CN218848276U - Chip testing jig - Google Patents

Abstract

The utility model discloses a chip testing jig, which comprises a base, a first face cover, a second face cover and a testing board, wherein the first face cover and the second face cover are respectively positioned at two sides of the base and movably connected with the base; the testing device comprises a base, a first testing groove, a second testing groove and a testing device, wherein the two opposite surfaces of the base are respectively provided with the first testing groove and the second testing groove, and the first testing groove and the second testing groove are used for containing chips to be tested; a first pressing piece is arranged on one side, facing the first test slot, of the first face cover in a protruding mode, and a second pressing piece is arranged on one side, facing the second test slot, of the second face cover in a protruding mode; the test board is mounted on the base, is at least partially located in the first test slot and the second test slot, and is used for being in contact with and electrically connected with chips placed in the first test slot and the second test slot. The utility model discloses technical scheme has the effect that easy operation, test result are accurate, and can once only test more chips, and efficiency of software testing is high.

Description

Chip testing jig

Technical Field

The utility model relates to a chip testing field, in particular to chip testing jig.

Background

With the development of science and technology, electronic products have been gradually popularized in people's daily life, and the chip is used as a core component of the electronic product, which determines the quality of the electronic product to a certain extent.

The chip can be subjected to performance test before leaving the factory so as to ensure the quality of the chip. During testing, the chip is manually welded on the test board, and then the chip is tested through the test board, such as data read-write test. However, the chip is soldered to the test board manually, which is prone to cause the chip to deviate from the test position of the test board, thereby affecting the test result of the chip.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a chip test fixture aims at solving current chip test mode and has the unsafe technical problem of test result.

In order to achieve the above object, the utility model provides a chip testing jig, this chip testing jig includes:

the test board comprises a base, a first face cover, a second face cover and a test board, wherein the first face cover and the second face cover are respectively positioned on two sides of the base and movably connected with the base; wherein, the first and the second end of the pipe are connected with each other,

the two opposite surfaces of the base are respectively provided with a first test slot and a second test slot, and the first test slot and the second test slot are used for accommodating chips to be tested;

a first pressing piece is arranged on one side, facing the first test slot, of the first face cover in a protruding mode, and a second pressing piece is arranged on one side, facing the second test slot, of the second face cover in a protruding mode;

the test board is mounted on the base, is at least partially located in the first test slot and the second test slot, and is used for being in contact with and electrically connected with chips placed in the first test slot and the second test slot.

In some embodiments, the base comprises:

the first mounting plate is provided with the first test slot;

and the second mounting plate is stacked and connected with the first mounting plate, and the second test slot is arranged on the second mounting plate.

In some embodiments, an accommodating space is formed between the first mounting plate and the second mounting plate, the accommodating space is respectively communicated with the first test slot and the second test slot, and the test board is inserted into the accommodating space.

In some embodiments, the test plate comprises:

PCBA board;

the first test contact is electrically connected to one surface of the PCBA board;

a second test contact electrically connected to the other opposite face of the PCBA board;

wherein the first test contact is located within the first test slot and the second test contact is located within the second test slot.

In some embodiments, the chip test fixture further comprises:

the first mounting groove is formed in the first mounting plate or the second mounting plate and communicated with the accommodating space;

and the leakage protection device is arranged in the mounting groove and electrically connected with the PCBA.

In some embodiments, the chip test fixture further comprises:

the first limiting frame is arranged in the first test slot and provided with a plurality of first limiting grooves, and each first limiting groove is matched with the chip to be tested; and/or the presence of a gas in the gas,

and the second limiting frame is arranged in the second test slot and provided with a plurality of second limiting grooves, and each second limiting groove is matched with the chip to be tested.

In some embodiments, the chip test fixture further comprises:

the first buckle is arranged on the first face cover, and the first mounting plate is provided with a first clamping groove which is used for being clamped and matched with the first buckle; and/or the presence of a gas in the gas,

and the second buckle is arranged on the second face cover, and a second clamping groove is formed in the second mounting plate and used for being matched with the first buckle in a clamping manner.

In some embodiments, the first cover is provided with a second mounting groove, the first buckle is mounted in the second mounting groove, and two ends of the first buckle are respectively in rotary connection with two inner side walls of the second mounting groove; and/or the presence of a gas in the gas,

the second face cover is provided with a third mounting groove, the second buckle is mounted in the third mounting groove, and two ends of the second buckle are respectively rotatably connected with two inner side walls of the third mounting groove.

In some embodiments, the first catch is located on a side of the first bezel facing the first test slot;

and/or the second buckle is positioned on one surface of the second face cover facing the second test slot.

In some embodiments, the first face cover includes a plurality of first pressing members, the first pressing members include a plurality of first pressing members, the plurality of first pressing members are disposed on one first face cover at intervals, and each first pressing member corresponds to one first limiting groove;

and/or the second face cover comprises a plurality of second pressing and holding pieces, the second pressing and holding pieces comprise a plurality of second pressing and holding pieces, the second pressing and holding pieces are arranged on one second face cover at intervals, and each second pressing and holding piece corresponds to one second limiting groove.

