CN220439581U - Test equipment - Google Patents

Abstract

The utility model provides a test device for testing the resistance of the edge of a solar cell, comprising: the probe assembly comprises a carrier, a probe assembly and a lifting mechanism, wherein the carrier is provided with a bearing surface, a limiting groove for accommodating the solar cell is formed in the bearing surface, the limiting groove can limit the displacement of the solar cell along a first horizontal direction and the displacement of the solar cell along a second horizontal direction, and the first horizontal direction is perpendicular to the second horizontal direction; the bearing surface is provided with a functional area, and the functional area is electrically contacted with the edge of the lower surface of the solar cell; the probe assembly is positioned above the carrier; the lifting mechanism is used for driving the probe assembly to move up and down along the vertical direction, so that the probe assembly can move down along the vertical direction to be in electrical contact with the edge of the upper surface of the solar cell. The test equipment adopts the bearing surface to be in electrical contact with the lower surface of the solar cell to replace the lower probe assembly, so that the lower probe assembly and a driving source for driving the lower probe assembly to lift are omitted, and the structure of the test equipment is simplified.

Description

Test equipment

Technical Field

The utility model relates to the technical field of solar cells, in particular to test equipment for testing the resistance of the edge of a solar cell.

Background

Photovoltaic power generation is to directly convert light energy into electric energy by utilizing the photoelectric conversion effect of a solar cell, and a key element of the technology is a solar cell. The preparation process of the solar cell mainly comprises the following steps: detecting a silicon wafer, texturing, diffusing and forming, etching, plating an antireflection film, printing and sintering. In the diffusion junction making process, phosphorus is inevitably diffused to the side face and the back face of the battery piece, so that the upper surface and the lower surface of the battery piece are short-circuited, and therefore, the diffusion layers on the edge and the back face of the battery piece are required to be removed in the manufacturing process of the battery piece. After the diffusion layer removal process, it is generally necessary to detect the edge resistance of the battery cell to avoid electrical leakage of the battery cell due to uncleanness.

The related art provides a test apparatus including an upper probe assembly and a lower probe assembly which can be lifted up and down, the upper probe assembly is located above the battery plate, and can be moved down to be electrically conducted with an electrode on the upper surface of the battery plate, and the lower probe assembly is located below the battery plate, and can be moved up to be electrically conducted with an electrode on the lower surface of the battery plate, so as to detect the edge resistance of the battery plate.

However, sampling such a test apparatus, the structure of the test apparatus is complicated.

Disclosure of Invention

The utility model aims at solving at least one of the technical problems in the prior art, and provides test equipment for testing the resistance of the edge of a solar cell.

In order to achieve the object of the present utility model, there is provided a test apparatus for testing resistance of an edge of a solar cell, comprising: the test mechanism comprises a carrier, a probe assembly and a lifting mechanism,

the carrier is provided with a bearing surface, a limit groove for accommodating the solar cell is formed in the bearing surface, the limit groove can limit the displacement of the solar cell along a first horizontal direction and the displacement of the solar cell along a second horizontal direction, and the first horizontal direction is perpendicular to the second horizontal direction; the bearing surface is provided with a functional area, and the functional area is electrically contacted with the edge of the lower surface of the solar cell; the probe assembly is positioned above the carrier; the lifting mechanism is used for driving the probe assembly to move up and down along the vertical direction, the probe assembly can move down to the testing station along the vertical direction, and the probe assembly at the testing station is in electrical contact with the edge of the upper surface of the solar cell.

The test apparatus as described above, wherein the functional area of the carrying surface is provided with a conductive layer, which is in electrical contact with the lower surface edge.

The test apparatus as described above, wherein the stage is a metal stage made of a conductive metal material.

The test equipment comprises the test equipment, wherein the bearing surface is convexly provided with a first convex strip and a third convex strip which extend along a second horizontal direction and a second convex strip which extend along the first horizontal direction, and the first convex strip and the third convex strip are oppositely arranged along the first horizontal direction; the first raised strips, the second raised strips, the third raised strips and the bearing surface jointly define a limiting groove, one side of the limiting groove opposite to the second raised strips is provided with an opening, and the opening can allow the solar cell to pass through.

The test equipment comprises the test equipment and a tester, wherein the tester is electrically connected with the probe assembly and is used for displaying resistance data obtained by testing the probe assembly.

