CN219737606U

CN219737606U - Probe device and battery preparation system

Info

Publication number: CN219737606U
Application number: CN202321619556.XU
Authority: CN
Inventors: 张赛; 曹杰; 刘勇旺
Original assignee: Contemporary Amperex Technology Co Ltd
Current assignee: Contemporary Amperex Technology Co Ltd
Priority date: 2023-06-26
Filing date: 2023-06-26
Publication date: 2023-09-22
Anticipated expiration: 2033-06-26

Abstract

The utility model relates to a probe device and a battery preparation system, wherein the probe device comprises a first probe, the first probe comprises a body and a first detection head arranged at one end of the body, and the first detection head is used for contacting with an object to be detected; wherein the first detection head has a first contact portion and a second contact portion, at least a portion of the second contact portion and the first contact portion having a height difference in an axial direction of the body. According to the probe device, the first contact part and the second contact part for contacting with the object to be detected are arranged on the first detection head, and at least part of the second contact part and the first contact part have a height difference in the axial direction of the body, so that the contact part of the first detection head and the object to be detected is not completely planar, the adaptation detection of the objects to be detected with different planeness is realized, the compatibility and universality of the probe device are improved, and the acquisition precision of the electrical parameters of the object to be detected is improved.

Description

Probe device and battery preparation system

Technical Field

The utility model relates to the technical field of battery testing, in particular to a probe device and a battery preparation system.

Background

The detection probe is widely applied to the field of battery testing and is used for collecting the voltage and the current of a battery.

In the related art, a single cuspid probe is generally adopted as a detection probe, but the use condition of the cuspid probe is severe, and the detected object needs to have higher flatness to enable the detection result to be accurate. The detection probes are difficult to be compatible or adapt to an object to be detected with a certain inclination, gradient and other structures, and have poor compatibility and universality.

Disclosure of Invention

The present utility model aims to solve at least one of the technical problems existing in the prior art. Therefore, the probe device and the battery preparation system provided by the utility model can detect objects to be detected with different planeness, and have higher compatibility and universality.

In a first aspect, the present utility model provides a probe apparatus comprising: the first probe comprises a body and a first detection head arranged at one end of the body, and the first detection head is used for being in contact with an object to be detected;

wherein the first detection head has a first contact portion and a second contact portion, at least a portion of the second contact portion and the first contact portion having a height difference in an axial direction of the body.

The probe device according to the first aspect of the utility model has at least the following advantages:

according to the probe device, the first contact part and the second contact part which are used for being in contact with the object to be detected are arranged on the first detection head, at least part of the second contact part and the first contact part have a height difference in the axis direction of the body, when the surface flatness of the object to be detected is poor, for example, the surface of the object to be detected has a certain gradient, one or all of the first contact part and the second contact part on the first detection head can be in contact with the gradient part of the object to be detected, so that the contact area of the first detection head and the object to be detected is increased, and the acquisition accuracy of current and/or voltage of the object to be detected is improved. When the surface flatness of the object to be detected is higher, for example, the surface of the object to be detected is a horizontal plane, one of the first contact part and the second contact part on the first detection head can form surface-to-surface contact with the object to be detected, so that the first detection head and the object to be detected are ensured to have larger contact area, and the acquisition accuracy of current and/or voltage of the object to be detected can be improved.

According to the probe device, the first contact part and the second contact part for contacting with the object to be detected are arranged on the first detection head, and at least part of the second contact part and the first contact part have a height difference in the axial direction of the body, so that the contact part of the first detection head and the object to be detected is not completely planar, and the parts with different structures on the first detection head can be contacted with the surface of the object to be detected, thereby realizing the adaptive detection of the object to be detected with different planeness, improving the compatibility and universality of the probe device, and improving the acquisition precision of the electrical parameters of the object to be detected.

In some embodiments, the first contact portion and the second contact portion each have a plurality, and the plurality of first contact portions are arranged in an annular shape, and the plurality of second contact portions are arranged in an annular shape.

Therefore, the distribution range of the first contact part and the second contact part is enlarged, a plurality of first contact parts and a plurality of second contact parts can be used for being contacted with the surface of the object to be detected, so that the probability that the first contact parts and the second contact parts are contacted with the surface of the object to be detected is improved, the object to be detected with an irregular shape is adapted, and the overall compatibility and the overall adaptability of the probe device are further improved. Meanwhile, the contact area between the first detection head and the surface of the object to be detected can be increased, so that a plurality of parts on the first detection head can be in contact with the surface of the object to be detected, and the accuracy of the acquired electrical parameters of the object to be detected is improved.

