CN219245632U

CN219245632U - Probe structure

Info

Publication number: CN219245632U
Application number: CN202320164160.4U
Authority: CN
Inventors: 王云凤
Original assignee: Suzhou Haoyue Technology Co ltd
Current assignee: Suzhou Haoyue Technology Co ltd
Priority date: 2023-02-09
Filing date: 2023-02-09
Publication date: 2023-06-23
Anticipated expiration: 2033-02-09

Abstract

The utility model relates to a probe structure, use in the field of probe technique, it includes probe body and probe sleeve, probe sleeve includes installation section and adjustment section, the installation section with adjustment section threaded connection, the probe body is fixed in through fixed subassembly in the installation section and one end extends into the adjustment section, be equipped with the adjustment subassembly in the adjustment section, the adjustment subassembly with the probe body links to each other and drives the probe body towards the installation section extends outward. The application has the effect that the probe body is easy to take out from the probe sleeve, and the probe is convenient to replace.

Description

Probe structure

Technical Field

The application relates to the technical field of probes, in particular to a probe structure.

Background

The probe is a contact medium for PCBA test, is a high-end precise electronic hardware component, and belongs to an object of a PCBA test fixture. In the PCBA test link, special test tools are generally manufactured, probes are installed on the test tools to be used for contacting with PCBA test points, and finally, the performance parameters of the PCBA are tested.

The Chinese patent with publication number of CN211182590U discloses an improved structure of a probe, which comprises a metal sleeve, a probe, a conductor and an elastomer, wherein a containing space is formed in the hollow interior of the metal sleeve, and an opening is formed at one side of the containing space; the probe is provided with a base part which is accommodated in the accommodating space of the metal sleeve, and a contact head which penetrates out of the outer side of the opening of the accommodating space is outwards extended at one side of the base part; the conductor is accommodated in the accommodating space of the metal sleeve and is in electrical contact with the probe, and a contact part which is in electrical contact with the metal sleeve is formed at least one side of the conductor; the elastic body is accommodated in the accommodating space of the metal sleeve, and a supporting part which is supported between the electric conductor and the inner wall surface of the accommodating space is formed at two ends of the elastic body. A limiting piece with the outer diameter smaller than that of the base part extends outwards at the position, opposite to the contact head, of the base part of the probe, and a positioning space for positioning the limiting piece is formed in the conductive body.

In view of the above related art, the inventors consider that the probe is easily subjected to high temperature due to a large current in the test point during the test, and aging, failure or damage occurs, so that the probe needs to be replaced in time. If the limiting piece is placed in the positioning space, the probe is difficult to take out from the metal sleeve under the limiting action of the conductor, so that the replacement operation is difficult.

Disclosure of Invention

In order to solve the problem that the probe is difficult to take out of the metal sleeve under the limiting action of the conductor and the replacement operation is difficult, the application provides a probe structure.

The probe structure provided by the application adopts the following technical scheme:

the utility model provides a probe structure, includes probe body and probe sleeve pipe, the probe sleeve pipe includes installation section and adjustment section, the installation section with adjustment section threaded connection, the probe body is fixed in through fixed subassembly in the installation section and one end extends into the adjustment section, be equipped with the adjustment subassembly in the adjustment section, the adjustment subassembly with the probe body links to each other and drives the probe body towards the outer extension of installation section.

Through adopting above-mentioned technical scheme, because the probe body is installed in the installation section alone, and installation section and adjustment section threaded connection, therefore when need changing the probe body, only need unscrewing installation section and adjustment section, can take out the probe body from the installation section, change easy and fast.

Optionally, the adjustment subassembly includes division board and adjustment spring, the division board slides and locates in the adjustment section, adjustment spring's one end is fixed in the inner wall of adjustment section, adjustment spring's the other end support tightly in the division board, probe body's one end extension go into the adjustment section and support tightly in the division board.

By adopting the technical scheme, under the action force of the adjusting spring, the splitter plate abuts against the probe body and enables the probe body to extend out of the mounting section to be in contact with the test point, so that the probe body can slide in the probe sleeve, and the possibility of damage of the probe body due to overlarge pressure between the probe body and the test point is reduced; meanwhile, the partition plate can limit the adjusting spring in the adjusting section, so that the adjusting spring is separated from the probe body, the influence of the adjusting spring on the replacement of the probe body is reduced, and the convenience of the replacement of the probe body is improved.

Optionally, the periphery department of division board is equipped with spacing bead, the inner wall of adjustment section corresponds spacing bead is equipped with the spacing groove, spacing bead adaptation is inlayed and is located in the spacing inslot and in slide in the spacing inslot.

