CN220188626U - Test equipment and test system - Google Patents

Test equipment and test system Download PDF

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Publication number
CN220188626U
CN220188626U CN202320665066.7U CN202320665066U CN220188626U CN 220188626 U CN220188626 U CN 220188626U CN 202320665066 U CN202320665066 U CN 202320665066U CN 220188626 U CN220188626 U CN 220188626U
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module
switch
test
electronic device
electrically connected
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CN202320665066.7U
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涂鹤
吴东
陈熙
王雷
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Ecoflow Technology Ltd
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Ecoflow Technology Ltd
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Abstract

The application provides test equipment and a test system, wherein the method realizes the control of a passage switch between a power supply module and electronic equipment through a first switch module, realizes the control of a passage switch between a power utilization module and the electronic equipment through a second switch module, and realizes the switch control of a short circuit of a voltage output passage of the electronic equipment through a third switch module; and according to the test working conditions corresponding to the test instructions, the control module is used for controlling the first switch module, the second switch module and the third switch module singly or in combination so as to conduct the channels corresponding to the test working conditions and execute the test flow of the test working conditions. The test instructions are in one-to-one correspondence with the test working conditions, so that erroneous test can be avoided; the control module only needs to control the opening and closing of each control switch according to the test instruction so as to execute the corresponding test flow, so that the control module can adapt to the test requirements of various different durability test working conditions, and the test efficiency of the durability test is improved.

Description

Test equipment and test system
Technical Field
The application relates to the technical field of equipment testing, in particular to testing equipment and a testing system.
Background
With diversification of electronic devices, there are more input ports and more output ports on the electronic devices, and the electronic devices need to interact with other devices through the more input ports and the more output ports. When testing electronic equipment, the input port and the output port of the electronic equipment need to be tested under various combined working conditions. In the related art, a manual test method is adopted for testing the electronic equipment, or a single test working condition is adopted for testing, so that the conditions of missing test, wrong test and the like are easy to occur, the test efficiency is low, and the applicability is poor.
Disclosure of Invention
The utility model provides test equipment and a test system, and aims to improve the multi-working-condition test efficiency of electronic equipment.
In a first aspect, the present utility model provides a test apparatus for testing an electronic device, the test apparatus comprising:
the power supply module is used for charging the electronic equipment, and the power utilization module is used for consuming the electric energy of the electronic equipment;
the first end of the first switch module is electrically connected with the power supply module, and the second end of the first switch module is electrically connected with the voltage input end of the electronic equipment;
the first end of the second switch module is electrically connected with the voltage output end of the electronic equipment, and the second end of the second switch module is electrically connected with the power utilization module;
the first end of the third switch module is electrically connected with the positive power supply end of the power utilization module, and the second end of the third switch module is electrically connected with the negative power supply end of the power utilization module;
the control module is connected with the control ends of the first switch module, the second switch module and the third switch module;
The control module is used for controlling the opening or closing of the first switch module, the second switch module and the third switch module when different test instructions are received, the different test instructions correspond to different test working conditions, and the first switch module, the second switch module and the third switch module are controlled singly or in a combined mode to form different test working conditions.
In a second aspect, the present application also provides a test system, including a control terminal, an electronic device, and a test device as described above; the control terminal is in communication connection with the electronic equipment, and the control terminal is in communication connection with a control module in the test equipment; the control terminal is used for sending a test instruction to the test equipment so as to control the test equipment to execute a test working condition corresponding to the test instruction.
According to the test equipment, the first switch module is used for connecting the power supply module with the access between the electronic equipment, the second switch module is used for connecting the power utilization module with the access between the electronic equipment, and the third switch module is used for connecting the voltage output two ends of the electronic equipment, so that manual connection or extraction of each access is not needed during the test, and the test efficiency can be improved. In addition, the test equipment can control the first switch module, the second switch module and the third switch module singly or in combination according to the test instruction so as to execute the test flow of the test working condition corresponding to the test instruction, thereby realizing the durability test of the electronic equipment. The test flow of each test working condition is preset in the control module, and the test instructions and the test working conditions are in one-to-one correspondence, so that the phenomena of missing test and wrong test during manual test can be avoided. Meanwhile, the control module can comprise test flows of various test conditions, can adapt to test requirements of various different durability test conditions, and is high in applicability.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic block diagram of a test apparatus provided by an embodiment of the present application;
FIG. 2 is a schematic diagram illustrating connection of an embodiment of a test apparatus according to an embodiment of the present application;
FIG. 3 is a schematic diagram illustrating connection of an embodiment of a voltage sampling module in a test apparatus according to an embodiment of the present application;
FIG. 4 is a schematic diagram illustrating connection of an embodiment of a current sampling module in a test apparatus according to an embodiment of the present application;
fig. 5 is a schematic block diagram of a test system provided by an embodiment of the present application.
The achievement of the objects, functional features and advantages of the present application will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
The flow diagrams depicted in the figures are merely illustrative and not necessarily all of the elements and operations/steps are included or performed in the order described. For example, some operations/steps may be further divided, combined, or partially combined, so that the order of actual execution may be changed according to actual situations.
Some embodiments of the present application are described in detail below with reference to the accompanying drawings. The following embodiments and features of the embodiments may be combined with each other without conflict.
