CN220064232U - Square resistance non-contact type testing device for semiconductor production - Google Patents
Square resistance non-contact type testing device for semiconductor production Download PDFInfo
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- CN220064232U CN220064232U CN202321375697.1U CN202321375697U CN220064232U CN 220064232 U CN220064232 U CN 220064232U CN 202321375697 U CN202321375697 U CN 202321375697U CN 220064232 U CN220064232 U CN 220064232U
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 31
- 238000012360 testing method Methods 0.000 title claims abstract description 27
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 19
- 238000001514 detection method Methods 0.000 claims description 7
- 230000000694 effects Effects 0.000 abstract description 4
- 238000000034 method Methods 0.000 abstract description 4
- 239000011449 brick Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000004020 conductor Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Abstract
The utility model discloses a sheet resistance non-contact testing device for semiconductor production, which comprises a main body assembly, a test device and a test device, wherein the main body assembly comprises a device main body, a machine body arranged on the device main body, a display screen arranged on the machine body and an electric connection wire arranged on the machine body; the effective fixed subassembly, including installing the chassis on the device main part, start supporting bench on the chassis, install the support frame on the chassis, install the extension frame on the support frame, begin the first spout on the extension frame, set up the flexible mouth on the extension frame, install the fixed plate in first spout, set up the expansion tank on the fixed plate, install the spring in the expansion tank, install the expansion block on the spring. The device is convenient to install and detach in the using process by the mutual matching of the main body structure and the effective fixing structure, is convenient for equipment to move, has high flexibility, has a fixing effect and high stability, and is convenient for detecting semiconductors.
Description
Technical Field
The utility model relates to the technical field of semiconductor sheet resistance testing equipment, in particular to a sheet resistance non-contact testing device for semiconductor production.
Background
The semiconductor refers to a material with conductivity between a conductor and an insulator at normal temperature, the semiconductor has wide application in radio, television and temperature measurement, for example, a diode is a device manufactured by adopting the semiconductor, the semiconductor refers to a material with controllable conductivity ranging from the insulator to the conductor, after the semiconductor is produced, the semiconductor needs to be subjected to sheet resistance test, in the prior art, a testing device is usually fixedly arranged at a certain position and cannot be flexibly moved, or is directly placed on a certain object, and the stability is poor.
Disclosure of Invention
Therefore, the utility model aims to provide the sheet resistance non-contact type testing device for semiconductor production, which is convenient to install and detach in the use process by the mutual matching of the arranged main body structure and the effective fixing structure, is convenient for equipment to move, has high flexibility, simultaneously has strong fixing effect and high stability, and is convenient for detecting the semiconductor.
In order to solve the technical problems, according to one aspect of the present utility model, the following technical solutions are provided:
a television remote control for facilitating searching, comprising:
the main body assembly comprises a device main body, a machine body arranged on the device main body, a display screen arranged on the machine body and an electric wiring arranged on the machine body;
the effective fixing component comprises a bottom frame installed on the device main body, a supporting table started on the bottom frame, a supporting frame installed on the bottom frame, an extending frame installed on the supporting frame, a first sliding groove started on the extending frame, a telescopic opening formed in the extending frame, a fixing plate installed in the first sliding groove, a telescopic groove formed in the fixing plate, a spring installed in the telescopic groove and a telescopic block installed on the spring.
As a preferable mode of the sheet resistance non-contact test device for semiconductor production according to the present utility model, the fixing plate slides in the first slide groove.
As a preferable mode of the sheet resistance non-contact test device for semiconductor production of the present utility model, the expansion block is fixed to the body through the expansion port.
As a preferable mode of the sheet resistance non-contact test device for semiconductor production of the present utility model, the machine body is placed on the support table.
As a preferable scheme of the sheet resistance non-contact testing device for semiconductor production, the sheet resistance non-contact testing device further comprises a convenient assembly, wherein the convenient assembly comprises a detection port arranged at the bottom of the machine body, a second sliding groove arranged on the underframe, a direct object placing plate arranged on the underframe, sliding blocks arranged on two sides of the object placing plate and a placing groove arranged on the object placing plate.
As a preferable mode of the sheet resistance non-contact test device for semiconductor production according to the present utility model, the slider slides in the second slide groove.
