CN219676200U - Test management device for modularized integrated circuit - Google Patents
Test management device for modularized integrated circuit Download PDFInfo
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- CN219676200U CN219676200U CN202320954387.9U CN202320954387U CN219676200U CN 219676200 U CN219676200 U CN 219676200U CN 202320954387 U CN202320954387 U CN 202320954387U CN 219676200 U CN219676200 U CN 219676200U
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- integrated circuit
- modularized integrated
- fixedly connected
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- clamping plate
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- 238000012360 testing method Methods 0.000 title claims abstract description 62
- 238000001514 detection method Methods 0.000 abstract description 13
- 238000000034 method Methods 0.000 abstract description 8
- 230000000694 effects Effects 0.000 description 8
- 230000017525 heat dissipation Effects 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 206010063385 Intellectualisation Diseases 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
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- Tests Of Electronic Circuits (AREA)
Abstract
The utility model discloses a test management device for a modularized integrated circuit, which comprises a modularized integrated circuit test manager body and a plurality of jacks, wherein a bracket is arranged at the bottom of the modularized integrated circuit test manager body, a limit mechanism is arranged at the front side of the bracket, and fixing columns are arranged at both sides of the bottom of the bracket; the problem that the existing modularized integrated circuit test manager is mostly placed on a desktop directly and vertically, connecting wires and jacks are inconvenient to plug in and observe display data of the modularized integrated circuit test manager, and after the modularized integrated circuit board and the modularized integrated circuit test manager are connected, the modularized integrated circuit board is not limited in structure, and when the modularized integrated circuit board is mistakenly bumped in the detection process, the modularized integrated circuit board is easy to displace, even the connecting wires fall off, and normal detection management of the modularized integrated circuit board is affected is solved.
Description
Technical Field
The present utility model relates to the field of modularized integrated circuits, and in particular, to a test management apparatus for modularized integrated circuits.
Background
The modularized integrated circuit is a miniature electronic device or component, and adopts a certain process to interconnect elements such as transistors, resistors, capacitors, inductors and the like required in a circuit together with wiring, and the elements are manufactured on a small or a plurality of small semiconductor wafers or dielectric substrates to form modularization, and then the modularization integrated circuit is packaged in a tube shell to form a miniature structure with required circuit functions; all the components are integrated in structure, so that the electronic components are greatly advanced towards microminiaturization, low power consumption, intellectualization and high reliability, and a modularized integrated circuit test manager is needed when the modularized integrated circuit is subjected to detection management.
At present, the chinese patent with the bulletin number of CN209460364U discloses an integrated circuit testing device, including integrated circuit testing device body and auxiliary heat abstractor, first heat dissipation window has been seted up above the integrated circuit testing device body, the second heat dissipation window has all been seted up to the equal symmetry in both sides of integrated circuit testing device body, the inside auxiliary heat abstractor that is equipped with of integrated circuit testing device body, auxiliary heat abstractor includes the catheter, the catheter passes through fixing device to be fixed the upper end inner wall of integrated circuit testing device body, fixed a plurality of heat absorption pieces that are equipped with under the catheter, catheter one end is connected with the water pump, the water pump is fixed the upper end inner wall of integrated circuit testing device body, the output of water pump is equipped with the cooling tube, beneficial effect: the heat dissipation effect inside the integrated circuit testing device can be greatly increased, so that the heat dissipation is more uniform, and the heat dissipation of certain devices with more heat can be effectively assisted, so that the damage of the devices is avoided.
Most of the existing modularized integrated circuit test manager is directly and vertically placed on a desktop, so that connecting wires and jacks are inconvenient to plug in and observe display data of the modularized integrated circuit test manager, and after the modularized integrated circuit board and the modularized integrated circuit test manager are connected, the modularized integrated circuit board is not limited in structure, and when the modularized integrated circuit board is mistakenly bumped in the detection process, the modularized integrated circuit board is easy to displace, even the connecting wires fall off, so that normal detection management of the modularized integrated circuit board is affected.