Along with diversification of electronic equipment, input/output interfaces of the electronic equipment are more, and when the electronic equipment is tested, the electronic equipment needs to be connected and pulled out through sockets respectively according to different testing working conditions so as to test the electronic equipment. For example, when the dc input and output conditions need to be tested, the other needs to be pulled out, and then the dc input and output are plugged in; and under other test working conditions, the interface connection modes of the electronic equipment are different, and the interface needs to be replaced for pulling out or inserting. When the test working conditions of the electronic equipment are more, in the related technology, the test efficiency of the electronic equipment is low, the applicability is poor, and the like.
The embodiment of the application provides test equipment and a test system. According to the testing device, the first switch module is used for connecting the power supply module with the access between the electronic device, the second switch module is used for connecting the power utilization module with the access between the electronic device, the third switch module is used for connecting the voltage output two ends of the electronic device, and when the testing device is used for testing, the manual connection or the pulling-out of each access is not needed, so that the testing efficiency can be improved, and the applicability is higher.
Referring to fig. 1, fig. 1 is a schematic block diagram of a test apparatus according to an embodiment of the present application. The test equipment is used for testing the electronic equipment.
As shown in fig. 1, the test apparatus 100 of the present application includes a control module 110, a first switch module 121, a second switch module 122, a third switch module 123, a power supply module 130, and a power consumption module 140.
In an embodiment, as shown in fig. 1, the control module 110 is connected to control ends of the first switch module 121, the second switch module 122, and the third switch module 123, and is used for controlling the on/off of the first switch module 121, the second switch module 122, and the third switch module 123 to realize on/off combinations of different test paths.
The power supply module 130 is configured to charge the electronic device, and the power consumption module 140 is configured to consume electric energy of the electronic device.
By way of example, the power module 130 may include an energy storage device including an electrical energy storage unit, such as one or more batteries. The power supply module 130 may also include a power input device that may obtain electrical energy from an external source, such as a power grid, a generator, an energy storage device connected to a power supply device, a solar cell, etc., for example, a charger.
By way of example, the power module 140 may include a refrigerator, an air conditioner, a washing machine, a mower, and other power loads.
By way of example, the electronic device may be a power converter, a power distribution device, or other device having multiple inputs and multiple outputs.
In an embodiment, as shown in fig. 1, a first end of the first switch module 121 is electrically connected to the power supply module 130, and a second end of the first switch module 121 is electrically connected to a voltage input end of the electronic device. When the first switch module 121 is closed, the power supply module 130 is communicated with the channel of the electronic device, the power supply module 130 supplies power to the electronic device, and the power supply module 130 can charge the electronic device.
The first end of the second switch module 122 is electrically connected to the voltage output end of the electronic device, and the second end of the second switch module 122 is electrically connected to the power consumption module 140. When the second switch module 122 is closed, the electronic device is connected to the power consumption module 140, and the electronic device supplies power to the power consumption module 140, so that the power consumption module 140 consumes the electric energy of the electronic device.
The first end of the third switch module 123 is electrically connected to the positive power supply end of the power consumption module 140, and the second end of the third switch module 123 is electrically connected to the negative power supply end of the power consumption module 140. When the third module 123 is closed, the output circuit of the electronic device is directly transmitted from the positive power supply terminal to the negative power supply terminal, so that the output circuit of the electronic device is shorted, and the output circuit of the electronic device can be used for performing a short circuit test.
The embodiment provides a test device, which realizes the control of a channel switch between a power supply module and electronic equipment through a first switch module, realizes the control of a channel switch between the power supply module and the electronic equipment through a second switch module, and realizes the switch control of short-circuiting a voltage output channel of the electronic equipment through a third switch module; meanwhile, the on-off control of the first switch module, the second switch module and the third switch module is realized through the control module. Therefore, when the test equipment provided by the application is used for testing the electronic equipment, the first switch module, the second switch module and the third switch module are controlled independently or in a combined way only according to the test instruction so as to execute the test flow of the test working condition corresponding to the test instruction, and each passage is not required to be manually connected or pulled out, so that the test efficiency can be improved.
In an embodiment, the control module 110 may be a programmed board or MCU (Microcontroller Unit, micro control unit). The MCU is also called a single-chip microcomputer or a single-chip microcomputer, which is to properly reduce the frequency and specification of a central processing unit (Central Process Unit; CPU), integrate a memory, a counter, a USB (Universal Serial Bus, a universal serial bus), an A/D conversion (Analog to Digital Converter, ADC, analog-digital conversion), a UART (Universal Asynchronous Receiver/Transmitter, a universal asynchronous receiver Transmitter), a PLC (Programmable Logic Controller, a programmable logic controller), a DMA (Direct Memory Access ) and other peripheral interfaces, and even LCD (Liquid Crystal Display ) driving circuits on a single chip to form a chip-level computer, and perform different combination control for different application occasions.
In this embodiment, by presetting test programs with multiple test conditions in the program control board or the MCU, corresponding test procedures are executed according to execution instructions of the test conditions, so that test procedures can be simplified, and problems of erroneous test, missing test and the like can be avoided, thereby improving test efficiency.
The first, second and third switch modules 121, 122 and 123 may be relays, or may be other switch modules that may be used for programming a circuit path, and the present application is not limited in particular.
