CN218866219U

CN218866219U - Microscope probe adjusting structure

Info

Publication number: CN218866219U
Application number: CN202223352493.4U
Authority: CN
Inventors: 季迪
Original assignee: Shanghai Manji Photoelectric Technology Co ltd
Current assignee: Shanghai Manji Photoelectric Technology Co ltd
Priority date: 2022-12-13
Filing date: 2022-12-13
Publication date: 2023-04-14
Anticipated expiration: 2032-12-13

Abstract

The utility model discloses a microscope probe adjusts structure relates to microscope probe support technical field. The utility model comprises a microscope test board, wherein an adjusting structure is fixedly arranged in the microscope test board; the adjusting structure comprises a supporting frame fixedly connected to the microscope test bench, the inner side wall of the supporting frame is rotatably connected with a lead screw through a bearing, the surface of the lead screw is connected with a sliding table in a sliding mode, and an X-axis adjusting mechanism is installed on one side of the sliding table. The utility model discloses a lead screw, slip table, X axle adjustment mechanism, Y axle adjustment mechanism, regulating plate, the setting of probe direction subassembly and probe, can realize that the direction of X axle, Y axle and Z axle is adjusted, realize the puncture demand of multiple spot regulation in order to satisfy different positions, still can slide in the regulating plate through probe direction subassembly simultaneously and realize angle modulation, can carry out the puncture operation through probe guiding hole after the regulation is accomplished, adopt this regulation structure to puncture and can realize the puncture experiment of higher accuracy.

Description

Microscope probe adjusting structure

Technical Field

The utility model belongs to the technical field of microscope probe support, especially, relate to a microscope probe adjusts structure.

Background

The microscope is an optical instrument formed by one lens or a combination of several lenses, is a sign of human being entering atomic times, and is an instrument which is mainly used for magnifying tiny objects and can be seen by naked eyes of human beings.

Need carry out the puncture test to the cell in cell experimental process, microscope test equipment commonly used on the market is when using, needs personnel to operate the microscope and hand the probe and carry out the puncture operation on one side, and direct handheld probe puncture can cause the puncture failure, and traditional test equipment is to fix the probe and use on the probe support, and the probe support is the fixed bolster that has the aperture usually, and this kind of fixed bolster is difficult to carry out puncture angle according to the puncture direction and adjusts, for this reason, we provide a microscope probe and adjust the structure.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a microscope probe adjusts structure has solved current microscope probe and has adjusted the structure, inconvenient problem of adjusting the puncture angle when using.

In order to solve the technical problem, the utility model discloses a realize through following technical scheme:

the utility model relates to a microscope probe adjusting structure, which comprises a microscope test board, wherein an adjusting structure is fixedly arranged in the microscope test board;

the utility model discloses a microscope test platform, including microscope test platform, adjust the structure, adjust the inside wall of support frame and include fixed connection in the support frame on microscope test platform, the inside wall of support frame rotates through the bearing and is connected with the lead screw, the sliding surface of lead screw is connected with the slip table, X axle adjustment mechanism is installed to one side of slip table, X axle adjustment mechanism's removal end fixedly connected with Y axle adjustment mechanism, Y axle adjustment mechanism's one end fixedly connected with regulating plate, the inside wall sliding connection of regulating plate has probe direction subassembly, probe direction subassembly's inside wall is pegged graft and is had the probe.

Further, one side fixed mounting of support frame inner wall has the slide rail, the surface sliding connection of slide rail has balanced slider, balanced slider links to each other with the slip table is fixed, the top fixedly connected with of lead screw changes the handle, rotates to change and to drive the lead screw and drive the slip table and slide from top to bottom on the surface of lead screw.

Further, X axle adjustment mechanism and Y axle adjustment mechanism's structure is the same, X axle adjustment mechanism and Y axle adjustment mechanism all include one and adjust the seat, adjust two balanced slides of the inside wall fixedly connected with of seat, two the common fixedly connected with alignment jig of the inside wall of balanced slide, alignment jig can slide at the inner wall of balanced slide to realize that X axle and Y axle direction are adjusted.

