CN220359153U - Signal receiving and transmitting device of automatic testing machine and automatic testing machine - Google Patents

Abstract

The present disclosure relates to the field of automated semiconductor testing, and in particular, to a signal transceiver of an automatic testing machine and an automatic testing machine. The device comprises: the two local oscillation modules are respectively used for generating multipath local oscillation signals; the two paths of signal transmitting links are respectively and correspondingly connected with the local oscillation modules and are respectively used for receiving one path of local oscillation signals and then outputting multiple paths of radio frequency signals; the logic interface module is connected with the two paths of signal transmitting links and is used for receiving the multipath radio frequency signals, outputting multipath test signals to a plurality of tested devices through processing and receiving feedback signals of the plurality of tested devices; and the multipath signal demodulation links are respectively connected with the logic interface module and the two local oscillation modules and are respectively used for demodulating the feedback signals according to one path of local oscillation signals after receiving multipath feedback signals. The technical scheme saves the number of the local oscillation modules, thereby saving the cost and the space of the automatic testing machine.

Description

Signal receiving and transmitting device of automatic testing machine and automatic testing machine

Technical Field

The present disclosure relates to the field of automated semiconductor testing, and in particular, to a signal transceiver of an automatic testing machine and an automatic testing machine.

Background

The automatic semiconductor test refers to that an automatic tester (Automatic Test Equipment, ATE) is used for detecting various parameter indexes of a tested device (Device Under Test, DUT) and removing defective products to control the factory quality of the semiconductor device. Automatic testers typically require testing of multiple devices under test simultaneously.

The automatic testing machine in the prior art comprises a plurality of local oscillation modules, specifically two local oscillation modules are needed for each tested device, one local oscillation module generates local oscillation signals which are processed into test signals and output to the tested device, and the other local oscillation module generates local oscillation signals which are used for demodulating feedback signals of the tested device. And because the automatic tester needs to test a plurality of tested devices at the same time, a large number of local oscillation modules are needed, so that the cost of the automatic tester is increased, and the space of the automatic tester is occupied.

Disclosure of Invention

Accordingly, it is desirable to provide a signal transceiver of an automatic testing machine and an automatic testing machine for solving the above-mentioned problems.

In a first aspect, an embodiment of the present utility model provides a signal transceiver of an automatic testing machine, where the signal transceiver includes:

the two local oscillation modules are respectively used for generating multipath local oscillation signals;

the two paths of signal transmitting links are respectively and correspondingly connected with the local oscillation modules and are respectively used for receiving one path of local oscillation signals and then outputting multiple paths of radio frequency signals;

the logic interface module is connected with the two paths of signal transmitting links and is used for receiving the multipath radio frequency signals, outputting multipath test signals to a plurality of tested devices through processing and receiving feedback signals of the plurality of tested devices;

and the multipath signal demodulation links are respectively connected with the logic interface module and the two local oscillation modules and are respectively used for demodulating the feedback signals according to one path of local oscillation signals after receiving multipath feedback signals.

In an embodiment, the local oscillator module includes:

the vibration source is used for generating a local oscillation signal;

the first power divider is connected with the local oscillator source and is used for receiving one path of local oscillator signals and then outputting two paths of local oscillator signals;

and the second power divider is connected with the first power divider and is used for receiving one local oscillation signal output by the first power divider and then outputting multiple local oscillation signals.

In an embodiment, the signal transmission link comprises:

the signal modulation link is correspondingly connected with the local oscillation module and is used for selecting whether to modulate the local oscillation signal and outputting a radio frequency signal;

and the third power divider is connected with the signal modulation link and outputs multiple paths of radio frequency signals after receiving the radio frequency signals.

In an embodiment, the signal modulation link includes a first switch, a signal modulation module, and a second switch that are sequentially connected;

the first change-over switch and the second change-over switch are matched to control whether the signal modulation module is connected or not so as to select whether the local oscillation signal is modulated or not.

In one embodiment, the logic interface module includes:

the first power control modules are respectively connected with one path of signal transmitting links and are respectively used for receiving one path of radio frequency signals and outputting test signals after power control;

and the channel selection modules are respectively connected with the first power control modules and are respectively used for receiving the test signals and selecting corresponding channels to output to the tested device and receiving feedback signals of the tested device and selecting corresponding channels to output.