In this embodiment, the relay is used as the switch module, and the control of the switch module can be realized through a program control mode, so that the control of each channel in the test circuit is realized, and the program control relay is closed/opened, so that the connection of the channels corresponding to each test working condition is faster, and the test efficiency is improved.
In one embodiment, as shown in fig. 2, the power supply module 130 includes an ac power supply module 131 and a dc power supply module 132; the first switch module 121 includes an ac charging switch 1211 and a dc charging switch 1212. The first end of the ac charging switch 1211 is electrically connected to the ac power module 131, and the second end of the ac charging switch 1211 is electrically connected to the ac voltage input end of the electronic device. The first end of the dc charging switch 1212 is electrically connected to the dc power module 132, and the second end of the dc charging switch 1212 is electrically connected to the dc voltage input terminal of the electronic device.
Illustratively, the ac power module 131 may be an alternator or a utility power device; the dc power module 132 may be a battery, a rectifying source, a dc power source, or a dc generator.
Illustratively, the control module 110 controls the ac charging switch 1211 to close and the ac power module 131 outputs an ac voltage to charge the electronic device. When the control module 110 controls the dc charging switch 1212 to be closed, the dc power supply module 132 outputs a dc voltage to charge the electronic device.
For example, the control module 110 may control the ac charging switch 1211 and the dc charging switch 1212 to be simultaneously closed, and the ac power module 131 and the dc power module 132 to simultaneously charge the electronic device.
For example, the dc power module 132 may include multiple dc outputs, and may provide a dc voltage output to the electronic device at the same time, or may provide a dc voltage output to the electronic device separately.
The dc charging switch 1212 for connecting the multiple dc output power sources and the electronic device may be one, so as to realize synchronous output control of the dc power module 132. The dc charging switch 1212 may be provided in plural numbers to control the connection of each dc output of the dc power supply module 132 to a path of the electronic device.
In this embodiment, the power supply module 130 includes an ac power supply module 131 and a dc power supply module 132, and controls the on-off of the path between the ac power supply module 131 and the electronic device through the ac charging switch 1211, and controls the on-off of the path between the dc power supply module 132 and the electronic device through the dc charging switch 1212, so as to satisfy different input requirements of the electronic device, and improve applicability.
In one embodiment, as shown in fig. 2, the power module 140 includes a dc power module 141 and an ac power module 142, and the second switch module 122 includes a dc power switch 1221 and an ac power switch 1222. The first end of the dc power supply switch 1221 is electrically connected to the positive and negative poles of the dc voltage output end of the electronic device, and the second end of the dc power supply switch 1221 is electrically connected to the dc power module 141. The first end of the ac power switch 1222 is electrically connected to the ac voltage output terminal of the electronic device, and the second end of the ac power switch 1222 is electrically connected to the ac power module 142.
For example, when the control module 110 controls the dc power switch 1221 to be closed, the electronic device outputs a dc voltage to the dc power module 141 to consume the electric power of the electronic device. When the control module 110 controls the ac power switch 1222 to be closed, the electronic device outputs a dc voltage to the ac power module 142, and the ac power module 142 consumes the electrical energy of the electronic device.
The dc power module 141 may be a dc light source, a dc fan, or a dc electrical device; the ac power module 142 may be a refrigerator, an air conditioner, a computer, or the like.
In this embodiment, the power module 140 includes a dc power module 141 and an ac power module 142, and controls the on-off of the path between the dc power module 141 and the electronic device through the dc power switch 1221, and controls the on-off of the path between the ac power module 142 and the electronic device through the ac power switch 1222, so as to satisfy different output requirements of the electronic device and improve applicability.
In an embodiment, the control module 110 is connected to the first switch module 121 and the second switch module 122, i.e. the control module 110 is connected to the control terminals of the ac charging switch 1211, the dc charging switch 1212, the dc power supply switch 1221 and the ac power supply switch 1222. The control module 110 may implement on/off control of the ac charging switch 1211, the dc charging switch 1212, the dc power switch 1221, and the ac power switch 1222.
In an embodiment, when the control module 110 receives different test instructions, it controls the opening or closing of the first switch module 121, the second switch module 122, and the third switch module 123, where the different test instructions correspond to different test conditions, and the first switch module 121, the second switch module 122, and the third switch module 123 are controlled separately or in combination to form different test conditions.
By way of example, the test conditions may include a DC (Direct Current) input high/low voltage charge-discharge cycle test, an AC (Alternating Current ) input high/low voltage charge-discharge cycle test, an AC output full load/overload condition load-unload test, and a DC output full load/overload condition load-unload test.
In one embodiment, as shown in FIG. 2, when the control module 110 and the electronic device receive a test command for a DC input high/low voltage charge-discharge cycle test condition, the test condition is triggered under the test command. Under the test condition, when the initial SOC (State of Charge) of the electronic device is less than 100%, the control module 110 controls the dc charging switch 1212 to be closed, so as to Charge the electronic device with the dc power supply module 132. When the current SOC of the electronic device is equal to 100%, the control module 110 controls the dc charging switch 1212 to be opened and controls the dc power supply switch 1221 to be closed, and the dc power module 141 consumes the electric energy of the electronic device to discharge the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the dc charging switch 1212 to be closed and the second switch module 122 to be opened, so that the dc power supply module 132 charges the electronic device, and sequentially and circularly charges and discharges the electronic device. The high/low voltage charge-discharge cycle test of the DC input can be used for testing the cycle condition of the high/low voltage charge-discharge of the DC input of the electronic equipment.
