CN220305347U - Equipment for high-low temperature test of electronic industrial equipment - Google Patents
Equipment for high-low temperature test of electronic industrial equipment Download PDFInfo
- Publication number
- CN220305347U CN220305347U CN202321905456.3U CN202321905456U CN220305347U CN 220305347 U CN220305347 U CN 220305347U CN 202321905456 U CN202321905456 U CN 202321905456U CN 220305347 U CN220305347 U CN 220305347U
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- insulation
- ventilation
- plate
- insulation box
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- 238000012360 testing method Methods 0.000 title claims abstract description 35
- 238000009413 insulation Methods 0.000 claims abstract description 76
- 238000009423 ventilation Methods 0.000 claims abstract description 38
- 239000004065 semiconductor Substances 0.000 claims abstract description 23
- 238000005485 electric heating Methods 0.000 claims abstract description 19
- 238000005192 partition Methods 0.000 claims description 30
- 238000010438 heat treatment Methods 0.000 claims description 17
- 238000004321 preservation Methods 0.000 claims description 10
- 229910003460 diamond Inorganic materials 0.000 claims description 3
- 239000010432 diamond Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 5
- 238000000034 method Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 208000001034 Frostbite Diseases 0.000 description 3
- 206010053615 Thermal burn Diseases 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000001125 extrusion Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000005057 refrigeration Methods 0.000 description 3
- 239000000872 buffer Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to the technical field of electronic industry detection and discloses equipment for testing high and low temperatures of electronic industry equipment, which comprises an insulation box, wherein one side of the insulation box is provided with an insulation box door, the top of the insulation box is provided with a ventilation drum, the two ends of the insulation box are provided with a first fan and a second fan for ventilation, the inner wall of the top of the insulation box is provided with a semiconductor refrigerating device, the lower end of the semiconductor refrigerating device is provided with an electric heating plate, and one end of the ventilation drum is provided with a lifting handle for lifting.
Description
Technical Field
The utility model relates to the technical field of electronic industry detection, in particular to equipment for high-low temperature test of electronic industry equipment.
Background
The electronics industry is an industry in which electronic devices and various electronic components, devices, instruments, and meters are developed and produced. Is a military and civil combined industry. The system consists of production industries such as broadcast television equipment, communication navigation equipment, radar equipment, electronic computers, electronic components, electronic instruments and meters, other electronic special equipment and the like; the method is widely applied to the industry and other equipment working tests with special requirements on low temperature and high temperature, and is used for judging the working state of equipment in low temperature and high temperature.
At present, new requirements are put forward on the production capacity and the production stability of enterprises for the detection requirements of some industrial equipment such as electronic components, the temperature test range of the electronic components is widened from original normal high temperature to low temperature and high temperature, the electronic components are used for judging the working states of the equipment in low temperature and high temperature, and an incubator is needed to be used for stabilizing the environmental temperature in order to ensure the stability of the temperature in the test process.
When the existing incubator is used for high-temperature or low-temperature tests, the temperature in the incubator becomes very high or very low, the door is directly opened when the tests are just finished, operators are easy to scald or frostbite, personal safety of staff is endangered, if the incubator waits for the high-temperature and low-temperature incubator to automatically recover to normal temperature after the tests are finished, the process of taking out electronic elements is very slow, and the working efficiency is reduced, so that the equipment for high-temperature and low-temperature test of the electronic industrial equipment is provided.
Disclosure of Invention
Aiming at the defects of the prior art, the utility model provides equipment for testing high and low temperatures of electronic industrial equipment, and solves the problems.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides an equipment for high low temperature test of electronic industry equipment, includes the insulation can, one side of insulation can rotates and is connected with the insulation can door, and the top of insulation can is equipped with the breather sleeve, and the both ends of insulation can are equipped with first fan and second fan, are equipped with semiconductor refrigerating plant on the top inner wall of insulation can, and semiconductor refrigerating plant's lower extreme is equipped with the electrical heating board, and the one end of breather sleeve is equipped with the lift handle that is used for going up and down, and one side lower extreme that insulation can kept away from the insulation can door is equipped with exhaust assembly.
Preferably, the upper end fixedly connected with test observation window of heat preservation chamber door, the lower extreme of test observation window is equipped with high low temperature control cabinet, and high low temperature control cabinet fixed connection is on the outer wall of heat preservation chamber door, and the lower extreme fixedly connected with chamber door handle of heat preservation chamber door.