The utility model provides an among the technical scheme, when the chip test, will test the chip of examination with the examination of awaiting measuring and place in first test groove or second test groove, because the size and the shape of first test groove or second test groove all with chip looks adaptation, consequently, place the chip in first test groove or second test groove back, the chip will be accurate be located the test position of surveying the test panel. Then, the first face cover or the second face cover is moved to a position right above the first test slot or the second test slot, so that the first pressing piece or the second pressing piece corresponding to the first face cover or the second face cover respectively supports against the chip in the first test slot or the second test slot, the chip is guaranteed to be fixed in the first test slot or the second test slot and always keeps in contact with the test board, the chip is prevented from being separated from the test board in the test process, normal chip test is guaranteed, and accuracy of test results is improved. For survey test panel with chip welding through the manual work on with the mode of carrying out capability test, the utility model discloses technical scheme has easy operation, and the test result is accurate, and testing cost low grade advantage, and because this chip test fixture's tow sides has all seted up test groove, can test a plurality of chips simultaneously, the efficiency of software testing is high.

Drawings

FIG. 1 is a schematic structural diagram of an embodiment of a chip testing fixture of the present invention;

FIG. 2 is a schematic structural diagram of an embodiment of a first mounting plate and a first limiting frame in FIG. 1;

FIG. 3 is a schematic structural view of an embodiment of a second mounting plate and a second limiting frame in FIG. 1;

FIG. 4 is a schematic diagram of one embodiment of a side of the test board of FIG. 1;

FIG. 5 is a schematic view of another embodiment of the test board shown in FIG. 1.

Detailed Description

In the following, the embodiments of the present invention will be described in detail with reference to the accompanying drawings, and obviously, the described embodiments are only some embodiments, not all embodiments, of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by a person skilled in the art without making creative efforts belong to the protection scope of the present invention.

It should be noted that all the directional indicators (such as up, down, left, right, front, back \8230;) in the embodiments of the present invention are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the attached drawings), and if the specific posture is changed, the directional indicator is changed accordingly.

It will also be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present.

Furthermore, the descriptions in the present application related to "first", "second", etc. are for descriptive purposes only and are not to be construed as indicating or implying relative importance or to imply that the number of technical features indicated are implicitly being indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions in the embodiments may be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should not be considered to exist, and is not within the protection scope of the present invention.

The utility model provides a chip test fixture, refer to 1 ~ 5, this chip test fixture includes:

the test board comprises a base 1, a first face cover 2, a second face cover 3 and a test board 4, wherein the first face cover 2 and the second face cover 3 are respectively positioned at two sides of the base 1 and movably connected with the base; wherein the content of the first and second substances,

the two opposite surfaces of the base 1 are respectively provided with a first test slot 11 and a second test slot 12, and the first test slot 11 and the second test slot 12 are used for accommodating chips to be tested;

a first pressing piece 21 is arranged on one side, facing the first test slot 11, of the first face cover 2 in a protruding mode, and a second pressing piece 31 is arranged on one side, facing the second test slot 12, of the second face cover 3 in a protruding mode;

the test board 4 is mounted on the base 1, and at least partially located in the first test slot 11 and the second test slot 12, and is used for contacting and electrically connecting chips placed in the first test slot 11 and the second test slot 12.

In this embodiment, when the chip testing jig is used, the chip is placed in the first test slot 11 or the second test slot 12, and then the first cover 2 or the second cover 3 is covered to fix the chip.

If place the chip in first test groove 11, then close the one side that base 1 was equipped with first test groove 11 with first face lid 2 lid, because the first holding 21 that presses that first face lid 2 epirelief was equipped with, first face lid 2 lid can drive first holding 21 when closing the one side that base 1 was equipped with first test groove 11, so first holding 21 can press the chip in holding first test groove 11 under the condition that base 1 was equipped with the one side of first test groove 11 is closed to first face lid 2 lid, thereby make the chip always be connected with survey test panel 4 electricity.

If, place the chip in second test slot 12, then close the one side that base 1 was equipped with second test slot 12 with second face lid 3 lid, because the protruding second that is equipped with on second face lid 3 presses and holds 31, second face lid 3 lid can drive the second when closing the one side that base 1 was equipped with second test slot 12 and press and hold 31, so the second presses and holds 31 and can press and hold the chip in second test slot 12 under the condition that base 1 was equipped with the one side of second test slot 12 is closed to second face lid 3 lid, thereby make the chip always be connected with survey test panel 4 electricity.

The first test slot 11 and the second test slot 12 are arranged on the base 1, and the testing efficiency is improved through improvement of loading quantity and convenience of testing when the chip is tested.

For example, when the first test slot 11 is filled with chips and the first test slot 11 has no empty position, the chips can be assembled in the second test slot 12, but when the chips are assembled in the second test slot 12, the side of the base 1 provided with the first test slot 11 is covered by the first face cover 2 to prevent the assembled chips from falling; when the second test slot 12 is filled with chips, the second face cover 3 covers one face of the base 1, which is provided with the second test slot 12, and the chip test fixture can load and test a plurality of chips on the test board 4 at one time through the arrangement.