The test equipment comprises the test equipment, and further comprises a chassis, wherein the chassis is internally provided with a rack, the interior of the chassis is divided into a first space and a second space by the rack, and the tester and the test mechanism are respectively located in the first space and the second space.

The test equipment comprises the test mechanism, a carrier, a lifting mechanism and a supporting frame, wherein the test mechanism further comprises a bottom plate and a vertical plate, the carrier is placed on the bottom plate, the vertical plate is positioned above the bottom plate and is vertical to the bottom plate, and the lifting mechanism is fixedly connected with the vertical plate; the testing mechanism further comprises an insulating support piece, and the insulating support piece is arranged on one surface of the bottom plate facing the carrying platform and is abutted with the carrying platform.

The test equipment comprises the test mechanism, wherein the test mechanism further comprises a mounting plate, the mounting plate is located above the carrying platform, the probe assembly is mounted on the edge of the mounting plate, and the lifting mechanism is used for driving the mounting plate to move up and down in the vertical direction.

The test equipment comprises the lifting mechanism, the connecting rod, the lifting rod, the handle, the first hinge shaft, the second hinge shaft and the third hinge shaft, wherein the base is fixedly connected with the vertical plate, one end of the handle is rotatably connected with the base through the first hinge shaft, one end of the connecting rod is rotatably connected with the handle through the second hinge shaft, the other end of the connecting rod is connected with one end of the lifting rod through the third hinge shaft, and the other end of the lifting rod is fixedly connected with the mounting plate; wherein the rotary hinge axes of the first hinge shaft, the second hinge shaft and the third hinge shaft are parallel and extend in the horizontal direction; and/or the number of the groups of groups,

the testing mechanism comprises two groups of guiding devices, the two groups of guiding devices are respectively arranged on two sides of the lifting mechanism, each guiding device comprises a slideway, a sliding block and a fixing plate, the slideway extends along the vertical direction and is formed on the vertical plate, the sliding block is arranged on the slideway in a sliding manner, the sliding block is fixedly connected with the fixing plate, and the fixing plate is fixedly connected with the mounting plate.

The test equipment comprises the test mechanism and a support rib plate, wherein the support rib plate is erected on the bottom plate, is positioned on one side of the vertical plate along the thickness direction and is fixedly connected with the vertical plate; the testing mechanism further comprises a rib plate, and the rib plate is erected on the bottom plate and is fixedly connected with the supporting rib plate.

The utility model has the following beneficial effects:

the test equipment provided by the utility model is used for testing the resistance of the edge of the solar cell, the bearing surface is in electrical contact with the lower surface of the solar cell to replace the lower probe assembly, the lower probe assembly and a driving source for driving the lower probe assembly to lift are omitted, and the structure of the test equipment is simplified.

And moreover, the limiting groove is formed in the bearing surface and can play a role in positioning so as to find the placement position of the solar cell, thereby being beneficial to improving the testing efficiency.

Drawings

Fig. 1 is a schematic perspective view of a test apparatus according to an embodiment of the present application;

FIG. 2 is a schematic perspective view of the testing mechanism of the testing apparatus shown in FIG. 1 at a first viewing angle;

FIG. 3 is an exploded schematic view of the testing mechanism shown in FIG. 2;

FIG. 4 is a perspective view of a probe holder of the test mechanism shown in FIG. 3;

FIG. 5 is a schematic perspective view of a lifting mechanism of the test mechanism shown in FIG. 2;

fig. 6 is a schematic perspective view of the testing device shown in fig. 1 when the testing mechanism is located at a second viewing angle.

Reference numerals illustrate:

1000-test equipment;

100-a testing mechanism; 110-stage; 111-bearing surface; 112-first ribs; 113-second ribs; 114-third raised strips; 120-probe assembly; 121-a probe holder; 1211-a first mount; 1212-a connecting arm; 1213-a projection; 1214-a second mount; 122-probe; 130-lifting mechanism; 131-a base; 132-a connecting rod; 133-lifting rod; 134-handle; 135-a first hinge shaft; 136-a second hinge shaft; 137-a third hinge shaft; 140-a bottom plate; 141-insulating supports; 150-vertical plates; 160-supporting rib plates; 170-rib plates; 180-mounting plates; 181-through holes; 190-guiding means; 191-a slideway; 192-slide block; 193-fixing plate;

200-a tester;

300-chassis; 310-rack;

400-solar cell.

