CN218848248U - Be suitable for testing arrangement of looped netowrk cabinet secondary module - Google Patents
Be suitable for testing arrangement of looped netowrk cabinet secondary module Download PDFInfo
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- CN218848248U CN218848248U CN202222873735.8U CN202222873735U CN218848248U CN 218848248 U CN218848248 U CN 218848248U CN 202222873735 U CN202222873735 U CN 202222873735U CN 218848248 U CN218848248 U CN 218848248U
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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Abstract
The utility model relates to an electrical engineering technical field especially indicates a be suitable for testing arrangement of looped netowrk cabinet secondary module, include: the circuit comprises a printed circuit board, a current testing unit, a voltage testing unit and a control circuit disconnection testing unit, wherein the printed circuit board is provided with the current testing unit, the voltage testing unit and the control circuit disconnection testing unit, and the current testing unit is used for testing the current of a secondary module; the voltage testing unit is used for voltage testing and second pulse testing of the secondary module; the control loop disconnection testing unit is used for the disconnection testing of the secondary module; and a first row of terminals and a second row of terminals are arranged on two sides of the printed circuit board, and the secondary module is connected with the first row of terminals and the second row of terminals. The utility model discloses carry out the on-the-spot simulation test to looped netowrk cabinet secondary mould before dispatching from the factory, the wrong direction of quick location looped netowrk cabinet secondary module makes things convenient for the debugging of looped netowrk cabinet secondary module.
Description
Technical Field
The utility model relates to an electrical engineering technical field especially indicates a be suitable for testing arrangement of looped netowrk cabinet secondary module.
Background
The ring main unit secondary module is a low-voltage electrical secondary device which is required for monitoring, controlling, adjusting and protecting the work of primary equipment and providing operation conditions or production command signals for operation and maintenance personnel. The looped netowrk cabinet secondary module gathers the operation module of the electric secondary equipment that all operation circuits put together, and the power supply trunk forms a closed annular trunk promptly, and power supply supplies power to the annular trunk, and from the trunk again all the way ground through high tension switchgear to the external distribution. Generally, a ring main unit secondary module is provided with a left annular main line and a right annular main line, and each power distribution branch of the ring main unit secondary module can be used for getting power from the left annular main line and the right annular main line.
However, the whole ring main network relates to numerous users, the field test during the operation of the secondary module of the ring main unit is not feasible, the hidden trouble of equipment failure is caused if the secondary module of the ring main unit is not tested, but at present, no related technical equipment for carrying out the field simulation test before the secondary module of the ring main unit leaves a factory exists.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem of the on-the-spot simulation test before the looped netowrk cabinet secondary module dispatches from the factory among the prior art, the utility model discloses an embodiment provides a testing arrangement who is suitable for looped netowrk cabinet secondary module, testing arrangement includes:
a printed circuit board, on which a current test unit, a voltage test unit and a control circuit disconnection test unit are arranged,
the current testing unit is used for testing the current of the secondary module; the voltage testing unit is used for testing the voltage of the secondary module and testing the pulse per second; the control circuit disconnection testing unit is used for the disconnection test of the secondary module;
and a first row of terminals and a second row of terminals are arranged on two sides of the printed circuit board, and the secondary module is connected with the first row of terminals and the second row of terminals.
In a preferred embodiment, the current testing unit includes a plurality of current testing switches of an array, and a plurality of current testing resistors and a plurality of current testing indicator lamps corresponding to the plurality of current testing switches, for testing different currents of the secondary module.
In a preferred embodiment, each current test switch of a plurality of the current test switches is connected in series with a corresponding current test resistor and a current test indicator lamp,
and each current test switch is connected with the first row of terminals, and each current test indicator lamp is connected with the second row of terminals.
In a preferred embodiment, the voltage testing unit includes a plurality of voltage testing switches of an array, and a plurality of voltage testing resistors and a plurality of voltage testing indicator lamps corresponding to the plurality of voltage testing switches, for testing different voltages of the secondary module.
In a preferred embodiment, each voltage test switch of a plurality of the voltage test switches is connected in series with a corresponding voltage test resistor and a voltage test indicator lamp,
and each voltage test switch is connected with the first row of terminals, and each voltage test indicator lamp is connected with the second row of terminals.
In a preferred embodiment, the voltage testing unit further includes a plurality of pulse-per-second testing switches of the array, and a plurality of pulse-per-second testing resistors and a plurality of pulse-per-second testing indicator lamps corresponding to the plurality of pulse-per-second testing switches, for testing different pulse-per-second of the secondary module.
