CN219513044U - Be used for scanning electron microscope sample platform compound support - Google Patents
Be used for scanning electron microscope sample platform compound support Download PDFInfo
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- CN219513044U CN219513044U CN202320785103.8U CN202320785103U CN219513044U CN 219513044 U CN219513044 U CN 219513044U CN 202320785103 U CN202320785103 U CN 202320785103U CN 219513044 U CN219513044 U CN 219513044U
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- side wall
- fixedly connected
- electron microscope
- plate
- scanning electron
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Abstract
The utility model discloses a composite bracket for a scanning electron microscope sample table, which comprises a fixed base, wherein the top end of the fixed base is fixedly connected with a vacuum observation bin, an observation mirror is arranged on the outer side wall of the vacuum observation bin, a storage mechanism is arranged on the inner side wall of the vacuum observation bin, and a rotating mechanism is arranged on the inner side wall of the vacuum observation bin.
Description
Technical Field
The utility model relates to the technical field of electron microscope sample tables, in particular to a composite bracket for a scanning electron microscope sample table.
Background
An electron microscope, which is called an electron microscope for short, is an indispensable important tool in modern science and technology, and consists of a lens cone, a vacuum device and a power cabinet.
When some acid and alkali, alcohol, gas and liquid are stored, a storage tank is needed, but the existing storage tank has the following problems when in use:
the current electron microscope sample support, when using, the function is comparatively single, and most only can observe a sample, because the environment of electron microscope is most all sealing state, when taking out the sample and trade the sample, still need to discharge the air again, comparatively waste time, therefore need a compound support for scanning electron microscope sample platform urgently.
Disclosure of Invention
The utility model aims to provide a composite bracket for a scanning electron microscope sample table, which aims to solve the problems that in the background technology, the use function is single, most of the use functions can only be used for observing one sample, and because the environment of an electron microscope is in a sealed state, when the sample is taken out and replaced, the air is required to be discharged again, so that the time is wasted.
In order to achieve the above purpose, the utility model provides a technical scheme that the composite bracket for the scanning electron microscope sample table comprises a fixed base, wherein the top end of the fixed base is fixedly connected with a vacuum observation bin, an observation mirror is arranged on the outer side wall of the vacuum observation bin, a storage mechanism is arranged on the inner side wall of the vacuum observation bin, and a rotating mechanism is arranged on the inner side wall of the vacuum observation bin;
the storage mechanism comprises a connecting slide plate, connecting slide bars, connecting slide grooves, a placing groove, sliding rollers, a placing plate and a first toothed ring, wherein the connecting slide plate is in sliding connection with the inner side wall of a vacuum observation bin, the connecting slide bars are fixedly connected with one side wall of the connecting slide plate, the connecting slide grooves are two inner side walls of the vacuum observation bin, the connecting slide grooves are in sliding connection with the connecting slide bars, the placing groove is formed in the inner side wall of the connecting slide plate, the sliding rollers are in multiple rotation connection with the inner side wall of the connecting slide plate, the placing plate is movably connected with the inner side wall of the placing groove, the placing plate is in rotation connection with the sliding rollers, the first toothed ring is fixedly connected with the outer side wall of the placing plate, and the inner side wall of the placing plate is provided with a supporting mechanism which comprises a pressing rod, a sliding plate, a pushing spring, a connecting clamping plate, a supporting spring and an observation sample.
As a preferable technical scheme of the utility model, the rotating mechanism comprises a second toothed ring, a first conical gear, a connecting rotating rod, a sealing ring and a second conical gear, wherein the second toothed ring is rotatably connected to the inner side wall of the vacuum observation bin.
As a preferable technical scheme of the utility model, the first conical gear is fixedly connected to the top end of the second toothed ring, the connecting rotating rod is rotatably connected to the inner side wall of the vacuum observation bin, and the sealing ring is fixedly connected to the outer side wall of the connecting rotating rod.
As a preferable technical scheme of the utility model, the second bevel gear is fixedly connected to one side wall of the connecting rotating rod, the first bevel gear and the second bevel gear are in meshed connection, and the first bevel gear and the first toothed ring are in meshed connection.
