CN220626469U - Withstand voltage testing device of semiconductor discrete device with high safety - Google Patents
Withstand voltage testing device of semiconductor discrete device with high safety Download PDFInfo
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- CN220626469U CN220626469U CN202322275532.3U CN202322275532U CN220626469U CN 220626469 U CN220626469 U CN 220626469U CN 202322275532 U CN202322275532 U CN 202322275532U CN 220626469 U CN220626469 U CN 220626469U
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- 238000012360 testing method Methods 0.000 title claims abstract description 114
- 239000004065 semiconductor Substances 0.000 title claims abstract description 47
- 238000001816 cooling Methods 0.000 claims description 22
- 230000001502 supplementing effect Effects 0.000 claims description 5
- 230000002035 prolonged effect Effects 0.000 abstract description 4
- 208000033999 Device damage Diseases 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
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Abstract
The utility model discloses a withstand voltage testing device of a semiconductor discrete device with high safety, which comprises a test bench and an adjusting component, wherein the adjusting component is arranged on the outer wall of the test bench, and the adjusting component comprises: the test bench comprises a first motor, a ball screw, a limiting slide bar and a first sliding block, wherein the first motor is arranged on the side face of the outer wall of the test bench, a first rotating shaft is arranged on the side face of the outer wall of the first motor, the ball screw is sleeved on the outer wall of the first rotating shaft, the limiting slide bar is arranged on the side face of the inner wall of the test bench, the first sliding block is sleeved on the outer wall of the ball screw, and the first sliding block is sleeved on the outer wall of the limiting slide bar. According to the utility model, the test bench and the adjusting component are arranged, so that the function of adjusting the spacing between the positive and negative test blocks is realized, the problem that the semiconductor discrete device is damaged due to the fact that the spacing between the positive and negative test blocks cannot be adjusted and the pin of the semiconductor discrete device is manually pulled to change the spacing is solved, and the service life of the semiconductor discrete device is prolonged.
Description
Technical Field
The utility model relates to the technical field of withstand voltage testing devices, in particular to a withstand voltage testing device for a semiconductor discrete device with high safety.
Background
The dielectric withstand voltage test is in a narrow sense, is a voltage applied between a part or a certain independent part which are insulated from each other and the ground for a period of time, and aims to prove that a material can safely work under the condition of rated voltage or instant overvoltage caused by a phenomenon such as a switch, an arc and the like.
The utility model discloses a withstand voltage testing device of a semiconductor discrete device, which comprises a withstand voltage testing device main body, wherein the outer surface of the front end of the withstand voltage testing device main body is fixedly connected with a withstand voltage testing device control area, the outer surface of the front end of the withstand voltage testing device main body is fixedly connected with a withstand voltage testing device data display area, the withstand voltage testing device control area is positioned at one end of the withstand voltage testing device data display area, the outer surfaces of the two ends of the withstand voltage testing device main body are fixedly connected with a portable mechanism, and the outer surface of the lower end of a multifunctional pad is fixedly connected with a multifunctional pad. According to the pressure-resistant testing device for the semiconductor discrete device, the pressure-resistant testing device is convenient to carry and move through the portable mechanism, the insulating pad is arranged at the bottom end of the pressure-resistant testing device all the time through the multifunctional pad, the multifunctional pad has an anti-slip effect, the stability of the pressure-resistant testing device can be improved, and a better application prospect is brought.
In summary, the above-mentioned patent has realized increasing the stability of withstand voltage testing arrangement through installing portable mechanism, insulating pad and multi-functional pad, brought better application prospect, but the above-mentioned patent can not adjust positive and negative test block interval, leads to the problem that needs the manual work to pull the discrete device pin of semiconductor to change interval and leads to the discrete device of semiconductor to damage;
therefore, the voltage withstand testing device for the semiconductor discrete device is high in safety and capable of adjusting the spacing between the positive test block and the negative test block.
