CN219085071U - Test fixture for integrated circuit chip - Google Patents

Abstract

The utility model relates to a test fixture for an integrated circuit chip. At present, in the existing integrated circuit chip test, each type of integrated circuit chip can be fixed on a test tool with a corresponding size to clamp the test, but the whole test tool cannot be adjusted to be suitable for testing integrated circuit chips with different types, so that the universality is poor. A test fixture for integrated circuit chips comprises a base (1), wherein a screw rod (2) is connected to the upper portion of the base in a rotating mode, two sides of the screw rod are connected with a movable vertical plate (3) in a threaded mode, a supporting plate (4) is arranged on the upper portion of the movable vertical plate, the integrated circuit chips are arranged on the supporting plate, a plurality of clamping plates (5) are arranged on the supporting plate, contact pins of the integrated circuit chips are clamped between the clamping plates, a bottom contact (6) is arranged on the supporting plate between the two clamping plates, and a tester (7) is electrically connected to the bottom contact. The utility model is applied to the technical field of integrated circuit chip testing tools.

Description

Test fixture for integrated circuit chip

Technical Field

The utility model belongs to the technical field of integrated circuit chip testing tools, and particularly relates to a testing tool for an integrated circuit chip.

Background

The existing integrated circuit chips need to be tested before leaving factories or before being used in a large batch, so that the use quality of the integrated circuit chips is guaranteed, in the existing integrated circuit chip test, each type of integrated circuit chips can be fixed on a test tool with a corresponding size to clamp the test, but the whole test tool cannot be adjusted and adapted to test the integrated circuit chips with different types, so that the universality is poor, and the test tool for the integrated circuit chips is provided for solving the problems.

Disclosure of Invention

The utility model aims to provide a test fixture for an integrated circuit chip.

The above object is achieved by the following technical scheme:

a test fixture for an integrated circuit chip, comprising: the base is rotationally connected with the screw, two movable risers are arranged on the screw and penetrate through guide grooves on the base, a supporting plate is arranged above the movable risers, a group of clamping plates are connected onto the supporting plate, the distances between two adjacent clamping plates are the same, a bottom contact is arranged on the horizontal plate surface of the supporting plate and is connected with the tester through a wire, and a pressing mechanism is arranged on one side of the base;

the pushing mechanism is provided with a supporting rod, a movable groove is formed in the upper side of the supporting rod, a sliding block is arranged in the movable groove, the top of the sliding block is fixedly connected with a vertical rod, the vertical rod penetrates through the top of the supporting rod to be connected with a pressing plate, and a spring is sleeved on the vertical rod.

The test fixture for the integrated circuit chip is characterized in that a T-shaped clamping block is connected to the vertical plate surface of the supporting plate and is clamped with a clamping groove at the top of the movable vertical plate;

two top bolts are symmetrically connected to the surface of the T-shaped clamping block.

The test fixture for the integrated circuit chip is characterized in that the threaded rod adopts a bidirectional thread structure, and the threaded rod drives the two movable risers to horizontally move when the base rotates.

The beneficial effects achieved by the utility model are as follows:

1. the utility model can be used for detecting by changing the supporting plates of different types according to the number and the spacing of the contact pins of the integrated circuit chips, and the movable vertical plate is driven to move by rotating the screw rod, so that the spacing between the two supporting plates can be adjusted to adapt to the integrated circuit chips with different lengths.

2. The supporting plate is clamped into the clamping groove of the movable vertical plate through the T-shaped clamping block, and then the movable vertical plate is propped against by the rotary top bolt, so that the supporting plate can be quickly and stably fixed on the movable vertical plate, the connecting structure is simple, and the supporting plate with different types can be quickly assembled and disassembled in later period.

Drawings

The accompanying drawings are included to provide a further understanding of the utility model and are incorporated in and constitute a part of this specification, illustrate the utility model and together with the embodiments of the utility model, serve to explain the utility model.

In the drawings:

FIG. 1 is a schematic diagram of the front internal structure of the present utility model;

FIG. 2 is a schematic diagram of the structure of the pressing mechanism of the present utility model;

FIG. 3 is a schematic perspective view of a mobile riser according to the present utility model;

fig. 4 is a schematic diagram showing a three-dimensional structure of a pallet according to the present utility model.

Fig. 5 is a schematic view of the base structure of the present utility model.

The marks in the figure: 1-base, 2-screw, 3-movable riser, 4-layer board, 5-cardboard, 6-bottom contact, 7-tester, 8-pushing mechanism, 9-guide way, 10-draw-in groove, 11-T fixture block, 12-top bolt, 13-bracing piece, 14-movable groove, 15-slider, 16-telescopic link, 17-spring, 18-clamp plate.

Detailed Description

The preferred embodiments of the present utility model will be described below with reference to the accompanying drawings, it being understood that the preferred embodiments described herein are for illustration and explanation of the present utility model only, and are not intended to limit the present utility model.

Example 1:

the embodiment of the utility model provides a test fixture for an integrated circuit chip, which is shown by referring to fig. 1 and 4, and comprises a base 1, wherein the upper part of the base 1 is rotationally connected with a screw rod 2, both sides of the screw rod 2 are in threaded connection with a movable vertical plate 3, the upper part of the movable vertical plate 3 is provided with a supporting plate 4, the supporting plate 4 is provided with the integrated circuit chip, the supporting plate 4 is provided with a plurality of clamping plates 5, the contact pins of the integrated circuit chip are clamped between the clamping plates 5, the supporting plate 4 between the two clamping plates 5 is provided with a bottom contact 6, the bottom contact 6 is electrically connected with a tester 7, the structure drives the two movable vertical plates 3 to move by rotating the screw rod 2, and then the two supporting plates 4 are adjusted to adapt to integrated circuit chips with different lengths, so that the left and right positions of the integrated circuit chip are positioned, meanwhile, the contact pins of the integrated circuit chip can be positioned at the front and back positions by utilizing the clamping plates 5 on the supporting plate 4 to be contacted with the bottom contact points 6, and the integrated circuit chip can be communicated with the tester, and the integrated circuit chip can be detected.

