CN219123529U - Secondary circuit test joint based on universal terminal - Google Patents

Secondary circuit test joint based on universal terminal Download PDF

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Publication number
CN219123529U
CN219123529U CN202223475267.5U CN202223475267U CN219123529U CN 219123529 U CN219123529 U CN 219123529U CN 202223475267 U CN202223475267 U CN 202223475267U CN 219123529 U CN219123529 U CN 219123529U
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China
Prior art keywords
probe
clamp
primary
universal terminal
spring
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CN202223475267.5U
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周鹏林
王冠旻
苏东亮
邓化运
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Huaneng Qingdao Thermal Power Co Ltd
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Huaneng Qingdao Thermal Power Co Ltd
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    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

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Abstract

The utility model provides a secondary circuit test connector based on a universal terminal, which comprises: the clamp comprises a clamp body and a probe, wherein the clamp body comprises a clamp main edge and a clamp auxiliary edge, and the middle parts of the clamp main edge and the clamp auxiliary edge are connected through a torsion spring; the connecting part of the main side of the clamp and the auxiliary side of the clamp is movably connected with a probe, and the probe is of a multistage telescopic structure and comprises a first-stage probe, a second-stage probe and a third-stage probe; the clamp body is used for clamping and fixing the universal terminal strip, and the probe is used for being inserted into the universal terminal strip. The utility model is suitable for the terminal strip which can not be directly connected with the test wire. For the working condition that the voltage analog quantity or the signals are input and output from the terminal strip are temporarily connected, the test wire can be directly connected to the terminal strip in parallel through the temporary connector on the premise that the original wire core disconnecting work is not carried out, the safety, reliability and convenience of relevant work of temporarily connecting the signals from the terminal strip are improved, and the operation steps are simplified.