Through adopting above-mentioned technical scheme, under the effect of spacing bead, the division board can steadily slide in the adjustment section, the difficult condition that appears rotatory or reversal to improved the stability of adjustment spring to the probe body.

Optionally, a butt joint part is arranged at one end of the installation section, which is close to the adjustment section, a bending part is arranged at one end of the adjustment section, which is close to the installation section, a butt joint notch matched with the butt joint part is formed at the outer edge of the bending part, and the butt joint part is in threaded connection with the bending part; the partition plate is abutted against the bending part.

Through adopting above-mentioned technical scheme, the division board supports tightly on the portion of bending under the effort of adjusting spring to with adjusting spring restriction in the adjustment section, consequently, when installation section and adjustment section unscrew, adjusting spring can not push out the division board adjustment section and cause the influence to the change of probe body.

Optionally, the one end that the adjustment section kept away from the installation section is equipped with the encapsulation board, the encapsulation board orientation one side of adjustment section is equipped with the spliced pole, spliced pole threaded connection in the adjustment section, the encapsulation board with all run through on the spliced pole and be equipped with the exhaust hole.

By adopting the technical scheme, the connecting column is in threaded connection in the adjusting section, so that the connecting column and the adjusting section can be detachably fixed, and the adjusting spring can be conveniently installed in the adjusting section or replaced; the air inside and outside the adjusting section is circulated through the air exhaust holes, so that the air pressure inside and outside the adjusting section is balanced, and the partition plate can slide in the adjusting section.

Optionally, the fixed subassembly includes spacing portion and supports tight portion, spacing portion integrated into one piece in the inner wall of installation section, support tight portion integrated into one piece in the lateral wall of probe body, support tight portion with spacing portion looks butt.

By adopting the technical scheme, under the action of the adjusting spring, the abutting part on the probe body abuts against the limiting part on the inner wall of the mounting section, so that the probe body cannot slide out of the mounting section under the limiting action of the limiting part, and is stably fixed in the mounting section; when the mounting section is unscrewed from the adjusting section, the probe body is not subjected to the acting force of the adjusting spring, and the probe body can be directly pulled out of the mounting section at the moment, so that the convenience of replacing the probe body is further improved.

Optionally, a buffer groove is formed in one side, facing the abutting portion, of the limiting portion, a buffer layer is arranged in the buffer groove, and the abutting portion abuts against the buffer layer.

Through adopting above-mentioned technical scheme, when the probe body no longer contacts the test point, adjustment spring promotes the probe body and resets, consequently supports tight portion and bumps to spacing portion, and the buffer layer just can cushion the collision force that produces between tight portion and the spacing portion to reduce the possibility that damage appears in probe body and probe sleeve.

Optionally, a positioning rib is arranged at the periphery of the abutting part, a positioning groove is arranged on the inner wall of the mounting section corresponding to the positioning rib, and the positioning rib is adaptively embedded in the positioning groove and slides in the positioning groove.

Through adopting above-mentioned technical scheme, under the effect of location bead, the probe body can slide in the installation section steadily, the difficult rotatory condition that appears to the stability of probe body to the test point test has been improved.

In summary, the present application includes at least one of the following beneficial technical effects:

1. because the probe body is independently arranged in the mounting section and the mounting section is in threaded connection with the adjusting section, when the probe body needs to be replaced, the probe body can be taken out of the mounting section only by unscrewing the mounting section and the adjusting section, and the replacement operation is simple, convenient and quick;

2. the partition plate is abutted against the bending part under the acting force of the adjusting spring, so that the adjusting spring is limited in the adjusting section, and therefore, when the mounting section and the adjusting section are unscrewed, the adjusting spring cannot push the partition plate out of the adjusting section to influence the replacement of the probe body, and the convenience of replacing the probe body is improved;

3. when the mounting section is unscrewed from the adjusting section, the probe body is not subjected to the acting force of the adjusting spring, and the probe body can be directly pulled out of the mounting section at the moment, so that the convenience of replacing the probe body is further improved.

Drawings

FIG. 1 is a schematic diagram of the structure of a probe in an embodiment of the present application.

Fig. 2 is an enlarged view of a portion a in fig. 1.

Reference numerals: 1. a probe body; 2. a probe sleeve; 21. a mounting section; 211. a positioning groove; 22. an adjustment section; 221. a limit groove; 3. a fixing assembly; 31. a limit part; 311. a buffer tank; 32. a pressing part; 4. an adjustment assembly; 41. a partition plate; 42. an adjusting spring; 5. a limit rib; 6. a butt joint part; 7. a bending part; 71. a docking notch; 8. a package plate; 81. an exhaust hole; 9. a connecting column; 10. a buffer layer; 11. positioning ribs.

Detailed Description

The present application is described in further detail below in conjunction with figures 1-2.

