a programmable alternating current power supply and a feedback power grid simulation device.

Further, when the device to be tested is an inverter device, the bidirectional high-voltage direct current source outputs voltage and current according to the volt-ampere curve of a photovoltaic cell of the inverter device, and the bidirectional high-voltage direct current source is a photovoltaic cell simulator; when the device to be tested is a PCS device, the bidirectional high-voltage direct current source provides high-voltage current input for the PCS device, and the bidirectional high-voltage direct current source is a programmable high-voltage power supply.

Further, when the device to be tested is an AC/DC device or a PCS device, the high-voltage electronic load is used for pulling and carrying current at a DC output end of the AC/DC device, and the high-voltage electronic load is a programmable electronic load.

Further, when the device to be tested is an inverter device, the RLC load is used for implementing an island test of the inverter device, and the connection between the power grid simulation device and the inverter device is disconnected, so that the RLC load is directly connected to the inverter device.

Further, the device to be tested is an AC/DC device or a PCS device or an inverter device.

Further, the inverter device is a photovoltaic inverter device.

The utility model has the advantages that,

According to the power equipment testing device, testing without power equipment can be achieved in one set of testing system, time for building, moving and dismantling a testing platform is saved, and labor cost is saved.

Drawings

Fig. 1 is a schematic diagram of a power equipment testing device according to the present utility model.

Fig. 2 is a schematic diagram of an inverter device burn-in test of a power device testing apparatus according to the present utility model.

Fig. 3 is a schematic diagram of a PCS device and AC/DC device burn-in test of a power device testing apparatus according to the present utility model.

Fig. 4 is a general block diagram of a power device testing system according to an embodiment of the utility model.

Fig. 5 is a detailed schematic diagram of a power device testing system according to an embodiment of the utility model.

Fig. 6 is a schematic diagram of a call relationship of a power device testing system according to an embodiment of the present utility model.

Fig. 7 is a schematic diagram of a test sequence file field format of a power device test system according to an embodiment of the present utility model.

Fig. 8 is a schematic diagram of a Limit file field format of a power device testing system according to an embodiment of the present utility model.

Fig. 9 is a block diagram of a simplified power equipment testing apparatus on which a photovoltaic inverter island testing method is based according to an embodiment of the present utility model.

In the above figures, 100, the device under test; 200. a power grid simulation device; 300. RLC load; 400. a bi-directional high voltage DC source; 500. a high voltage electronic load; 600. a conditioning circuit; 700. a power analyzer; 800. an oscilloscope; 900. an upper computer; 1000. a main testing device; 1100. testing the sequence device; 1110. PreUUTLoop files; 1120. PreUUT files; 1130. a Main file; 1140. PostUUT files; 1150. a Save Log file; 1160. PostUUTLoop files; 1200. a profile service device; 1300. an interface output device; 1400. a database interaction device; 2000. a database device; 2100. a log generation device; 2200. a database; 3000. and a service device.

Detailed Description

The conception, specific structure, and technical effects produced by the present utility model will be clearly and completely described below with reference to the embodiments and the drawings to fully understand the objects, aspects, and effects of the present utility model. It should be noted that, without conflict, the embodiments of the present utility model and features of the embodiments may be combined with each other.

It should be noted that, unless otherwise specified, when a feature is referred to as being "fixed" or "connected" to another feature, it may be directly or indirectly fixed or connected to the other feature. Further, the descriptions of the upper, lower, left, right, top, bottom, etc. used in the present utility model are merely with respect to the mutual positional relationship of the respective constituent elements of the present utility model in the drawings.

Furthermore, unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art. The terminology used in the description presented herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the utility model. The term "and/or" as used herein includes any combination of one or more of the associated listed items.

It should be understood that although the terms first, second, third, etc. may be used in this disclosure to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element of the same type from another. For example, a first element could also be termed a second element, and, similarly, a second element could also be termed a first element, without departing from the scope of the present disclosure.