In one embodiment, as shown in FIG. 2, when the control module 110 and the electronic device receive a test command for an AC input high/low voltage charge-discharge cycle test condition, the test condition is triggered under the test command. Under the test condition, the control module 110 controls the ac charging switch 1211 to be closed when the initial SOC of the electronic device is less than 100% so as to charge the electronic device by the ac power supply module 131. When the current SOC of the electronic device is equal to 100%, the control module 110 controls the ac charging switch 1211 to open and controls the ac power switch 1222 to close, and the ac power module 142 consumes power of the electronic device to discharge the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the dc charging switch 1212 to be closed and the second switch module 122 to be opened, so that the ac power supply module 131 charges the electronic device, and sequentially and circularly charges and discharges the electronic device. The AC input high/low voltage charge-discharge cycle test can be used for testing the cycle condition of the AC input high/low voltage charge-discharge of the electronic equipment.
In one embodiment, as shown in FIG. 2, when the control module 110 and the electronic device receive a test command for a load/unload test condition under a DC output full load/overload condition, the test condition is triggered under the test command. Under the test condition, the control module 110 controls the dc charging switch 1212 to be closed to charge the electronic device when the initial SOC of the electronic device is less than 100%. When the current SOC of the electronic device is equal to 100%, the control module 110 controls the first switch module 121 to be turned off, the load of the program-controlled dc power module 141 is a full load value or an overload value of the electronic device, and the on time and the off time of the dc power switch 1221 are set to discharge the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the dc power supply switch 1221 to be opened and the dc charging switch 1212 to be closed, so as to charge the electronic device, and sequentially and circularly charge and discharge the electronic device. The cyclic condition of the direct current output of the electronic equipment under the full load/overload condition can be tested through the loading and unloading test under the full load/overload condition of the direct current output.
In one embodiment, as shown in FIG. 2, when the control module 110 and the electronic device receive a test instruction for a load/unload test condition under an AC output full load/overload condition, the test condition is triggered under the test instruction. Under the test condition, when the initial SOC of the electronic device is less than 100%, the control module 110 controls the first switch module 121 to be closed, so as to charge the electronic device by the dc power supply module 132. When the current SOC of the electronic device is equal to 100%, the control module 110 controls the first switch module 121 to be turned off, the load of the program-controlled ac power module 142 is a full load value or an overload value of the electronic device, and sets the on time and the off time of the ac power switch 1222, so that the ac power module 131 discharges the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the ac power switch 1222 to be opened and the first switch module 121 to be closed, so that the dc power module 132 charges the electronic device, and sequentially and circularly charges and discharges the electronic device. The cycle condition of the alternating current output of the electronic equipment under the full load/overload condition can be tested through the loading and unloading test under the full load/overload condition of the AC output.
In an embodiment, test programs for the DC input high/low voltage charge/discharge cycle test, AC input high/low voltage charge/discharge cycle test, load/unload test under the AC output full load/overload condition, and load/unload test under the DC output full load/overload condition may be pre-programmed and set in the control module 110. When receiving the execution instruction of the test condition, the control module 110 may send the execution instruction to the first switch module 121, the second switch module 122 and the third switch module 123 at regular time or sequentially, so as to control the first switch module 121, the second switch module 122 and the third switch module 123 to be turned on or turned off, so as to form test paths corresponding to different test conditions. Therefore, the control module 110 executes the test program corresponding to the test working condition according to the execution instruction of the test working condition, so that missing test and erroneous test can be avoided, and the practicability is improved.
In one embodiment, as shown in fig. 2, the third switch module 123 includes a first shorting switch 1231 and a second shorting switch 1232. The first end of the first short-circuit switch 1231 is electrically connected to the positive power supply end of the dc power module 141, and the second end of the first short-circuit switch 1231 is electrically connected to the negative power supply end of the dc power module 141; the first end of the second short-circuit switch 1232 is electrically connected to the power supply first end of the ac power module 142, and the second end of the second short-circuit switch 1232 is electrically connected to the power supply second end of the ac power module 142.
In an embodiment, when the dc power supply switch 1221 is closed, the electronic device supplies power to the dc power module 141, and at this time, when the first short-circuit switch 1231 is closed, the dc output path of the electronic device is short-circuited. When the ac power supply switch 1222 is closed, the electronic device supplies power to the ac power module 142, and at this time, when the second shorting switch 1232 is closed, the ac output path of the electronic device is shorted.
The test conditions may also include, for example, an AC output full load short test, a DC output full load short test, and an AC output bypass/inverter cycle switch test.
