CN220510401U

CN220510401U - Test connector

Info

Publication number: CN220510401U
Application number: CN202321761466.4U
Authority: CN
Inventors: 胡宁伟; 吕银涛; 黄颗; 尹绪引; 邓忠诚; 胡卫杰
Original assignee: Shenzhen Electric Connector Technology Co Ltd
Current assignee: Shenzhen Electric Connector Technology Co Ltd
Priority date: 2023-07-06
Filing date: 2023-07-06
Publication date: 2024-02-20
Anticipated expiration: 2033-07-06

Abstract

The utility model discloses a test connector, which comprises a main body, an outer conductor, a first insulator, a second insulator, a center pin, a spring and conductive silica gel, wherein the outer conductor is sleeved on the lower side of the main body, a boss structure is arranged on the upper side of the outer conductor, the spring is sleeved on the outer side of the main body, and the lower end of the spring is abutted to the boss structure; the central needle penetrates through the main body and the inner part of the outer conductor, is in insulating connection with the main body through the first insulator, and is in insulating connection with the outer conductor through the second insulator; the inner surface of the lower side of the outer conductor is provided with a groove, and conductive silica gel is embedded in the groove. By additionally arranging flexible ring conductive silica gel on the lower side of the outer conductor, the ground shell of the radio frequency seat can be contacted in whole circle due to the scalability of the conductive silica gel when the test probe is pressed down to deflect, the performance is not affected, more reliable grounding can be achieved, and the false detection rate is reduced.

Description

Test connector

Technical Field

The present utility model relates to the field of electrical connectors, and in particular, to a test connector.

Background

With the rapid development of communication information technology, mobile phones have become an integral part of people's daily lives. The RF switch test connector is increasingly applied to a mobile phone motherboard, and the grounding of a probe for testing RF is metal hard contact, and because the RF seat is eccentric when being installed on a PCB patch and a RF probe on a test fixture, the conductor inclined plane and the RF seat are in inclined contact in the process of pressing the RF probe, and the contact resistance is easily increased due to long-term inclined single-point contact and scratch plating, so that poor contact is caused in the test process. Therefore, the false detection rate of the radio frequency seat is also higher and higher, and the efficiency is low and the cost is high.

Therefore, there is a need for a RF switch test connector that is reliable in performance, reduces false detection, and improves efficiency.

Disclosure of Invention

The application provides a test connector, has excellent flexible performance and conductive performance, can avoid the probe to contact poorly, reduces the false detection rate.

In order to achieve the above purpose, the technical scheme adopted by the utility model is as follows: a test connector comprises a main body, an outer conductor, a first insulator, a second insulator, a center pin, a spring and conductive silica gel,

the outer conductor is sleeved on the lower side of the main body, a boss structure is arranged on the upper side of the outer conductor, the spring is sleeved on the outer side of the main body, and the lower end of the spring is abutted with the boss structure; the center needle runs through and is arranged in the main body and the inner part of the outer conductor, the center needle is in insulation connection with the main body through the first insulator, the center needle is in insulation connection with the outer conductor through the second insulator, a groove is formed in the inner surface of the lower side of the outer conductor, and conductive silica gel is embedded in the groove.

Preferably, the conductive silicone is a loop structure, and the outer diameter of the loop structure is the same as the maximum diameter of the groove.

Preferably, the novel plastic packaging machine further comprises a metal shell, wherein a first thread structure is arranged on the inner wall of the metal shell, a second thread structure is arranged on the outer wall of the main body, and the first thread structure and the second thread structure are in matched spiral connection.

Preferably, the outer surface of the metal shell is further provided with an anti-slip structure and a step structure, the anti-slip structure is used for rotating the metal shell, and the step structure is arranged on the lower side of the anti-slip structure.

Preferably, the outer conductor is further provided with a claw-shaped structure, the claw-shaped structure is arranged on the upper side of the boss structure, and the claw-shaped structure is sleeved between the main body and the spring.

Preferably, the fixing flange further comprises a cross-shaped structure, and the main body is sleeved on the lower side of the fixing flange.

Preferably, the central needle further comprises a third insulator arranged inside the fixed flange, and the central needle is in insulating connection with the fixed flange through the third insulator.

Preferably, the center needle comprises a fixed probe, an internal spring and a movable probe, wherein the upper side of the fixed probe is fixed in the fixed flange through the third insulator, the lower side of the fixed probe is provided with a concave structure, the internal spring is positioned in the concave structure, and the lower end of the internal spring is connected with the movable probe.

The utility model has the beneficial effects that: by additionally arranging flexible ring conductive silica gel on the lower side of the outer conductor, the ground shell of the radio frequency seat can be contacted in whole circle due to the scalability of the conductive silica gel when the test probe is pressed down to deflect, the performance is not affected, more reliable grounding can be achieved, and the false detection rate is reduced.