Referring to fig. 1 to 9, the present application provides a power equipment testing apparatus, comprising: a device under test 100, the device under test 100 comprising at least one power port, at least one signal port and at least one communication port; the power grid simulation device 200 is connected with the equipment to be tested 100 through a first power port; an RLC load 300, where the RLC load 300 is connected to the device under test 100 through the first power port; a bidirectional high-voltage direct current source 400, wherein the bidirectional high-voltage direct current source 400 is connected with the device under test 100 through a second power port; a high voltage electronic load 500, the high voltage electronic load 500 being connected to the device under test 100 through the second power port; conditioning circuit 600, conditioning circuit 600 is connected with device under test 100 through a first signal port.

The utility model has the advantages that,

According to the power equipment testing device, testing of power equipment can be achieved in one set of testing system, common power equipment comprises AC/DC equipment, PCS equipment and inverter equipment, the different power equipment can be tested in the same testing platform, time for building, moving, refitting and dismantling the testing platform is greatly saved, and labor cost is saved.

In some embodiments, the testing of the AC/DC device includes, but is not limited to, version detection, initial state detection testing, AC output side over-undershoot protection testing, efficiency testing, steady-state accuracy testing, power loss testing, charging efficiency testing, output voltage measurement error testing, and output current measurement error testing.

In some embodiments, the testing of the PCS device and the inverter device includes, but is not limited to, automatic power on/off function testing, communication function testing, maximum conversion efficiency testing, MPPT efficiency testing, conversion efficiency testing, average weighted total efficiency testing, harmonic and waveform distortion testing, power factor testing, three-phase circuit imbalance testing, direct current component testing, active power capacity testing, active power change rate control testing, active power setpoint control testing, active power over-frequency derating control testing, reactive power capacity testing, reactive power voltage/reactive regulation testing, reactive power constant reactive power control testing, reactive power constant power factor control testing, voltage adaptation testing, frequency adaptation testing, fault ride-through testing, harmonic adaptation testing of power quality, harmonic adaptation testing between power quality, three-phase voltage imbalance adaptation testing of power quality, voltage fluctuation and flicker adaptation testing of power quality, direct current input side over-voltage protection testing, alternating current input side under-voltage protection testing, polarity or phase sequence error protection testing, direct current input protection testing, island protection testing, recovery testing, voltage accuracy testing, alternating current accuracy testing, and alternating current accuracy testing.

Further, referring to fig. 1, the power analyzer 700 and the oscilloscope 800 are sequentially connected, a first channel of the power analyzer 700 is connected with the device under test 100 and the power grid simulation device 200 through the first power port, a second channel of the power analyzer 700 is connected with the device under test 100, the bidirectional hvdc source 400 and the high voltage electronic load 500 through the second power port, and the power analyzer 700 is respectively connected with a first oscilloscope 800 port and a second oscilloscope 800 port of the oscilloscope 800.

Further, referring to fig. 1, the device under test 100, the power grid simulation device 200, the RLC load 300, the bidirectional high-voltage dc source 400, the high-voltage electronic load 500, and the conditioning circuit 600 are respectively connected to the upper computer 900.