In a preferred embodiment, each second pulse test switch of a plurality of second pulse test switches is connected with a corresponding second pulse test resistor and a second pulse test indicator lamp in series,
and each pulse per second test switch is connected with the first row of terminals, and each pulse per second test indicator lamp is connected with the second row of terminals.
In a preferred embodiment, the control circuit disconnection testing unit includes a closing disconnection switch, an opening disconnection switch, a control circuit disconnection testing resistor and a control circuit disconnection testing indicator light, and is used for the disconnection testing of the secondary module.
In a preferred embodiment, the closing disconnection switch is connected in series with the control loop disconnection test resistor and the control loop disconnection test indicator lamp;
the opening and breaking switch is connected in series with the control loop disconnection testing resistor and the control loop disconnection testing indicator lamp;
and the closing disconnection switch and the opening disconnection switch are respectively connected with a first row of terminals, and the control loop disconnection test indicator lamp is connected with a second row of terminals.
In a preferred embodiment, the printed circuit board is further provided with an energy storage testing unit for energy storage testing of the secondary module;
wherein the energy storage test unit comprises an energy storage test switch, an energy storage test resistor and an energy storage test indicator lamp,
the energy storage test switch is connected with the energy storage test resistor and the energy storage test indicating lamp in series, the energy storage test switch is connected with the first row of terminals, and the energy storage test indicating lamp is connected with the second row of terminals.
The embodiment of the utility model provides a beneficial effect that technical scheme brought includes at least:
the utility model provides a be suitable for testing arrangement of looped netowrk cabinet secondary module carries out the on-the-spot simulation test to looped netowrk cabinet secondary module before dispatching from the factory, fixes a position the wrong direction of looped netowrk cabinet secondary module fast, makes things convenient for the debugging of looped netowrk cabinet secondary module.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic diagram of an overall structure of a testing apparatus suitable for a ring main unit secondary module according to an embodiment of the present invention.
Fig. 2 is a schematic structural diagram of a current testing unit of a testing device suitable for a ring main unit secondary module according to an embodiment of the present invention.
Fig. 3 is a schematic structural diagram of a voltage testing unit of a testing device suitable for a ring main unit secondary module according to an embodiment of the present invention.
Fig. 4 is a schematic structural diagram of a control circuit disconnection testing unit of a testing apparatus suitable for a ring main unit secondary module according to an embodiment of the present invention.
Fig. 5 is a schematic structural diagram of an energy storage testing unit of a testing apparatus suitable for a ring main unit secondary module according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
The terms "first," "second," "third," "fourth," and the like in the description and in the claims, as well as in the drawings, if any, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are, for example, capable of operation in sequences other than those illustrated or otherwise described herein. Moreover, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
As shown in fig. 1 the utility model discloses an embodiment one kind is suitable for looped netowrk cabinet secondary module's testing arrangement's overall structure schematic diagram, according to the utility model discloses an embodiment, a testing arrangement suitable for looped netowrk cabinet secondary module includes printed circuit board 1.
A current test unit 11, a voltage test unit 12, a control loop disconnection test unit 13 and an energy storage test unit 14 are arranged on the printed circuit board 1. And the current test unit 11 is used for testing the current of the secondary module. And the voltage test unit 12 is used for voltage test and second pulse test of the secondary module. And the control circuit disconnection testing unit 13 is used for the disconnection test of the secondary module. And the energy storage testing unit 14 is used for energy storage testing of the secondary module.
According to the utility model discloses an embodiment still sets up separating brake switch 16 and combined floodgate switch 17 on the printed circuit board 1, and separating brake switch 16 and combined floodgate switch 17 are connected to looped netowrk cabinet secondary module through the wiring respectively for the circuit breaker separating brake and the combined floodgate of control looped netowrk cabinet secondary module. In some preferred embodiments, the opening switch 16 and the closing switch 17 are push-button switches.
A first row of terminals 18 and a second row of terminals 19 are arranged on both sides of the printed circuit board 1, and the secondary module is connected through the first row of terminals 18 and the second row of terminals 19. In a specific embodiment, the first row of terminals 18 and the second row of terminals 19 are fixed on the printed circuit board 1 by screws, and the first row of terminals 18 and the second row of terminals 19 are respectively connected with the secondary module of the ring main unit by connecting wires.