Detailed Description

In order to enable those skilled in the art to better understand the technical solutions of the present utility model, the test apparatus provided by the present utility model is described in detail below with reference to the accompanying drawings.

Fig. 1 is a schematic perspective view of a test apparatus according to an embodiment of the present application. Referring to fig. 1, an embodiment of the present application provides a testing apparatus 1000 for testing the resistance of the edge of a solar cell 400. Wherein the test apparatus 1000 specifically comprises a test mechanism 100.

Fig. 2 is a schematic perspective view of the test mechanism 100 in the test apparatus 1000 shown in fig. 1 when the test mechanism 100 is located at a first viewing angle, and fig. 3 is an exploded schematic view of the test mechanism 100 shown in fig. 2. Referring to fig. 2 and 3, the test mechanism 100 includes a stage 110, a probe assembly 120, and a lifting mechanism 130.

The carrier 110 has a carrying surface 111 on which the solar cell 400 is placed, and the carrying surface 111 has a functional area thereon, the functional area is electrically contacted with the lower surface edge of the solar cell 400, and the functional area is electrically conductive with the lower surface edge of the solar cell 400. The probe assembly 120 is located above the carrier 110, and the lifting mechanism 130 is used to drive the probe assembly 120 to move up and down in a vertical direction (shown in a Z direction in fig. 2), so that the probe assembly 120 can move down in the vertical direction (Z direction) to a testing station, and the probe assembly 120 at the testing station is in electrical contact with the upper surface edge of the solar cell 400, and is electrically conducted therebetween.

Thus, the test mechanism 100 of the present embodiment works substantially as follows: placing the solar cell 400 to be tested on the bearing surface 111 of the carrier 110, and electrically contacting the edge of the lower surface of the solar cell 400 with the functional area of the bearing surface 111; the lifting mechanism 130 drives the probe assembly 120 to move downwards in the vertical direction (Z direction) to be in electrical contact with the upper surface edge of the solar cell 400 to be tested; the electrical conduction between the edge of the upper surface and the edge of the lower surface of the solar cell 400 forms a loop, so that the resistance between the upper and lower points of the edge of the solar cell 400 can be obtained, thereby realizing the test of the edge resistance; the lifting mechanism 130 drives the probe assembly 120 to move upwards along the vertical direction (Z direction) to the wafer exchanging station to be far away from the bearing surface 111, and then the solar cell 400 which is already tested is replaced by the solar cell 400 to be tested so as to start the next test.

It should be noted that, the carrying surface 111 is further formed with a limiting groove for accommodating the solar cell 400, where the shape and size of the limiting groove are adapted to those of the solar cell 400, and the limiting groove can limit the displacement of the solar cell 400 along the first horizontal direction (shown in the X direction in fig. 2) and the displacement along the second horizontal direction (shown in the Y direction in fig. 2), and the first horizontal direction (X direction) is perpendicular to the second horizontal direction (Y direction). Like this, on the one hand, the cooperation of spacing groove and solar wafer 400 can play the positioning action, helps looking for the emplacement of accurate solar wafer 400, and then is favorable to improving test efficiency, and on the other hand, the displacement of solar wafer 400 along first horizontal direction (X direction) and second horizontal direction (Y direction) of placing in the spacing groove is restrained to be favorable to guaranteeing that the test can be smooth completion and the accuracy of test.

In summary, compared with the test apparatus 1000 of the related art, in which the upper probe assembly and the lower probe assembly are respectively electrically contacted with the upper surface and the lower surface of the solar cell 400, the test apparatus 1000 provided in this embodiment makes the lower surface edge and the upper surface edge of the solar cell 400 electrically conductive for testing by providing the functional area of the carrying surface 111 to be electrically contacted with the lower surface edge of the solar cell 400. Therefore, the functional area of the bearing surface 111 is electrically contacted with the lower surface of the solar cell 400 to replace the lower probe assembly, so that the lower probe assembly and a driving source for driving the lower probe assembly to lift are omitted, and the structure of the test equipment 1000 is simplified.

Moreover, by arranging the limiting groove on the bearing surface 111, the limiting groove can play a role in positioning so as to find the placement position of the solar cell 400, thereby being beneficial to improving the testing efficiency.

