CN220568289U - Test circuit of module collection pencil - Google Patents
Test circuit of module collection pencil Download PDFInfo
- Publication number
- CN220568289U CN220568289U CN202321744025.3U CN202321744025U CN220568289U CN 220568289 U CN220568289 U CN 220568289U CN 202321744025 U CN202321744025 U CN 202321744025U CN 220568289 U CN220568289 U CN 220568289U
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- resistor
- photoelectric coupler
- ntc
- singlechip
- capacitor
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- 238000012360 testing method Methods 0.000 title claims abstract description 18
- 239000003990 capacitor Substances 0.000 claims abstract description 19
- 238000006243 chemical reaction Methods 0.000 claims abstract description 17
- 238000001514 detection method Methods 0.000 abstract description 6
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 3
- 229910052744 lithium Inorganic materials 0.000 description 3
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The utility model discloses a testing circuit for a module collection wiring harness, which comprises a photoelectric coupler, wherein an A pole of the photoelectric coupler is connected with one end of a resistor R3, a C pole of the photoelectric coupler is connected with a resistor R1 and a resistor R2, an E pole of the photoelectric coupler is connected with the connected end of the resistor R1 and the connected end of the resistor R2, and the other end of the resistor R3 is connected with a Vctl interface for software control; the other end of the resistor R2 is connected with an NTC to be detected and a capacitor C2 and is connected with a singlechip with ADC conversion for converting digital signals; the circuit uses a singlechip with ADC conversion to carry out NTC detection, NTC resistance values are different, partial voltage Vout of the resistor is different, vout is converted into a digital signal through the ADC, the digital signal is processed through the singlechip, a three-bit nixie tube is used for displaying corresponding temperature, and meanwhile, the Vctl is controlled to output high and low levels, and the photoelectric coupler is used for controlling the connection of the resistor R1 and the resistor R2, so that the regulation can be carried out according to parameters of the NTC to be detected.
Description
Technical Field
The utility model relates to the technical field of wire harness detection, in particular to a testing circuit for a module collection wire harness.
Background
A lithium battery module collection wire harness is shown in fig. 1, and comprises 14 voltage collection points (B1-, B1+, B2+, B3+, B4+, B5+, B6+, B7+, B8+, B9+, B10+, B11+, B12+, B13+) and 8 NTC temperature collection points (T1, T2, T3, T4, T5, T6, T7 and T8).
J1 is a connector, as shown in fig. 2, connected to a BMS (battery management system) which reads and monitors voltage and temperature information of the lithium battery module in real time through voltage acquisition points and temperature acquisition.
When the wire harness is produced in batches, the collection performance of the wire harness is required to be tested, so that the quality of the wire harness is ensured, 14 voltage collection points are generally tested by using a common wire harness conduction tester with learning, but the traditional NTC temperature collection and detection cannot generally detect NTCs with different parameters, so that a testing circuit for collecting the wire harness by a module is designed, and the NTC temperature collection is conveniently tested and detected.
Disclosure of Invention
The utility model aims to provide a testing circuit for a module collection wiring harness, which aims to solve the problems in the background technology.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the testing circuit for the module collection wiring harness comprises a photoelectric coupler, wherein an A pole of the photoelectric coupler is connected with one end of a resistor R3, a C pole of the photoelectric coupler is connected with a resistor R1 and a resistor R2, an E pole of the photoelectric coupler is connected with the connected end of the resistor R1 and the connected end of the resistor R2, and the other end of the resistor R3 is connected with a Vctl interface for software control;
the other end of the resistor R2 is connected with NTC and a capacitor C2 to be detected and is connected with a singlechip with ADC conversion for converting digital signals.
Preferably: and a resistor R4 is also connected between the resistor R2 and the singlechip with ADC conversion.
Preferably: one end of a capacitor C3 and one end of a diode D1 are also connected between the resistor R4 and the singlechip with ADC conversion.
Preferably: one end of a capacitor C1 is further connected between the resistor R3 and the Vctl interface, and the other end of the capacitor C1 is grounded.