In a further embodiment, a power module 15 is further disposed on the printed circuit board 1 for supplying power to the current test unit 11, the voltage test unit 12, the control circuit disconnection test unit 13 and the energy storage test unit 14 integrated on the printed circuit board 1.
As shown in fig. 2 the utility model discloses an embodiment one kind is suitable for looped netowrk cabinet secondary module's testing arrangement's current test unit's structural schematic diagram, according to the utility model discloses an embodiment, current test unit 11 includes a plurality of current test switch of array to and a plurality of current test resistance and a plurality of current test pilot lamp that correspond with a plurality of current test switch for test secondary module's different electric currents.
In a specific embodiment, the current testing unit 11 includes a first current testing switch 1101, a first current testing resistor 1109 corresponding to the first current testing switch 1101, and a first current testing indicator 1117, and is configured to test IA + (a-phase current +) current of the secondary module of the ring main unit.
The current testing unit 11 further includes a second current testing switch 1102, a second current testing resistor 1110 corresponding to the second current testing switch 1102, and a second current testing indicator 1118, and is configured to test the IA- (a-phase current-) current of the secondary module of the ring main unit.
The current testing unit 11 further includes a third current testing switch 1103, a third current testing resistor 1111 corresponding to the third current testing switch 1103, and a third current testing indicator 1119, and is configured to test an IB + (phase B current +) current of the ring main unit secondary module.
The current testing unit 11 further includes a fourth current testing switch 1104, a fourth current testing resistor 1112 corresponding to the fourth current testing switch 1104, and a fourth current testing indicator 1120, and is configured to test the IB- (B-phase current-) current of the secondary module of the ring main unit.
The current testing unit 11 further includes a fifth current testing switch 1105, a fifth current testing resistor 1113 corresponding to the fifth current testing switch 1105, and a fifth current testing indicator 1121, and is configured to test an IC + (C-phase current +) current of the secondary module of the ring main unit.
The current testing unit 11 further includes a sixth current testing switch 1106, a sixth current testing resistor 1114 corresponding to the sixth current testing switch 1106, and a sixth current testing indicator lamp 1122, and is used for testing the IC- (C-phase current-) current of the secondary module of the ring main unit.
The current testing unit 11 further includes a seventh current testing switch 1107, a seventh current testing resistor 1115 and a seventh current testing indicator lamp 1123 corresponding to the seventh current testing switch 1107, and is configured to test the IO + (zero-sequence current +) current of the secondary module of the ring main unit.
The current testing unit 11 further includes an eighth current testing switch 1108, an eighth current testing resistor 1116 and an eighth current testing indicator light 1124 corresponding to the eighth current testing switch 1108, and is configured to test the IO- (zero sequence current-) current of the secondary module of the ring main unit.
According to the utility model discloses an embodiment, each current test switch of a plurality of current test switches, with the current test resistance and the current test pilot lamp series connection that correspond to, each current test switch is connected with first row terminal, and each current test pilot lamp is connected with second row terminal.
As shown in fig. 2, taking the first current test switch 1101, the first current test resistor 1109 and the first current test indicator 1117 as an example, the first current test switch 1101, the first current test resistor 1109 and the first current test indicator 1117 are connected in series, the first current test switch 1101 is connected to the first row of terminals 18, and the first current test indicator 1117 is connected to the second row of terminals 19, so that the first current test switch 1101, the first current test resistor 1109, the first current test indicator 1117 and the tested secondary module of the ring main unit form a loop.
The connection modes of the other current testing switches, the current testing resistor and the current testing indicator lamp of the current testing unit 11 are the same as the connection modes of the first current testing switch 1101, the first current testing resistor 1109 and the first current testing indicator lamp 1117, and are not described again here.
As shown in fig. 3 the utility model discloses an embodiment one kind is suitable for looped netowrk cabinet secondary module's testing arrangement's voltage test unit's structural schematic diagram, according to the utility model discloses an embodiment, voltage test unit 12 includes a plurality of voltage test switch of array to and a plurality of voltage test resistance and a plurality of voltage test pilot lamp that correspond with a plurality of voltage test switch for test secondary module's different voltages.
In a specific embodiment, the voltage testing unit 12 includes a first voltage testing switch 1201, a first voltage testing resistor 1209 corresponding to the first voltage testing switch 1201, and a first voltage testing indicator 1217, and is configured to test a voltage of a (a-phase voltage positive terminal) of the secondary module of the ring main unit.