In some embodiments, the first contact portion and the second contact portion are connected, and a connection of the first contact portion and the second contact portion forms a first cut portion.

Therefore, when the probe device performs detection action on the object to be detected, the first detection head applies certain pressing force to the surface of the object to be detected, so that the first contact part and/or the second contact part form surface contact with the corresponding position of the surface of the object to be detected, and meanwhile, the first cutting part can puncture the oxide layer of the surface of the object to be detected, so that the accuracy of the electrical parameters of the object to be detected, which are acquired by the first detection head, is improved.

In some embodiments, the first detection head further has a third contact portion, the third contact portion is located between two adjacent first contact portions, and a cross-sectional area of the third contact portion gradually decreases along an axial direction of the body.

Therefore, the first contact part and the second contact part form a convex part structure, the third contact part independently forms a convex part structure, and a concave part structure is formed between the first contact part and the third contact part, so that the first detection head is provided with a plurality of concave part structures and a plurality of convex part structures along the circumferential direction, the surface of the first detection head is compatible with an object to be detected with a plurality of concave-convex structures, and the accuracy of the probe device for acquiring the electrical parameters of the object to be detected is improved.

In some embodiments, a bottom end of the third contact portion forms a second cutting portion, and the second cutting portion is disposed at the same height as the first cutting portion.

Therefore, when the third contact part is contacted with the object to be detected, the second cutting part can also effectively puncture the oxide layer corresponding to the surface of the object to be detected. The second cutting part can be in a dot-shaped structure or a linear structure, so that the sharpness of the second cutting part is improved.

Moreover, the first cutting parts and the second cutting parts can synchronously contact the surface of the object to be detected, so that an oxide layer corresponding to the surface of the object to be detected is punctured, and the accuracy of the electrical parameters of the object to be detected acquired by the first detection head is further improved.

In some embodiments, a second probe is further included, the second probe being disposed through the body.

Thus, the probe device can integrate the voltage detection probe and the current detection probe on one structure, reduce the whole structural volume of the probe device and increase the functionality of the probe device.

In some embodiments, a second probe is provided at an end of the second probe near the first probe, the second probe is used for contacting with an object to be detected, and the first contact portion and the second contact portion are all enclosed along the circumference of the second probe.

Therefore, the distribution positions of the first detection head and the second detection head are relatively compact, and the overall integration level of the probe device is improved. Moreover, the contact parts of the first detection head and the second detection head and the object to be detected can be relatively close, and the accuracy of the electric parameters acquired by the first detection head and the second detection head can be improved to a certain extent.

In some embodiments, the second detection head is configured as a tip structure.

Therefore, the second detection head has a certain sharpness, and when the second detection head contacts the surface of the object to be detected, the tip part of the second detection head can puncture the oxide layer on the surface of the object to be detected, so that the accuracy of the second detection head for collecting the electrical parameters corresponding to the object to be detected is improved.

In some embodiments, an insulating member is disposed between the body and the second probe, and the insulating member is sleeved on the second probe.

Therefore, the first probe and the second probe can be mutually insulated, current collection of the first probe on the object to be detected and voltage collection of the second probe on the object to be detected are mutually independent and do not interfere with each other, and detection accuracy of the first probe 100 and the second probe on corresponding electrical parameters is improved.

In some embodiments, a first elastic member is provided between the insulating member and the body, and the first elastic member is used for applying an elastic force to the body along an axial direction of the body.

Therefore, the pressure of the tip structures of the first cutting part, the second cutting part and the second detection head on the surface of the object to be detected can be increased, so that the tip structures of the first cutting part, the second cutting part and the second detection head on the first detection head can more effectively puncture the oxide layer on the surface of the object to be detected, and the detection accuracy of the first probe and the second probe on the corresponding electrical parameters of the object to be detected is further improved.

In some embodiments, the probe apparatus further comprises:

the body penetrates through the mounting seat;

the second elastic piece is arranged between the mounting seat and the first detection head and is used for applying elastic force along the axial direction of the body to the first detection head.

Therefore, the pressure applied to the surface of the object to be detected by the first cutting part and the second cutting part on the first detection head can be increased by means of the high-strength elastic force of the second elastic piece, so that the first cutting part and the second cutting part on the first detection head can be ensured to effectively puncture the oxide layer on the surface of the object to be detected, and the detection accuracy of the first detection head on the corresponding electrical parameters of the object to be detected is improved.