Further, the side of adjusting the seat rotates and is connected with the adjusting knob, the adjusting knob runs through the one end fixedly connected with drive gear of adjusting the seat, the side fixedly connected with of alignment jig is in the pinion rack of drive gear looks adaptation.

Furtherly, the spout has been seted up to the inside wall of regulating plate, the spout is circular-arcly, probe direction subassembly includes sliding connection in the inside arc slider of spout, one side fixedly connected with probe fixing base of arc slider, arc slider and spout looks adaptation.

Furthermore, a probe guide hole is formed in the middle of the probe fixing seat, a positioning bolt is connected to one side of the probe fixing seat in a threaded mode, one end, penetrating through the probe fixing seat, of the positioning bolt abuts against the side wall of the probe, and therefore the probe can be conveniently fixed through the positioning bolt.

Furthermore, the other side of the probe fixing seat is in threaded connection with a fixing clamp, the fixing clamp is tightly abutted to the side wall of the adjusting plate in threaded connection with the probe fixing seat, and the probe fixing seat can be fixed through the fixing clamp.

The utility model discloses following beneficial effect has:

through the lead screw, the slip table, X axle adjustment mechanism, Y axle adjustment mechanism, the regulating plate, the setting of probe direction subassembly and probe, the lead screw rotates and to drive the slip table at the surface slip of lead screw, the realization is to the regulation of probe Z axle direction, cooperation X axle adjustment mechanism and Y axle adjustment mechanism realize the many points location simultaneously and adjust the puncture demand in order to satisfy different points location, still can slide in the regulating plate through probe direction subassembly simultaneously and realize the angle modulation, can carry out the puncture operation through probe direction hole after the regulation is accomplished, adopt this regulation structure to puncture and can realize the puncture experiment of higher accuracy.

Of course, it is not necessary for any particular product to achieve all of the above-described advantages at the same time.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below. It should be apparent that the drawings in the following description are merely exemplary and that other implementation drawings may be derived from the drawings provided to one of ordinary skill in the art without inventive effort.

Fig. 1 is a schematic perspective view of the present invention;

fig. 2 is a schematic side view of the present invention;

fig. 3 is a schematic perspective view of the adjusting structure of the present invention;

fig. 4 is a top view of the adjusting structure of the present invention;

fig. 5 is a schematic view of a partial structure of the adjusting structure of the present invention.

In the drawings, the reference numbers indicate the following list of parts:

1. a microscope test bench; 2. a support frame; 3. a screw rod; 4. a sliding table; 5. an X-axis adjusting mechanism; 501. an adjusting seat; 502. a balance slide seat; 503. an adjusting bracket; 504. an adjusting knob; 505. a drive gear; 506. a toothed plate; 6. a Y-axis adjustment mechanism; 7. an adjusting plate; 8. a probe guide assembly; 801. a fixing clip; 802. a chute; 803. an arc-shaped sliding block; 804. a probe fixing seat; 805. a probe guide hole; 806. positioning a bolt; 9. a probe; 10. a slide rail; 11. a balancing slide block; 12. and (7) turning a handle.

Detailed Description

Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The implementations described in the exemplary embodiments below are not intended to represent all implementations consistent with the present disclosure. Rather, they are merely examples of devices consistent with certain aspects of the present disclosure, as detailed in the appended claims.