The embodiment of the application discloses a probe structure. Referring to fig. 1 and 2, the probe structure includes a mounting section 21 and an adjusting section 22, and both the mounting section 21 and the adjusting section 22 are hollow structures. Specifically, the one end integrated into one piece that the installation section 21 is close to adjustment section 22 has butt joint portion 6, and the one end integrated into one piece that adjustment section 22 is close to installation section 21 has bending portion 7, and the outer fringe department of bending portion 7 is equipped with the butt joint notch 71 with butt joint portion 6 looks adaptation, and the internal edge department of butt joint portion 6 has the screw thread that meshes with the uniform integrated into one piece in outer fringe department of bending portion 7, and after butt joint portion 6 and the outer fringe department of bending portion 7 threaded connection, installation section 21 and adjustment section 22 constitute probe sleeve 2 jointly. In addition, the end of the adjusting section 22 far away from the mounting section 21 is in threaded connection with a connecting column 9, and the end of the connecting column 9 far away from the adjusting section 22 is integrally formed with a packaging plate 8, so that one end of the probe sleeve 2 is closed.

Referring to fig. 1 and 2, the adjusting section 22 is provided with an adjusting unit 4, specifically, the adjusting unit 4 includes a partition plate 41 and an adjusting spring 42, the partition plate 41 is slidably disposed in the adjusting section 22, one end of the adjusting spring 42 is fixed to the connecting post 9, and the other end abuts against the partition plate 41, so that the partition plate 41 abuts against the bending portion 7 under the urging force of the adjusting spring 42, thereby restricting the adjusting spring 42 in the adjusting section 22. In addition, the periphery of the partition plate 41 is attached to the inner wall of the adjusting section 22 and is integrally formed with a limiting rib 5, a limiting groove 221 adapted to the limiting rib 5 is formed on the inner wall of the adjusting section 22 corresponding to the limiting rib 5, and the limiting rib 5 is slidably disposed in the limiting groove 221. Therefore, the partition plate 41 can smoothly slide in the adjustment section 22 under the restriction action of the restricting rib 5, and rotation or reverse rotation is not likely to occur.

In this embodiment, in order to enable the partition plate 41 to slide smoothly in the adjustment section 22, the vent holes 81 are formed through the connecting columns 9 and the packaging plate 8, so that air inside and outside the adjustment section 22 can flow through the vent holes 81, thereby achieving the effect of balancing the air pressure inside and outside the adjustment section 22.

Referring to fig. 1 and 2, the mounting section 21 is provided therein with a probe body 1 and a fixing component 3 for fixing the probe body 1, specifically, the fixing component 3 includes a limiting portion 31 and a tightening portion 32, the limiting portion 31 is integrally formed on the inner wall of the mounting section 21 along the circumferential direction of the mounting section 21, the tightening portion 32 is integrally formed on the side wall of the probe body 1 along the circumferential direction of the probe body 1, the probe body 1 is slidably disposed in the mounting section 21, one end of the probe body abuts against the partition plate 41, and the other end of the probe body extends out of the mounting section 21, therefore, under the action of the adjusting spring 42, the tightening portion 32 on the probe body 1 abuts against the limiting portion 31 on the inner wall of the mounting section 21, and therefore, the probe body 1 does not slide out of the mounting section 21 under the action force of the adjusting spring 42. In addition, the probe body 1 is provided with a positioning rib 11 integrally formed along the axial direction thereof at the abutting portion 32, a positioning groove 211 matched with the positioning rib 11 is formed on the inner wall of the mounting section 21 corresponding to the positioning rib 11, and the positioning rib 11 is slidably arranged in the positioning groove 211. Therefore, under the limiting action of the positioning rib 11, the probe body 1 can slide in the mounting section 21 smoothly, and the rotation is not easy to occur.

Therefore, when the test is performed, the probe body 1 extends out of the mounting section 21 under the action of the adjusting spring 42 and is abutted against the test point, meanwhile, the abutting part 32 on the probe body 1 abuts against the limiting part 31 on the inner wall of the mounting section 21, and the probe body 1 cannot slide out of the mounting section 21 under the limiting action of the limiting part 31; when the pressure between the probe body 1 and the test point is too high, the adjusting spring 42 is contracted, and the probe body 1 moves towards the inside of the probe sleeve 2, so that the pressure between the probe body 1 and the test point is reduced, and the possibility of damage to the probe body 1 is reduced; when the probe body 1 needs to be replaced, the mounting section 21 and the adjusting section 22 are unscrewed, at this time, the probe body 1 is not subjected to the acting force of the adjusting spring 42, and the adjusting spring 42 is limited in the adjusting section 22 by the partition plate 41, so that the probe body 1 can be directly pulled out from the mounting section 21, and the convenience of replacing the probe body 1 is improved.