Description

Secondary circuit test joint based on universal terminal
Technical Field
The utility model belongs to the technical field of terminal blocks, and particularly relates to a secondary circuit test connector based on a universal terminal.
Background
The statements in this section merely provide background information related to the present disclosure and may not necessarily constitute prior art.
In the field of power engineering, the working conditions of leading in voltage analog quantity, opening quantity or temporary access opening quantity from the secondary loop terminal strip are common due to test or temporary measure requirements. The conventional voltage loop terminal strip and the switching value signal terminal strip cannot be directly inserted into a conventional test wire. The current common means is that the test wire is pressed and connected with the standby segment on the premise that the standby terminal is arranged and the standby segment and the target terminal are connected in parallel; 2. removing the primary core of the target terminal, making insulation measures, marks and records, pressing the test wire into the target terminal, and recovering wiring after the test is completed or temporary measures are cancelled; 3. the test wire and the primary wire core of the target terminal are pressed in the terminal row. The problem that the terminal strip screw is damaged caused by repeatedly disassembling the screw exists in all three conditions, and two conditions and three conditions are hidden danger. Second case: the problems of improper insulation protection or dislocation recovery of the wire core and the like caused by dismantling the original wire core occur sometimes. Third case: the double-voltage of the wire cores of different types has the hidden trouble of unreliable wiring, and the rule plaintext prescribes that the double-voltage of the wiring of the terminal strip is forbidden. In summary, the secondary circuit terminal strip temporary connector which is safe, reliable, portable, easy to operate and can be matched with the conventional test line for use becomes the first choice for solving the problem.
Disclosure of Invention
In order to overcome the defects in the prior art, the utility model provides a secondary circuit test connector based on a universal terminal.
To achieve the above object, one or more embodiments of the present utility model provide the following technical solutions: a universal terminal-based secondary loop test connector, comprising:
the clamp comprises a clamp body and a probe, wherein the clamp body comprises a clamp main edge and a clamp auxiliary edge, and the middle parts of the clamp main edge and the clamp auxiliary edge are connected through a torsion spring;
the connecting part of the main side of the clamp and the auxiliary side of the clamp is movably connected with a probe, and the probe is of a multistage telescopic structure and comprises a first-stage probe, a second-stage probe and a third-stage probe;
the clamp body is used for clamping and fixing the universal terminal strip, and the probe is used for being inserted into the universal terminal strip.
Furthermore, the first-level probe and the second-level probe are hollow structures; the outer diameter of the secondary probe is smaller than the inner diameter of the primary probe, and the outer diameter of the tertiary probe is smaller than the inner diameter of the secondary probe.
Further, the inside sliding connection secondary probe of primary probe, the inside sliding connection tertiary probe of secondary probe.
Further, a first-stage probe spring is arranged in the first-stage probe, the head end of the first-stage probe spring is connected with the head end of the first-stage probe, and the tail end of the first-stage probe spring is connected with the head end of the second-stage probe;
the secondary probe is internally provided with a secondary probe spring, the head end of the secondary probe spring is connected with the head end of the secondary probe, and the tail end of the secondary probe spring is connected with the head end of the tertiary probe.
Further, the length of the tertiary probe is not smaller than that of the primary probe, and when the primary probe spring and the secondary probe spring are compressed, the tail end of the tertiary probe is ensured to be inserted into the terminal row.
Further, the outer surface of the main side of the clamp, the outer surface of the secondary side of the clamp, the outer surface of the primary probe, the outer surface of the secondary probe and the outer surface of the joint of the main side and the secondary side of the clamp are all provided with insulating layers.
Further, the upper end of the main edge of the clamp is provided with a jack for passing through a test wire.
Furthermore, the universal test wire jack on the main side of the clamp, the inner surface of the primary probe, the inner surface of the secondary probe and the tertiary probe are all made of metal materials.
Further, the tertiary probes are inserted on metal conductors in the universal terminal row or on terminal screws in the universal terminal row.
Further, the torsion spring is sleeved on the spring rod, a through hole is formed in the head end of the primary probe, and one end of the spring rod penetrates through the through hole and then movably connects the primary probe on the spring rod.
The one or more of the above technical solutions have the following beneficial effects:
(1) The utility model provides a temporary connector of a secondary circuit terminal strip, in particular to a terminal connector applied to a secondary circuit terminal under working conditions such as test and temporary measures, which is suitable for a terminal strip which cannot be directly connected with a test line. For the working condition that the voltage analog quantity or the signals are input and output from the terminal strip are temporarily connected, the test wire can be directly connected to the terminal strip in parallel through the temporary connector on the premise that the original wire core disconnecting work is not carried out, the safety, the reliability and the convenience of relevant work of temporarily connecting the signals from the terminal strip are improved, the operation steps are simplified, and accidents caused by artificial factors in the relevant work can be avoided.
(2) The probes are of a multistage telescopic structure, and the reliable contact between the three-stage probes and the terminal strip conductors can be ensured by arranging the probe springs in the first-stage probes and the second-stage probes, so that more reliable electric signal connection can be established.
