CN220773096U - Clamping mechanism of chip electric test equipment - Google Patents

Abstract

The utility model relates to a clamping mechanism of chip electric test equipment, which comprises a test bench, wherein the front surface of the test bench is provided with an adjusting clamping mechanism, the adjusting clamping mechanism comprises two fixed plates fixedly connected with the front surface of the test bench, one sides of the two fixed plates opposite to each other are fixedly connected with electric push rods, one sides of the two electric push rods opposite to each other are fixedly connected with movable plates, the back surfaces of the two movable plates are fixedly connected with two sliding blocks, the front surface of the test bench is provided with four sliding grooves, and the front surfaces of the two movable plates are fixedly connected with positioning blocks. This fixture of chip electric test equipment can carry out the centre gripping to the chip of equidimension not under the effect of electric putter and second screw rod through setting up adjusting fixture, can remove the chip that the test was accomplished out movable clamp through first screw rod and vacuum pump to when taking the chip, can prevent to drop and cause the chip to damage.

Description

Clamping mechanism of chip electric test equipment

Technical Field

The utility model relates to the technical field of chip electric test clamping, in particular to a clamping mechanism of chip electric test equipment.

Background

The chip is an indispensable part of the electrical appliance, and the chip needs to be electrically tested when leaving the factory, and the electrical testing equipment is equipment for testing the performance of the chip.

For example, chinese patent CN 209559932U discloses an anti-damage clamping device for testing an optical communication chip, in which an adhesive layer is disposed between an upper chuck and a lower chuck, when the main body is used, the upper chuck and the lower chuck are used to clamp the chip as a test experiment, the adhesive layer plays a role in protecting the chip, so that the chip is effectively prevented from being damaged, and the working efficiency is greatly improved, but the existing clamping mechanism is generally simple and cannot be adjusted according to the size of the chip, and after the detection is completed, the chip is small, the chip is easy to drop when taken out from the clamping mechanism, so that the chip is damaged, and the clamping mechanism of the chip electrical testing device is provided to solve the above problems.

Disclosure of Invention

Aiming at the defects of the prior art, the utility model provides the clamping mechanism of the chip electric test equipment, which has the advantages of adjustable size and the like, and solves the problems that the chip cannot be adjusted according to the size of the chip, and the chip is easy to drop to cause damage of the chip when the chip is taken out from the clamping mechanism due to smaller chip after detection is completed.

In order to achieve the above purpose, the present utility model provides the following technical solutions: the clamping mechanism of the chip electric test equipment comprises a test bench, and an adjusting clamping mechanism is arranged on the front surface of the test bench.

The utility model provides an adjustable clamping mechanism, including with the positive fixed plate of fixed connection of testboard and quantity be two, two the equal fixedly connected with electric putter of one side that the fixed plate is relative, two the equal fixedly connected with fly leaf of one side that electric putter is relative, two the equal fixedly connected with in back of fly leaf is slider two, the spout that quantity is four has been seted up in the front of testboard, two the equal fixedly connected with locating piece in front of fly leaf, two the equal fixedly connected with second motor in front of fly leaf, two the equal fixedly connected with second screw rod of output shaft of second motor, two the equal threaded connection in outside of second screw rod is the fly leaf, the positive fixedly connected with installation storehouse of testboard, the inside fixedly connected with first motor of installation storehouse, the output shaft fixedly connected with first screw rod of first screw rod, the outside threaded connection of first screw rod has place the piece, the positive fixedly connected with limiting plate of testboard.

Further, place the inside fixedly connected with vacuum pump of piece, the right side fixedly connected with second intake pipe of vacuum pump, place the inside fixedly connected with sucking disc that the piece is two in quantity, one side and the right side sucking disc fixed connection of vacuum pump are kept away from to the second intake pipe, the outside fixedly connected with first intake pipe of second intake pipe, one side and the left side sucking disc fixed connection of second intake pipe are kept away from to first intake pipe.

Further, the tops of the two second screws are rotatably connected with the bottoms of the two positioning blocks through bearings.

Further, the top of first screw rod is connected with the bottom of limiting plate through the bearing rotation, four the opposite side of activity clamp is all fixedly connected with rubber pad.

Further, the inside of placing the piece is offered and is had the first screw thread through-hole with first screw rod size looks adaptation.

Further, second threaded through holes matched with the second screw in size are formed in the four movable clamps.

Compared with the prior art, the technical scheme of the application has the following beneficial effects:

this fixture of chip electric test equipment can carry out the centre gripping to the chip of equidimension not under the effect of electric putter and second screw rod through setting up adjusting fixture, can remove the chip that the test was accomplished out movable clamp through first screw rod and vacuum pump to when taking the chip, can prevent to drop and cause the chip to damage.

Drawings

FIG. 1 is a schematic diagram of the structure of the present utility model;

fig. 2 is a schematic view of the inside of the structure placement block of the present utility model.

In the figure: the device comprises a placing block 1, a first motor 2, a mounting bin 3, a second motor 4, a second screw 5, a movable plate 6, an electric push rod 7, a fixed plate 8, a movable clamp 9, a chute 10, a test bench 11, a sliding block 12, a positioning block 13, a rubber pad 14, a limiting plate 15, a first screw 16, a sucking disc 17, a first air inlet pipe 18, a vacuum pump 19 and a second air inlet pipe 20.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Referring to fig. 1-2, a clamping mechanism of a chip electrical testing apparatus in this embodiment includes a testing table 11, and an adjusting clamping mechanism is disposed on a front surface of the testing table 11.

