CN220064184U

CN220064184U - Test probe assembly

Info

Publication number: CN220064184U
Application number: CN202320717146.2U
Authority: CN
Inventors: 方经军
Original assignee: Suzhou Stende Electronic Technology Co ltd
Current assignee: Suzhou Stende Electronic Technology Co ltd
Priority date: 2023-04-04
Filing date: 2023-04-04
Publication date: 2023-11-21
Anticipated expiration: 2033-04-04

Abstract

The utility model discloses a test probe assembly, which comprises an adapter rod, a needle sleeve and a reinforcing unit; a connecting rod: the upper end of the outer cambered surface is provided with a mounting hooping groove, a threaded bulge arranged at the bottom end of the outer cambered surface of the connecting rod is in threaded connection with a threaded groove correspondingly arranged at the upper end of the inner cambered wall of the needle sleeve, the needle sleeve is internally and slidably connected with a contact pin, the connecting rod is internally provided with a concave cavity, and the upper end of the inner cambered wall of the needle sleeve is provided with a limit groove which is bilaterally symmetrical; reinforcing unit: the reinforcing unit is arranged in the concave cavity and is movably clamped with the limiting groove; wherein: the reinforcing unit comprises a storage cavity and a limiting block, the storage cavity is symmetrically arranged at the lower end of the outer cambered surface of the connecting rod in a left-right mode, the storage cavity is communicated with the concave cavity, and the limiting block is rotationally connected to the inside of the storage cavity through a pin shaft; this test probe subassembly can guarantee the simple operation nature when promoting overall structure's connection stability, makes things convenient for personnel to change the contact pin.

Description

Test probe assembly

Technical Field

The utility model relates to the technical field of electrical element testing, in particular to a test probe assembly.

Background

A test probe is a tool for testing and diagnosing semiconductors or circuit boards in electronic devices, typically small pin contacts mounted in a test device or test instrument. During testing, test probes may be inserted into circuit board connectors or plugs to detect connection and communication of circuits in the circuit board or to detect the operational status of specific components or test points in the circuit board.

The test probes are typically comprised of electrically conductive pin-shaped members that can be easily inserted into a connector of a circuit board for testing and measurement. In operation, the circuit board probes can help diagnose shorts in the circuit board, find problems with signal loss and shorted circuits, and detect other operational and performance problems in the circuit board.

The existing test probe assembly generally needs to be integrally replaced after the contact pin in the existing test probe assembly reaches the service life, so that a certain degree of resource waste is caused, a small part of the test probe assembly which can be used for independently replacing the contact pin is generally designed in a combined mode, the connection and fixation between the connecting rod and the needle sleeve are generally fixed in a threaded connection mode, and the connection stability between the connecting rod and the needle sleeve is difficult to further improve on the basis.

Disclosure of Invention

The utility model aims to overcome the existing defects, provide a test probe assembly, ensure the operation convenience while improving the connection stability of the whole structure, facilitate the replacement of a contact pin by personnel, and effectively solve the problems in the background art.

In order to achieve the above purpose, the present utility model provides the following technical solutions: the test probe assembly comprises a connecting rod, a needle sleeve and a reinforcing unit;

a connecting rod: the upper end of the outer cambered surface is provided with a mounting hooping groove, a threaded bulge arranged at the bottom end of the outer cambered surface of the connecting rod is in threaded connection with a threaded groove correspondingly arranged at the upper end of the inner cambered wall of the needle sleeve, the needle sleeve is internally and slidably connected with a contact pin, the connecting rod is internally provided with a concave cavity, and the upper end of the inner cambered wall of the needle sleeve is provided with a limit groove which is bilaterally symmetrical;

reinforcing unit: the reinforcing unit is arranged in the concave cavity, and is movably clamped with the limiting groove, so that the connection stability of the whole structure can be improved, the operation convenience can be guaranteed, and the contact pin can be replaced conveniently by personnel.

Further, the reinforcement unit is including accomodating chamber and stopper, accomodate the chamber bilateral symmetry and offer in the extrados lower extreme of connecting rod, accomodate the chamber and all be linked together with the cavity, accomodate the inside in chamber and all be connected with the stopper through the round pin axle rotation, two stoppers respectively with the adjacent spacing groove activity joint of homonymy, can realize the reinforcement spacing to connecting rod and needle cover.