The connection mode of the first panel 2 and the base 1 can be various, and can be a rotary connection or a sliding connection, but the first panel 2 can move relative to the base 1; the connection mode of the second cover 3 and the base 1 can be various, can be a rotary connection, can be a sliding connection, but the second cover 3 can move relative to the base 1; after fixing the chip on testing board 4, testing board 4 can be directly used for testing the chip, also can test board 4 and chip and form a whole and insert test host computer and test, and its main purpose is exactly in order to let chip and testing board 4 electricity connect to can extract the information in the chip and analyze or test the performance of chip.

In some embodiments, referring to fig. 1, the base 1 comprises:

the first mounting plate 13, the first test slot 11 is opened in the first mounting plate 13;

and a second mounting plate 14 stacked on and connected to the first mounting plate 13, and the second test slot 12 is opened in the second mounting plate 14.

In this embodiment, the two sides of the chassis 1 are respectively provided with a first test slot 11 and a second test slot 12, the first test slot 11 is located on one side of the chassis 1, the second test slot 12 is located on one side of the chassis 1, the second test slot 14 is located on one side of the chassis, and the first mounting plate 13 and the second mounting plate 14 are combined into the chassis 1 in a stacking manner.

The stacked fixing manner may be a screw connection or a snap connection, but the first mounting plate 13 and the second mounting plate 14 are detachably connected, and after the first mounting plate 13 and the second mounting plate 14 are connected, the first mounting plate 13 and the second mounting plate 14 are kept fixed while the connection state is maintained.

Because the first surface cover 2 covers one surface of the base 1 on which the first test slot 11 is arranged, and the first test slot 11 is arranged on the first mounting plate 13, the first surface cover 2 can cover the first mounting plate 13; because what the second face lid 3 covered is be equipped with the one side of second test groove 12 on the base 1, and second test groove 12 set up with second mounting panel 14 on, so second face lid 3 can cover second mounting panel 14.

In some embodiments, referring to fig. 1, an accommodating space is formed between the first mounting plate 13 and the second mounting plate 14, the accommodating space is respectively communicated with the first test slot 11 and the second test slot 12, and the test board 4 is inserted into the accommodating space.

In the present embodiment, after the first mounting plate 13 and the second mounting plate 14 are connected in a stacked manner, a space is left between the first mounting plate and the second mounting plate, and the space is referred to as an accommodating space.

The test board 4 can be inserted into the accommodating space, the first mounting plate 13 and the second mounting plate 14 can abut against the test board 4, one surface of the test board 4 can be exposed out of the chip test fixture through the bottom of the first test slot 11, and when the first test slot 11 is covered by the first surface cover 2, the part of the test board 4 exposed out through the first test slot 11 can be covered by the first surface cover 2; the other side of the test board 4 is exposed outside the chip test fixture through the bottom of the second test slot 12, and when the second face cover 3 covers the second test slot 12, the part of the test board 4 exposed outside through the second test slot 12 is covered by the second face cover 3; the containing space only comprises a part of the test board 4, so that a part of the test board 4 is exposed outside the chip test fixture.

In some embodiments, referring to fig. 4-5, the test plate 4 comprises:

PCBA board;

a first test contact 41 electrically connected to one surface of the PCBA board;

a second test contact 42 electrically connected to the other opposite face of the PCBA board;

the first test contact 41 is located in the first test slot 11, and the second test contact 42 is located in the second test slot 12.

In this embodiment, the testing board 4 includes a PCBA board, and a first testing contact 41 and a second testing contact 42 disposed on the PCBA board, where one side of the PCBA board including the first testing contact 41 abuts against the first mounting board 13, the first testing contact 41 and the second testing contact 42 may be electrically connected to the same type of chip, or may be electrically connected to different types of chips, but the chips tested by the side of the PCBA board on which the first testing contact 41 is disposed are of the same type, the chips tested by the side of the PCBA board on which the second testing contact 42 is disposed are of the same type, the chips may be electrically connected to the first testing contact 41 when mounted in the first testing slot 11, and the chips may be electrically connected to the second testing contact 42 when mounted in the second testing slot 12.

The first test contacts 41 can be located anywhere on the PCBA board, and the corresponding first test slots 11 can be located anywhere on the first mounting plate 13, but the first test slots 11 always correspond to the first test contacts 41; the second test contacts 42 can be anywhere on the PCBA board, and the corresponding second test slot 12 can be located anywhere on the second mounting plate 14, but the second test slot 12 always corresponds to the second test contacts 42.

In some embodiments, referring to fig. 1 and 2, the chip test fixture further includes:

the first mounting groove 131 is formed in the first mounting plate 13 or the second mounting plate 14 and communicated with the accommodating space;

and a leakage protector 5 disposed in the first mounting groove 131 and electrically connected to the PCBA board.