Disclosure of Invention
The utility model mainly aims to provide a test management device for a modularized integrated circuit, which aims to solve the problems that most of the existing modularized integrated circuit test management devices are directly and vertically placed on a desktop, connection wires and jacks are inconvenient to plug in and observe display data of the modularized integrated circuit test management devices, and after the modularized integrated circuit boards are connected with the modularized integrated circuit test management devices, the modularized integrated circuit boards are not limited in structure, and when the modularized integrated circuit boards are mistakenly touched in the detection process, the modularized integrated circuit boards are easy to displace, even the connection wires fall off, and normal detection management of the modularized integrated circuit boards is affected.
In order to achieve the above purpose, the test management device for the modularized integrated circuit provided by the utility model comprises a modularized integrated circuit test manager body and a plurality of jacks, wherein a bracket is arranged at the bottom of the modularized integrated circuit test manager body, a limit mechanism is arranged at the front side of the bracket, and fixing columns are arranged at both sides of the bottom of the bracket;
the limiting mechanism comprises a first clamping plate, a supporting plate and a second clamping plate, wherein the bottom of the first clamping plate is fixedly connected with the top of the supporting plate, the rear side of the supporting plate is fixedly connected with the front side of the bracket, and the bottom of the second clamping plate is in contact with the top of the supporting plate.
Preferably, rubber pads are fixedly connected to opposite sides of the first clamping plate and the second clamping plate, and the number of the rubber pads is a plurality of.
Preferably, the inside of layer board has seted up the spout, the quantity of spout is two, the inside sliding connection of spout has the slider, the top of slider and the bottom fixed connection of second splint.
Preferably, a limiting groove is formed in the sliding groove, a limiting block is connected in the limiting groove in a sliding mode, and the left side of the limiting block is fixedly connected with the right side of the sliding block.
Preferably, the bottom fixedly connected with first fixed block of second splint, the inside threaded connection of first fixed block has the column, the rear side of column passes first fixed block and extends to the rear side of first fixed block, the front side fixedly connected with of column twists the piece.
Preferably, the left side fixedly connected with second fixed block of layer board, the front side of second fixed block rotates and is connected with the bearing, the front side of bearing and the rear side fixed connection of swivel post.
Preferably, the bottom of fixed column is provided with the pillar, the top of pillar extends to the inside of fixed column and with the inside threaded connection of fixed column, the bottom fixedly connected with slipmat of pillar, the fixed cover in surface of pillar is equipped with the antiskid cover.
Preferably, the internal thread of the support is connected with a limit button, and the right side of the limit button passes through the support and is in close contact with the surface of the modularized integrated circuit test manager body.
According to the technical scheme, the modularized integrated circuit test manager body is connected with the support, the support is rotated, the length of the support can be adjusted, the support can support the modularized integrated circuit test manager body upwards by a certain angle, connecting wires and jacks are conveniently inserted and displayed data of the modularized integrated circuit test manager are conveniently observed, and the modularized integrated circuit board is placed on the top of the supporting plate, and the rotating support is rotated, so that the modularized integrated circuit board is clamped by the first clamping plate and the second clamping plate, and the problems that the modularized integrated circuit board is easily displaced, even the connecting wires fall off and normal detection management of the modularized integrated circuit board is affected in the detection process are avoided.
Drawings
In order to more clearly illustrate the embodiments of the present utility model or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to the structures shown in these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of an embodiment of the present utility model;
FIG. 2 is a schematic view of a three-dimensional connection between a bracket and a pallet according to an embodiment of the present utility model;
FIG. 3 is a schematic perspective view of a limiting mechanism according to an embodiment of the present utility model;
FIG. 4 is an enlarged view of a portion of FIG. 3A according to an embodiment of the present utility model;
FIG. 5 is a schematic perspective view illustrating a connection between a steering column and a first fixing block according to an embodiment of the present utility model;
fig. 6 is a schematic perspective view illustrating a connection between a fixing post and a supporting post in an embodiment of the present utility model.