The voltage testing unit 12 further includes a second voltage testing switch 1202, a second voltage testing resistor 1210 corresponding to the second voltage testing switch 1202, and a second voltage testing indicator 1218, and is configured to test a UB (B-phase voltage positive terminal) voltage of the secondary module of the ring main unit.
The voltage testing unit 12 further includes a third voltage testing switch 1203, a third voltage testing resistor 1211 and a third voltage testing indicator light 1219, where the third voltage testing resistor 1211 and the third voltage testing indicator light correspond to the third voltage testing switch 1203, and are configured to test a UC (C-phase voltage positive end) voltage of the secondary module of the ring main unit.
The voltage testing unit 12 further includes a fourth voltage testing switch 1204, a fourth voltage testing resistor 1212 corresponding to the fourth voltage testing switch 1204 and a fourth voltage testing indicator 1220, for testing the UN (phase voltage common) voltage of the secondary module of the ring main unit.
The voltage testing unit 12 further includes a fifth voltage testing switch 1205, a fifth voltage testing resistor 1213 and a fifth voltage testing indicator lamp 1221 corresponding to the fifth voltage testing switch 1205, and is configured to test the UO + (zero sequence voltage) voltage of the secondary module of the ring main unit.
The voltage testing unit 12 further includes a sixth voltage testing switch 1206, a sixth voltage testing resistor 1214 corresponding to the sixth voltage testing switch 1206, and a sixth voltage testing indicator light 1222, and is used for testing the UO- (zero sequence voltage common) voltage of the ring main unit secondary module.
According to the utility model discloses an embodiment, each voltage test switch of a plurality of voltage test switches, with the voltage test resistance and the voltage test pilot lamp series connection that correspond to, each voltage test switch is connected with first row terminal, and each voltage test pilot lamp is connected with second row terminal.
As shown in fig. 3, taking the first voltage test switch 1201, the first voltage test resistor 1209 and the first voltage test indicator 1217 as an example, the first voltage test switch 1201, the first voltage test resistor 1209 and the first voltage test indicator 1217 are connected in series, and the first voltage test switch 1201 is connected to the first row of terminals 18 and the first voltage test indicator 1217 is connected to the second row of terminals 19, so that the first voltage test switch 1201, the first voltage test resistor 1209, the first voltage test indicator 1217 and the ring main unit secondary module to be tested form a loop.
The connection modes of the other voltage testing switches, the voltage testing resistors and the voltage testing indicator lamps of the voltage testing unit 12 are the same as those of the first voltage testing switch 1201, the first voltage testing resistor 1209 and the first voltage testing indicator lamp 1217, and are not described again here.
According to the utility model discloses a voltage test unit 12 still includes a plurality of pulse per second test switch of array to and a plurality of pulse per second test resistance and a plurality of pulse per second test pilot lamp that correspond with a plurality of pulse per second test switch, be used for testing the different pulse per second of secondary module.
In a specific embodiment, the voltage testing unit 12 further includes a first second pulse testing switch 1207, a first second pulse testing resistor 1215 corresponding to the first second pulse testing switch 1207, and a first second pulse testing indicator lamp 1223, and is configured to test the PPS + (second pulse +) second pulse of the ring main unit secondary module.
The voltage testing unit 12 further includes a second pulse-per-second testing switch 1208, a second pulse-per-second testing resistor 1265 corresponding to the second pulse-per-second testing switch 1208, and a second pulse-per-second testing indicator 1224, for testing the PPS (pulse per second) pulse of the secondary module of the ring main unit.
According to the utility model discloses an embodiment, each pulse per second test switch of a plurality of pulse per second test switch, with the pulse per second test resistance and the pulse per second test pilot lamp series connection that correspond to, each pulse per second test switch is connected with first row of terminal, and each pulse per second test pilot lamp is connected with second row of terminal.
The connection modes of the pulse-per-second test switch, the pulse-per-second test resistor and the pulse-per-second test indicator lamp are the same as those of the first voltage test switch 1201, the first voltage test resistor 1209 and the first voltage test indicator lamp 1217, and are not described again here.
As shown in fig. 4 the utility model discloses an embodiment one kind is suitable for looped netowrk cabinet secondary module's testing arrangement's control circuit broken string test unit's structural schematic diagram, according to the utility model discloses an embodiment, control circuit broken string test unit 13 includes combined floodgate broken string switch 1301, separating brake broken string switch 1302 to and control circuit broken string test resistance 1303 and control circuit broken string test pilot lamp 1304, be used for the broken string test of secondary module.
