CN220419497U - PCB board testing arrangement - Google Patents

Abstract

The application discloses PCB board testing arrangement includes: the machine base is provided with a qualified placing area; the testing mechanism is arranged on the machine base and is provided with a positioning column and a positioning block, the positioning column is used for limiting the periphery of the PCB, the positioning column is abutted with the side wall of the PCB, the positioning block is symmetrically arranged on the diagonal line of the PCB, the positioning block is provided with a right-angle position, two corners of the diagonal position of the PCB are abutted with the right-angle position, the testing mechanism is provided with a probe, and the probe can be abutted with the PCB; the error-proofing sensors are arranged on one side of the base close to the qualified placing area at intervals and are electrically connected with the testing mechanism; and the alarm is respectively and electrically connected with the testing mechanism and the error-proofing sensor. The PCB testing device can avoid the undetected or unqualified PCB from being placed in the qualified placement area, improves the accuracy of PCB testing, reduces the cost, increases the testing range, improves the testing efficiency and improves the production efficiency.

Description

PCB board testing arrangement

Technical Field

The application relates to the technical field of PCB testing, in particular to a PCB testing device.

Background

The PCB is used as an important component in the development and production of an electronic system, and the quality of the PCB directly influences the quality of the whole equipment, so that the electrical performance of the PCB needs to be detected in the production process of the PCB. In the process of detecting the PCB, operators can easily cause inaccuracy in PCB detection and classification due to long-time work, for example, the undetected circuit board is placed in a qualified area for completing detection, the unqualified PCB is placed in a qualified PCB area, and the like, so that the accuracy of PCB detection is reduced, and the production cost of the PCB is increased.

Disclosure of Invention

The present application aims to solve at least one of the technical problems existing in the prior art. Therefore, the application provides a PCB board testing device, can avoid placing the undetected or unqualified PCB board in the qualified placement area, improve the accuracy of PCB board test, reduce cost, and test range increases, improves efficiency of software testing, improves production efficiency.

According to the PCB board testing device of the embodiment of the application, the device comprises: the machine base is provided with a qualified placing area; the testing mechanism is arranged on the base, the testing mechanism is provided with a positioning column and a positioning block, the positioning column is used for limiting the periphery of the PCB, the positioning column is abutted to the side wall of the PCB, the positioning block is symmetrically arranged on the diagonal line of the PCB, the positioning block is provided with a right-angle position, two corners of the diagonal position of the PCB are abutted to the right-angle position, and the testing mechanism is provided with a probe which can be abutted to the PCB; the error-proofing sensors are arranged on one side of the base close to the qualified placement area at intervals, and are electrically connected with the testing mechanism; and the alarm is respectively and electrically connected with the testing mechanism and the error-proof sensor.

According to the PCB testing device, at least the following beneficial effects are achieved: during testing, the PCB is placed on the testing mechanism, the periphery of the PCB is abutted with the positioning column, and two corners of the diagonal position of the PCB are abutted with the right-angle position on the positioning block, so that the quick positioning of the PCB is realized; then, the probe is abutted against the PCB to detect the state of the PCB, so that workers can conveniently distinguish the qualified and unqualified PCB; then detecting whether the PCB is placed in the qualified placement area by an error-proof sensor so as to monitor whether the PCB placed in the qualified placement area is correct; if the unqualified PCB is placed in the qualified placement area, the alarm gives an alarm to prompt the staff to place errors. Through adopting above-mentioned structure, can avoid placing the PCB board that does not detect or disqualified in the qualified district of placing, improve the accuracy of PCB board test, reduce cost. In addition, by the aid of the error-proofing sensors, when one of the error-proofing sensors is damaged, the rest error-proofing sensors can monitor, the testing range is enlarged, and the testing accuracy is improved; through be provided with the reference column around the PCB board in order to restrict the PCB board, be provided with simultaneously at the locating piece and be used for with the right angle position of two angle butt of PCB board diagonal position to can realize the quick location of PCB board, improve test efficiency, improve production efficiency.

According to the PCB board testing device, the testing mechanism comprises an upper testing component and a lower testing component, the upper testing component is arranged above the lower testing component in a lifting mode, the probe comprises an upper probe and a lower probe, the upper probe is arranged on the upper testing component, the lower probe is arranged on the lower testing component, the upper probe and the lower probe can be abutted to the PCB board, the positioning column and the positioning block are arranged on the lower testing component, the upper testing component is provided with a positioning hole and a positioning groove, and the positioning column and the positioning block are respectively embedded into the positioning hole and the positioning groove.

