CN220709228U

CN220709228U - Aging test fixture for electronic components

Info

Publication number: CN220709228U
Application number: CN202322385659.0U
Authority: CN
Inventors: 朱建军
Original assignee: Shenzhen Jingsen Technology Co ltd
Current assignee: Shenzhen Jingsen Technology Co ltd
Priority date: 2023-09-04
Filing date: 2023-09-04
Publication date: 2024-04-02
Anticipated expiration: 2033-09-04

Abstract

The utility model discloses an electronic component aging test fixture which comprises a box body, wherein a chute is formed in the surface of the box body, a hollow groove is formed in the bottom of the chute, a contact plate is fixedly arranged in the hollow groove, a positioning fixture is arranged at the top of the chute, and the positioning fixture comprises a positioning plate, a lifting plate, an electric screw rod, a connecting block and a locking block. According to the utility model, the electronic components to be detected are placed in the detection cavity through the positioning clamp, the connecting block and the locking block of the positioning clamp are used for positioning and clamping one end face of the electronic components, the electric screw rod can be controlled to work according to different types of the electronic components to adjust the position of the mobile electronic components, the sampling table extends out of the probe to connect the electronic components, meanwhile, the heating seat at the bottom is used for heating and heating the electronic components, so that the aging performance of the electronic components is detected, and the aging test of the electronic components can be completed simply and rapidly.

Description

Aging test fixture for electronic components

Technical Field

The utility model relates to the technical field of electronic component testing equipment, in particular to an electronic component aging testing fixture.

Background

The electronic component is a component part of an electronic element and a small machine or instrument, is often composed of a plurality of parts, and can be commonly used in similar products; some parts of the industry such as electric appliances, radios, meters and the like are commonly referred to as electronic devices such as capacitors, transistors, hairsprings, springs and the like. The electronic component includes: resistor, capacitor, inductor, potentiometer, electronic tube, radiator, electromechanical element, connector, semiconductor discrete device, electroacoustic device, laser device, electronic display device, photoelectric device, sensor, power supply, switch, micro-motor, electronic transformer, relay, printed circuit board, integrated circuit, various circuits, piezoelectric, crystal, quartz, ceramic magnetic material, base substrate for printed circuit, special material for electronic function process, electronic adhesive (tape) product, electronic chemical material, and parts.

In order to ensure the product performance of the electronic components, aging test is required to be carried out after the production of the electronic components is finished, the surface temperature of the electronic components is usually too high after the existing aging test is finished, and the electronic components are easy to scald after being directly contacted and moved.

Disclosure of Invention

In order to overcome the above-mentioned defects in the prior art, an embodiment of the present utility model provides an electronic component burn-in test fixture.

In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides an electronic components smelts test fixture, includes the box, the box surface is provided with the spout, the spout bottom is equipped with the hollow tank, the inside fixed contact plate that is equipped with of hollow tank, the spout top is equipped with positioning fixture, positioning fixture includes locating plate, lifter plate, electronic lead screw, connecting block and latch segment, the locating plate with be equipped with electronic lead screw between the lifter plate, electronic lead screw bottom surface is equipped with the connecting block, connecting block bottom one end is equipped with the latch segment, the connecting block with be equipped with the clearance groove between the latch segment, the lifter plate bottom plate is equipped with the detection chamber, the detection chamber bottom is equipped with the heating seat, the contact plate bottom is equipped with the cooling chamber.

In a preferred embodiment, the box sets up to a plurality of table tops, and every table top surface all is equipped with contact plate and positioning fixture, the box outside is equipped with the protective housing, the protective housing both ends all are equipped with the installation piece, the box both sides run through and are equipped with the mounting groove, the installation piece with the mounting groove phase-match.

In a preferred embodiment, the top surface of the box is provided with a display lamp, and the bottom of the display lamp is provided with a plurality of control buttons.

In a preferred embodiment, the depth of the chute is greater than that of the detection cavity, and the locking block is arranged at the top of the chute and is clamped with the inner wall of the chute.

In a preferred embodiment, the bottom of the positioning plate is also uniformly provided with a guide rod, a through hole is formed in the lifting plate in a penetrating mode, the guide rod penetrates through the through hole and extends to the surface of the box body, and positioning seats are arranged at two ends of the electric screw rod.

