CN220154610U - Long-term reliable discharge test integrated device - Google Patents

Long-term reliable discharge test integrated device Download PDF

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Publication number
CN220154610U
CN220154610U CN202321508244.1U CN202321508244U CN220154610U CN 220154610 U CN220154610 U CN 220154610U CN 202321508244 U CN202321508244 U CN 202321508244U CN 220154610 U CN220154610 U CN 220154610U
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long
power supply
term
load
contactor
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CN202321508244.1U
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雷昀
刘磊
张其辉
邱心涛
朱昨庆
赵龙涛
王妍懿
刘爽
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Qingdao Meikai Lin Polytron Technologies Inc
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Qingdao Meikai Lin Polytron Technologies Inc
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Abstract

The utility model relates to the field of long-term power supply discharge testing, in particular to a long-term reliable discharge testing integrated device. The power supply comprises a long-term power supply and a discharge unit, wherein the long-term power supply is connected with the discharge unit in an adaptive manner. The discharging unit is characterized by comprising an electronic load and a control box, wherein the control box comprises a load resistor, the electronic load and the control box are connected with a long-term power supply in an adaptive manner, the electronic load is connected with the control box in an adaptive manner, and the load resistor and the electronic load are mutually standby. The integrated device has high adjustment precision, less heating, maintenance and discharge test interruption prevention.