Example 2:

referring to fig. 1, external threads with opposite directions are provided on the outer sides of the two sides of the screw 2, and the external threads with opposite directions can drive the two movable risers 3 to move in opposite directions at the same time.

Referring to fig. 1, a guide groove 9 is formed in the top surface of the base 1, and the movable riser 3 penetrates the guide groove 9, and the guide groove 9 is used for guiding movement of the movable riser 3.

Referring to fig. 1 and 2, a pressing mechanism 8 is arranged at the rear part of the top surface of the base 1, the pressing mechanism 8 comprises a supporting rod 13, a movable groove 14 is formed in the upper side of the supporting rod 13, a sliding block 15 is arranged in the movable groove 14, a telescopic rod 16 is fixedly connected to the top of the sliding block 15, the telescopic rod 16 is slidably connected to the top of the supporting rod 13, a spring 17 is adjusted on the outer wall of the telescopic rod 16, a pressing plate 18 is fixedly connected to the top end of the telescopic rod 16, the sliding block 15 is pushed by the spring 17, downward force is applied to the sliding block 15, so that downward force is applied to the pressing plate 18 at the top end of the telescopic rod 16, and the integrated circuit chip is stably pressed on the supporting plate 4 by the pressing plate 18, so that the contact pins of the integrated circuit chip are stably contacted with the bottom contacts 6 on the supporting plate 4.

Referring to fig. 1, 3 and 4, a clamping groove 10 is formed in the upper portion of the movable vertical plate 3, a T-shaped clamping block 11 is fixedly connected to the supporting plate 4, the T-shaped clamping block 11 is clamped with the clamping groove 10, two sides of the T-shaped clamping block 11 are respectively and spirally connected with a top bolt 12, the movable vertical plate 3 is quickly connected with the supporting plate 4 through the clamping groove 10 and the T-shaped clamping block 11 in the structure, meanwhile, the position of the supporting plate 4 is located, and the supporting plate 4 can be stably fixed on the movable vertical plate 3 through rotating the top bolts 12.

Example 3:

the implementation principle of the test fixture for the integrated circuit chip is as follows: when the integrated circuit chip testing device is used, firstly, a proper detection supporting plate 4 is selected according to the number and the distance of the tentacles of the integrated circuit chips to be tested, then the supporting plate 4 is clamped into the clamping groove 10 of the movable vertical plate 3 through the T-shaped clamping block 11, then the top bolt 12 on the T-shaped clamping block 11 is rotated, the top bolt 12 is used for supporting the movable bolt 3, so that the supporting plate 4 is stably fixed on the movable vertical plate 3, after the supporting plate 4 is fixed, the screw 2 is rotated according to the length of the integrated circuit chips, the two movable vertical plates 3 are driven to move simultaneously by the external threads opposite to the two sides of the screw 2, the distance between the two supporting plates 4 is adjusted to adapt to the length of the integrated circuit chips, after the adjustment, the integrated circuit chips are prevented from being clamped between the supporting plates 4, and the tentacles of the integrated circuit chips are clamped between the clamping plates 5 of the supporting plate 4, at this time, the bottom contacts 6 of the supporting plate 4 and the contact pins of the integrated circuit chips are in contact connection, then an operator rotates the pressing plate 18 on the supporting rod 13, so that the pressing plate 18 is enabled to be on the upper part of the integrated circuit chips, then the pressing plate 18 is released, under the action of the pushing force of the integrated circuit chips, the pressing plate 18 can be stably pressed on the pressing plate 4, the pressing plate 6, the integrated circuit chips can be stably contact the bottom contacts 7, and then the integrated circuit chips can be stably connected, and the integrated circuit chips can be tested.

Claims (3)

1. A test fixture for an integrated circuit chip, comprising: the base, base and screw rod rotate to be connected, install two removal risers on the screw rod, and remove the guide way that the riser passed on the base, characterized by: the upper part of the movable vertical plate is provided with a supporting plate, a group of clamping plates are connected to the supporting plate, the distances between two adjacent clamping plates are the same, the horizontal plate surface of the supporting plate is provided with a bottom contact, the bottom contact is connected with the tester through a wire, and one side of the base is provided with a pressing mechanism;

the pushing mechanism is provided with a supporting rod, a movable groove is formed in the upper side of the supporting rod, a sliding block is arranged in the movable groove, the top of the sliding block is fixedly connected with a vertical rod, the vertical rod penetrates through the top of the supporting rod to be connected with a pressing plate, and a spring is sleeved on the vertical rod.

2. The test fixture for an integrated circuit chip of claim 1, wherein: the vertical plate surface of the supporting plate is connected with a T-shaped clamping block, and the T-shaped clamping block is clamped with a clamping groove at the top of the movable vertical plate;

two top bolts are symmetrically connected to the surface of the T-shaped clamping block.

3. The test fixture for an integrated circuit chip of claim 2, wherein: the screw rod adopts two-way thread structure, and the screw rod drives two movable risers horizontal movement when the base rotates.

Images