Further, the reinforcement unit still includes lifter pin and triangle-shaped breach, the vertical sliding connection of lifter pin is in the inside of cavity, and the extrados lower extreme of lifter pin is equipped with bilateral symmetry's triangle-shaped breach, and the relative inboard end of two stopper all is located inside the adjacent triangle-shaped breach of homonymy, can drive the stopper and take place to rotate.

Further, the reinforcement unit further comprises a first spring, the first spring is arranged on the step surface at the lower end of the inner portion of the concave cavity, the upper end of the first spring is fixedly connected with the step surface at the middle portion of the lifting pin, and the first spring is sleeved outside the lifting pin, so that the lifting pin can be driven to automatically reset.

Further, a second spring is arranged in the needle sleeve, the bottom end of the second spring is in contact with the upper surface of the contact pin, and the upper end of the second spring is in contact with the bottom surface of the connecting rod, so that a certain elastic displacement compensation effect can be provided for the contact pin, and the contact pin can be in normal contact with semiconductors or circuit boards with different thicknesses during testing.

Furthermore, the first spring and the second spring are plastic insulating springs, so that the first spring or the second spring can be prevented from being magnetized under the action of an electric field force to lose elasticity in the testing process.

Furthermore, the outer cambered surfaces of the connecting rod and the needle sleeve are respectively provided with an anti-slip groove which is uniformly distributed, so that the friction coefficient between the fingers of a person and the connecting rod or the needle sleeve can be increased, and the operation of the person is facilitated.

Compared with the prior art, the utility model has the beneficial effects that: the test probe assembly has the following advantages:

1. when the semiconductor or circuit board is required to be tested, a person installs the connecting rod in the probe socket of the external test tool through the mounting hoop groove, so that the connecting rod is fixed, in the subsequent test process, the contact pin is enabled to be in contact with the semiconductor or circuit board by utilizing the driving of the external test tool, the test work can be carried out, and the second spring can provide a certain elastic displacement compensation effect for the contact pin, so that the contact pin can be normally contacted with the semiconductor or circuit board when the semiconductors or circuit boards with different thicknesses are tested, and the accuracy of the test result of the semiconductor or circuit board is ensured.

2. When the personnel need change the contact pin, can manual pressure lift pin makes its lower shift, the inboard end of this in-process stopper receives the restriction of triangle-shaped breach can the downturn, make the outside fixture block of stopper follow the inside of spacing groove unscrew and remove the reinforcement spacing of connecting rod and needle cover, afterwards the personnel manually release the threaded connection relation of connecting rod and needle cover can make both separate and change the contact pin, accomplish the change to the contact pin and with connecting rod and needle cover threaded connection once more after, personnel unclamp the lift pin, the lift pin can drive stopper together to reset because of the elastic potential energy influence of first spring, make the outside fixture block of stopper block card in the inside of spacing groove again, guarantee the operating convenience when promoting overall structure's connection stability.

Drawings

FIG. 1 is a schematic diagram of the structure of the present utility model;

FIG. 2 is a schematic view of the present utility model in an inner cross-section;

fig. 3 is an enlarged schematic view of the structure of the present utility model at a.

In the figure: the connecting rod 1, the mounting hooping groove 2, the needle sleeve 3, the contact pin 4, the concave cavity 5, the limiting groove 6, the reinforcing unit 7, the storage cavity 71, the limiting block 72, the lifting pin 73, the triangular notch 74, the first spring 75, the second spring 8 and the anti-skid groove 9.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Referring to fig. 1-3, the present embodiment provides a technical solution: the test probe assembly comprises an adapter rod 1, a needle sleeve 3 and a reinforcing unit 7;