In a preferred embodiment, a heating seat is arranged at the bottom of the detection cavity, a heating coil is filled in the heating seat, and a wire through groove penetrating through the detection cavity is arranged on the outer side of the heating seat.

In a preferred embodiment, a sampling meter is arranged in the box body, the sampling meter is arranged into a voltmeter and an ammeter, a plurality of detection cables are arranged at the output end of the sampling meter, and the detection cables penetrate through the line through grooves and extend to the outer side of the detection cavity.

In a preferred embodiment, the cooling cavity is internally filled with a cooling plate, the surface of the top of the cooling cavity is provided with a hollow plate, the cooling plate and the hollow plate are internally filled with a coolant, the top of the hollow plate is attached with a heat conducting plate, and the heat conducting plate is arranged at the bottom of the contact plate.

The utility model has the technical effects and advantages that:

1. according to the utility model, the electronic components to be detected are placed in the detection cavity through the positioning clamp, the connecting block and the locking block of the positioning clamp are used for positioning and clamping one end face of the electronic components, the position of the mobile electronic components can be adjusted by controlling the operation of the electric screw according to different types of the electronic components, the electronic components are connected by the probe extending out of the sampling table, meanwhile, the heating seat at the bottom is used for heating the electronic components, so that the aging performance of the electronic components is detected, the aging test of the electronic components can be simply and rapidly completed, an operator is not required to manually contact the electronic components in the test process, the parameters are controllable and adjustable, and the detection is more accurate;

2. through being equipped with a plurality of boxes, contact plate and cooling chamber, the product after the detection is accomplished removes to the contact plate surface, the refrigeration piece work in the cooling chamber absorbs the heat of contact plate after refrigerating fluid refrigeration, thereby carry out heat exchange to electronic components, make its surface temperature reduce fast, again by workman's operation take after reducing, avoid the condition emergence of hand scald, and a plurality of boxes can be realized carrying out contrast test to same model electronic components, the circuit is connected power and ground, other input pin parallelly connected access resistance and link to each other with the power end, make the inside transistor of circuit basically realize the reverse bias, induce the failure mechanism that is related to the magazine pollution in high temperature environment, and can input appropriate circuit variation through the sampling table, make inside realization node upset of circuit, can realize the comprehensive investigation of the electrical characteristics of inside node of device, dielectric medium, electrically conductive path.

Drawings

Fig. 1 is a schematic diagram of the overall structure of the present utility model.

Fig. 2 is a schematic diagram of the structure of the case of the present utility model.

Fig. 3 is a side view of the case of the present utility model.

The reference numerals are: 1 box, 11 mounting groove, 12 display lamp, 13 control button, 2 spout, 3 hollow groove, 4 contact plate, 5 positioning fixture, 51 locating plate, 52 lifter plate, 53 guide bar, 54 electric screw rod, 541 locating seat, 55 connecting block, 56 latch segment, 6 detection chamber, 61 heating seat, 7 sampling table, 8 cooling chamber, 81 refrigeration piece, 82 hollow plate, 83 heat-conducting plate.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

According to the electronic component aging test fixture shown in fig. 1-3, the electronic component aging test fixture comprises a box body 1, a chute 2 is arranged on the surface of the box body 1, a hollow groove 3 is arranged at the bottom of the chute 2, a contact plate 4 is fixedly arranged in the hollow groove 3, a positioning fixture 5 is arranged at the top of the chute 2, the positioning fixture 5 comprises a positioning plate 51, a lifting plate 52, an electric screw 54, a connecting block 55 and a locking block 56, an electric screw 54 is arranged between the positioning plate 51 and the lifting plate 52, a connecting block 55 is arranged on the bottom surface of the electric screw 54, a locking block 56 is arranged at one end of the bottom of the connecting block 55, a clearance groove is arranged between the connecting block 55 and the locking block 56, a detection cavity 6 is arranged on the bottom plate of the lifting plate 52, a heating seat 61 is arranged at the bottom of the detection cavity 6, and a cooling cavity 8 is arranged at the bottom of the contact plate 4.

