CN220603371U - Annular probe for magnetic particle inspection machine - Google Patents

Annular probe for magnetic particle inspection machine Download PDF

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Publication number
CN220603371U
CN220603371U CN202322155828.1U CN202322155828U CN220603371U CN 220603371 U CN220603371 U CN 220603371U CN 202322155828 U CN202322155828 U CN 202322155828U CN 220603371 U CN220603371 U CN 220603371U
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CN
China
Prior art keywords
sliding
groove
annular probe
magnetic particle
inspection machine
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CN202322155828.1U
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Chinese (zh)
Inventor
程大超
冯建云
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Shandong Jujiao Cloud Detection Co ltd
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Shandong Jujiao Cloud Detection Co ltd
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Abstract

The utility model discloses an annular probe for a magnetic particle inspection machine, which relates to the technical field of magnetic particle inspection machine probes and comprises a base, wherein a groove is formed in the upper end of the base, a first sliding groove is formed in each of two side walls of the groove, a second sliding groove is formed in the inner wall of one end of the groove, a sliding rod is connected inside the first sliding groove in a sliding manner, a first limiting block is connected inside the second sliding groove in a sliding manner, a third sliding groove is formed in one end of the base, a second limiting block is connected inside the third sliding groove in a sliding manner, racks are fixedly arranged at two ends of the second limiting block, a square hole is formed in one side of the sliding rod in a penetrating manner, racks I are fixedly arranged inside the square hole, and gears are meshed with the upper ends of the racks I. According to the utility model, through the arrangement of the first chute and the second chute, the annular probe main body can be replaced by pushing and pulling one handle, so that the operation steps are reduced, and the efficiency of replacing the annular probe main body is improved.