Additional aspects of the utility model will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the utility model.
Drawings
The accompanying drawings, which are included to provide a further understanding of the utility model and are incorporated in and constitute a part of this specification, illustrate embodiments of the utility model and together with the description serve to explain the utility model.
Fig. 1 is a schematic view of the secondary circuit terminal block test connector of example 1.
Fig. 2 is a schematic cross-sectional view of a terminal block test joint of example 1.
Fig. 3 is a schematic cross-sectional view of the test connector of example 1 after being connected to a universal terminal block.
FIG. 4 is a schematic cross-sectional view of the test connector of example 1 after being connected to a universal terminal block
In the figure: 1. the device comprises a clamp main side, 101, a universal test line jack, 2, a clamp secondary side, 301, a first-stage probe, 302, a second-stage probe, 303, a third-stage probe, 4, a clamp main side, a clamp secondary side, a first-stage probe connection part, 401, a first-stage probe spring, 402, a second-stage probe spring and 5, a universal terminal row.
Detailed Description
The disclosure is further described below with reference to the drawings and examples.
Example 1
As shown in fig. 1 and 2, the present utility model provides a secondary circuit test connector based on a universal terminal, comprising:
the clamp comprises a clamp body and a probe, wherein the clamp body comprises a clamp main edge 1 and a clamp auxiliary edge 2, and the middle parts of the clamp main edge and the clamp auxiliary edge are connected through a torsion spring; the connecting structure of the main side and the auxiliary side of the clip adopts the common assembly structure of the spring clip, namely, two free ends of the torsion spring are respectively abutted with the main side 1 and the auxiliary side 2 of the clip, so that the clip is ensured to have a certain closing force, and the clip is clamped on the universal terminal strip 5 conveniently; the upper parts of the main side and the auxiliary side of the clamp are holding parts, universal test wire insertion holes 101 are formed in the holding parts of the main side 1 of the clamp, the lower parts of the main side and the auxiliary side of the clamp are of bending structures, a certain clamping gap is formed, and the surfaces of the clamp body are made of insulating materials;
the connecting part 4 of the main side of the clamp and the auxiliary side of the clamp is movably connected with the probe, in particular, the torsion spring is sleeved on the spring rod, the head end of the primary probe 301 is provided with a through hole, and one end of the spring rod passes through the through hole and then movably arranges the primary probe 301 on the spring rod; the first stage probe 301 can swing freely within a proper angular range of the plane of the cross section of fig. 2 after the clip is opened, so as to accurately insert the third stage probe 303 on the universal terminal strip conductor.
The probes are of a multistage telescopic structure and comprise a first-stage probe 301, a second-stage probe 302 and a third-stage probe 303; the inside of the primary probe, the secondary probe and the tertiary probe is of a hollow structure; the outer diameter of the secondary probe is smaller than the inner diameter of the primary probe, and the outer diameter of the tertiary probe is smaller than the inner diameter of the secondary probe; the inside of the first-stage probe is connected with the second-stage probe in a sliding way, and the inside of the second-stage probe is connected with the third-stage probe in a sliding way;
a primary spring 401 is arranged in the primary probe 301, the head end of the primary spring 401 is connected with the head end of the primary probe, and the tail end of the primary spring 401 is connected with the head end of the secondary probe 302; by disposing the first stage probe spring 401 in the first stage probe 301, it is convenient to ensure that the second stage probe 302 is stressed and kept in an elongated state, so as to ensure that the third stage probe 303 is reliably contacted with the universal terminal strip conductor.
The secondary spring 402 is arranged in the secondary probe 302, the head end of the secondary spring is connected with the head end of the secondary probe, and the tail end of the secondary spring is connected with the head end of the tertiary probe 303; by configuring the secondary probe springs 402 within the secondary probes 302 to facilitate ensuring that the tertiary probes 303 are forced to remain in an extended state, reliable contact of the tertiary probes 303 with the universal terminal strip conductors is ensured.
As shown in fig. 3 and 4, the tertiary probe 303 can be inserted on the middle metal conductor in the common terminal row or on the terminal screw in the common terminal row; the probes are compressed when being inserted into the terminal block, so that the length of the tertiary probes 303 is not smaller than that of the primary probes 301, the tail ends of the tertiary probes 303 are ensured to be inserted into the terminal block when the primary springs 401 and the secondary springs 402 are compressed, and the tail ends of the tertiary probes 303 are fine protrusions, so that a more reliable electric signal channel can be established.
The outer surfaces of the main side of the clamp, the secondary side of the clamp, the outer surface of the primary probe, the outer surface of the secondary probe and the outer surfaces of the main side, the secondary side and the connecting part of the clamp are all made of insulating materials. The universal test wire jack in the main edge of the clamp, the inner surface of the first-stage probe, the inner surface of the second-stage probe and the third-stage probe are all made of metal materials; reliable electrical connections exist between the surface of the universal test wire receptacle, the inner surface of the first stage probe, the inner surface of the second stage probe, the interior of the third stage probe, and the ends thereof to facilitate the transmission of electrical signals between the universal test wire receptacle and the ends of the third stage probe.
While the foregoing description of the embodiments of the present utility model has been presented in conjunction with the drawings, it should be understood that it is not intended to limit the scope of the utility model, but rather, it is intended to cover all modifications or variations within the scope of the utility model as defined by the claims of the present utility model.