The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1, fig. 2, fig. 3, fig. 4 and fig. 5, the present invention is a microscope probe adjusting structure, including a microscope testing platform 1, wherein the adjusting structure is fixedly installed in the microscope testing platform 1;

the adjusting structure comprises a supporting frame 2 fixedly connected to the microscope test board 1, the inner side wall of the supporting frame 2 is connected with a lead screw 3 in a rotating mode through a bearing, the surface of the lead screw 3 is connected with a sliding table 4 in a sliding mode, an X-axis adjusting mechanism 5 is installed on one side of the sliding table 4, a Y-axis adjusting mechanism 6 is fixedly connected to the moving end of the X-axis adjusting mechanism 5, an adjusting plate 7 is fixedly connected to one end of the Y-axis adjusting mechanism 6, a probe guiding assembly 8 is connected to the inner side wall of the adjusting plate 7 in a sliding mode, and a probe 9 is inserted into the inner side wall of the probe guiding assembly 8.

As shown in fig. 1, fig. 2, fig. 3, fig. 4 and fig. 5, a slide rail 10 is fixedly mounted on one side of the inner wall of the support frame 2, a balance slide block 11 is connected to the surface of the slide rail 10 in a sliding manner, the balance slide block 11 is fixedly connected with the sliding table 4, a rotating handle 12 is fixedly connected to the top of the screw rod 3, and the rotating handle 12 is rotated to drive the screw rod 3 to drive the sliding table 4 to slide up and down on the surface of the screw rod 3.

Specifically, during the use, when needing to carry out Z axle direction regulation, rotate and change 12, can drive lead screw 3 through changeing 12 and rotate, drive slip table 4 through lead screw 3 and slide on the surface of lead screw 3 for X axle adjustment mechanism 5 and Y axle adjustment mechanism 6 carry out synchronous regulation along with slip table 4, can be through balanced slider 11 on the surface of slide rail 10 when lead screw 3 rotates, make slip table 4 keep balanced state when the motion.

As shown in fig. 1, 2, 3, 4 and 5, the X-axis adjusting mechanism 5 and the Y-axis adjusting mechanism 6 have the same structure, the X-axis adjusting mechanism 5 and the Y-axis adjusting mechanism 6 both include an adjusting seat 501, two balance sliders 502 are fixedly connected to the inner side wall of the adjusting seat 501, an adjusting frame 503 is fixedly connected to the inner side walls of the two balance sliders 502, and the adjusting frame 503 can slide on the inner wall of the balance sliders 502, so that the adjustment in the X-axis direction and the Y-axis direction can be realized.

The side of the adjusting base 501 is rotatably connected with an adjusting knob 504, one end of the adjusting knob 504 penetrating through the adjusting base 501 is fixedly connected with a driving gear 505, and the side of the adjusting frame 503 is fixedly connected with a toothed plate 506 matched with the driving gear 505.

Specifically, during the use, be the right angle distribution between X axle adjustment mechanism 5 and the Y axle adjustment mechanism 6, that is to say that the contained angle is 90 between Y axle adjustment mechanism 6 and the X axle adjustment mechanism 5, because X axle adjustment mechanism 5 is the same with Y axle adjustment mechanism 6's structure, operating procedure is also the same, during the operation, rotate adjusting knob 504, synchronous drive gear 505 rotates when adjusting knob 504 rotates, mesh pinion rack 506 through drive gear 505, make pinion rack 506 slide left and right, consequently, realize the regulation of X axle and Y axle point position, make probe 9 realize the distribution of different location, in order to satisfy the puncture demand of different points.

As shown in fig. 1, 2, 3, 4 and 5, a sliding groove 802 is formed in the inner side wall of the adjusting plate 7, the sliding groove 802 is arc-shaped, the probe guiding assembly 8 includes an arc-shaped sliding block 803 slidably connected to the inside of the sliding groove 802, a probe fixing seat 804 is fixedly connected to one side of the arc-shaped sliding block 803, and the arc-shaped sliding block 803 is adapted to the sliding groove 802.

Probe guide hole 805 has been seted up at the middle part of probe fixing base 804, and one side threaded connection of probe fixing base 804 has positioning bolt 806, and positioning bolt 806 runs through the one end of probe fixing base 804 and supports the lateral wall of tight probe 9 to conveniently fix probe 9 through positioning bolt 806.