Reference numerals illustrate: 1. a modular integrated circuit test manager body; 2. a jack; 3. a limiting mechanism; 301. a first clamping plate; 302. a supporting plate; 303. a second clamping plate; 4. fixing the column; 5. a bracket; 6. a limit button; 7. a rubber pad; 8. a rotating column; 9. twisting blocks; 10. a slide block; 11. a limiting block; 12. a limit groove; 13. a chute; 14. a second fixed block; 15. a bearing; 16. a first fixed block; 17. a support post; 18. an anti-slip pad; 19. an anti-skid sleeve.
The achievement of the objects, functional features and advantages of the present utility model will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present utility model are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
Furthermore, descriptions such as those referred to as "first," "second," and the like, are provided for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implying an order of magnitude of the indicated technical features in the present disclosure. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present utility model, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.
Moreover, the technical solutions of the embodiments of the present utility model may be combined with each other, but it is necessary to be based on the fact that those skilled in the art can implement the technical solutions, and when the technical solutions are contradictory or cannot be implemented, it should be considered that the combination of the technical solutions does not exist, and is not within the scope of protection claimed by the present utility model.
The utility model provides a test management device for a modularized integrated circuit, which aims to solve the problems that most of the existing modularized integrated circuit test management devices are directly and vertically placed on a desktop, connection wires and jacks are inconvenient to plug in and observe display data of the modularized integrated circuit test management devices, and after the modularized integrated circuit boards are connected with the modularized integrated circuit test management devices, the modularized integrated circuit boards are not limited in structure, and when the modularized integrated circuit boards are mistakenly bumped in the detection process, the modularized integrated circuit boards are easy to displace, even the connection wires fall off, and normal detection management of the modularized integrated circuit boards is affected.
As shown in fig. 1-6, the test management device for a modularized integrated circuit provided by the embodiment of the utility model comprises a modularized integrated circuit test manager body 1 and a plurality of jacks 2, wherein a bracket 5 is arranged at the bottom of the modularized integrated circuit test manager body 1, a limit mechanism 3 is arranged at the front side of the bracket 5, and fixing columns 4 are arranged at two sides of the bottom of the bracket 5;
the limiting mechanism 3 comprises a first clamping plate 301, a supporting plate 302 and a second clamping plate 303, wherein the bottom of the first clamping plate 301 is fixedly connected with the top of the supporting plate 302, the rear side of the supporting plate 302 is fixedly connected with the front side of the bracket 5, and the bottom of the second clamping plate 303 is in contact with the top of the supporting plate 302.
According to the technical scheme, the modularized integrated circuit test manager body 1 is connected with the support 5, the support 17 is rotated, the length of the support 17 can be adjusted, the support 17 can support the modularized integrated circuit test manager body 1 upwards by a certain angle, connecting wires and the jacks 2 are conveniently spliced and data displayed by the modularized integrated circuit test manager are conveniently observed, the modularized integrated circuit board is placed on the top of the supporting plate 302, the rotating column 8 is rotated, the modularized integrated circuit board is clamped by the first clamping plate 301 and the second clamping plate 303, and the problems that the modularized integrated circuit board is easy to displace and even fall off in the process of mistakenly touching the modularized integrated circuit board in the detection process, and normal detection management of the modularized integrated circuit board is affected are avoided.
Referring to fig. 3, rubber pads 7 are fixedly connected to opposite sides of the first clamping plate 301 and the second clamping plate 303, and the number of the rubber pads 7 is a plurality. In this embodiment, by moving the first clamping plate 301 and the second clamping plate 303 until the rubber pad 7 contacts with the modularized integrated circuit board, the first clamping plate 301 and the second clamping plate 303 can clamp the modularized integrated circuit board and protect the modularized integrated circuit board, so that the clamping damage of the first clamping plate 301 and the second clamping plate 303 to the modularized integrated circuit board is avoided, and the effect of protecting the modularized integrated circuit board is achieved.