In this embodiment, the first mounting plate 13 is provided with a first mounting groove 131 or the second mounting plate 14 is provided with a first mounting groove 131; the earth leakage protection device 5 is electrically connected with the test board 4 through the first mounting groove 131, in the middle of the circuit, fire or equipment burnout accidents caused by electric leakage can occur in the electricity utilization process, so the earth leakage protection device 5 is needed to protect the circuit, and the earth leakage protection device 5 can be an earth leakage breaker or an earth leakage alarm, and the earth leakage protection device 5 can prevent the electric leakage and further harm to the equipment.

In some embodiments, referring to fig. 2, the chip testing jig further includes:

the first limiting frame 15 is installed in the first test slot 11, the first limiting frame 15 is provided with a plurality of first limiting grooves 151, and each first limiting groove 151 is matched with the chip to be tested.

In this embodiment, the first limiting frame 15 is installed in the first test slot 11, and the first test slot 11 and the first limiting frame 15 are just adapted in size, and because the first test slot 11 is opened on the first mounting plate 13, the first limiting frame 15 and the first mounting plate 13 installed in the first test slot 11 are fixedly connected into a whole, but the first mounting plate 13 and the first limiting frame 15 can be detached.

A first limiting groove 151 is formed in the first limiting frame 15, the first limiting groove 151 is used for placing a chip, the chip is placed in the first limiting groove 151, and the chip is electrically connected with the test board 4; the number of the first limiting grooves 151 is multiple, each first limiting groove 151 is formed in the first limiting frame 15, each first limiting groove 151 can be matched with a chip, and the matching refers to that when the chip is placed in the first limiting groove 151, the chip can be fixed, and the situation of left-right shaking cannot occur; the effect of first spacing frame 15 is, when the chip of different models is tested in needs, need not to change whole first mounting panel 13, only need to survey test panel 4 and first spacing frame 15 change can.

In some embodiments, referring to fig. 3, the chip testing jig further includes:

the second limiting frame 16 is installed in the second test slot 12, the second limiting frame 16 has a plurality of second limiting grooves, and each second limiting groove 161 is adapted to the chip to be tested.

In this embodiment, the second limiting frame 16 is installed in the second test slot 12, the second test slot 12 and the second limiting frame 16 are just matched in size, and because the second test slot 12 is opened on the second mounting plate 14, the second limiting frame 16 installed in the second test slot 12 and the second mounting plate 14 are fixedly connected into a whole, but the second mounting plate 14 and the second limiting frame 16 can be detached.

A second limiting groove 161 is formed in the second limiting frame 16, the second limiting groove 161 is used for placing a chip, the chip is placed in the second limiting groove 161, and the chip is electrically connected with the test board 4; a plurality of second limiting grooves 161 are arranged, each second limiting groove 161 is arranged in the second limiting frame 16, each second limiting groove 161 can be matched with a chip, and the matching refers to that when the chip is placed in the second limiting groove 161, the chip can be fixed, and the situation of left-right shaking cannot occur; the effect of the second limiting frame 16 is that when the chips of different models are required to be tested, the whole second mounting plate 14 does not need to be replaced, and only the test plate 4 and the second positioning frame need to be replaced.

In some embodiments, referring to fig. 2 and 3, the chip test fixture further includes:

the first limiting frame 15 is installed in the first test slot 11, the first limiting frame 15 is provided with a plurality of first limiting grooves 151, and each first limiting groove 151 is matched with the chip to be tested; the second limiting frame 16 is installed in the second test slot 12, the second limiting frame 16 has a plurality of second limiting grooves, and each second limiting groove 161 is adapted to the chip to be tested.

In this embodiment, the first limiting frame 15 is installed in the first test slot 11, the first test slot 11 and the first limiting frame 15 are just matched in size, and because the first test slot 11 is opened on the first mounting plate 13, the first limiting frame 15 installed in the first test slot 11 and the first mounting plate 13 are fixedly connected into a whole, but the first mounting plate 13 and the first limiting frame 15 can be detached; a first limiting groove 151 is formed in the first limiting frame 15, the first limiting groove 151 is used for placing a chip, the chip is placed in the first limiting groove 151, and the chip is electrically connected with the test board 4; the number of the first limiting grooves 151 is multiple, each first limiting groove 151 is formed in the first limiting frame 15, each first limiting groove 151 can be matched with a chip, and the matching refers to that when the chip is placed in the first limiting groove 151, the chip can be fixed, and the situation of left-right shaking cannot occur; the effect of first spacing frame 15 is, when testing the chip of different models in needs, need not to change whole first mounting panel 13, only need will survey test panel 4 and first spacing frame 15 change can.

The second limiting frame 16 is installed in the second test slot 12, the size of the second test slot 12 is just matched with that of the second limiting frame 16, and because the second test slot 12 is arranged on the second mounting plate 14, the second limiting frame 16 installed in the second test slot 12 and the second mounting plate 14 are fixedly connected into a whole, but the second mounting plate 14 and the second limiting frame 16 can be detached; a second limiting groove 161 is formed in the second limiting frame 16, the second limiting groove 161 is used for placing a chip, the chip is placed in the second limiting groove 161, and the chip is electrically connected with the test board 4; a plurality of second limiting grooves 161 are arranged, each second limiting groove 161 is arranged in the second limiting frame 16, each second limiting groove 161 can be matched with a chip, and the matching refers to that when the chip is placed in the second limiting groove 161, the chip can be fixed, and the situation of left-right shaking cannot occur; the effect of the second limiting frame 16 is that when chips of different models need to be tested, the whole second mounting plate 14 does not need to be replaced, and only the test plate 4 and the second positioning frame need to be replaced.