It should be noted that the above-mentioned functional area of the carrying surface 111 is to be understood in a broad sense in electrical contact with the lower surface edge of the solar cell sheet 400.

In the first case, only the functional area on the carrying surface 111 is configured to be electrically conductive.

It will be appreciated that specific implementations of this embodiment include, but are not limited to, the following possibilities.

For example, in one possible implementation, a conductive layer is provided on the functional area of the carrying surface 111, which is in electrical contact with the lower surface edge. Specifically, the conductive layer may be, for example, a conductive plate made of a conductive metal material (such as gold, silver, copper, iron, tin, aluminum, etc.), and the conductive plate is connected to the functional area of the carrying surface 111; alternatively, the conductive layer may be, for example, a plating layer formed in the functional region of the bearing surface 111.

For another possible implementation manner, the carrier 110 may be specifically formed by splicing a first portion and a second portion, where the second portion is located at an edge, and the first portion is made of non-conductive metal, the second portion is made of conductive metal, and the top surface of the second portion is a functional area. For example, the first portion may be a rectangular plate structure, the second portion may be a frame structure, and the central position of the second portion has a central hole, and the peripheral edge of the first portion is connected with the wall of the central hole of the second portion. In this embodiment, the second portion of the carrier 110 is conductive.

In the second case, the entire carrier 110 is conductive, and the carrier 110 is a metal carrier made of conductive metal. Specifically, the stage 110 may be made of copper, iron, aluminum, or the like. In this embodiment, the carrier 110 is not limited to only the functional area, and the entire carrier 110 can be conductive, so that the carrier 110 can electrically contact the lower surface of the solar cell 400 to form a loop for testing without purposely aligning the lower surface edge of the solar cell 400 with the functional area of the carrying surface 111, which is beneficial to improving the testing efficiency.

Taking the solar cell 400 as a rectangular example for illustration, the side wall of the groove of the limiting groove in the above embodiment may specifically include a first side surface and a second side surface that are disposed opposite to each other, and a third side surface and a fourth side surface that are disposed opposite to each other, when the solar cell 400 is placed in the limiting groove, two sides of the solar cell 400 along the first horizontal direction (X direction) respectively abut against the first side surface and the second side surface, and two sides along the second horizontal direction (Y direction) respectively abut against the third side surface and the fourth side surface. In this embodiment, the top of the limiting groove is opened to form a top opening, the solar cell 400 can be accommodated in the limiting groove through the top opening, and the upper surface of the solar cell 400 is exposed outside the top opening so as to be capable of electrically contacting with the probe assembly 120.

Wherein, the specific forming mode of the limit groove has various possibilities. Illustratively, in some embodiments, the side of the carrying surface 111 facing away from the solar cell 400 of the carrier 110 may be recessed to form a limiting groove.

In a specific example of the present application, referring to fig. 3, a first protrusion 112 and a third protrusion 114 extending along a second horizontal direction (Y direction) and a second protrusion 113 extending along a first horizontal direction (X direction) are protruding on the carrying surface 111, the first protrusion 112 and the third protrusion 114 are disposed opposite to each other along the first horizontal direction (X direction), and the first protrusion 112, the second protrusion 113, the third protrusion 114 and the carrying surface 111 together define a limiting slot. And, the limit groove is formed with an opening at a side opposite to the second protruding strip 113, and the opening can allow the solar cell 400 to pass through. At this time, a surface of the first protrusion 112 facing the third protrusion 114 is a first side surface, a surface of the third protrusion 114 facing the first protrusion 112 is a second side surface, and a surface of the second protrusion 113 facing the limiting groove is a third side surface.

In this way, when the testing device 1000 of the present embodiment is used to test the resistor, the solar cell 400 can be placed in the limiting groove from the top opening, or the solar cell 400 can be placed in the limiting groove from the opening, so that the mounting modes are more. If the solar cell 400 is placed in the limiting groove from the opening, the solar cell 400 is mounted in place when contacting the second convex strip 113.

In addition, compared with the recess forming the limit groove on the carrying surface 111, the limit groove is surrounded by the convex strips 112, 113, 114 protruding from the carrying surface 111 in the embodiment, so as to facilitate ensuring the higher structural strength of the carrier 110.