In some embodiments, the hardware configuration of the power device testing apparatus further includes an industrial personal computer, a UPS, a feedback power grid analog power supply, a programmable RLC carrier, a programmable dc high voltage electronic load 500, a programmable bidirectional dc high voltage power supply, an auxiliary power supply, a power meter, a current sensor, a power analyzer 700, an oscilloscope 800, a current probe, a high voltage differential probe, a CAN interface card, a switching circuit, and a DIO module. The industrial personal computer is of model number of IPC-610L, the UPS is of model number of SANTEKC KR (3 KVA/2400W), the feedback power grid analog power supply is of model number of Ai Nuo ANBGS120TL (maximum phase voltage of 350V, power of 120kVA, frequency of 40-70 Hz), the feedback power grid analog power supply is used for A power grid analog device or AN alternating current source, the programmable RLC load 300 is of model number of Wen Shun WS-873100-380T (power of 120 kW) for island test, the programmable DC high voltage electronic load 500 is of model number of Ai Nuo AN23648-1200-1920 (voltage of 1200V, current of 1920A, power of 48 kW), the programmable bidirectional DC power supply is of model number of Ai Nuo ANEVH-40 (voltage of 1000V, current of 40A, power of 15 KW), the programmable bidirectional DC power supply is used for A PV source (independent)/high voltage source (parallel connection), the auxiliary power supply is of model No. GWINSTEKGPP-3060 (two channels, 20V, 6A), the power meter is of model No. ZLGPA333H (1500V, 50A, three channels, 0.1% primary accuracy), the current sensor is of model No. CSA series (200A, 10ppm accuracy), the current sensors are used for ACDC and PCS dc terminals, respectively, the power analyzer 700 is of model No. ZLGPA6000H (1500V, 50A, five channels, 0.01% primary accuracy), the oscilloscope 800 is of model No. ZLGZDS2024B plus (four channels, 200MHz bandwidth), the oscilloscope 800 is used for measuring dc ripple, the current probe is of model No. ZLGCP2100B (100A, 2.5MHz bandwidth), the high voltage differential probe is of model No. ZLGZP1500D (1500V, bandwidth 100 MHz), the model of the CAN interface card is ZLGUSBCANFD-200U, the model of the switching circuit is PRM series (parallel high voltage source/switching ac loop/switching dc loop), and the model of the DIO module is MOXAE1200.

Further, referring to fig. 1, the grid simulator 200, the RLC load 300, the bidirectional hvdc source 400, the high voltage electronic load 500 and the conditioning circuit 600 are connected to the host computer 900 through RJ45 network lines, respectively. The power grid simulation device 200, the RLC load 300, the bidirectional high-voltage direct current source 400, the high-voltage electronic load 500 and the conditioning circuit 600 are all connected with products by adopting a network port, an upper computer 900 test system matched with the power equipment test device is installed on the basis of an SCPI standard protocol or an instrument manufacturer custom protocol, the upper computer 900 test system realizes related data communication, the upper computer 900 test system controls related equipment to realize simulation under different working conditions, and reads related return values of instruments, the upper computer 900 test system collects data, displays the data, performs logic processing judgment and stores related results in a corresponding file system.

Further, referring to fig. 1, when the device under test 100 is an AC/DC device, the grid simulation apparatus 200 is configured to generate an input of an AC input terminal of the AC/DC device, and the grid simulation apparatus 200 is a programmable AC power source; when the device to be tested 100 is an inverter device, the power grid simulation device 200 is used for simulating various voltage conditions and absorbing ac output of the inverter device, and the power grid simulation device 200 is a feedback power grid simulation device 200; when the device under test 100 is a PCS device, the power grid simulation device 200 is a programmable ac power supply and a feedback power grid simulation device 200.

Further, referring to fig. 1, when the device under test 100 is an inverter device, the bidirectional high voltage dc source 400 outputs a voltage and a current according to a volt-ampere curve of a photovoltaic cell of the inverter device, and the bidirectional high voltage dc source 400 is a photovoltaic cell simulator; when the device under test 100 is a PCS device, the bidirectional high-voltage dc source 400 provides a high-voltage current input to the PCS device, and the bidirectional high-voltage dc source 400 is a programmable high-voltage power supply.

Further, referring to fig. 1, when the device under test 100 is an AC/DC device or a PCS device, the high voltage electronic load 500 is used for pulling current at a DC output terminal of the AC/DC device, and the high voltage electronic load 500 is a programmable electronic load.

Further, referring to fig. 1, when the device under test 100 is an inverter device, the RLC load 300 is configured to disconnect the grid simulator 200 from the inverter device and directly connect the RLC load 300 to the inverter device when performing an island test of the inverter device.

Further, referring to fig. 1, the device under test 100 is an AC/DC device or a PCS device or an inverter device.

Further, referring to fig. 1, the inverter device is a photovoltaic inverter device.

