CN219777740U - Probe and probe assembly - Google Patents

Abstract

The utility model discloses a probe and a probe assembly, wherein the tester is provided with an inserting port, a tested signal interface and an inserting signal interface are arranged in the inserting port, the probe comprises a probe body and a circuit board, the probe body is provided with a first end and a second end which are opposite, and the first end of the probe body is provided with a coaxial interface and a first slot; the circuit board is arranged in the probe body, the circuit board is arranged on one side of the first slot, a conductive contact is arranged at a position corresponding to the first slot, and the conductive contact is arranged on at least one side of the circuit board; the conductive contact is used for being electrically connected with the plugging signal interface when the probe is plugged into the plugging interface, so that the circuit board obtains a power supply from the tester and/or interacts with the data of the tester; the coaxial interface is electrically connected with the circuit board and is used for being connected with the tested signal interface when the probe is inserted into the insertion interface so as to transmit the tested signal to the tester. The probe is used for solving the problems of large occupied space and difficult assembly of the probe.

Description

Probe and probe assembly

Technical Field

The utility model relates to the technical field of testers, in particular to a probe and a probe assembly.

Background

At present, when the existing probe transmits multiple paths of test signals of a tested device, a plurality of mutually independent spring pins and other wiring structures are required to be respectively arranged corresponding to the multiple paths of test signals, but the probe with the multiple wiring structures in a concentrated manner has the problems of large occupied space and difficult assembly.

And the problems of insecurity in contact, current limitation and the like are easily generated when the spring needle is used for contact.

Disclosure of Invention

One of the main purposes of the utility model is to provide a probe which is used for solving the problems of large occupied space and difficult assembly of the probe.

In order to achieve the above object, the present utility model provides a probe applied to a tester, the tester having an interface, in which a signal interface to be tested and an interface for plugging signals are provided, the probe comprising:

the probe comprises a probe body, a first connecting rod and a second connecting rod, wherein the probe body is provided with a first end and a second end which are opposite, and the first end of the probe body is provided with a coaxial interface and a first slot; and

the circuit board is arranged in the probe body, extends out of one side of the first slot, and is provided with a conductive contact corresponding to the first slot, and the conductive contact is arranged on at least one side of the circuit board;

the conductive contact is used for being electrically connected with the plugging signal interface when the probe is plugged into the plugging interface, so that the circuit board obtains a power supply from the tester and/or interacts with the data of the tester;

the coaxial interface is electrically connected with the circuit board and is used for being connected with the tested signal interface when the probe is inserted into the insertion port so as to transmit the tested signal to the tester.

In an embodiment, the probe further comprises a locking structure, the probe body is provided with a locking hole, and the locking structure is telescopically and translationally arranged in the locking hole and is used for movably switching between a locking position and an unlocking position along the locking hole;

when the probe is in the locking position, the locking structure extends out of the locking hole so as to enable the probe to be in locking fit with the plug interface;

and when the probe is in the unlocking position, the locking structure is retracted into the locking hole so as to separate the probe from the plug interface.

In an embodiment, the locking structure is provided with a manipulation part for driving the locking structure to be movably switched between a locking position and an unlocking position.

In an embodiment, an elastic member is disposed in the probe body, and the elastic member is connected with the locking structure and is used for driving the locking structure to be reset and switched from the unlocking position to the locking position.

In an embodiment, two locking structures are provided, the two locking structures are oppositely arranged at two sides of the probe body, and the elastic piece is connected between the two locking structures.

In an embodiment, fixing positions are disposed on inner sides of the two locking structures, two elastic members are disposed on inner sides of the locking structures, the elastic members correspond to the fixing positions, and the two elastic members are disposed on two sides of the circuit board and respectively abut against the corresponding fixing positions.

In an embodiment, the inner sides of the two locking structures are respectively provided with a fixing position, a through hole is arranged in the middle of the circuit board, and the elastic piece penetrates through the through hole and two ends of the elastic piece are respectively connected with the fixing positions.

In an embodiment, the circuit board has a first connection end and a second connection end opposite to each other, the first slot is enclosed outside the first connection end of the circuit board, and the first connection end of the circuit board is flush with the first end of the probe body.

