CN218788163U - Control circuit and aging test system - Google Patents
Control circuit and aging test system Download PDFInfo
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- CN218788163U CN218788163U CN202223575319.6U CN202223575319U CN218788163U CN 218788163 U CN218788163 U CN 218788163U CN 202223575319 U CN202223575319 U CN 202223575319U CN 218788163 U CN218788163 U CN 218788163U
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Abstract
The utility model discloses a control circuit and aging test system, the control circuit comprises a switch module and a second switch module; one end of the switch module is connected with a power supply module of the IVI aging cabinet; the delay module comprises a first delay circuit and a second delay circuit, one end of the first delay circuit is connected with the other end of the switch module, the other end of the first delay circuit is connected with one end of the second delay circuit, and the other end of the second delay circuit is connected with the test module of the IVI aging cabinet. The utility model discloses outage and power supply order when can controlling aging testing improve the yield.
Description
Technical Field
The utility model relates to an aging testing technical field especially relates to a control circuit and aging testing system.
Background
The IVI (in-vehicle entertainment control system) is a vehicle-mounted integrated information processing system formed on the basis of a vehicle body main system and internet services, is used for coordinating and controlling the whole vehicle-mounted electronic control information entertainment equipment, and can improve the comfort and the safety of an automobile.
An IVI (in-vehicle entertainment control system) burn-in cabinet is used for burn-in testing of an IVI system of an automobile to ensure the performance of the IVI system. When the existing IVI aging cabinet carries out aging test on an IVI system, the power supply and power-off sequence cannot be controlled, for example, when an ACC ignition module is tested, the power supply and power-off sequence of the ACC ignition module cannot be controlled, the ACC ignition module is easily damaged, and the reject ratio is improved.
SUMMERY OF THE UTILITY MODEL
The utility model provides a control circuit and aging testing system aims at solving the higher problem of defective rate that current IVI ageing cabinet uncontrollable power supply and outage order lead to.
In a first aspect, the present invention provides a control circuit, comprising a switch module and a second switch module; one end of the switch module is connected with a power supply module of the IVI aging cabinet; the delay module comprises a first delay circuit and a second delay circuit, one end of the first delay circuit is connected with the other end of the switch module, the other end of the first delay circuit is connected with one end of the second delay circuit, and the other end of the second delay circuit is connected with the test module of the IVI aging cabinet.
Further, the first time delay circuit comprises a first time relay, a first public end and a second public end of the first time relay are both connected with the switch module, and a first normally open contact and a second normally open contact of the first time relay are both connected with the second time delay circuit.
Further, the second time delay circuit comprises a second time relay, a first common end of the second time relay is connected with a first normally-open end of the first time relay, a second common end of the second time relay is connected with a second normally-open end of the first time relay, and a first normally-closed end and a second normally-closed end of the second time relay are both connected with the test module.
Furthermore, the switch module comprises a first switch, one end of the first switch is connected with the power supply module, and the other end of the first switch is respectively connected with the first public end and the second public end of the first time relay.
Further, the first switch is a single pole single throw switch.
Further, the first switch is a push-button switch.
In a second aspect, the present invention further provides an aging testing system, which comprises an IVI aging cabinet and any one of the above control circuits.
Further, the IVI aging cabinet comprises a power supply module and a test module, wherein the power supply module is connected with the switch module of the control circuit, and the test module is connected with the second delay circuit of the control circuit.
Further, the test module includes ACC ignition module and storage battery module, ACC ignition module with the first normally closed end of second time relay of second delay circuit is connected, the storage battery module with the second normally closed end of second time relay is connected.
Further, the power supply module is a direct current power supply.
The utility model provides a control circuit and aging testing system can be through the power supply order of first time delay circuit control power module to test module, and it is long when the test is controlled to the outage order through second time delay circuit control test module, ensures test module's aging testing's normal operating, reduces the defective rate.
Drawings
In order to more clearly illustrate the technical solution of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic block diagram of an aging testing system according to an embodiment of the present invention;
fig. 2 is a circuit diagram of a control circuit according to an embodiment of the present invention;
fig. 3 is a timing diagram of power supply and power failure provided by the present invention.
Detailed Description
The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used in the specification and the appended claims, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should be further understood that the term "and/or" as used in the specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
Referring to fig. 1 to 3, fig. 1 is a schematic block diagram of an aging test system according to an embodiment of the present invention; fig. 2 is a circuit diagram of a control circuit 10 according to an embodiment of the present invention; fig. 3 is a timing diagram of power supply and power failure provided by the present invention. As shown in fig. 1, the present invention provides a control circuit 10 including a switch module 11 and a delay module 12; one end of the switch module 11 is connected with a power supply module 20 of the IVI aging cabinet; the delay module 12 includes a first delay circuit 121 and a second delay circuit 122, one end of the first delay circuit 121 is connected to the other end of the switch module 11, the other end of the first delay circuit 121 is connected to one end of the second delay circuit 122, and the other end of the second delay circuit 122 is connected to the test module 30 of the IVI aging cabinet.