Description

Long-term reliable discharge test integrated device
Technical Field
The utility model relates to the field of long-term power supply discharge testing, in particular to a long-term reliable discharge testing integrated device.
Background
For long-term reliable discharge loads for long-term power supplies, the current state of the art uses resistive loads as the primary load for long-term discharge. However, due to the characteristics of the resistor, the resistor load has the defects of poor adjustment precision, high load heating and incapability of maintenance. Meanwhile, a resistive load is used as a main load for long-term discharge, and once the resistive load fails, a discharge test is interrupted.
Disclosure of Invention
The utility model aims to solve the technical problem of providing a long-term reliable discharge test integrated device, which has high adjustment precision, less heating, maintenance and discharge test interruption avoidance.
In order to solve the problems, the following technical scheme is provided:
the long-term reliable discharge test integrated device comprises a long-term power supply and a discharge unit, wherein the long-term power supply is connected with the discharge unit in an adaptive manner. The discharging unit is characterized by comprising an electronic load and a control box, wherein the control box comprises a load resistor, the electronic load and the control box are connected with a long-term power supply in an adaptive manner, the electronic load is connected with the control box in an adaptive manner, and the load resistor and the electronic load are mutually standby.
The electronic loads are two, are mutually standby, and are connected in an adaptive mode.
The electronic load comprises a singlechip, a signal relay KS and a first contactor, wherein the signal relay KS and the first contactor are connected with the singlechip in an adaptive manner. The positive pole and the negative pole of the long-term power supply are both connected with the two first contactors in an adaptive mode. The control box contains control switch, the anodal and the control switch adaptation of long-term power are connected, and control switch and load resistance's one end adaptation link to each other, and load resistance's the other end links to each other with long-term power's negative pole. The signal relays KS are all connected with the control switch in an adaptive mode.
And isolating switches are arranged between the first contactor and the positive electrode and the negative electrode of the long-term power supply.
The control switch comprises a normally closed relay NC and an AF contactor, and the signal relay KS is a direct current solid state relay. The positive pole and the negative pole of signal relay KS input control end are connected with the corresponding singlechip adaptation, and the positive pole of signal relay KS output controlled end links to each other with DC power supply module's output, and the negative pole of signal relay KS output controlled end links to each other with diode D's positive pole, and diode D's negative pole links to each other with normally closed relay NC's input control end positive pole, and normally closed relay NC's input control end negative pole links to each other with DC power supply module's ground connection. The positive electrode of the output controlled end of the normally closed relay NC is connected with the live wire of the alternating current power supply module, the negative electrode of the output controlled end of the normally closed relay NC is connected with one end of a coil of the AF contactor, and the other end of the coil of the AF contactor is connected with the zero line of the alternating current power supply module. The live wire of the long-term power supply is connected with one end of a normally closed switch of the AF contactor, the other end of the normally closed switch is connected with one end of a load resistor, and the other end of the load resistor is connected with a zero line of the long-term power supply.
And one side of the load resistor is provided with a cooling fan, the cooling fan is powered by a third power supply, and a normally closed switch of the AF contactor is connected in series in a power supply loop formed by the cooling fan and the third power supply.
The electronic load comprises a communication network port.
By adopting the scheme, the method has the following advantages:
because the discharging unit of the long-term reliable discharging test integrated device comprises the electronic load and the control box, the electronic load and the control box are both connected with the long-term power supply in an adaptive manner, the electronic load is connected with the control box in an adaptive manner, the control box comprises the load resistor, and the load resistor and the electronic load are mutually standby. When the electronic load is used, the electronic load and the long-term power supply are in a circuit during normal operation, and the load resistor and the long-term power supply are in an open circuit. The electronic load has high self-adjusting precision, less heating and maintainability, thereby solving the problems of poor adjusting precision, high heating of the load and non-maintainability in the background technology. Meanwhile, the load resistor and the electronic load are mutually standby, when the electronic load is abnormal, the electronic load and the long-term power supply are disconnected, and the load resistor in the control box and the long-term power supply are connected, so that switching is realized, and the problem of test interruption caused by load faults is avoided.
Drawings
FIG. 1 is a schematic diagram of a long-term reliable discharge test integrated device of the present utility model (embodiment one);
FIG. 2 is a schematic diagram of the long-term reliable discharge test integrated device of the present utility model in a two-state implementation;
FIG. 3 is a schematic diagram of a long-term reliable discharge test integrated device control box and electronic assisted switching of the present utility model.
Detailed Description
The utility model is described in further detail below with reference to the drawings and examples.
Example 1
As shown in fig. 1 and 3, the long-term reliable discharge test integrated device of the present embodiment includes a long-term power supply and a discharge unit, and the long-term power supply is adaptively connected with the discharge unit. The discharge unit contains an electronic load and a control box. The electronic load contains singlechip, signal relay KS and first contactor, and the singlechip model is TMS28335 in this embodiment, and the power of singlechip is provided by the mainboard of electronic load, and the external drive power supply of mainboard of electronic load, the specific structure of electronic load mainboard belong to prior art, and this is not described in detail here. The signal relay KS is a direct current solid state relay. The signal relay KS and the first contactor are connected with the singlechip in an adaptive manner, the singlechip sends control signals to the signal relay KS and the first contactor, and the input control end of the signal relay KS is controlled to be electrified or not to control the on-off of the first contactor. And isolating switches are arranged between the first contactor and the positive electrode and the negative electrode of the long-term power supply.