The closing disconnection switch 1301 is connected in series with a control circuit disconnection test resistor 1303 and a control circuit disconnection test indicator light 1304, the closing disconnection switch 1301 is connected to the first row of terminals 18, and the control circuit disconnection test indicator light 1304 is connected to the second row of terminals 19.
The opening and closing switch 1302 is connected in series with a control circuit disconnection test resistor 1303 and a control circuit disconnection test indicator light 1304, the opening and closing switch 1302 is connected with the first row of terminals 18, and the control circuit disconnection test indicator light 1304 is connected with the second row of terminals.
As shown in fig. 5 the utility model discloses an embodiment one kind is suitable for looped netowrk cabinet secondary module's testing arrangement's energy storage test unit's schematic structure, according to the utility model discloses an embodiment, still sets up energy storage test unit 14 on the printed circuit board 1. The energy storage test unit 14 comprises an energy storage test switch 1401, an energy storage test resistor 1402 and an energy storage test indicator light 1403. Energy storage test switch 1401 is established ties with energy storage test resistance 1402 and energy storage test pilot lamp 1403, and energy storage test switch 1401 is connected with first row of terminal 18, and energy storage test pilot lamp 1403 is connected with second row terminal 18, makes energy storage test switch 1401, energy storage test resistance 1402 and energy storage test pilot lamp 1403 and the looped netowrk cabinet secondary module that is surveyed form a return circuit.
In some preferred embodiments, all the test switches are toggle switches, all the resistors are low-power resistors, and all the indicator lamps are single-color LED indicator lamps.
In some preferred embodiments, the wiring is printed on the printed circuit board 1 by way of circuit scribing.
The following is to the utility model provides a pair of be suitable for testing arrangement test procedure of looped netowrk cabinet secondary module and give the explanation.
The first row of terminals 18 and the second row of terminals 19 are respectively connected to corresponding connectors of the secondary module of the ring main unit through connecting wires, for example, the first row of terminals 18 is connected to one side of the secondary module of the ring main unit, which is connected to the DTU, and the second row of terminals 19 is connected to one side of the secondary module of the ring main unit, which is connected to the CT cabinet. And the opening switch 16 and the closing switch 17 are respectively connected to the circuit breakers of the secondary module of the ring main unit through connecting wires. The power supply module 15 is turned on to supply power to the printed circuit board 1.
And (5) performing a secondary module disconnection test on the ring main unit.
An energy storage test switch 1401 of the energy storage test unit 14 is turned to the opening side, and when an energy storage test indicator light 1403 is turned on, it indicates that the ring main unit secondary module stores energy, and a ring main unit secondary module disconnection test can be performed.
The closing disconnection switch 1301 of the control circuit disconnection testing unit 13 is switched to the opening side, the closing switch 17 is pressed to control the ring main unit secondary module to be closed, and when the control circuit disconnection testing indicator light 1304 is turned on, the ring main unit secondary module is not disconnected in a closing state.
The opening/closing switch 1302 of the control circuit disconnection testing unit 13 is turned to an open side, the opening/closing switch 16 is pressed to control the secondary module of the ring main unit to open, and when the control circuit disconnection testing indicator 1304 is turned on, the ring main unit is not disconnected in the opening state of the secondary module.
And testing the current of the secondary module of the ring main unit.
Each current test switch of the current test unit 11 is sequentially switched to the open side, and when the corresponding current test indicator lamp is turned on, the current corresponding to the secondary module of the ring network cabinet is normal.
Taking the IA + current test as an example, the first current test switch 1101 is turned on, and when the first current test indicator 1117 is turned on, the IA + current of the secondary module of the ring main unit is normal. Other current testing processes are the same, and are not described in detail.
And testing the voltage of the secondary module of the ring main unit.
Each voltage test switch of the voltage test unit 12 is sequentially switched to the open side, and when the corresponding voltage test indicator lamp is turned on, the voltage corresponding to the secondary module of the ring network cabinet is normal.
Taking UA voltage test as an example, the first voltage test switch 1201 is turned on, and when the first voltage test indicator lamp 1217 is turned on, the UA voltage of the secondary module of the ring main unit is normal. Other voltage testing processes are the same, and are not described again.