According to the PCB board testing device, the lower testing component comprises a bottom plate and a cover plate, the bottom plate is provided with a supporting column, the cover plate is arranged on the supporting column, the cover plate can slide up and down relative to the bottom plate, the lower probe is arranged on the bottom plate, the cover plate is provided with a through hole, and when the cover plate slides downwards along the supporting column, the lower probe extends out of the through hole.

According to the PCB testing device, a plurality of middle plates are arranged between the bottom plate and the cover plate, the middle plates are arranged at intervals, through holes are formed in the middle plates, and the lower probes penetrate through the through holes.

According to the PCB board testing device, the support column comprises a bottom column and a top column, the top column is located above the bottom column, the top column is connected with the bottom column through a spring, the bottom plate is connected with the bottom column, and the cover plate is connected with the top column.

According to the PCB testing device, the upper testing component and the lower testing component are identical in structure.

According to the PCB board testing device, the base comprises a base and a rack, the rack is arranged on the base, the rack is provided with a pressing plate in a lifting mode, the upper testing component is arranged on the pressing plate, and the lower testing component is arranged on the base.

Additional aspects and advantages of the application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application.

Drawings

The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings, wherein:

fig. 1 is a schematic structural diagram of a PCB board testing device according to an embodiment of the present application;

fig. 2 is a schematic structural diagram of a lower test component in the PCB board test apparatus according to the embodiment of the present application;

fig. 3 is a top view of a lower test assembly in the PCB board test apparatus according to the embodiment of the present application;

fig. 4 is a schematic structural diagram of a support column in the PCB board testing apparatus according to the embodiment of the present application.

Reference numerals illustrate:

a qualified placement area 110; a base 120; a frame 130; upright 140; a pressing plate 150; a cylinder 160; an upper test assembly 210; an upper probe 211; positioning holes 212; a positioning groove 213; a lower test assembly 220; a lower probe 221; positioning posts 222; a positioning block 223; right angle bit 224; a bottom plate 231; a cover 232; support columns 233; a through hole 234; a bottom post 235; a top post 236; a spring 237; an intermediate plate 238; a substrate 239; a locking piece 240; an error-proofing sensor 300; an alarm 400.

Detailed Description

Embodiments of the present application are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary only for the purpose of explaining the present application and are not to be construed as limiting the present application.

In the description of the present application, it should be understood that references to orientation descriptions, such as directions of up, down, front, back, left, right, etc., are based on the orientation or positional relationship shown in the drawings, are merely for convenience of describing the present application and simplifying the description, and do not indicate or imply that the apparatus or element referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application.

In the description of the present application, the meaning of a number is one or more, the meaning of a number is two or more, greater than, less than, exceeding, etc. are understood to not include the present number, and the meaning of a number above, below, within, etc. are understood to include the present number. The description of the first and second is for the purpose of distinguishing between technical features only and should not be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.

In the description of the present application, unless explicitly defined otherwise, terms such as arrangement, installation, connection, etc. should be construed broadly and the specific meaning of the terms in the present application can be reasonably determined by a person skilled in the art in combination with the specific contents of the technical solution.

Referring to fig. 1 to 4, an embodiment of the present application provides a PCB board testing device, including: the machine base is provided with a qualified placing area 110; the testing mechanism is arranged on the machine base and is provided with a positioning column 222 and a positioning block 223, the positioning column 222 is used for limiting the periphery of the PCB, the positioning column 222 is abutted against the side wall of the PCB, the positioning block 223 is symmetrically arranged on the diagonal line of the PCB, the positioning block 223 is provided with a right-angle position 224, two corners of the diagonal position of the PCB are abutted against the right-angle position 224, the testing mechanism is provided with a probe, and the probe can be abutted against the PCB; the error-proofing sensors 300 are arranged in a plurality, the error-proofing sensors 300 are arranged at intervals on one side of the base 120 close to the qualified placing area 110, and the error-proofing sensors 300 are electrically connected with the testing mechanism; the alarm 400 is electrically connected with the testing mechanism and the error-proofing sensor 300 respectively.

During testing, the PCB is placed on the testing mechanism, the periphery of the PCB is abutted with the positioning column 222, and two corners of the diagonal position of the PCB are abutted with the right-angle position 224 on the positioning block 223, so that the quick positioning of the PCB is realized; then, the probe is abutted against the PCB to detect the state of the PCB, so that workers can conveniently distinguish the qualified and unqualified PCB; then detecting whether the PCB is placed in the qualified placement area 110 by the error-proofing sensor 300 to monitor whether the PCB placed in the qualified placement area 110 is correct; if the unqualified PCB is placed in the qualified placement area 110, the alarm 400 gives an alarm to prompt the worker of the placement error. Through adopting above-mentioned structure, can avoid placing the PCB board that does not detect or disqualified in the qualified district of placing, improve the accuracy of PCB board test, reduce cost. In addition, by arranging the error-proofing sensors 300 and arranging a plurality of error-proofing sensors 300, when one of the error-proofing sensors 300 is damaged, the rest of the error-proofing sensors 300 can monitor, the testing range is enlarged, and the testing accuracy is improved; through be provided with reference column 222 in order to restrict the PCB board around the PCB board, be provided with simultaneously at locating piece 223 and be used for with the right angle position 224 of two angle butt of PCB board diagonal position to can realize the quick location of PCB board, improve test efficiency, improve production efficiency.