In some embodiments, referring to fig. 1, the chip testing jig further includes:

first buckle 6 is established on first face lid 2, is equipped with first draw-in groove 132 on the first mounting panel 13 for with the cooperation of first buckle 6 looks joint, first buckle 6 and first face lid 2 can be swing joint, also can be fixed connection.

In this embodiment, the first buckle 6 is disposed on the first surface cover 2, the first locking groove 132 is disposed on the first mounting plate 13, and the first buckle 6 and the first locking groove 132 are engaged with each other; because the first pressing member 21 presses the chip in the first position-limiting groove 151 when the first cover 2 covers the first mounting plate 13, but because the chip is electrically connected to the test plate 4 at any time during testing, if the chip is separated from the test plate 4 during testing, data loss may occur, which is why the prior art uses manual welding to fix the chip on the test plate 4; therefore, in order to fix the chip on the test board 4 for a long time, the first surface cover 2 needs to keep a covering state with the first mounting plate 13, so that the first pressing member 21 always presses the chip during the test, but without the external force, the first surface cover 2 and the first mounting plate 13 may cause the first pressing member 21 to be separated from the first limiting groove 151 along with factors such as shaking, and the chip cannot be pressed and held, so that the chip is separated from the test board 4 and cannot be electrically connected with the test board 4; be equipped with first buckle 6 on first face lid 2, so when first face lid 2 is in the activity, first buckle 6 can be along with the activity of first face lid 2 is movable together, when first face lid 2 lid closes first mounting panel 13, first buckle 6 can with first draw-in groove 132 joint to first buckle 6 is with first face lid 2 lock always on first mounting panel 13, makes first face lid 2 and first mounting panel 13 be in the lid and closes the state.

In some embodiments, referring to fig. 1, the chip testing jig further includes:

the second buckle 7 is arranged on the second face cover 3, and the second mounting plate 14 is provided with a second clamping groove 141 for clamping and matching with the first buckle 6.

In this embodiment, the second buckle 7 is disposed on the second panel 3, the second slot 141 is disposed on the second mounting plate 14, the second buckle 7 and the second slot 141 are in clamping fit, and the second buckle 7 and the second panel 3 may be movably connected or fixedly connected; because the second holding member 31 holds the chip in the second position-limiting groove 161 when the second cover 3 covers the second mounting plate 14, but because the chip is electrically connected to the test plate 4 at any time during testing, if the chip is separated from the test plate 4 during testing, data loss may occur, which is why the prior art uses manual welding to fix the chip on the test plate 4; therefore, in order to fix the chip on the test board 4 for a long time, the second surface cover 3 needs to keep a covering state with the second mounting plate 14, so that the second pressing member 31 always presses the chip during the test, but without the external force, the second surface cover 3 and the second mounting plate 14 may cause the second pressing member 31 to disengage from the second limiting groove 161 along with factors such as shaking, and the chip cannot be pressed, so that the chip is disengaged from the test board 4 and cannot be electrically connected with the test board 4; be equipped with second buckle 7 on the second face lid 3, so when second face lid 3 is in the activity, second buckle 7 can play the activity along with second face lid 3 activity two, when second face lid 3 lid closes second mounting panel 14, second buckle 7 can with second draw-in groove 141 joint, and second draw-in groove 141 establishes on second mounting panel 14 to second buckle 7 is with first face lid 2 lock always on second mounting panel 14, makes second face lid 3 and second mounting panel 14 be in the lid and closes the state.

In some embodiments, referring to fig. 1, the chip testing jig further includes:

the first buckle 6 is arranged on the first face cover 2, and the first mounting plate 13 is provided with a first clamping groove 132 which is used for clamping and matching with the first buckle 6; the second buckle 7 is arranged on the second face cover 3, and the second mounting plate 14 is provided with a second clamping groove 141 for clamping and matching with the first buckle 6.