Referring to fig. 1 and 2, a buffer groove 311 is disposed on a side of the limiting portion 31 facing the abutting portion 32, and the buffer groove 311 is filled with a buffer layer 10, in this embodiment, the buffer layer 10 is made of a rubber material, when the probe body 1 no longer contacts with a test point, the adjusting spring 42 pushes the probe body 1 to reset, so that the abutting portion 32 can collide with the limiting portion 31, and the buffer layer 10 can buffer the collision force generated between the abutting portion 32 and the limiting portion 31, thereby reducing the possibility of damage to the probe body 1 and the probe sleeve 2.

The implementation principle of the probe structure in the embodiment of the application is as follows: when a test is performed, the probe body 1 extends out of the mounting section 21 under the action of the adjusting spring 42 and is abutted against the test point, meanwhile, the abutting part 32 on the probe body 1 abuts against the limiting part 31 on the inner wall of the mounting section 21, and the probe body 1 cannot slide out of the mounting section 21 under the limiting action of the limiting part 31; when the probe body 1 needs to be replaced, the mounting section 21 and the adjusting section 22 are unscrewed, at this time, the probe body 1 is not subjected to the acting force of the adjusting spring 42, and the adjusting spring 42 is limited in the adjusting section 22 by the partition plate 41, so that the probe body 1 can be directly pulled out from the mounting section 21, and the convenience of replacing the probe body 1 is improved.

The foregoing are all preferred embodiments of the present application, and are not intended to limit the scope of the present application in any way, therefore: all equivalent changes in structure, shape and principle of this application should be covered in the protection scope of this application.

Claims

1. The utility model provides a probe structure, includes probe body (1) and probe sleeve pipe (2), its characterized in that: the probe sleeve (2) comprises a mounting section (21) and an adjusting section (22), wherein the mounting section (21) is in threaded connection with the adjusting section (22), the probe body (1) is fixed in the mounting section (21) through a fixing component (3) and one end of the probe body extends into the adjusting section (22), an adjusting component (4) is arranged in the adjusting section (22), and the adjusting component (4) is connected with the probe body (1) and drives the probe body (1) to extend outwards from the mounting section (21).

2. A probe structure according to claim 1, wherein: the adjusting assembly (4) comprises a partition plate (41) and an adjusting spring (42), the partition plate (41) is slidably arranged in the adjusting section (22), one end of the adjusting spring (42) is fixed on the inner wall of the adjusting section (22), the other end of the adjusting spring (42) abuts against the partition plate (41), and one end of the probe body (1) extends into the adjusting section (22) and abuts against the partition plate (41).

3. A probe structure according to claim 2, wherein: the periphery department of division board (41) is equipped with spacing bead (5), the inner wall of adjustment section (22) corresponds spacing bead (5) is equipped with spacing groove (221), spacing bead (5) adaptation are inlayed and are located in spacing groove (221) and in slide in spacing groove (221).

4. A probe structure according to claim 2, wherein: a butt joint part (6) is arranged at one end, close to the adjusting section (22), of the mounting section (21), a bending part (7) is arranged at one end, close to the mounting section (21), of the adjusting section (22), a butt joint notch (71) matched with the butt joint part (6) is formed at the outer edge of the bending part (7), and the butt joint part (6) is in threaded connection with the bending part (7); the partition plate (41) is abutted against the bending part (7).

5. A probe structure according to claim 2, wherein: one end that adjustment section (22) was kept away from installation section (21) is equipped with encapsulation board (8), encapsulation board (8) orientation one side of adjustment section (22) is equipped with spliced pole (9), spliced pole (9) threaded connection in adjustment section (22), encapsulation board (8) with all run through on spliced pole (9) and be equipped with exhaust hole (81).

6. A probe structure according to claim 1, wherein: the fixing assembly (3) comprises a limiting part (31) and a propping part (32), the limiting part (31) is integrally formed on the inner wall of the mounting section (21), the propping part (32) is integrally formed on the side wall of the probe body (1), and the propping part (32) is propped against the limiting part (31).

7. A probe structure according to claim 6, wherein: one side of the limiting part (31) facing the abutting part (32) is provided with a buffer groove (311), a buffer layer (10) is arranged in the buffer groove (311), and the abutting part (32) abuts against the buffer layer (10).

8. A probe structure according to claim 6, wherein: the periphery department of supporting tight portion (32) is equipped with location bead (11), the inner wall of installation section (21) corresponds location bead (11) is equipped with constant head tank (211), location bead (11) adaptation are inlayed in constant head tank (211) and in slide in constant head tank (211).