CN220490880U

CN220490880U - Probe guide test fixture mechanism

Info

Publication number: CN220490880U
Application number: CN202321873184.3U
Authority: CN
Inventors: 黄诚
Original assignee: Suzhou Hitace Semiconductor Testing Equipment Co ltd
Current assignee: Suzhou Hitace Semiconductor Testing Equipment Co ltd
Priority date: 2023-07-17
Filing date: 2023-07-17
Publication date: 2024-02-13
Anticipated expiration: 2033-07-17

Abstract

The utility model discloses a probe guide test fixture mechanism in the technical field of probe fixtures, which comprises a bottom plate and probes, wherein a vertical plate is arranged at the top of the bottom plate, a sliding plate is arranged on the front side wall of the vertical plate in a sliding connection manner, a fixed block is arranged on the front side wall of the vertical plate, an electric telescopic rod is arranged at the bottom of the fixed block, one end of the electric telescopic rod is connected with the top of the sliding plate, a sliding rod is arranged on the front side wall of the sliding plate, four groups of sliding blocks are sleeved on the outer walls of the sliding rod, clamping mechanisms are arranged on the outer walls of the four groups of sliding blocks, the probes can be clamped and fixed by the clamping mechanisms, a second rack is arranged on the top of the sliding plate, and adjusting mechanisms are arranged on the tops of the four groups of sliding blocks.

Description

Probe guide test fixture mechanism

Technical Field

The utility model relates to the technical field of probe clamps, in particular to a probe guide test clamp mechanism.

Background

The PCB is called a printed circuit board, also called a printed circuit board, is an important electronic component, is a support body of the electronic component, is a carrier for electrically connecting the electronic components, is called a printed circuit board because the PCB is manufactured by adopting an electronic printing technology, and is required to be tested when the PCB is tested, the existing probe is required to be clamped and fixed by using a clamp mechanism, and the existing clamp mechanism is inconvenient to adjust the interval between the probes, so that the interval between the probes cannot be adjusted according to different PCB boards, and is inconvenient to use, and therefore, the probe guiding test clamp mechanism is required.

Disclosure of Invention

The utility model aims to provide a probe guide test fixture mechanism for solving the problems in the background technology.

In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides a probe direction test fixture mechanism, includes bottom plate and probe, and the bottom plate top is equipped with vertical board, and vertical board preceding lateral wall sliding connection is equipped with the sliding plate, and vertical board preceding lateral wall is equipped with the fixed block, and the fixed block bottom is equipped with electric telescopic handle, and electric telescopic handle one end is connected with the sliding plate top, the sliding plate preceding lateral wall is equipped with the slide bar, and the slide bar outer wall cup joints four groups of sliders, and four groups of slider outer walls are equipped with clamping mechanism, and clamping mechanism can press from both sides tightly fixedly to the probe, the sliding plate top is equipped with the second rack, and four groups of slider tops all are equipped with adjustment mechanism.

Further, clamping mechanism includes the mounting bracket that the slider outer wall was equipped with, and sliding connection is equipped with the grip block in the mounting bracket, and first arc wall has been seted up to the grip block back lateral wall, the grip block front side wall is equipped with the screw rod, and preceding lateral wall is connected with the rotor plate that outside was equipped with in the screw rod one end runs through the mounting bracket.

Further, a second arc-shaped groove matched with the first arc-shaped groove is formed in the front side wall of the sliding block.

Further, adjustment mechanism includes the mounting panel that the slider top was equipped with, and the mounting panel top runs through and is equipped with the lead screw, and lead screw one end connection is equipped with adjust knob, and the lead screw other end is equipped with through the bearing connection with second rack engaged with first rack.

Further, the mounting plate is arranged in an L shape.

Further, the guide groove is formed in the front side wall of the sliding plate, and guide blocks matched with the guide groove are arranged on the rear side walls of the four groups of sliding blocks.

Compared with the prior art, the utility model has the beneficial effects that: the utility model discloses can press from both sides tightly fixedly to the probe under the cooperation of clamping mechanism and second arc wall, can conveniently adjust the interval between the probe under the cooperation of slide bar, slider, adjustment mechanism and second rack to can adjust the interval between the probe according to different PCB boards.

Drawings

FIG. 1 is a schematic diagram of the structure of the present utility model;

FIG. 2 is a left side view of the structure of the present utility model;

FIG. 3 is a schematic view of the structure A of the present utility model;

fig. 4 is a schematic diagram of the structure B of the present utility model.

In the figure: 1. a bottom plate; 2. a sliding plate; 3. a slide block; 4. a probe; 5. a slide bar; 6. a clamping mechanism; 60. a mounting frame; 61. a clamping plate; 62. a rotating plate; 63. a screw; 7. an electric telescopic rod; 8. a fixed block; 9. an adjusting mechanism; 90. an adjustment knob; 91. a screw rod; 92. a first rack; 93. a mounting plate; 10. a vertical plate; 11. and a second rack.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Example 1:

referring to fig. 1-2, the present utility model provides a technical solution: the utility model provides a probe direction test fixture mechanism, including bottom plate 1 and probe 4, the bottom plate 1 top is equipped with vertical board 10, vertical board 10 preceding lateral wall sliding connection is equipped with slide plate 2, vertical board 10 preceding lateral wall is equipped with fixed block 8, the fixed block 8 bottom is equipped with electric telescopic handle 7, electric telescopic handle 7 one end is connected with slide plate 2 top, slide plate 2 preceding lateral wall is equipped with slide bar 5, four group's slider 3 have been cup jointed to slide bar 5 outer wall, the guide way has been seted up to slide plate 2 preceding lateral wall, four group's slider 3 back lateral wall all is equipped with the guide block with guide way assorted, make slider 3 remove more stably at slide bar 5 outer wall under the effect of guide way and guide block, four group's slider 3 outer walls are equipped with clamping mechanism 6, clamping mechanism 6 can press from both sides tightly fixedly to probe 4, slide plate 2 top is equipped with second rack 11, four group's slider 3 tops all are equipped with adjustment mechanism 9