Preferably, the bottom of the ventilation cylinder is fixedly connected with the top of the insulation box, a circular plate is arranged at the top of the ventilation cylinder, diamond holes are formed in the outer ring of the ventilation cylinder in a surrounding mode, and a filter screen is arranged in the ventilation cylinder.
Preferably, the semiconductor refrigerating device is arranged at the lower end of the corresponding ventilation cylinder, the semiconductor refrigerating device is fixedly connected with the insulation box through a connecting rod, and the refrigerating end of the semiconductor refrigerating device is arranged at the top of the corresponding partition plate.
Preferably, both ends of the top end of one side of the insulation box are fixedly provided with sliding rails, the sliding rails extend downwards to the lower end of the electric heating plate, and the sliding rails are connected with the electric heating plate and the partition plate in a sliding manner.
Preferably, a screw rod is arranged on the other side of the interior of the insulation box, the top of the screw rod extends to penetrate through the top of the insulation box, the top of the screw rod is fixedly connected with the lifting handle, the lower end of the screw rod is connected with the partition plate and the electric heating plate in a threaded manner, and the heating end of the electric heating plate is arranged corresponding to the semiconductor refrigerating device.
Preferably, the exhaust assembly comprises a ventilation partition plate, a linkage plate and a fixing plate, wherein the fixing plate is fixedly connected to the inner wall of the insulation box and is arranged at the lower end of the electric heating plate, the fixing plate is rotationally connected with the linkage plate through a connecting rod, one side of the linkage plate is fixedly connected with the top of the ventilation partition plate, and a ventilation window is formed in the insulation box corresponding to the ventilation partition plate.
Preferably, the inner side of the ventilation partition plate is not attached to the inside of the insulation box, and the first fan and the second fan are fixedly connected to two ends of the insulation box and are located at the lower end of the ventilation partition plate.
Compared with the prior art, the utility model provides equipment for testing high and low temperatures of electronic industrial equipment, which has the following beneficial effects:
this equipment for high low temperature test of electronic industry equipment, when the test is finished, the electrical heating board descends when rotating the lift handle, the lower extreme of electrical heating board carries out the high low temperature control board of extrusion die and links the partition panel of taking a breath to the window rotation of taking a breath, make high temperature or low temperature by the inside of the rear end discharge normal temperature entering insulation can, first fan and the inside circulation of air of second fan acceleration insulation can, it makes normal air flow in insulation can inside not to take a breath partition panel one side and the laminating of insulation can, reach the purpose of recovering to normal atmospheric temperature fast, avoided directly opening the chamber door and lead to the operator to scald or frostbite, harm staff's personal safety's problem, high low temperature box resumes the speed of normal temperature, take out electronic component process is accelerated, work efficiency has been improved.
Drawings
FIG. 1 is a schematic diagram of the structure of the present utility model;
FIG. 2 is a schematic diagram of the structure of the present utility model;
FIG. 3 is a schematic diagram of the structure of the present utility model.
In the figure: 1. an insulation box; 2. a thermal insulation door; 3. testing a viewing window; 4. a high-low temperature control console; 5. a door handle; 6. a ventilation cylinder; 7. lifting the handle; 8. a screw rod; 9. a semiconductor refrigeration device; 10. a slide rail; 11. a partition plate; 12. an electric heating plate; 13. a ventilation partition panel; 14. a linkage plate; 15. a fixing plate; 16. a first fan; 17. and a second fan.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-3, an apparatus for testing high and low temperatures of electronic industrial equipment comprises an insulation box 1, wherein one side of the insulation box 1 is rotatably connected with an insulation box door 2, the top of the insulation box 1 is provided with a ventilation drum 6, both ends of the insulation box 1 are provided with a first fan 16 and a second fan 17, the inner wall of the top of the insulation box 1 is provided with a semiconductor refrigerating device 9, the lower end of the semiconductor refrigerating device 9 is provided with an electric heating plate 12, one end of the ventilation drum 6 is provided with a lifting handle 7 for lifting, one side lower end of the insulation box 1, far away from the insulation box door 2, is provided with an exhaust component, and can quickly recover to normal temperature when a temperature test is just finished, so that the problem that operators scald or frostbite is avoided when the box door is directly opened, the personal safety of workers is endangered, the speed of recovering normal temperature of the high and low temperature boxes is reduced, the process of taking out electronic components is quickened, and the working efficiency is improved.
Further, the upper end fixedly connected with test observation window 3 of heat preservation chamber door 2, the lower extreme of test observation window 3 is equipped with high low temperature control cabinet 4, and high low temperature control cabinet 4 fixed connection is on the outer wall of heat preservation chamber door 2, and the lower extreme fixedly connected with chamber door handle 5 of heat preservation chamber door 2 conveniently observes and adjusts the detection state in the insulation can.
