CN219536085U - Mainboard testing device based on LORA technology - Google Patents
Mainboard testing device based on LORA technology Download PDFInfo
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- CN219536085U CN219536085U CN202320924622.8U CN202320924622U CN219536085U CN 219536085 U CN219536085 U CN 219536085U CN 202320924622 U CN202320924622 U CN 202320924622U CN 219536085 U CN219536085 U CN 219536085U
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Abstract
The utility model discloses a mainboard testing device based on LORA technology, which comprises a testing box, wherein a fixing component is arranged in the testing box. The utility model belongs to the technical field of motherboard testing, in particular to a motherboard testing device based on LORA technology, which can flexibly adjust according to the size of a motherboard by arranging a fixing component, reduces artificial interference, reduces labor waste, improves the working efficiency of the testing device, and improves the stability of the motherboard during testing by matching with a flexible positioning board.
Description
Technical Field
The utility model belongs to the technical field of motherboard testing, and particularly relates to a motherboard testing device based on LORA technology.
Background
LoRa is one of communication technologies, is an ultra-long distance wireless transmission scheme based on a spread spectrum technology, mainly solves the testing problem of site construction of a LoRa network, and realizes analysis and evaluation of signal coverage of a professional level, so that the LoRa network is applied to a testing device of a motherboard. The existing motherboard testing device cannot test the motherboards with different models, and usually uses manual operation when calibrating the motherboard, which is time-consuming and labor-consuming, so a new motherboard testing device based on the LORA technology is provided.
Disclosure of Invention
Aiming at the situation, in order to overcome the defects of the prior art, the utility model provides the mainboard testing device based on the LORA technology, which can flexibly adjust according to the size of the mainboard by arranging the fixing component, reduces the artificial interference, reduces the waste of labor force, improves the working efficiency of the testing device, and improves the stability of the mainboard during testing by matching with the flexible locating plate, and improves the use experience of the testing device.
The technical scheme adopted by the utility model is as follows: the utility model relates to a mainboard testing device based on LORA technology, which comprises a testing box, wherein a fixing component is arranged in the testing box, a supporting table is arranged on the lower wall of the testing box, a testing component is arranged on the supporting table, a sealing door is hinged on the front wall of the supporting table, an observation window is arranged on the sealing door, and a control panel is arranged on one side of the observation window; the fixed subassembly includes the lifting part, be equipped with the support frame on the lifting part, be equipped with the connection base on the support frame, be equipped with the bradyseism platform on the connection base, be equipped with the mounting panel on the bradyseism platform, be equipped with rotating electrical machines on the mounting panel, be connected with the grip block on the rotating electrical machines.
Further, the clamping plates are provided with two groups, and the clamping plates are provided with protection pads.
Further, the lifting piece comprises a lifting groove, the lifting groove is formed in the side wall of the test box, a lifting threaded rod is arranged in the lifting groove, one end of the lifting threaded rod is provided with a lifting motor, a moving table is arranged on the lifting threaded rod in a meshed transmission mode, and the moving table is connected with the supporting frame.
Further, the test assembly comprises a moving groove, the moving groove is formed in the upper wall of the supporting table, a linear guide rail is arranged in the moving groove, a linear motor is arranged on the linear guide rail, an electric telescopic rod is arranged on the linear motor, and a test head is arranged on the electric telescopic rod.
Further, a buffer groove is formed in the supporting table, a buffer spring is arranged in the buffer groove, a fixing plate is arranged on the buffer spring, and a positioning plate is arranged on the fixing plate; the locating plate is made of flexible materials.
Further, the control panel comprises a display and control buttons, and the control panel is electrically connected with an external power supply, the fixing assembly and the testing assembly respectively.
The beneficial effects obtained by the utility model by adopting the structure are as follows: according to the mainboard testing device based on the LORA technology, through the arrangement of the fixing component, flexible adjustment can be carried out according to the size of the mainboard, interference caused by human factors is reduced, waste of labor force is reduced, working efficiency of the testing device is improved, and the mainboard is matched with the flexible locating plate, stability of the mainboard in testing is improved, and use experience of the testing device is improved.
Drawings
FIG. 1 is a schematic diagram of a motherboard testing apparatus based on LORA technology;
fig. 2 is a motherboard testing device based on the LORA technology in the present embodiment.
The test device comprises a test box 1, a test box 2, a fixed component 3, a supporting table 4, a test component 5, a sealing door 6, an observation window 7, a control panel 8, a lifting piece 9, a supporting frame 10, a connecting base 11, a damping table 12, a mounting plate 13, a rotating motor 14, a clamping plate 15, a lifting groove 16, a lifting threaded rod 17, a lifting motor 18, a moving table 19, a moving groove 20, a linear guide rail 21, a linear motor 22, an electric telescopic rod 23, a test head 24, a buffer groove 25, a buffer spring 26, a fixed plate 27, a positioning plate 28, a protection pad 29, a display 30 and a control button.
The accompanying drawings are included to provide a further understanding of the utility model and are incorporated in and constitute a part of this specification, illustrate the utility model and together with the embodiments of the utility model, serve to explain the utility model.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the utility model; all other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
As shown in fig. 1-2, the mainboard testing device based on the LORA technology comprises a testing box 1, wherein a fixing component 2 is arranged in the testing box 1, a supporting table 3 is arranged on the lower wall of the testing box 1, a testing component 4 is arranged on the supporting table 3, a sealing door 5 is hinged on the front wall of the supporting table 3, an observation window 6 is arranged on the sealing door 5, and a control panel 7 is arranged on one side of the observation window 6; the fixed component 2 comprises a lifting piece 8, a supporting frame 9 is arranged on the lifting piece 8, a connecting base 10 is arranged on the supporting frame 9, a damping table 11 is arranged on the connecting base 10, a mounting plate 12 is arranged on the damping table 11, a rotating motor 13 is arranged on the mounting plate 12, and a clamping plate 14 is connected to the rotating motor 13.