In this embodiment, the first buckle 6 is disposed on the first surface cover 2, the first locking groove 132 is disposed on the first mounting plate 13, the first buckle 6 and the first locking groove 132 are in locking fit, and the first buckle 6 and the first surface cover 2 may be movably connected or fixedly connected; because the first pressing member 21 presses the chip in the first position-limiting groove 151 when the first cover 2 covers the first mounting plate 13, but because the chip is electrically connected to the test plate 4 at any time during testing, if the chip is separated from the test plate 4 during testing, data loss may occur, which is why the prior art uses manual welding to fix the chip on the test plate 4; therefore, in order to fix the chip on the test board 4 for a long time, the first surface cover 2 needs to keep a covering state with the first mounting plate 13, so that the first pressing member 21 always presses the chip during the test, but without the external force, the first surface cover 2 and the first mounting plate 13 may cause the first pressing member 21 to be separated from the first limiting groove 151 along with factors such as shaking, and the chip cannot be pressed and held, so that the chip is separated from the test board 4 and cannot be electrically connected with the test board 4; be equipped with first buckle 6 on first face lid 2, so when first face lid 2 in the activity, first buckle 6 can be along with the activity of first face lid 2 is movable together, when 2 lids of first face lid close first mounting panel 13, first buckle 6 can with first draw-in groove 132 joint to first buckle 6 with 2 locks of first face lid on first mounting panel 13 always, make first face lid 2 and first mounting panel 13 be in the lid and close the state.

The second buckle 7 is arranged on the second face cover 3, the second clamping groove 141 is formed in the second mounting plate 14, the second buckle 7 is in clamping fit with the second clamping groove 141, and the second buckle 7 and the second face cover 3 can be movably connected or fixedly connected; because the second pressing member 31 presses the chip in the second limiting groove 161 when the second cover 3 covers the second mounting plate 14, but because the chip is electrically connected to the test board 4 at any time during testing, if the chip is separated from the test board 4 during testing, data loss may occur, which is why the chip is fixed on the test board 4 by manual welding in the prior art; therefore, in order to fix the chip on the test board 4 for a long time, the second surface cover 3 needs to keep a covering state with the second mounting plate 14, so that the second pressing member 31 always presses the chip during the test, but without the external force, the second surface cover 3 and the second mounting plate 14 may cause the second pressing member 31 to disengage from the second limiting groove 161 along with factors such as shaking, and the chip cannot be pressed, so that the chip is disengaged from the test board 4 and cannot be electrically connected with the test board 4; be equipped with second buckle 7 on the second face lid 3, so when second face lid 3 is in the activity, second buckle 7 can play the activity along with second face lid 3 activity two, when second face lid 3 lid closes second mounting panel 14, second buckle 7 can with second draw-in groove 141 joint, and second draw-in groove 141 establishes on second mounting panel 14 to second buckle 7 is with first face lid 2 lock always on second mounting panel 14, makes second face lid 3 and second mounting panel 14 be in the lid and closes the state.

In some embodiments, referring to fig. 1 and 2, the first cover 2 is provided with a second mounting groove 22, the first buckle 6 is mounted in the second mounting groove 22, and two ends of the first buckle 6 are rotatably connected with two inner side walls of the second mounting groove 22, respectively.

In this embodiment, the first surface cover 2 is provided with a second mounting groove 22, the first buckle 6 is mounted in the second mounting groove 22, and two sides of the inner wall of the second mounting groove 22 are respectively rotatably connected with two ends of the first buckle 6; the two ends that first buckle 6 and second mounting groove 22 rotate to be connected are one side, and the opposite side can with first draw-in groove 132 joint, when first buckle 6 and first draw-in groove 132 joint, only need through the one side of rotating first buckle 6, just can make 6 opposite sides of first buckle and first draw-in groove 132 separation.

In some embodiments, referring to fig. 1 and 3, the second cover 3 is provided with a third mounting groove 32, the second buckle 7 is mounted in the third mounting groove 32, and two ends of the second buckle 7 are rotatably connected to two inner side walls of the third mounting groove 32, respectively.

In this embodiment, the second face cover 3 is provided with the second mounting groove 22, the second buckle 7 is mounted in the third mounting groove 32, and two sides of the inner wall of the third mounting groove 32 are respectively rotatably connected with two ends of the second buckle 7; the two ends of the second buckle 7 rotatably connected with the third mounting groove 32 are on one side, and the other side can be connected with the second clamping groove 141 in a clamped manner, so that when the second buckle 7 is connected with the second clamping groove 141 in a clamped manner, the other side of the second buckle 7 can be separated from the second clamping groove 141 only by rotating one side of the second buckle 7.

In some embodiments, referring to fig. 1 and 3, the first surface cover 2 is provided with a second mounting groove 22, the first buckle 6 is mounted in the second mounting groove 22, and two ends of the first buckle 6 are respectively rotatably connected with two inner side walls of the second mounting groove 22; the second face cover 3 is provided with a third mounting groove 32, the second buckle 7 is mounted in the third mounting groove 32, and two ends of the second buckle 7 are respectively connected with two inner side walls of the third mounting groove 32 in a rotating manner.

In this embodiment, the first surface cover 2 is provided with a second mounting groove 22, the first buckle 6 is mounted in the second mounting groove 22, and two sides of the inner wall of the second mounting groove 22 are respectively rotatably connected with two ends of the first buckle 6; the two ends of the first buckle 6 rotatably connected with the second mounting groove 22 are one side, the other side is clamped with the first clamping groove 132, when the first buckle 6 is clamped with the first clamping groove 132, the other side of the first buckle 6 can be separated from the first clamping groove 132 only by rotating one side of the first buckle 6;

the second face cover 3 is provided with a second mounting groove 22, the second buckle 7 can be mounted in a third mounting groove 32, and two sides of the inner wall of the third mounting groove 32 can be respectively and rotatably connected with two ends of the second buckle 7; the both ends that second buckle 7 and third mounting groove 32 rotate to be connected are one side, and the opposite side can with second draw-in groove 141 joint, when second buckle 7 and second draw-in groove 141 joint, only need through the one side of rotating second buckle 7, just can make second buckle 7 opposite side and second draw-in groove 141 separation.