Description

Annular probe for magnetic particle inspection machine
Technical Field
The utility model relates to the technical field of probes of magnetic particle detectors, in particular to an annular probe for a magnetic particle detector.
Background
The magnetic powder inspection is to utilize ferromagnetic material to magnetize, and because of the discontinuous existence, the magnetic lines of force on the surface and near surface of the workpiece are locally distorted to generate a leakage magnetic field (namely, a magnetic field formed when the magnetic lines of force leave and enter the surface) to absorb the magnetic powder applied on the surface of the workpiece, so as to form a magnetic mark visible visually under proper illumination, thereby displaying the position, shape and size of the discontinuity.
In the prior art, as disclosed in Chinese patent CN216771594U, the annular probe for the magnetic particle inspection machine comprises a detection ring, wherein an extension plate is arranged on the lower side of the detection ring, and a connecting mechanism is arranged on the extension plate; the connecting mechanism comprises an embedding plate and two locking components, the embedding plate is connected with the extension plate, the two locking components are symmetrically arranged on two sides of the embedding plate, and the locking components consist of two lockpin devices and a pull ring; the two lockpin devices are symmetrically arranged on the embedded plate, the lockpin devices comprise pins, a inhaul cable and a reset elastic piece, the embedded plate is provided with a step cavity matched with the lockpin devices, the opening of the step cavity faces to the parallel ground, the pins are slidably arranged in the step cavity, the inhaul cable is slidably arranged on the embedded plate, two ends of the inhaul cable are respectively connected with the pins and the pull ring, and the reset elastic piece is arranged in the step cavity and matched with the pins.
However, in the prior art, as in the above patent, when the device is used for replacing the annular probe, the pull rings at two ends of the annular probe are required to be pulled simultaneously, so that the pull rings drive the guy cable to move, and then drive the lock tongue to move, and then the annular probe is replaced, so that the operation is complicated, and the replacement of the annular probe is not rapid.
Disclosure of Invention
The utility model aims to solve the problems that when an annular probe is replaced by a device in the prior art, pull rings at two ends of the annular probe are required to be pulled simultaneously, so that the pull rings drive a guy rope to move and further drive a lock tongue to move, and then the annular probe is replaced, the operation is complicated, and the annular probe is not replaced quickly.
In order to achieve the above purpose, the present utility model adopts the following technical scheme: the utility model provides an annular probe for magnetic particle inspection machine, includes the base, the upper end of base is seted up flutedly, spout one has all been seted up to the both sides wall of recess, spout two has been seted up to the one end inner wall of recess, the inside sliding connection of spout one has the slide bar, the inside sliding connection of spout two has stopper one, spout three has been seted up to the one end of base, the inside sliding connection of spout three has stopper two, the equal fixed mounting in both ends of stopper two has rack two, square hole has been seted up in running through of one side of slide bar, the inside fixed mounting in square hole has rack one, the upper end meshing of rack one has the gear.
Preferably, one end of the base is welded with a second fixing rod, and the outer side of the second fixing rod is rotationally connected with a limiting rod.
Preferably, the annular probe body is clamped in the groove, and clamping grooves are formed in the two ends of the annular probe body and close to the lower end of the annular probe body.
Preferably, the outer side of the second chute is matched with the inner part of the clamping groove, and the outer side of the second limiting block is matched with the inner part of the second chute.
Preferably, two ends of the first limiting block are respectively fixed with one side of the two sliding rods, and the inner parts of the first sliding grooves are communicated with the inner parts of the third sliding grooves.
Preferably, the gear is rotatably connected with a first fixing rod, and one ends of the first fixing rods are respectively fixed with one side wall of the first sliding groove.
Preferably, the upper end of the gear is meshed with the lower end of the second rack, and one ends of the two sliding rods are welded with handles.
Compared with the prior art, the utility model has the advantages and positive effects that:
1. according to the utility model, through the arrangement of the first chute and the second chute, the annular probe main body can be replaced by pushing and pulling one handle, so that the operation steps are reduced, and the efficiency of replacing the annular probe main body is improved.
2. According to the utility model, through the arrangement of the limiting rod, after the first limiting block and the second limiting block are respectively clamped in the two clamping grooves, the limiting rod can be rotated clockwise, so that the limiting rod rotates around the second fixing rod until the limiting rod rotates to the vertical direction, at the moment, one end of the limiting rod is contacted with one side of the middle position of the handle, thereby improving the stability of the device and preventing the handle from returning to the initial position under the action of external force.
Drawings
Fig. 1 is a schematic perspective view of an annular probe for a magnetic particle inspection machine according to the present utility model;
fig. 2 is a schematic cross-sectional view of an annular probe for a magnetic particle inspection machine according to the present utility model;
fig. 3 is a schematic view of a part of the structure of an annular probe for a magnetic particle inspection machine according to the present utility model;
fig. 4 is a schematic diagram showing the internal structure of an annular probe for a magnetic particle inspection machine according to the present utility model;
fig. 5 is a schematic diagram of the main structure of an annular probe for a magnetic particle inspection machine according to the present utility model.