Drawings

FIG. 1 is a schematic diagram of the overall structure of a test connector according to an embodiment of the present utility model;

FIG. 2 is a longitudinal structural cross-sectional view of a test connector according to an embodiment of the present utility model;

FIG. 3 is an exploded view of the test connector of FIGS. 1 and 2 according to the present utility model;

FIG. 4 is a schematic view of the internal assembly of a test connector with the metal shell removed in accordance with an embodiment of the present utility model;

FIG. 5 is a schematic diagram of a jig mounted conductive silica gel in an embodiment of the utility model;

FIG. 6 is a schematic cross-sectional view of a jig-mounted conductive silicone according to an embodiment of the utility model;

FIG. 7 is a cross-sectional view of a test connector in contact with a RF socket in an embodiment of the utility model;

reference numerals: 10. the main body, 11, a second thread structure, 20, an outer conductor, 21, a boss structure, 22, a claw structure, 23, a groove, 30, a spring, 40, conductive silica gel, 50, a center pin, 60, a fixing flange, 70, a metal shell, 71, a first thread structure, 72, an anti-slip structure, 73, a step structure, 81, a first insulator, 82, a second insulator, 83, a third insulator, 90, a jig, 100, a radio frequency seat, 101, a sizing core, 102 and a grounding shell

Detailed Description

In order that the above objects, features and advantages of the utility model will be readily understood, a more particular description of the utility model will be rendered by reference to the appended drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present utility model. The utility model may be embodied in many other forms than described herein and similarly modified by those skilled in the art without departing from the spirit or scope of the utility model, which is therefore not limited to the specific embodiments disclosed below.

The application provides a test connector, which solves the problem of poor grounding caused by hard contact of test probe metals in the prior art. In the present application, the direction in which the main body is located with respect to the outer conductor is upper, upper end or top, and the direction opposite thereto is lower, lower end or bottom, and bottom.

Fig. 1-7 are schematic views of the overall structure of the test connector of the present application. The test connector comprises a main body 10, an outer conductor 20, a spring 30 and conductive silicone 40, a center pin 50, a first insulator 81, a second insulator 82. Wherein, the outer conductor 20 is sleeved on the lower side of the main body 10, the upper side of the outer conductor 20 is provided with a boss structure 21, the spring 30 is sleeved on the outer side of the main body 10, and the lower end of the spring 30 is abutted with the boss structure 21; the lower inner surface of the outer conductor 20 is provided with a groove 23 (refer to fig. 6), and the groove 23 is embedded with conductive silica gel 40. Generally, the main body 10 and the outer conductor 20 are of a cylindrical structure coaxially provided, the center pin 50 is inserted through the main body 10 and the outer conductor 20, the upper side of the center pin 50 is in insulating contact with the main body 10 via the first insulator 81, and the lower side is in insulating contact with the outer conductor 20 via the second insulator 82. Meanwhile, the first insulator 81 and the second insulator 82 can prevent the center needle 50 from shaking in the testing process, so that the structural strength of the center needle 50 is improved, and the testing accuracy is guaranteed.

As shown in fig. 3 and 6, the conductive silicone 40 is a loop structure having an outer diameter identical to the maximum diameter of the groove 23.

Referring to fig. 3, the test connector further includes a metal housing 70 having a first screw structure 71 formed on an inner wall thereof, and a second screw structure 11 formed on an outer wall of the main body 10, the first screw structure 71 and the second screw structure 11 being engaged with each other in a screw-fit manner. The effect of this design is that when the conductive silicone 40 is repeatedly tested for cracking, the threads can be turned off to replace the outer conductor 20 and the center pin 50 can be reused. Further, an anti-slip structure 72 and a step structure 73 are provided on the outer surface of the metal housing 70, and the step structure 73 is provided on the lower side of the anti-slip structure 72. The function is as follows: when the metal shell 70 is twisted in, the metal shell 70 can be prevented from slipping and is easier to twist in, and after the metal shell is twisted in place, a spanner can be used for fastening the metal shell 70 on the step structure 73, so that loosening is prevented.

As shown in fig. 3 and 4, a claw-like structure 22 is provided on the step structure 21 of the outer conductor 20, and the claw-like structure 22 is fitted between the main body 10 and the spring 30. More specifically, the maximum outer diameter of the step structure 22 is larger than the maximum outer diameter of the claw structure 22, and the maximum outer diameter of the claw structure 22 is between the outer diameter of the spring 30 and the outer diameter of the cylinder at the lower end of the main body 10, so that the claw structure 22 can be firmly sleeved outside the main body 10, and the contact performance of the test connector can be improved.

The test connector further comprises a fixing flange 60, wherein the fixing flange 60 is sleeved on the upper side of the main body 10, and is used for fixing the main body 10 on a test fixture tool (not shown in the figure). Generally, the mounting flange 60 is provided with a plurality of mounting holes. More specifically, the test connector further includes a third insulator 83 disposed between the center pin 50 and the fixing flange 60, the third insulator 83 being sleeved on the inner side of the fixing flange 60. The assembly formed by the fixing flange 60, the third insulator 83 and the main body 10 can freely move axially along the periphery of the main body 10, and since the test fixture is fixed to the test connector through the fixing flange 60, the test fixture drives the fixing flange 60 to elastically move, so that an elastically grounding movement is formed between the test fixture and the test connector, and damage to the test connector in the test process is avoided.