In an embodiment, the second end of the probe body is provided with a clamping structure and a signal cable, the clamping structure is provided with a clamping groove corresponding to the first slot, and the circuit board is at least partially located in the clamping groove and is electrically connected with the signal cable.

In an embodiment, the circuit board is disposed on one side of the coaxial interface, so that the probe body is flat.

The second main objective of the present utility model is to provide a probe assembly for solving the problems of large occupied space and difficult assembly of the probe.

In order to achieve the above object, the present utility model provides a probe assembly, including a probe and a connection interface according to one of the objects of the present utility model, wherein one end of the probe is inserted into a socket of a tester; the other end of the probe is provided with a signal cable and is coupled to the connection interface through the signal cable, and the connection interface is electrically connected with the tested device and used for transmitting a test signal to the tester.

Compared with the prior art, the utility model has the following beneficial effects:

1. a coaxial interface and a first slot are arranged at one end of the probe body, a circuit board is arranged in the probe body, the circuit board is arranged in the first slot of the probe body, a conductive contact is arranged at a position corresponding to the first slot, and data interaction between a tested device and a tester is realized through the circuit board connected with the interface; the circuit board and the coaxial interfaces are arranged in the probe body, so that the problems of excessive number of interfaces and inconvenient use caused by split arrangement can be avoided, the structure of the probe is effectively simplified, and the problems of large occupied space, difficult processing and assembly caused by respectively arranging a plurality of wiring structures for a plurality of paths of tested signals corresponding to the tested device are avoided;

2. a plurality of relatively independent conductive contacts are respectively arranged corresponding to a plurality of paths of tested signals of the tested device, and the plurality of conductive contacts are arranged on at least one side of the circuit board and used for expanding the arrangement range of the conductive contacts and avoiding the mutual interference of data transmission; the conductive contact is used for being electrically connected with the plugging signal interface when the probe is plugged into the plugging interface, so that the circuit board obtains a power supply from the tester and/or exchanges data with the tester, reliable data exchange is realized, the problems of difficult connection and inconvenient operation caused by excessive wiring structures are avoided, and the problem of overlarge occupied space of the probe caused by the need of additionally arranging a power supply device on the probe is avoided;

3. the signal to be tested is transmitted to the tester through the coaxial interface, and the multipath signal to be tested of the device to be tested is received and output through the tester.

Drawings

In order to more clearly illustrate the embodiments of the present utility model or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to the structures shown in these drawings without inventive effort for a person skilled in the art.

FIG. 1 is an exploded view of one embodiment of a probe of the present utility model;

FIG. 2 is a schematic structural view of an embodiment of a probe assembly of the present utility model;

FIG. 3 is an exploded view of one embodiment of the coaxial interface of the present utility model;

in the figure: 100. a probe body; 101. a first slot; 1021. a locking hole; 1022. an operation hole; 103. a clamping structure; 1031. a first housing; 1032. a second housing; 1033. a locking piece; 1041. a first package; 1042. a second package; 105. a baffle; 106. a second slot; 200. a circuit board; 201. a through hole; 202. a connection hole; 300. a coaxial interface; 301. a contact pin; 302. an insulation sleeve; 303. connecting sleeves; 3031. a plug-in position; 304. a sleeve; 400. a locking structure; 401. a limit protrusion; 402. a manipulation section; 403. fixing the position; 4031. a connecting shaft; 500. an elastic member; 600. a signal cable; 700. and a connection interface.

The achievement of the objects, functional features and advantages of the present utility model will be further described with reference to the accompanying drawings, in conjunction with the embodiments.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

It should be noted that, if all the directional indicators in the embodiments of the present utility model are only used to explain the relative positional relationship, movement conditions, etc. between the components in a specific posture, if the specific posture is changed, the directional indicators are correspondingly changed.

If the description of "first", "second", etc. in this disclosure is for descriptive purposes only, it is not to be construed as indicating or implying a relative importance thereof or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. If the description of "a and/or B" is referred to in the present utility model, it means that either scheme a or scheme B is included, or both scheme a and scheme B are included. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present utility model.