The control box contains load resistance and control switch, and control switch contains normally closed relay NC and AF contactor. The positive electrode of the controlled output end of the signal relay KS is connected with the output end of the direct current power supply module, the negative electrode of the controlled output end of the signal relay KS is connected with the positive electrode of the diode D, the negative electrode of the diode D is connected with the positive electrode of the input control end of the normally closed relay NC, and the negative electrode of the input control end of the normally closed relay NC is connected with the grounding end of the direct current power supply module. The positive electrode of the output controlled end of the normally closed relay NC is connected with the live wire of the alternating current power supply module, the negative electrode of the output controlled end of the normally closed relay NC is connected with one end of a coil of the AF contactor, and the other end of the coil of the AF contactor is connected with the zero line of the alternating current power supply module. The live wire of the long-term power supply is connected with one end of a normally closed switch of the AF contactor, the other end of the normally closed switch is connected with one end of a load resistor, and the other end of the load resistor is connected with a zero line of the long-term power supply.
When the electronic load fails, the singlechip sends a turn-off signal to the first contactor, the first contactor is turned off, the long-term power supply is disconnected from the loop of the electronic load, and the resistance load is disconnected from the long-term power supply. Meanwhile, the input control end of the single chip microcomputer control signal relay KS is powered on, a positive electrode and a negative electrode of the output controlled end of the signal relay KS form a passage, the input control end of the normally closed relay NC is powered on, the output controlled end of the normally closed relay NC is disconnected, a coil of the AF contactor is powered off, a normally closed switch of the AF contactor is closed, a long-term power supply and a load resistor form a passage, and load discharge is continuously realized. At this time, can maintain electronic load, in order to prevent unexpected, the manual isolator that opens before the maintenance ensures safety.
After the maintenance of the resistance load is completed, the isolating switch is manually closed, the singlechip controls the first contactor to be closed, and the long-term power supply is conducted with the loop of the electronic load. Meanwhile, the input control end of the single chip microcomputer control signal relay KS is powered off, the positive electrode and the negative electrode of the output controlled end of the signal relay KS are disconnected, the input control end of the normally closed relay NC is powered off, the output controlled end of the normally closed relay NC forms a passage, the coil of the AF contactor is powered on, the normally closed switch of the AF contactor is disconnected, the long-term power supply is disconnected from the loop of the load resistor, and the electronic load is normally discharged.
Example two
As shown in fig. 2 and 3, the long-term reliable discharge test integrated device of the present embodiment includes a long-term power supply and a discharge unit, and the long-term power supply is adaptively connected with the discharge unit. The discharge unit contains a control box and two electronic loads. The electronic load contains singlechip, signal relay KS and first contactor, and the singlechip model is TMS28335 in this embodiment, and the power of singlechip is provided by the mainboard of electronic load, and the external drive power supply of mainboard of electronic load, the specific structure of electronic load mainboard belong to prior art, and this is not described in detail here. The signal relay KS is a direct current solid state relay. In the same electronic load, the signal relay KS and the first contactor are connected with the singlechip in an adaptive manner, and the singlechip sends control signals to the corresponding signal relay KS and the first contactor to control whether an input control end of the signal relay KS is electrified or not and control the on-off of the first contactor. The singlechip of two resistors is connected in an adaptive way and is used for realizing information interaction. And isolating switches are arranged between the first contactor and the positive electrode and the negative electrode of the long-term power supply. In this embodiment, the load resistor is formed by connecting 18 resistors with a resistance value of 1.5KW in parallel.
The control box contains load resistance and control switch, and control switch contains normally closed relay NC and AF contactor. The positive electrode of the controlled output end of the signal relay KS is connected with the output end of the direct current power supply module, the negative electrode of the controlled output end of the signal relay KS is connected with the positive electrode of the diode D, the negative electrode of the diode D is connected with the positive electrode of the input control end of the normally closed relay NC, and the negative electrode of the input control end of the normally closed relay NC is connected with the grounding end of the direct current power supply module. The positive electrode of the output controlled end of the normally closed relay NC is connected with the live wire of the alternating current power supply module, the negative electrode of the output controlled end of the normally closed relay NC is connected with one end of a coil of the AF contactor, and the other end of the coil of the AF contactor is connected with the zero line of the alternating current power supply module. The live wire of the long-term power supply is connected with one end of a normally closed switch of the AF contactor, the other end of the normally closed switch is connected with one end of a load resistor, and the other end of the load resistor is connected with a zero line of the long-term power supply.
One side of the load resistor is provided with a cooling fan, the cooling fan is powered by a third power supply, and a normally closed switch of the AF contactor is connected in series in a power supply loop formed by the cooling fan and the third power supply.
The electronic loads all contain communication network ports so as to send detection data to the outside through a network.
When one of the electronic loads (hereinafter referred to as a first resistor load) fails during use, the singlechip of the electronic load sends a turn-off signal to the corresponding first contactor, the first contactor is turned off, a long-term power supply is disconnected from a loop of the electronic load, and the resistor load is disconnected from the long-term power supply. Meanwhile, the input control end of the single chip microcomputer control signal relay KS is powered on, a positive electrode and a negative electrode of the output controlled end of the signal relay KS form a passage, the input control end of the normally closed relay NC is powered on, the output controlled end of the normally closed relay NC is disconnected, a coil of the AF contactor is powered off, a normally closed switch of the AF contactor is closed, a long-term power supply and a load resistor form a passage, and load discharge is continuously realized. And then, the single chip microcomputer of the first resistance load electronic load transmits fault information to the single chip microcomputer of the second electronic load, the single chip microcomputer of the second electronic load controls the second electronic load to start, the first relay of the second electronic load is closed, a passage is formed between the second electronic load and the long-term circuit, and the second electronic load is normally discharged. Meanwhile, the singlechip of the first electronic load controls the input control end of the corresponding signal relay KS to lose electricity, the positive electrode and the negative electrode of the output controlled end of the signal relay KS are disconnected, the input control end of the normally closed relay NC is in failure, the output controlled end of the normally closed relay NC forms a passage, the coil of the AF contactor is electrified, the normally closed switch of the AF contactor is disconnected, and the long-term power supply is disconnected from the loop of the load resistor. When the electronic load is maintained, in order to prevent accidents, the isolating switch is manually opened before maintenance, safety is ensured, and after the maintenance of the resistor load is completed, the isolating switch is manually closed.