Disclosure of Invention
The utility model aims to provide a withstand voltage testing device for a semiconductor discrete device with high safety, which aims to solve the technical problem that the pin of the semiconductor discrete device is required to be manually pulled to change the distance to damage the semiconductor discrete device because the distance between positive and negative test blocks cannot be adjusted in the prior art.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides a withstand voltage testing arrangement of high semiconductor discrete device of security, includes testboard, adjusting part is installed to testboard outer wall, adjusting part includes: the test bench comprises a first motor, a ball screw, a limiting slide bar and a first sliding block, wherein the first motor is arranged on the side face of the outer wall of the test bench, a first rotating shaft is arranged on the side face of the outer wall of the first motor, the ball screw is sleeved on the outer wall of the first rotating shaft, the limiting slide bar is arranged on the side face of the inner wall of the test bench, the first sliding block is sleeved on the outer wall of the ball screw, and the first sliding block is sleeved on the outer wall of the limiting slide bar.
Preferably, the positive electrode test block is installed at the top of the outer wall of the first sliding block, and a positive electrode jack is formed at the top of the outer wall of the positive electrode test block.
Preferably, the ball screw outer wall cover is equipped with the second slider, and second slider suit is at spacing slide bar outer wall, and negative pole test block is installed at second slider outer wall top, and negative pole jack has been seted up at negative pole test block outer wall top.
Preferably, the cooling dryer is installed in testboard outer wall front, and the second motor is installed in testboard outer wall front, and the second pivot is installed to second motor outer wall, and cooling fan is installed to second pivot outer wall.
Preferably, the pressure-resistant test processor is arranged on the back of the inner wall of the test bench, the movable rod is arranged on the side face of the inner wall of the test bench, the display screen is sleeved on the outer wall of the movable rod, the signal wire is arranged on the top of the outer wall of the pressure-resistant test processor, and the signal wire is connected with the display screen.
Preferably, the power lines are arranged on the back surfaces of the outer walls of the positive electrode test block and the negative electrode test block, the power lines are connected with the voltage withstand test processor, and the electronic controller is arranged at the top of the outer wall of the test bench.
Preferably, supporting legs are arranged at the bottom of the outer wall of the test table, a mounting groove is formed in the side face of the inner wall of the test table, and a light supplementing lamp is arranged on the inner wall of the mounting groove.
Compared with the prior art, the utility model has the beneficial effects that:
1. according to the utility model, the test bench and the adjusting component are arranged, the adjusting component is arranged on the outer wall of the test bench, and the adjusting component comprises: the device comprises a first motor, a ball screw, a limit slide bar and a first sliding block, wherein the first motor is arranged on the side face of the outer wall of the test bench, a first rotating shaft is arranged on the side face of the outer wall of the first motor, the ball screw is sleeved on the outer wall of the first rotating shaft, the limit slide bar is arranged on the side face of the inner wall of the test bench, the first sliding block is sleeved on the outer wall of the ball screw, and the first sliding block is sleeved on the outer wall of the limit slide bar, so that the distance adjusting function of positive and negative test blocks is realized, the problem that the semiconductor discrete devices are damaged due to the fact that the distance between the positive and negative test blocks cannot be adjusted and the semiconductor discrete device pins are required to be manually pulled to change is solved, and the service life of the semiconductor discrete devices is prolonged;
2. according to the utility model, the cooling air duct, the second motor and the cooling fan are arranged, the cooling air duct is arranged on the front surface of the outer wall of the test bench, the second motor is arranged on the front surface of the outer wall of the test bench, the second rotating shaft is arranged on the outer wall of the second motor, and the cooling fan is arranged on the outer wall of the second rotating shaft, so that the cooling function of the semiconductor discrete device after the withstand voltage test is realized, the problem of scalding caused by the fact that the semiconductor discrete devices are mutually contacted at high temperature after the withstand voltage test of the semiconductor discrete device is solved, and the damage rate of the semiconductor discrete device is reduced.
Drawings
FIG. 1 is a schematic elevational view of the present utility model;
FIG. 2 is a schematic view of the front part structure of the present utility model;
FIG. 3 is a schematic view of a portion of the structure of an adjusting assembly according to the present utility model;
FIG. 4 is a schematic view of a portion of a cooling duct according to the present utility model.