The utility model provides a probe and a probe assembly.

Referring to fig. 1 to 3, the present utility model provides a probe for a tester, the tester having an interface in which a signal interface to be tested and a signal interface to be plugged are disposed, the probe including a probe body 100 and a circuit board 200.

The probe body has a first end and a second end opposite to each other, and the first end of the probe body 100 is provided with a coaxial interface 300 and a first slot 101;

the circuit board 200 is disposed in the probe body 100, the circuit board 200 extends out at one side of the first slot 101, and a conductive contact is disposed at a position corresponding to the first slot 101, and the conductive contact is disposed at least one side of the circuit board;

the conductive contact is used for being electrically connected with the plugging signal interface when the probe is plugged into the plugging interface, so that the circuit board obtains a power supply from the tester and/or interacts with the data of the tester;

the coaxial interface 300 is electrically connected with the circuit board 200, and is used for connecting with the tested signal interface when the probe is inserted into the insertion port, so as to transmit the tested signal to the tester.

It may be appreciated that the circuit board 200 may be disposed on one side of the first slot 101, and specifically, the circuit board 200 may be disposed on any side of the coaxial interface 300, a plurality of conductive contacts may be disposed corresponding to multiple paths of signals to be tested, and the plurality of conductive contacts may be disposed on one side or two sides of the circuit board 200 or other multiple sides, so as to avoid the situation that multiple paths of signals affect each other during the data interaction process. The probe is electrically connected with the plugging signal interface of the tester through the circuit board 200, and multi-path data interaction is realized through the conductive contacts of the circuit board 200, so that the problems of overlarge volume of the probe and unstable connection caused by unstable plugging of the probe due to the adoption of a probe structure such as a spring needle are avoided.

A coaxial interface 300 and a first slot 101 are arranged at one end of the probe body 100, a circuit board 200 is arranged in the probe body 100, the circuit board 200 is arranged in the first slot 101 of the probe body 100, conductive contacts are arranged at positions corresponding to the first slot 101, and data interaction between a tested device and a tester is realized through the circuit board 200 connected with the interface; the circuit board 200 and the coaxial interface 300 are arranged in the probe body, so that the problems of excessive number of interfaces and inconvenient use caused by split arrangement can be avoided, the structure of the probe is effectively simplified, and the problems of large occupied space of the probe and difficult processing and assembly caused by respectively arranging a plurality of wiring structures for multiple paths of tested signals corresponding to the tested device are avoided.

A plurality of relatively independent conductive contacts are respectively arranged corresponding to a plurality of paths of tested signals of the tested device, and the plurality of conductive contacts are arranged on at least one side of the circuit board 200 so as to enlarge the arrangement range of the conductive contacts and avoid mutual interference of data transmission; the conductive contact is used for being electrically connected with the plugging signal interface when the probe is plugged into the plugging interface, so that the circuit board obtains a power supply from the tester and/or exchanges data with the tester, reliable data exchange is realized, the problems of difficult connection and inconvenient operation caused by excessive wiring structures are avoided, and the problem of overlarge occupied space of the probe caused by the need of additionally arranging a power supply device on the probe is avoided.

The signal to be tested is transmitted to the tester through the coaxial interface 300, and the multipath signal to be tested of the device to be tested is received and output through the tester.

In an embodiment, the probe further includes a locking structure 400, the probe body 100 is provided with a locking hole 1021, and the locking structure 400 is telescopically and translationally arranged in the locking hole 1021 for movably switching between a locking position and an unlocking position along the locking hole 1021;

when in the locking position, the locking structure 400 extends out of the locking hole 1021 to enable the probe to be in locking fit with the plug interface;

in the unlocked position, the locking structure 400 is retracted into the locking hole 1021 to disengage the probe from the plug.

The locking structure 400 is arranged on the probe, so that the probe is locked to the plug-in port of the probe at the locking position, and the locking structure is suitable for different tester plug-in ports, and the situations that the connection between the tester plug-in port and the probe is loose and even poor contact is caused due to long-term use are avoided, and signal transmission is influenced. The locking structure 400 is arranged, so that the loose plugging caused by the collision of external force can be avoided to a certain extent.