With continued reference to fig. 3, further, the second protrusion 113 may be located between the first protrusion 112 and the third protrusion 114, and the second protrusion 113 is not in contact with the first protrusion 112 and the third protrusion 114. In this way, since the limit groove has an opening, the periphery of the solar cell 400 in the limit groove is not completely surrounded, and a pushing force is applied to the solar cell 400 from the gap between the second raised line 113 and the first raised line 112 or from the gap between the second raised line 113 and the third raised line 114, so that the solar cell 400 after the test can be easily pushed to be removed from the opening to the outside of the limit groove. That is, the solar cell 400, which has been tested, can be conveniently taken out from the opening, improving the test efficiency.

With continued reference to fig. 2 and 3, the test mechanism 100 further includes a base plate 140 and a vertical plate 150, the base plate 140 is parallel to the horizontal plane, the carrier 110 is placed on the base plate 140, the vertical plate 150 is located above the base plate 140 and perpendicular to the base plate 140, and the lifting mechanism 130 is fastened to the vertical plate 150. In this manner, the bottom plate 140 provides support for the carrier 110 and the riser 150 provides an installation opportunity for the lift mechanism 130. In addition, by connecting the base plate 140 with the chassis 300 (see description below), the test mechanism 110 can be easily installed into the chassis 300.

In some examples, the test mechanism 100 further includes a mounting plate 180, the mounting plate 180 being located above the stage 110, the probe assembly 120 being mounted on an edge of the mounting plate 180, and the lifting mechanism 130 being configured to drive the mounting plate 180 in a vertical (Z-direction) lifting motion. In this way, the mounting plate 180 provides mounting possibility and support for the probe assemblies 120, and the lifting mechanism 130 can conveniently drive the probe assemblies 120 to move by driving the mounting plate 180, especially when a plurality of probe assemblies 120 are arranged, the probe assemblies 120 are all mounted on the mounting plate 180, and the lifting mechanism 130 can simultaneously drive all the probe assemblies 120 to move by driving the mounting plate 180.

In connection with the example shown in fig. 2 and 3, the probe assemblies 120 are provided in four, and the four probe assemblies 120 are respectively provided at four sides of the mounting plate 180 to be respectively in electrical contact with the peripheral edges of the rectangular solar cell sheet 400. Thus, the resistance of the peripheral edge of the rectangular solar cell 400 can be detected, and the test accuracy is high. Of course, it is understood that the number of the probe assemblies 120 is not limited to the above number, for example, the probe assemblies 120 may be provided with more than five, and at least one edge of the upper surface of the solar cell 400 is in electrical contact with a plurality of the probe assemblies 120, where the number of the probe assemblies 120 is increased, which is beneficial for further improving the accuracy of the test.

Fig. 4 is a perspective view of the probe holder 121 of the test mechanism 100 shown in fig. 3. Referring to fig. 4, the probe assembly 120 specifically includes a probe frame 121 and a plurality of probes 122, where a plurality of through holes are formed in the probe frame 121, and the plurality of probes 122 are respectively and correspondingly inserted into the plurality of through holes, and a central axis of the through holes extends along a vertical direction (Z direction).

The probe holder 121 may be connected to the mounting plate 180 by a screw connection, or may be connected to the mounting plate 180 by welding or bonding, etc., so that the probe assembly 120 can be fixed to the mounting plate 180.

In some examples of the present application, as shown in fig. 3 and 4, a through hole 181 is provided on the mounting plate 180, a central axis of the through hole 181 extends in a vertical direction (Z direction), the probe holder 121 includes a first support 1211, a connection arm 1212, and a second support 1214 connected in sequence, a bottom surface of the first support 1211 and a bottom surface of the second support 1214 are coplanar and parallel to a horizontal plane, the bottom surface of the connection arm 1212 is located below the bottom surface of the first support 1211, that is, a bottom portion of the connection arm 1212 has a protruding portion 1213, and the protruding portion 1213 protrudes toward below the first support 1211 and the second support 1214. Specifically, the protruding portion 1213 is clamped to the through hole 181, and the bottom surfaces of the first support 1211 and the second support 1214 are abutted against the top surface of the mounting plate 180. Thus, the abutting relationship of the first support 1211 and the second support 1214 with the mounting plate 180 may act as a detent indicating that the probe holder 121 is in place.