Specifically, the control circuit 10 is connected between the power supply module 20 and the test module 30, the switch module 11 is configured to control the power supply of the power supply module 20 to the test module 30, when the switch module 11 is turned on, the power supply module 20 first supplies power to the first delay circuit 121, and after the first delay circuit 121 is turned on, the second delay circuit 122 is turned on, so as to supply power to the test module 30, and the aging test starts. The test module 30 may include an ACC ignition module 31 and a battery module 32 for testing the ignition function of the vehicle. Can control ACC ignition module 31 and storage battery module 32's power supply order through setting up first delay circuit 121, under general conditions, storage battery module 32's power supply time is earlier than ACC ignition module 31, can set up delay time and be 5 seconds, then after supplying power to storage battery module 32 for 5 seconds, supply power to ACC ignition module 31 again, it has the electricity to avoid ACC ignition module 31 to have before storage battery module 32, and is equal, switch module 11 switches on the back, can set up first delay circuit 121's delay on-time, for example in 3 seconds, then after switch module 11 switches on 3 seconds, first delay circuit 121 just switches on. When the ACC ignition module 31 and the battery module 32 are both powered on, the aging test is started, and the aging time can be controlled by setting the off time of the second delay circuit 122, for example, the second delay circuit 122 is set to firstly turn off the power supply to the ACC ignition module 31 after 120 minutes and then turn off the power supply to the battery module 32 after 121 minutes, so as to ensure that the ACC ignition module 31 is powered off earlier than the battery module 32, and the two are separated by one minute. Through the arrangement, the power supply sequence and the power-off sequence when the test module 30 is carried out can be ensured, the damage of the test module 30 is avoided, and the yield is improved.
As a further embodiment, referring to fig. 2, the first time delay circuit 121 includes a first time relay LS1, a first common terminal and a second common terminal of the first time relay LS1 are both connected to the switch module 11, and a first normally open contact and a second normally open contact of the first time relay LS1 are both connected to the second time delay circuit 122.
As a further embodiment, the second delay circuit 122 includes a second time relay LS2, a first common terminal of the second time relay LS2 is connected to a first normally open terminal of the first time relay LS1, a second common terminal of the second time relay LS2 is connected to a second normally open terminal of the first time relay LS1, and a first normally closed terminal and a second normally closed terminal of the second time relay LS2 are both connected to the test module 30.
As shown in fig. 3, fig. 3 is a timing chart of power supply and power cut-off, when power is supplied, the battery module 32 supplies power before the ACC ignition module 31, and when power is cut-off, the ACC ignition module 31 cuts off power before the battery module 32. Specifically, the first delay circuit 121 may include a first time relay LS1, a first common terminal and a second common terminal of the first time relay LS1 are both connected to the switch module 11, when the switch module 11 is turned on, the power supply module 20 supplies power to the first time relay LS1, a time that the first time relay LS1 is turned on with a delay may be set, for example, 3 seconds, and then the first time relay LS1 starts to be turned on after the switch module 11 is turned on for 3 seconds. Similarly, the conduction time of the first normally-open end and the second normally-open end can be set, for example, the second normally-open end is earlier than the first normally-open end, when the first time relay LS1 is turned on, the second common end of the first time relay LS1 is firstly communicated with the second normally-open end, the second common end of the second time relay LS2 is communicated with the second normally-closed end, and the power supply module 20 supplies power to the battery module 32. After the second common terminal of the first time relay LS1 is conducted with the second normally open terminal, for example, after 5 seconds of conduction, the first common terminal of the first time relay LS1 is communicated with the first normally open terminal, the first common terminal of the corresponding second time relay LS2 is conducted with the first normally closed terminal, the power supply module 20 supplies power to the ACC ignition module 31, and the aging test is started. The ACC ignition module 31 is connected with a first normally closed end of the second time relay LS2, the battery module 32 is connected with a second normally closed end of the second time relay LS2, the second time relay LS2 is set to be closed after being delayed for a period of time, for example, 120 minutes, when the aging test reaches 120 minutes, a first common end of the second time relay LS2 is communicated with the first normally open end, the power supply module 20 stops supplying power to the ACC ignition module 31, after being delayed for 1 minute, a second common end of the second time relay LS2 is communicated with the second normally open end, the power supply module 20 stops supplying power to the battery module 32, and therefore the aging test is finished. As shown in fig. 2, the contact 1 is a first common end, the contact 2 is a first normally closed end, the contact 3 is a first normally open end, the contact 4 is a second common end, the contact 5 is a second normally closed end, the contact 6 is a second normally open end, the contacts 7 and 8 are connected with a coil inside the time relay, and the power supply and power off sequences of the first time relay LS1 and the second time relay LS2 can be controlled by controlling the power supply time of the coil.