In a second aspect, the present utility model provides a battery preparation system comprising a probe apparatus as described above.

The battery preparation system according to the second aspect of the present utility model has at least the following advantageous effects:

the battery preparation system provided by the utility model has the same technical effects brought by the probe device because the probe device is configured, namely, the battery preparation system can realize the adaptive detection of the objects to be detected with different planeness, has better compatibility and universality, and improves the acquisition precision of the electrical parameters of the objects to be detected.

The foregoing description is only an overview of the present utility model, and is intended to be implemented in accordance with the teachings of the present utility model in order that the same may be more clearly understood and to make the same and other objects, features and advantages of the present utility model more readily apparent.

Drawings

Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the utility model. Also, like reference numerals are used to designate like parts throughout the accompanying drawings. In the drawings:

FIG. 1 is a perspective view of a probe apparatus according to an embodiment of the present utility model in an isometric view.

FIG. 2 is a schematic view of a portion of a probe apparatus according to an embodiment of the utility model.

FIG. 3 is a schematic diagram of a probe apparatus according to an embodiment of the present utility model.

Fig. 4 is an enlarged view of a partial structure at a in fig. 3.

FIG. 5 is another perspective view of a probe apparatus according to an embodiment of the present utility model in an isometric view.

FIG. 6 is a schematic diagram of another structure of a probe apparatus according to an embodiment of the utility model.

Reference numerals illustrate: a first probe 100; a body 110; a first detection head 120; a first contact portion 121; a second contact portion 122; a first cutting portion 123; a third contact portion 124; a second cutting portion 125; a second probe 200; a second detection head 210; an insulator 300; a first elastic member 400; a mounting base 500; and a second elastic member 600.

Detailed Description

In order that the above objects, features and advantages of the utility model will be readily understood, a more particular description of the utility model will be rendered by reference to the appended drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present utility model. The present utility model may be embodied in many other forms than described herein and similarly modified by those skilled in the art without departing from the spirit of the utility model, whereby the utility model is not limited to the specific embodiments disclosed below.

In the description of the present utility model, it should be understood that, if any, these terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., are used herein with respect to the orientation or positional relationship shown in the drawings, these terms refer to the orientation or positional relationship for convenience of description and simplicity of description only, and do not indicate or imply that the apparatus or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the utility model.

Furthermore, the terms "first," "second," and the like, if any, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present utility model, the terms "plurality" and "a plurality" if any, mean at least two, such as two, three, etc., unless specifically defined otherwise.

In the present utility model, unless explicitly stated and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly. For example, the two parts can be fixedly connected, detachably connected or integrated; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.

In the present utility model, unless expressly stated or limited otherwise, the meaning of a first feature being "on" or "off" a second feature, and the like, is that the first and second features are either in direct contact or in indirect contact through an intervening medium. Moreover, a first feature being "above," "over" and "on" a second feature may be a first feature being directly above or obliquely above the second feature, or simply indicating that the first feature is level higher than the second feature. The first feature being "under", "below" and "beneath" the second feature may be the first feature being directly under or obliquely below the second feature, or simply indicating that the first feature is less level than the second feature.

It will be understood that if an element is referred to as being "fixed" or "disposed" on another element, it can be directly on the other element or intervening elements may also be present. If an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and the like as used herein, if any, are for descriptive purposes only and do not represent a unique embodiment.

In the related art, a single cuspid probe is generally adopted as a detection probe, but the use condition of the cuspid probe is severe, the detected object is required to have higher flatness (for example, the surface of the detected object is a horizontal plane), and the bottom detection end of the cuspid probe and the surface of the detected object are ensured to be kept in a parallel state, so that the detection result is accurate. If the bottom detection end of the cuspid probe and the detected object have a larger inclination angle, the detection result is inaccurate. Moreover, the single cuspid probe is easy to wear in a long-term use process, and the service life of the detection probe is influenced.

Obviously, the detection probe is difficult to be compatible or adapt to an object to be detected with a certain inclination, gradient and other structures, and has poor compatibility and universality.

Referring to fig. 1 and 2, the present utility model provides a probe device, which includes a first probe 100, the first probe 100 includes a body 110 and a first detecting head 120 disposed at one end of the body 110, and the first detecting head 120 is used for contacting an object to be detected.