In one embodiment, as shown in fig. 2, when the control module 110 and the electronic device receive a test command for an AC output full-load short-circuit test condition, the test condition is triggered under the test command. Under the test condition, the control module 110 controls the ac charging switch 1211 to be closed when the initial SOC of the electronic device is less than 100% so as to charge the electronic device by the ac power supply module 131. When the current SOC of the electronic device is equal to 100%, the control module 110 controls the ac charging switch 1211 to be turned off, controls the load of the program-controlled ac power module 142 to be a full load value of the electronic device, controls the ac power switch 1222 to be turned on, and sets the on time and the off time of the second short circuit switch 1232 to discharge the electronic device by the ac power module 131. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the ac power switch 1222 and the second short-circuit switch 1232 to be opened, and controls the ac charging switch 1211 to be closed, so that the ac power module 131 charges the electronic device, and sequentially circulates to charge and discharge the electronic device. The circulation condition of the alternating current output short circuit of the electronic equipment can be tested through the AC output full-load short circuit test.
In one embodiment, as shown in fig. 2, when the control module 110 and the electronic device receive a test command for a DC output full-load short-circuit test condition, the test condition is triggered under the test command. Under the test condition, the control module 110 controls the dc charging switch 1212 to be closed when the initial SOC of the electronic device is less than 100%, so as to charge the electronic device with the dc power supply module 132. When the current SOC of the electronic device is equal to 100%, the control module 110 controls the first switch module 121 to be turned off, controls the load of the program-controlled dc power module 141 to be a full load value of the electronic device, controls the dc power supply switch 1221 to be turned on, and sets the on time and the off time of the first short circuit switch 1231 to discharge the electronic device by the dc power module 132. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the dc power supply switch 1221 and the first short circuit switch 1231 to be opened, and controls the dc charging switch 1212 to be closed, so that the dc power supply module 132 charges the electronic device, and sequentially and circularly charges and discharges the electronic device. Through the DC output full-load short circuit test, the circulation condition of the DC output short circuit of the electronic equipment can be tested.
In one embodiment, as shown in FIG. 2, when the control module 110 and the electronic device receive a test command to AC output bypass/inverter cycle switch test conditions, the test conditions are triggered under the test command. Under the test condition, the control module 110 controls the ac charging switch 1211 to be closed when the initial SOC of the electronic device is less than 100% so as to charge the electronic device by the ac power supply module 131. When the current SOC of the electronic device is equal to 100%, the control module 110 programs the load size of the ac power module 142 to be the full load value of the electronic device. The control module 110 controls the ac power switch 1222 to be closed, and sets the closing time and the opening time of the ac charging switch 1211 to discharge the electronic device by the ac power module 131. When the current SOC of the electronic device is equal to 0%, the ac power switch 1222 is controlled to be opened, and the ac charging switch 1211 is controlled to be closed, so that the ac power module 131 charges the electronic device, and the electronic device is sequentially and circularly charged and discharged. The AC output bypass/inversion cycle switching test can be used for testing the cycle condition of the AC output bypass/inversion of the electronic equipment.
In an embodiment, the test device further comprises at least one voltage sampling module and/or at least one current sampling module.
Illustratively, as shown in FIG. 3, the voltage sampling module includes an input voltage sampling module 161 and an output voltage sampling module 162;
the first end of the input voltage sampling module 161 is electrically connected with the first switch module 121, and the second end of the input voltage sampling module 161 is electrically connected with the voltage input end of the electronic device; the first end of the output voltage sampling module 162 is electrically connected to the voltage output end of the electronic device, and the second end of the output voltage sampling module 162 is electrically connected to the second switch module. The input voltage sampling module 161 is used for collecting a dc/ac input voltage value of the electronic device, and the output voltage sampling module 162 is used for collecting a dc/ac output voltage value of the electronic device.
For example, the input voltage sampling module 161 may include at least two input voltage sampling modules respectively distributed on a path between the electronic device and the dc power supply module, and on a path between the electronic device and the ac power supply module, for respectively collecting the dc input voltage and the ac input voltage of the electronic device.
In an embodiment, when the control module 110 and the electronic device receive a test command of a dc input overvoltage protection test condition, the test condition is triggered under the test command, and under the test condition, the control module 110 controls the dc charging switch 1212 to be closed when the initial SOC of the electronic device is less than 100%, so as to charge the electronic device with the dc power supply module 132. The control module 110 gradually adjusts the output voltage value of the dc power supply module 132 until the output voltage value of the dc power supply module 132 exceeds the rated voltage of the electronic device, and records the maximum input voltage value collected by the input voltage sampling module 161 when the electronic device triggers overvoltage shutdown protection. After the electronic device triggers the overvoltage and disconnection protection, the control module 110 controls the dc charging switch 1212 to be opened, controls the electronic device to be disconnected and restored, and controls the dc power supply switch 1221 to be closed, so that the dc power module 132 discharges the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the dc power supply switch 1221 to be opened and controls the dc charging switch 1212 to be closed, so as to gradually increase the output voltage value of the dc power supply module 132 to exceed the rated voltage of the electronic device, and charge the electronic device with the dc power supply module 132, and sequentially and circularly charge and discharge the electronic device. Through the direct current input overvoltage protection test, the circulation condition of the direct current input overvoltage protection of the electronic equipment can be tested.