Wherein, the clamping plate 14 is provided with two groups, and the clamping plate 14 is provided with a protection pad 28.
The lifting piece 8 comprises a lifting groove 15, the lifting groove 15 is arranged in the side wall of the test box 1, a lifting threaded rod 16 is arranged in the lifting groove 15, a lifting motor 17 is arranged at one end of the lifting threaded rod 16, a moving table 18 is arranged on the lifting threaded rod 16 in a meshed transmission manner, and the moving table 18 is connected with the support frame 9.
The test assembly 4 comprises a moving groove 19, wherein the moving groove 19 is arranged on the upper wall of the supporting table 3, a linear guide rail 20 is arranged in the moving groove 19, a linear motor 21 is arranged on the linear guide rail 20, an electric telescopic rod 22 is arranged on the linear motor 21, and a test head 23 is arranged on the electric telescopic rod 22.
The supporting table 3 is provided with a buffer groove 24, a buffer spring 25 is arranged in the buffer groove 24, a fixed plate 26 is arranged on the buffer spring 25, and a positioning plate 27 is arranged on the fixed plate 26; the positioning plate 27 is made of flexible materials.
The control panel 7 comprises a display 29 and control buttons 30, and the control panel 7 is electrically connected with the external power supply, the fixing assembly 2 and the testing assembly 4 respectively.
When the test device is specifically used, a user opens the sealing door 5 to place a mainboard to be detected on the clamping plate 14, then closes the sealing door 5, at the moment, starts the lifting motor 17 to drive the lifting threaded rod 16 to rotate, then drives the mobile station 18 and the supporting frame 9 on the mobile station 18 to move downwards, then drives the connecting base 10, the damping table 11 and the mounting plate 12 to move downwards until the bottom end of the mainboard fixed on the clamping plate 14 contacts with the positioning plate 27, then starts the linear motor 21 to drive the electric telescopic rod 22 to approach to the mainboard along the linear guide rail 20, at the moment, the electric telescopic rod 22 flexibly changes the height according to the size of the mainboard, so that the position of the test head 23 is changed, and measured data is transmitted into the display 29 to facilitate the user to observe and record. The whole working flow of the utility model is just the above, and the step is repeated when the utility model is used next time.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
The utility model and its embodiments have been described above with no limitation, and the actual construction is not limited to the embodiments of the utility model as shown in the drawings. In summary, if one of ordinary skill in the art is informed by this disclosure, a structural manner and an embodiment similar to the technical solution should not be creatively devised without departing from the gist of the present utility model.
Claims (7)
1. A mainboard testing device based on LORA technology is characterized in that: the testing device comprises a testing box (1), wherein a fixing component (2) is arranged in the testing box (1), a supporting table (3) is arranged on the lower wall of the testing box (1), a testing component (4) is arranged on the supporting table (3), a sealing door (5) is hinged to the front wall of the supporting table (3), an observation window (6) is arranged on the sealing door (5), and a control panel (7) is arranged on one side of the observation window (6); the fixed component (2) comprises a lifting part (8), a supporting frame (9) is arranged on the lifting part (8), a connecting base (10) is arranged on the supporting frame (9), a damping table (11) is arranged on the connecting base (10), a mounting plate (12) is arranged on the damping table (11), a rotating motor (13) is arranged on the mounting plate (12), and a clamping plate (14) is connected to the rotating motor (13).
2. The motherboard testing apparatus according to claim 1, wherein: lifting piece (8) are including lift groove (15), in the lateral wall of test box (1) is located in lift groove (15), be equipped with lift threaded rod (16) in lift groove (15), the one end of lift threaded rod (16) is equipped with elevator motor (17), the last meshing transmission of lift threaded rod (16) is equipped with mobile station (18), mobile station (18) are connected with support frame (9).
3. The motherboard testing apparatus according to claim 2, wherein: the test assembly (4) comprises a moving groove (19), wherein the moving groove (19) is formed in the upper wall of the supporting table (3), a linear guide rail (20) is arranged in the moving groove (19), a linear motor (21) is arranged on the linear guide rail (20), an electric telescopic rod (22) is arranged on the linear motor (21), and a test head (23) is arranged on the electric telescopic rod (22).
4. The motherboard testing apparatus according to claim 3, wherein: the supporting table (3) is provided with a buffer groove (24), a buffer spring (25) is arranged in the buffer groove (24), a fixing plate (26) is arranged on the buffer spring (25), and a positioning plate (27) is arranged on the fixing plate (26).
5. The motherboard testing apparatus according to claim 4, wherein: the positioning plate (27) is made of flexible materials.
6. The motherboard testing apparatus according to claim 5, wherein: the clamping plates (14) are provided with two groups, and the clamping plates (14) are provided with protection pads (28).
7. The motherboard testing apparatus according to claim 6, wherein: the control panel (7) comprises a display (29) and a control button (30), and the control panel (7) is electrically connected with an external power supply, the fixing assembly (2) and the testing assembly (4) respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320924622.8U CN219536085U (en) | 2023-04-22 | 2023-04-22 | Mainboard testing device based on LORA technology |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320924622.8U CN219536085U (en) | 2023-04-22 | 2023-04-22 | Mainboard testing device based on LORA technology |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219536085U true CN219536085U (en) | 2023-08-15 |
Family
ID=87633566
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320924622.8U Active CN219536085U (en) | 2023-04-22 | 2023-04-22 | Mainboard testing device based on LORA technology |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219536085U (en) |
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2023
- 2023-04-22 CN CN202320924622.8U patent/CN219536085U/en active Active
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