Further, referring to fig. 4, the sliding grooves 13 are formed in the supporting plate 302, the number of the sliding grooves 13 is two, the sliding blocks 10 are slidably connected in the sliding grooves 13, and the top of the sliding blocks 10 is fixedly connected with the bottom of the second clamping plate 303. In this embodiment, the second clamping plate 303 slides inside the chute 13 through the sliding block 10, so that the second clamping plate 303 can move, and the effect of facilitating the movement of the second clamping plate 303 is achieved.
With continued reference to fig. 4, a limiting groove 12 is formed in the sliding groove 13, a limiting block 11 is slidably connected in the limiting groove 12, and the left side of the limiting block 11 is fixedly connected with the right side of the sliding block 10. In this embodiment, when the slider 10 moves in the chute 13, the limiting block 11 slides in the limiting groove 12, and at this time, the limiting block 11 can limit the slider 10, so as to avoid the second clamping plate 303 from separating from the supporting plate 302, and achieve the effect of avoiding the second clamping plate 303 from separating from the supporting plate 302.
Referring to fig. 3 and 5, a first fixing block 16 is fixedly connected to the bottom of the second clamping plate 303, a rotary column 8 is screwed in the first fixing block 16, the rear side of the rotary column 8 passes through the first fixing block 16 and extends to the rear side of the first fixing block 16, and a screwing block 9 is fixedly connected to the front side of the rotary column 8. In this embodiment, through handheld piece 9 of twisting, rotate piece 9 of twisting, twist piece 9 rotate drive the column 8 rotate, column 8 through with first fixed block 16 between threaded connection, when column 8 rotates, can make first fixed block 16 remove, first fixed block 16 removes and can drive the second clamp splice and remove, has reached the effect that conveniently drives the second clamp splice and remove.
In addition, referring to fig. 5, a second fixing block 14 is fixedly connected to the left side of the supporting plate 302, a bearing 15 is rotatably connected to the front side of the second fixing block 14, and the front side of the bearing 15 is fixedly connected to the rear side of the rotary column 8. In this embodiment, the rotary column 8 is rotatably connected with the second fixed block 14 through the bearing 15, so that the rotary column 8 can rotate, and the effect of facilitating the rotation of the rotary column 8 is achieved.
Referring to fig. 6, a pillar 17 is disposed at the bottom of the fixing pillar 4, the top of the pillar 17 extends into the fixing pillar 4 and is in threaded connection with the fixing pillar 4, an anti-slip pad 18 is fixedly connected to the bottom of the pillar 17, and an anti-slip sleeve 19 is fixedly sleeved on the surface of the pillar 17. In this embodiment, through the threaded connection between pillar 17 and fixed column 4, handheld antiskid cover 19 rotates pillar 17, and when pillar 17 rotated, can make pillar 17 remove, conveniently adjust the supporting angle of modular integrated circuit test manager body 1, through slipmat 18 with place the position contact for pillar 17 can carry out stable support to modular integrated circuit test manager body 1, has reached the effect of convenient adjustment to modular integrated circuit test manager body 1 supporting angle.
In addition, referring to fig. 2, a limit button 6 is screwed inside the bracket 5, and the right side of the limit button 6 passes through the bracket 5 and is in close contact with the surface of the modular integrated circuit testing manager body 1. In this embodiment, through with modularization integrated circuit test manager body 1 and support 5 contact, then rotate spacing button 6, spacing button 6 through with support 5 between threaded connection, can make spacing button 6 remove when spacing button 6 rotates, with spacing button 6 remove to with the surface in close contact of modularization integrated circuit test manager body 1, can be connected modularization integrated circuit test manager body 1 and support 5 this moment, reached the effect that conveniently is connected support 5 and modularization integrated circuit test manager body 1.