Legend description: 1. a base; 2. a groove; 3. a first chute; 4. a second chute; 5. a slide bar; 6. a first limiting block; 7. a chute III; 8. a second limiting block; 9. square holes; 10. a first rack; 11. a second rack; 12. a gear; 13. a first fixed rod; 14. a handle; 15. a second fixing rod; 16. a limit rod; 17. an annular probe body; 18. a clamping groove.
Description of the embodiments
In order that the above objects, features and advantages of the utility model will be more clearly understood, a further description of the utility model will be rendered by reference to the appended drawings and examples. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments may be combined with each other.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present utility model, however, the present utility model may be practiced otherwise than as described herein, and therefore the present utility model is not limited to the specific embodiments of the disclosure that follow.
Examples
As shown in fig. 1-5, the utility model provides an annular probe for a magnetic particle inspection machine, which comprises a base 1, the upper end of the base 1 is provided with a groove 2, two side walls of the groove 2 are respectively provided with a first chute 3, one end inner wall of the groove 2 is provided with a second chute 4, the inner side of the first chute 3 is in sliding connection with a slide bar 5, the inner side of the second chute 4 is in sliding connection with a first limiting block 6, one end of the base 1 is provided with a third chute 7, the inner side of the third chute 7 is in sliding connection with a second limiting block 8, two ends of the second limiting block 8 are respectively and fixedly provided with a second rack 11, one side of the slide bar 5 is penetrated and provided with a square hole 9, the inner side of the square hole 9 is fixedly provided with a first rack 10, the upper end of the first rack 10 is meshed with a gear 12, the inner side wall of the groove 2 is clamped with an annular probe body 17, two ends of the annular probe body 17 are respectively and are respectively provided with a clamping groove 18 near the lower end, the outer side of the second chute 4 is matched with the inner side of the second chute 4, two ends of the limiting block 8 are respectively fixed with one side of the slide bar 5, one end of the first rack 13 is fixedly connected with the inner side walls of the first rack 13, and one end of the two side walls of the first rack 13 is fixedly connected with the two handles 13 respectively, and one end of the two ends of the first rack 13 is fixedly connected with one end of the handle 13 is fixedly connected.
In detail, the lower end of the annular probe body 17 is aligned to the groove 2 and moves downwards when the annular probe body 17 is installed, the lower end of the annular probe body 17 is clamped in the groove 2, the handle 14 is pulled, the handle 14 drives the two slide bars 5 to slide outwards in the first two slide grooves 3 respectively, the first limit block 6 is further driven to slide outwards in the second slide groove 4, the first limit block 6 is clamped in one of the clamping grooves 18, the first slide bars 5 also drive the racks 10 in the first limit block to move outwards, so that the two gears 12 are driven to rotate, the second racks 11 are driven to move inwards, the second racks 11 drive the second limit block 8 to move inwards, the second limit block 8 is clamped in the other clamping groove 18, the annular probe body 17 is fixed in the groove 2, and the annular probe body 17 can be replaced only by pushing and pulling the first handle 14, so that the operation steps are reduced, and the efficiency of replacing the annular probe body 17 is improved.
Examples
As shown in fig. 1 and 2, a second fixing rod 15 is welded at one end of the base 1, and a limiting rod 16 is rotatably connected to the outer side of the second fixing rod 15.
The effect that its whole embodiment reaches is, after stopper one 6 and stopper two 8 joint respectively in the inside of two draw-in grooves 18, can rotate gag lever post 16 clockwise, makes gag lever post 16 rotatory round dead lever two 15, and until gag lever post 16 rotates to vertical direction, and the one end of gag lever post 16 contacts with one side of the middle part position of handle 14 this moment to improved the stability of device, prevented that handle 14 from getting back to the initial position under the effect of external force.
The application method and the working principle of the device are as follows: when the annular probe main body 17 on the base 1 needs to be replaced, the limiting rod 16 is firstly rotated to the horizontal direction, the handle 14 is pushed, the handle 14 drives the two sliding rods 5 to slide inwards in the first 3 sliding grooves respectively, the first 6 sliding rods are further driven to slide inwards in the second 4 sliding grooves, the first 6 sliding rods are separated from one clamping groove 18, the first 10 sliding rods 5 can drive the racks in the first sliding grooves to move inwards, the two gears 12 are driven to rotate, the second 11 sliding rods are further driven to move outwards, the second 11 sliding rods can drive the second 8 sliding rods to move outwards, the second 8 sliding rods are separated from the other clamping groove 18, the annular probe main body 17 can be easily taken down at the moment, the new annular probe main body 17 is replaced, the handle 14 is pulled, the handle 14 drives the two sliding rods 5 to slide outwards in the first 3 sliding grooves respectively, the first 6 sliding grooves are further driven to slide outwards in the second 4, the first 6 sliding grooves are clamped in the first 18, the first 10 sliding rods can be driven to move outwards, the second 11 sliding rods are further, the second 11 are driven to move inwards, the second 16 is further, the two sliding rods are further driven to move inwards, and the second 16 are driven to rotate, and the other 16 is fixed to move inwards, and the limiting rod is further rotated, the limiting rod 16 is connected to move inwards, and the second 11 is fixed to move inwards, and is in the annular probe main body 16, and is fixed to move outwards, and opposite to the other 18.
The present utility model is not limited to the above-mentioned embodiments, and any equivalent embodiments which can be changed or modified by the technical content disclosed above can be applied to other fields, but any simple modification, equivalent changes and modification made to the above-mentioned embodiments according to the technical substance of the present utility model without departing from the technical content of the present utility model still belong to the protection scope of the technical solution of the present utility model.

Claims (7)

1. The utility model provides a ring probe for magnetic particle inspection machine, includes base (1), its characterized in that: the novel sliding type sliding seat is characterized in that a groove (2) is formed in the upper end of the base (1), a first sliding groove (3) is formed in each side wall of the groove (2), a second sliding groove (4) is formed in the inner wall of one end of the groove (2), a sliding rod (5) is connected to the first sliding groove (3) in a sliding mode, a first limiting block (6) is connected to the second sliding groove (4) in a sliding mode, a third sliding groove (7) is formed in one end of the base (1), a second limiting block (8) is connected to the third sliding groove (7) in a sliding mode, a second rack (11) is fixedly installed at two ends of the second limiting block (8), a square hole (9) is formed in one side of the sliding rod (5) in a penetrating mode, a first rack (10) is fixedly installed in one side of the square hole, and a gear (12) is meshed at the upper end of the first rack (10).
2. An annular probe for a magnetic particle inspection machine according to claim 1, wherein: one end of the base (1) is welded with a second fixing rod (15), and the outer side of the second fixing rod (15) is rotatably connected with a limiting rod (16).
3. An annular probe for a magnetic particle inspection machine according to claim 1, wherein: the inside joint of recess (2) has annular probe main part (17), draw-in groove (18) have all been seted up at the both ends of annular probe main part (17) and are close to lower extreme position department.
4. A ring probe for a magnetic particle inspection machine according to claim 3, wherein: the outer side of the second sliding groove (4) is matched with the inner portion of the clamping groove (18), and the outer side of the second limiting block (8) is matched with the inner portion of the second sliding groove (4).
5. An annular probe for a magnetic particle inspection machine according to claim 1, wherein: two ends of the first limiting block (6) are respectively fixed with one sides of the two sliding rods (5), and the interiors of the two first sliding grooves (3) are communicated with the interiors of the third sliding grooves (7).
6. An annular probe for a magnetic particle inspection machine according to claim 1, wherein: the inside rotation of gear (12) is connected with dead lever one (13), and two one end of dead lever one (13) respectively with one lateral wall of two spout one (3) is fixed mutually.
7. An annular probe for a magnetic particle inspection machine according to claim 1, wherein: the upper ends of the gears (12) are meshed with the lower ends of the racks II (11), and handles (14) are welded at one ends of the two sliding rods (5).
CN202322155828.1U 2023-08-11 2023-08-11 Annular probe for magnetic particle inspection machine Active CN220603371U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202322155828.1U CN220603371U (en) 2023-08-11 2023-08-11 Annular probe for magnetic particle inspection machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202322155828.1U CN220603371U (en) 2023-08-11 2023-08-11 Annular probe for magnetic particle inspection machine

Publications (1)

Publication Number Publication Date
CN220603371U true CN220603371U (en) 2024-03-15

Family

ID=90170038

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202322155828.1U Active CN220603371U (en) 2023-08-11 2023-08-11 Annular probe for magnetic particle inspection machine

Country Status (1)

Country Link
CN (1) CN220603371U (en)

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