Through holes are formed in the connection arms 1212, so that the probes 122 mounted on the connection arms 1212 can be inserted into the through holes 181 to be in contact with the upper surface of the solar cell 400 when the probe holder 121 is fixed to the mounting plate 180.

It is understood that the lifting mechanism 130 includes, but is not limited to, the possible implementations described below. In some possible implementations, the lifting mechanism 130 may be an electric push rod, or the lifting mechanism 130 may include a motor and a transmission for converting rotational power of the motor into linear power and transmitting the linear power to the mounting plate 180.

Fig. 5 is a schematic perspective view of the lifting mechanism 130 in the test mechanism 100 shown in fig. 2. In one possible implementation, referring to fig. 2 and 5, the lifting mechanism 130 includes a base 131, a link 132, a lifting rod 133, a handle 134, a first hinge shaft 135, a second hinge shaft 136, and a third hinge shaft 137, the base 131 is fixedly connected with the riser 150, one end of the handle 134 is rotatably connected with the base 131 through the first hinge shaft 135, one end of the link 132 is rotatably connected with the handle 134 through the second hinge shaft 136, the other end of the link 132 is connected with one end of the lifting rod 133 through the third hinge shaft 137, and the other end of the lifting rod 133 is fixedly connected with the mounting plate 180. Wherein the rotational hinge axes of the first, second and third hinge shafts 135, 136 and 137 are parallel and extend in a horizontal direction.

In the operation of the testing mechanism 100 of this embodiment, when it is required to drive the probe assembly 120 up to the film changing station, the tester can apply a force to raise the handle 134, the first hinge shaft 135 rotates in the counterclockwise direction, the second hinge shaft 136 moves up along with the handle 134, and then drives the link 132 and the lifting rod 133 connected to the link 132 to move up, and the mounting plate 180 and the probe assembly 120 move up accordingly.

Thus, the elevating mechanism 130 of the present embodiment corresponds to an toggle clamp, and the mounting plate 180 can be driven to move up and down by a mechanical structure, as compared with the elevating mechanism 130 that drives the probe assembly 120 by a motor.

In a further alternative example of the present application, a latch (not shown) may be provided on the handle 134 in a protruding manner, and a latch portion (not shown) may be provided on the vertical plate 150 in a protruding manner. So set up, when handle 134 is raised to extreme position, probe subassembly 120 moves to the trade piece station, fixture block and joint portion joint cooperation for elevating system 130 lock is dead in extreme position, is favorable to guaranteeing that probe subassembly 120 moves in order to test after solar wafer 400 changes to accomplish. Of course, in other examples, an elbow clamp with a self-locking function may be used as the lifting mechanism 130, and an elbow clamp with a maximum clamping weight greater than the total weight of the mounting plate 180 and the probe assembly 120 may be used.

In some embodiments, the testing mechanism 100 further includes two sets of guiding devices 190, where the two sets of guiding devices 190 are respectively disposed on two sides of the lifting mechanism 130, the guiding devices 190 include a slide 191, a slider 192, and a fixing plate 193, the slide 191 extends in a vertical direction (Z direction) and is formed on the vertical plate 150, the slider 192 is slidably disposed on the slide 191, the slider 192 is fastened to the fixing plate 193, and the fixing plate 193 is fastened to the mounting plate 180.

Here, the slide 191 may be specifically a slide groove formed on the vertical plate 150, the slide groove extending in the vertical direction, or, in the example shown in fig. 2, a slide rail may be mounted on the vertical plate 150, and the slide 191 is formed on the slide 191.

With the above arrangement, the sliding fit relationship between the slider 192 and the slide 191 can serve as a guide to guide the fixed plate 193 and the mounting plate 180 connected to the fixed plate 193 to move along a predetermined trajectory (i.e., in a vertical direction), so as to facilitate ensuring that the probe assembly 120 can be lifted and lowered in a vertical direction (Z direction). It should be noted that by providing two sets of guide means 190, a greater number of guide means 190 is advantageous for enhancing the guiding action.

In order to improve the structural stability of the test mechanism 100, the test mechanism 100 further includes two support ribs 160, where the two support ribs 160 are both erected on the base plate 140 and disposed at intervals along the first horizontal direction (X direction), and the support ribs 160 are located on one side of the riser 150 in the thickness direction and are fastened to the riser 150. So configured, the support rib 160 can function to support the riser 150. It should be understood that the number of support ribs 160 is not limited to two and may be designed according to actual requirements.