In an embodiment, when the control module 110 and the electronic device receive a test command of an ac input overvoltage protection test condition, the test condition is triggered under the test command, and under the test condition, the control module 110 controls the ac charging switch 1211 to be closed when the initial SOC of the electronic device is less than 100% so as to charge the electronic device by the ac power supply module 131. The control module 110 gradually adjusts the output voltage value of the ac power supply module 131 until the output voltage value of the ac power supply module 131 exceeds the rated voltage of the electronic device, and records the maximum input voltage value acquired by the input voltage sampling module 161 when the electronic device triggers overvoltage and disconnection protection. After the electronic device triggers the overvoltage shutdown protection, the control module 110 controls the ac charging switch 1211 to open and controls the electronic device to shutdown and resume, and controls the ac power switch 1222 to close to discharge the electronic device with the ac power module 131. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the ac power supply switch 1222 to be opened and controls the ac charging switch 1211 to be closed, so as to gradually increase the output voltage value of the ac power supply module 131 to exceed the rated voltage of the electronic device, and charge the electronic device with the ac power supply module 131, and sequentially and circularly charge and discharge the electronic device. The circulation condition of the alternating current input overvoltage protection of the electronic equipment can be tested through the alternating current input overvoltage protection test.
For example, as shown in fig. 3, the output voltage sampling module 162 may include at least two output voltage sampling modules respectively distributed on a path between the electronic device and the dc power module, and on a path between the electronic device and the ac power module, for respectively collecting the dc output voltage and the ac output voltage of the electronic device.
In an embodiment, when the control module 110 and the electronic device receive a test instruction of a dc output overvoltage protection test condition, the test condition is triggered under the test instruction, and under the test condition, the control module 110 controls the dc charging switch 1212 to be closed when the initial SOC of the electronic device is less than 100%, so as to charge the electronic device with the dc power supply module 132. When the current SOC of the electronic device is equal to 100%, the control module 110 controls the dc charging switch 1212 to be opened and controls the dc power supply switch 1221 to be closed, and adjusts the load voltage of the dc power module 141 to gradually rise until the load voltage exceeds the rated output voltage of the electronic device and triggers the overvoltage shutdown protection of the electronic device, so as to record the maximum output voltage of the electronic device collected by the output voltage sampling module 162. After the electronic device triggers the overvoltage and disconnection protection, the control module 110 sets the load voltage of the dc power module 141 not to exceed the rated output voltage of the electronic device, and controls the electronic device to disconnect and recover so as to discharge the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the dc power supply switch 1221 to be opened and controls the dc charging switch 1212 to be closed, so as to charge the electronic device, and sequentially and circularly charge and discharge the electronic device. Through the direct-current output overvoltage protection test, the circulation condition of the direct-current output overvoltage protection of the electronic equipment can be tested.
In an embodiment, when the control module 110 and the electronic device receive a test command of an ac output overvoltage protection test condition, the test condition is triggered under the test command, and under the test condition, the control module 110 controls the ac charging switch 1211 to be closed when the initial SOC of the electronic device is less than 100% so as to charge the electronic device. When the current SOC of the electronic device is equal to 100%, the control module 110 controls the ac charging switch 1211 to be opened and controls the ac power supply switch 1222 to be closed, and adjusts the load voltage of the ac power module 142 to gradually rise until the load voltage exceeds the rated output voltage of the electronic device and triggers the overvoltage shutdown protection of the electronic device, so as to record the maximum output voltage of the electronic device collected by the output voltage sampling module 162. After the electronic device triggers the overvoltage shutdown protection, the control module 110 sets the load voltage of the ac power module 142 not to exceed the rated output voltage of the electronic device, and controls the electronic device to shutdown and recover to discharge the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the ac power switch 1222 to be opened and controls the ac charging switch 1211 to be closed so as to charge the electronic device, and sequentially circulates to charge and discharge the electronic device. Through the direct current output overvoltage protection test, the circulation condition of the alternating current output overvoltage protection of the electronic equipment can be tested.
Illustratively, as shown in FIG. 4, the current sampling module includes an input current sampling module 171 and an output current sampling module 171;
the first end of the input current sampling module 171 is electrically connected with the first switch module 121, and the second end of the input current sampling module 171 is electrically connected with the current input end of the electronic device; the first end of the output current sampling module 172 is electrically connected to the current output end of the electronic device, and the second end of the output current sampling module 172 is electrically connected to the second switch module 122.
For example, the input current sampling module 171 may include at least two input current sampling modules respectively distributed on a path between the electronic device and the dc power supply module, and on a path between the electronic device and the ac power supply module, for respectively collecting the dc input current and the ac input current of the electronic device.
In an embodiment, when the control module 110 and the electronic device receive a test instruction of a dc input over-current protection test condition, the test condition is triggered under the test instruction, and under the test condition, the control module 110 controls the dc charging switch 1212 to be closed when the initial SOC of the electronic device is less than 100% so as to charge the electronic device. The output current value of the direct current power supply module 132 is gradually adjusted by the control module 110 until the output current value of the direct current power supply module 132 exceeds the rated current of the electronic equipment, overcurrent open-circuit protection of the electronic equipment is triggered, and the maximum input current value acquired by the input current sampling module 171 is recorded. After the electronic device triggers the overcurrent trip protection, the control module 110 controls the dc charging switch 1212 to open, controls the electronic device to trip back, and controls the dc power switch 1221 to close to discharge the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the dc power supply switch 1221 to be opened and controls the dc charging switch 1212 to be closed, so as to gradually increase the output current value of the dc power supply module 132 to exceed the rated current of the electronic device, so as to charge the electronic device, and sequentially and circularly charge and discharge the electronic device. Through the direct current input overcurrent protection test, the circulation condition of the direct current input overcurrent protection of the electronic equipment can be tested.