Wherein the first detection head 120 has a first contact portion 121 and a second contact portion 122, and at least a portion of the second contact portion 122 has a height difference from the first contact portion 121 in the axis direction of the body 110.

The object to be measured may be, but is not limited to, a battery structure such as a cylindrical battery or a prismatic battery.

The first probe 100 may be a current detection probe or a voltage detection probe to collect a current or a voltage corresponding to the object to be measured. When the first contact portion 121 and/or the second contact portion 122 of the first detection head 120 contact the surface of the object to be detected, the first detection head 120 can collect the electrical parameters of the object to be detected. For example, the first probe 100 may be a current detection probe, the object to be detected is a battery, and when the first contact portion 121 and/or the second contact portion 122 of the first detection head 120 contact the electrode terminal of the battery, the first probe 100 can collect the current of the battery.

The difference in height between at least part of the second contact portion 122 and the first contact portion 121 in the axial direction of the body 110 can be understood as: at least part of the second contact portion 122 is not on the same horizontal plane as the first contact portion 121. In this way, the contact portion between the first detection head 120 and the object is not completely planar, so as to adapt to the object with poor surface flatness.

It should be noted that, specific structures of the first contact portion 121 on the first detection head 120 include, but are not limited to, a planar structure, a bevel structure, a cambered surface structure, a sawtooth structure, a stair structure, and the like. Also, the structure of the second contact portion 122 includes, but is not limited to, a planar structure, a beveled structure, a cambered surface structure, a saw tooth structure, a stepped structure, and the like.

For example, referring to fig. 1 and 2, the first contact portion 121 is a horizontal plane, the second contact portion 122 is an inclined plane, at this time, the second contact portion 122 is inclined with respect to the first contact portion 121, and an included angle is formed between the second contact portion 122 and the first contact portion 121, that is, the horizontal plane of the first contact portion 121 and the inclined plane of the second contact portion 122 are not on the same plane, and have a height difference.

For another example, the first contact portion 121 is a horizontal plane, the second contact portion 122 is an arc surface, and at this time, a tangent line at any point on the second contact portion 122 is inclined with respect to the first contact portion 121, that is, an included angle is formed between the tangent line at any point on the second contact portion 122 and the first contact portion 121, so that the first contact portion 121 and the second contact portion 122 form a height difference.

It can be understood that when the probe device of the present utility model detects an object with poor surface flatness, for example, when the surface of the object has a certain gradient or a convex portion, since the first contact portion 121 and the second contact portion 122 for contacting the object are disposed on the first detection head 120, and at least a portion of the second contact portion 122 and the first contact portion 121 have a height difference in the axial direction of the body 110, one or all of the first contact portion 121 and the second contact portion 122 on the first detection head 120 can contact the gradient portion of the object, so as to increase the contact area between the first detection head 120 and the object, improve the current and/or voltage collection accuracy of the object, and realize compatible adaptation to the object.

When the surface flatness of the object to be measured is high, for example, when the surface of the object to be measured is a horizontal plane, one of the first contact portion 121 and the second contact portion 122 on the first detection head 120 can form surface-to-surface contact with the object to be measured, so that the first detection head 120 and the object to be measured are ensured to have a larger contact area, the collection accuracy of the current and/or the voltage of the object to be measured can be improved, and the compatible adaptation of the object to be measured can be realized.

Obviously, in the probe device of the present utility model, the first contact portion 121 and the second contact portion 122 for contacting with the object to be tested are disposed on the first detection head 120, and at least part of the second contact portion 122 and the first contact portion 121 have a height difference in the axis direction of the body 110, so that the contact portion of the first detection head 120 and the object to be tested is not completely planar, so that the contact portions of the first detection head 120 with different structures can contact with the surface of the object to be tested, thereby realizing the adaptive detection of the object to be tested with different planeness, not only improving the compatibility and universality of the probe device, but also improving the acquisition precision of the electrical parameters of the object to be tested.

In addition, the first contact part 121 and the second contact part 122 for contacting with the object to be detected are arranged on the first detection head 120, so that the parts with different structures on the first detection head 120 can contact with the surface of the object to be detected, and compared with the traditional single-cuspid probe structure, the single-cuspid probe structure is not easy to wear and has longer service life.

In some embodiments of the present utility model, the first contact portion 121 and the second contact portion 122 have a plurality, and the plurality of first contact portions 121 are annularly arranged, and the plurality of second contact portions 122 are annularly arranged.