In an embodiment, the logic interface module further comprises:

the multi-path voice combining link is respectively connected between the two first power control modules and one channel selection module, and the two first power control modules are respectively connected with the two signal transmitting links and are respectively used for selecting whether to combine two paths of test signals and then output the two paths of test signals to the channel selection module.

In an embodiment, the synthesizing link further includes:

the sound combination module is connected with the channel selection module and is used for outputting the two paths of test signals to the channel selection module after combining the sound;

the input end of the third change-over switch is connected with one first power control module, the output end of the third change-over switch is connected with the sound combination module and the channel selection module, and the third change-over switch is used for selecting and outputting the test signal to the sound combination module or the channel selection module;

and the input end of the fourth change-over switch is connected with the other first power control module, and the output end of the fourth change-over switch is connected with the sound combination module and the channel selection module and is used for selecting and outputting the test signal to the sound combination module or the channel selection module.

In one embodiment, the signal demodulation link includes:

a fifth change-over switch connected with the two local oscillation modules and used for selecting and receiving one local oscillation signal;

and the signal demodulation module is connected with the fifth change-over switch and the logic interface module and is respectively used for demodulating the feedback signals according to one path of local oscillation signals after receiving multiple paths of feedback signals.

In an embodiment, the signal demodulation link further comprises:

and the second power control module is connected with the logic interface module and the signal demodulation module and is used for receiving the feedback signals in multiple paths, controlling the power and outputting the feedback signals to the signal demodulation module.

In a second aspect, an embodiment of the present utility model provides an automatic testing machine, including a signal transceiver according to the first aspect, and an upper computer connected to the signal transceiver, where the upper computer is configured to obtain a test result of each device under test according to a demodulated feedback signal.

Compared with the prior art, the technical scheme has the following technical effects: and the logic interface module is used for processing and outputting the multi-path radio frequency signals to the multi-path radio frequency signals, so that the multi-path test signals are transmitted. And then, receiving feedback signals of a plurality of tested devices through a logic interface module, and demodulating the feedback signals through a multipath signal demodulation link according to one path of local oscillation signals respectively, thereby completing the receiving and demodulation of the feedback signals. Compared with the prior art, the method and the device have the advantages that the number of local oscillation modules is reduced, and therefore the cost and the space of an automatic testing machine are reduced.

Drawings

Fig. 1 is a schematic connection diagram of a signal transceiver according to an embodiment of the present utility model;

fig. 2 is a schematic connection diagram of a local oscillation module according to an embodiment of the present utility model;

fig. 3 is a schematic connection diagram of a signal transmission link according to an embodiment of the present utility model;

FIG. 4 is a schematic diagram illustrating connection of a logic interface module according to an embodiment of the present utility model;

FIG. 5 is a schematic diagram illustrating connection of a logic interface module according to another embodiment of the present utility model;

fig. 6 is a schematic connection diagram of a signal demodulation link according to an embodiment of the present utility model;

fig. 7 is a schematic connection diagram of a signal demodulation link according to another embodiment of the present utility model;

fig. 8 is a schematic connection diagram of a signal transceiver according to an exemplary embodiment of the present utility model;

fig. 9 is a schematic connection diagram of an automatic test machine according to an embodiment of the utility model.

The device comprises a signal receiving and transmitting device, a signal receiving and transmitting device and a signal transmitting device, wherein 1; 2. an upper computer; 10. a local oscillation module; 20. a signal transmission link; 30. a logic interface module; 40. a signal demodulation link; 101. the vibration source; 102. a first power divider; 103. a second power divider; 201. a signal modulation link; 202. a third power divider; 2011. a first changeover switch; 2012. a signal modulation module; 2013. a second change-over switch; 301. a first power control module; 302. a channel selection module; 303. a voice combining link; 3031. a sound combining module; 3032. a third change-over switch; 3033. a fourth change-over switch; 401. a fifth changeover switch; 402. a signal demodulation module; 403. and the second power control module.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.

