CN220437601U - Vacuum high-low temperature probe station - Google Patents

Vacuum high-low temperature probe station Download PDF

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Publication number
CN220437601U
CN220437601U CN202321887873.XU CN202321887873U CN220437601U CN 220437601 U CN220437601 U CN 220437601U CN 202321887873 U CN202321887873 U CN 202321887873U CN 220437601 U CN220437601 U CN 220437601U
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China
Prior art keywords
frame
fixedly connected
low temperature
motor
vacuum high
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CN202321887873.XU
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Chinese (zh)
Inventor
江明燕
石王凯
戴文聪
廖万述
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Shenzhen Sendongbao Technology Co ltd
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Shenzhen Sendongbao Technology Co ltd
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Abstract

The utility model provides a vacuum high-low temperature probe station, which relates to the technical field of temperature measurement equipment and comprises a base; the support frame is of U-shaped design, the middle position of the upper part of the inner side of the support frame is fixedly connected with a positioning table, and the bottom position of the positioning table is fixedly connected with a fixed gear. When the material is required to be detected through the detection probe, the motor B is started by combining the size of the material, and the movable frame is made to slide and adjust in the space frame through the matching of the threaded rod of the motor B and the threaded hole of the movable frame until the detection probe is attached to the material to be detected, so that the detection step is completed. The problem of current vacuum high low temperature probe platform detects the material to the material that accords with the device body matching model in the majority when detecting the material test with the solution, the practicality is relatively poor can not satisfy polytypic detection demand is solved.