Specifically, referring to fig. 1 and 2, the body 110 and the first detection head 120 are each cylindrical. The first contact portion 121 is a horizontal plane, and the second contact portion 122 is a slope. The first contact portion 121 and the second contact portion 122 are two, the two first contact portions 121 are symmetrically distributed with respect to the central axis of the first detection head 120, and similarly, the two second contact portions 122 are symmetrically distributed with respect to the central axis of the first detection head 120. Of course, in other embodiments, the number of the first contact portions 121 and the second contact portions 122 is the same, and the number of the first contact portions 121 and the second contact portions 122 may be three or four.

According to the utility model, the first contact parts 121 and the second contact parts 122 are arranged in a plurality, the first contact parts 121 are annularly arranged, the second contact parts 122 are annularly arranged, the distribution range of the first contact parts 121 and the second contact parts 122 is enlarged, and the first contact parts 121 and the second contact parts 122 can be used for being contacted with the surface of an object to be detected, so that the probability that the first contact parts 121 and the second contact parts 122 are contacted with the surface of the object to be detected is improved, the irregularly-shaped object to be detected is adapted, and the compatibility and the adaptability of the whole probe device are further improved. Meanwhile, the contact area between the first detection head 120 and the surface of the object to be detected can be increased, so that a plurality of parts on the first detection head 120 can be contacted with the surface of the object to be detected, and the accuracy of the acquired electrical parameters of the object to be detected is improved.

It should be noted that, the battery generally uses aluminum and nickel materials to manufacture the casing, so that a dense oxide layer can be generated on the surface of the battery, and therefore, the detection probe needs to puncture the oxide layer on the surface of the battery, so as to more effectively collect electrical parameters such as voltage and current of the battery.

Based on this, in some embodiments of the present utility model, referring again to fig. 2, 3 and 4, the first contact portion 121 and the second contact portion 122 are connected, and the connection of the first contact portion 121 and the second contact portion 122 forms a first cut portion 123.

Specifically, the first contact portion 121 and the second contact portion 122 are integrally provided. The first contact portion 121 and the second contact portion 122 are each configured as a blade structure having a certain sharpness. The first contact portion 121 is a horizontal plane, and the second contact portion 122 is an inclined plane, so that the second contact portion 122 is inclined at a certain angle with respect to the first contact portion 121, so that a tip structure is formed at the connection position of the first contact portion 121 and the second contact portion 122, and the tip structure forms a first cutting portion 123 capable of piercing the oxide layer on the surface of the battery.

In this way, when the probe device performs a detection action on the object to be detected, the first detection head 120 applies a certain pressing force to the surface of the object to be detected, so that the first contact portion 121 and/or the second contact portion 122 form surface contact with the corresponding position on the surface of the object to be detected, and meanwhile, the first cutting portion 123 punctures the oxide layer on the surface of the object to be detected, thereby improving the accuracy of the electrical parameters of the object to be detected acquired by the first detection head 120.

Further, a plurality of first contact portions 121 and a plurality of second contact portions 122 may be disposed on the first detection head 120 in a ring shape such that a plurality of first cutting portions 123 are formed on the first detection head 120 in a ring shape. When the probe device performs a detection action on the object to be detected, the first detection head 120 applies a certain pressing force to the surface of the object to be detected, and the plurality of first cutting portions 123 can puncture the oxide layer corresponding to the surface of the object to be detected, so that the accuracy of the electrical parameters of the object to be detected acquired by the first detection head 120 is further improved. In addition, by providing the plurality of first cutting portions 123, when one or more of the first cutting portions 123 is reduced in functionality due to long-term wear, the remaining first cutting portions 123 can function as supplemental cutting oxide layers, thereby improving the overall fault tolerance of the probe device.

In addition, the first contact portion 121 and the second contact portion 122 may be configured as blade structures, so that the first contact portion 121 and the second contact portion 122 have a certain cutting sharpness, and thus the first contact portion 121 and the second contact portion 122 can also pierce an oxide layer on the surface of the object to be measured.

In some embodiments of the present utility model, referring again to fig. 2, 3 and 4, the first detecting head 120 further has a third contact portion 124, the third contact portion 124 is located between two adjacent first contact portions 121, and the cross-sectional area of the third contact portion 124 gradually decreases along the axial direction of the body 110.

Specifically, the first detecting head 120 has a cylindrical shape, and the third contact portion 124 has an inverted cone shape or V shape, that is, the cross-sectional area of the third contact portion 124 gradually decreases from bottom to top. It is understood that the third contact portions 124 have a plurality, and each third contact portion 124 is located between two adjacent first contact portions 121.

The first contact portions 121 and the third contact portions 124 are alternately distributed at intervals around the center circumference of the bottom of the first detection head 120, so that the first contact portions 121 and the second contact portions 122 form a convex structure, the third contact portions 124 form a convex structure alone, and a concave structure is formed between the first contact portions 121 and the third contact portions 124, so that the first detection head 120 is provided with a plurality of concave structures and a plurality of convex structures along the circumferential direction, the compatible surface is provided with a to-be-detected object with a plurality of concave-convex structures, and the accuracy of the probe device for acquiring electrical parameters of the to-be-detected object is improved.

In some embodiments of the present utility model, referring to fig. 3 and 4, the bottom end of the third contact portion 124 forms a second cutting portion 125, and the second cutting portion 125 is disposed at the same height as the first cutting portion 123.

Specifically, the third contact portion 124 is configured as a blade structure, and the second cutting portion 125 formed at the bottom end of the third contact portion 124 has good sharpness, so that when the third contact portion 124 contacts with the object to be measured, the second cutting portion 125 can also effectively puncture the oxide layer corresponding to the surface of the object to be measured. The second cutting portion 125 may have a dot-like structure or a linear structure to enhance sharpness thereof.

In addition, the fact that the second cutting portion 125 is disposed at the same height as the first cutting portion 123 may be understood that the second cutting portion 125 and the first cutting portion 123 are disposed on the same horizontal plane. When the probe device performs a detection action on the object to be detected, the first detection head 120 applies a certain pressing force to the surface of the object to be detected, and the plurality of first cutting portions 123 and the plurality of second cutting portions 125 can synchronously contact the surface of the object to be detected, so as to puncture an oxide layer corresponding to the surface of the object to be detected, and further improve the accuracy of the electrical parameters of the object to be detected acquired by the first detection head 120.

In some embodiments of the present utility model, referring to fig. 1 and 3, a second probe 200 is further included, and the second probe 200 is disposed through the body 110.

Specifically, the body 110 has a cavity for accommodating the second probe 200, and the second probe 200 is movably disposed in the cavity. The first probe 100 is a current detection probe, and is used for collecting a current corresponding to an object to be detected. The second probe 200 is a voltage detection probe, and is used for collecting a voltage corresponding to the object to be detected. When the probe device performs a detection operation on the object to be detected, the first probe 100 and the second probe 200 can be respectively contacted with the surface of the object to be detected, so that the current and the voltage of the object to be detected are respectively collected.

According to the utility model, the second probe 200 is arranged, and the second probe 200 is penetrated into the body 110 of the first probe 100, so that the probe device can integrate the voltage detection probe and the current detection probe on one structure, the whole structural volume of the probe device is reduced, and the functionality of the probe device is increased.

In some embodiments of the present utility model, referring to fig. 2, 3 and 4, the end of the second probe 200 near the first detection head 120 has a second detection head 210, the second detection head 210 is used for contacting with an object to be detected, and the first contact portion 121 and the second contact portion 122 are all enclosed along the circumference of the second detection head 210.

Specifically, the body 110 and the first detection head 120 are both cylindrical, and the body 110 and the first detection head 120 are coaxially disposed. The second probe 200 is disposed in the body 110 and is in the same line with the axis of the body 110, and the second detecting head 210 is located at the center of the bottom surface of the first detecting head 120. The first contact portion 121 and the second contact portion 122 are integrally provided in a trapezoidal structure, and the third contact portion 124 is in a V-shaped structure. The trapezoid structures and the V-shaped structures are alternately surrounded by the second detecting head 210.

By surrounding the first contact portion 121 and the second contact portion 122 along the circumference of the second detection head 210, the distribution positions of the first detection head 120 and the second detection head 210 are relatively compact, and the overall integration level of the probe device is improved. Moreover, the contact portions between the first and second detection heads 120 and 210 and the object to be measured can be made relatively close, and the accuracy of the electrical parameters acquired by the first and second detection heads 120 and 210 can be improved to some extent.

Further, referring again to fig. 2, 3 and 4, the second detection head 210 is configured as a tip structure.

Specifically, the second detection head 210 may have a tip structure of an inverted cone shape, a zigzag shape, or the like.

By constructing the second detecting head 210 as a tip structure, the second detecting head 210 has a certain sharpness, and when the second detecting head 210 contacts the surface of the object to be detected, the tip part of the second detecting head 210 can puncture the oxide layer on the surface of the object to be detected, so that the accuracy of the second detecting head 210 for collecting the electrical parameters corresponding to the object to be detected is improved.

Referring to fig. 1 and 3, in some embodiments of the present utility model, an insulating member 300 is disposed between the body 110 and the second probe 200, and the insulating member 300 is sleeved on the second probe 200.

Specifically, the insulating member 300 is an insulating sleeve or an insulating cylinder, and the insulating member 300 is formed of an insulating material. The body 110 is cylindrical, and the insulator 300 is embedded in the inner wall of the body 110 and sleeved with the second probe 200.

According to the utility model, the insulating piece 300 is arranged between the body 110 and the second probe 200, so that the first probe 100 and the second probe 200 can be mutually insulated, the current collection of the first probe 100 on the object to be detected and the voltage collection of the second probe 200 on the object to be detected are ensured to be mutually independent and mutually noninterfere, and the detection accuracy of the first probe 100 and the second probe 200 on corresponding electrical parameters is improved.

In some embodiments of the present utility model, referring to fig. 1 and 3, a first elastic member 400 is provided between the insulating member 300 and the body 110, and the first elastic member 400 is used to apply an elastic force to the body 110 in an axial direction of the body 110.

Specifically, the first elastic member 400 is a compression spring. The body 110 has a cavity for accommodating the first elastic member 400, the first elastic member 400 is sleeved on the second probe 200, and two ends of the first elastic member 400 are respectively abutted against the insulating member 300 and the body 110.

When the probe device performs a detection action on the object to be detected, the external force pushes the body 110 to contact the surface of the object to be detected, the first elastic member 400 is compressed by the body, and the first elastic member 400 applies a reaction force along the axis of the body 110 to the body 100 through the insulating member 300, so that the first detection head 120 and the second detection head 210 at the end of the body 110 are in close contact with the surface of the object to be detected, and the first detection head 120 and the second detection head 210 are ensured to be capable of effectively acquiring electrical parameters corresponding to the object to be detected, thereby improving the overall detection efficiency of the probe device.

In addition, the first elastic member 400 applies an elastic force to the body 110 along the axial direction of the body 110, and can increase the pressure of the tip structures of the first cutting part 123, the second cutting part 125, and the second detecting head 210 on the surface of the object to be detected on the first detecting head 120, so that the tip structures of the first cutting part 123, the second cutting part 125, and the second detecting head 210 on the first detecting head 120 more effectively pierce the oxide layer on the surface of the object to be detected, and the detection accuracy of the first probe 100 and the second probe 200 on the corresponding electrical parameters of the object to be detected is further improved.

In some embodiments of the present utility model, referring to fig. 5 and 6, the probe apparatus further includes a mount 500 and a second elastic member 600. The body 110 is disposed through the mounting seat 500. The second elastic member 600 is disposed between the mounting seat 500 and the first detection head 120, and the second elastic member 600 is configured to apply an elastic force to the first detection head 120 along the axial direction of the body 110.

Specifically, the mounting base 500 has a frame structure, and a plurality of probe devices of the utility model can be mounted on the mounting base 500 to realize detection of batch objects to be detected.

The second elastic member 600 is two elastic sheets formed of high manganese spring steel. The two elastic sheets are respectively disposed on two sides of the first detection head 120 and between the mounting seat 500 and the first detection head 120. The two ends of the second elastic member 600 may be fixedly connected with the first detection head and the mounting seat 500 by welding or fastening.

It should be understood that, when the mounting seat 500 drives the body 110 to move in a direction approaching to the surface of the object to be detected, so that the first contact portion 121 and/or the second contact portion 122 of the first detection head 120 are in contact with the surface of the object to be detected, the first elastic member 400 is compressed by the body 110, and at the same time, the second elastic member 600 is compressed by the mounting seat 500. In this way, the pressure applied to the surface of the object to be detected by the first cutting portion 123 and the second cutting portion 125 on the first detecting head 120 can be increased by the high-strength elastic force of the second elastic member 600, so that the first cutting portion 123 and the second cutting portion 125 on the first detecting head 120 can effectively puncture the oxide layer on the surface of the object to be detected, and the detection accuracy of the first probe 100 on the corresponding electrical parameters of the object to be detected can be improved.

Similarly, the pressure of the tip structure of the second detecting head 210 on the surface of the object to be detected can be increased by means of the high-strength elastic force of the second elastic member 600, so that the tip structure of the second detecting head 210 more effectively punctures the oxide layer on the surface of the object to be detected, and further the detection accuracy of the second probe 200 on the corresponding electrical parameter of the object to be detected is improved.

In addition, the utility model also provides a battery preparation system, which comprises the probe device.

In some embodiments of the present utility model, a probe apparatus is provided, including a first probe 100, the first probe 100 including a body 110 and a first detection head 120 disposed at one end of the body 110, the first detection head 120 being configured to contact an object to be detected. Wherein the first detection head 120 has a first contact portion 121 and a second contact portion 122, and at least a portion of the second contact portion 122 has a height difference from the first contact portion 121 in the axis direction of the body 110. Meanwhile, a battery preparation system is also provided, and the battery preparation system comprises the probe device.

According to the probe device and the battery preparation system, the first contact part 121 and the second contact part 122 for contacting with the object to be detected are arranged on the first detection head 120, and at least part of the second contact part 122 and the first contact part 121 have a height difference in the axis direction of the body 110, so that the contact part of the first detection head 120 and the object to be detected is not completely planar, and the parts with different structures on the first detection head 120 can be contacted with the surface of the object to be detected, thereby realizing the adaptive detection of the object to be detected with different planeness, improving the compatibility and universality of the probe device, and improving the acquisition precision of the electrical parameters of the object to be detected.

The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The above examples illustrate only a few embodiments of the utility model, which are described in detail and are not to be construed as limiting the scope of the claims. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the utility model, which are all within the scope of the utility model. Accordingly, the scope of protection of the present utility model is to be determined by the appended claims.

Claims

1. A probe apparatus, comprising:

a first probe (100) comprising a body (110) and a first detection head (120) arranged at one end of the body (110), wherein the first detection head (120) is used for contacting with an object to be detected;

wherein the first detection head (120) has a first contact portion (121) and a second contact portion (122), at least a part of the second contact portion (122) and the first contact portion (121) having a height difference in the axial direction of the body (110);

the first contact part (121) and the second contact part (122) are connected, and a first cutting part (123) is formed at the connection part of the first contact part (121) and the second contact part (122).

2. The probe apparatus according to claim 1, wherein the first contact portion (121) and the second contact portion (122) each have a plurality, and the plurality of first contact portions (121) are arranged in a ring shape, and the plurality of second contact portions (122) are arranged in a ring shape.

3. The probe apparatus according to claim 2, wherein the first detection head (120) further has a third contact portion (124), the third contact portion (124) is located between two adjacent first contact portions (121), and a cross-sectional area of the third contact portion (124) gradually decreases in an axial direction of the body (110).

4. A probe device according to claim 3, wherein the bottom end of the third contact portion (124) forms a second cutting portion (125), the second cutting portion (125) being arranged at the same height as the first cutting portion (123).

5. The probe apparatus of any one of claims 1 to 4, further comprising a second probe (200), the second probe (200) being disposed through the body (110).

6. The probe apparatus according to claim 5, wherein one end of the second probe (200) near the first probe head (120) has a second probe head (210), the second probe head (210) is used for contacting with an object to be tested, and the first contact portion (121) and the second contact portion (122) are both enclosed along the circumferential direction of the second probe head (210).

7. The probe apparatus of claim 6, wherein the second detection head (210) is configured as a tip structure.

8. The probe apparatus according to claim 5, wherein an insulating member (300) is disposed between the body (110) and the second probe (200), and the insulating member (300) is sleeved on the second probe (200).

9. The probe apparatus according to claim 8, wherein a first elastic member (400) is provided between the insulating member (300) and the body (110), the first elastic member (400) being configured to apply an elastic force to the body (110) in an axial direction of the body (110).

10. The probe apparatus of claim 1, wherein the probe apparatus further comprises:

the body (110) penetrates through the mounting seat (500);

and a second elastic member (600) provided between the mounting base (500) and the first detection head (120) and configured to apply an elastic force to the first detection head (120) in the axial direction of the body (110).

11. A battery preparation system comprising a probe apparatus according to any one of claims 1 to 10.