For example, the vertical plate 150 may be directly connected to the bottom plate 140 vertically. In this embodiment, the base plate 140 also provides support for the riser 150, and the stage 110, probe assembly 120, and lift mechanism 130 are all located on the same side of the riser 150.

In an alternative specific example, as shown in fig. 2, 3 and 6, the bottom surface of the vertical plate 150 is not in contact with the top surface of the bottom plate 140 and has a certain distance along the vertical direction (Z direction), and an avoidance opening is formed between the bottom surface of the vertical plate 150 and the top surface of the bottom plate 140, and the avoidance opening may allow the carrier 110, the solar cell 400 located on the carrier 110, and the mounting plate 180 to pass through. In this embodiment, the carrier 110, the solar cell 400 located on the carrier 110, and the mounting plate 180 may pass through the avoidance opening, so that part of the carrier 110, the solar cell 400, and the mounting plate 180 is located on one side of the riser 150 in the thickness direction thereof, part of the solar cell is located on the other side of the riser 150 in the thickness direction thereof, at least one of the plurality of probe assemblies 120 is located on one side of the riser 150 in the thickness direction thereof, and the rest of the probe assemblies 120 are located on the other side of the riser 150 in the thickness direction thereof. Fig. 6 is a schematic perspective view of the test device 1000 shown in fig. 1 when the test mechanism 100 is located at the second viewing angle.

So designed, the lifting mechanism 130 is disposed at one side of the vertical plate 150 along the thickness direction thereof, and the orthographic projection of the center of the lifting mechanism 130 on the horizontal plane can be overlapped with the center of gravity of the solar cell 400 and the center of gravity of the mounting plate 180, so that the mounting plate 180 can keep balance when lifting under the driving action of the lifting mechanism 130, thereby being beneficial to ensuring that a plurality of probe assemblies 120 simultaneously contact with the edge of the upper surface of the solar cell 400.

Further, a rib plate 170 is further provided between each support rib plate 160 and the bottom plate 140, and the rib plates 170 stand on the bottom plate 140 and are fastened to the support rib plates 160. By designing the rib plates 170, the rib plates 170 can support the supporting rib plates 160, so that the structural stability of the testing mechanism 100 is improved.

With reference to fig. 3, the testing mechanism 100 further includes an insulating support member 141, where the insulating support member 141 is disposed on a surface of the bottom plate 140 facing the carrier 110 and abuts against the carrier 110. The insulating support member 141 not only can play a role in supporting the carrier 110, but also can play an insulating role when the carrier 110 is made of conductive metal materials, so that the base plate 140 is prevented from conducting electricity to be transmitted to other components of the testing equipment 1000, and meanwhile, the circuit formed by conduction between the other components and the upper surface edge and the lower surface edge of the solar cell 400 during testing is avoided, and the accuracy of resistance testing is ensured.

In order to stably support the carrier 110, the insulating support 141 is provided in plurality. As shown in fig. 3, the insulating supports 141 are provided with four, and the four insulating supports 141 are respectively abutted against the four corner ends of the carrier 110. It is understood that the number of the insulating supports 141 is not limited to four, and may be designed according to actual requirements.

In some embodiments of the present application, as shown in fig. 1, the test apparatus 1000 further includes a tester 200, where the tester 200 is electrically connected to the probe assembly 120, and the tester 200 is used to display the resistance data obtained by testing the probe assembly 120. Therefore, the tester can easily know the edge resistance of the solar cell 400 according to the resistance data displayed by the tester 200, and can accurately judge whether the diffusion layers on the edge and the back of the solar cell 400 are removed.

Based on the above embodiment, the test apparatus 1000 further includes a chassis 300, in which the rack 310 is installed in the chassis 300, and the rack 310 divides the interior of the chassis 300 into a first space and a second space, where the tester 200 and the test mechanism 100 are located, respectively. The design of this embodiment is that the chassis 300 protects the test mechanism 100 and the tester 200, and the test mechanism 100 and the tester 200 are integrated into the test device 1000, so that the test device 1000 as a whole can be conveniently moved and carried.

In the example shown in fig. 1, the first space is located above the second space, that is, the tester 200 is located above the testing mechanism 100, so that the solar cell 400 to be tested is conveniently placed in the limit groove, and the solar cell 400 after the test is conveniently taken out, so that the testing efficiency is high. In other embodiments, the first space may also be located below the second space, or the first space may also be located on the left or right side of the second space.