In the figure: 1. a test bench; 101. support legs; 102. a mounting groove; 103. a light supplementing lamp; 2. an electronic controller; 3. a withstand voltage test processor; 301. a signal line; 302. a power line; 4. a display screen; 401. a movable rod; 5. a first motor; 501. a first rotating shaft; 502. a ball screw; 503. a limit slide bar; 504. a first slider; 505. a positive electrode test block; 506. an anode jack; 507. a second slider; 508. a negative electrode test block; 509. a negative electrode jack; 6. a second motor; 601. a second rotating shaft; 602. a cooling fan; 7. and cooling the air duct.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
In the description of the present utility model, it should be noted that the directions or positional relationships indicated by the terms "upper", "lower", "inner", "outer", "front", "rear", "both ends", "one end", "the other end", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific direction, be configured and operated in the specific direction, and thus should not be construed as limiting the present utility model. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present utility model, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "provided," "connected," and the like are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present utility model will be understood in specific cases by those of ordinary skill in the art.
Referring to fig. 1-3, an embodiment of the present utility model is provided: the utility model provides a withstand voltage testing arrangement of high semiconductor discrete device of security, includes testboard 1, adjusting part is installed to testboard 1 outer wall, adjusting part includes: the test bench comprises a first motor 5, a ball screw 502, a limit sliding rod 503 and a first sliding block 504, wherein the first motor 5 is installed on the side face of the outer wall of the test bench 1, a first rotating shaft 501 is installed on the side face of the outer wall of the first motor 5, the ball screw 502 is sleeved on the outer wall of the first rotating shaft 501, the limit sliding rod 503 is installed on the side face of the inner wall of the test bench 1, the first sliding block 504 is sleeved on the outer wall of the ball screw 502, the first sliding block 504 is sleeved on the outer wall of the limit sliding rod 503, the first motor 5 drives the first rotating shaft 501 to rotate, the ball screw 502 drives the first sliding block 504 and the second sliding block 507 to slide left and right on the limit sliding rod 503, the first sliding block 504 and the second sliding block 507 drive a positive electrode test block 505 and a negative electrode test block 508 to move, the distance between the positive electrode jack 506 and the negative electrode jack 509 is adjusted, the distance adjusting function of the positive and negative test block is achieved, and the problem that the distance between the positive and negative test blocks cannot be adjusted is manually changed to cause the discrete semiconductor device pins to be manually moved to cause discrete semiconductor device damage is solved, and the service life of the discrete semiconductor device is prolonged.
Referring to fig. 1-4, a cooling air duct 7 is installed on the front surface of the outer wall of the test stand 1, a second motor 6 is installed on the front surface of the outer wall of the test stand 1, a second rotating shaft 601 is installed on the outer wall of the second motor 6, a cooling fan 602 is installed on the outer wall of the second rotating shaft 601, the second motor 6 is started, the second motor 6 drives the second rotating shaft 601 to rotate, the second rotating shaft 601 drives the cooling fan 602 to rotate, the cooling fan 602 blows air to positive and negative pins of the semiconductor discrete device through the cooling air duct 7, the cooling function after the withstand voltage test of the semiconductor discrete device is achieved, the problem that the pins are mutually touched to cause scalding after the withstand voltage test of the semiconductor discrete device is solved, and the damage rate of the semiconductor discrete device is reduced.
The working principle is that the supporting legs 101 play a role in supporting the left and right sides of the test bench 1, the electronic controller 2 plays a role in controlling the starting of electronic components, the light supplementing lamp 103 in the mounting groove 102 plays a role in supplementing light, and the power line 302 plays a role in connecting a power supply to form a loop; the first motor 5 is started, the first motor 5 drives the first rotating shaft 501 to rotate, the first rotating shaft 501 drives the ball screw 502 to rotate, the ball screw 502 drives the first sliding block 504 and the second sliding block 507 to slide left and right on the limit sliding rod 503, the first sliding block 504 and the second sliding block 507 drive the positive electrode test block 505 and the negative electrode test block 508 to move, the spacing adjustment between the positive electrode jack 506 and the negative electrode jack 509 is completed, the pins of the semiconductor discrete device are inserted into the positive electrode jack 506 and the negative electrode jack 509 for testing, the spacing adjustment function of the positive and negative test blocks is realized, the problem that the semiconductor discrete device is damaged due to the fact that the spacing of the positive and negative test blocks cannot be adjusted and the pins of the semiconductor discrete device are required to be manually pulled to change the spacing is solved, and the service life of the semiconductor discrete device is prolonged; the test data is transmitted and displayed on the display screen 4 through the signal wire 301 by the withstand voltage test processor 3, after the test is finished, the second motor 6 is started, the second motor 6 drives the second rotating shaft 601 to rotate, the second rotating shaft 601 drives the cooling fan 602 to rotate, the cooling fan 602 blows air to the anode pin and the cathode pin of the semiconductor discrete device through the cooling air duct 7, the cooling function of the semiconductor discrete device after the withstand voltage test is realized, the problem that the pins are not retracted at high temperature after the withstand voltage test of the semiconductor discrete device and the semiconductor discrete device touch each other to cause scalding damage is solved, the damage rate of the semiconductor discrete device is reduced, the display screen 4 is pulled, the display screen 4 rotates around the movable rod 401, the display screen 4 is folded, and the display screen 4 is prevented from being collided and damaged.