It is apparent that the drawings in the following description are only some examples or embodiments of the present application, and it is possible for those of ordinary skill in the art to apply the present application to other similar situations according to these drawings without inventive effort. Moreover, it should be appreciated that while such a development effort might be complex and lengthy, it would nevertheless be a routine undertaking of design, fabrication, or manufacture for those of ordinary skill having the benefit of this disclosure, and thus should not be construed as having the benefit of this disclosure.

Reference in the specification to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is to be expressly and implicitly understood by those of ordinary skill in the art that the embodiments described herein can be combined with other embodiments without conflict.

Unless defined otherwise, technical or scientific terms used herein should be given the ordinary meaning as understood by one of ordinary skill in the art to which this application belongs. Reference to "a," "an," "the," and similar terms herein do not denote a limitation of quantity, but rather denote the singular or plural. The terms "comprising," "including," "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, article, or apparatus that comprises a list of steps or modules (elements) is not limited to only those steps or elements but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus. The terms "connected," "coupled," and the like in this application are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The term "plurality" as used herein refers to two or more. "and/or" describes an association relationship of an association object, meaning that there may be three relationships, e.g., "a and/or B" may mean: a exists alone, A and B exist together, and B exists alone. The character "/" generally indicates that the context-dependent object is an "or" relationship. The terms "first," "second," "third," and the like, as used herein, are merely distinguishing between similar objects and not representing a particular ordering of objects.

As shown in fig. 1, an embodiment of the present utility model provides a signal transceiver of an automatic testing machine, where the signal transceiver includes: two local oscillation modules 10, which are respectively used for generating multipath local oscillation signals; two signal transmitting links 20, which are respectively connected with the local oscillation module 10 correspondingly, and are respectively used for receiving one local oscillation signal and outputting multiple paths of radio frequency signals; the logic interface module 30 is connected with the two paths of signal transmitting links 20, and is used for receiving the multipath radio frequency signals, outputting multipath test signals to a plurality of tested devices after processing, and receiving feedback signals of the plurality of tested devices; and the multipath signal demodulation link 40 is respectively connected with the logic interface module 30 and the two local oscillation modules 10, and is respectively used for demodulating the feedback signals according to one path of local oscillation signals after receiving multipath feedback signals.

It will be appreciated that the automatic tester supports simultaneous testing of multiple devices under test, but that in actual testing use, each device under test is identical to the test signal of the automatic tester.

Wherein multiple signal demodulation links 40 can demodulate multiple feedback signals in parallel. The number of signal demodulation links 40 may be determined based on the number of devices under test that can be tested by the automatic tester at one time. For example, an automatic tester can test 4 devices under test simultaneously, with 4 signal demodulation links 40 at a time.

Based on this, in this embodiment, multiple local oscillation signals are generated by two local oscillation modules 10 respectively, multiple radio frequency signals are processed and output by two signal transmission links 20 respectively for one local oscillation signal, and multiple test signals are processed and output by a logic interface module 30 for multiple radio frequency signals, so as to complete the transmission of multiple test signals. And then, the logic interface module 30 receives feedback signals of a plurality of tested devices, and the multipath signal demodulation link 40 demodulates the feedback signals according to one path of local oscillation signals respectively, so that the feedback signals are received and demodulated. Compared with the prior art, the embodiment saves the number of the local oscillation modules 10, thereby saving the cost and the space of the automatic testing machine.

In the prior art, one signal transmitting link 20 is required for each output test signal, and when multiple paths of test signals are required, multiple paths of signal transmitting links 20 are required, and in the embodiment, multiple paths of signal transmitting links 20 can be output only by two paths of signal transmitting links 20.

In one embodiment, as shown in fig. 2, the local oscillation module 10 includes: the local oscillation source 101 is used for generating a local oscillation signal; the first power divider 102 is connected with the local oscillation source 101 and is used for receiving one path of local oscillation signals and then outputting two paths of local oscillation signals; the second power divider 103 is connected to the first power divider 102, and is configured to receive one local oscillation signal output by the first power divider 102 and output multiple local oscillation signals.