In some embodiments, the center needle 50 is an integrally formed probe structure; in some embodiments, the center needle includes a fixed probe, an internal spring, and a movable probe (not shown). The upper side of the fixed probe is fixed in the fixing flange 60 through the third insulator 83, the lower side of the fixed probe is an open concave structure, the built-in spring is positioned in the concave structure, the lower end of the built-in spring is connected with the movable probe, and the lower side of the movable probe is respectively connected with the main body 10 in an insulating way through the first insulator 81 and the outer conductor 20 in an insulating way through the second insulator 82.

In one embodiment of the present application, the test connector is assembled by the following implementation steps:

1) The third insulator 83 is press-fitted inside the fixing flange 60;

2) The central probe is arranged on the third insulator 83 in the step 1, the first insulator 81 is sleeved on the central needle 50, and finally the main body 10 is in interference press fit on the fixed flange 60 until the insulator is pressed with the central needle 50;

3) Embedding the conductive silica gel 40 into the groove 23 at the lower end of the outer conductor 20; the assembly can be performed by using a jig or manual assembly, when the jig is used for installation (refer to fig. 5 and 6), the upper part of the jig 90 is sleeved into the lower port of the outer conductor 20, the conductive silica gel is placed at the end part of the lower part of the jig 90, and the conductive silica gel is sent into the groove 23 arranged at the lower port of the outer conductor 20 by applying force to the F direction through the jig; when the manual fixture is adopted, the conductive silica gel 40 is clamped by tweezers to be contracted, one half of the contracted conductive silica gel is put into the groove 23 at the lower end of the outer conductor 20, and the other half is pushed by the tweezers to be extruded and then bounced off, and as the silica gel pad is not divided, both sides have conductivity, the installation can be realized both the front and the back.

4) Interference crimping the second insulator 82 inside the outer conductor 20;

5) The spring 30 is placed on the body 10 of step 2, the outer conductor 20 of step 4 is threaded onto the center probe of step 2, and finally the metal housing 70 is twisted into the body.

As shown in fig. 7, when the test connector is in press-contact with the rf seat 100, the circular rubber core 101 on the upper side of the rf seat 100 and the part of the grounding shell 102 of the outer ring are pressed into the conductive silica gel 40, and the silica gel is flexible, so that the contact with the grounding shell 102 of the rf seat 100 can be completed in whole circle due to the scalability of the silica gel when the test connector is in press-deflection, thereby achieving more reliable grounding.

In conclusion, the assembly process is simple, the false detection rate can be effectively reduced, the production efficiency is improved, the production cost is reduced, and the popularization and the application of the test connector in industry are facilitated.

The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The foregoing examples merely illustrate embodiments of the utility model and are described in more detail and are not to be construed as limiting the scope of the utility model. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the utility model, which are all within the scope of the utility model. Accordingly, the scope of protection of the present utility model is to be determined by the appended claims.

Claims

1. The test connector is characterized by comprising a main body, an outer conductor, a first insulator, a second insulator, a center pin, a spring and conductive silica gel; the outer conductor is sleeved on the lower side of the main body, a boss structure is arranged on the upper side of the outer conductor, the spring is sleeved on the outer side of the main body, and the lower end of the spring is abutted with the boss structure; the center pin penetrates through the main body and the inner part of the outer conductor, is in insulating connection with the main body through the first insulator, and is in insulating connection with the outer conductor through the second insulator; the inner surface of the lower side of the outer conductor is provided with a groove, and conductive silica gel is embedded in the groove.

2. The test connector of claim 1, wherein the conductive silicone is a loop structure and an outer diameter of the loop structure is the same as the maximum diameter of the groove.

3. The test connector of claim 1, further comprising a metal housing, wherein the metal housing inner wall is provided with a first thread structure, wherein the body outer wall is provided with a second thread structure, and wherein the first thread structure and the second thread structure are threadably engaged with each other.

4. The test connector of claim 3, wherein the metal shell outer surface is further provided with a slip resistant structure and a step structure, the step structure being disposed on an underside of the slip resistant structure.

5. The test connector of claim 1, wherein the outer conductor is further provided with a claw-like structure, the claw-like structure being disposed on an upper side of the boss structure, the claw-like structure being interposed between the main body and the spring.

6. The test connector of claim 1, further comprising a mounting flange of cross-shaped configuration, the body being nested on an underside of the mounting flange.

7. The test connector of claim 6, further comprising a third insulator disposed inside the mounting flange, the center pin being insulated from the mounting flange by the third insulator.

8. The test connector of claim 7, wherein the center pin comprises a fixed probe, an internal spring and a movable probe, the upper side of the fixed probe is fixed inside the fixed flange through the third insulator, the lower side of the fixed probe is provided with a concave structure, the internal spring is positioned in the concave structure, and the lower end of the internal spring is connected with the movable probe.