Claims (10)

1. A universal terminal-based secondary loop test connector, comprising:
the clamp comprises a clamp body and a probe, wherein the clamp body comprises a clamp main edge and a clamp auxiliary edge, and the middle parts of the clamp main edge and the clamp auxiliary edge are connected through a torsion spring;
the connecting part of the main side of the clamp and the auxiliary side of the clamp is movably connected with a probe, and the probe is of a multistage telescopic structure and comprises a first-stage probe, a second-stage probe and a third-stage probe;
the clamp body is used for clamping and fixing the universal terminal strip, and the probe is used for being inserted into the universal terminal strip.
2. The secondary circuit test connector based on the universal terminal according to claim 1, wherein the primary probe and the secondary probe are hollow structures; the outer diameter of the secondary probe is smaller than the inner diameter of the primary probe, and the outer diameter of the tertiary probe is smaller than the inner diameter of the secondary probe.
3. The universal terminal-based secondary loop test connector of claim 2, wherein the primary probe is internally slidingly coupled to the secondary probe and the secondary probe is internally slidingly coupled to the tertiary probe.
4. The secondary circuit test connector based on the universal terminal according to claim 3, wherein a primary probe spring is arranged in the primary probe, the head end of the primary probe spring is connected with the head end of the primary probe, and the tail end of the primary probe spring is connected with the head end of the secondary probe;
the secondary probe is internally provided with a secondary probe spring, the head end of the secondary probe spring is connected with the head end of the secondary probe, and the tail end of the secondary probe spring is connected with the head end of the tertiary probe.
5. The universal terminal-based secondary loop test connector of claim 4, wherein the length of the tertiary probe is not less than the length of the primary probe, and wherein the ends of the tertiary probe are secured for insertion into the terminal block when the primary and secondary probe springs are compressed.
6. The universal terminal-based secondary loop test connector of claim 3, wherein the outer surface of the primary side of the clip, the outer surface of the secondary side of the clip, the outer surface of the primary probe, the outer surface of the secondary probe, and the outer surface of the junction of the primary and secondary sides of the clip are provided with insulating layers.
7. A universal terminal-based secondary loop test connector as defined in claim 3 wherein said clip main edge upper end defines a pass-through test wire receptacle.
8. The universal terminal-based secondary loop test connector of claim 7, wherein the universal test wire receptacle on the main side of the clip, the inner surface of the primary probe, the inner surface of the secondary probe, and the tertiary probe are all metallic.
9. The universal terminal-based secondary loop test joint according to claim 1, wherein the tertiary probe is inserted on a metal conductor in a universal terminal row or on a terminal screw in a universal terminal row.
10. The secondary circuit test connector based on the universal terminal according to claim 1, wherein the torsion spring is sleeved on the spring rod, a through hole is formed at the head end of the primary probe, and one end of the spring rod passes through the through hole to movably connect the primary probe on the spring rod.
CN202223475267.5U 2022-12-26 2022-12-26 Secondary circuit test joint based on universal terminal Active CN219123529U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202223475267.5U CN219123529U (en) 2022-12-26 2022-12-26 Secondary circuit test joint based on universal terminal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202223475267.5U CN219123529U (en) 2022-12-26 2022-12-26 Secondary circuit test joint based on universal terminal

Publications (1)

Publication Number Publication Date
CN219123529U true CN219123529U (en) 2023-06-02

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ID=86519643

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202223475267.5U Active CN219123529U (en) 2022-12-26 2022-12-26 Secondary circuit test joint based on universal terminal

Country Status (1)

Country Link
CN (1) CN219123529U (en)

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