Claims (7)

1. The long-term reliable discharge test integrated device comprises a long-term power supply and a discharge unit, wherein the long-term power supply is connected with the discharge unit in an adaptive manner; the discharging unit is characterized by comprising an electronic load and a control box, wherein the control box comprises a load resistor, the electronic load and the control box are connected with a long-term power supply in an adaptive manner, the electronic load is connected with the control box in an adaptive manner, and the load resistor and the electronic load are mutually standby.
2. The long-term reliable discharge test integrated apparatus of claim 1 wherein the electronic load has two, which are mutually redundant, and wherein the two electronic loads are adapted to be connected.
3. The long-term reliable discharge test integrated device according to claim 1, wherein the electronic load comprises a single chip microcomputer, a signal relay KS and a first contactor, and the signal relay KS and the first contactor are connected with the single chip microcomputer in an adaptive connection manner; the positive electrode and the negative electrode of the long-term power supply are both connected with the two first contactors in an adaptive manner; the control box comprises a control switch, the positive electrode of the long-term power supply is connected with the control switch in an adaptive manner, the control switch is connected with one end of a load resistor in an adaptive manner, and the other end of the load resistor is connected with the negative electrode of the long-term power supply; the signal relays KS are all connected with the control switch in an adaptive mode.
4. The long term reliable discharge test integrated device of claim 3 wherein the first contactor is isolated from both the positive and negative poles of the long term power supply.
5. The long-term reliable discharge test integrated device of claim 3 wherein said control switch comprises normally closed relays NC and AF contactors, said signal relay KS being a dc solid state relay; the positive electrode and the negative electrode of the input control end of the signal relay KS are connected with the corresponding single chip microcomputer in an adapting way, the positive electrode of the output controlled end of the signal relay KS is connected with the output end of the direct current power supply module, the negative electrode of the output controlled end of the signal relay KS is connected with the positive electrode of the diode D, the negative electrode of the diode D is connected with the positive electrode of the input control end of the normally closed relay NC, and the negative electrode of the input control end of the normally closed relay NC is connected with the grounding end of the direct current power supply module; the positive electrode of the output controlled end of the normally closed relay NC is connected with the live wire of the alternating current power supply module, the negative electrode of the output controlled end of the normally closed relay NC is connected with one end of a coil of the AF contactor, and the other end of the coil of the AF contactor is connected with the zero line of the alternating current power supply module; the live wire of the long-term power supply is connected with one end of a normally closed switch of the AF contactor, the other end of the normally closed switch is connected with one end of a load resistor, and the other end of the load resistor is connected with a zero line of the long-term power supply.
6. The long-term reliable discharge test integrated device according to claim 1, wherein a radiator fan is provided on one side of the load resistor, the radiator fan is powered by a third power supply, and the normally closed switch of the AF contactor is connected in series in a power supply loop formed by the radiator fan and the third power supply.
7. The long term reliable discharge test integrated apparatus of any of claims 1-6 wherein the electronic load comprises a communication portal.
CN202321508244.1U 2023-06-14 2023-06-14 Long-term reliable discharge test integrated device Active CN220154610U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202321508244.1U CN220154610U (en) 2023-06-14 2023-06-14 Long-term reliable discharge test integrated device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202321508244.1U CN220154610U (en) 2023-06-14 2023-06-14 Long-term reliable discharge test integrated device

Publications (1)

Publication Number Publication Date
CN220154610U true CN220154610U (en) 2023-12-08

Family

ID=89012736

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202321508244.1U Active CN220154610U (en) 2023-06-14 2023-06-14 Long-term reliable discharge test integrated device

Country Status (1)

Country Link
CN (1) CN220154610U (en)

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