CN219744846U - High-low temperature low-pressure test box - Google Patents
High-low temperature low-pressure test box Download PDFInfo
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- CN219744846U CN219744846U CN202321160702.7U CN202321160702U CN219744846U CN 219744846 U CN219744846 U CN 219744846U CN 202321160702 U CN202321160702 U CN 202321160702U CN 219744846 U CN219744846 U CN 219744846U
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- low temperature
- pressure test
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- test chamber
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- 238000012360 testing method Methods 0.000 title claims abstract description 63
- 238000007789 sealing Methods 0.000 claims abstract description 12
- 238000012856 packing Methods 0.000 claims abstract description 6
- 230000032683 aging Effects 0.000 claims description 3
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 229920002379 silicone rubber Polymers 0.000 claims description 3
- 230000006835 compression Effects 0.000 claims description 2
- 238000007906 compression Methods 0.000 claims description 2
- 239000004945 silicone rubber Substances 0.000 claims description 2
- 230000000694 effects Effects 0.000 abstract description 3
- 230000002093 peripheral effect Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 239000000428 dust Substances 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 238000004378 air conditioning Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000005622 photoelectricity Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000005341 toughened glass Substances 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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Abstract
The utility model discloses a high-low temperature low-pressure test box, which comprises a test box main body, wherein fixing pins penetrate through and are fixedly connected to the left side positions of the inner walls of the top and the bottom of the test box main body, box doors penetrate through and are rotationally connected to the outer diameters of the fixing pins, packing pieces penetrate through and are fixedly connected to the peripheral positions of the front end of the test box main body, a telescopic cylinder is fixedly connected to the middle position on the right side of the outer surface of the test box main body, a telescopic rod penetrates through and is slidingly connected to the center position of the front end of the telescopic cylinder, and clamping pieces penetrate through and are fixedly connected to the outer surface of a ball bearing; through set up sealed pad in test box main part and chamber door seam crossing, can play good sealed effect, further through starting flexible cylinder for the telescopic link is retracted, drives the pressure strip and is close to the chamber door, and the telescopic link continues to retract, makes pressure strip and chamber door in close contact with, and compresses tightly the chamber door, makes the chamber door close more tightly, promotes device's sealing performance greatly.
Description
Technical Field
The disclosure relates to the technical field of test boxes, in particular to a high-low temperature low-pressure test box.
Background
The high-low temperature low-pressure test box is a device commonly used in laboratories such as chemistry, physics, biology and the like, provides a temperature and humidity change environment through the test box, simulates the adaptability of a test sample under the temperature and pressure change environment condition, and checks the performance index of a product. With the rapid development of industry, the high-precision products are more and more, the low-pressure high-low-temperature test chambers are more and more widely applied, and are widely applied to the fields of electronics, semiconductors, photoelectricity, communication, aviation, aerospace, scientific research, automobiles, solar energy, biotechnology, chemical industry, pharmacy and the like;
the prior patent with the publication number of CN216826233U discloses a rapid temperature-changing high-low temperature low-pressure test box, which comprises a supporting box body, wherein the top of the supporting box body is vertically connected with three sealing plates, the end parts of adjacent sealing plates are fixed through a supporting frame, the top of the supporting box body is also fixedly connected with a protective shell, the three sealing plates are all positioned in the protective shell, the upper end and the lower end of the outer wall of the sealing plate are both connected with a rectangular box body, one side of the rectangular box body penetrates into the sealing plate, a cross flow fan is rotationally connected in the rectangular box body through a rotating shaft, and one end of the rotating shaft extends to the outside of the rectangular box body and is fixedly connected with a driving motor; the inside fixedly connected with heating rod of rectangle box body, the bottom of rectangle box body all is connected with the air conditioning pipe, and the inside of supporting the box body is equipped with the refrigerator, and the bottom of air conditioning pipe extends to in the supporting box body and is connected with the refrigerator. The utility model is convenient to adjust, can realize rapid temperature change, can meet different testing requirements, and ensures the practicability of the device; however, in the high-low temperature low-pressure test box, impurities such as dust, water vapor and the like in the outside air easily enter the test box in the use process, so that the accuracy of the test result of the test box is affected;
there is a need for a high and low temperature, low pressure test chamber having good sealing properties.
Disclosure of Invention
In view of the above-described drawbacks or shortcomings of the prior art, it is desirable to provide a high and low temperature, low pressure test chamber.
The utility model provides a high-low temperature low-pressure test chamber, which comprises:
the testing box comprises a testing box body, fixing pins are penetrated and fixedly connected at the left side positions of the top and bottom inner walls of the testing box body, a box door is penetrated and rotationally connected on the outer diameter of each fixing pin, packing pieces are penetrated and fixedly connected at the periphery positions of the front end of the testing box body, a telescopic cylinder is fixedly connected at the middle position of the right side of the outer surface of the testing box body, a telescopic rod is penetrated and slidingly connected at the center position of the front end of the telescopic cylinder, a ball bearing is penetrated and fixedly connected at the front end position of the outer diameter of the telescopic rod, and a clamping piece is penetrated and fixedly connected on the outer surface of the ball bearing.