Further, the bottom of the ventilation cylinder 6 is fixedly connected with the top of the insulation box 1, a circular plate is arranged at the top of the ventilation cylinder 6, diamond holes are formed in the outer ring of the ventilation cylinder 6 in a surrounding mode, a filter screen is arranged in the ventilation cylinder 6, and the temperature inside the insulation box 1 is prevented from being influenced by the outside.
Further, the semiconductor refrigerating device 9 is arranged corresponding to the lower end of the ventilation cylinder 6, the semiconductor refrigerating device 9 is fixedly connected with the heat insulation box 1 through a connecting rod, the refrigerating end of the semiconductor refrigerating device 9 is arranged corresponding to the top of the partition plate 11, and heat is collected at the heat dissipation end of the semiconductor refrigerating device 9.
Further, both ends of the top end of one side of the insulation box 1 are fixedly provided with sliding rails 10, the sliding rails 10 extend downwards to the lower end of the electric heating plate 12, the sliding rails 10 are connected with the electric heating plate 12 and the partition plate 11 in a sliding manner, the partition plate 11 buffers the emitted temperature of the electric heating plate 12, and the electric heating plate 12 can slide up and down under the action of the sliding rails 10.
Further, the inside opposite side of insulation can 1 is equipped with hob 8, the top of hob 8 extends and runs through the top of insulation can 1, hob 8's top and lift handle 7 fixed connection, hob 8's lower extreme and division board 11 and electric heating board 12 threaded connection are in the same place, the heating end of electric heating board 12 corresponds semiconductor refrigerating plant 9 setting, hob 8 carries out spacing to division board 11 and electric heating board 12, rotate lift handle 7 and make division board 11 and electric heating board 12 slide from top to bottom through threaded relation, change the distance of heating and refrigeration and make it can normally work.
Further, exhaust assembly includes partition panel 13 that takes a breath, linkage board 14 and fixed plate 15, fixed plate 15 fixed connection just is in the lower extreme of electrical heating board 12 on the inner wall of insulation can 1, fixed plate 15 passes through the connecting rod and rotates and connect linkage board 14, one side of linkage board 14 is in the same place with the top fixed connection of partition panel 13 that takes a breath, the ventilation window has been seted up to insulation can 1's position that corresponds partition panel 13 that takes a breath, when the test finishes, electrical heating board 12 descends when rotating lift handle 7, the lower extreme of electrical heating board 12 carries out extrusion die high low temperature control board 4 linkage partition panel 13 that takes a breath to the linkage of linkage board 14 outside the window that takes a breath, make high temperature or low temperature by the inside of the rear end discharge normal temperature entering insulation can.
Further, the inside of the ventilation partition plate 13 is not attached to the inside of the insulation box 1, the first fan 16 and the second fan 17 are fixedly connected to two ends of the insulation box 1 and are located at the lower end of the ventilation partition plate 13, the first fan 16 and the second fan 17 accelerate air circulation inside the insulation box, and one side of the ventilation partition plate 13 is not attached to the insulation box 1, so that normal air flows inside the insulation box, and the purpose of quickly recovering to normal temperature is achieved.
Working principle: the lower extreme fixedly connected with chamber door handle 5 of heat preservation chamber door 2 conveniently observes and adjusts the detection state in the insulation can, the inside of ventilation tube 6 is provided with the filter screen, block the inside temperature of insulation can 1 and receive external influence and collect the heat to the radiating end of semiconductor refrigeration device 9, division board 11 buffers the inside temperature of electrical heating board 12, make it slide from top to bottom under the effect of slide rail 10, rotate lift handle 7 and make division board 11 slide from top to bottom with electrical heating board 12 through the screw thread relation, change the distance that heats and refrigerates and make it can normally work, when the test is finished, electrical heating board 12 descends when rotating lift handle 7, the lower extreme of electrical heating board 12 links the high low temperature control board 14 of extrusion die and changes the partition board 13 to the window of taking a breath outside, make high temperature or low temperature by the inside entering insulation can of rear end discharge normal temperature, first fan 16 and second fan 17 accelerate the inside air circulation of insulation can, make normal air flow in the inside the insulation can not laminate with insulation can 1, the purpose of recovering to normal air to normal temperature fast is achieved, the normal work of the insulation can be recovered to normal, the personnel's of the personnel can be avoided, the high-speed of the personnel who has been damaged, the work safety of the personnel has been accelerated, high-speed and the normal work personnel has been recovered, and the normal work efficiency has been avoided, the personnel can be damaged.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (8)
1. The utility model provides an equipment for high low temperature test of electronic industry equipment, includes insulation can (1), its characterized in that: one side of insulation can (1) rotates and is connected with insulation can door (2), the top of insulation can (1) is equipped with air vent (6), the both ends of insulation can (1) are equipped with first fan (16) and second fan (17), be equipped with semiconductor refrigerating plant (9) on the top inner wall of insulation can (1), the lower extreme of semiconductor refrigerating plant (9) is equipped with electrical heating board (12), the one end of air vent (6) is equipped with lift handle (7) that are used for going up and down, one side lower extreme that insulation can (1) kept away from insulation can door (2) is equipped with exhaust assembly.
