CN220019800U

CN220019800U - Chip test positioning device and chip test socket

Info

Publication number: CN220019800U
Application number: CN202321440424.0U
Authority: CN
Inventors: 李亚鹏
Original assignee: Suzhou Jingsheng Micro Nano Semiconductor Technology Co ltd
Current assignee: Suzhou Jingsheng Micro Nano Semiconductor Technology Co ltd
Priority date: 2023-06-07
Filing date: 2023-06-07
Publication date: 2023-11-14
Anticipated expiration: 2033-06-07

Abstract

The utility model relates to the technical field of semiconductor chip testing, in particular to a chip testing positioning device and a testing socket, wherein the chip testing positioning device comprises a shell, a first fixing plate, a second fixing plate, a probe and a pin, the second fixing plate is fixed at the bottom of the first fixing plate, the shell is covered outside the first fixing plate and the second fixing plate and is fixedly connected with the first fixing plate, one end of the probe penetrates out of the first fixing plate and the shell, the other end of the probe penetrates out of the second fixing plate, the pin comprises a main body part and a limiting part, the diameter of the limiting part is larger than that of the main body part, the shell, the first fixing plate and the second fixing plate are provided with pin holes, the pin holes comprise limiting holes for inserting the limiting part and main body holes with the same diameter as the main body part, and the pin can penetrate out of the pin holes to be spliced with a PCB (printed circuit board); the test socket comprises the chip test positioning device, a spring probe and a gland, wherein the gland is used for pressing down the spring probe, so that the probe can be fully contacted with a chip and a PCB.

Description

Chip test positioning device and chip test socket

Technical Field

The present utility model relates to the field of semiconductor chip testing technologies, and in particular, to a chip testing positioning device and a chip testing socket.

Background

Along with the continuous improvement of chip core operation speed, the requirement on chip test tool is also higher and higher, current chip test tool generally adopts test socket, test socket can connect chip and test PCB board, the step of welding the chip that awaits measuring on test PCB board has been saved, save a lot of time, but need guarantee the probe and the chip at the double-end probe both ends on the test socket and test PCB board point-to-point connection switch on during the test, be provided with the draw-in groove that is used for restricting the chip on the test socket in general, can realize the accurate connection of double-end probe and chip, be provided with the locating pin simultaneously, the locating pin can insert the locating hole of predetermineeing on the test PCB board, thereby realize the accurate connection of double-end probe and test PCB board.

For example, in the test socket shown in fig. 1, the test socket mainly includes a probe for connecting a chip and a test PCB, a first fixing plate and a second fixing plate made of insulating plastic for fixing the probe, and a housing covered outside the first fixing plate and the second fixing plate, where the housing is used for preventing the first fixing plate and the second fixing plate from deforming, and a positioning pin is disposed on the housing and sequentially penetrates through the first fixing plate and the second fixing plate to be inserted into a pin hole preset on the test PCB.

At present, interference fit is mainly adopted between a close-fit pin and a shell, a mounting hole is machined in the shell, the radius of the mounting hole is smaller than that of the close-fit pin, the close-fit pin is pressed into the mounting hole by a press, and the following problems are easy to occur: once the press presses the close-fitting pin, uneven stress can cause the close-fitting pin to deviate from the preset position vertical to the shell, and the positioning accuracy is affected.

Disclosure of Invention

The utility model aims to provide a chip test positioning device which can accurately mount pins with positioning function on a test socket and ensure positioning accuracy.

To achieve the purpose, the utility model adopts the following technical scheme:

the utility model provides a chip test positioner, includes shell, first fixed plate, second fixed plate, probe and pin, the second fixed plate is fixed in first fixed plate bottom, the shell cover is established first fixed plate with outside the second fixed plate and with first fixed plate fixed connection, the one end of probe is worn out first fixed plate with the shell, the other end of probe is worn out on the second fixed plate, the pin includes main part and spacing portion, the diameter of spacing portion is greater than main part diameter, the shell first fixed plate with the pin hole has been seted up in the intercommunication on the second fixed plate, the pin hole including confession spacing portion male spacing hole and with main part diameter the same main part hole, the pin can wear out pin hole and PCB board grafting cooperation.

Optionally, the limiting part surrounds the middle section of the main body part, and the main body hole is arranged at two axial ends of the limiting hole.

Optionally, the limiting hole is separately disposed on the first fixing plate and has the same thickness as the first fixing plate.

Optionally, the spacing portion set up in the axial both ends of main part, including with main part stretches out the first spacing portion of detachable connection of the first end of shell and with the second spacing portion of the second end integrated into one piece of main part, spacing hole set up in main part is kept away from the one end of shell for the second spacing portion inserts.

Optionally, the main body hole is disposed on the housing and has the same thickness as the housing, or the main body hole is disposed on the housing and the first fixing plate and has the same thickness as the housing and the first fixing plate.

Optionally, the main body portion is screwed with the first limiting portion.

Optionally, the housing is detachably connected with the first fixing plate and the second fixing plate.

Optionally, the two axial ends of the pin are rounded.

Optionally, the probe is a spring probe.

Another object of the present utility model is to provide a test socket, including the above-mentioned chip test positioning device, and further including a pressing cover for pressing down the spring probe.

The beneficial effects of the utility model are as follows: this chip test positioner reforms transform the shape of pin, makes the pin include spacing portion and main part, sets up the cotter hole that matches with the pin on shell, first fixed plate and second fixed plate simultaneously, and the cotter hole is crossed including the main part hole unanimous with main part diameter and is supplied spacing hole that spacing portion passed, and spacing portion can block the tip in main part hole and realize the fixing to the pin to guaranteed the positioning accuracy of pin, the pin can be dismantled with the shell and be connected, is favorable to realizing the reuse of shell moreover. The chip test socket comprising the chip test positioning device adopts the spring probe, and the spring probe can be fully contacted with the chip and the PCB through the gland arranged, so that the test effect is ensured.

Drawings

FIG. 1 is a schematic diagram of a portion of a conventional chip test socket;

FIG. 2 is a schematic diagram of a chip test positioning apparatus according to a first embodiment of the utility model;

fig. 3 is a diagram of a chip testing and positioning device according to a second embodiment of the utility model.

In the figure, 1, a shell; 2. a first fixing plate; 3. a second fixing plate; 4. a probe; 5. a pin; 51. a main body portion; 52. a limit part; 52a, a first limiting part; 52b, a second limiting part; 6. a chip; 7. a PCB; 8. a pin hole; 81. a limiting hole; 82. a body aperture.

Detailed Description

The utility model is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the utility model and are not limiting thereof. It should be further noted that, for convenience of description, only some, but not all of the structures related to the present utility model are shown in the drawings.

In the description of the present utility model, unless explicitly stated and limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the present utility model will be understood in specific cases by those of ordinary skill in the art.

In the present utility model, unless expressly stated or limited otherwise, a first feature "above" or "below" a second feature may include both the first and second features being in direct contact, as well as the first and second features not being in direct contact but being in contact with each other through additional features therebetween. Moreover, a first feature being "above," "over" and "on" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature includes the first feature being directly under and obliquely below the second feature, or simply means that the first feature is less level than the second feature.

In the description of the present embodiment, the terms "upper", "lower", "left", "right", and the like are orientation or positional relationships based on those shown in the drawings, and are merely for convenience of description and simplicity of operation, and are not intended to indicate or imply that the apparatus or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present utility model. Furthermore, the terms "first," "second," and the like, are used merely for distinguishing between descriptions and not for distinguishing between them.

The test socket is also called IC socket, IC test seat and IC socket, is a static connector between PCB and IC, based on different test demands of chips, the PCB board connected with the test socket is different, and invariable, the test socket utilizes the double-ended probe to conduct point-to-point connection between the chip and the PCB board, thus the importance of positioning between the PCB board and the test socket is seen.

The utility model provides a chip test positioning device based on fig. 1, which improves the shape of a pin 5, and utilizes a shell 1, a first fixing plate 2 and a second fixing plate 3 to limit the pin 5, so that the pin 5 is accurately arranged at a preset position, thereby meeting the high-precision requirement of the pin 5 in positioning a test socket and a test PCB 7.

Example 1

Fig. 2 shows a chip testing and positioning device according to an embodiment of the present utility model, including a housing 1, a first fixing plate 2, a second fixing plate 3, a probe 4 and a pin 5, where the first fixing plate 2 is provided with a plurality of first through holes, the second fixing plate 3 is fixed at the bottom of the first fixing plate 2, the second fixing plate 3 is provided with a plurality of second through holes coaxial with the first through holes, the probe 4 is disposed in the first through holes and the second through holes and two ends of the probe are respectively protruded out of the first through holes and the second through holes, the housing 1 is provided with a cover structure with one open end, the cover is disposed above the first fixing plate 2 and the second fixing plate 3 and fixedly connected with the first fixing plate 2, the housing 1 is provided with a third through hole through which the plurality of probes 4 pass, one end of the probe 4 passes out of the housing 1 from the third through hole, and is used for realizing contact with a chip 6 to be tested, the chip 6 testing and positioning device according to the embodiment is particularly characterized in that the pin 5 for realizing positioning of the board 7 adopts a mesa-shaped pin 5, the pin 5 comprises a main body part 52 and a pin part 52 and a middle part 52 axially extending from the two ends of the main body part 8, which are disposed around the first pin part and the second pin part 8 and the two ends of the main body part 8 are axially connected with the first fixing plate 2, and the two ends of the main body part 8 are axially fixed by inserting the pin part 5, and the two end parts of the main body part 5 are axially fixed by the first pin part 5, and the two end parts are axially fixed by the main part 5, and the end part is provided with the main part 5.

According to the chip testing and positioning device in the embodiment, the pins 5 are arranged in a shape with thick middle and thin two ends, the pins 5 are fixed by matching with the shell 1, the first fixing plate 2 and the second fixing plate 3, and the mounting accuracy of the pins 5 is ensured, so that the accuracy of positioning the pins 5 on the PCB 7 is realized, the two ends of the probe 4 are connected with the chip 6 and the PCB 7 in a point-to-point manner, and the chip 6 to be tested is tested; meanwhile, after the whole test socket is tested for a long time, the shell 1 is likely to be damaged or deformed to a certain extent, the shell 1 needs to be overhauled, and the pin 5 and the shell 1 can be separated only by disassembling the shell 1 from the first fixing plate 2 and the second fixing plate 3, so that the shell 1 can be reused relative to interference fit.

It will be appreciated that the number of pins 5 is not less than two, and the number of corresponding pin holes 8 is not less than two, and that two pins 5 are arranged diagonally, for example.

Based on the above-mentioned chip test positioner's maintenance requirement to shell 1, can dismantle between shell 1 and the first fixed plate 2 and be connected, adopt equally to dismantle between the first fixed plate 2 and the second fixed plate 3 to make things convenient for the change and the repeatedly usable of probe 4, can adopt screw together fixed shell 1, first fixed plate 2 and second fixed plate 3 generally, be provided with coaxial and the mounting hole that communicates in proper order on shell 1, first fixed plate 2 and the second fixed plate 3 promptly. Illustratively, countersunk screws are used as screws.

In the case of the pin hole 8, the pin hole 8 may be a through hole penetrating the housing 1 or a blind hole not penetrating the housing 1 at one end of the housing 1, and in view of the characteristic that the first fixing plate 2 and the second fixing plate 3 are easily deformed (both the first fixing plate 2 and the second fixing plate 3 are made of insulating composite plastics), it is apparent that the longer the pin 5 is inserted into the housing 1, the better the stability thereof, and thus the pin hole 8 penetrates the housing 1 in this embodiment.