Referring to fig. 1, wherein the stand includes a base 120 and a frame 130. The stand 140 is disposed around the base 120, the stand 130 is located above the base 120, and the stand 130 is fixed on the stand 140. The frame 130 is provided with a pressing plate 150 in a lifting manner, the pressing plate 150 is located between the frame 130 and the base 120, and the pressing plate 150 can be close to or far from the base 120. It is conceivable that the frame 130 is provided with an air cylinder 160, the telescopic end of the air cylinder 160 is connected with the pressing plate 150, and the air cylinder 160 drives the pressing plate 150 to be close to or far from the base 120, so that the structure is simple and the work is stable. It is easy to understand that the pressing plate 150 is provided with a mounting hole, and the upright post 140 is penetrated through the mounting hole, so that the pressing plate 150 performs a lifting motion along the upright post 140, thereby improving the stability of the pressing plate 150.

Referring to fig. 1 to 3, the testing mechanism includes an upper testing assembly 210 and a lower testing assembly 220, and the upper testing assembly 210 is disposed on the pressing plate 150, so that the upper testing assembly 210 performs a lifting motion relative to the lower testing assembly 220. The probes comprise an upper probe 211 and a lower probe 221, the upper probe 211 is arranged on the upper test assembly 210, the lower probe 221 is arranged on the lower test assembly 220, the upper probe 211 and the lower probe 221 can be abutted against the PCB, the positioning column 222 and the positioning block 223 are arranged on the lower test assembly 220, the upper test assembly 210 is provided with a positioning hole 212 and a positioning groove 213, and the positioning column 222 and the positioning block 223 are respectively embedded into the positioning hole 212 and the positioning groove 213. Specifically, the pressing plate 150 drives the upper test assembly 210 to descend, so that the upper test assembly 210 and the lower test assembly 220 are close to each other, at this time, the positioning posts 222 are embedded in the positioning holes 212, and the positioning blocks 223 are embedded in the positioning slots 213, so as to ensure the stability of the upper test assembly 210 and the lower test assembly 220, and improve the test precision. Of course, the positioning column 222 and the positioning block 223 may also be disposed on the lower test assembly 220 through a telescopic mechanism, that is, when the upper test assembly 210 and the lower test assembly 220 are close to each other, the positioning column 222 and the positioning block 223 will retract into the lower test assembly 220, so that the stability of the upper test assembly 210 and the lower test assembly 220 can be ensured, and the test precision is improved.

Referring to fig. 1 to 4, the lower test assembly 220 includes a bottom plate 231 and a cover plate 232, the bottom plate 231 is provided with a support column 233, the cover plate 232 is disposed on the support column 233, the cover plate 232 can slide up and down relative to the bottom plate 231, the lower probe 221 is disposed on the bottom plate 231, the cover plate 232 is provided with a through hole 234, and the lower probe 221 extends out of the through hole 234 when the cover plate 232 slides down along the support column 233. Normally, the top surface of the lower probe 221 is lower than the upper surface of the cover plate 232. The PCB is placed above the cover plate 232 and is positioned by the positioning column 222 and the positioning block 223, and then when the cover plate 232 is stressed to slide downwards towards the bottom plate 231, the lower probe 221 extends out of the through hole 234, so that the lower probe can be abutted with the PCB; when the pressing plate 150 moves up away from the bottom plate 231, the probe returns to its original position, so that the lower probe 221 can be protected, and the service life of the probe can be prolonged. Specifically, the support column 233 includes a bottom column 235 and a top column 236, the top column 236 is located above the bottom column 235, the top column 236 and the bottom column 235 are connected by a spring 237, the bottom plate 231 is connected to the bottom column 235, and the cover plate 232 is connected to the top column 236. Through the structure, the cover plate 232 can slide up and down relative to the bottom plate 231, and the cover plate 232 can automatically reset, so that the structure is simple and the operation is simple. Further, in order to be provided with the connecting rod between the top pillar 236 and the bottom pillar 235 in a telescopic manner, the spring 237 is sleeved on the connecting rod, so that the spring 237 can be prevented from being cheap, and the stability can be improved. Of course, the cover plate 232 may be movably sleeved on the support column 233, and a compression spring is disposed between the cover plate 232 and the bottom plate 231; alternatively, the cover 232 is provided as an elastic material.