In an embodiment, when the control module 110 and the electronic device receive a test command of an ac input over-current protection test condition, the test condition is triggered under the test command, and under the test condition, the control module 110 controls the ac charging switch 1211 to be closed when the initial SOC of the electronic device is less than 100% so as to charge the electronic device. The output current value of the alternating current power supply module 131 is gradually adjusted through the control module 110 until the output current value of the alternating current power supply module 131 exceeds the rated current of the electronic equipment, overcurrent open-circuit protection of the electronic equipment is triggered, and the maximum input voltage value acquired by the input current sampling module 171 is recorded. After the electronic device triggers the overcurrent trip protection, the control module 110 controls the ac charging switch 1211 to open and controls the electronic device to trip back, and controls the ac power switch 1222 to close to discharge the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the ac power supply switch 1222 to be opened and controls the ac charging switch 1211 to be closed, so as to gradually increase the output current value of the ac power supply module 131 to exceed the rated current of the electronic device, to charge the electronic device, and sequentially and circularly charge and discharge the electronic device. Through the alternating current input overcurrent protection test, the circulation condition of the alternating current input overcurrent protection of the electronic equipment can be tested.
For example, as shown in fig. 4, the output current sampling module 172 may include at least two output current sampling modules respectively distributed on the paths between the electronic device and the dc power module, and on the paths between the electronic device and the ac power module, for respectively collecting the dc output current and the ac output current of the electronic device.
In an embodiment, when the control module 110 and the electronic device receive a test instruction of a dc output over-current protection test condition, the test condition is triggered under the test instruction, and under the test condition, the control module 110 controls the dc charging switch 1212 to be closed when the initial SOC of the electronic device is less than 100% so as to charge the electronic device. When the current SOC of the electronic device is equal to 100%, the control module 110 programs the dc power switch 1221 to be closed, and adjusts the load current of the dc power module 141 to gradually rise until the load current exceeds the rated output current of the electronic device and triggers the overcurrent breaking protection of the electronic device, so as to record the maximum output current of the electronic device collected by the output current sampling module 172. After the electronic device triggers the overvoltage and disconnection protection, the control module 110 sets the load current of the direct current power module 141 not to exceed the rated output current of the electronic device, and controls the electronic device to disconnect and recover so as to discharge the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the dc power supply switch 1221 to be opened and controls the dc charging switch 1212 to be closed, so as to charge the electronic device, and sequentially and circularly charge and discharge the electronic device. Through the direct current output overcurrent protection test, the circulation condition of the direct current output overcurrent protection of the electronic equipment can be tested.
In an embodiment, when the control module 110 and the electronic device receive a test instruction of the ac output over-current protection test condition, the test condition is triggered under the test instruction, and under the test condition, the control module 110 controls the ac charging switch 1211 to be closed when the initial SOC of the electronic device is less than 100% so as to charge the electronic device. When the current SOC of the electronic device is equal to 100%, the control module 110 programs the ac power switch 1222 to be closed, and adjusts the load current of the ac power module 142 to gradually rise until the load current exceeds the rated output current of the electronic device and triggers the overcurrent breaking protection of the electronic device, so as to record the maximum output current of the electronic device collected by the output current sampling module 172. After the electronic device triggers the overcurrent and open-circuit protection, the control module 110 sets the load current of the ac power module 142 not to exceed the rated output current of the electronic device, and controls the electronic device to open-circuit and recover so as to discharge the electronic device. When the current SOC of the electronic device is equal to 0%, the control module 110 controls the ac power switch 1222 to be opened and controls the ac charging switch 1211 to be closed so as to charge the electronic device, and sequentially circulates to charge and discharge the electronic device. Through the AC output overcurrent protection test, the circulation condition of the AC output overcurrent protection of the electronic equipment can be tested.
Referring to fig. 5, fig. 5 is a schematic structural diagram of a test system according to an embodiment of the application.
As shown in fig. 5, the test system 10 includes a control terminal 200, an electronic device 300, and the test device 100 as described above.
In one embodiment, as shown in FIG. 5, the control terminal 200 is communicatively coupled to the control module 110 in the test device 100; the control terminal 200 is configured to send a test instruction to the test device 100, so as to control the test device to execute a test working condition corresponding to the test instruction.
The control terminal 200 includes, for example, a mobile phone, a tablet computer, a notebook computer, a desktop computer, a processor, and other electronic devices.
For example, the test device 100 may pre-store a plurality of test conditions and test flows of each test condition, and the control terminal 200 may send a test instruction to the test device 100, where the test device 100 executes the test flow of the test condition included in the test instruction according to the test instruction.
For example, the control terminal 200 may be communicatively connected to each module in the test device, such as the power supply module 130, the power consumption module 140, the voltage sampling module, and the current sampling module, and the control terminal 200 may receive and store the voltage data, the current data, the load data, and the like fed back by each module in the test device 100 in real time.