The shape of the pin hole 8 is the same as that of the pin 5, the middle radius is larger than the two end radii, and the difference is that the lengths of the main body parts 51 of the pin 5 at two sides of the limiting part 52 are not necessarily the same, specifically, the pin hole 8 comprises a limiting hole 81 for accommodating the limiting part 52 and main body holes 82 which are positioned at two axial ends of the limiting hole 81 and are used for accommodating the main body parts 51, the diameter of the main body holes 82 is the same as that of the main body parts 51, the limiting hole 81 can be independently arranged on the first fixing plate 2 and is the same as that of the first fixing plate 2, the limiting hole 81 can be independently arranged on the first fixing plate 2, but the length is smaller than that of the first fixing plate 2, and the length of the limiting hole 81 can be larger than that of the first fixing plate 2, namely, the pin hole 8 on the housing 1 and/or the second fixing plate 3 is a step hole. In summary, the length of the limiting hole 81 is only required to be not greater than the sum of the thicknesses of the housing 1, the first fixing plate 2 and the second fixing plate 3, but for convenience of processing, the limiting hole 81 is separately provided on the first fixing plate 2 and is the same as the thickness of the first fixing plate 2.

At this time, the end face of one end of the limiting part 52 of the pin 5 inserted in the pin hole 8 abuts against the bottom face of the housing 1, the end face of the other end abuts against the top face of the second mounting plate, and the housing 1 and the second mounting plate limit the pin 5 based on the fixed connection of the housing 1, the first mounting plate and the second mounting plate, so that the pin 5 is stationary with respect to the housing 1.

Further, the axial ends of the pin 5 are rounded to facilitate insertion of the pin 5 into the pin hole 8.

When the chip testing and positioning device in this embodiment is assembled, one end of the pin 5 is inserted into the second fixing plate 3, one end of the probe 4 is also inserted into the second fixing plate 3, and then the first fixing plate 2 and the housing 1 are sequentially sleeved on the pin 5, so that the first fixing plate 2, the second fixing plate 3 and the housing 1 are fixedly assembled.

Example two

Fig. 3 shows a chip testing positioning device according to another embodiment of the present utility model, which is different from the first embodiment in that the position of the limiting portion 52 of the pin 5 is different, and accordingly, the shapes of the pin holes 8 provided on the housing 1, the first fixing plate 2 and the second fixing plate 3 for passing the pin 5 are also changed.

In this embodiment, the limiting portion 52 is disposed at two ends of the main body portion 51, and specifically includes a first limiting portion 52a and a second limiting portion 52b, the first end of the main body portion 51 penetrates out of the housing 1 and is detachably connected with the first limiting portion 52a, the second end of the main body portion 51 and the second limiting portion 52b are integrally formed, and the limiting hole 81 for accommodating the pin 5 includes a main body hole 82 for accommodating the main body portion 51 and a limiting hole 81 for accommodating the second limiting portion 52b, the limiting hole 81 is disposed at one end of the main body hole 82 far away from the housing 1, and the second limiting portion 52b can penetrate out of the limiting hole 81 for positioning the PCB 7.

When the chip testing and positioning device in this embodiment is assembled, firstly, one end of the main body 51 sequentially passes through the second fixing plate 3, the first fixing plate 2 and the housing 1 from bottom to top, and then the main body 51 and the first limiting portion 52a are connected to limit the pin 5.

There are various manners in which the main body 51 and the first stopper 52a are detachably connected, such as screwing, bonding, or the like. In this embodiment, the first end of the main body 51 penetrating out of the housing 1 is provided with an external thread, and the limiting portion 52 may be sleeved on the main body 51 by using a standard nut, so as to achieve connection.

Similar to the first embodiment, the length of the main body hole 82 is not more than the sum of the thicknesses of the housing 1, the first fixing plate 2, and the second fixing plate 3. In this embodiment, the main body hole 82 may be separately provided on the housing 1 and is identical to the thickness of the housing 1, or provided on the housing 1 and the first fixing plate 2 and is identical to the thickness of the housing 1 and the first fixing plate 2, so as to reduce the processing difficulty.