Compared with the prior art, the utility model has the following beneficial effects: through the main structure and the mutual cooperation of effective fixed knot who set up, reach in the in-process of using, the device is convenient for install and dismantle, facilitate the equipment removes, the flexibility is high, the fixity effect simultaneously, and stability is strong, and it detects to conveniently, when specifically using, place the organism on the brace table of chassis, the support frame is hugged closely to the organism rear side, press the telescopic brick, the telescopic brick is to the shrink of expansion tank internal contraction, the spring shrink, slide the fixed plate along first spout, hug closely the organism, the telescopic brick corresponds with the flexible mouth, the spring resets, the telescopic brick pops out from the flexible mouth, carry out spacing fixedly to the organism, place the object that will detect in the standing groove of putting on the thing board, promote to put the thing board, the slider slides in the second spout, promote the detected object to detect to the mouth below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the following detailed description of the embodiments of the present utility model will be given with reference to the accompanying drawings, which are to be understood as merely some embodiments of the present utility model, and from which other drawings can be obtained by those skilled in the art without inventive faculty. Wherein:
FIG. 1 is a block diagram of a body assembly of the present utility model;
FIG. 2 is a block diagram of an effective fixation assembly of the present utility model;
FIG. 3 is a block diagram of a portable assembly of the present utility model.
In the figure: 100. a body assembly; 110. a device body; 120. a body; 130. a display screen; 140. an electrical connection; 200. an effective fixing component; 210. a chassis; 215. a support table; 220. a support frame; 230. an extension frame; 235. a first chute; 240. a telescopic opening; 250. a fixing plate; 260. a telescopic slot; 270. a spring; 280. a telescopic block; 300. a convenient component; 310. a detection port; 320. a second chute; 330. a storage plate; 340. a slide block; 350. and (5) placing a groove.
Detailed Description
In order that the above objects, features and advantages of the utility model will be readily understood, a more particular description of the utility model will be rendered by reference to the appended drawings.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present utility model, but the present utility model may be practiced in other ways other than those described herein, and persons skilled in the art will readily appreciate that the present utility model is not limited to the specific embodiments disclosed below.
In the following detailed description of the embodiments of the present utility model, the cross-sectional view of the device structure is not partially enlarged to a general scale for the convenience of description, and the schematic is merely an example, which should not limit the scope of the present utility model. In addition, the three-dimensional dimensions of length, width and depth should be included in actual fabrication.
For the purpose of making the objects, technical solutions and advantages of the present utility model more apparent, embodiments of the present utility model will be described in further detail below with reference to the accompanying drawings.
The utility model provides a sheet resistance non-contact type testing device for semiconductor production, which is convenient to install and detach in the use process by the mutual matching of a main body structure and an effective fixing structure, is convenient for equipment to move, has high flexibility, simultaneously has a fixing effect and strong stability, and is convenient for detecting semiconductors.
Example 1
Fig. 1 and 2 are schematic views showing an overall structure of an embodiment of a sheet resistance non-contact testing device for semiconductor production according to the present utility model, referring to fig. 1 and 2, the main structure of the embodiment includes: a body assembly 100 and an effective fixation assembly 200.
The main body assembly 100 is used for semiconductor side testing, and specifically, the main body assembly 100 comprises a device main body 110, a body 120 mounted on the device main body 110, a display screen 130 mounted on the body 120, and an electric connection 140 mounted on the body 120; in particular use, body 110 tests semiconductors.
The effective fixing component 200 is used for fixing a detection device, and specifically, the effective fixing component 200 comprises a chassis 210 installed on a device main body 110, a supporting table 215 started on the chassis 210, a supporting frame 220 installed on the chassis 210, an extension frame 230 installed on the supporting frame 220, a first sliding groove 235 started on the extension frame 230, a telescopic opening 240 formed on the extension frame 230, a fixing plate 250 installed in the first sliding groove 235, a telescopic groove 260 formed on the fixing plate 250, a spring 270 installed in the telescopic groove 260, and a telescopic block 280 installed on the spring 270, when the effective fixing component is specifically used, the machine body 120 is placed on the supporting table 215 of the chassis 210, the rear side of the machine body 120 is tightly attached to the supporting frame 220, the telescopic block 280 is pressed, the telescopic block 280 is contracted towards the telescopic groove 260, the spring 270 is contracted, the fixing plate 250 is slid along the first sliding groove 235, the telescopic block 280 corresponds to the telescopic opening 240, the spring 270 is reset, the telescopic block 280 is ejected out of the telescopic opening 240, and the fixing plate 120 is limited, so that equipment can be conveniently installed and detached, and meanwhile, the flexibility is high, the stability is achieved.