According to the technical scheme provided by the embodiment of the utility model, the packing element is a sealing gasket made of high-low temperature aging resistant silicon rubber.
According to the technical scheme provided by the embodiment of the utility model, the clamping piece adopts the L-shaped compression plate.
According to the technical scheme provided by the embodiment of the utility model, a plurality of sliding grooves which are uniformly distributed are formed in the inner walls of the left side and the right side of the main body of the test box in a penetrating mode, and the left side and the right side of the main body of the test box are connected with the storage disc in a sliding mode.
According to the technical scheme provided by the embodiment of the utility model, the central position of the front end of the box door penetrates through and is fixedly connected with the observation piece.
According to the technical scheme provided by the embodiment of the utility model, the middle position on the right side of the front end of the box door is penetrated and fixedly connected with a fixed column, and the outer diameter of the fixed column is penetrated and rotatably connected with a handle.
According to the technical scheme provided by the embodiment of the utility model, the middle position of the right side of the front end of the box door is penetrated and provided with the storage groove.
According to the technical scheme provided by the embodiment of the utility model, the top positions of the storage trays are penetrated and provided with evenly distributed flow holes.
To sum up, this technical scheme specifically discloses high low temperature low pressure test chamber, through set up sealed pad in test chamber main part and chamber door seam crossing, can play good sealed effect, further through starting flexible cylinder for the telescopic link is retracted, drives the pressure strip and is close to the chamber door, and the telescopic link continues to retract, makes pressure strip and chamber door in close contact with, and compresses tightly the chamber door, makes the chamber door close more tightly, promotes device's sealing performance greatly, avoids impurity such as dust and steam in the external air to enter into inside the device, effectively guarantees device test result accuracy.
Drawings
Other features, objects and advantages of the present utility model will become more apparent upon reading of the detailed description of non-limiting embodiments, made with reference to the accompanying drawings in which:
FIG. 1 is a schematic diagram of the overall structure of a high-low temperature low-pressure test chamber.
FIG. 2 is a schematic diagram of the structure of a compacting plate of the high-low temperature low pressure test chamber.
Fig. 3 is a schematic diagram of the structure of the door of the high-low temperature low pressure test chamber.
Fig. 4 is a schematic diagram of the main structure of the high-low temperature low-pressure test chamber.
Reference numerals in the drawings: 1. a test chamber body; 2. a telescopic cylinder; 3. a compacting plate; 4. a door; 5. a detection window; 6. a telescopic rod; 7. a ball bearing; 8. fixing the column; 9. a storage groove; 10. a handle; 11. a chute; 12. a fixing pin; 13. a sealing gasket; 14. a storage tray; 15. and a flow hole.
Detailed Description
The utility model is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the utility model and are not limiting of the utility model. It should be noted that, for convenience of description, only the portions related to the utility model are shown in the drawings.
It should be noted that, without conflict, the embodiments of the present utility model and features of the embodiments may be combined with each other. The utility model will be described in detail below with reference to the drawings in connection with embodiments.
Referring to fig. 1 to 4, the high-low temperature low pressure test chamber comprises a test chamber main body 1, fixing pins 12 are fixedly connected to the left side positions of the top and bottom inner walls of the test chamber main body 1, the outer diameters of the fixing pins 12 are penetrated and rotationally connected with a chamber door 4, the peripheral positions of the front end of the test chamber main body 1 are penetrated and fixedly connected with packing pieces, the middle position of the right side of the outer surface of the test chamber main body 1 is fixedly connected with a telescopic cylinder 2, the center position of the front end of the telescopic cylinder 2 is penetrated and slidably connected with a telescopic rod 6, the front end position of the outer diameter of the telescopic rod 6 is penetrated and fixedly connected with a ball bearing 7, and the outer surface of the ball bearing 7 is penetrated and fixedly connected with clamping pieces.
It should be noted that, as shown in fig. 4, the gasket is made of a high-temperature aging-resistant silicone rubber gasket 13.
It should be noted that, as shown in fig. 2, the clamping piece adopts the hold-down plate 3 that is the L type, and hold-down plate 3 can carry out 180 rotations to hold-down plate 3 with chamber door 4 in close contact with, can make hold-down plate 3 right side edge flush with the outer surface right side of test box main part 1, makes things convenient for the technicians to open or close chamber door 4.
It should be noted that, as shown in fig. 4, a plurality of sliding grooves 11 uniformly distributed are all penetrated and arranged on the inner walls of the left and right sides of the main body 1 of the test box, and a storage tray 14 is slidably connected to each of the left and right adjacent sliding grooves 11 for storing objects to be tested and detected.