In some embodiments, referring to fig. 1, the first catch 6 is located on a side of the first face cover 2 facing the first test slot 11.

In this embodiment, the first buckle 6 and the first pressing member 21 are located on the same surface of the first surface cover 2, the first buckle 6 and the first pressing member 21 are disposed on the same surface, so that the occupied space of the chip testing apparatus can be reduced, the first buckle 6 and the first pressing member 21 are both embedded into the first mounting plate 13, the first buckle 6 is clamped with the first clamping groove 132, and the first pressing member 21 corresponds to the first limiting groove 151.

In some embodiments, referring to fig. 1, the second catch 7 is located on a side of the second face cover 3 facing the second test slot 12.

In this embodiment, the second buckle 7 and the second pressing member 31 are located on the same surface of the second surface cover 3, the second buckle 7 and the second pressing member 31 are disposed on the same surface, so that the occupied space of the chip testing apparatus can be reduced, the second buckle 7 and the second pressing member 31 are both embedded into the second mounting plate 14, the second buckle 7 is clamped with the second clamping groove 141, and the second pressing member 31 corresponds to the second limiting groove 161.

In some embodiments, referring to fig. 1, the first catch 6 is located on a side of the first face cover 2 facing the first test slot 11; the second catch 7 is located on the side of the second face cover 3 facing the second test slot 12.

In this embodiment, the first buckle 6 and the first pressing member 21 are located on the same surface of the first surface cover 2, the first buckle 6 and the first pressing member 21 are disposed on the same surface, so that the occupied space of the chip testing apparatus can be reduced, the first buckle 6 and the first pressing member 21 are both embedded into the first mounting plate 13, the first buckle 6 is clamped with the first clamping groove 132, and the first pressing member 21 corresponds to the first limiting groove 151.

The second buckle 7 and the second pressing piece 31 are located on the same face of the second face cover 3, the second buckle 7 and the second pressing piece 31 are arranged on the same face, occupied space of the chip testing jig can be reduced, the second buckle 7 and the second pressing piece 31 can be embedded into the second mounting plate 14, the second buckle 7 can be clamped with the second clamping groove 141, and the second pressing piece 31 can correspond to the second limiting groove 161.

In some embodiments, referring to fig. 1, the first surface cover 2 includes a plurality of first pressing members 21, the plurality of first pressing members 21 are disposed on one first surface cover 2 at intervals, and each first pressing member 21 corresponds to one first limiting groove 151.

In this embodiment, the first face covers 2 include a plurality of, each first face cover 2 includes a plurality of first pressing members 21, the first pressing members 21 on the first face cover 2 correspond to the first limiting grooves 151 on the first mounting plate 13, because the first face cover 2 also includes a plurality of, the first mounting plate 13 can be movably connected to the plurality of first face covers 2, one first face cover 2 only covers the plurality of first limiting grooves 151, and one first face cover 2 cannot cover all the first limiting grooves 151 on the face cover; however, a plurality of first covers 2 may be connected and combined together, so that the number of the first stopper grooves 151 covered is increased.

In some embodiments, referring to fig. 1, the second face cover 3 includes a plurality of second pressing members 31, the plurality of second pressing members 31 are disposed on one second face cover 3 at intervals, and each second pressing member 31 corresponds to one second limiting groove 161.

In this embodiment, the second face cover 3 includes a plurality of second face covers 3, each second face cover 3 includes a plurality of second pressing members 31, the second pressing members 31 on the second face cover 3 correspond to the second limiting grooves 161 on the second mounting plate 14, because the second face cover 3 also includes a plurality of second face covers, the second mounting plate 14 is movably connected to the plurality of second face covers 3, one second face cover 3 only covers the plurality of second limiting grooves 161, and one second face cover 3 cannot cover all the second limiting grooves 161 on the face cover; however, a plurality of second covers 3 may be connected and combined together, so that the number of the covered second limiting grooves 161 is increased.

In some embodiments, referring to fig. 1, the first face cover 2 includes a plurality of first pressing members 21, the plurality of first pressing members 21 are disposed on one first face cover 2 at intervals, and each first pressing member 21 corresponds to one first limiting groove 151; the second face cover 3 comprises a plurality of second pressing pieces 31, the plurality of second pressing pieces 31 are arranged on the second face cover 3 at intervals, and each second pressing piece 31 corresponds to one second limiting groove 161.