As a further embodiment, the switch module 11 includes a first switch SW1, one end of the first switch SW1 is connected to the power supply module 20, and the other end of the first switch SW1 is connected to the first common terminal and the second common terminal of the first time relay LS1 respectively.
As a further embodiment, the first switch SW1 is a single pole, single throw switch.
As a further embodiment, the first switch SW1 is a push button switch.
The first switch SW1 is used for controlling the power supply module 20 to the first delay circuit 121. The second delay circuit 122, and the test module 30, may be powered by a single pole, single throw switch or a push button switch.
The utility model also provides an aging testing system, aging testing system includes any one in IVI ageing cabinet and the above-mentioned example control circuit 10.
As a further embodiment, the IVI burn-in cabinet includes a power supply module 20 and a test module 30, the power supply module 20 is connected to the switch module 11 of the control circuit 10, and the test module 30 is connected to the second delay circuit 122 of the control circuit 10.
As a further embodiment, the test module 30 includes an ACC ignition module 31 and a battery module 32, the ACC ignition module 31 is connected to a first normally closed terminal of a second time relay LS2 of the second delay circuit 122, and the battery module 32 is connected to a second normally closed terminal of the second time relay LS 2.
As a further embodiment, the power supply module 20 is a dc power supply.
Wherein, the test module 30 can include the module that needs the strict control of the power-on time sequence such as ACC ignition module 31 and storage battery module 32, also can be conventional test module 30, when test module 30 includes the module that needs the control power supply and outage time sequence such as ACC ignition module 31 and storage battery module 32, can set up the time of first time relay LS1 and the second time relay LS2 of control circuit 10 and control power supply and outage time sequence, when test module 30 is ordinary module, can not set up the delay time of first time relay LS1 and second time relay LS 2.
The utility model discloses can control test time through second delay circuit control outage order through first delay circuit control power supply order to can control the power supply and the outage order of ageing cabinet, ensure can not cause the damage to test module, improve the yield.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily think of various equivalent modifications or substitutions within the technical scope of the present invention, and these modifications or substitutions should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. A control circuit is applied to the ageing cabinet of IVI, its characterized in that includes:
one end of the switch module is connected with a power supply module of the IVI aging cabinet;
the delay module comprises a first delay circuit and a second delay circuit, one end of the first delay circuit is connected with the other end of the switch module, the other end of the first delay circuit is connected with one end of the second delay circuit, and the other end of the second delay circuit is connected with the test module of the IVI aging cabinet.
2. The control circuit of claim 1, wherein the first time delay circuit comprises a first time relay, a first common terminal and a second common terminal of the first time relay are both connected to the switch module, and a first normally open contact and a second normally open contact of the first time relay are both connected to the second time delay circuit.
3. The control circuit of claim 2, wherein the second delay circuit comprises a second time relay, a first common terminal of the second time relay being connected to a first normally open terminal of the first time relay, a second common terminal of the second time relay being connected to a second normally open terminal of the first time relay, the first normally closed terminal and the second normally closed terminal of the second time relay being connected to the test module.
4. The control circuit of claim 3, wherein the switch module comprises a first switch, one end of the first switch is connected to the power supply module, and the other end of the first switch is connected to the first common terminal and the second common terminal of the first time relay, respectively.
5. The control circuit of claim 4, wherein the first switch is a single pole, single throw switch.
6. The control circuit of claim 4, wherein the first switch is a push button switch.
7. A burn-in test system comprising an IVI burn-in cabinet and a control circuit as claimed in any one of claims 1 to 6.
8. The burn-in system of claim 7, wherein the IVI burn-in cabinet comprises a power module and a test module, the power module being connected to the switch module of the control circuit, the test module being connected to the second delay circuit of the control circuit.
9. The burn-in test system of claim 7, wherein the test module comprises an ACC ignition module and a battery module, the ACC ignition module being connected to a first normally closed terminal of a second time relay of the second delay circuit, the battery module being connected to a second normally closed terminal of the second time relay.
10. The burn-in test system of claim 7, wherein the power module is a dc power supply.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223575319.6U CN218788163U (en) | 2022-12-30 | 2022-12-30 | Control circuit and aging test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223575319.6U CN218788163U (en) | 2022-12-30 | 2022-12-30 | Control circuit and aging test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218788163U true CN218788163U (en) | 2023-04-04 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223575319.6U Active CN218788163U (en) | 2022-12-30 | 2022-12-30 | Control circuit and aging test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218788163U (en) |
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2022
- 2022-12-30 CN CN202223575319.6U patent/CN218788163U/en active Active
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