The first power divider 102 divides one local oscillation signal power outputted by the local oscillation source 101 into two local oscillation signals, one local oscillation signal power is outputted to the signal transmitting link 20, the other local oscillation signal power is outputted to the second power divider 103, and the local oscillation signals are divided into multiple local oscillation signals through the second power divider 103.

The model number of the second power divider 103 may be determined according to the number of tested devices that can be tested by the automatic tester at one time. For example, the automatic tester can test 4 devices under test simultaneously at a time, and the second power divider 103 is a one-to-four power divider.

In this embodiment, a power division manner is adopted to divide one local oscillation signal generated by two local oscillation sources 101 into multiple local oscillation signals, so that compared with the prior art, the number of local oscillation sources 101 is saved.

In one embodiment, as shown in fig. 3, the signal transmission link 20 includes: the signal modulation link 201 is correspondingly connected with the local oscillation module 10, and is used for selecting whether to modulate the local oscillation signal and outputting a radio frequency signal; and the third power divider 202 is connected with the signal modulation link 201, receives the radio frequency signals and outputs multiple paths of radio frequency signals.

The signal modulation link 201 may select whether to modulate the local oscillation signal and output the radio frequency signal according to the requirement. When the local oscillation signal is selected to be modulated, the local oscillation signal is modulated, processed and a radio frequency signal is output; when the local oscillation signal is not modulated, the local oscillation signal is not modulated and a radio frequency signal is output, and the radio frequency signal is the local oscillation signal under the condition.

The model of the third power divider 202 may also be determined according to the number of tested devices that can be tested by the automatic tester at a time.

In this embodiment, the third power divider 202 divides one path of radio frequency signal into multiple paths of radio frequency signals, so as to realize simultaneous testing of multiple devices under test.

Specifically, the signal modulation link 201 includes a first switch 2011, a signal modulation module 2012, and a second switch 2013 that are sequentially connected; the first switch 2011 and the second switch 2013 cooperate to control whether the signal modulation module 2012 is connected to select whether to modulate the local oscillation signal.

The first switch 2011 and the second switch 2013 are two-way selector switches, one of which is connected to the signal modulation module 2012, and the other of which is a direct communication path. Under the condition that the local oscillation signal needs to be modulated, the first switch 2011 and the second switch 2013 are connected in cooperation with the control signal modulation module 2012; under the condition that the local oscillation signal does not need to be modulated, the first switch 2011 and the second switch 2013 cooperate to control the direct communication path to be connected.

In one embodiment, as shown in FIG. 4, the logic interface module 30 includes: the first power control modules 301 are respectively connected with one of the signal transmitting links 20, and are respectively used for receiving one of the radio frequency signals and outputting test signals after power control; the multiple channel selection modules 302 are respectively connected with the multiple first power control modules 301, and are respectively configured to receive the multiple test signals, select corresponding channels to output to the device under test, and receive feedback signals of the device under test, and select corresponding channels to output.

Considering that the power of the radio frequency signal may not meet the test requirement, the power of the radio frequency signal is controlled by the first power control module 301 to meet the test requirement.

The number of the first power control modules 301 may be determined according to the model number of the third power splitters 202, and assuming that the third power splitters 202 are quarter-split power splitters, the two third power splitters 202 output 8 radio frequency signals in total, so the number of the first power control modules 301 is 8.

The channel selection module 302 may implement selection of an output channel to implement selection of an output test signal to test a corresponding device under test.

The number of channel selection modules 302 may be determined according to the number of devices under test that can be tested by the automatic tester at one time. For example, an automatic tester can test 4 devices under test at a time, with 4 channel selection modules 302.

The channel selection module 302 includes, for example, a first channel selection module for selecting an output test signal and a second channel selection module for selecting a corresponding device under test.

In some test requirements it is desirable to test the device under test with a two-tone test signal. To meet this test requirement, in one embodiment, as shown in fig. 5, the logic interface module 30 further includes: the multipath voice combining link 303 is respectively connected between the two first power control modules 301 and one channel selection module 302, where the two first power control modules 301 are respectively connected with the two signal transmitting links 20 and are respectively used for selecting whether to combine two paths of test signals and then output the combined signals to the channel selection module 302.