Preferably: and the resistor R1 and the C electrode of the photoelectric coupler are also connected with a reference voltage input end Vref.
Preferably: the other ends of the NTC to be tested, the capacitor C2, the capacitor C3 and the diode D1 are grounded.
Preferably: the singlechip with ADC conversion is also connected with a nixie tube for displaying temperature.
Compared with the prior art, the utility model has the beneficial effects that: the circuit uses a singlechip with ADC conversion to carry out NTC detection, NTC resistance values are different, partial voltages Vout of resistors are different, vout is converted into digital signals through the ADC, and the digital signals are processed through the singlechip, and a three-bit nixie tube is used for displaying corresponding temperatures.
Meanwhile, the Vctl is controlled to output high and low levels, and the connection of the resistor R1 and the resistor R2 is controlled through the photoelectric coupler, so that the adjustment can be carried out according to parameters of the NTC to be measured.
Drawings
FIG. 1 is a circuit diagram of the present utility model;
FIG. 2 is a schematic view of a nixie tube panel according to the present utility model;
fig. 3 is a schematic structural view of a wire harness;
fig. 4 is a schematic structural view of the plug connector.
Detailed Description
The technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model.
Examples
Referring to fig. 1-2, the present utility model provides a technical solution: the testing circuit for the module collection wiring harness comprises a photoelectric coupler, wherein an A pole of the photoelectric coupler is connected with one end of a resistor R3, a C pole of the photoelectric coupler is connected with a resistor R1 and a resistor R2, an E pole of the photoelectric coupler is connected with the connecting end of the resistor R1 and the resistor R2, and the other end of the resistor R3 is connected with a Vctl interface for software control; with the above arrangement, the resistor R2 is 10K resistor, and the resistor R1 is 90K resistor
The other end of the resistor R2 is connected with an NTC to be detected and a capacitor C2, and is connected with a singlechip with ADC conversion for converting digital signals, and the singlechip is also connected with a nixie tube for displaying temperature; through the arrangement, NTC resistance values to be measured are different, partial voltages Vout of the resistors are different, vout is converted into digital signals through an ADC, and the digital signals are processed through a singlechip, and corresponding temperatures are displayed by using a three-bit nixie tube.
As shown in fig. 1: a resistor R4 is further connected between the resistor R2 and the singlechip with ADC conversion, and one end of a capacitor C3 and one end of a diode D1 are further connected between the resistor R4 and the singlechip with ADC conversion.
As shown in fig. 1: one end of a capacitor C1 is further connected between the resistor R3 and the Vctl interface, and the other end of the capacitor C1 is grounded.
As shown in fig. 1: the resistor R1 and the C electrode of the photoelectric coupler are also connected with a reference voltage input end Vref, and the other ends of the NTC to be tested, the capacitor C2, the capacitor C3 and the diode D1 are grounded; through the arrangement, vref and GND are used as power supply input ends, and the power supply is DC 5-12V.
Working principle: the power supply input end, the power supply is DC 5-12V, the circuit uses the single chip microcomputer with ADC conversion to carry out NTC detection, the NTC detection circuit is shown in figure 1, NTC resistance values are different, voltage division Vout of the resistor is different, vout is converted into a digital signal through the ADC, and the digital signal is processed through the single chip microcomputer, and the corresponding temperature is displayed by using the three-bit nixie tube; when the NTC is not accessed, the nixie tube displays the LLL; when the resistance of the accessed NTC is too low, the nixie tube displays HHH;
meanwhile, NTCs of 10K3435 and 100K3950 (NTCs of different B values may be added in software) may be tested, and NTC parameters may be selected using "SET" and "+", "-" keys as in fig. 2.