And (5) testing the second module second pulse of the ring main unit.
Each second pulse test switch of the voltage test unit 12 is sequentially switched to the open side, and when the corresponding second pulse test indicator lamp is turned on, the second pulse corresponding to the secondary module of the ring network cabinet is normal.
Taking the PPS + second pulse test as an example, the first second pulse test switch 1207 is turned on, and when the first second pulse test indicator lamp 1223 is turned on, the PPS + second pulse of the secondary module of the ring main unit is normal. The PPS-second pulse test procedure is the same, and is not described in detail.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention.
Claims (10)
1. The utility model provides a be suitable for testing arrangement of looped netowrk cabinet secondary module which characterized in that, testing arrangement includes:
a printed circuit board, on which a current test unit, a voltage test unit and a control circuit disconnection test unit are arranged,
the current testing unit is used for testing the current of the secondary module; the voltage testing unit is used for voltage testing and second pulse testing of the secondary module; the control circuit disconnection testing unit is used for the disconnection test of the secondary module;
and a first row of terminals and a second row of terminals are arranged on two sides of the printed circuit board, and the secondary module is connected with the first row of terminals and the second row of terminals.
2. The test device of claim 1, wherein the current test unit comprises a plurality of current test switches of an array, and a plurality of current test resistors and a plurality of current test indicator lamps corresponding to the plurality of current test switches for testing different currents of the secondary module.
3. The test device of claim 2, wherein each of the plurality of current test switches is connected in series with a corresponding current test resistor and a current test indicator light,
and each current test switch is connected with the first row of terminals, and each current test indicator lamp is connected with the second row of terminals.
4. The test device of claim 1, wherein the voltage test unit comprises a plurality of voltage test switches in an array, and a plurality of voltage test resistors and a plurality of voltage test indicator lamps corresponding to the plurality of voltage test switches for testing different voltages of the secondary module.
5. The test device of claim 4, wherein each of the plurality of voltage test switches is connected in series with a corresponding voltage test resistor and a voltage test indicator light,
and each voltage test switch is connected with the first row of terminals, and each voltage test indicator lamp is connected with the second row of terminals.
6. The test device of claim 4, wherein the voltage test unit further comprises a plurality of pulse-per-second test switches of an array, and a plurality of pulse-per-second test resistors and a plurality of pulse-per-second test indicator lamps corresponding to the plurality of pulse-per-second test switches, for testing different pulse-per-second of the secondary module.
7. The test device of claim 6, wherein each pulse-per-second test switch of the plurality of pulse-per-second test switches is connected in series with a corresponding pulse-per-second test resistor and a pulse-per-second test indicator light,
and each pulse per second test switch is connected with the first row of terminals, and each pulse per second test indicator lamp is connected with the second row of terminals.
8. The testing device of claim 1, wherein the control circuit disconnection testing unit comprises a closing disconnection switch, an opening disconnection switch, a control circuit disconnection testing resistor and a control circuit disconnection testing indicator light, and is used for disconnection testing of the secondary module.
9. The testing device of claim 8, wherein the closing disconnect switch is connected in series with the control loop disconnect test resistor and the control loop disconnect test indicator light;
the brake separating and wire breaking switch is connected with the control loop wire breaking test resistor and the control loop wire breaking test indicator lamp in series;
and the closing disconnection switch and the opening disconnection switch are respectively connected with a first row of terminals, and the control loop disconnection test indicator lamp is connected with a second row of terminals.
10. The testing device of claim 1, wherein the printed circuit board is further provided with an energy storage testing unit for energy storage testing of the secondary module;
wherein the energy storage test unit comprises an energy storage test switch, an energy storage test resistor and an energy storage test indicator lamp,
the energy storage test switch is connected with the energy storage test resistor and the energy storage test indicator lamp in series, the energy storage test switch is connected with the first row of terminals, and the energy storage test indicator lamp is connected with the second row of terminals.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222464811 | 2022-09-07 | ||
| CN202222464811X | 2022-09-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218848248U true CN218848248U (en) | 2023-04-11 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222873735.8U Active CN218848248U (en) | 2022-09-07 | 2022-10-25 | Be suitable for testing arrangement of looped netowrk cabinet secondary module |
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| Country | Link |
|---|---|
| CN (1) | CN218848248U (en) |
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2022
- 2022-10-25 CN CN202222873735.8U patent/CN218848248U/en active Active
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