Example 2
Referring to fig. 2, the present embodiment further includes a portable component 300 on the basis of embodiment 1, where the portable component 300 includes a detection opening 310 installed at the bottom of the machine body 120, a second chute 320 provided on the bottom frame 210, a storage plate 330 installed directly on the bottom frame 210, sliding blocks 340 installed on two sides of the storage plate 330, and a placement groove 350 provided on the storage plate 330, and when in specific use, an object to be detected is placed in the placement groove 350 on the storage plate 330, the storage plate 330 is pushed, the sliding blocks 340 slide in the second chute 320, and the detected object is pushed to the position below the detection opening 310 for detection, so that the arrangement can facilitate the test of the semiconductor.
Although the utility model has been described hereinabove with reference to embodiments, various modifications thereof may be made and equivalents may be substituted for elements thereof without departing from the scope of the utility model. In particular, the features of the disclosed embodiments may be combined with each other in any manner as long as there is no structural conflict, and the exhaustive description of these combinations is not given in this specification merely for the sake of omitting the descriptions and saving resources. Therefore, it is intended that the utility model not be limited to the particular embodiment disclosed, but that the utility model will include all embodiments falling within the scope of the appended claims.
Claims (6)
1. A sheet resistance non-contact test device for semiconductor production, comprising:
a body assembly (100) including a device body (110), a body (120) mounted on the device body (110), a display screen (130) mounted on the body (120), and an electrical connection (140) mounted on the body (120);
the effective fixing assembly (200) comprises a bottom frame (210) arranged on the device main body (110), a supporting table (215) started on the bottom frame (210), a supporting frame (220) arranged on the bottom frame (210), an extending frame (230) arranged on the supporting frame (220), a first sliding groove (235) started on the extending frame (230), a telescopic opening (240) arranged on the extending frame (230), a fixing plate (250) arranged in the first sliding groove (235), a telescopic groove (260) arranged on the fixing plate (250), a spring (270) arranged in the telescopic groove (260) and a telescopic block (280) arranged on the spring (270).
2. The sheet resistance non-contact test apparatus for semiconductor production according to claim 1, wherein the fixing plate (250) slides in the first chute (235).
3. The sheet resistance non-contact test device for semiconductor production according to claim 1, wherein the expansion block (280) passes through the expansion port (240) to fix the body (120).
4. The sheet resistance non-contact test apparatus for semiconductor production according to claim 1, wherein the body (120) is placed on the support table (215).
5. The sheet resistance non-contact testing device for semiconductor production according to claim 1, further comprising a convenient assembly (300), wherein the convenient assembly (300) comprises a detection port (310) arranged at the bottom of the machine body (120), a second sliding groove (320) arranged on the bottom frame (210), a direct object placing plate (330) arranged on the bottom frame (210), sliding blocks (340) arranged on two sides of the object placing plate (330), and a placing groove (350) arranged on the object placing plate (330).
6. The sheet resistance non-contact test apparatus for semiconductor production according to claim 5, wherein the slider (340) slides in the second chute (320).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321375697.1U CN220064232U (en) | 2023-06-01 | 2023-06-01 | Square resistance non-contact type testing device for semiconductor production |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321375697.1U CN220064232U (en) | 2023-06-01 | 2023-06-01 | Square resistance non-contact type testing device for semiconductor production |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220064232U true CN220064232U (en) | 2023-11-21 |
Family
ID=88751891
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321375697.1U Active CN220064232U (en) | 2023-06-01 | 2023-06-01 | Square resistance non-contact type testing device for semiconductor production |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220064232U (en) |
-
2023
- 2023-06-01 CN CN202321375697.1U patent/CN220064232U/en active Active
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