Specifically, the synthesizing link 303 further includes: the sound combining module 3031 is connected with the channel selecting module 302 and is used for outputting the two paths of test signals to the channel selecting module 302 after combining the sound; the third switch 3032 has an input end connected to the first power control module 301, and an output end connected to the synthesizing module 3031 and the channel selection module 302, for selecting to output the test signal to the synthesizing module 3031 or the channel selection module 302; the input end of the fourth switch 3033 is connected to another first power control module 301, and the output end of the fourth switch is connected to the synthesizing module 3031 and the channel selection module 302, so as to selectively output the test signal to the synthesizing module 3031 or the channel selection module 302.

The third switch 3032 and the fourth switch 3033 are two-way selection switches, one way directly outputs a single-tone test signal to the channel selection module 302, and the other way of output value tone combination module 3031 combines two ways of test signals, and the two ways of test signals respectively correspond to the two local oscillation modules 10.

Under the condition that the test signals need to be combined, the third switch 3032 and the fourth switch 3033 cooperatively control the two paths of test signals to be output to the sound combination module 3031 for sound combination; in the case that the test signals do not need to be combined, the third switch 3032 and the fourth switch 3033 respectively control the test signals to be directly output to the channel selection module 302.

In one embodiment, as shown in fig. 6, the signal demodulation link 40 includes: a fifth switch 401, connected to the two local oscillation modules 10, for selectively receiving one local oscillation signal; and the signal demodulation module 402 is connected to the fifth switch 401 and the logic interface module 30, and is configured to demodulate the feedback signals according to one of the local oscillation signals after receiving multiple paths of feedback signals.

The fifth switch 401 is a two-way selection switch, and is connected to the two local oscillation modules 10, and selects to receive one local oscillation signal according to the demodulation requirement, so as to select that the local oscillation signal and the feedback signal do not share a common local oscillation.

Further, as shown in fig. 7, the signal demodulation link 40 further includes: the second power control module 403 is connected to the logic interface module 30 and the signal demodulation module 402, and is configured to receive the multiple feedback signals, control power, and output the power to the signal demodulation module 402.

The power of the feedback signal is controlled by the second power control module 403 to meet the demodulation requirement, considering that the power of the feedback signal may not meet the demodulation requirement.

In an exemplary embodiment, as shown in fig. 8, the signal transceiver includes two local oscillation modules 10, two signal transmission links 20, a logic interface module 30, and four signal demodulation links 40. Each local oscillation module 10 includes a local oscillation source 101, a first power divider 102 of one-to-two and a second power divider 103 of one-to-four. Each signal transmission link 20 includes a first switch 2011, a signal modulation module 2012, a second switch 2013, and a third power divider 202 of one-fourth. The logic interface module 30 comprises 8 first power control modules 301, 4-way voice combining links 303 and 4 channel selection modules 302. Each of the voice combining links 303 includes a third switch 3032, a fourth switch 3033, and a voice combining module 3031. The signal demodulation link 40 includes a fifth switch 401, a signal demodulation module 402, and a second power control module 403.

Compared with the prior art, 6 local oscillation modules and 2 signal modulation modules are saved, and the architecture of the signal transceiver is easy to expand.

In an embodiment, as shown in fig. 9, the present utility model further provides an automatic testing machine, which includes the signal transceiver 1 in the above embodiment, and the host computer 2 connected to the signal transceiver, where the host computer 2 is configured to obtain a test result of each device under test according to the demodulated feedback signal.

It should be noted that, the test result of each tested device obtained by the upper computer according to the demodulated feedback signal is in the prior art, so that no further description is needed in this embodiment.

It should be further noted that the signal transceiver has been described in detail in the above embodiments, and thus will not be described in detail in this embodiment. Since the automatic test machine includes the signal transceiver in the above embodiment, the same technical effects are achieved.

The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The above examples merely represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the utility model. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application is to be determined by the claims appended hereto.