In addition, the power equipment testing device is placed in the aging testing equipment to be tested, and the following testing hardware connection is respectively carried out on the AC/DC equipment, the PCS equipment and the inverter equipment.

Referring to fig. 2, in some embodiments, the power device testing system is placed in an aging device to perform an aging test, where the device under test 100 is an inverter device, and a single set of the power device testing apparatus may age 6 inverter devices below 50KW (or below 5 strings) in parallel, and for inverter devices above 50KW (or above 5 strings) may age 3 in parallel.

Referring to fig. 3, in some embodiments, the power device testing system is placed in an aging device to perform an aging test, where the device to be tested 100 is a PCS device or an AC/DC device, and a single set of the power device testing apparatus may age 6 PCS devices or AC/DC devices below 50KW in parallel, and for PCS devices or AC/DC devices exceeding 50KW, 3 devices may age in parallel by being connected in parallel.

The above burn-in test further comprises: the industrial personal computer comprises an industrial personal computer, a UPS, a direct current source, a bidirectional high-voltage source, a current sensor, a collection loop, an ageing room and an ageing trolley, wherein the industrial personal computer is of a model of a grinding IPC-610L (I7-6700 CPU/1T hard disk, 16G memory), the UPS is of a model of SANTEKC KR (3 KVA/2400W), the direct current source is of a PRM series (15 KW, 750V), the bidirectional high-voltage source is of a PRM series (55KW, 1000V), the current sensor is of a beauty control series, the collection loop is of a model MOXA, the ageing room is of a PRM series, and the ageing trolley is of a PRM series.

In particular, the present utility model also proposes a test system running on the upper computer 900, referring to fig. 4 to 8, the test system comprises: a main testing device 1000, configured to perform a test, where the main testing device 1000 includes a test sequence device 1100, a profile service device 1200, an interface output device 1300, and a database interaction device 1400, and the profile service device 1200, the interface output device 1300, and the database interaction device 1400 are respectively connected to the test sequence device 1100; a database device 2000 for storing test output data of the main test device 1000, wherein the database device 2000 is connected with the database interaction device 1400; and a service device 3000 for performing data interaction with the factory side data system, wherein the service device 3000 is connected with the main test device 1000.

It should be noted that the present utility model further provides a test system running on the upper computer 900 only for explaining a composition mode of the upper computer system of the power equipment test device, and the main test device, the service device and the database device can all be implemented through hardware devices.

Specifically, referring to fig. 4 and 5, the main test device 1000 is a main test execution device, and includes test functions based on a test sequence, and stores test data and a test interaction interface. The service device 3000 is used for performing MES data interaction with a factory end, and is a standard test platform data interface; for the MES formats of different factories, only the program of the MES server needs to be changed, the interaction with the factory MES can be easily performed, and the test platform does not need to be changed. The database device 2000 is used for analyzing database equipment, generating daily test log, generating GRR report, and further comprises FPY and Top 5 functions

In some embodiments, the upper computer test system reads the configuration file of the specific path, loads and generates a corresponding interface, then reads the test Sequence related files under the specific path, including the Main file 1130, preUUT file 1120, preUUTLoop file 1110, postUUT file 1140, postUUTLoop file 1160, save Log file 1150, and other files, preloads the related functions to be called in these files to the memory, then transfers the parameters in the test Sequence related files into the related functions and executes the related functions according to the calling Sequence in the test Sequence related files, feeds the acquired related data back to the interface display process for display, and saves the complete test data to the database device 2000 after the final test is completed. The service device 3000 is configured to read data stored after the testing of the electrical equipment testing system is completed, and transmit the relevant data to a server of the factory through a data interface given by the factory. The database device 2000 is configured to read data stored after the testing of the electrical equipment testing system is completed, generate LOG files meeting the user requirements, and generate related data analysis reports.

In some embodiments, the host computer test system is developed based on NI LabVIEW 2018 64 bits. The test vi is an NI LabVIEW virtual instrument.