The foregoing description is only of the preferred embodiments of the present utility model and is not intended to limit the scope of the utility model, and all equivalent structural changes made by the specification and drawings of the present utility model or direct/indirect application in other related technical fields are included in the scope of the present utility model.
Claims (8)
1. The test management device for the modularized integrated circuit comprises a modularized integrated circuit test management instrument body (1) and a plurality of jacks (2), and is characterized in that a bracket (5) is arranged at the bottom of the modularized integrated circuit test management instrument body (1), a limit mechanism (3) is arranged at the front side of the bracket (5), and fixing columns (4) are arranged at two sides of the bottom of the bracket (5);
the limiting mechanism (3) comprises a first clamping plate (301), a supporting plate (302) and a second clamping plate (303), wherein the bottom of the first clamping plate (301) is fixedly connected with the top of the supporting plate (302), the rear side of the supporting plate (302) is fixedly connected with the front side of the bracket (5), and the bottom of the second clamping plate (303) is in contact with the top of the supporting plate (302).
2. The test management device for a modular integrated circuit according to claim 1, wherein rubber pads (7) are fixedly connected to opposite sides of the first clamping plate (301) and the second clamping plate (303), and the number of the rubber pads (7) is a plurality.
3. The test management device for a modularized integrated circuit according to claim 1, wherein the sliding grooves (13) are formed in the supporting plate (302), the number of the sliding grooves (13) is two, the sliding blocks (10) are slidably connected in the sliding grooves (13), and the top of each sliding block (10) is fixedly connected with the bottom of the corresponding second clamping plate (303).
4. The test management device for a modularized integrated circuit according to claim 3, wherein a limit groove (12) is formed in the chute (13), a limit block (11) is slidably connected in the limit groove (12), and the left side of the limit block (11) is fixedly connected with the right side of the slider (10).
5. The test management device for a modular integrated circuit according to claim 1, wherein a first fixing block (16) is fixedly connected to the bottom of the second clamping plate (303), a rotating column (8) is connected to the first fixing block (16) through internal threads, the rear side of the rotating column (8) penetrates through the first fixing block (16) and extends to the rear side of the first fixing block (16), and a screwing block (9) is fixedly connected to the front side of the rotating column (8).
6. The test management device for a modular integrated circuit according to claim 5, wherein a second fixing block (14) is fixedly connected to the left side of the supporting plate (302), a bearing (15) is rotatably connected to the front side of the second fixing block (14), and the front side of the bearing (15) is fixedly connected to the rear side of the rotary column (8).
7. The test management device for a modularized integrated circuit according to claim 1, wherein a pillar (17) is arranged at the bottom of the fixed pillar (4), the top of the pillar (17) extends to the inside of the fixed pillar (4) and is in threaded connection with the inside of the fixed pillar (4), an anti-slip pad (18) is fixedly connected to the bottom of the pillar (17), and an anti-slip sleeve (19) is arranged on the surface fixing sleeve of the pillar (17).
8. The test management device for the modularized integrated circuit according to claim 1, wherein the limit button (6) is connected to the internal thread of the bracket (5), and the right side of the limit button (6) penetrates through the bracket (5) and is in close contact with the surface of the modularized integrated circuit test manager body (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320954387.9U CN219676200U (en) | 2023-04-17 | 2023-04-17 | Test management device for modularized integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320954387.9U CN219676200U (en) | 2023-04-17 | 2023-04-17 | Test management device for modularized integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219676200U true CN219676200U (en) | 2023-09-12 |
Family
ID=87928022
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320954387.9U Active CN219676200U (en) | 2023-04-17 | 2023-04-17 | Test management device for modularized integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219676200U (en) |
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2023
- 2023-04-17 CN CN202320954387.9U patent/CN219676200U/en active Active
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