CN220399591U - Crystal cover packaging relay testing tool realized by spring probe - Google Patents

Crystal cover packaging relay testing tool realized by spring probe Download PDF

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Publication number
CN220399591U
CN220399591U CN202321929101.8U CN202321929101U CN220399591U CN 220399591 U CN220399591 U CN 220399591U CN 202321929101 U CN202321929101 U CN 202321929101U CN 220399591 U CN220399591 U CN 220399591U
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China
Prior art keywords
spring probe
relay
area
crystal
welding
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Application number
CN202321929101.8U
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Chinese (zh)
Inventor
周文武
金霞
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China Aeronautical Radio Electronics Research Institute
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China Aeronautical Radio Electronics Research Institute
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Abstract

The utility model discloses a test fixture for a crystal cover packaging relay realized by a spring probe, wherein a spring probe area, a PCB wiring area and an external interface area are arranged on a PCB; in the spring probe area, setting a spring probe welding point position (4) according to the size, the pin number and the definition of a relay of a crystal cover, and welding a spring probe (1) on the spring probe welding point position; welding an interface connector (5) on the external interface region, the interface connector being for cross-linking with the test device; in the PCB wiring area, the spring probe welding points (4) are communicated with the interface connector (5) through metal interconnection wiring. The utility model can be effectively contacted with the crystal cover packaging relay through pressing operation, is convenient to test, meets the requirements of contact property and convenience, and gives consideration to the compatibility problems of pin pins, welding hook pins and the like, so that the utility model has the advantages of good practicality, good compatibility, high efficiency and low cost.

Description

Crystal cover packaging relay testing tool realized by spring probe
Technical Field
The utility model relates to a tool of a spring probe in the field of testing of crystal cover packaging relays, in particular to a pressing type contact testing tool which can be applied to testing of electric performance parameters of crystal cover packaging relays of various different series specifications.
Background
In order to improve the reliability of certain electronic products, especially electronic products which relate to national security and have great influence on public life and property security, and improve the service life of the electronic products, a series of detection screening tests such as electric performance detection are carried out on the electronic products before the electronic products use a crystal cover to encapsulate electronic components such as a relay and the like so as to remove early failure products.
When the electrical performance parameter test is carried out on the crystal cover packaging relay, the pins of the crystal cover packaging relay are required to be connected with test equipment. However, in view of the limitations of the special appearance structure of the crystal cover packaging relay, the application quantity is small, and the like, the special shelf tool on the market is almost absent. At present, when testing, each crystal cover packaging relay needs to be manually hooked (testing hook feet and the like), the testing efficiency is low, and manual misoperation is easy to occur. Therefore, the spring probe can be used for manufacturing the test tool on the premise of meeting the test accuracy, so that the test safety and the test efficiency are improved.
Disclosure of Invention
The utility model aims to provide a test fixture for a crystal hood packaging relay, which is realized by a spring probe and is used for realizing the test work of electric performance parameters of the crystal hood packaging relay with different model names, and solving the defects of hook pin test existing at present on the premise of ensuring the test accuracy, safety and efficiency.
The utility model aims at realizing the following technical scheme:
a crystal cover packaging relay testing tool realized by a spring probe takes a PCB as a carrier, and a spring probe area, a PCB wiring area and an external interface area are arranged on the PCB;
in the spring probe area, a spring probe welding point position 4 is set according to the size, the pin number and the definition of a relay of a crystal cover, and a spring probe 1 is welded on the spring probe welding point position;
welding an interface connector 5 on the external interface region, the interface connector being for cross-linking with the test equipment;
in the PCB routing area, the spring probe soldering sites are connected to the interface connector 5 by metal interconnect routing.
Preferably, a 1-foot identification point position 2 is further arranged in the spring probe region, and the crystal cover packaging relay is aligned with the spring probe according to the 1-foot identification point position 2.
Preferably, the external interface region is provided with a concave-convex structure for preventing an insertion error.
Preferably, the interface connector 5 is a T-connector.
Preferably, a relay product model name identifier 3 can be further arranged in the PCB wiring area.
The utility model has the beneficial effects that:
1. according to different sizes of the crystal cover packaging relay (such as a crystal cover, a 1/2 crystal cover, a 1/4 crystal cover, a 1/5 crystal cover and the like), corresponding spring probes are distributed, arranged and distributed according to different types of pin definitions, the crystal cover packaging relay pins are connected with a testing tool through pressing operation, and the testing equipment can be used for testing electrical performance parameters.
2. The interface connector can be connected with different test devices, and by matching different interface connectors, different types of test devices can be adapted.
3. The spring probe can be in effective contact with the crystal cover packaging relay through pressing operation, the test is convenient, the requirements of contact and convenience are met, and compatibility problems such as contact pin type pins and welding hook type pins are considered, so that the spring probe is good in practicality, high in compatibility, low in cost and easy to popularize and apply, and has a large practical value.
Drawings
FIG. 1 is a schematic diagram of a test fixture.
Fig. 2 is a detailed design structure diagram of the present utility model.
Wherein, 1-spring probe, 2-1 footmark sign, 3-relay product model name sign, 4-spring probe welding point position, 5-interface connector, 6-misinsertion prevention design.
Detailed Description
The utility model is described in further detail below with reference to the drawings and examples.
The utility model provides a test fixture for a crystal hood packaging relay, which is realized by using a spring probe, as shown in fig. 1, wherein a PCB (printed circuit board) is used as a main carrier, and a spring probe area, a PCB wiring area and an external interface area are arranged on the PCB.
As shown in fig. 2, in the spring probe area, spring probe welding points 4 are set according to the size, the number of pins and the definition of the crystal cover relay, and spring probes 1 are welded on the spring probe welding points, so that the spring probes can be contacted with the pins of the crystal cover relay. In addition, a 1-foot identification point position 2 can be arranged in the spring probe region, and the crystal cover packaging relay is aligned with the spring probe according to the 1-foot identification point position 2.
On the external interface area an interface connector 5 is soldered, which interface connector is used for cross-linking with the test equipment. Misplug prevention designs 6, such as male-female structures or T-connectors, can also be used on the external interface area, such as where the test equipment is inserted in a direction that is not aligned and cannot be effectively inserted.
In the PCB wiring area, the spring probe welding point is communicated with the interface connector 5 through metal interconnection wiring to form a test fixture. A relay product model name identifier 3 can also be set in the PCB routing area. Because the crystal cover relay of a product model corresponds to different test tools due to different sizes, pin numbers, definitions and the like, the product type of the crystal cover relay applicable to the test tools can be identified through the name identification 3 of the relay product model.
When the test device is used, the interface connector 5 is connected with corresponding test equipment, the crystal cover packaging relay and the spring probe are aligned according to the 1-foot identification point position 2, press connection is carried out, and electrical performance test is carried out by controlling the test equipment, so that the test efficiency is improved, and the operation strength is reduced.
When the electrical performance test is performed on the crystal hood packaging relay, referring to a detailed design structure diagram of the spring probe test fixture shown in fig. 2, the following steps are executed:
1. selecting a proper test tool according to the model name and the appearance configuration of a product of the relay to be tested;
2. connecting the interface connector 5 with test equipment to finish the crosslinking of the test equipment and the test tool;
3. checking 1-foot identification point positions 2 according to the layout definition of the pins of the relay to be tested, aligning the pins of the relay with the spring probes 1, and connecting the spring probes 1 with the relay through push type contact;
4. the electrical performance test is carried out through the test equipment, when the relays with the same model name are tested, the device to be tested is replaced through the push type operation, and the connection between the external interface and the test equipment is not required to be changed.
It will be understood that equivalents and modifications will occur to those skilled in the art in light of the present utility model and their spirit, and all such modifications and substitutions are intended to be included within the scope of the present utility model as defined in the following claims.