The opposite side threaded connection of probe fixing base 804 has fixation clamp 801, supports the lateral wall of tight regulating plate 7 when fixation clamp 801 and probe fixing base 804 threaded connection, can realize the fixed to probe fixing base 804 through fixation clamp 801.

Specifically, during the use, when needing to adjust the puncture angle of probe 9, rotate fixation clamp 801 and make fixation clamp 801 break away from regulating plate 7 and can slide arc slider 803 and then adjust the inclination of probe fixing base 804, can reverse rotation fixation clamp 801 after the regulation is accomplished, make fixation clamp 801 interlock regulating plate 7, accomplish the fixed to arc slider 803, then penetrate probe 9 in probe guiding hole 805, carry out the operation of puncturing through probe guiding hole 805, still can rotate positioning bolt 806 simultaneously, make positioning bolt 806 support probe 9 and accomplish the fixed to probe 9 tightly.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope of the disclosure being indicated by the following claims.

Claims

1. The utility model provides a structure is adjusted to microscope probe, includes microscope test platform (1), its characterized in that: an adjusting structure is fixedly arranged in the microscope test bench (1);

adjust the structure and include support frame (2) of fixed connection on microscope testboard (1), the inside wall of support frame (2) rotates through the bearing and is connected with lead screw (3), the sliding surface of lead screw (3) is connected with slip table (4), X axle adjustment mechanism (5) are installed to one side of slip table (4), the removal end fixedly connected with Y axle adjustment mechanism (6) of X axle adjustment mechanism (5), the one end fixedly connected with regulating plate (7) of Y axle adjustment mechanism (6), the inside wall sliding connection of regulating plate (7) has probe direction subassembly (8), the inside wall of probe direction subassembly (8) is pegged graft and is had probe (9).

2. The microscope probe adjusting structure according to claim 1, wherein a slide rail (10) is fixedly installed at one side of the inner wall of the support frame (2), a balance slider (11) is slidably connected to the surface of the slide rail (10), the balance slider (11) is fixedly connected to the sliding table (4), and a rotating handle (12) is fixedly connected to the top of the screw rod (3).

3. The microscope probe adjusting structure according to claim 1, wherein the X-axis adjusting mechanism (5) and the Y-axis adjusting mechanism (6) have the same structure, the X-axis adjusting mechanism (5) and the Y-axis adjusting mechanism (6) each include an adjusting seat (501), two balancing sliding seats (502) are fixedly connected to inner side walls of the adjusting seats (501), and an adjusting frame (503) is fixedly connected to inner side walls of the two balancing sliding seats (502).

4. The microscope probe adjusting structure according to claim 3, wherein an adjusting knob (504) is rotatably connected to a side surface of the adjusting base (501), a driving gear (505) is fixedly connected to one end of the adjusting knob (504) penetrating through the adjusting base (501), and a toothed plate (506) matched with the driving gear (505) is fixedly connected to a side surface of the adjusting frame (503).

5. The microscope probe adjusting structure according to claim 3, wherein a sliding groove (802) is formed in an inner side wall of the adjusting plate (7), the sliding groove (802) is arc-shaped, the probe guiding assembly (8) comprises an arc-shaped sliding block (803) slidably connected inside the sliding groove (802), and a probe fixing seat (804) is fixedly connected to one side of the arc-shaped sliding block (803).

6. The microscope probe adjusting structure according to claim 5, wherein a probe guide hole (805) is formed in the middle of the probe fixing seat (804), a positioning bolt (806) is connected to one side of the probe fixing seat (804) in a threaded manner, and one end of the positioning bolt (806) penetrating through the probe fixing seat (804) abuts against the side wall of the probe (9).

7. The microscope probe adjusting structure according to claim 6, wherein a fixing clip (801) is screwed on the other side of the probe fixing seat (804), and the fixing clip (801) abuts against a side wall of the adjusting plate (7) when being screwed with the probe fixing seat (804).