It is to be understood that the above embodiments are merely illustrative of the application of the principles of the present utility model, but not in limitation thereof. Various modifications and improvements may be made by those skilled in the art without departing from the spirit and substance of the utility model, and are also considered to be within the scope of the utility model.

Claims (10)

1. A test apparatus for testing the resistance of an edge of a solar cell, comprising: the test mechanism comprises a carrier, a probe assembly and a lifting mechanism, wherein,

the carrying platform is provided with a carrying surface, a limit groove for accommodating the solar cell is formed in the carrying surface, the limit groove can limit the displacement of the solar cell along a first horizontal direction and the displacement of the solar cell along a second horizontal direction, and the first horizontal direction is perpendicular to the second horizontal direction; the bearing surface is provided with a functional area, and the functional area is in electrical contact with the edge of the lower surface of the solar cell;

the probe assembly is positioned above the carrier;

the lifting mechanism is used for driving the probe assembly to move up and down along the vertical direction, the probe assembly can move down to a testing station along the vertical direction, and the probe assembly at the testing station is in electrical contact with the edge of the upper surface of the solar cell.

2. Test apparatus according to claim 1, wherein the functional area of the bearing surface is provided with a conductive layer, which is in electrical contact with the lower surface edge.

3. The test apparatus of claim 1, wherein the stage is a metal stage made of a conductive metal material.

4. The test apparatus according to claim 1, wherein the carrying surface is provided with first and third protrusions extending in the second horizontal direction and second protrusions extending in the first horizontal direction, the first and third protrusions being disposed opposite to each other in the first horizontal direction;

the first raised strips, the second raised strips, the third raised strips and the bearing surface jointly define the limiting groove, and an opening is formed in one side, opposite to the second raised strips, of the limiting groove, and can allow the solar cell to pass through.

5. The test apparatus of claim 1, further comprising a tester electrically connected to the probe assembly, the tester for displaying resistance data obtained from the probe assembly testing.

6. The test apparatus of claim 5, further comprising a chassis having a rack mounted therein, the rack dividing the interior of the chassis into a first space and a second space, the tester and the test mechanism being located in the first space and the second space, respectively.

7. The test apparatus of any one of claims 1 to 6, wherein the test mechanism further comprises a base plate on which the stage is placed and a riser plate above and perpendicular to the base plate, the lift mechanism being in secure connection with the riser plate;

the test mechanism further comprises an insulating support piece, wherein the insulating support piece is arranged on one surface of the bottom plate, which faces the carrying platform, and is abutted to the carrying platform.

8. The test apparatus of claim 7, wherein the test mechanism further comprises a mounting plate positioned above the stage, the probe assembly being mounted to an edge of the mounting plate, the lifting mechanism being configured to drive the mounting plate to move up and down in a vertical direction.

9. The test apparatus of claim 8, wherein the lifting mechanism comprises a base, a link, a lifting rod, a handle, a first hinge shaft, a second hinge shaft, and a third hinge shaft, the base is fixedly connected with the riser, one end of the handle is rotatably connected with the base through the first hinge shaft, one end of the link is rotatably connected with the handle through the second hinge shaft, the other end of the link is connected with one end of the lifting rod through the third hinge shaft, and the other end of the lifting rod is fixedly connected with the mounting plate;

wherein the rotary hinge axes of the first hinge shaft, the second hinge shaft and the third hinge shaft are parallel and extend in the horizontal direction; and/or the number of the groups of groups,

the testing mechanism comprises two groups of guiding devices, the two groups of guiding devices are respectively arranged on two sides of the lifting mechanism, each guiding device comprises a slideway, a sliding block and a fixing plate, the slideway extends along the vertical direction and is formed on the vertical plate, the sliding block is slidably arranged on the slideway, the sliding block is fixedly connected with the fixing plate, and the fixing plate is fixedly connected with the mounting plate.

10. The test apparatus according to claim 7, wherein the test mechanism further comprises a support rib standing on the bottom plate, the support rib being located on one side of the vertical plate in the thickness direction and being fixedly connected to the vertical plate;

the testing mechanism further comprises a rib plate, and the rib plate is erected on the bottom plate and is fixedly connected with the supporting rib plate.