Referring to fig. 3, the clamping mechanism 6 includes a mounting frame 60 provided on an outer wall of the slider 3, a clamping plate 61 is slidably connected in the mounting frame 60, a first arc-shaped slot is provided on a rear side wall of the clamping plate 61, a second arc-shaped slot matched with the first arc-shaped slot is provided on a front side wall of the slider 3, a screw 63 is provided on a front side wall of the clamping plate 61, one end of the screw 63 penetrates through the inner front side wall of the mounting frame 60 and is connected with a rotating plate 62 provided outside, the rotating plate 62 is rotated by a worker to drive the screw 63 to rotate, the screw 63 drives the clamping plate 61 to move, and the probe 4 can be clamped and fixed under the cooperation of the first arc-shaped slot and the second arc-shaped slot on the clamping plate 61.

Referring to fig. 4, the adjusting mechanism 9 includes a mounting plate 93 provided at the top of the slider 3, the mounting plate 93 is in an L shape, a screw rod 91 is provided at the top of the mounting plate 93 in a penetrating manner, one end of the screw rod 91 is connected with an adjusting knob 90, and the other end of the screw rod 91 is connected with a first rack 92 engaged with the second rack 11 through a bearing.

Working principle: when the PCB is required to be tested, a worker places the PCB on the bottom plate 1, the worker places the probes 4 in the mounting frame 60, then the worker rotates the rotating plate 62 to drive the screw rod 63 to rotate, the screw rod 63 drives the clamping plate 61 to move, the probes 4 can be clamped and fixed under the cooperation of the first arc-shaped groove and the second arc-shaped groove on the clamping plate 61, the electric telescopic rod 7 drives the sliding plate 2 to move downwards, the sliding plate 2 drives the probes 4 to move downwards to test the PCB, and when the interval between the probes 4 is required to be adjusted, the worker dials the sliding block 3 to move on the outer wall of the sliding rod 5, so that the sliding block 3 drives the probes 4 to move, then the worker rotates the adjusting knob 90 to drive the screw rod 91 to rotate, and the screw rod 91 drives the first racks 92 to move downwards to be meshed with the second racks 11, so that the probes 4 can be fixed, and the adjustment of the probes 4 is completed.

Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a probe direction test fixture mechanism, includes bottom plate (1) and probe (4), and bottom plate (1) top is equipped with vertical board (10), and vertical board (10) preceding lateral wall sliding connection is equipped with sliding plate (2), and vertical board (10) preceding lateral wall is equipped with fixed block (8), and fixed block (8) bottom is equipped with electric telescopic handle (7), and electric telescopic handle (7) one end is connected its characterized in that with sliding plate (2) top: the utility model discloses a probe, including slip board (2), slide bar (5), four groups of sliders (3) have been cup jointed to slide bar (5) outer wall, and four groups of sliders (3) outer wall are equipped with clamping mechanism (6), and clamping mechanism (6) can press from both sides tightly fixedly to probe (4), slip board (2) top is equipped with second rack (11), and four groups of sliders (3) top all is equipped with adjustment mechanism (9).

2. The probe guide test fixture mechanism of claim 1, wherein: the clamping mechanism (6) comprises a mounting frame (60) arranged on the outer wall of the sliding block (3), a clamping plate (61) is arranged in sliding connection in the mounting frame (60), a first arc-shaped groove is formed in the rear side wall of the clamping plate (61), a screw (63) is arranged on the front side wall of the clamping plate (61), and one end of the screw (63) penetrates through the inner front side wall of the mounting frame (60) and is connected with a rotating plate (62) arranged outside.

3. The probe guide test fixture mechanism of claim 1, wherein: the front side wall of the sliding block (3) is provided with a second arc-shaped groove matched with the first arc-shaped groove.

4. The probe guide test fixture mechanism of claim 1, wherein: the adjusting mechanism (9) comprises an installing plate (93) arranged at the top of the sliding block (3), a screw rod (91) is arranged at the top of the installing plate (93) in a penetrating mode, an adjusting knob (90) is connected and arranged at one end of the screw rod (91), and a first rack (92) meshed with the second rack (11) is connected and arranged at the other end of the screw rod (91) through a bearing.

5. The probe guide test fixture mechanism of claim 4, wherein: the mounting plate (93) is L-shaped.

6. The probe guide test fixture mechanism of claim 1, wherein: the guide grooves are formed in the front side wall of the sliding plate (2), and guide blocks matched with the guide grooves are arranged on the rear side wall of the four groups of sliding blocks (3).