2. The apparatus for testing high and low temperatures of an electronic industrial apparatus according to claim 1, wherein: the upper end fixedly connected with test observation window (3) of heat preservation chamber door (2), the lower extreme of test observation window (3) is equipped with high low temperature control cabinet (4), and high low temperature control cabinet (4) fixed connection is on the outer wall of heat preservation chamber door (2), and the lower extreme fixedly connected with chamber door handle (5) of heat preservation chamber door (2).
3. The apparatus for testing high and low temperatures of an electronic industrial apparatus according to claim 1, wherein: the bottom of the ventilation cylinder (6) is fixedly connected with the top of the insulation box (1), a circular plate is arranged at the top of the ventilation cylinder (6), diamond holes are formed in the outer ring of the ventilation cylinder (6) in a surrounding mode, and a filter screen is arranged in the ventilation cylinder (6).
4. A device for testing high and low temperatures of an electronic industrial device according to claim 3, wherein: the semiconductor refrigerating device (9) is arranged at the lower end of the corresponding ventilating barrel (6), the semiconductor refrigerating device (9) is fixedly connected with the heat insulation box (1) through a connecting rod, and the refrigerating end of the semiconductor refrigerating device (9) is arranged at the top of the corresponding partition plate (11).
5. The apparatus for testing high and low temperatures of electronic industrial equipment according to claim 4, wherein: two ends of the top end of one side of the heat insulation box (1) are fixedly provided with sliding rails (10), the sliding rails (10) extend downwards to the lower end of the electric heating plate (12), and the sliding rails (10) are connected with the electric heating plate (12) and the partition plate (11) in a sliding mode.
6. The apparatus for testing high and low temperatures of electronic industrial equipment according to claim 5, wherein: the inside opposite side of insulation can (1) is equipped with hob (8), and the top of hob (8) extends and runs through the top of insulation can (1), and the top and the lift handle (7) fixed connection of hob (8), the lower extreme and division board (11) of hob (8) and electrical heating board (12) threaded connection are in the same place, and the heating end of electrical heating board (12) corresponds semiconductor refrigerating plant (9) setting.
7. The apparatus for testing high and low temperatures of an electronic industrial apparatus according to claim 1, wherein: the exhaust assembly comprises a ventilation partition plate (13), a linkage plate (14) and a fixing plate (15), wherein the fixing plate (15) is fixedly connected to the inner wall of the insulation box (1) and is arranged at the lower end of the electric heating plate (12), the fixing plate (15) is rotationally connected with the linkage plate (14) through a connecting rod, one side of the linkage plate (14) is fixedly connected with the top of the ventilation partition plate (13) together, and a ventilation window is formed in the position, corresponding to the ventilation partition plate (13), of the insulation box (1).
8. The apparatus for testing high and low temperatures of electronic industrial equipment according to claim 7, wherein: the inner side of the ventilation partition plate (13) is not attached to the inside of the insulation box (1), and the first fan (16) and the second fan (17) are fixedly connected to two ends of the insulation box (1) and are located at the lower end of the ventilation partition plate (13).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321905456.3U CN220305347U (en) | 2023-07-19 | 2023-07-19 | Equipment for high-low temperature test of electronic industrial equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321905456.3U CN220305347U (en) | 2023-07-19 | 2023-07-19 | Equipment for high-low temperature test of electronic industrial equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220305347U true CN220305347U (en) | 2024-01-05 |
Family
ID=89352429
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321905456.3U Active CN220305347U (en) | 2023-07-19 | 2023-07-19 | Equipment for high-low temperature test of electronic industrial equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220305347U (en) |
-
2023
- 2023-07-19 CN CN202321905456.3U patent/CN220305347U/en active Active
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