joining rod 1: the upper end of the outer arc surface of the connecting rod 1 is provided with a mounting hooping groove 2, a threaded bulge arranged at the bottom end of the outer arc surface of the connecting rod 1 is in threaded connection with a threaded groove correspondingly arranged at the upper end of the inner arc wall of the needle sleeve 3, the inside of the needle sleeve 3 is slidably connected with a contact pin 4, the inside of the connecting rod 1 is provided with a concave cavity 5, the upper end of the inner arc wall of the needle sleeve 3 is provided with a limit groove 6 which is bilaterally symmetrical, when a semiconductor or a circuit board is required to be tested, a person firstly installs the connecting rod 1 in a probe socket of an external test tool through the mounting hooping groove 2, so that the connecting rod 1 is fixed, and in the subsequent test process, the contact pin 4 is enabled to be in contact with the semiconductor or the circuit board by utilizing the driving of the external test tool;

reinforcement unit 7: the reinforcement unit 7 is movably clamped with the limit groove 6 in the cavity 5, the reinforcement unit 7 comprises a storage cavity 71 and limit blocks 72, the storage cavity 71 is symmetrically arranged at the lower end of the outer arc surface of the joint rod 1 in a left-right mode, the storage cavity 71 is communicated with the cavity 5, the limit blocks 72 are rotatably connected to the inside of the storage cavity 71 through pin shafts, the two limit blocks 72 are movably clamped with limit grooves 6 adjacent to the same side respectively, the reinforcement unit 7 further comprises a lifting pin 73 and a triangular notch 74, the lifting pin 73 is vertically and slidably connected to the inside of the cavity 5, the lower end of the outer arc surface of the lifting pin 73 is provided with a triangular notch 74 which is symmetrically arranged at the lower end of the outer arc surface of the lifting pin 73, opposite inner side ends of the two limit blocks 72 are respectively positioned in the triangular notch 74 adjacent to the same side, the reinforcement unit 7 further comprises a first spring 75, the first spring 75 is arranged on the step surface at the lower end of the inside of the cavity 5, the upper end of the first spring 75 is fixedly connected with the step surface at the middle of the lifting pin 73, the first spring 75 is sleeved outside the lifting pin 73, when a person needs to replace the contact pin 4, the contact pin 73 can be manually pressed down to enable the inner side of the contact pin 73 to move down, the contact pin 73 is enabled to be separated from the corresponding to the limit sleeve 3, the limit blocks 3 can be separated from the inner side of the limit block 1, the limit sleeve 3 and the limit sleeve 3 is released from the limit sleeve 3 by the limit sleeve 3, the limit sleeve 3 is replaced by the manual force, and the limit sleeve 3 is replaced by the limit sleeve 3, and the limit joint rod 3 is replaced by the limit pin 3, and the limit pin 3 is screwed down by the limit sleeve 3, and the limit joint pin 3 is moved down and the limit-shaped tightly, the connection stability of the integral structure is improved, and meanwhile, the operation convenience is guaranteed.

Wherein: the second spring 8 is arranged in the needle sleeve 3, the bottom end of the second spring 8 is in contact with the upper surface of the contact pin 4, the upper end of the second spring 8 is in contact with the bottom surface of the connecting rod 1, and the second spring 8 can provide a certain elastic displacement compensation effect for the contact pin 4, so that the contact pin 4 can be in normal contact with semiconductors or circuit boards with different thicknesses when the semiconductors or circuit boards are tested, and the accuracy of the test results of the semiconductors or the circuit boards is ensured.

Wherein: the first spring 75 and the second spring 8 are plastic insulating springs, so that the first spring 75 or the second spring 8 can be prevented from being magnetized under the action of an electric field force to lose elasticity in the testing process.

Wherein: the outer cambered surfaces of the connecting rod 1 and the needle sleeve 3 are respectively provided with an anti-skid groove 9 which is uniformly distributed, so that the friction coefficient between the fingers of a person and the connecting rod 1 or the needle sleeve 3 can be increased, and the operation of the person is facilitated.