Description

Vacuum high-low temperature probe station
Technical Field
The utility model belongs to the technical field of temperature measurement equipment, and particularly relates to a vacuum high-low temperature probe station.
Background
In order to study the conductivity or superconductivity of some materials, it is often necessary to have a requirement for the temperature at which the material is located. Therefore, in order to detect performance parameters of some materials under extreme high temperature or low temperature conditions, temperature measurement devices are increasingly demanded, and in order to reduce heat loss during conduction, temperature measurement devices often use probes to measure the temperature of the materials, such as probes placed on probe arms in a temperature control chamber, and the probe arms lift the probes into the materials, so as to measure relevant parameters.
Application number CN202221054673.1 this application relates to temperature measurement equipment, especially, relate to a probe mechanism for vacuum high low temperature probe platform, including the workstation, have the control by temperature change room, probe subassembly and shield, wherein, the control by temperature change room is placed on the workstation, the holding cavity has been seted up to the inside of control by temperature change room, the intercommunicating pore has been seted up to the lateral wall of holding cavity, the shield room has been placed in the control by temperature change room moreover, the intercommunication chamber has been seted up on the lateral wall of shield room, the shield laminating intercommunication chamber is towards the opening size setting in holding cavity one side, the probe subassembly can wear to establish the holding cavity through the intercommunicating pore, the shielding room is worn to establish in the rethread intercommunication chamber for probe subassembly's one end is directional in the work piece. The shielding member makes it difficult for the temperature of one end of the probe assembly to be transferred to one end directed to the workpiece, thereby improving the accuracy of the temperature measurement of the probe assembly.
Based on the search of the patent and the application knowledge of the existing vacuum high-low temperature probe station: most of the vacuum high-low temperature probe tables detect materials which meet the matching model of the device body in the material test and detection at present, and the practicality is poor and can not meet the requirements of multi-model detection.
Disclosure of Invention
In order to solve the technical problems, the utility model provides a vacuum high-low temperature probe station, which aims at solving the problems that the prior vacuum high-low temperature probe station detects materials which meet the matching model of a device body mostly when the materials are tested and detected, and the practicability is poor and the requirements of multiple types of detection cannot be met.
The utility model discloses a vacuum high-low temperature probe station, which is characterized by comprising the following specific technical means:
a vacuum high-low temperature probe station comprises a base; the utility model discloses a support frame, including base top, fixed gear, support frame, rack and interval frame top, both sides position fixedly connected with support frame in the middle of the base top, the support frame is U font design, and the inboard top intermediate position fixedly connected with locating platform of support frame, the bottom position fixedly connected with fixed gear of locating platform, fixed gear are located the position directly over the base, and the upper and lower both ends of fixed gear all are provided with the ring lug, and the ring lug block of fixed gear is in the inside position of winding the frame, the bottom position fixedly connected with extension frame of winding the frame, the bottom position and interval frame top inside position fixedly connected of extension frame.
Further, a motor A is fixedly connected to the middle position of the top of the winding frame, and a rotating shaft at the bottom of the motor A is fixedly connected with the middle position of the top of the movable gear.
Further, the movable gear is positioned in the inner position of the winding frame, and the movable gear is meshed with the fixed gear.
Further, the inside intermediate position of interval frame has seted up the spout, and interval frame is located the upper position of base, and interval frame's outside position fixedly connected with motor B.
Further, motor B pivot fixedly connected with threaded rod, the threaded rod that motor B connects is located the inside intermediate position of interval frame spout.
Further, sliding connection has the movable frame in the interval frame spout, and the movable frame is L shape design, and the screw hole has been seted up to the top position of movable frame, and the threaded rod that motor B connects is located the screw hole of movable frame, and the outside lower part of movable frame is provided with the detection probe.
Compared with the prior art, the utility model has the following beneficial effects:
the material that will detect is placed in the top intermediate position of base, when the material detects through detecting the probe to the needs, at first combine the size of material to start motor B, through the cooperation of motor B threaded rod and adjustable shelf screw hole, make its adjustable shelf carry out sliding adjustment at interval frame inside, until the material that detects the probe laminating needs to detect, accomplish the detection step, and then most detect the material that accords with the device body matching model when having solved vacuum high low temperature probe platform to material test and detect, the problem that the practicality is relatively poor can not satisfy polytypic detection demand.
When the peripheral surface position of the material is selected and detected, the motor A is started to drive the movable gear to rotate, so that the whole winding frame and the whole spacing frame are rotated around the fixed gear, the detection probe is adjusted to the position where the material is required to be detected, and the accuracy of the position where the material is selected at will is improved.
Drawings
FIG. 1 is a schematic top view of a vacuum high and low temperature probe station according to the present utility model.
FIG. 2 is a schematic diagram of the left-hand structure of the vacuum high-low temperature probe station of the present utility model.
FIG. 3 is a schematic side view of the vacuum high and low temperature probe station of the present utility model.
Fig. 4 is a schematic view of a partially enlarged structure of fig. 3 a according to the present utility model.
In the figure, the correspondence between the component names and the drawing numbers is:
1. a base; 101. a support frame; 102. a positioning table; 103. a fixed gear; 2. winding a frame; 201. a motor A; 202. a movable gear; 203. an extension frame; 3. a spacing frame; 301. a motor B; 302. a movable frame; 303. and detecting the probe.
Detailed Description
Embodiments of the present utility model are described in further detail below with reference to the accompanying drawings and examples.
Examples:
as shown in fig. 1 to 4:
the utility model provides a vacuum high-low temperature probe station, which comprises a base 1; the support frame 101 is fixedly connected to the middle two sides of the top of the base 1, the support frame 101 is of U-shaped design, the middle position of the upper side of the inner side of the support frame 101 is fixedly connected with the positioning table 102, the bottom position of the positioning table 102 is fixedly connected with the fixed gear 103, the fixed gear 103 is located at the middle position of the sliding groove of the spacing frame 3, circular protruding blocks are arranged at the upper end and the lower end of the fixed gear 103, the circular protruding blocks of the fixed gear 103 are clamped at the inner position of the winding frame 2, the extending frame 203 is fixedly connected to the bottom position of the winding frame 2, the bottom position of the extending frame 203 is fixedly connected with the inner side position of the top of the spacing frame 3, a sliding groove is formed in the middle position of the inner side of the spacing frame 3, the spacing frame 3 is located at the upper position of the base 1, the outer side position of the spacing frame 3 is fixedly connected with the motor B301, the rotating shaft of the motor B301 is fixedly connected with a threaded rod, the threaded rod connected to the movable frame 302 is slidably connected to the sliding groove of the spacing frame 3, the upper position of the movable frame 302 is of L-shaped design, the threaded hole is formed in the upper position of the movable frame 302, the threaded rod connected to the motor B is located in the threaded hole of the movable frame 302, and the outer side of the position of the movable frame 302 is provided with the probe 303.
Wherein, the middle position of the top of the winding frame 2 is fixedly connected with a motor A201, the rotating shaft at the bottom of the motor A201 is fixedly connected with the middle position of the top of a movable gear 202, the movable gear 202 is positioned at the inner position of the winding frame 2, and the movable gear 202 is meshed with the fixed gear 103.
Specific use and action of the embodiment:
when the device is used, the device is assembled by combining the embodiment, the material to be detected is placed in the middle position of the top of the base 1, when the material is required to be detected by the detection probe 303, the motor B301 is started by combining the size of the material, and the movable frame 302 is made to slide and adjust in the space frame 3 by matching the threaded rod of the motor B301 with the threaded hole of the movable frame 302 until the detection probe 303 is attached to the material to be detected, so that the detection step is completed.
When the circumferential surface position of the material is selected and detected, the motor A201 is started to drive the movable gear 202 to rotate, so that the whole winding frame 2 and the whole spacing frame 3 are rotated around the fixed gear 103, the detection probe 303 is adjusted to the position where the material is required to be detected, and the accuracy of the position where the material is selected at will is improved.

