CN219758382U - Lower needle test fixture - Google Patents
Lower needle test fixture Download PDFInfo
- Publication number
- CN219758382U CN219758382U CN202223554565.3U CN202223554565U CN219758382U CN 219758382 U CN219758382 U CN 219758382U CN 202223554565 U CN202223554565 U CN 202223554565U CN 219758382 U CN219758382 U CN 219758382U
- Authority
- CN
- China
- Prior art keywords
- block
- conductive copper
- compression spring
- inclined hole
- plate
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Links
- 238000012360 testing method Methods 0.000 title claims abstract description 27
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 43
- 229910052802 copper Inorganic materials 0.000 claims abstract description 43
- 239000010949 copper Substances 0.000 claims abstract description 43
- 239000000523 sample Substances 0.000 claims abstract description 18
- 230000006835 compression Effects 0.000 claims description 37
- 238000007906 compression Methods 0.000 claims description 37
- 230000005540 biological transmission Effects 0.000 claims description 11
- 238000009434 installation Methods 0.000 claims description 6
- 230000006978 adaptation Effects 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 230000007306 turnover Effects 0.000 abstract description 13
- 230000007547 defect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model aims to provide a needle setting test fixture which has a compact overall structure and can be suitable for a complex needle setting space. The utility model comprises a carrier plate and a turnover plate, wherein one end of the turnover plate is hinged with the carrier plate, the other end of the turnover plate is in limit fit with the carrier plate, a profiling groove matched with a product is formed in the carrier plate, an oblique side pushing module is arranged on the carrier plate, a probe connected with an external testing machine penetrates through the turnover plate, a pressing module in press fit with the oblique side pushing module is arranged on the turnover plate, the oblique side pushing module comprises a mounting block, an oblique hole is formed in the mounting block, a conductive copper block is arranged at the oblique hole in a sliding mode, an arc surface structure is formed at the bottom of the conductive copper block, when the turnover plate is covered, the pressing module presses the conductive copper block to drive the conductive copper block to move along the oblique hole, the arc surface structure is contacted with an arc surface contact of the product, and the conductive copper block is contacted with the bottom of the probe. The utility model is applied to the technical field of camera testing.
Description
Technical Field
The utility model is applied to the technical field of camera testing, and particularly relates to a needle setting testing jig.
Background
At present, the popularization of smart phones is that consumers have higher requirements on cameras, so that a series of tests are carried out in the assembly process of the mobile phone cameras, impedance tests of the cameras are one of test items, because the appearance of a product is mostly covered by a flat cable and a protective shell, a needle-down area is only provided with a round corner at the boundary of the edge of the side face and the top face, and a test fixture on the market is generally directly and vertically downwards needle on a contact of the product, so that signal conduction is realized, although the needle-down mode is simple and effective, the needle-down is difficult to carry out under the appearance condition of a complex product, and a needle block module is constrained by the space size. For example, chinese patent publication No. CN113484608A discloses a dispensing and impedance testing jig for a camera module, in which a floating impedance testing seat is vertically distributed, an upper cover is closed, and then a product is pushed to an XY positioning block by movement of the floating impedance testing seat, and the product is fixed in a horizontal direction, and simultaneously the upper cover is pressed down to press the test product. However, when the probe is applied to the condition of complex product appearance, the position deviation of the contact between the probe and the product easily occurs, so that the conduction accuracy of the probe cannot be ensured. Therefore, it is necessary to provide a needle-setting test fixture which has a compact overall structure and can be applied to a complex needle-setting space.
Disclosure of Invention
The utility model aims to solve the technical problem of overcoming the defects of the prior art and providing the needle setting test fixture which has a compact overall structure and can be suitable for a complex needle setting space.
The technical scheme adopted by the utility model is as follows: the utility model comprises a carrier plate and a turnover plate, wherein one end of the turnover plate is hinged with the carrier plate, the other end of the turnover plate is in limit fit with the carrier plate, a profiling groove matched with a product is formed in the carrier plate, an inclined side pushing module is arranged on the carrier plate, a probe connected with an external testing machine penetrates through the turnover plate, a pressing module in press fit with the inclined side pushing module is arranged on the turnover plate, the inclined side pushing module comprises a mounting block, an inclined hole is formed in the mounting block, a conductive copper block is slidably arranged at the inclined hole, an arc surface structure is formed in the bottom of the conductive copper block, the pressing module presses the conductive copper block to drive the conductive copper block to move along the inclined hole, the arc surface structure is in contact with an arc surface contact of the product, and the conductive copper block is in contact with the bottom of the probe.
According to the technical scheme, the conductive copper block moves through the downward pressing action of the downward pressing module on the inclined hole, the conductive copper block is in contact with the bottom of the probe, and the cambered surface structure is in contact with the cambered surface contact of the product, so that signal conduction is realized. The needle-setting test fixture can be suitable for complex needle-setting space, and can avoid deviation of positions of the probes and contacts of products, thereby ensuring the conduction accuracy of the probes.
