CN219369926U - Enhanced contact device for integrated circuit tester - Google Patents
Enhanced contact device for integrated circuit tester Download PDFInfo
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- CN219369926U CN219369926U CN202223428463.7U CN202223428463U CN219369926U CN 219369926 U CN219369926 U CN 219369926U CN 202223428463 U CN202223428463 U CN 202223428463U CN 219369926 U CN219369926 U CN 219369926U
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Abstract
The utility model discloses an enhanced contact device for an integrated circuit tester, which is characterized in that two binding devices are used for respectively clamping opposite sides of an access clamp of a high-fidelity tester and a test case, pressure between two clamping plates is regulated by the dislocation degree of insection and locking teeth of two flange plates, if an abnormality exists in which the pressure between the access clamp of the high-fidelity tester and the test case is insufficient, the distance between the two clamping plates can be shortened quickly, the pressure can be increased, the problem can be solved quickly, the stability in the test can be increased, the test yield can be stabilized, and the test efficiency can be improved. The utility model solves the problems that the high-fidelity tester access clamp of the integrated circuit tester is in poor contact with the test case, and the pressure is difficult to control accurately and the stability is poor due to the fact that heavy pressurization is adopted in the prior art.
Description
Technical Field
The utility model relates to the technical field of chip detection equipment, in particular to an enhanced contact device for an integrated circuit tester.
Background
An important premise in wafer testing is to build a testing environment. Under the very good state of test environment, only can be stable during the test. However, once the contact problem occurs in the test process, the test problem is derived, so that the test yield is affected, the time for exception handling is increased, and the test efficiency is greatly reduced.
In the process of setting up a test environment of an integrated circuit tester (such as an EVA100 integrated circuit tester, manufacturer is Advantest adwann, japan), contact failure between the HIfix (high fidelity tester access fixture) and the sbox (test case) often occurs. Such contact problems are relatively difficult to control during production. Under the current condition, the two modules are mainly locked by a lock, and the fine adjustment of pressure cannot be performed. When the contact problem occurs, a heavy object is generally pressed on the sbox, so that the effect of increasing the contact pressure is achieved in an auxiliary mode, and the stability of the test system is guaranteed. In this way, on the one hand, the pressure of the heavy object is not well controlled, and on the other hand, maintenance and stability cannot be ensured.
The information disclosed in this background section is only for enhancement of understanding of the general background of the utility model and should not be taken as an acknowledgement or any form of suggestion that this information forms the prior art already known to a person of ordinary skill in the art.
Disclosure of Invention
In order to overcome the defects existing in the prior art, an enhanced contact device for an integrated circuit tester is provided, so that the problems that the access clamp of the high-fidelity tester of the integrated circuit tester is in poor contact with a test case, the pressure is difficult to accurately control and the stability is poor due to the fact that heavy pressurization is adopted in the prior art are solved.
To achieve the above object, there is provided an enhanced contact device for an integrated circuit tester, comprising two sets of fastener disposed opposite each other, the fastener comprising:
the clamping plates are provided with a first end and a second end which are opposite to each other, and a clamping space for clamping one side of the high-fidelity tester access clamp and the test case is formed between the first ends of the two clamping plates;
the drawknot assembly comprises two flange plates, a guide rod and a fastening piece, wherein the two flange plates are respectively connected to the second ends of the two clamping plates, the two flange plates are in staggered fit together, anti-slip insections arranged in the thickness direction of the clamping plates are formed on the opposite side of one flange plate, locking teeth are formed on the opposite side of the other flange plate, the locking teeth are meshed with the anti-slip insections, guide holes arranged in the thickness direction of the clamping plates are formed on the opposite side of one flange plate, the guide rod is slidably arranged in the guide holes, one end of the guide rod is connected with the other flange plate, the other end of the guide rod extends to the outside of the guide hole of the one flange plate, and the fastening piece is detachably arranged on the other end of the guide rod and is pressed against the opposite side of the one flange plate.
Further, one end of the guide rod is connected to one flange plate close to the clamping space, and the other end of the guide rod extends to the outside of the guide hole of the other flange plate far away from the clamping space.
Further, the locking teeth are formed on opposite sides of one of the flange plates adjacent to the clamping space.
Further, the flange plate is provided with a first end and a second end which are opposite, the first end of the flange plate is connected to the second end of the clamping plate, the second ends of the two flange plates are in staggered fit together, locking teeth are formed on opposite sides of the second end of the flange plate, and the locking teeth are obliquely arranged towards the first end of the flange plate.
Further, an external thread is formed at the other end of the guide rod, a threaded hole is formed in the fastening piece, and the fastening piece is in threaded connection with the other end of the guide rod.
Further, the flange plate and the clamping plate are integrally formed.
The enhanced contact device for the integrated circuit tester has the beneficial effects that the enhanced contact device for the integrated circuit tester respectively clamps the opposite sides of the high-fidelity tester access clamp and the tester case through the two tightening devices, and adjusts the pressure between the two clamping plates through the dislocation degree of the insection and the locking teeth of the two flange plates, if the abnormality that the pressure between the high-fidelity tester access clamp and the tester case is insufficient exists, the pressure can be quickly adjusted through the device (the distance between the two clamping plates is shortened, the pressure is increased), the problem is quickly solved, the stability in the test is increased, the test yield is stabilized, and the test efficiency is improved.
Drawings
Other features, objects and advantages of the present application will become more apparent upon reading of the detailed description of non-limiting embodiments, made with reference to the following drawings, in which:
FIG. 1 is a schematic diagram of an enhanced contact device for an integrated circuit tester according to an embodiment of the present utility model.
FIG. 2 is a cross-sectional view of a fastener according to an embodiment of the present utility model.
Detailed Description
The present application is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the utility model and are not limiting of the utility model. It should be noted that, for convenience of description, only the portions related to the utility model are shown in the drawings.
It should be noted that, in the case of no conflict, the embodiments and features in the embodiments may be combined with each other. The present application will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.
Referring to FIGS. 1 and 2, the present utility model provides an enhanced contact device for an integrated circuit tester comprising two sets of fastener A. The two sets of fastener A are disposed opposite each other.
Specifically, each set includes two clamping plates 1 and a drawknot assembly 2.
Wherein each clamping plate 1 has opposite first and second ends. A clamping space a is formed between the first ends of the two clamping plates. The clamping space a is used for clamping one side of the high-fidelity tester access clamp 3 and the tester case 4.
Each of the drawknot assemblies 2 comprises two flange plates 21, a guide bar 22 and a fastening piece 23. Two flange plates 21 are connected to the second ends of the two clamping plates, respectively. The two flange plates 21 are attached together in a staggered manner. The opposite side of one flange plate 21 is formed with anti-slip insections. The anti-slip insections are arranged along the thickness direction of the clamping plate. The opposite side of the other flange plate 21 is formed with locking teeth 24. The locking teeth 24 engage the anti-slip toothing. The opposite side of one flange plate 21 is provided with a guide hole 210. The guide holes 210 are provided in the thickness direction of the clamping plate. The slide of the guide bar 22 is provided in the guide hole 210. One end of the guide rod 22 is connected to the other flange plate 21, and the other end of the guide rod 22 extends to the outside of the guide hole 210 of one flange plate 21. The fastening member 23 is detachably mounted on the other end of the guide rod 22 and presses against the opposite side of a flange plate 21.
As a preferred embodiment, one end of the guide bar 22 is connected to one flange plate 21 close to the clamping space a, and the other end of the guide bar 22 extends to the outside of the guide hole 210 of the other flange plate 21 far from the clamping space a.
In the present embodiment, the lock teeth 24 are formed on opposite sides of a flange plate 21 near the holding space a.
For the sake of more clear description of the two flange plates, in this embodiment, the clamping plate on the side close to the clamping space is referred to as "inner flange plate", and correspondingly, the other clamping plate on the side far from the clamping space is referred to as "outer flange plate".
Referring to fig. 1 and 2, the outer side of the inner flange plate is formed with anti-slip insections. The inner side of the outer flange plate is formed with locking teeth 24. Meanwhile, the outer flange plate is provided with a guide hole 210. Correspondingly, one end of the guide rod 22 is connected to the inner flange plate. The other end of the guide rod 22 extends outside the guide hole 210 in the outer flange plate. The fastening piece 23 is detachably mounted at the other end of the guide rod 22 and presses against the outer side of the outer flange plate.
In this embodiment, flange plate 21 has opposite first and second ends. The flange plate 21 has a first end connected to the second end of the clamping plate. The second ends of the two flange plates 21 are attached together in a staggered manner. The opposite side of the second end of flange plate 21 is formed with locking teeth 24. The lock teeth 24 are disposed obliquely toward the first end of the flange plate 21.
As a preferred embodiment, the other end of the guide bar 22 is formed with external threads. The fastening member 23 is provided with a threaded hole. The fastening member 23 is screwed to the other end of the guide rod 22.
In the present embodiment, the flange plate 21 is integrally formed with the clamping plate 1.
In actual use, two sets of fastener of the enhanced contact apparatus for an integrated circuit tester of the present utility model are clamped on opposite sides of the clamping high-fidelity tester access fixture 3 and the test case 4, respectively, i.e., a first side of the clamping high-fidelity tester access fixture 3 and the test case 4 is clamped by one set of fastener, and a second side of the clamping high-fidelity tester access fixture 3 and the test case 4 is clamped by the other set of fastener.
Referring to fig. 1, after the fastening member is loosened by rotating, the outer flange plate is adjusted up and down, so as to drive the clamping plates at the upper part of the fastener to move up and down to adjust the pressure between the clamping plates, thereby increasing the contact between the clamping high-fidelity tester access clamp 3 and the test case 4, and finally, the fastening member is screwed tightly so that the locking teeth are meshed with the anti-slip insections to lock the distance between the two clamping plates. When the pressure needs to be released, the fastening piece is released, then the two clamping plates are separated from each other, the engagement of the locking teeth and the anti-skid insections is released, and the pressure is released.
According to the enhanced contact device for the integrated circuit tester, the two binding devices are used for respectively clamping the opposite sides of the high-fidelity tester access clamp and the tester case, the pressure between the two clamping plates is regulated through the tooth patterns and the locking tooth dislocation degree of the two flange plates, if the pressure between the high-fidelity tester access clamp and the tester case is abnormal, the pressure can be regulated through the device (the distance between the two clamping plates is shortened, the pressure is increased), the problem is solved quickly, the stability in the test is increased, the test yield is stabilized, and the test efficiency is improved.
As a preferred embodiment, for precisely controlling the pressure between the two clamping plates, one of the two flange plates of each set of fastener is provided with an indication line (such as the open arrow line in fig. 1); the other flange plate is provided with scale marks, and the scale marks are arranged along the length direction of the flange plate. The indication line of one flange plate is aligned with the scale line of the other flange plate. When the indication line is aligned to the starting point of the scale line, the two clamping plates are attached to the high-fidelity tester access clamp and the test case, and the clamping plates exert 0 on the high-fidelity tester access clamp and the test case. On the basis of fixing the inner flange plate, the outer flange plate is pressed down, so that the indication line descends, and the scale value of the scale line pointed by the indication line is a real-time pressure value applied by the clamping plate to the high-fidelity tester access clamp and the test case. With continued reference to the position state shown in fig. 1, when the clamping pressure of the two clamping plates to the high-fidelity tester access clamp and the test case needs to be increased, the outer flange plate is pressed downwards based on the preset pressure value applied by the clamping plates to the high-fidelity tester access clamp and the test case, so that the indication line is aligned to the corresponding scale value of the scale line. When the indication lines point to the corresponding scale values, the relative positions of the two flange plates are locked through the insection and the locking engagement, and finally the two flange plates are pressed together through the fastening piece to lock the relative positions of the two flange plates, so that the clamping real-time pressure value between the two clamping plates reaches the preset pressure value.
The foregoing description is only of the preferred embodiments of the present application and is presented as a description of the principles of the technology being utilized. It will be appreciated by persons skilled in the art that the scope of the utility model referred to in this application is not limited to the specific combinations of features described above, but it is intended to cover other embodiments in which any combination of features described above or equivalents thereof is possible without departing from the spirit of the utility model. Such as the above-described features and technical features having similar functions (but not limited to) disclosed in the present application are replaced with each other.
Claims (6)
1. An enhanced contact device for an integrated circuit tester, comprising two sets of oppositely disposed fastener elements, the fastener elements comprising:
the clamping plates are provided with a first end and a second end which are opposite to each other, and a clamping space for clamping one side of the high-fidelity tester access clamp and the test case is formed between the first ends of the two clamping plates;
the drawknot assembly comprises two flange plates, a guide rod and a fastening piece, wherein the two flange plates are respectively connected to the second ends of the two clamping plates, the two flange plates are in staggered fit together, anti-slip insections arranged in the thickness direction of the clamping plates are formed on the opposite side of one flange plate, locking teeth are formed on the opposite side of the other flange plate, the locking teeth are meshed with the anti-slip insections, guide holes arranged in the thickness direction of the clamping plates are formed on the opposite side of one flange plate, the guide rod is slidably arranged in the guide holes, one end of the guide rod is connected with the other flange plate, the other end of the guide rod extends to the outside of the guide hole of the one flange plate, and the fastening piece is detachably arranged on the other end of the guide rod and is pressed against the opposite side of the one flange plate.
2. The enhanced contact apparatus for an integrated circuit tester according to claim 1, wherein one end of said guide bar is connected to one of said flange plates near said holding space, and the other end of said guide bar extends to the outside of a guide hole of the other of said flange plates far from said holding space.
3. The enhanced contact apparatus for an integrated circuit tester according to claim 2, wherein said locking teeth are formed on opposite sides of one of said flange plates adjacent said clamping space.
4. The enhanced contact apparatus for an integrated circuit tester according to claim 3, wherein said flange plate has opposite first and second ends, said first end of said flange plate being connected to said second end of said clamping plate, said second ends of said flange plates being offset fit together, opposite sides of said second end of said flange plate being formed with said locking teeth, said locking teeth being disposed obliquely toward said first end of said flange plate.
5. The enhanced contact device for an integrated circuit tester according to claim 1, wherein the other end of the guide bar is formed with an external thread, the locking member is provided with a threaded hole, and the locking member is screwed to the other end of the guide bar.
6. The enhanced contact device for an integrated circuit tester of claim 1, wherein said flange plate is integrally formed with said clamping plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223428463.7U CN219369926U (en) | 2022-12-21 | 2022-12-21 | Enhanced contact device for integrated circuit tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223428463.7U CN219369926U (en) | 2022-12-21 | 2022-12-21 | Enhanced contact device for integrated circuit tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219369926U true CN219369926U (en) | 2023-07-18 |
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ID=87147362
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223428463.7U Active CN219369926U (en) | 2022-12-21 | 2022-12-21 | Enhanced contact device for integrated circuit tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219369926U (en) |
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2022
- 2022-12-21 CN CN202223428463.7U patent/CN219369926U/en active Active
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