Claims (6)

1. A vacuum high-low temperature probe station, which is characterized in that: comprises a base (1); the utility model discloses a U-shaped support for the refrigerator, including base (1), support frame (101) in the middle of base (1), support frame (101) are U font design, the inboard top intermediate position fixedly connected with location platform (102) of support frame (101), the bottom position fixedly connected with fixed gear (103) of location platform (102), fixed gear (103) are located the position directly over base (1), the upper and lower both ends of fixed gear (103) all are provided with the ring lug, and the ring lug block of fixed gear (103) is in the inside position around frame (2), the bottom position fixedly connected with extension frame (203) of around frame (2), the bottom position and the inside position fixed connection in interval frame (3) top of extension frame (203).
2. A vacuum high and low temperature probe station as claimed in claim 1, wherein: the middle position of the top of the winding frame (2) is fixedly connected with a motor A (201), and a rotating shaft at the bottom of the motor A (201) is fixedly connected with the middle position of the top of the movable gear (202).
3. A vacuum high and low temperature probe station as claimed in claim 2, wherein: the movable gear (202) is positioned in the inner position of the winding frame (2), and the movable gear (202) is meshed with the fixed gear (103).
4. A vacuum high and low temperature probe station as claimed in claim 1, wherein: a sliding groove is formed in the middle of the inside of the spacing frame (3), the spacing frame (3) is located above the base (1), and a motor B (301) is fixedly connected to the outer side of the spacing frame (3).
5. A vacuum high and low temperature probe station according to claim 4, wherein: the rotating shaft of the motor B (301) is fixedly connected with a threaded rod, and the threaded rod connected with the motor B (301) is positioned in the middle position inside the chute of the spacing frame (3).
6. A vacuum high and low temperature probe station according to claim 5, wherein: the space frame (3) sliding connection has movable frame (302) in the spout, and movable frame (302) are L shape design, and the screw hole has been seted up to the top position of movable frame (302), and the threaded rod that motor B (301) is connected is located the screw hole of movable frame (302), and the outside lower position of movable frame (302) is provided with detection probe (303).
CN202321887873.XU 2023-07-18 2023-07-18 Vacuum high-low temperature probe station Active CN220437601U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202321887873.XU CN220437601U (en) 2023-07-18 2023-07-18 Vacuum high-low temperature probe station

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202321887873.XU CN220437601U (en) 2023-07-18 2023-07-18 Vacuum high-low temperature probe station

Publications (1)

Publication Number Publication Date
CN220437601U true CN220437601U (en) 2024-02-02

Family

ID=89685884

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202321887873.XU Active CN220437601U (en) 2023-07-18 2023-07-18 Vacuum high-low temperature probe station

Country Status (1)

Country Link
CN (1) CN220437601U (en)

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