The upper computer test system can realize the test without power equipment in one set of test system, and the common power equipment comprises AC/DC equipment, PCS equipment and inverter equipment, and the different power equipment can be tested in the same test platform, so that the time for building, moving, refitting and dismantling the test platform is greatly saved, the labor cost is saved, and the interaction with a user factory database is convenient.

Further, referring to fig. 5, the profile service apparatus 1200 includes a variety of profiles including a clip profile, a Slot number profile, and a database profile, the profiles being in a csv file format. In some specific embodiments, the Main file 1130 in the test sequence file optionally selects configuration information such as jigs, instruments, parameters, graphics, data processing, etc. for testing a specific test item from the configuration file according to the test requirement.

Further, referring to fig. 6, the test sequence device 1100 includes a plurality of test sequence files, where the test sequence files include PreUUTLoop files 1110, preUUT files 1120, main files 1130, postUUT files 1140, save Log files 1150 and PostUUTLoop files 1160, the file formats of the test sequence files are csv, and the test sequence files respectively call a plurality of tests vi for testing. In some embodiments, referring to fig. 3, the test sequence includes all steps listed in the PreUUTLoop file 1110, the PreUUT file 1120, the Main file 1130, the PostUUT file 1140, the Save Log file 1150, and the PostUUTLoop file 1160 being performed sequentially, and in one particular embodiment, after the steps in the Save Log file 1150 are performed, the steps in the PreUUT file 1120, the Main file 1130, the PostUUT file 1140, and the Save Log file 1150 are performed in a loop until the user exits the test at his initiative.

Specifically, referring to fig. 6, preUUTLoop file 1110, preUUT file 1120, main file 1130, postUUT file 1140, and PostUUTLoop file 1160 are all in csv file format.

Further, referring to fig. 7, the test sequence file includes a Step Index, a Step Name, a Step Enable flag Enable, a Step type StepType, a call test vi Name ViName, a test Step Display flag Ui Display, a test Step record ResultRecord, a test Step operation mode Property, a Limit type bit Limit, a retest number LoopNum, a Step parameter InputParameter, a test Delay time Delay and a Next Step type next_step_ctl.

Specifically, the step Index is an integer ranging from 1 to plus infinity.

The step Enable flag bit Enable controls whether to run the test step, which is 0 or 1, and if the step Enable flag bit value is 1, the step will run, and if the step Enable flag bit value is 0, the step will not run.

The step type StepType is the type of the test step, and the value of the step type StepType is TST, ACT and FLC;

Wherein,

ACT: for performing certain operations, such as cylinder up/down, power on/off, without limitation for the sub VI, the result of the execution includes pass, fail and error.

TST: for executing test items, such as voltage measurement, the name of the Limit needs to be configured, and the detailed Limit is configured in the Limit file and comprises an upper Limit, a lower Limit, units and judgment conditions.

FLC: for flow control, jump to a step if failure, call a sub-sequence, etc.

SPE: for performing some special actions such as start condition judgment, bar code scan UI and judgment, etc.

The test step Display flag bit Ui Display is used for controlling whether the test step is to be displayed on the Ui, the value of the test step Display flag bit Ui Display is 0 or 1, if the test step Display flag bit Ui Display value is 1, the step is to be displayed on the Ui, and if the test step Display flag bit Ui Display value is 0, the step is not to be displayed on the Ui.

The test step record ResultRecord is used to control whether this test step will be recorded on the database device 2200 with a value of 0 or 1, if the test step record ResultRecord is a value of 1, this step will be recorded in the database device 2200, and if the test step record ResultRecord is a value of 0, this step will not be recorded in the database device 2200.

The test step running mode Property is used for controlling the running mode of the test step, the values of the test step running mode Property are Parallel, serial and single on, if the test step running mode Property value is Parallel, the step is operated in Parallel, if the test step running mode Property value is Serial, the step is operated in Serial, and if the test step running mode Property value is on, the step is operated only Once.

The Limit type bit Limit is the name of the Limit, and detailed Limit information is configured in the Limit file.

The step parameter InputParameter has a format of value1|value2, where "|" is a separator, indicating that a plurality of parameters are juxtaposed.