NTC selection modes of 10K and 100K:
1. when 10K NTC test is selected, software controls Vctl to output high level, at the moment, the diode of the photoelectric coupler emits light, after the photoelectric triode receives a light source, the C, E pole is conducted, NTC is only connected with R2 (10K) in series to divide voltage, and the divided voltage value Vout is sent into an ADC for conversion treatment;
2. when the NTC test of 100K is selected, the software controls Vctl to output a low level, at this time, the diode of the photocoupler does not emit light, the phototransistor C, E is not turned on, the NTC and R1, R2 (r1+r2=100deg.k) are serially connected to divide the voltage, and the divided voltage Vout is sent to the ADC for conversion.
Meanwhile, the circuit can be provided with a plurality of groups according to the specific situation of the wire harness, for example, the lithium battery module mentioned in the background art can be used for collecting the wire harness, 8 paths can be arranged when the circuit is used for detecting the wire harness, and after the plurality of groups are arranged, the buttons of SET and "+", "-", and 1-8 paths can be selected for measurement;
also, using the "SET" and "+", "-" keys, temperature differences (the difference between the maximum and minimum values of several SETs of measured temperatures) can be SET;
and measuring and judging the maximum and minimum temperature differences of N paths (N=1-8), namely pressing a 'TEST' key according to the selected number of measuring paths (e.g. 4 paths are selected), starting to judge the 4 paths of temperature difference values, if the temperature difference value is within a set value, flashing a pass indicator lamp on an instrument, if the temperature difference value exceeds the set value, flashing a fail indicator lamp, simultaneously giving an alarm by a 'drop' buzzer, pressing a 'stop' key, and exiting.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. The utility model provides a test circuit of pencil is gathered to module, includes photoelectric coupler, its characterized in that: the A pole of the photoelectric coupler is connected with one end of a resistor R3, the C pole of the photoelectric coupler is connected with a resistor R1 and a resistor R2, the E pole of the photoelectric coupler is connected with the connected end of the resistor R1 and the connected end of the resistor R2, and the other end of the resistor R3 is connected with a Vctl interface for software control;
the other end of the resistor R2 is connected with NTC and a capacitor C2 to be detected and is connected with a singlechip with ADC conversion for converting digital signals.
2. The module collection harness test circuit of claim 1, wherein: and a resistor R4 is also connected between the resistor R2 and the singlechip with ADC conversion.
3. The module collection harness test circuit of claim 2, wherein: one end of a capacitor C3 and one end of a diode D1 are also connected between the resistor R4 and the singlechip with ADC conversion.
4. The module collection harness test circuit of claim 1, wherein: one end of a capacitor C1 is further connected between the resistor R3 and the Vctl interface, and the other end of the capacitor C1 is grounded.
5. The module collection harness test circuit of claim 1, wherein: and the resistor R1 and the C electrode of the photoelectric coupler are also connected with a reference voltage input end Vref.
6. The module collection harness test circuit of claim 1, wherein: the other ends of the NTC to be tested, the capacitor C2, the capacitor C3 and the diode D1 are grounded.
7. The module collection harness test circuit of claim 1, wherein: the singlechip with ADC conversion is also connected with a nixie tube for displaying temperature.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321744025.3U CN220568289U (en) | 2023-07-05 | 2023-07-05 | Test circuit of module collection pencil |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321744025.3U CN220568289U (en) | 2023-07-05 | 2023-07-05 | Test circuit of module collection pencil |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220568289U true CN220568289U (en) | 2024-03-08 |
Family
ID=90092689
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321744025.3U Active CN220568289U (en) | 2023-07-05 | 2023-07-05 | Test circuit of module collection pencil |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220568289U (en) |
-
2023
- 2023-07-05 CN CN202321744025.3U patent/CN220568289U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20240506 Address after: No. 10, Phase II, Shanhe Avenue Innovation Industrial Park, Duji Economic Development Zone, Gaoyue Street, Duji District, Huaibei City, Anhui Province, 235000 Patentee after: Anhui Jinming Electrical Technology Co.,Ltd. Country or region after: China Address before: No. 10, Phase II, Shanhe Avenue Innovation Industrial Park, Duji Economic Development Zone, Duji District, Huaibei City, Anhui Province, 235000 Patentee before: Jinpaike New Energy Technology (Huaibei) Co.,Ltd. Country or region before: China |