Referring to fig. 1 and 2, in some embodiments, a plurality of intermediate plates 238 are disposed between the bottom plate 231 and the cover plate 232, the intermediate plates 238 are disposed at intervals, the intermediate plates 238 are provided with through holes, and the lower probes 221 are disposed through the through holes. By providing a plurality of intermediate plates 238, a certain guiding action can be given to the lower probe 221, thereby improving the protection effect on the probe. It is contemplated that lower test assembly 220 further includes a base plate 239, base plate 239 being secured to the bottom of base plate 231, base plate 239 being fixedly coupled to base plate 120. Wherein, the base 120 is provided with a locking piece 240, and the locking piece 240 is pressed against the substrate 239, so that the lower test assembly 220 is fixed on the base 120, and the structure is simple and the operation is simple.

In the present embodiment, the upper test assembly 210 and the lower test assembly 220 have the same structure. The pressing plate 150 drives the upper test assembly 210 to descend so that the upper test assembly 210 and the lower test assembly 220 are close to each other, at this time, the upper test assembly 210 and the lower test assembly 220 are in compression joint with each other, the cover plate 232 moves close to the bottom plate 231, so that the upper probe 211 and the lower probe 221 respectively extend out of the through hole 234 and are in contact with the PCB board, and whether the upper probe 211, the lower probe 221 and the PCB board form a passage is determined, so that the qualified and unqualified PCB board is identified, namely: the upper probe 211, the lower probe 221 and the PCB form a via, which is a qualified PCB; the upper probe 211, the lower probe 221, and the PCB cannot form a path, which is a defective PCB.

In the description of the present specification, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

While embodiments of the present application have been shown and described, it will be understood by those of ordinary skill in the art that: many changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the application, the scope of which is defined by the claims and their equivalents.

Claims (7)

1. PCB board testing arrangement, its characterized in that includes:

   the machine base is provided with a qualified placing area;

   the testing mechanism is arranged on the base, the testing mechanism is provided with a positioning column and a positioning block, the positioning column is used for limiting the periphery of the PCB, the positioning column is abutted to the side wall of the PCB, the positioning block is symmetrically arranged on the diagonal line of the PCB, the positioning block is provided with a right-angle position, two corners of the diagonal position of the PCB are abutted to the right-angle position, and the testing mechanism is provided with a probe which can be abutted to the PCB;

   the error-proofing sensors are arranged on one side of the base close to the qualified placing area at intervals, and are electrically connected with the testing mechanism;

   and the alarm is respectively and electrically connected with the testing mechanism and the error-proof sensor.
2. 2. The device for testing the PCB according to claim 1, wherein the testing mechanism comprises an upper testing component and a lower testing component, the upper testing component is arranged above the lower testing component in a lifting manner, the probe comprises an upper probe and a lower probe, the upper probe is arranged on the upper testing component, the lower probe is arranged on the lower testing component, the upper probe and the lower probe can be abutted to the PCB, the positioning column and the positioning block are arranged on the lower testing component, the upper testing component is provided with a positioning hole and a positioning groove, and the positioning column and the positioning block are respectively embedded into the positioning hole and the positioning groove.
3. 3. The PCB testing apparatus of claim 2, wherein the lower testing assembly comprises a base plate and a cover plate, the base plate is provided with a support column, the cover plate is provided with the support column, the cover plate is slidable up and down relative to the base plate, the lower probe is provided with a through hole, and the cover plate extends out of the through hole when sliding down along the support column.
4. 4. The PCB testing device of claim 3, wherein a plurality of intermediate plates are disposed between the bottom plate and the cover plate, the intermediate plates are disposed at intervals, the intermediate plates are provided with through holes, and the lower probes are disposed through the through holes.
5. 5. The PCB testing device of claim 3, wherein the support column comprises a bottom column and a top column, the top column is located above the bottom column, the top column and the bottom column are connected by a spring, the bottom plate is connected with the bottom column, and the cover plate is connected with the top column.
6. 6. The PCB testing apparatus of claim 2, wherein the upper testing assembly and the lower testing assembly are identical in structure.
7. 7. The PCB testing apparatus of claim 6, wherein the chassis includes a base and a frame, the frame is disposed on the base, a pressing plate is disposed on the frame in a lifting manner, the upper testing assembly is disposed on the pressing plate, and the lower testing assembly is disposed on the base.