Claims (5)

1. A crystal cover packaging relay test fixture realized by a spring probe takes a PCB as a carrier and is characterized in that a spring probe area, a PCB wiring area and an external interface area are arranged on the PCB;
in the spring probe area, setting a spring probe welding point position (4) according to the size, the pin number and the definition of a relay of a crystal cover, and welding a spring probe (1) on the spring probe welding point position;
welding an interface connector (5) on the external interface region, the interface connector being for cross-linking with the test device;
in the PCB wiring area, the spring probe welding points (4) are communicated with the interface connector (5) through metal interconnection wiring.
2. The test fixture for the crystal hood packaging relay realized by the spring probe according to claim 1 is characterized in that a 1-foot identification point position (2) is further arranged in the spring probe area, and the crystal hood packaging relay is aligned with the spring probe according to the 1-foot identification point position (2).
3. The test fixture for the crystal hood encapsulation relay realized by the spring probe according to claim 1, wherein the external interface area is provided with a concave-convex structure for preventing the insertion error.
4. The test fixture for the crystal hood encapsulation relay realized by the spring probe according to claim 1, wherein the interface connector (5) is a T-shaped connector.
5. The test fixture for the crystal hood encapsulation relay realized by the spring probe according to claim 1 is characterized in that a relay product model name mark (3) is further arranged in a PCB wiring area.
CN202321929101.8U 2023-07-21 2023-07-21 Crystal cover packaging relay testing tool realized by spring probe Active CN220399591U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202321929101.8U CN220399591U (en) 2023-07-21 2023-07-21 Crystal cover packaging relay testing tool realized by spring probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202321929101.8U CN220399591U (en) 2023-07-21 2023-07-21 Crystal cover packaging relay testing tool realized by spring probe

Publications (1)

Publication Number Publication Date
CN220399591U true CN220399591U (en) 2024-01-26

Family

ID=89609861

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202321929101.8U Active CN220399591U (en) 2023-07-21 2023-07-21 Crystal cover packaging relay testing tool realized by spring probe

Country Status (1)

Country Link
CN (1) CN220399591U (en)

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