The adjusting and clamping mechanism comprises two fixed plates 8 fixedly connected with the front surface of a test bench 11, wherein one sides of the two fixed plates 8 opposite to each other are fixedly connected with electric push rods 7, one sides of the two electric push rods 7 opposite to each other are fixedly connected with movable plates 6, the back surfaces of the two movable plates 6 are fixedly connected with two sliding blocks 12, four sliding grooves 10 are formed in the front surface of the test bench 11, positioning blocks 13 are fixedly connected with the front surfaces of the two movable plates 6, second motors 4 are fixedly connected with the front surfaces of the two movable plates 6, second screw rods 5 are fixedly connected with output shafts of the two second motors 4, the tops of the two second screw rods 5 are rotatably connected with the bottoms of the two positioning blocks 13 through bearings, the outsides of the two second screw rods 5 are fixedly connected with two movable clamps 9, one sides of the four movable clamps 9 opposite to each other are fixedly connected with rubber pads 14, the inside of the four movable clamps 9 is provided with second threaded through holes which are matched with the second screw rod 5 in size, the front surface of the test bench 11 is fixedly connected with the mounting bin 3, the inside of the mounting bin 3 is fixedly connected with the first motor 2, the output shaft of the first motor 2 is fixedly connected with the first screw rod 16, the outer side of the first screw rod 16 is in threaded connection with the placing block 1, the inside of the placing block 1 is provided with first threaded through holes which are matched with the first screw rod 16 in size, the inside of the placing block 1 is fixedly connected with sucking discs 17 with two in number, the inside of the placing block 1 is fixedly connected with a vacuum pump 19, the right side of the vacuum pump 19 is fixedly connected with a second air inlet pipe 20, the outer side of the second air inlet pipe 20 is fixedly connected with a first air inlet pipe 18, one side of the first air inlet pipe 18 far away from the second air inlet pipe 20 is fixedly connected with a left sucking disc 17, one side of the second air inlet pipe 20 far away from the vacuum pump 19 is fixedly connected with the right sucking disc 17, the front surface of the test bench 11 is fixedly connected with the limiting plate 15, and the top of the first screw 16 is rotatably connected with the bottom of the limiting plate 15 through a bearing.

The chips with different sizes can be clamped under the action of the electric push rod 7 and the second screw rod 5, and the tested chips can be moved out of the movable clamp 9 through the first screw rod 16 and the vacuum pump 19, so that the chips can be prevented from being damaged due to falling when the chips are taken out.

The working principle of the embodiment is as follows:

this fixture of chip electric test equipment through placing the chip on placing piece 1, through starting vacuum pump 19, thereby vacuum pump 19 is fixed the chip with the back of inhaling the air in two sucking discs 17, through starting first motor 2, first motor 2 drives first screw rod 16 and rotates, first screw rod 16 drives the piece 1 of placing that has the chip and removes, push away two fly leaf 6 to the chip at two electric putter 7 of start, through two second motors 4 of start, two second motors 4 drive two second screw rods 5 rotation, two second screw rods 5 drive four movable clamp 9 and remove, thereby carry out the centre gripping to the chip, and then can carry out the centre gripping to the chip of equidimension not.

The control mode of the utility model is controlled by the controller, the control circuit of the controller can be realized by simple programming by a person skilled in the art, the supply of the power supply also belongs to the common knowledge in the art, and the utility model is mainly used for protecting mechanical devices, so the utility model does not explain the control mode and circuit connection in detail, and the device is powered by an external power supply.

It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims (6)

1. Clamping mechanism of chip electric test equipment, including testboard (11), its characterized in that: the front surface of the test table (11) is provided with an adjusting and clamping mechanism;

the utility model provides an adjustable clamping mechanism, including fixed plate (8) with testboard (11) openly fixed connection and quantity are two, two equal fixedly connected with electric putter (7) in one side that fixed plate (8) are relative, two one side fixedly connected with fly leaf (6) that electric putter (7) are relative, two slider (12) that the back equal fixedly connected with quantity is two of fly leaf (6), spout (10) that quantity is four are offered in the front of testboard (11), two equal fixedly connected with locating piece (13) in the front of fly leaf (6), two equal fixedly connected with second motor (4) in the front of fly leaf (6), two equal fixedly connected with second screw rod (5) in the output shaft of second motor (4), two equal threaded connection in the outside of second screw rod (5) has a movable clamp (9) that quantity is two, the front fixedly connected with install bin (3), the inside fixedly connected with first motor (2) of install bin (3), first screw rod (16) are placed in the front of first screw rod (16), first screw rod (16) are placed in the front of test board (16).

2. The clamping mechanism of a chip electrical test apparatus according to claim 1, wherein: the inside fixedly connected with vacuum pump (19) of placing piece (1), the right side fixedly connected with second intake pipe (20) of vacuum pump (19), place inside fixedly connected with quantity of piece (1) and be two sucking discs (17), one side and right side sucking disc (17) fixed connection of vacuum pump (19) are kept away from to second intake pipe (20), the outside fixedly connected with first intake pipe (18) of second intake pipe (20), one side and left side sucking disc (17) fixed connection of second intake pipe (20) are kept away from to first intake pipe (18).

3. The clamping mechanism of a chip electrical test apparatus according to claim 1, wherein: the tops of the two second screws (5) are rotatably connected with the bottoms of the two positioning blocks (13) through bearings.

4. The clamping mechanism of a chip electrical test apparatus according to claim 1, wherein: the top of the first screw rod (16) is rotationally connected with the bottom of the limiting plate (15) through a bearing, and rubber pads (14) are fixedly connected to one sides of the four movable clamps (9) opposite to each other.

5. The clamping mechanism of a chip electrical test apparatus according to claim 1, wherein: the inside of placing piece (1) is offered and is had the first screw thread through-hole with first screw rod (16) size looks adaptation.

6. The clamping mechanism of a chip electrical test apparatus according to claim 1, wherein: second threaded through holes matched with the second screw rods (5) in size are formed in the four movable clamps (9).