CN219533328U - Integrated circuit chip aging test device - Google Patents
Integrated circuit chip aging test device Download PDFInfo
- Publication number
- CN219533328U CN219533328U CN202320399497.3U CN202320399497U CN219533328U CN 219533328 U CN219533328 U CN 219533328U CN 202320399497 U CN202320399497 U CN 202320399497U CN 219533328 U CN219533328 U CN 219533328U
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- integrated circuit
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- 238000012360 testing method Methods 0.000 title claims abstract description 123
- 230000032683 aging Effects 0.000 title claims abstract description 9
- 238000010438 heat treatment Methods 0.000 claims abstract description 41
- 230000000694 effects Effects 0.000 abstract description 4
- 239000004020 conductor Substances 0.000 description 9
- 239000000523 sample Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 230000000903 blocking effect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 230000001351 cycling effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000010409 ironing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000005382 thermal cycling Methods 0.000 description 1
Classifications
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to the technical field of integrated circuit testing, and discloses an integrated circuit chip aging testing device which comprises an equipment box body, wherein a resistor module is connected inside the equipment box body in a sliding manner, and a testing resistor, a connecting block, a plug, a connecting wire, a handle, a resistor storage box and a testing box body are inserted inside the resistor module in a plugging manner. The utility model has the technical effects and advantages that the storage box inserted at one side of the equipment box body can be used for placing test resistors with different resistance values, the heating box body can be internally inserted with heating plates with different powers, the wire seat is connected with the test seat in the test box body, the fan and the heating plate can be started for heat circulation, three resistance modules can be inserted in the equipment box body, the plug can be inserted into the different resistance modules according to the test time according to the test requirement, the test box body can be internally inserted with a plurality of test seats, the test seats are clamped with integrated circuit boards used during the test, and the connecting wires are connected with the wire seat for voltage regulation through the equipment box body.
Description
Technical Field
The utility model relates to the technical field of integrated circuit testing, in particular to an integrated circuit chip burn-in testing device.
Background
With the development of modern electronic information technology, integrated Circuits (ICs) are increasingly used, and the test requirements are also increasing, however, the conventional manual welding chip test method has low test efficiency and may cause damage to the integrated circuits due to the problem of welding temperature.
In the integrated circuit test socket disclosed in the chinese patent application publication 202222664382.0, although the integrated circuit board to be tested is placed in the mounting groove of the probe mounting block, and the pins of the integrated circuit board to be tested are in contact with the first ends of the probes, the probe mounting block can move downward along the movable cavity under the action of the driving component until the second ends of the probes pass through the first probe holes and contact with the pads of the test circuit board disposed at the lower end of the base, so that the integrated circuit board to be tested is conducted with the test circuit board, compared with the conventional manual soldering chip test method, the integrated circuit test socket is higher in efficiency, and less in damage to the integrated circuit board, but the conventional test is only to perform a heating test on the circuit board, so that the internal elements cannot be tested at high voltage, only whether the soldering spots are loose or not, and the whole integrated circuit cannot be subjected to an aging test, thereby a large amount of manpower is required to perform a test on the integrated circuit board, and thus the novel device is proposed to solve the problems.
Disclosure of Invention
(one) solving the technical problems
Aiming at the defects of the prior art, the utility model provides an integrated circuit chip aging test device, which solves the problems that the aging test of different voltages cannot be carried out on internal elements and the aging test cannot be carried out integrally.
(II) technical scheme
In order to achieve the above purpose, the utility model is realized by the following technical scheme: the utility model provides an integrated circuit chip aging testing device, includes the equipment box, the inside sliding connection of equipment box has resistance module, resistance module's inside grafting has test resistance, one side of resistance module is equipped with the connecting block, the inside joint of connecting block has the plug, the inside grafting of plug has the connecting wire, one side of plug is equipped with the handle, one side grafting of equipment box has the resistance receiver, one side grafting of equipment box has the test box, the inside sliding connection of test box has the test seat, the inside joint of test seat has the integrated circuit board.
Optionally, a threaded hole is formed in one side of the test box body, a bolt penetrates through the internal thread of the threaded hole, and the test box body penetrates through the wired seat through the bolt thread.
Optionally, one side joint of test box has the heating box, the inside grafting of heating box has the fan.
Optionally, a chute is formed on one side of the heating box body, and a heating plate is inserted into the chute.
Optionally, one side of the equipment box body is rotationally connected with an A cover plate through a hinge.
Optionally, the lower surfaces of the test box body and the heating box body are provided with B universal wheels.
Optionally, a movable handle is inserted at one side of the heating box body.
In summary, the utility model has the technical effects and advantages that:
1. the utility model has reasonable structure, the voltage in different resistance modules is changed by putting the test resistor into the resistance module, the A cover plate is arranged at one side of the equipment box body simultaneously for ensuring the safety during the test, the test resistor with different resistance values can be placed in the storage box inserted at one side of the equipment box body, the A universal wheel is also arranged at the same time on the lower surface of the equipment box body for facilitating the movement of the equipment box body, the heating plate with different powers can be inserted in the heating box body, the heating plate can be matched with the fan for use, the wire seat is connected with the test seat in the test box body, the fan and the heating plate can be started for carrying out the thermal cycle according to the test requirement, and meanwhile, the resistance module arranged in the equipment box body is started for carrying out the integral test on the integrated circuit board.
2. According to the utility model, three resistance modules can be inserted into the equipment box body, and the plug can be inserted into different resistance modules according to the test time according to the test requirement.
3. In the utility model, a plurality of test seats can be inserted into the test box body, the test seats are clamped with an integrated circuit board used in test, connecting wires are connected with the wire seats, voltage regulation is carried out through the equipment box body, the wire seats are connected with the test seats in the test box body, and a fan and a heating plate are used for carrying out thermal circulation.
Drawings
FIG. 1 is a schematic diagram of the structure of the present utility model;
FIG. 2 is a schematic diagram showing a split view of the structure of the equipment box of the present utility model;
FIG. 3 is a schematic diagram showing a resistor module structure according to the present utility model;
FIG. 4 is a schematic diagram showing a structure of a test case according to the present utility model.
In the figure: 1. an equipment box; 2. a resistor module; 3. testing the resistance; 4. a connecting block; 5. a plug; 6. a connecting wire; 7. a handle; 8. a resistor storage box; 9. a test box; 10. a test seat; 11. an integrated circuit board; 12. a bolt; 13. a wire seat; 14. heating the box body; 15. a blower; 16. a heating plate; 17. a hinge; 18. a cover plate; 19. a cover plate B; 20. a universal wheels; 21. b universal wheels; 22. the handle is moved.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Examples: referring to fig. 1-4, an integrated circuit chip burn-in apparatus is shown. Including equipment box 1, the inside sliding connection of equipment box 1 has resistance module 2, and resistance module 2's inside grafting has test resistor 3, and one side of resistance module 2 is equipped with connecting block 4, and connecting block 4's inside joint has plug 5, and plug 5's inside grafting has connecting wire 6, and one side of plug 5 is equipped with handle 7, and one side of equipment box 1 is pegged graft there is resistance receiver 8, and one side of equipment box 1 is pegged graft there is test box 9, and test box 9's inside sliding connection has test seat 10, and test seat 10's inside joint has integrated circuit board 11.
As a preferred implementation manner in this embodiment, as shown in fig. 2 and 3, a resistor module 2 is slidably connected in the device box 1, a test resistor 3 is inserted in the resistor module 2, a connecting block 4 is arranged on one side of the resistor module 2, a plug 5 is clamped in the connecting block 4, a connecting wire 6 is inserted in the plug 5, a handle 7 is arranged on one side of the plug 5, a resistor storage box 8 is inserted in one side of the device box 1, an a cover plate 18 is rotatably connected on one side of the device box 1 through a hinge 17, an a universal wheel 20 is arranged on the lower surface of the device box 1, and the resistance of the conductor is called by the blocking effect of the conductor on current. The resistance is a physical quantity and represents in physics the magnitude of the current blocking effect of a conductor. The larger the resistance of the conductor, the greater the resistance of the conductor to current. The resistance of different conductors is generally different, and is a property of the conductor itself. The resistor of the conductor is usually represented by letter R, the unit of the resistor is ohm, abbreviated as europe, the symbol is Ω, therefore, a great deal of increase of the test resistor 3 can prevent the current from increasing the voltage to the resistor, when the device is used, the voltage in different resistor modules 2 is changed by putting the test resistor 3 into the resistor module 2, it is worth noting that three resistor modules 2 can be inserted into the equipment box 1, the plug 5 can be inserted into the different resistor modules 2 according to the test requirement, the A cover plate 18 is simultaneously arranged on one side of the equipment box 1 for ensuring the safety during the test, the test resistor 3 with different resistance values can be placed in the storage box 8 inserted on one side of the equipment box 1, and the A universal wheel 20 is simultaneously arranged on the lower surface of the equipment box 1 for facilitating the movement.
As an implementation manner in this embodiment, as shown in fig. 1 and fig. 4, a test box 9 is inserted into one side of an equipment box 1, a test seat 10 is slidably connected in the test box 9, an integrated circuit board 11 is clamped in the test seat 10, a threaded hole is formed in one side of the test box 9, a bolt 12 penetrates through the internal thread of the threaded hole, the test box 9 penetrates through a wire seat 13 through the thread of the bolt 12, a heating box 14 is clamped in one side of the test box 9, a fan 15 is inserted into the heating box 14, a chute is formed in one side of the heating box 14, a heating plate 16 is inserted into the chute, a B cover plate 19 is slidably connected in one side of the test box 9, B universal wheels 21 are arranged on the lower surfaces of the test box 9 and the heating box 14, a movable handle 22 is inserted into one side of the heating box 14, the heating plate 16 used by the device is resistance heating, and the resistance heating converts electric energy into heat energy by using the joule effect of current to heat an object. Generally, it is classified into direct resistance heating and indirect resistance heating. The power supply voltage of the former is directly applied to the heated object, and when current flows, the heated object itself heats the ironing machine electrically. The directly resistance heatable object must be a conductor but has a relatively high resistivity. Because the heat generates the heated object itself, belong to internal heating, the thermal efficiency is very high, can use with fan 15 collocation, make the inside of heating box 14 and test box 9 play the thermal cycle effect, a plurality of test seats 10 can be pegged graft to the inside of test box 9, integrated circuit board 11 that test seat joint used when having the test, connecting wire 6 is connected with line seat 13, carry out voltage regulation through equipment box 1, line seat 13 and test seat 10 interconnect in the test box 9, one side of test box 9 also is equipped with B apron 19 and plays the guard action when testing simultaneously, can open fan 15 and hot plate 16 according to the demand of test, carry out the thermal cycle, the resistance module that the inside of equipment box 1 was equipped with is opened simultaneously carries out the whole test to integrated circuit board 11, very big reduction artificial waste.
The working principle of the utility model is as follows:
through putting into resistance module 2 with test resistance 3 when using this device, change the voltage in the different resistance module 2, can insert plug 5 according to test time in the different resistance module 2 according to the test demand, for the safety when guaranteeing the test, be equipped with A apron 18 simultaneously in one side of equipment box 1, the test resistance 3 of different resistance values can be placed to receiver 8 of one side grafting of equipment box 1, for the convenience mobile equipment box 1 lower surface also is equipped with A universal wheel 20 simultaneously, the test box 9 of one side grafting of equipment box 1 welds each other with heating box 14, the inside hot plate 16 of the different powers of can pegging graft of heating box 14, can use with fan 15 collocation, make the inside of heating box 14 and test box 9 play the thermal cycling effect, the inside of test box 9 can peg graft a plurality of test seats 10, the integrated circuit board 11 that the test seat joint had the use when testing, test seat 13 and test seat 10 interconnect in the test box 9, one side of test box 9 also is equipped with B19 and plays the guard action when testing simultaneously, can be equipped with the heater plate 16 according to the test, the inside can peg graft the heating plate 16 of heating box 14, the very little waste of the internal connection of equipment box 1 is carried out with the internal connection of the internal portion of test box 14, the internal connection of the test box 1 is equipped with the manual work, the test box is more than the heater plate is convenient for carrying out the whole, the test box 1 is equipped with the heater plate is more than the heater plate 1, the internal connection is equipped with the heater plate is convenient to be had, and the test box 1, and can be opened.
The electrical components are all connected with an external main controller and 220V mains supply, and the main controller can be conventional known equipment for controlling a computer and the like.
Finally, it should be noted that: the foregoing description is only illustrative of the preferred embodiments of the present utility model, and although the present utility model has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described, or equivalents may be substituted for elements thereof, and any modifications, equivalents, improvements or changes may be made without departing from the spirit and principles of the present utility model.
Claims (7)
1. The utility model provides an integrated circuit chip aging test device, includes equipment box (1), its characterized in that: the inside sliding connection of equipment box (1) has resistance module (2), the inside grafting of resistance module (2) has test resistor (3), one side of resistance module (2) is equipped with connecting block (4), the inside joint of connecting block (4) has plug (5), the inside grafting of plug (5) has connecting wire (6), one side of plug (5) is equipped with handle (7), one side grafting of equipment box (1) has resistance receiver (8), one side grafting of equipment box (1) has test box (9), the inside sliding connection of test box (9) has test seat (10), the inside joint of test seat (10) has integrated circuit board (11).
2. The burn-in apparatus of claim 1, wherein: a threaded hole is formed in one side of the test box body (9), a bolt (12) penetrates through the internal thread of the threaded hole, and the test box body (9) penetrates through the wired seat (13) through the thread of the bolt (12).
3. The burn-in apparatus of claim 1, wherein: one side joint of test box (9) has heating box (14), the inside grafting of heating box (14) has fan (15).
4. An integrated circuit chip burn-in apparatus as recited in claim 3, wherein: a chute is formed in one side of the heating box body (14), and a heating plate (16) is inserted into the chute.
5. The burn-in apparatus of claim 1, wherein: one side of the equipment box body (1) is rotationally connected with an A cover plate (18) through a hinge (17), and one side of the test box body (9) is slidably connected with a B cover plate (19).
6. The burn-in apparatus of claim 1, wherein: the lower surface of equipment box (1) is equipped with A universal wheel (20), the lower surface of test box (9) and heating box (14) is equipped with B universal wheel (21).
7. An integrated circuit chip burn-in apparatus as recited in claim 3, wherein: a movable handle (22) is inserted into one side of the heating box body (14).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320399497.3U CN219533328U (en) | 2023-03-07 | 2023-03-07 | Integrated circuit chip aging test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320399497.3U CN219533328U (en) | 2023-03-07 | 2023-03-07 | Integrated circuit chip aging test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219533328U true CN219533328U (en) | 2023-08-15 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320399497.3U Active CN219533328U (en) | 2023-03-07 | 2023-03-07 | Integrated circuit chip aging test device |
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| Country | Link |
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| CN (1) | CN219533328U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117092495A (en) * | 2023-10-19 | 2023-11-21 | 江苏永鼎股份有限公司 | Chip aging test equipment |
-
2023
- 2023-03-07 CN CN202320399497.3U patent/CN219533328U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117092495A (en) * | 2023-10-19 | 2023-11-21 | 江苏永鼎股份有限公司 | Chip aging test equipment |
| CN117092495B (en) * | 2023-10-19 | 2024-01-02 | 江苏永鼎股份有限公司 | Chip aging test equipment |
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