The working principle of the test probe assembly provided by the utility model is as follows: when the semiconductor or circuit board is required to be tested, a person firstly installs the connecting rod 1 in a probe socket of an external test tool through the mounting hooping slot 2, the fixing of the connecting rod 1 is achieved, in the subsequent test process, the contact pin 4 is enabled to be in contact with the semiconductor or circuit board by utilizing the driving of the external test tool, the test work can be carried out, the second spring 8 can provide a certain elastic displacement compensation effect for the contact pin 4, so that the contact pin 4 can be normally contacted with the semiconductor or circuit board when the semiconductors or circuit boards with different thicknesses are tested, the accuracy of the test result of the semiconductor or circuit board is ensured, in addition, when the person needs to replace the contact pin 4, the person can manually press the lifting pin 73 to enable the lifting pin 73 to move downwards, the inner end of the limiting block 72 is limited by the triangular notch 74 in the process, the outer side clamping block of the limiting block 72 is enabled to rotate downwards from the inner side of the limiting groove 6, the reinforcing limiting limit of the connecting rod 1 and the needle sleeve 3 can be released, then the person can manually release the threaded connection relation between the connecting rod 1 and the needle sleeve 3 to enable the contact pin 4 to be replaced, the contact pin 4 can be replaced when the replacement of the contact pin 4 is completed, the contact pin 1 and the needle sleeve 3 can be connected with the needle sleeve 3 through the pin 3, the elastic connection pin 73 can be conveniently and the elastic connection pin 73 can be lifted by the person to the lifting pin 73, the elastic connection pin can be conveniently and easily lifted by the person to have the lifting pin 73 and the limiting block 75 can be connected with the inner side 75.

The foregoing description is only illustrative of the present utility model and is not intended to limit the scope of the utility model, and all equivalent structures or equivalent processes or direct or indirect application in other related technical fields are included in the scope of the present utility model.

Claims

1. Test probe subassembly, its characterized in that: comprises a connecting rod (1), a needle sleeve (3) and a reinforcing unit (7);

connecting rod (1): the upper end of the outer cambered surface is provided with a mounting hooping groove (2), a threaded bulge arranged at the bottom end of the outer cambered surface of the connecting rod (1) is in threaded connection with a threaded groove correspondingly arranged at the upper end of the inner cambered wall of the needle sleeve (3), the inside of the needle sleeve (3) is connected with a contact pin (4) in a sliding manner, a concave cavity (5) is arranged in the connecting rod (1), and the upper end of the inner cambered wall of the needle sleeve (3) is provided with a limit groove (6) which is bilaterally symmetrical;

reinforcement unit (7): the reinforcing unit (7) is movably clamped with the limiting groove (6) in the concave cavity (5).

2. The test probe assembly of claim 1, wherein: the reinforcing unit (7) comprises a storage cavity (71) and limiting blocks (72), the storage cavity (71) is symmetrically arranged at the lower end of the outer arc surface of the connecting rod (1), the storage cavity (71) is communicated with the concave cavity (5), the limiting blocks (72) are rotationally connected to the inside of the storage cavity (71) through pin shafts, and the two limiting blocks (72) are movably clamped with limiting grooves (6) adjacent to the same side respectively.

3. The test probe assembly of claim 2, wherein: the reinforcing unit (7) further comprises a lifting pin (73) and a triangular notch (74), the lifting pin (73) is vertically connected to the inside of the concave cavity (5) in a sliding mode, the triangular notch (74) which is bilaterally symmetrical is arranged at the lower end of the outer cambered surface of the lifting pin (73), and the opposite inner side ends of the two limiting blocks (72) are located inside the triangular notch (74) which is adjacent to the same side.

4. A test probe assembly according to claim 3, wherein: the reinforcing unit (7) further comprises a first spring (75), the first spring (75) is arranged on the step surface at the lower end inside the concave cavity (5), the upper end of the first spring (75) is fixedly connected with the step surface at the middle part of the lifting pin (73), and the first spring (75) is sleeved outside the lifting pin (73).

5. The test probe assembly of claim 4, wherein: the second spring (8) is arranged in the needle sleeve (3), the bottom end of the second spring (8) is in contact with the upper surface of the contact pin (4), and the upper end of the second spring (8) is in contact with the bottom surface of the connecting rod (1).

6. The test probe assembly of claim 5, wherein: the first spring (75) and the second spring (8) are plastic insulating springs.

7. The test probe assembly of claim 1, wherein: the outer cambered surfaces of the connecting rod (1) and the needle sleeve (3) are respectively provided with an anti-slip groove (9) which is uniformly distributed.