Specifically, the locking structure 400 may be received in the probe body 100, and the locking hole 1021 may be formed in a side wall surface of the probe body 100 at a position of the probe body 100 corresponding to the locking structure 400. Corresponding to the locking hole 1021, a limit protrusion 401 or the like may be provided as a locking portion at an end of the locking structure 400 near the first slot 101. Further, the aperture of the locking hole 1021 may be not smaller than the limit protrusion 401, so as to achieve effective locking and unlocking.

In addition, according to practice, it is not excluded that the socket of the tester is correspondingly provided with a slot suitable for the locking structure, so that the locking structure is locked to the slot of the socket when in the locking position.

In an embodiment, the locking structure 400 is provided with an operating portion 402 for driving the locking structure 400 to be movably switched between a locking position and an unlocking position.

As an example, referring to fig. 1 to 2, the manipulation part 402 may be provided as a pressing piece such that the locking structure 400 is telescopically disposed in the locking hole 1021. Further, the operating portion 402 and the locking structure 400 may be configured as an integral structure, and the operating portion 402 may be disposed at an end of the locking structure 400 away from the first slot 101, so as to drive the locking structure 400 to movably switch between the locking position and the unlocking position, so that the operation is more labor-saving, and the limitation of the insertion of the probe body 100 due to the improper setting of the operating portion 402 is avoided. When in the locking position, the locking structure 400 extends out of the locking hole 1021 along the first direction of the probe body 100 and is clamped in the socket of the tester, so that the probe is in locking fit with the socket; in the unlocked position, the locking structure 400 is retracted inwardly into the locking hole 1021 in the first direction of the probe body 100 and out of the socket of the tester, so that the probe is separated from the socket. The first direction of the probe body 100 described herein refers to a direction from the central axis of the probe body 100 to the outer side wall thereof.

As another example, the manipulation part 402 may be provided as a push-pull member so that the locking structure 400 is telescopically disposed in the locking hole 1021. Further, the operating portion 402 and the locking structure 400 may be configured as an integral structure, and the operating portion 402 may be disposed at an end of the locking structure 400 away from the first slot 101, so as to drive the locking structure 400 to movably switch between the locking position and the unlocking position, so that the operation is more labor-saving, and the limitation of the insertion of the probe body 100 due to the improper setting of the operating portion 402 is avoided. Further, the locking hole 1021 may be provided on a side wall surface of the probe body 100 and extend from a middle portion of the side wall surface to the first slot 101. When in the locking position, the locking structure 400 extends out of the locking hole 1021 along the second direction of the probe body 100 and is clamped in the socket of the tester, so that the probe is in locking fit with the socket; when in the unlocking position, the locking structure 400 is retracted inwards into the locking hole 1021 along the second direction of the probe body 100 and exits the interface of the tester, so that the probe is separated from the interface. It should be noted that, the second direction of the probe body 100 described herein refers to a direction from one end of the probe body 100 where the coaxial interface 300 is disposed to the other end. Further, it is not excluded, according to practice, to provide a groove track adapted to the locking structure 400 on the side of the locking hole 1021 corresponding to the second direction for guiding the movement of the locking structure 400.

Further, on the basis of the above example, an operation hole 1022 may be correspondingly disposed on the side wall of the probe body corresponding to the manipulation direction of the manipulation part 402, and the operation hole 1022 may be disposed near the locking hole 1021; of course, in order to facilitate the processing, the operation hole 1022 and the locking hole 1021 may be provided in the same hole site of the probe body, and when the operation hole 1022 and the locking hole 1021 are provided in the same hole site, it is not excluded to provide the baffle 105 corresponding to the side wall of the probe body 100, and the locking hole 1021 and the operation hole 1022 may be separated by the baffle 105 in the hole site, so that the locking structure 400 may extend out of the probe body 100 through the baffle 105.

Referring to fig. 1, in an embodiment, an elastic member 500 is disposed in the probe body 100, and the elastic member 500 is connected to the locking structure 400, and is used for driving the locking structure 400 to be reset and switched from the unlocking position to the locking position.

As an example, the elastic member 500 may be disposed in the probe body 100 corresponding to the manipulation part 402. In the case of providing a locking structure 400, one end of the elastic member 500 is fixed in the probe body 100, and the other end of the elastic member 500 is connected to the locking structure 400. In the case that a plurality of locking structures 400 are provided, the elastic structure may be provided with a plurality of free ends corresponding to the number and positions of the locking structures 400, so that the plurality of free ends of the elastic member 500 are connected to the plurality of locking structures 400 one by one.

It should be noted that, the elastic member 500 may be configured as a compression spring, a torsion spring, or any other elastic structure suitable for practical use according to practical needs. Of course, the elastic member 500 may be configured to have a certain elasticity, and the elastic member 500 may be made of metal, rubber, plastic, or the like having a certain elasticity.

In addition, it will be appreciated that the resilient member 500 may be provided herein in correspondence with the unlocked position and the locked position, and further, the locking structure 400 may be provided to be movable switched between the locked position and the unlocked position in the first direction or the second direction. The elastic member 500 may be disposed at a middle portion of the probe body 100 corresponding to the first direction, or may be disposed at an end of the manipulation portion 402 away from the first slot 101 corresponding to the second direction.

Referring to fig. 1, in one embodiment, there are two locking structures 400, two locking structures 400 are disposed opposite to each other on both sides of the probe body 100, and the elastic member 500 is connected between the two locking structures 400.

The two locking structures 400 and the corresponding operating parts 402 are oppositely arranged on two sides of the probe body 100, a user drives the locking structures 400 to movably switch between the locking position and the unlocking position by pressing or pushing the operating parts 402 on the side edge of the probe body 100, so that the probe is convenient to use, and the probe body 100 is effectively locked to an inserting port of a tester through the locking structures 400 in the locking position in a connecting state, so that the connection between the probe and the tester is more secure and reliable.

It will be appreciated that depending on the actual use, the two ends of the elastic member 500 may be respectively connected to the two locking structures 400 in a contact manner. Further, the two locking structures 400 may be configured as any integrally formed structure suitable for practical use, such as H-shaped or U-shaped, so that the two locking structures 400 may be simultaneously driven by the elastic member 500 to be reset and switched from the unlocking position to the locking position, so as to avoid the situation that the probe is not locked in place when being plugged into the plugging port of the tester; and through the elastic component 500 drives two locking structure 400 simultaneously and carries out the position switching, avoids appearing can't get the condition of tester interface fast with the probe when releasing the connection, and the use experience is optimized.

Optionally, fixing positions are provided on the inner sides of the two locking structures for fixing the elastic members.

In an embodiment, fixing positions 403 are disposed on the inner sides of the two locking structures 400, two elastic members 500 are disposed on the inner sides of the two locking structures, the elastic members 500 correspond to the fixing positions, and the two elastic members 500 are respectively disposed on two sides of the circuit board 200 and respectively abut against the corresponding fixing positions 403.

Alternatively, two elastic members may be fixed to the circuit board and the corresponding fixing portion 403 by bonding, welding, clamping, plugging, or the like.

In an embodiment, the fixing locations 403 are disposed on the inner sides of the two locking structures 400, the through hole 201 is disposed in the middle of the circuit board, and the elastic member 500 passes through the through hole 201 and is respectively connected to the fixing locations at two ends.

Through holes 201 are formed in the middle of the circuit board 200, and the elastic piece 500 is limited by the through holes 201, so that the situation that the elastic piece 500 is deviated in the stretching process to influence the reset switching effect is avoided. Alternatively, the elastic member may be disposed through the through hole, and both ends are fixed to the fixing portion 403 by bonding, welding, fastening, plugging, or the like.

Referring to fig. 1, in one embodiment, the elastic member 500 is a spring for easy material handling. The inner sides of the two locking structures 400 are provided with fixing positions 403, and the springs pass through the through holes and are respectively connected with the fixing positions 403 at two ends.

Further, limiting structures such as a connecting shaft 4031 may be disposed at the inner sides of the two locking structures 400 corresponding to the fixing position 403, and the fixing position 403 and the connecting shaft 4031 of the two locking structures 400 are disposed on the same axis, so that the spring is limited by the connecting shaft 4031 of the two locking structures 400, thereby avoiding the spring compression displacement and even deformation, and preventing the spring transition compression from extruding the circuit board 200 to a certain extent.

In an embodiment, the circuit board 200 has a first connection end and a second connection end opposite to each other, the first slot 101 is disposed around the first connection end of the circuit board 200, and the first connection end of the circuit board 200 is flush with the first end of the probe body 100. The probe body 100 is disposed outside the circuit board 200 through the first slot 101, and is used for protecting the coaxial interface 300 and the circuit board 200.

Referring to fig. 1, in an embodiment, the other end of the probe body 100 is provided with a clamping structure 103 and a signal cable 600, the clamping structure 103 is provided with a clamping groove corresponding to the first slot 101, and the circuit board 200 is at least partially located in the clamping groove and is electrically connected with the signal cable 600.

The circuit board 200 is limited by the clamping groove, so that when the probe is inserted into the insertion port of the tester, the circuit board 200 of the first slot 101 can be stably connected with the insertion signal interface, the situation of poor contact is avoided, and the circuit board 200 can be further prevented from being influenced by the locking structure 400 to have position offset by the arrangement of the clamping groove.

Further, the clamping structure 103 includes a first housing 1031 and a second housing 1032, and the first housing 1031 and the second housing 1032 may be disposed on two sides of the clamping structure 103 in a plugging, clamping, sleeving, screwing, or the like manner, so that the clamping groove is formed between the first housing 1031 and the second housing 1032. Furthermore, the locking members 1033 penetrating the first housing 1031 and the second housing 1032 may be used to connect the two housings, and according to practical situations, it is not excluded to provide the circuit board 200 with the connecting holes 202, and the locking members 1033 penetrate the first housing 1031, the connecting holes 202 and the second housing 1032, so that the circuit board 200 is fixed in the clamping groove.

As an example, the probe further includes a first package 1041 and a second package 1042 that are packaged outside the coaxial interface 300, the first slot 101, and the clamping structure 103, and the first package 1041 and the second package 1042 may be integrally connected by plugging, clamping, sleeving, screwing, or the like. The coaxial interface 300 and the first slot 101 are formed at an end of the first package 1041 facing away from the second package 1042. In addition, according to the actual implementation, a second slot 106 may be provided in the first package 1041 corresponding to the coaxial interface 300, so that the coaxial interface 300 may be connected with a signal interface to be tested of the tester; the signal cable 600 is disposed at one end of the second package 1042 facing away from the first package 1041, and extends out of the probe body 100 through the second package 1042 for connecting with a device under test.

Further, a sealing ring or gasket may be disposed on the signal cable 600, the coaxial interface 300, etc. to prevent dust and water, and prevent external contaminants from entering the probe body 100, which affects performance and service life.

Referring to fig. 1 to 2, in an embodiment, the circuit board 200 is disposed at one side of the coaxial interface 300, so that the probe body 100 is flat.

The probe is used for compressing the volume of the probe, reduces the occupation of space, is arranged in a flat shape, and is convenient for packaging and transportation.

Referring to fig. 3, in an embodiment, the coaxial interface 300 includes a pin 301, and an insulation sleeve 302 and a connection sleeve 303 sequentially sleeved outside the pin 301, wherein a plug position 3031 adapted to be plugged into the circuit board 200 is disposed at one end of the connection sleeve 303 near the pin 301, and the connection sleeve 303 and the pin 301 are respectively electrically connected with the circuit board 200.

The connecting sleeve 303 is sleeved outside the pin 301 through an insulating sleeve 302, and the plug position 3031 is provided on the connecting sleeve 303, so that the connecting sleeve 303 and the pin 301 are firmly plugged in the circuit board 200 and electrically connected with the circuit board 200. Further, the coaxial interface 300 further includes a sleeve 304 sleeved outside the connecting sleeve 303, so as to be used for sleeving the coaxial interface 300, so that the coaxial interface 300 is stably connected to the tested signal interface of the tester, and the coaxial interface 300 is protected, and abrasion and even corrosion caused by the external environment to the coaxial interface 300 are reduced.

Referring to fig. 1 to 3, the present utility model also provides a probe assembly including a probe and a connection interface 700 as shown in the above example, one end of the probe being inserted into a socket of a tester; the other end of the probe is provided with a signal cable 600 and is coupled to the connection interface 700 via the signal cable 600, and the connection interface 700 is electrically connected with a device under test for transmitting a test signal to the tester. So as to solve the problems of large occupied space and difficult assembly of the probe.

Specific examples of the probe are as described above, and are not described in detail herein.

The foregoing description is only of the optional embodiments of the present utility model, and is not intended to limit the scope of the utility model, and all the equivalent structural changes made by the description of the present utility model and the accompanying drawings or the direct/indirect application in other related technical fields are included in the scope of the utility model.

Claims (11)

1. The utility model provides a probe, is applied to the tester, its characterized in that, the tester has the interface, be provided with signal interface and grafting signal interface to be tested in the interface, the probe includes:

the probe comprises a probe body, a first connecting rod and a second connecting rod, wherein the probe body is provided with a first end and a second end which are opposite, and the first end of the probe body is provided with a coaxial interface and a first slot; and

the circuit board is arranged in the probe body, extends out of one side of the first slot, and is provided with a conductive contact corresponding to the first slot, and the conductive contact is arranged on at least one side of the circuit board;

the conductive contact is used for being electrically connected with the plugging signal interface when the probe is plugged into the plugging interface, so that the circuit board obtains a power supply from the tester and/or interacts with the data of the tester;

the coaxial interface is electrically connected with the circuit board and is used for being connected with the tested signal interface when the probe is inserted into the insertion port so as to transmit the tested signal to the tester.

2. The probe of claim 1, further comprising a locking structure, the probe body having a locking aperture, the locking structure being telescopically translatably disposed in the locking aperture for movable switching along the locking aperture between a locked position and an unlocked position;

when the probe is in the locking position, the locking structure extends out of the locking hole so as to enable the probe to be in locking fit with the plug interface;

and when the probe is in the unlocking position, the locking structure is retracted into the locking hole so as to separate the probe from the plug interface.

3. A probe according to claim 2, wherein the locking structure is provided with an operating portion for moving the locking structure between a locked position and an unlocked position.

4. The probe of claim 2, wherein an elastic member is disposed within the probe body, the elastic member being coupled to the locking structure for driving the locking structure to reset from the unlocked position to the locked position.

5. The probe of claim 4, wherein there are two locking structures, the two locking structures are oppositely disposed at two sides of the probe body, and the elastic member is connected between the two locking structures.

6. The probe of claim 4, wherein fixing positions are provided on inner sides of the two locking structures, the two elastic pieces are respectively arranged on two sides of the circuit board and respectively abutted against the corresponding fixing positions, and the two elastic pieces correspond to the fixing positions.

7. The probe of claim 6, wherein the inner sides of the two locking structures are provided with fixing positions, a through hole is arranged in the middle of the circuit board, and the elastic piece penetrates through the through hole and is respectively connected with the fixing positions at two ends.

8. The probe of claim 1, wherein the circuit board has opposite first and second connection ends, the first slot is disposed around the first connection end of the circuit board, and the first connection end of the circuit board is flush with the first end of the probe body.

9. The probe of claim 1, wherein the second end of the probe body is provided with a clamping structure and a signal cable, the clamping structure is provided with a clamping groove corresponding to the first slot, and the circuit board is at least partially positioned in the clamping groove and is electrically connected with the signal cable.

10. The probe of any one of claims 1-9, wherein the circuit board is disposed on a side of the coaxial interface such that the probe body is flat.

11. A probe assembly comprising a probe according to any one of claims 1 to 10 and a connection interface, one end of the probe being inserted into a socket of a tester; the other end of the probe is provided with a signal cable and is coupled to the connection interface through the signal cable, and the connection interface is electrically connected with the tested device and used for transmitting a test signal to the tester.