The embodiment provides a test system, which sends a test instruction to a control module in test equipment through a control terminal, so that the test equipment executes corresponding test working conditions according to the test instruction, and thus tests the electronic equipment, the durability test flow of the electronic equipment is more convenient, and the operation difficulty of the durability test of the electronic equipment is reduced. Meanwhile, the test equipment executes a preset test flow according to the test instruction, so that the problems of misoperation, such as false test, missing test and the like, can be avoided, the test efficiency is improved, the test flow corresponding to various test working conditions is preset in the test equipment, the test can be performed aiming at various durable test working conditions, and the applicability of the test equipment is improved.
While the application has been described with reference to certain preferred embodiments, it will be understood by those skilled in the art that various changes and substitutions of equivalents may be made and equivalents will be apparent to those skilled in the art without departing from the scope of the application. Therefore, the protection scope of the application is subject to the protection scope of the claims.

Claims (10)

1. A test apparatus for testing an electronic device, comprising:
The power supply module is used for charging the electronic equipment, and the power utilization module is used for consuming the electric energy of the electronic equipment;
the first end of the first switch module is electrically connected with the power supply module, and the second end of the first switch module is electrically connected with the voltage input end of the electronic equipment;
the first end of the second switch module is electrically connected with the voltage output end of the electronic equipment, and the second end of the second switch module is electrically connected with the power utilization module;
the first end of the third switch module is electrically connected with the positive power supply end of the power utilization module, and the second end of the third switch module is electrically connected with the negative power supply end of the power utilization module;
the control module is connected with the control ends of the first switch module, the second switch module and the third switch module;
the control module is used for controlling the opening or closing of the first switch module, the second switch module and the third switch module when different test instructions are received, the different test instructions correspond to different test working conditions, and the first switch module, the second switch module and the third switch module are controlled singly or in a combined mode to form different test working conditions.
2. The test device of claim 1, wherein the power supply module comprises an ac power supply module and a dc power supply module; the first switch module comprises an alternating current charging switch and a direct current charging switch;
the first end of the alternating current charging switch is electrically connected with the alternating current power supply module, and the second end of the alternating current charging switch is electrically connected with the alternating current voltage input end of the electronic equipment; the first end of the direct current charging switch is electrically connected with the direct current power supply module, and the second end of the direct current charging switch is electrically connected with the direct current voltage input end of the electronic equipment.
3. The test apparatus of claim 1, wherein the power module comprises a direct current power module and an alternating current power module; the second switch module comprises a direct current power supply switch and an alternating current power supply switch;
the first end of the direct current power supply switch is electrically connected with the positive electrode and the negative electrode of the direct current voltage output end of the electronic equipment, and the second end of the direct current power supply switch is electrically connected with the direct current power utilization module; the first end of the alternating current power supply switch is electrically connected with the alternating current voltage output end of the electronic equipment, and the second end of the alternating current power supply switch is electrically connected with the alternating current power utilization module.
4. A test device according to claim 3, wherein the third switch module comprises a first short-circuit switch and a second short-circuit switch;
the first end of the first short-circuit switch is electrically connected with the positive power supply end of the direct current power utilization module, and the second end of the first short-circuit switch is electrically connected with the negative power supply end of the direct current power utilization module; the first end of the second short-circuit switch is electrically connected with the power supply first end of the alternating current power utilization module, and the second end of the second short-circuit switch is electrically connected with the power supply second end of the alternating current power utilization module.
5. The test device according to claim 1, further comprising at least one voltage sampling module and/or at least one current sampling module.
6. The test device of claim 5, wherein the voltage sampling module comprises an input voltage sampling module and an output voltage sampling module;
the first end of the input voltage sampling module is electrically connected with the first switch module, and the second end of the input voltage sampling module is electrically connected with the voltage input end of the electronic equipment; the first end of the output voltage sampling module is electrically connected with the voltage output end of the electronic equipment, and the second end of the output voltage sampling module is electrically connected with the second switch module and/or the third switch module.
7. The test device of claim 5, wherein the current sampling module comprises an input current sampling module and an output current sampling module;
the first end of the input current sampling module is electrically connected with the first switch module, and the second end of the input current sampling module is electrically connected with the current input end of the electronic equipment; the first end of the output current sampling module is electrically connected with the current output end of the electronic equipment, and the second end of the output current sampling module is electrically connected with the second switch module.
8. The test device of claim 1, wherein the first, second, and third switch modules comprise relays.
9. The test device of claim 1, wherein the control module comprises a programmed board or MCU.
10. A test system comprising a control terminal, an electronic device and a test device according to any one of claims 1 to 9;
the control terminal is in communication connection with the electronic equipment, and the control terminal is in communication connection with a control module in the test equipment;
The control terminal is used for sending a test instruction to the test equipment so as to control the test equipment to execute a test working condition corresponding to the test instruction.
CN202320665066.7U 2023-03-22 2023-03-22 Test equipment and test system Active CN220188626U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202320665066.7U CN220188626U (en) 2023-03-22 2023-03-22 Test equipment and test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202320665066.7U CN220188626U (en) 2023-03-22 2023-03-22 Test equipment and test system

Publications (1)

Publication Number Publication Date
CN220188626U true CN220188626U (en) 2023-12-15

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Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
CN (1) CN220188626U (en)

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