The test Delay time Delay is the Delay time after the test step.

The next_step_ctl type includes the following values:

1) NEXT, direct NEXT, means that the NEXT step is directly performed after the completion of this test step;

2) if fail goto, step failure transfer, means that when this test step fails, the next step will be run in the designated step;

3) if pass goto, step success transfer, means that after passing this test step, the next step will be run in the designated step;

4) goto, forwarding the designated step to execute the next step, indicating that the next step will be executed in the designated step after the completion of the test step;

5) force pass, force the step, means this test step is finished, force this step;

6) force fail, forcing the step to fail after the test step is completed;

7) Stop if fail, stopping execution when the test step fails, means that the test sequence will Stop when the test step fails.

Further, referring to fig. 8, the step types include an execution test item TST type, an execution designation operation ACT type, an execution flow control FLC type, and an execution special operation SPE type.

Wherein,

FLC: for flow control, jump to a step if failure, call a sub-sequence, etc.

Further, the test step operation mode comprises parallel operation, serial operation and single operation on.

Further, referring to fig. 8, the Limit type bit is used to indicate the Name of the Limit type, and detailed information of the Limit type is recorded in a Limit file including a Limit Name, a Limit upper Limit value UPLimit, a Limit lower Limit value DownLimit, a comparison criterion Comparis, and a numerical Unit. In some embodiments, the format of the Limit file is a csv format.

Further, referring to fig. 7, the NEXT type includes a direct NEXT, a step fail transfer if fail goto, a step success transfer if pass goto, a transfer designating step execution NEXT step goto, a force execution step force pass, a force step fail, and a Stop if fail when fail.

Further, referring to fig. 4, the database apparatus 2000 further includes a log generating apparatus 2100 for recording detailed information of all test steps including test items, limit ranges, test results, start times, end times, and additional information.

Further referring to fig. 4, the database apparatus 2000 includes a database device 2200, the database device 2200 is an SQLite database, and the database device 2200 is connected to the database interaction apparatus 1400.

In some embodiments, the power device testing apparatus has various forms so as to test various devices under test 100, and the utility model proposes a simplified power device testing apparatus for island testing of a photovoltaic inverter, and the photovoltaic inverter island testing method can also be run on other power device testing apparatuses.

In particular, referring to fig. 9, the utility model also provides a photovoltaic inverter island test method and device for the anti-island performance of the photovoltaic inverter, and the photovoltaic inverter island test method is optionally applied to a power equipment test device and a simplified power equipment test device.

It should be noted that the anti-islanding performance of the photovoltaic inverter according to the present utility model also provides a photovoltaic inverter islanding test method, which is only used for explaining the power equipment test device and the simplified power equipment test device.

Referring to fig. 9, the simplified power equipment testing apparatus at least includes a power grid simulation apparatus 200, a device under test 100, and a bidirectional high voltage DC source 400, which are sequentially connected, and further includes an oscilloscope 800, an RLC load 300, and an upper computer 900, where the oscilloscope 800 and the RLC load 300 are respectively connected to the device under test 100, the power grid simulation apparatus 200 is connected to the device under test 100 through a first switch S1, the RLC load 300 is connected to the device under test 100 through a second switch S2, and the power grid simulation apparatus 200, the device under test 100, the bidirectional high voltage DC source 400, the oscilloscope 800, the RLC load 300, the first switch S1, and the second switch S2 are respectively connected to the upper computer 900, and the device under test 100 is one or a combination of a plurality of AC/DC devices, PCS devices, and photovoltaic inverter devices.