In this embodiment, the first face covers 2 include a plurality of, each first face cover 2 includes a plurality of first pressing members 21, the first pressing members 21 on the first face cover 2 correspond to the first limiting grooves 151 on the first mounting plate 13, because the first face cover 2 also includes a plurality of, the first mounting plate 13 can be movably connected to the plurality of first face covers 2, one first face cover 2 only covers the plurality of first limiting grooves 151, and one first face cover 2 cannot cover all the first limiting grooves 151 on the face cover; however, a plurality of first covers 2 may be connected and combined together, so that the number of the first limiting grooves 151 covered is increased.

The second face cover 3 comprises a plurality of second face covers, each second face cover 3 comprises a plurality of second pressing and holding pieces 31, and the second pressing and holding pieces 31 on the second face cover 3 correspond to the second limiting grooves 161 on the second mounting plate 14; because the second face cover 3 also comprises a plurality of second face covers, the second mounting plate 14 can be movably connected with a plurality of second face covers 3, one second face cover 3 only covers a plurality of second limiting grooves 161, and one second face cover 3 can not cover all the second limiting grooves 161 on the face cover; however, a plurality of second covers 3 may be connected and combined together, so that the number of the covered second limiting grooves 161 is increased.

Various embodiments or examples and features of various embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

The above is only the part or the preferred embodiment of the present invention, no matter the characters or the drawings can not limit the protection scope of the present invention, all under the whole concept of the present invention, the equivalent structure transformation performed by the contents of the specification and the drawings is utilized, or the direct/indirect application in other related technical fields is included in the protection scope of the present invention.

Claims (10)

1. A chip testing jig is characterized by comprising a base, a first face cover, a second face cover and a testing board, wherein the first face cover and the second face cover are respectively positioned on two sides of the base and movably connected with the base; wherein the content of the first and second substances,

the two opposite surfaces of the base are respectively provided with a first test slot and a second test slot, and the first test slot and the second test slot are used for accommodating chips to be tested;

a first pressing piece is arranged on one side, facing the first test slot, of the first face cover in a protruding mode, and a second pressing piece is arranged on one side, facing the second test slot, of the second face cover in a protruding mode;

the test board is mounted on the base, is at least partially located in the first test slot and the second test slot, and is used for being in contact with and electrically connected with chips placed in the first test slot and the second test slot.

2. The chip testing jig according to claim 1, wherein the base includes:

the first mounting plate is provided with the first test slot;

and the second mounting plate is stacked and connected with the first mounting plate, and the second test slot is arranged on the second mounting plate.

3. The chip testing jig according to claim 2, wherein an accommodating space is formed between the first mounting plate and the second mounting plate, the accommodating space is respectively communicated with the first test slot and the second test slot, and the test board is inserted into the accommodating space.

4. The chip testing fixture of claim 3, wherein the testing board comprises:

PCBA board;

the first test contact is electrically connected to one surface of the PCBA board;

a second test contact electrically connected to the other opposite face of the PCBA board;

wherein the first test contact is located within the first test slot and the second test contact is located within the second test slot.

5. The chip testing fixture of claim 4, further comprising:

the first mounting groove is formed in the first mounting plate or the second mounting plate and communicated with the accommodating space;

and the leakage protection device is arranged in the mounting groove and electrically connected with the PCBA.

6. The chip testing jig of claim 2, further comprising:

the first limiting frame is installed in the first test groove and provided with a plurality of first limiting grooves, and each first limiting groove is matched with a chip to be tested; and/or the presence of a gas in the gas,

and the second limiting frame is arranged in the second test slot and provided with a plurality of second limiting grooves, and each second limiting groove is matched with the chip to be tested.

7. The chip testing jig according to claim 2, further comprising:

the first buckle is arranged on the first face cover, and a first clamping groove is formed in the first mounting plate and is used for being clamped and matched with the first buckle; and/or the presence of a gas in the atmosphere,

and the second buckle is arranged on the second face cover, and a second clamping groove is formed in the second mounting plate and used for being matched with the first buckle in a clamping manner.

8. The chip testing fixture of claim 7,

the first face cover is provided with a second mounting groove, the first buckle is mounted in the second mounting groove, and two ends of the first buckle are respectively in rotating connection with two inner side walls of the second mounting groove; and/or the presence of a gas in the gas,

the second face cover is provided with a third mounting groove, the second buckle is mounted in the third mounting groove, and two ends of the second buckle are respectively rotatably connected with two inner side walls of the third mounting groove.

9. The chip testing fixture of claim 7,

the first buckle is positioned on one surface, facing the first test slot, of the first face cover;

and/or the second buckle is positioned on one surface of the second face cover facing the second test slot.

10. The chip testing fixture of claim 6,

the first face cover comprises a plurality of first pressing and holding pieces, the first pressing and holding pieces comprise a plurality of first pressing and holding pieces, the first pressing and holding pieces are arranged on one first face cover at intervals, and each first pressing and holding piece corresponds to one first limiting groove;

and/or the second face cover comprises a plurality of second pressing and holding pieces, the second pressing and holding pieces comprise a plurality of second pressing and holding pieces, the second pressing and holding pieces are arranged on one second face cover at intervals, and each second pressing and holding piece corresponds to one second limiting groove.

Images