As a preferable technical scheme of the utility model, the pressing rod is connected to the inner side wall of the placing plate in a sliding way, and the sliding plate is fixedly connected to the bottom end of the pressing rod.
As a preferable technical scheme of the utility model, the sliding plate is slidably connected to the inner side wall of the placing plate, the pushing springs are fixedly connected to the inner side wall of the placing plate, and the pushing springs are fixedly connected to the bottom end of the sliding plate.
As a preferable technical scheme of the utility model, the connecting clamping plates are in a plurality of groups and are rotationally connected to the top end of the sliding plate, supporting springs are fixedly connected between each group of connecting clamping plates, the observation samples are in a plurality of movable connections to the top end of the placing plate, and the observation samples are in clamping connection with the plurality of groups of connecting clamping plates.
Compared with the prior art, the utility model has the beneficial effects that:
1. through connecting the connection between slide bar and the connection spout, can conveniently play spacing effect to connecting the slide, the slip of connecting the slide is convenient, can conveniently place the board through the standing groove, the rotation of connecting the bull stick can drive first conical gear and second ring gear through the second conical gear and rotate, the rotation of second ring gear can drive the board of placing through first ring gear and rotate, through the cooperation of slip gyro wheel with placing the board, can conveniently place the rotation of board, the rotation of placing the board can make things convenient for the staff to observe a plurality of samples, just so reduced the time that frequent evacuation consumed.
2. Through the connection between connection cardboard and the supporting spring, can conveniently be fixed the top of placing the board with observing the sample, it is convenient fixed to observe the sample when using, replace the observation sample fast when not using the observation sample, drop when avoiding observing the sample and using.
Drawings
FIG. 1 is a schematic diagram of the structure of the present utility model;
FIG. 2 is a schematic view of the structure of the vacuum observation chamber and the connecting slide plate in FIG. 1 according to the present utility model;
fig. 3 is a schematic view of the structure of the placement plate and the first toothed ring in fig. 2 according to the present utility model.
In the figure: 1. a fixed base; 11. a vacuum observation bin; 12. an observation mirror; 2. the connecting slide plate; 21. connecting a slide bar; 22. the connecting chute; 23. a placement groove; 24. a sliding roller; 25. placing a plate; 26. a first toothed ring; 27. a second toothed ring; 28. a first bevel gear; 29. connecting a rotating rod; 210. a seal ring; 211. a second bevel gear; 3. pressing a pressing rod; 31. a sliding plate; 32. a pushing spring; 33. the connecting clamping plate; 34. a support spring; 35. the sample was observed.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-3, the present utility model provides a technical solution for a composite support of a scanning electron microscope sample stage:
embodiment one:
according to the figures 1 and 2, a composite bracket for a scanning electron microscope sample table comprises a fixed base 1, wherein the top end of the fixed base 1 is fixedly connected with a vacuum observation bin 11, the outer side wall of the vacuum observation bin 11 is provided with an observation mirror 12, the inner side wall of the vacuum observation bin 11 is provided with a storage mechanism, the inner side wall of the vacuum observation bin 11 is provided with a rotating mechanism, the storage mechanism comprises a connecting slide plate 2, a connecting slide bar 21, a connecting slide groove 22, a placing groove 23, a sliding roller 24, a placing plate 25 and a first toothed ring 26, the connecting slide plate 2 is in sliding connection with the inner side wall of the vacuum observation bin 11, the connecting slide bar 21 is in two fixed connection with one side wall of the connecting slide plate 2, the connecting slide groove 22 is in two inner side walls arranged in the vacuum observation bin 11, the two connecting slide grooves 22 are in sliding connection with the connecting slide bar 21, the standing groove 23 is formed in the inner side wall of the connecting sliding plate 2, the sliding roller 24 is connected to the inner side wall of the connecting sliding plate 2 in a plurality of rotating mode, the standing plate 25 is movably connected to the inner side wall of the standing groove 23, the standing plate 25 is connected to the plurality of sliding rollers 24 in a rotating mode, the first toothed ring 26 is fixedly connected to the outer side wall of the standing plate 25, the first conical gear 28 is fixedly connected to the top end of the second toothed ring 27, the connecting rotating rod 29 is connected to the inner side wall of the vacuum observation bin 11 in a rotating mode, the sealing ring 210 is fixedly connected to the outer side wall of the connecting rotating rod 29, the second conical gear 211 is fixedly connected to one side wall of the connecting rotating rod 29, the first conical gear 28 is connected to the second conical gear 211 in a meshed mode, and the first conical gear 28 is connected to the first toothed ring 26 in a meshed mode, and the connecting mode between the sliding roller 24 and the standing plate 25 is achieved. Friction of the placing plate 25 during rotation in the placing groove 23 can be reduced.
When the sample detection device is specifically used, when the sample detection device is required to detect a sample, the placing plate 25 is placed in the placing groove 23, then the connecting sliding plate 2 is closed, the air in the sample is pumped out, then the sample can be observed through the observation mirror 12, after one observation sample 35 is observed, the connecting rotating rod 29 is rotated by a worker, the connecting rotating rod 29 drives the second bevel gear 211 to rotate, the sealing ring 210 can play a role in sealing the connecting rotating rod 29, the vacuum in the sample is ensured, the second bevel gear 211 rotates to drive the second toothed ring 27 through the first bevel gear 28, the second toothed ring 27 drives the first toothed ring 26 to rotate, the first toothed ring 26 rotates, and the other observation sample 35 rotates to an observation position.
Embodiment two:
on the basis of the first embodiment, as shown in fig. 1 and 3, the inner side wall of the placement plate 25 is provided with a supporting mechanism, the supporting mechanism comprises a pressing rod 3, a sliding plate 31, a pushing spring 32, a connecting clamping plate 33, a supporting spring 34 and an observation sample 35, the pressing rod 3 is slidingly connected to the inner side wall of the placement plate 25, the sliding plate 31 is fixedly connected to the bottom end of the pressing rod 3, the sliding plate 31 is slidingly connected to the inner side wall of the placement plate 25, the pushing spring 32 is fixedly connected to the bottom end of the sliding plate 31, the connecting clamping plates 33 are in multiple groups and are rotationally connected to the top end of the sliding plate 31, each group of connecting clamping plates 33 is fixedly connected with the supporting spring 34, the observation sample 35 is in multiple movable connections to the top end of the placement plate 25, the multiple observation samples 35 and the multiple groups of connecting clamping plates 33 are in clamping connection, the observation sample 35 can be limited to the position of the placement plate 25 through connection between the connecting clamping plates 33 and the observation sample 35, and the observation of workers is convenient.
When the device is specifically used, when the device needs to be detached, the pressing rod 3 is pressed by a worker, the pressing rod 3 drives the sliding plate 31 to squeeze the pushing spring 32, the connecting clamping plate 33 slides in the observation sample 35, the connecting clamping plate 33 slides downwards in the observation sample 35 to squeeze the supporting spring 34, then the observation sample 35 is separated, then the observation sample 35 is taken down by the worker through tweezers, and the detachment of the observation sample 35 is completed.
In the description of the present utility model, it should be understood that the orientation or positional relationship indicated is based on the orientation or positional relationship shown in the drawings, and is merely for convenience in describing the present utility model and simplifying the description, and does not indicate or imply that the apparatus or element referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model.
In the present utility model, unless explicitly specified and defined otherwise, for example, it may be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intermediaries, or in communication with each other or in interaction with each other, unless explicitly defined otherwise, the meaning of the terms described above in this application will be understood by those of ordinary skill in the art in view of the specific circumstances.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. The utility model provides a be used for scanning electron microscope sample platform compound support, includes unable adjustment base (1), its characterized in that: the top end of the fixed base (1) is fixedly connected with a vacuum observation bin (11), an observation mirror (12) is arranged on the outer side wall of the vacuum observation bin (11), a storage mechanism is arranged on the inner side wall of the vacuum observation bin (11), and a rotating mechanism is arranged on the inner side wall of the vacuum observation bin (11);
the storage mechanism comprises a connecting sliding plate (2), a connecting sliding rod (21), a connecting sliding groove (22), a placing groove (23), sliding rollers (24), a placing plate (25) and a first toothed ring (26), wherein the connecting sliding plate (2) is slidingly connected to the inner side wall of a vacuum observing bin (11), the connecting sliding rod (21) is fixedly connected to one side wall of the connecting sliding plate (2), the connecting sliding groove (22) is formed in two inner side walls of the vacuum observing bin (11), the connecting sliding groove (22) is slidingly connected with the connecting sliding rod (21), the placing groove (23) is formed in the inner side wall of the connecting sliding plate (2), the sliding rollers (24) are rotatably connected to the inner side wall of the placing groove (23), the placing plate (25) and the sliding rollers (24) are rotationally connected, the first toothed ring (26) is fixedly connected to the outer side wall of the placing plate (25), and the inner side wall of the placing plate (25) is provided with a supporting mechanism, and the supporting mechanism (33) and the supporting spring (35) are connected with the supporting mechanism.
2. A composite stand for a scanning electron microscope sample stage according to claim 1, wherein: the rotating mechanism comprises a second toothed ring (27), a first conical gear (28), a connecting rotating rod (29), a sealing ring (210) and a second conical gear (211), wherein the second toothed ring (27) is rotationally connected to the inner side wall of the vacuum observation bin (11).
3. A composite stand for a scanning electron microscope sample stage according to claim 2, wherein: the first conical gear (28) is fixedly connected to the top end of the second toothed ring (27), the connecting rotating rod (29) is rotatably connected to the inner side wall of the vacuum observation bin (11), and the sealing ring (210) is fixedly connected to the outer side wall of the connecting rotating rod (29).
4. A composite stand for a scanning electron microscope sample stage according to claim 2, wherein: the second bevel gear (211) is fixedly connected to one side wall of the connecting rotating rod (29), the first bevel gear (28) is in meshed connection with the second bevel gear (211), and the first bevel gear (28) is in meshed connection with the first toothed ring (26).
5. A composite stand for a scanning electron microscope sample stage according to claim 1, wherein: the pressing rod (3) is slidably connected to the inner side wall of the placing plate (25), and the sliding plate (31) is fixedly connected to the bottom end of the pressing rod (3).
6. A composite stand for a scanning electron microscope sample stage according to claim 1, wherein: the sliding plate (31) is slidably connected to the inner side wall of the placing plate (25), the pushing springs (32) are fixedly connected to the inner side wall of the placing plate (25), and the pushing springs (32) are fixedly connected to the bottom end of the sliding plate (31).
7. A composite stand for a scanning electron microscope sample stage according to claim 1, wherein: the connection clamping plates (33) are in multiple groups and are rotationally connected to the top ends of the sliding plates (31), each group of connection clamping plates (33) are fixedly connected with supporting springs (34), the observation samples (35) are in multiple movable connections to the top ends of the placement plates (25), and multiple observation samples (35) are connected with the multiple groups of connection clamping plates (33) in a clamping mode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320785103.8U CN219513044U (en) | 2023-04-10 | 2023-04-10 | Be used for scanning electron microscope sample platform compound support |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320785103.8U CN219513044U (en) | 2023-04-10 | 2023-04-10 | Be used for scanning electron microscope sample platform compound support |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219513044U true CN219513044U (en) | 2023-08-11 |
Family
ID=87548363
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320785103.8U Active CN219513044U (en) | 2023-04-10 | 2023-04-10 | Be used for scanning electron microscope sample platform compound support |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219513044U (en) |
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2023
- 2023-04-10 CN CN202320785103.8U patent/CN219513044U/en active Active
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| CB03 | Change of inventor or designer information |
Inventor after: Jiang Fei Inventor after: Zhang Junke Inventor after: Su Peng Inventor after: Xu Yeyu Inventor before: Jiang Fei Inventor before: Jueluo cloud Inventor before: Zhang Junke Inventor before: Su Peng Inventor before: Xu Yeyu |