The slope of inclined hole is 45 degrees, the inclined hole is provided with a first compression spring that is on a parallel with the inclined hole direction, first compression spring's both ends respectively with electrically conductive copper piece the installation piece is connected, when electrically conductive copper piece is followed the inclined hole moves down, electrically conductive copper piece pass through first compression spring with installation piece roof pressure fit.
The lower pressing die set comprises a fixed block, a transmission block, rollers and a plurality of second compression springs, wherein the fixed block is fixed at the upper end of the turnover plate, the rollers are arranged at the bottom of the transmission block, the second compression springs sequentially penetrate through the fixed block, the turnover plate and the top of the transmission block in the vertical direction, and the tops of the second compression springs are connected with an external driving mechanism.
The bottom of flip board is provided with a plurality of briquetting, flip board with be connected with third compression spring between the briquetting, when the lid closes flip board, briquetting and product roof pressure fit.
One preferable scheme is, the support plate is provided with the lock subassembly, the lock subassembly includes connecting block, turning block and fourth compression spring, the turning block rotates and sets up on the connecting block, the connecting block is fixed on the support plate, fourth compression spring connects the connecting block with between the turning block, fourth compression spring follows the turning end horizontal direction setting of turning block, works as the turning block rotates, the connecting block passes through fourth compression spring with turning block top press fit, the turning block with flip board's top press fit.
Drawings
FIG. 1 is a schematic perspective view of the present utility model;
FIG. 2 is a schematic perspective view of the present utility model when opened;
FIG. 3 is a schematic perspective view of the fastening assembly;
FIG. 4 is a schematic perspective view of the probe contacting the conductive copper block;
FIG. 5 is a cross-sectional view of the present utility model;
fig. 6 is an exploded perspective view of the oblique side pushing module.
Detailed Description
As shown in fig. 1, 2 and 6, in this embodiment, the present utility model includes a carrier plate 1 and a flip plate 2, one end of the flip plate 2 is hinged to the carrier plate 1, the other end of the flip plate 2 is in limit fit with the carrier plate 1, a profiling groove 3 adapted to a product is provided on the carrier plate 1, an inclined side pushing module 4 is provided on the carrier plate 1, a probe 5 connected to an external testing machine penetrates through the flip plate 2, the flip plate 2 is provided with a lower pressing module 6 press-fitted with the inclined side pushing module 4, the inclined side pushing module 4 includes a mounting block 7, an inclined hole 8 is provided on the mounting block 7, a conductive copper block 9 is slidably provided at the inclined hole 8, a cambered surface structure 10 is provided at the bottom of the conductive copper block 9, the lower pressing module 6 is pressed on the conductive copper block 9 to drive the conductive copper block 9 to move along the inclined hole 8, the cambered surface structure 10 contacts with a cambered surface of the product, and the conductive copper block 9 contacts with the bottom of the probe 5. The profiling groove 3 is used for mounting, a contact of a product is of an arc surface structure, the conductive copper block 9 is used as an adapter of the product probe 5 and the product, when the flip plate 2 is covered, the external driving mechanism presses the lower pressing die set 6, the lower pressing die set 6 presses the conductive copper block 9 to drive the conductive copper block 9 to move along the inclined hole 8, the arc surface structure 10 is in contact with the arc surface contact of the product, and the conductive copper block 9 is in contact with the bottom of the probe 5.
As shown in fig. 6, in this embodiment, the slope of the inclined hole 8 is 45 degrees, the inclined hole 8 is provided with a first compression spring 11 parallel to the direction of the inclined hole 8, two ends of the first compression spring 11 are respectively connected with the conductive copper block 9 and the mounting block 7, and when the conductive copper block 9 moves downward along the inclined hole 8, the conductive copper block 9 is in press fit with the mounting block 7 through the first compression spring 11. The first compression spring 11 plays a role in supporting the top pressure when the conductive copper block 9 moves downward along the inclined hole 8, and the first compression spring 11 plays a role in resetting when the conductive copper block 9 moves upward along the inclined hole 8.
As shown in fig. 5, in this embodiment, the lower pressing die set 6 includes a fixed block 12, a transmission block 13, a roller 14, and a plurality of second compression springs 15, where the fixed block 12 is fixed at the upper end of the flip plate 2, the roller 14 is disposed at the bottom of the transmission block 13, and the plurality of second compression springs 15 sequentially penetrate through the fixed block 12, the flip plate 2 and the top of the transmission block 13 along the vertical direction, and the top of the plurality of second compression springs 15 is connected with an external driving mechanism. The external driving mechanism drives the second compression spring 15 to move downwards to drive the transmission block 13 to press downwards, so that the roller 14 acts on the conductive copper block 9.