The island test method of the photovoltaic inverter comprises the following steps:

s100, the upper computer 900 controls the first switch S1 to be closed, controls the second switch S2 to be opened and starts the device to be tested 100;

s200, the upper computer 900 controls the bidirectional high-voltage direct current source 400 to output so that the alternating current output power of the equipment 100 to be tested reaches the preset power, and the reactive power of the equipment 100 to be tested is measured, wherein the preset power is not higher than the rated alternating current output power of the equipment 100 to be tested;

S300, the upper computer 900 controls the equipment to be tested 100 to stop, controls the first switch S1 to be opened and controls the second switch S2 to be closed;

s400, the upper computer 900 adjusts the RLC load 300 so that the power factor of the device under test 100 reaches a preset power factor;

S500, the upper computer 900 controls the first switch S1 and the second switch S2 to be closed, and starts the device to be tested 100;

s600, the upper computer 900 controls the first switch S1 to be turned off, the oscilloscope 800 measures state transition time, the upper computer 900 obtains and records measurement waveforms of the oscilloscope 800 and the state transition time, and the state transition time is time consumption from the time when the first switch S1 is turned off to the time when the output current of the device 100 to be tested is reduced and maintained at a preset current;

And S700, adjusting the preset power, and repeatedly executing the steps S100 to S600 until the test is completed.

Further, the step S400 further includes:

S410, the upper computer 900 mediates the RLC load 300 so that the inductive reactive power consumed by the RLC load 300 meets the inductive reactive power balance condition;

S420, the upper computer 900 adjusts the access inductance of the RLC load 300 so that the reactive power of the device 100 to be tested is equal to the inductive reactive power consumed by the RLC load 300;

S430, the upper computer 900 adjusts the access capacitance of the RLC load 300, so that the capacitive reactive power consumed by the RLC load 300 meets the capacitive reactive power balance condition;

S440, the upper computer 900 adjusts the access resistance of the RLC load 300, so that the active power consumed by the RLC load 300 is equal to the AC output power of the device under test 100.

Further, the inductive reactive power balance condition is:

Q_L＝Q_F*P，

Wherein Q _L is the inductive reactive power of the RLC load 300, Q _F is the power factor of the device under test 100, and P is the ac output power of the device under test 100.

Further, the capacitive reactive power balance condition is:

Q_L+Q_C＝Q_EUT，

Wherein, Q _L is the inductive reactive power of the RLC load 300, Q _C is the capacitive reactive power of the RLC load 300, and Q _EUT is the reactive power output by the inverter.

Further, the preset power factor is 0.95 to 1.05 times the power factor of the device under test 100.

Further, the preset current is not higher than 1% of the rated output current of the device under test 100, which is the output current of the device under test 100.

Further, the preset power is 33%, 66% and 100% of the rated ac output power of the device under test 100. In some specific embodiments, other percentages of rated power may be set.

Further, referring to fig. 9, the present utility model further provides a power equipment testing device, where the power equipment testing device includes a power grid simulation device 200, a device under test 100, a bidirectional hvdc source 400, an oscilloscope 800, an RLC load 300, and an upper computer 900, where the oscilloscope 800 and the RLC load 300 are respectively connected to the device under test 100, the power grid simulation device 200 is connected to the device under test 100 through a first switch S1, the RLC load 300 is connected to the device under test 100 through a second switch S2, and the power grid simulation device 200, the device under test (DsUT) 100, the bidirectional hvdc source 400, the oscilloscope 800, the RLC load 300, the first switch S1, and the second switch S2 are respectively connected to the upper computer 900.

Further referring to fig. 9, the device under test 100 is a combination of one or more of an AC/DC device, a PCS device, and a photovoltaic inverter device.

Further, referring to fig. 9, the RLC load 300 is a PV-RLC series load.

According to the photovoltaic inverter island test method and the device thereof, the conventional test method and the conventional test device are difficult to multiplex the test equipment, so that the equipment 100 to be tested is often required to be switched on different test platforms.

The present utility model is not limited to the above embodiments, but can be modified, equivalent, improved, etc. by the same means to achieve the technical effects of the present utility model, which are included in the spirit and principle of the present disclosure. Are intended to fall within the scope of the present utility model. Various modifications and variations are possible in the technical solution and/or in the embodiments within the scope of the utility model.