It should be noted that, as shown in fig. 1, the central position of the front end of the box door 4 is penetrated and fixedly connected with an observation piece, the observation piece adopts a detection window 5 made of toughened glass, and a technician can observe the object state detected by the test in the test box main body 1 through the detection window 5.
As shown in fig. 3, the middle position on the right side of the front end of the door 4 is penetrated and fixedly connected with a fixing column 8, the outer diameter of the fixing column 8 is penetrated and rotatably connected with a handle 10, and by pulling the handle 10, a technician can conveniently open or close the door 4 with force.
As shown in fig. 3, the middle position on the right side of the front end of the door 4 is penetrated and provided with a storage groove 9, and the handle 10 can be stored into the storage groove 9 by rotating the handle 10, so that the handle 10 is prevented from protruding, and the rotation of the compacting plate 3 is prevented from being affected.
It should be noted that, as shown in fig. 4, the top positions of the storage tray 14 are all penetrated and provided with uniformly distributed ventilation holes 15, so that the air inside the device circulates, and the internal temperature and the air pressure are kept consistent, and it should be added that the ball bearing 7 consists of an outer ring, a middle ball and an inner ring, and the outer ring and the inner ring can rotate relatively without mutual interference.
Working principle: in the use, through set up sealed pad 13 in test box main part 1 and chamber door 4 seam crossing, can play good sealed effect, further through start telescopic cylinder 2 for telescopic link 6 is retracted, drives pinch roller 3 and is close to chamber door 4, and telescopic link 6 continues to retract, makes pinch roller 3 and chamber door 4 in close contact with, and compresses tightly chamber door 4, makes chamber door 4 closed tighter, promotes the sealing performance of device greatly, avoids impurity such as dust and steam in the external air to enter into the device inside, effectively guarantees device test result accuracy.
The above description is only illustrative of the preferred embodiments of the present utility model and of the principles of the technology employed. It will be appreciated by persons skilled in the art that the scope of the utility model referred to in the present utility model is not limited to the specific combinations of the technical features described above, but also covers other technical features formed by any combination of the technical features described above or their equivalents without departing from the inventive concept. Such as the above-mentioned features and the technical features disclosed in the present utility model (but not limited to) having similar functions are replaced with each other.
Claims (8)
1. High low temperature low pressure test chamber, its characterized in that includes:
the novel testing box comprises a testing box body (1), fixing pins (12) are fixedly connected to the left side positions of the top and bottom inner walls of the testing box body (1), a box door (4) is fixedly connected to the outer diameter of each fixing pin (12) in a penetrating and rotating mode, packing pieces are fixedly connected to the periphery positions of the front end of the testing box body (1), a telescopic cylinder (2) is fixedly connected to the middle position of the right side of the outer surface of the testing box body (1), a telescopic rod (6) is fixedly connected to the center position of the front end of the telescopic cylinder (2) in a penetrating and sliding mode, ball bearings (7) are fixedly connected to the front end position of the outer diameter of each telescopic rod (6), and clamping pieces are fixedly connected to the outer surface of each ball bearing (7).
2. The high-low temperature and low-pressure test chamber according to claim 1, wherein the packing element is a sealing gasket (13) made of high-low temperature aging resistant silicone rubber.
3. The high-low temperature and low-pressure test chamber according to claim 1, wherein the clamping member adopts an L-shaped compression plate (3).
4. The high-low temperature low-pressure test chamber according to claim 1, wherein a plurality of sliding grooves (11) which are uniformly distributed are formed in the inner walls of the left side and the right side of the test chamber main body (1), and a storage disc (14) is connected to each of the two adjacent sliding grooves (11) in a sliding manner.
5. The high-low temperature low-pressure test chamber according to claim 1, wherein an observation member is fixedly connected to the front end center position of the chamber door (4).
6. The high-low temperature low-pressure test chamber according to claim 1, wherein a fixing column (8) is penetrated and fixedly connected at the middle position on the right side of the front end of the chamber door (4), and a handle (10) is penetrated and rotatably connected on the outer diameter of the fixing column (8).
7. The high-low temperature low-pressure test chamber according to claim 1, wherein a receiving groove (9) is formed in the middle of the right side of the front end of the chamber door (4).
8. The high-low temperature low-pressure test chamber according to claim 4, wherein the top positions of the storage trays (14) are all penetrated and provided with evenly distributed flow holes (15).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321160702.7U CN219744846U (en) | 2023-05-15 | 2023-05-15 | High-low temperature low-pressure test box |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321160702.7U CN219744846U (en) | 2023-05-15 | 2023-05-15 | High-low temperature low-pressure test box |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219744846U true CN219744846U (en) | 2023-09-26 |
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ID=88081746
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321160702.7U Active CN219744846U (en) | 2023-05-15 | 2023-05-15 | High-low temperature low-pressure test box |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219744846U (en) |
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2023
- 2023-05-15 CN CN202321160702.7U patent/CN219744846U/en active Active
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