As shown in fig. 2, in this embodiment, a plurality of pressing blocks 16 are disposed at the bottom of the flip plate 2, a third compression spring 17 is connected between the flip plate 2 and the pressing blocks 16, and when the flip plate 2 is covered, the pressing blocks 16 are in pressing fit with a product, so that the product is ensured to be positioned in the profiling groove 3, displacement of the product is avoided, and further the probe cannot be accurately matched with the product.
As shown in fig. 3, in this embodiment, the carrier 1 is provided with a fastening component 18, the fastening component 18 includes a connection block 19, a rotation block 20 and a fourth compression spring 21, the rotation block 20 is rotatably disposed on the connection block 19, the connection block 19 is fixed on the carrier 1, the fourth compression spring 21 is connected between the connection block 19 and the rotation block 20, the fourth compression spring 21 is disposed along a horizontal direction of a rotation end of the rotation block 20, and when the rotation block 20 rotates, the connection block 19 is in press fit with the rotation block 20 through the fourth compression spring 21, and the rotation block 20 is in press fit with a top of the flip board 2. The buckling component 18 is of an elastic structure, so that a worker can conveniently open or close the flip plate 2, and meanwhile, the stability of the flip plate 2 in closing is guaranteed.
The working principle of the utility model is as follows: a worker or a manipulator places the product in the profiling groove,
the flip board is covered, the external driving mechanism presses the second compression spring to drive the transmission block to press downwards, so that the roller acts on the conductive copper block, the conductive copper block moves along the inclined hole, the cambered surface structure of the conductive copper block is contacted with the cambered surface contact of the product, and the conductive copper block is contacted with the bottom of the probe, so that signal conduction is realized.
Claims (5)
1. The utility model provides a needle test fixture down, includes carrier plate (1) and flip board (2), the one end of flip board (2) with carrier plate (1) is articulated, the other end of flip board (2) with carrier plate (1) spacing cooperation, profile modeling groove (3) with product looks adaptation are seted up to carrier plate (1), its characterized in that: the utility model provides a test device for testing the surface of a semiconductor wafer, including support plate (1), flip board (2) are provided with oblique side pushes away module (4) push down mould group (6), oblique side pushes away module (4) including installation piece (7), inclined hole (8) have been seted up to installation piece (7), inclined hole (8) department slides and is provided with electrically conductive copper piece (9), cambered surface structure (10) have been seted up to the bottom of electrically conductive copper piece (9), push down module (6) press in electrically conductive copper piece (9), drive electrically conductive copper piece (9) are followed inclined hole (8) remove, cambered surface structure (10) are contacted with the cambered surface contact of product, electrically conductive copper piece (9) with the bottom of probe (5).
2. The lower needle test fixture of claim 1, wherein: the slope of inclined hole (8) is 45 degrees, be provided with in inclined hole (8) to be on a parallel with first compression spring (11) of inclined hole (8) direction, the both ends of first compression spring (11) respectively with electrically conductive copper piece (9) installation piece (7) are connected, work as electrically conductive copper piece (9) are followed when inclined hole (8) moves down, electrically conductive copper piece (9) are through first compression spring (11) with installation piece (7) top press fit.
3. The lower needle test fixture of claim 1, wherein: the pressing module (6) comprises a fixed block (12), a transmission block (13), rollers (14) and a plurality of second compression springs (15), wherein the fixed block (12) is fixed at the upper end of the flip plate (2), the rollers (14) are arranged at the bottom of the transmission block (13), the second compression springs (15) sequentially penetrate through the fixed block (12) in the vertical direction, the flip plate (2) is connected with the top of the transmission block (13), and the tops of the second compression springs (15) are connected with an external driving mechanism.
4. The lower needle test fixture of claim 1, wherein: the bottom of flip board (2) is provided with a plurality of briquetting (16), flip board (2) with be connected with third compression spring (17) between briquetting (16), when lid closes flip board (2), briquetting (16) and product roof pressure fit.
5. The lower needle test fixture of claim 1, wherein: the support plate (1) is provided with lock subassembly (18), lock subassembly (18) include connecting block (19), rotating block (20) and fourth compression spring (21), rotating block (20) rotate and set up on connecting block (19), connecting block (19) are fixed on support plate (1), fourth compression spring (21) are connected connecting block (19) with between rotating block (20), fourth compression spring (21) are followed rotating end horizontal direction setting of rotating block (20), works as when rotating block (20) rotate, connecting block (19) are passed through fourth compression spring (21) with rotating block (20) top press fit, rotating block (20) with the top press fit of flip board (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223554565.3U CN219758382U (en) | 2022-12-30 | 2022-12-30 | Lower needle test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223554565.3U CN219758382U (en) | 2022-12-30 | 2022-12-30 | Lower needle test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219758382U true CN219758382U (en) | 2023-09-26 |
Family
ID=88085895
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223554565.3U Active CN219758382U (en) | 2022-12-30 | 2022-12-30 | Lower needle test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219758382U (en) |
-
2022
- 2022-12-30 CN CN202223554565.3U patent/CN219758382U/en active Active
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |