CN219695254U - Solar cell testing device - Google Patents
Solar cell testing device Download PDFInfo
- Publication number
- CN219695254U CN219695254U CN202222757511.0U CN202222757511U CN219695254U CN 219695254 U CN219695254 U CN 219695254U CN 202222757511 U CN202222757511 U CN 202222757511U CN 219695254 U CN219695254 U CN 219695254U
- Authority
- CN
- China
- Prior art keywords
- needle
- probe
- air guide
- solar cell
- needle cap
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 40
- 239000000523 sample Substances 0.000 claims abstract description 60
- 239000004020 conductor Substances 0.000 claims abstract description 8
- 230000007246 mechanism Effects 0.000 claims description 10
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 8
- 229910052709 silver Inorganic materials 0.000 claims description 8
- 239000004332 silver Substances 0.000 claims description 8
- 230000000149 penetrating effect Effects 0.000 claims description 4
- 229910001316 Ag alloy Inorganic materials 0.000 claims description 3
- 230000007423 decrease Effects 0.000 claims description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- 238000007747 plating Methods 0.000 description 9
- 230000006872 improvement Effects 0.000 description 7
- 244000137852 Petrea volubilis Species 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 229910001873 dinitrogen Inorganic materials 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000002035 prolonged effect Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 2
- 229910001887 tin oxide Inorganic materials 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000003090 exacerbative effect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Photovoltaic Devices (AREA)
Abstract
The utility model relates to the field of testing devices, in particular to a solar cell testing device, which comprises a probe, an air guide piece and a fixed plate, wherein the probe and the air guide piece are arranged on the fixed plate; the probe comprises a needle body and a needle cap, wherein the needle cap is made of conductive materials, the needle body is fixedly arranged on the fixing plate, and the needle cap is sleeved at one end of the needle body; the air guide piece is provided with a needle hole, an air inlet and an air guide channel, the air inlet is communicated with the needle hole through the air guide channel, and the probe penetrates through the needle hole and the needle cap stretches out of the needle hole. By adopting the utility model, the oxide on the probe is effectively reduced, and the contact resistance of the probe is reduced.
Description
Technical Field
The utility model relates to the field of testing devices, in particular to a solar cell testing device.
Background
In the production process of solar cells, various electrical properties of the cell need to be detected, and the grid line is an important component of the solar cell and is responsible for collecting and transmitting the current generated inside the cell to the outside of the cell. In the existing detection, a testing device is adopted, a probe is contacted with a grid line on a solar cell, and related electric parameters are obtained through testing conditions such as voltage and current applied by the probe.
In the conventional probe, a plating layer of gold, silver, nickel or other materials is plated on the surface, and as the number of times of contact is increased, the contact resistance of the probe increases due to the fact that tin oxide of a grid line is transferred to the surface of a needle head. In addition, the contact resistance of the probe increases because the surface of the probe is oxidized by contact with air during use. The existence of the oxide on the surface of the probe not only ensures that the local position is not contacted well and the test result is inaccurate, but also can lead to local temperature rise and melting of the needle tip when larger current passes through, thereby further exacerbating the problem of contact resistance increase. Although the purpose of rapidly and effectively cleaning the oxide on the surface of the probe can be achieved by pressing the sand paper and the probe, the thickness of the plating layer on the probe is generally smaller than 4 mu m, the plating layer is thinner, and the plating layer is damaged to a certain extent after the sand paper is pressed. Once the plating layer is thoroughly destroyed, the contact resistance of the plating layer is changed drastically, so that the electrical property test and the EL test are inaccurate, and the service life of the probe is short.
Disclosure of Invention
The utility model aims to solve the technical problem of providing a solar cell testing device which can effectively reduce oxides on a probe and reduce contact resistance of the probe.
In order to solve the technical problems, the utility model provides a solar cell testing device which comprises a probe, an air guide piece and a fixed plate, wherein the probe and the air guide piece are arranged on the fixed plate;
the probe comprises a needle body and a needle cap, wherein the needle cap is made of conductive materials, the needle body is fixedly arranged on the fixing plate, and the needle cap is sleeved at one end of the needle body;
the air guide piece is provided with a needle hole, an air inlet and an air guide channel, the air inlet is communicated with the needle hole through the air guide channel, and the probe penetrates through the needle hole and the needle cap stretches out of the needle hole.
As a modification of the above, the conductive material is pure silver or silver alloy.
As an improvement of the scheme, the needle cap comprises a sleeving part and a contact part, the sleeving part is provided with a cavity, the bottom of the sleeving part is provided with an opening communicated with the cavity, and the needle cap is sleeved outside the needle body through the opening;
the bottom of the contact part is connected with the top of the sleeving part, and the top of the contact part is provided with a contact surface for abutting against the solar cell.
As a modification of the above, the cross-sectional area of the contact portion gradually decreases from the bottom portion thereof toward the top portion thereof.
As an improvement of the above scheme, the shape of the sleeve joint part is a cylinder, and the shape of the contact part is a truncated cone.
As an improvement of the scheme, the probe further comprises an elastic piece arranged on the probe, and the needle cap is arranged in a telescopic way through the elastic piece.
As an improvement of the scheme, the pinholes penetrate through the upper end face and the lower end face of the air guide piece, the air inlets are formed in the side wall of the air guide piece, and the air guide channels are formed in the air guide piece.
As an improvement of the scheme, the lifting mechanism for driving the fixed plate to move is also included.
As the improvement of above-mentioned scheme, still include mount table and supporting component, supporting component and elevating system locate on the mount table, the fixed plate is located on the supporting component, elevating system locates the fixed plate below, the fixed plate top is located to the air guide piece.
As an improvement of the scheme, the supporting component comprises a supporting plate and a connecting plate, the connecting plate is arranged on the mounting table through the supporting plate, and the fixing plate is arranged on the connecting plate in a rack mode;
the connecting plate is provided with a guide hole, the fixing plate is provided with a guide connecting rod, the guide connecting rod is arranged on the guide hole in a penetrating mode, and the guide connecting rod can axially move back and forth along the guide hole.
The implementation of the utility model has the following beneficial effects:
the probe of the solar cell testing device is provided with the needle cap, the needle cap is directly contacted with the grid line, the needle cap is much thicker than the plating layer, sand paper can be adopted to clean the needle cap, the needle cap plays a role in protecting the needle body, the EL testing effect of the electrical property test is not affected, and the service life of the probe is prolonged. Simultaneously, still be equipped with the air guide spare, in the in-process of test, can blow out nitrogen gas to the needle cap through the air guide spare, nitrogen gas parcel is around the needle cap, avoids needle cap and air contact and generates the oxide, reduces probe contact resistance effectively to guarantee the accuracy of test result effectively.
Drawings
FIG. 1 is a schematic view of a solar cell testing apparatus according to the present utility model;
FIG. 2 is an enlarged view of the needle cap portion of FIG. 1;
FIG. 3 is a schematic diagram of the structure of the probe of FIG. 1;
FIG. 4 is a cross-sectional view of FIG. 3;
FIG. 5 is a schematic view of the needle cap of FIG. 3;
FIG. 6 is a schematic view of the air guide of FIG. 1;
fig. 7 is a cross-sectional view of fig. 6.
Detailed Description
The present utility model will be described in further detail with reference to the accompanying drawings, for the purpose of making the objects, technical solutions and advantages of the present utility model more apparent. It is only stated that the terms of orientation such as up, down, left, right, front, back, inner, outer, etc. used in this document or the imminent present utility model, are used only with reference to the drawings of the present utility model, and are not meant to be limiting in any way.
Referring to fig. 1-7, the utility model discloses a solar cell testing device, which comprises a probe 1, an air guide piece 2 and a fixed plate 3, wherein the probe 1 and the air guide piece 2 are arranged on the fixed plate 3.
The probe 1 comprises a needle body 11 and a needle cap 12, wherein the needle cap 12 is made of conductive materials, the needle body 11 is fixedly arranged on the fixing plate 3, and the needle cap 12 is sleeved at one end of the needle body 11.
The air guide member 2 is provided with a needle hole 21, an air inlet 22 and an air guide channel 23, the air inlet 22 is communicated with the needle hole 21 through the air guide channel 23, the probe 1 is arranged on the needle hole 21 in a penetrating mode, and the needle cap 12 extends out of the needle hole 21. Wherein, the air guide member 2 is made of insulating material. Specifically, the pin hole 21 penetrates through the upper and lower end surfaces of the air guide 2, the air inlet 22 is provided on the side wall of the air guide 2, and the air guide channel 23 is provided in the air guide 2. The air inlet 22 is connected to an air pump (not shown).
The probe of the solar cell testing device is provided with the needle cap, the needle cap is directly contacted with the grid line, the needle cap is much thicker than the plating layer, sand paper can be adopted to clean the needle cap, the needle cap plays a role in protecting the needle body, the EL testing effect of the electrical property test is not affected, and the service life of the probe is prolonged. Simultaneously, still be equipped with the air guide spare, in the in-process of test, can blow out nitrogen gas to the needle cap through the air guide spare, nitrogen gas parcel is around the needle cap, avoids needle cap and air contact and generates the oxide, reduces probe contact resistance effectively to guarantee the accuracy of test result effectively.
Preferably, the conductive material is pure silver or a silver alloy. More preferably, the conductive material is pure silver. The purity of the pure silver reaches more than 99 percent. The pure silver has softer texture, so that the impact force to the battery piece in the process of the collision between the probe and the battery piece is not too large, and the battery piece is protected. And tin oxide is not easy to be generated when pure silver contacts with tin.
As shown in fig. 4-5, the needle cap 12 includes a sleeve joint portion 121 and a contact portion 122, the sleeve joint portion 121 is provided with a cavity 123, an opening 124 communicating with the cavity 123 is provided at the bottom of the sleeve joint portion 121, and the needle cap 12 is sleeved outside the needle body 11 through the opening 124. The bottom of the contact part 122 is connected with the top of the sleeving part 121, and the top of the contact part 122 is provided with a contact surface 125 for abutting against the solar cell.
Preferably, the cross-sectional area of the contact portion 122 gradually decreases from the bottom to the top thereof.
Preferably, the shape of the socket 121 is a cylinder, and the shape of the contact 122 is a truncated cone.
The needle cap is sleeved on the needle head of the probe, and plays a role in protecting the probe. The needle cap is in direct contact with the grid line, and oxide and other substances which can increase the contact resistance of the probe can be attached to the needle cap, so that the oxide on the needle cap can be rapidly removed through the pressing of sand paper and the needle cap. Even if the needle cap is worn in the process, the electrical property test is hardly affected, the accuracy of the test result is effectively ensured, and the service life of the probe is prolonged. The contact part of the cone frustum is designed to enable the contact surface to be smaller than the grid line, so that the stress is balanced in the process of abutting the probe and the grid line, and the lamination is reliable. In addition, the needle cap can be matched with the existing flat head probe to be used, a new probe does not need to be developed, and the cost is low. Wherein, the needle body and the needle cap can adopt the connection modes such as conductive adhesive or welding.
Preferably, the wall thickness of the socket 121 is 0.1-1mm; the diameter of the bottom surface of the contact portion 122 is 1-4mm, the diameter of the contact surface 125 is 0.3-1.5mm, and the height of the contact portion 122 is 0.5-1.5mm. The thickness of the needle cap is much thicker than that of the existing plating layer, and when the abrasive paper is used for oxide cleaning of the needle cap, the probe is effectively protected, the strength of the probe is increased, the service life of the probe is prolonged, the contact resistance of the probe can be rapidly reduced, the electrical performance test is not affected, and the accuracy of the test result is improved.
More preferably, the wall thickness of the socket 121 is 0.3-0.8mm; the diameter of the bottom surface of the contact portion 122 is 2-3mm, the diameter of the contact surface 125 is 0.5-1mm, and the height of the contact portion 122 is 0.8-1.2mm.
More preferably, the wall thickness of the socket 121 is 0.5mm; the diameter of the bottom surface of the contact portion 122 is 2.5mm, the diameter of the contact surface 125 is 0.8mm, and the height of the contact portion 122 is 1mm.
Further, as shown in fig. 4, the utility model further comprises an elastic member 8 arranged on the probe 1, and the needle cap 12 is telescopically arranged by the elastic member 8. The elastic member 8 is preferably a spring. The elastic member 8 is disposed in the cavity 123, and both ends thereof respectively abut against the needle cap 12 and the needle body 11. The setting of elastic component can play the cushioning effect when probe and battery piece conflict, protects the battery piece effectively, avoids the battery piece to damage.
Still further, the present utility model further includes a lifting mechanism (not shown) for driving the fixed plate 3 to move. The lifting mechanism is an air cylinder. The needle cap of the probe on the fixing plate is contacted with the grid line of the battery piece by the driving of the lifting mechanism.
Still further, as shown in fig. 1, the utility model further comprises a mounting table 5 and a supporting component, wherein the supporting component and a lifting mechanism are arranged on the mounting table 5, the fixed plate 3 is erected on the supporting component, the lifting mechanism is arranged below the fixed plate 3, and the air guide member 2 is arranged at the top of the fixed plate 3. Specifically, the air guide member and the fixing plate are the same in size. The air guide piece is paved on the surface of the fixed plate and is fixedly connected with the fixed plate. The probe passes through the needle aperture and the needle cap exposes the needle aperture. The air pump pumps nitrogen into the air guide channel through the air inlet, the nitrogen flows to each pinhole along the air guide channel and blows out, so that the nitrogen wraps around the needle cap, the oxide is prevented from being generated due to contact between the needle cap and air, the generation of the oxide on the needle cap is reduced, the contact resistance of the probe is reduced, and the accuracy of the test is effectively improved.
Preferably, as shown in fig. 1, the support assembly includes a support plate 6 and a connection plate 7, the connection plate 7 is mounted on the mounting table 5 through the support plate 6, and the fixing plate 3 is erected on the connection plate 7. The connecting plate 7 is provided with a guide hole (not shown in the figure), the fixing plate 3 is provided with a guide connecting rod 4, the guide connecting rod 4 is arranged on the guide hole in a penetrating way, and the guide connecting rod 4 can axially move back and forth along the guide hole. The fixed plate is fixedly connected with the air guide piece through the guide connecting rod, so that the air guide piece and the fixed plate can synchronously move. The bottom end of the guide connecting rod is inserted into the guide hole, and when the lifting mechanism drives the fixing plate to move up and down, the guide hole plays a role in guiding and limiting the guide connecting rod, so that the fixing plate is ensured to move stably and not to deviate.
In summary, the utility model provides a solar cell testing device, which effectively reduces the oxide on the probe and reduces the contact resistance of the probe.
While the foregoing is directed to the preferred embodiments of the present utility model, it will be appreciated by those skilled in the art that changes and modifications may be made without departing from the principles of the utility model, such changes and modifications are also intended to be within the scope of the utility model.
Claims (10)
1. The solar cell testing device is characterized by comprising a probe, an air guide piece and a fixed plate, wherein the probe and the air guide piece are arranged on the fixed plate;
the probe comprises a needle body and a needle cap, wherein the needle cap is made of conductive materials, the needle body is fixedly arranged on the fixing plate, and the needle cap is sleeved at one end of the needle body;
the air guide piece is provided with a needle hole, an air inlet and an air guide channel, the air inlet is communicated with the needle hole through the air guide channel, and the probe penetrates through the needle hole and the needle cap stretches out of the needle hole.
2. The solar cell testing apparatus of claim 1, wherein the conductive material is pure silver or a silver alloy.
3. The solar cell testing device according to claim 1, wherein the needle cap comprises a sleeving part and a contact part, the sleeving part is provided with a cavity, the bottom of the sleeving part is provided with an opening communicated with the cavity, and the needle cap is sleeved outside the needle body through the opening;
the bottom of the contact part is connected with the top of the sleeving part, and the top of the contact part is provided with a contact surface for abutting against the solar cell.
4. The solar cell testing apparatus of claim 3, wherein the cross-sectional area of the contact portion gradually decreases from the bottom portion thereof toward the top portion thereof.
5. The solar cell testing apparatus according to claim 3, wherein the socket portion is in the shape of a cylinder and the contact portion is in the shape of a truncated cone.
6. The solar cell testing apparatus of claim 1, further comprising an elastic member provided on the probe, wherein the needle cap is configured to be telescopically arranged by the elastic member.
7. The solar cell testing device according to claim 1, wherein the pinholes penetrate through the upper end surface and the lower end surface of the air guide member, the air inlets are formed in the side walls of the air guide member, and the air guide channels are formed in the air guide member.
8. The solar cell testing apparatus of claim 1, further comprising a lifting mechanism for driving the movement of the fixed plate.
9. The solar cell testing apparatus of claim 8, further comprising a mounting table and a support assembly, wherein the support assembly and the lifting mechanism are disposed on the mounting table, the fixing plate is disposed on the support assembly, the lifting mechanism is disposed below the fixing plate, and the air guide is disposed at the top of the fixing plate.
10. The solar cell testing apparatus of claim 9, wherein the support assembly comprises a support plate and a connection plate, the connection plate being mounted on the mounting table by the support plate, the fixing plate being mounted on the connection plate;
the connecting plate is provided with a guide hole, the fixing plate is provided with a guide connecting rod, the guide connecting rod is arranged on the guide hole in a penetrating mode, and the guide connecting rod can axially move back and forth along the guide hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222757511.0U CN219695254U (en) | 2022-10-19 | 2022-10-19 | Solar cell testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222757511.0U CN219695254U (en) | 2022-10-19 | 2022-10-19 | Solar cell testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219695254U true CN219695254U (en) | 2023-09-15 |
Family
ID=87969916
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222757511.0U Active CN219695254U (en) | 2022-10-19 | 2022-10-19 | Solar cell testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219695254U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117805592A (en) * | 2024-01-08 | 2024-04-02 | 安盈半导体技术(常州)有限公司 | Flexible medium chip test interface |
-
2022
- 2022-10-19 CN CN202222757511.0U patent/CN219695254U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117805592A (en) * | 2024-01-08 | 2024-04-02 | 安盈半导体技术(常州)有限公司 | Flexible medium chip test interface |
| CN117805592B (en) * | 2024-01-08 | 2024-06-07 | 安盈半导体技术(常州)有限公司 | Flexible medium chip test interface |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN219695254U (en) | Solar cell testing device | |
| CN101651380B (en) | Plastic bracket structure of motor with replaceable carbon brush | |
| CN212229132U (en) | Electricity core short circuit detection device | |
| CN218730013U (en) | A high-voltage cable for new energy automobile | |
| CN109327267B (en) | SMD debugger | |
| CN215280338U (en) | Spot welding structure and battery | |
| CN201260152Y (en) | Drop impact resistant SMD quartz resonator | |
| CN212062557U (en) | Button cell with switching assembly | |
| CN210667945U (en) | Heat-resistant and impact-resistant carbon film resistor device | |
| CN210378886U (en) | Cut-off type switch device | |
| CN208781900U (en) | A kind of car battery cover board | |
| CN220552904U (en) | Probe protection device | |
| CN218731879U (en) | Spring pin connector and vehicle-mounted charging adapter | |
| CN219871497U (en) | Photovoltaic crystalline silicon cell test probe row | |
| CN220291126U (en) | Barbecue probe and charging base | |
| CN219612335U (en) | Ultrasonic sensor | |
| CN213210240U (en) | Coaxial high-current probe | |
| CN214769559U (en) | Environment-friendly conductive nozzle with ultra-long service life | |
| CN205317827U (en) | What do benefit to fixture attachment takes bulge loop probe | |
| CN218158061U (en) | Novel switching needle | |
| CN214703880U (en) | Integrated circuit chip detection device with safety protection function | |
| CN219802658U (en) | Connecting structure for connecting stable electronic element | |
| CN213457249U (en) | Charger test fixing device | |
| CN210692418U (en) | Conductive arm of isolating switch | |
| CN220591945U (en) | Laser welding device for aluminum foil |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |