CN219285286U - Low resistance testing device - Google Patents
Low resistance testing device Download PDFInfo
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- CN219285286U CN219285286U CN202123003595.0U CN202123003595U CN219285286U CN 219285286 U CN219285286 U CN 219285286U CN 202123003595 U CN202123003595 U CN 202123003595U CN 219285286 U CN219285286 U CN 219285286U
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- mounting plate
- fixedly connected
- low resistance
- measuring module
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Abstract
The utility model relates to the technical field of resistance testing, in particular to a low-resistance testing device, which comprises a shell, a mounting plate and a measuring module, wherein the mounting plate is in sliding connection with the shell, the mounting plate is positioned in the shell, the measuring module is fixedly connected with the mounting plate, the measuring module is positioned above the mounting plate, the measuring module is provided with a measuring circuit, and the measuring circuit comprises a constant current source I M Relay K and measured resistor R X And a voltmeter V, the two ends of the voltmeter V are respectively tested with a resistor R X Is connected with both ends of the constant current source I M Through the relay K and the measured resistor R X Parallel connection, solves the problem of resistance to be measuredAnd the measurement accuracy of the resistance value is low.
Description
Technical Field
The utility model relates to the technical field of resistance testing, in particular to a low-resistance testing device.
Background
The thermal noise is a potential difference generated at a connection portion of different types of metals such as between a probe and a wire of a measured object, and if the thermal noise is relatively large, a measurement error occurs, and as shown in fig. 1, the magnitude of the thermal noise also varies with the temperature of the measurement environment, and generally, the higher the temperature difference, the larger the thermal noise.
The existing low-resistance testing device has lower measurement accuracy of the resistance value of the tested resistor due to the influence of thermal noise.
Disclosure of Invention
The utility model aims to provide a low-resistance testing device so as to solve the problem of low measurement accuracy of the resistance value of a tested resistor.
In order to achieve the above purpose, the utility model provides a low-resistance testing device, which comprises a shell, a mounting plate and a measuring module, wherein the mounting plate is in sliding connection with the shell, the mounting plate is positioned in the shell, the measuring module is fixedly connected with the mounting plate, and the measuring module is positioned above the mounting plate;
the measuring module is provided with a measuring circuit which comprises a constant current source I M Relay K and measured resistor R X And a voltmeter V, the two ends of the voltmeter V are respectively tested with a resistor R X Is connected with both ends of the constant current source I M Through the relay K and the measured resistor R X And are connected in parallel.
The low-resistance testing device further comprises a telescopic structure, the telescopic structure comprises a fixed column, a movable column and a compression spring, the fixed column is provided with an installation cavity, the fixed column is fixedly connected with the shell, two ends of the compression spring are respectively fixedly connected with the fixed column and the movable column, the compression spring is located inside the installation cavity, the movable column is in sliding connection with the fixed column, the bottom of the movable column is located inside the installation cavity, and the top of the movable column is fixedly connected with the bottom of the installation plate.
The low-resistance testing device comprises a shell, and is characterized in that the low-resistance testing device further comprises a resisting structure, an accommodating groove is formed in the inner side face of the shell, the resisting structure comprises a resisting frame and a connecting spring, two ends of the connecting spring are fixedly connected with the shell and the resisting frame respectively, the connecting spring is located in the accommodating groove, and the resisting frame is in sliding connection with the shell.
The telescopic structure further comprises a limiting plate, wherein the limiting plate is fixedly connected with the movable column, and the limiting plate is located below the mounting plate.
The low-resistance testing device further comprises a cover body, the cover body is detachably connected with the shell, a clamping frame is arranged on the outer side face of the shell, and a clamping groove matched with the clamping frame is formed in the inner side face of the cover body.
A low-resistance test device of the present utility model is capable of generating a stable DC in a short time in seconds, and separating a detection signal from an AC in a frequency range, and a measuring instrument uses a measurement current as a pulse waveform to eliminate thermal noise, specifically, from a detection voltage V when the measurement current flows EMF Subtracting the detected voltage V at the time of stopping the current 0 The resistance value which is not influenced by thermal noise is obtained, so that the measurement accuracy of the resistance value of the measured resistor is improved, and the problem of lower measurement accuracy of the resistance value of the measured resistor is solved.
Drawings
In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the utility model, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of the cause of thermal noise.
Fig. 2 is a circuit diagram of a measurement circuit of a low resistance test device according to the present utility model.
FIG. 3 is a timing diagram of a low resistance test device according to the present utility model.
Fig. 4 is a schematic structural diagram of a low resistance testing device according to the present utility model.
FIG. 5 is a cross-sectional view of a low resistance test device according to the present utility model.
Fig. 6 is an enlarged view of a portion of fig. 5 a provided by the present utility model.
1-shell, 2-mounting panel, 3-measuring module, 4-extending structure, 5-fixed column, 6-movable column, 7-compression spring, 8-installation cavity, 9-structure of keeping out, 10-holding tank, 11-keep off the frame, 12-connecting spring, 13-limiting plate, 14-lid, 15-block frame, 16-block groove.
Detailed Description
Embodiments of the present utility model are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative and intended to explain the present utility model and should not be construed as limiting the utility model.
In the description of the present utility model, it should be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, merely to facilitate describing the present utility model and simplify the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present utility model. Furthermore, in the description of the present utility model, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
Referring to fig. 1 to 6, the utility model provides a low resistance testing device, which comprises a housing 1, a mounting plate 2 and a measuring module 3, wherein the mounting plate 2 is slidably connected with the housing 1, the mounting plate 2 is positioned in the housing 1, the measuring module 3 is fixedly connected with the mounting plate 2, and the measuring module 3 is positioned above the mounting plate 2;
the measuring module 3 is provided with a measuring circuit comprising a constant current source I M Relay K and measured resistor R X And the two ends of the voltmeter V are respectively connected with the two ends of the measured resistor, and the constant current source I M Through the relay K and the measured resistor R X And are connected in parallel.
In the present embodiment, the mounting plate 2 is used for mounting the measurement module 3, and the housing 1 is capable ofThe measuring module 3 can be protected, the mounting plate 2 can slide in the shell 1, so that a worker can conveniently take the measuring module 3 out of the shell 1 to facilitate measurement, and the constant current source I is used for measuring M The measured resistor R is connected through the relay K X The voltage difference generated by thermal noise is V EMF Constant current source I M Output constant current I M Output time is T M The voltage difference across the sampling resistor:
V M ＝R x ×IM+V EMF ；
the constant current source stops outputting the current I 0 Output time is T 0 And T is 0 ＝T M The voltage difference across the sampling resistor:
V 0 ＝R x ×I o +V EMF ；
the measured resistance Rx is obtained through calculation:
forming stable direct current in a short time of seconds, separating in a frequency range by using alternating current as a detection signal, and using a measuring instrument as a pulse waveform to eliminate thermal noise, specifically, from a detection voltage V when the measuring current flows EMF Subtracting the detected voltage V at the time of stopping the current 0 The resistance Rx which is not influenced by thermal noise is obtained, so that the measurement accuracy of the resistance value of the measured resistor is improved, and the problem of lower measurement accuracy of the resistance value of the measured resistor is solved.
Further, the low resistance testing device further comprises a telescopic structure 4, the telescopic structure 4 comprises a fixed column 5, a movable column 6 and a compression spring 7, the fixed column 5 is provided with an installation cavity 8, the fixed column 5 is fixedly connected with the shell 1, two ends of the compression spring 7 are respectively fixedly connected with the fixed column 5 and the movable column 6, the compression spring 7 is located inside the installation cavity 8, the movable column 6 is slidably connected with the fixed column 5, the bottom of the movable column 6 is located inside the installation cavity 8, and the top of the movable column 6 is fixedly connected with the bottom of the installation plate 2.
In this embodiment, the below of mounting panel 2 is provided with the extending structure 4, movable column 6 can be in the inside of installation cavity 8 stretches out and draws back for whole extending structure 4's length can change, so that mounting panel 2 can stretch out casing 1, thereby makes things convenient for the staff to measure the measured resistance.
Further, the low resistance testing device further comprises a resisting structure 9, an accommodating groove 10 is formed in the inner side face of the shell 1, the resisting structure 9 comprises a resisting frame 11 and a connecting spring 12, two ends of the connecting spring 12 are fixedly connected with the shell 1 and the resisting frame 11 respectively, the connecting spring 12 is located in the accommodating groove 10, and the resisting frame 11 is in sliding connection with the shell 1.
In this embodiment, the withstanding structure 9 can withstand the mounting plate 2, under the condition of no external force, the withstanding rack is subject to the withstanding of the connecting spring 12, so that the end of the withstanding rack away from the connecting spring 12 extends out of the accommodating groove 10, so as to withstand the mounting plate 2, thereby fixing the mounting plate 2 in the housing 1, when the low-resistance testing device is required to be used, the withstanding rack is pressed, so that the withstanding rack completely enters the accommodating groove 10, and at this time, the mounting plate 2 moves upwards under the action of the compression spring 7, so that the mounting plate 2 extends out of the housing 1, so that the staff can conveniently measure.
Further, the telescopic structure 4 further comprises a limiting plate 13, the limiting plate 13 is fixedly connected with the movable column 6, and the limiting plate 13 is located below the mounting plate 2.
In this embodiment, the limiting plate 13 may limit the movement range of the mounting plate 2, and the mounting plate 2 may be moved upward under the action of the compression spring 7 to a limit position where the mounting plate 2 moves upward when the limiting plate 13 contacts the abutment frame.
Further, the low resistance testing device further comprises a cover 14, the cover 14 is detachably connected with the housing 1, a clamping frame 15 is arranged on the outer side surface of the housing 1, and a clamping groove 16 matched with the clamping frame 15 is arranged on the inner side surface of the cover 14.
In this embodiment, the cover 14 and the housing 1 are detachably connected by the engagement frame 15 and the engagement groove 16, and the cover 14 can close the housing 1 to improve the protection effect on the measurement module 3.
The above disclosure is only a preferred embodiment of the present utility model, and it should be understood that the scope of the utility model is not limited thereto, and those skilled in the art will appreciate that all or part of the procedures described above can be performed according to the equivalent changes of the claims, and still fall within the scope of the present utility model.
Claims (5)
1. A low resistance test device is characterized in that,
the device comprises a shell, a mounting plate and a measuring module, wherein the mounting plate is in sliding connection with the shell, the mounting plate is positioned in the shell, the measuring module is fixedly connected with the mounting plate, and the measuring module is positioned above the mounting plate;
the measuring module is provided with a measuring circuit which comprises a constant current source I M Relay K and measured resistor R X And a voltmeter V, the two ends of the voltmeter V are respectively tested with a resistor R X Is connected with both ends of the constant current source I M Through the relay K and the measured resistor R X And are connected in parallel.
2. The low resistance test device of claim 1,
the low resistance testing device further comprises a telescopic structure, the telescopic structure comprises a fixed column, a movable column and a compression spring, the fixed column is provided with an installation cavity, the fixed column is fixedly connected with the shell, two ends of the compression spring are respectively fixedly connected with the fixed column and the movable column, the compression spring is located inside the installation cavity, the movable column is in sliding connection with the fixed column, the bottom of the movable column is located inside the installation cavity, and the top of the movable column is fixedly connected with the bottom of the installation plate.
3. The low resistance test device according to claim 2, wherein,
the low-resistance testing device further comprises a resisting structure, an accommodating groove is formed in the inner side face of the shell, the resisting structure comprises a resisting frame and a connecting spring, two ends of the connecting spring are fixedly connected with the shell and the resisting frame respectively, the connecting spring is located in the accommodating groove, and the resisting frame is in sliding connection with the shell.
4. The low resistance test device according to claim 3, wherein,
the telescopic structure further comprises a limiting plate, wherein the limiting plate is fixedly connected with the movable column, and the limiting plate is located below the mounting plate.
5. The low resistance test device according to claim 4, wherein,
the low-resistance testing device further comprises a cover body, the cover body is detachably connected with the shell, a clamping frame is arranged on the outer side face of the shell, and a clamping groove matched with the clamping frame is formed in the inner side face of the cover body.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123003595.0U CN219285286U (en) | 2021-12-02 | 2021-12-02 | Low resistance testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123003595.0U CN219285286U (en) | 2021-12-02 | 2021-12-02 | Low resistance testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219285286U true CN219285286U (en) | 2023-06-30 |
Family
ID=86915882
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202123003595.0U Active CN219285286U (en) | 2021-12-02 | 2021-12-02 | Low resistance testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219285286U (en) |
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2021
- 2021-12-02 CN CN202123003595.0U patent/CN219285286U/en active Active
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