The box 1 sets up to a plurality of table tops, and every table top surface all is equipped with contact plate 4 and positioning fixture 5, and the box 1 outside is equipped with the protective housing, and the protective housing both ends all are equipped with the installation piece, and the box 1 both sides run through and are equipped with mounting groove 11, installation piece and mounting groove 11 assorted can shelter from the protection with box 1 surface by the protective housing after having placed electronic components.

The display lamp 12 is arranged on the top surface of the box body 1, the control buttons 13 are arranged at the bottom of the display lamp 12, detection signals can be fed back in real time by the display lamp, the control buttons 13 can adjust and connect electronic components to input proper circuit variable quantity, so that node overturning is realized in a circuit, and comprehensive investigation on the electrical characteristics of nodes, dielectrics and conductive paths in the components can be realized.

The depth of the chute 2 is greater than that of the detection cavity 6, and the locking block 56 is arranged at the top of the chute 2 and is clamped with the inner wall of the chute 2, so that the electric screw 54 can be controlled to work according to different types of electronic components to adjust the positions of the mobile electronic components.

The bottom of the positioning plate 51 is also uniformly provided with a guide rod 53, a through hole is formed in the lifting plate 52 in a penetrating manner, the guide rod 53 penetrates through the through hole and extends to the surface of the box body 1, and the two ends of the electric screw rod 54 are respectively provided with a positioning seat 541.

The bottom of the detection cavity 6 is provided with a heating seat 61, a heating coil is filled in the heating seat 61, and a wire through groove penetrating through the detection cavity 6 is arranged on the outer side of the heating seat 61.

The inside sampling table 7 that is equipped with of box 1, sampling table 7 set up to voltmeter and ampere meter, and sampling table 7 output is equipped with a plurality of detection cables, and detection cable runs through the wire groove and extends to the detection chamber 6 outside, stretches out the probe by sampling table 7 and connects electronic components, and the heating seat 61 of bottom heats the intensification to electronic components detects electronic components's ageing performance, can accomplish its ageing test simply quick.

The cooling chamber 8 is inside to be filled with the refrigeration piece 81, cooling chamber 8 top surface is equipped with cavity board 82, the inside coolant that all is filled of refrigeration piece 81 and cavity board 82, cavity board 82 top is attached and is had heat-conducting plate 83, heat-conducting plate 83 sets up in contact plate 4 bottom, the product after the detection is accomplished removes to contact plate 4 surface, the refrigeration piece work in the cooling chamber 8 absorbs the heat of contact plate 4 after refrigerating the coolant liquid, thereby carry out heat exchange to electronic components, make its surface temperature reduce fast, again by workman's operation take after the reduction, avoid the condition emergence of hand scald.

The working principle of the utility model is as follows:

referring to fig. 1 and 2 of the accompanying drawings: the electronic components to be detected are placed in the detection cavity 6, one end face of the electronic components is positioned and clamped by the connecting block 55 and the locking block 56 of the positioning clamp 5, the electric screw 54 can be controlled to work according to different types of the electronic components to adjust the position of the mobile electronic components, the sampling table 7 extends out of the probe to connect the electronic components, meanwhile, the heating seat 61 at the bottom heats the electronic components, the aging performance of the electronic components is detected, the aging test of the electronic components can be simply and rapidly completed, an operator is not required to manually contact the electronic components in the test process, the parameters are controllable and adjustable, and the detection is more accurate;

referring to fig. 1 and 3 of the accompanying drawings: the product after the detection moves to the surface of the contact plate 4, the cooling piece in the cooling cavity 8 absorbs the heat of the contact plate 4 after cooling the cooling liquid, so that the heat exchange is carried out on electronic components, the surface temperature of the electronic components is reduced rapidly, the electronic components are taken by workers after being reduced, the condition of hand scalding is avoided, a plurality of boxes 1 can realize the comparison test on the electronic components of the same model, a circuit is connected with a power supply and the ground, other input pins are connected with a resistor in parallel and are connected with a power supply end, the reverse bias is basically realized on transistors in the circuit, a failure mechanism related to magazine pollution is induced in a high-temperature environment, the node overturning is realized in the circuit through the input of a sampling table 7, and the comprehensive investigation on the electrical characteristics of nodes, dielectrics and conductive paths in the device can be realized.