Claims (10)

1. A signal transceiver device of an automatic test machine, said device comprising:

the two local oscillation modules are respectively used for generating multipath local oscillation signals;

the two paths of signal transmitting links are respectively and correspondingly connected with the local oscillation modules and are respectively used for receiving one path of local oscillation signals and then outputting multiple paths of radio frequency signals;

the logic interface module is connected with the two paths of signal transmitting links and is used for receiving the multipath radio frequency signals, outputting multipath test signals to a plurality of tested devices through processing and receiving feedback signals of the plurality of tested devices;

and the multipath signal demodulation links are respectively connected with the logic interface module and the two local oscillation modules and are respectively used for demodulating the feedback signals according to one path of local oscillation signals after receiving multipath feedback signals.

2. The signal transceiving apparatus of an automatic test machine according to claim 1, wherein said local oscillator module comprises:

the vibration source is used for generating a local oscillation signal;

the first power divider is connected with the local oscillator source and is used for receiving one path of local oscillator signals and then outputting two paths of local oscillator signals;

and the second power divider is connected with the first power divider and is used for receiving one local oscillation signal output by the first power divider and then outputting multiple local oscillation signals.

3. The signal transceiving apparatus of an automatic test machine according to claim 1, wherein said signal transmission link comprises:

the signal modulation link is correspondingly connected with the local oscillation module and is used for selecting whether to modulate the local oscillation signal and outputting a radio frequency signal;

and the third power divider is connected with the signal modulation link and outputs multiple paths of radio frequency signals after receiving the radio frequency signals.

4. The signal transceiver of the automatic test machine according to claim 3, wherein the signal modulation link comprises a first change-over switch, a signal modulation module and a second change-over switch which are sequentially connected;

the first change-over switch and the second change-over switch are matched to control whether the signal modulation module is connected or not so as to select whether the local oscillation signal is modulated or not.

5. The signaling apparatus of an automatic test machine of claim 1 wherein said logic interface module comprises:

the first power control modules are respectively connected with one path of signal transmitting links and are respectively used for receiving one path of radio frequency signals and outputting test signals after power control;

and the channel selection modules are respectively connected with the first power control modules and are respectively used for receiving the test signals and selecting corresponding channels to output to the tested device and receiving feedback signals of the tested device and selecting corresponding channels to output.

6. The signaling apparatus of an automatic test machine of claim 5 wherein said logic interface module further comprises:

the multi-path voice combining link is respectively connected between the two first power control modules and one channel selection module, and the two first power control modules are respectively connected with the two signal transmitting links and are respectively used for selecting whether to combine two paths of test signals and then output the two paths of test signals to the channel selection module.

7. The signal transceiver device of automatic test equipment of claim 6, wherein said voice combining link further comprises:

the sound combination module is connected with the channel selection module and is used for outputting the two paths of test signals to the channel selection module after combining the sound;

the input end of the third change-over switch is connected with one first power control module, the output end of the third change-over switch is connected with the sound combination module and the channel selection module, and the third change-over switch is used for selecting and outputting the test signal to the sound combination module or the channel selection module;

and the input end of the fourth change-over switch is connected with the other first power control module, and the output end of the fourth change-over switch is connected with the sound combination module and the channel selection module and is used for selecting and outputting the test signal to the sound combination module or the channel selection module.

8. The signal transceiving apparatus of an automatic test machine according to claim 1, wherein said signal demodulation link comprises:

a fifth change-over switch connected with the two local oscillation modules and used for selecting and receiving one local oscillation signal;

and the signal demodulation module is connected with the fifth change-over switch and the logic interface module and is respectively used for demodulating the feedback signals according to one path of local oscillation signals after receiving multiple paths of feedback signals.

9. The signal transceiving apparatus of an automatic test machine according to claim 8, wherein said signal demodulation link further comprises:

and the second power control module is connected with the logic interface module and the signal demodulation module and is used for receiving the feedback signals in multiple paths, controlling the power and outputting the feedback signals to the signal demodulation module.

10. An automatic testing machine, characterized by comprising the signal transceiver according to any one of claims 1 to 9, and an upper computer connected to the signal transceiver, wherein the upper computer is used for obtaining the test result of each tested device according to the demodulated feedback signal.