Claims

1. A power equipment testing device, comprising:

a device under test (100), the device under test (100) comprising at least one power port, at least one signal port and at least one communication port;

The power grid simulation device (200) is connected with the equipment (100) to be tested through a first power port;

-an RLC load (300), the RLC load (300) being connected with the device under test (100) through the first power port;

a bidirectional high-voltage direct current source (400), wherein the bidirectional high-voltage direct current source (400) is connected with the device (100) to be tested through a second power port;

-a high voltage electronic load (500), the high voltage electronic load (500) being connected with the device under test (100) through the second power port;

and the conditioning circuit (600) is connected with the device (100) to be tested through a first signal port.

2. The power equipment testing device of claim 1, wherein the power equipment testing device comprises a power supply,

The power analyzer is characterized by further comprising a power analyzer (700) and an oscilloscope (800) which are sequentially connected, wherein a first channel of the power analyzer (700) is connected with the device to be tested (100) and the power grid simulation device (200) through a first power port, a second channel of the power analyzer (700) is connected with the device to be tested (100) through a second power port, a bidirectional high-voltage direct-current source (400) is connected with the high-voltage electronic load (500), and the power analyzer (700) is respectively connected with a first oscilloscope (800) port and a second oscilloscope (800) port of the oscilloscope (800).

3. The power equipment testing device of claim 1, wherein the power equipment testing device comprises a power supply,

The device for testing the power grid simulation device comprises a power grid simulation device (200), an RLC load (300), a bidirectional high-voltage direct-current source (400), a high-voltage electronic load (500) and a conditioning circuit (600), and further comprises an upper computer (900), wherein the device to be tested (100), the power grid simulation device, the RLC load (300), the bidirectional high-voltage direct-current source (400), the high-voltage electronic load (500) and the conditioning circuit (600) are respectively connected with the upper computer (900).

4. The power equipment testing device of claim 3, wherein,

The power grid simulation device (200), the RLC load (300), the bidirectional high-voltage direct current source (400), the high-voltage electronic load (500) and the conditioning circuit (600) are respectively connected with the upper computer (900) through RJ45 network cables.

5. The power equipment testing device of claim 1, wherein the power equipment testing device comprises a power supply,

When the device to be tested (100) is an AC/DC device, the power grid simulation device (200) is used for generating input of an alternating current input end of the AC/DC device, and the power grid simulation device (200) is a programmable alternating current power supply;

When the equipment to be tested (100) is inverter equipment, the power grid simulation device (200) is used for simulating various voltage working conditions and absorbing alternating current output of the inverter equipment, and the power grid simulation device (200) is a feedback power grid simulation device (200);

When the device to be tested (100) is PCS equipment, the power grid simulation device (200) is a programmable alternating current power supply and a feedback power grid simulation device (200).

6. The power equipment testing device of claim 1, wherein the power equipment testing device comprises a power supply,

When the device to be tested (100) is an inverter device, the bidirectional high-voltage direct current source (400) outputs voltage and current according to the volt-ampere curve of a photovoltaic cell of the inverter device, and the bidirectional high-voltage direct current source (400) is a photovoltaic cell simulator;

When the device under test (100) is a PCS device, the bidirectional high-voltage direct current source (400) provides high-voltage current input for the PCS device, and the bidirectional high-voltage direct current source (400) is a programmable high-voltage power supply.

7. The power equipment testing device of claim 1, wherein the power equipment testing device comprises a power supply,

When the device to be tested (100) is an AC/DC device or a PCS device, the high-voltage electronic load (500) is used for pulling and carrying the current of the direct-current output end of the AC/DC device, and the high-voltage electronic load (500) is a programmable electronic load.

8. The power equipment testing device of claim 1, wherein the power equipment testing device comprises a power supply,

When the equipment to be tested (100) is inverter equipment, the RLC load (300) is used for implementing an island test of the inverter equipment, the connection between the power grid simulation device (200) and the inverter equipment is disconnected, and the RLC load (300) is directly connected to the inverter equipment.

9. The power equipment testing device of claim 8, wherein the power equipment testing device comprises a power supply,

The inverter device is a photovoltaic inverter device.