The last points to be described are: first, in the description of the present application, it should be noted that, unless otherwise specified and defined, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be mechanical or electrical, or may be a direct connection between two elements, and "upper," "lower," "left," "right," etc. are merely used to indicate relative positional relationships, which may be changed when the absolute position of the object being described is changed;

secondly: in the drawings of the disclosed embodiments, only the structures related to the embodiments of the present disclosure are referred to, and other structures can refer to the common design, so that the same embodiment and different embodiments of the present disclosure can be combined with each other under the condition of no conflict;

finally: the foregoing description of the preferred embodiments of the utility model is not intended to limit the utility model to the precise form disclosed, and any such modifications, equivalents, and alternatives falling within the spirit and principles of the utility model are intended to be included within the scope of the utility model.

Claims

1. The utility model provides an electronic components smelts test fixture, includes box (1), its characterized in that: the surface of the box body (1) is provided with a chute (2), the bottom of the chute (2) is provided with a hollow groove (3), a contact plate (4) is fixedly arranged inside the hollow groove (3), the top of the chute (2) is provided with a positioning clamp (5), the positioning clamp (5) comprises a positioning plate (51), a lifting plate (52), an electric screw rod (54), a connecting block (55) and a locking block (56), the electric screw rod (54) is arranged between the positioning plate (51) and the lifting plate (52), the electric screw rod (54) bottom surface is equipped with connecting block (55), connecting block (55) bottom one end is equipped with latch segment (56), connecting block (55) with be equipped with the clearance groove between latch segment (56), lifter plate (52) bottom plate is equipped with detects chamber (6), detect chamber (6) bottom and be equipped with heating seat (61), contact plate (4) bottom is equipped with cooling chamber (8).

2. The electronic component burn-in test fixture of claim 1, wherein: the box (1) is provided with a plurality of table tops, the top surface of each table top is provided with a contact plate (4) and a positioning clamp (5), a protective shell is arranged on the outer side of the box (1), mounting blocks are arranged at two ends of the protective shell, mounting grooves (11) are formed in two sides of the box (1) in a penetrating mode, and the mounting blocks are matched with the mounting grooves (11).

3. The electronic component burn-in test fixture of claim 1, wherein: the display lamp (12) is arranged on the top surface of the box body (1), and a plurality of control buttons (13) are arranged at the bottom of the display lamp (12).

4. The electronic component burn-in test fixture of claim 1, wherein: the depth of the sliding groove (2) is larger than that of the detection cavity (6), and the locking block (56) is arranged at the top of the sliding groove (2) and is clamped with the inner wall of the sliding groove (2).

5. The electronic component burn-in test fixture of claim 1, wherein: guide rods (53) are uniformly arranged at the bottom of the positioning plate (51), through holes are formed in the lifting plate (52) in a penetrating mode, the guide rods (53) penetrate through the through holes and extend to the surface of the box body (1), and positioning seats (541) are arranged at two ends of the electric screw rod (54).

6. The electronic component burn-in test fixture of claim 1, wherein: the detection device is characterized in that a heating seat (61) is arranged at the bottom of the detection cavity (6), a heating coil is filled in the heating seat (61), and a wire through groove penetrating through the detection cavity (6) is arranged on the outer side of the heating seat (61).

7. The electronic component burn-in test fixture of claim 6, wherein: the novel electric meter is characterized in that a sampling meter (7) is arranged inside the box body (1), the sampling meter (7) is arranged to be a voltmeter and an ammeter, a plurality of detection cables are arranged at the output end of the sampling meter (7), and the detection cables penetrate through the wiring grooves and extend to the outer side of the detection cavity (6).

8. The electronic component burn-in test fixture of claim 1, wherein: the cooling cavity (8) is internally filled with a refrigerating sheet (81), the top surface of the cooling cavity (8) is provided with a hollow plate (82), the inside of the refrigerating sheet (81) and the inside of the hollow plate (82) are filled with coolant, the top of the hollow plate (82) is attached with a heat conducting plate (83), and the heat conducting plate (83) is arranged at the bottom of the contact plate (4).