As seen in connection with the first and second embodiments, the commonality between the two with respect to the pin 5 and the pin hole 8 is that: the pin 5 includes a main body 51 and a limiting portion 52, the diameter of the limiting portion 52 is larger than that of the main body 51, the pin hole 8 includes a limiting hole 81 for inserting the limiting portion 52 and a main body hole 82 with the same diameter as the main body 51, and then the limiting portion 52 is clamped at the end of the main body hole 82 to limit the pin 5.

Based on the above-mentioned chip test positioning device, another embodiment refers to a test socket, which further includes a pressing cover for pressing down the probe 4 so that the probe 4 is in full contact with the chip 6 and the PCB 7, and the probe 4 is a spring probe 4. It will be appreciated that, when the gland is provided according to the second embodiment, the first stopper 52a needs to be avoided when the probe 4 is pressed down by the gland.

It is to be understood that the above examples of the present utility model are provided for clarity of illustration only and are not limiting of the embodiments of the present utility model. Various obvious changes, rearrangements and substitutions can be made by those skilled in the art without departing from the scope of the utility model. It is not necessary here nor is it exhaustive of all embodiments. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the utility model are desired to be protected by the following claims.

Claims

1. Chip test positioner, including shell (1), first fixed plate (2), second fixed plate (3) and probe (4), second fixed plate (3) are fixed in first fixed plate (2) bottom, shell (1) cover is established outside first fixed plate (2) with second fixed plate (3) and with first fixed plate (2) fixed connection, first fixed plate (2) and shell (1) are worn out to the one end of probe (4), the other end of probe (4) is worn out on second fixed plate (3), its characterized in that still includes:

the pin (5) comprises a main body part (51) and a limiting part (52), the diameter of the limiting part (52) is larger than that of the main body part (51), a pin hole (8) is formed in the shell (1), the first fixing plate (2) and the second fixing plate (3) in a communicating mode, the pin hole (8) comprises a limiting hole (81) for the limiting part (52) to be inserted and a main body hole (82) with the same diameter as that of the main body part (51), and the pin (5) can penetrate out of the pin hole (8) to be matched with the PCB (7) in a plugging mode.

2. The chip testing and positioning device according to claim 1, wherein the limiting portion (52) is disposed around a middle section of the main body portion (51), and the main body hole (82) is disposed at two axial ends of the limiting hole (81).

3. Chip test positioning device according to claim 2, characterized in that the limiting holes (81) are provided on the first fixing plate (2) alone and have the same thickness as the first fixing plate (2).

4. Chip test positioning device according to claim 1, characterized in that the limiting portion (52) is disposed at two axial ends of the main body portion (51), and comprises a first limiting portion (52 a) detachably connected with a first end of the main body portion (51) extending out of the housing (1) and a second limiting portion (52 b) integrally formed with a second end of the main body portion (51), and the limiting hole (81) is disposed at an end of the main body portion (51) away from the housing (1) for inserting the second limiting portion (52 b).

5. Chip test positioning device according to claim 4, characterized in that the body hole (82) is provided on the housing (1) and is the same as the housing (1) in thickness, or the body hole (82) is provided on the housing (1) and the first fixing plate (2) and is the same as the housing (1) and the first fixing plate (2) in thickness.

6. The chip testing positioning device according to claim 4, wherein the main body portion (51) is screwed with the first limiting portion (52 a).

7. Chip test positioning device according to any of claims 1-6, characterized in that the housing (1) is detachably connected to the first fixing plate (2) and the second fixing plate (3).

8. Chip test positioning device according to claim 7, characterized in that the axial ends of the pins (5) are rounded.

9. Chip test positioning device according to any of the claims 1, characterized in that the probes (4) are spring probes (4).

10. Test socket comprising a chip test positioning device according to any of the claims 9, further comprising a gland for depressing the spring probe (4).