It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, and that the present utility model may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (7)
1. The utility model provides a withstand voltage testing arrangement of high semiconductor discrete device of security, includes testboard (1), adjusting part, its characterized in that: an adjusting component is installed on the outer wall of the test bench (1), and the adjusting component comprises: first motor (5), ball screw (502), spacing slide bar (503) and first slider (504), first motor (5) are installed to testboard (1) outer wall side-mounting, first pivot (501) are installed to first motor (5) outer wall side-mounting, first pivot (501) outer wall cover is equipped with ball screw (502), spacing slide bar (503) are installed to testboard (1) inner wall side-mounting, first slider (504) are equipped with to ball screw (502) outer wall cover, and first slider (504) suit is at spacing slide bar (503) outer wall.
2. The high-safety voltage withstand test device for a discrete semiconductor device according to claim 1, wherein: the positive electrode testing block (505) is installed at the top of the outer wall of the first sliding block (504), and a positive electrode jack (506) is formed in the top of the outer wall of the positive electrode testing block (505).
3. The high-safety voltage withstand test device for a discrete semiconductor device according to claim 1, wherein: the ball screw (502) outer wall cover is equipped with second slider (507), and second slider (507) suit is at spacing slide bar (503) outer wall, and negative pole test block (508) are installed at second slider (507) outer wall top, and negative pole jack (509) has been seted up at negative pole test block (508) outer wall top.
4. The high-safety voltage withstand test device for a discrete semiconductor device according to claim 1, wherein: the cooling air duct (7) is arranged on the front side of the outer wall of the test bench (1), the second motor (6) is arranged on the front side of the outer wall of the test bench (1), the second rotating shaft (601) is arranged on the outer wall of the second motor (6), and the cooling fan (602) is arranged on the outer wall of the second rotating shaft (601).
5. The high-safety voltage withstand test device for a discrete semiconductor device according to claim 4, wherein: the pressure-resistant test bench is characterized in that the pressure-resistant test processor (3) is mounted on the back of the inner wall of the test bench (1), the movable rod (401) is mounted on the side face of the inner wall of the test bench (1), the display screen (4) is sleeved on the outer wall of the movable rod (401), the signal wire (301) is mounted on the top of the outer wall of the pressure-resistant test processor (3), and the signal wire (301) is connected with the display screen (4).
6. The high-safety voltage withstand test device for a discrete semiconductor device according to claim 2, wherein: the power line (302) is installed on the back of the outer wall of the positive electrode test block (505) and the back of the outer wall of the negative electrode test block (508), the power line (302) is connected with the pressure-resistant test processor (3), and the electronic controller (2) is installed on the top of the outer wall of the test bench (1).
7. The high-safety voltage withstand test device for a discrete semiconductor device according to claim 5, wherein: supporting legs (101) are arranged at the bottom of the outer wall of the test bench (1), mounting grooves (102) are formed in the side faces of the inner wall of the test bench (1), and light supplementing lamps (103) are arranged on the inner wall of the mounting grooves (102).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322275532.3U CN220626469U (en) | 2023-08-23 | 2023-08-23 | Withstand voltage testing device of semiconductor discrete device with high safety |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322275532.3U CN220626469U (en) | 2023-08-23 | 2023-08-23 | Withstand voltage testing device of semiconductor discrete device with high safety |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220626469U true CN220626469U (en) | 2024-03-19 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322275532.3U Active CN220626469U (en) | 2023-08-23 | 2023-08-23 | Withstand voltage testing device of semiconductor discrete device with high safety |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220626469U (en) |
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2023
- 2023-08-23 CN CN202322275532.3U patent/CN220626469U/en active Active
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