CN218782376U - Circuit breaker test current commutation device and circuit breaker test equipment - Google Patents

Abstract

The utility model belongs to the technical field of the circuit breaker test, a circuit breaker test current commutation device and circuit breaker test equipment is disclosed. This circuit breaker test current commutation device includes circuit breaker, power and the switch module that awaits measuring, and the switch module includes K1, K2, K3, K4, K5, K6, K7, K8, K9 and K10, and the circuit breaker that awaits measuring includes the A utmost point, the B utmost point, the C utmost point and the N utmost point, and the power includes anodal Vcc of power and power negative pole 0V. According to the circuit breaker testing current phase-changing device, the opening and closing of K1, K2, K3, K4, K5, K6, K7, K8, K9 and K10 are controlled, so that the random switching among the A-phase testing loop, the B-phase testing loop, the C-phase testing loop, the N-phase testing loop, the AB-phase testing loop, the AC-phase testing loop, the BC-phase testing loop, the AN-phase testing loop, the BN-phase testing loop, the CN-phase testing loop, the ABC-phase testing loop and the ABCN-phase testing loop can be realized, the test of any phase of a circuit breaker to be tested is realized, the structure is simple, and the work is reliable.

Description

Circuit breaker test current commutation device and circuit breaker test equipment

Technical Field

The utility model relates to a circuit breaker test technical field especially relates to a circuit breaker test current commutation device and circuit breaker test equipment.

Background

Instantaneous and delayed checking is needed before delivery of a molded case circuit breaker product, namely any phase of A phase, B phase, C phase, N phase, AB phase, AC phase, BC phase, AN phase, BN phase, CN phase, ABC phase and ABCN phase of the product needs to be tested. The traditional calibration method comprises a manual test and a semi-automatic test, wherein the manual test directly connects the outlet end of the constant current source with the corresponding contact of the circuit breaker through a flexible connecting line and uses bolts and nuts for fastening, a special fixture device is not needed, the phase sequence switching of the circuit breaker is manually completed, but the manual operation has large workload and low working efficiency, and is not suitable for batch production. In a semi-automatic test mode, automatic phase change of the circuit breaker is realized by switching a phase sequence through a multi-path flexible connecting line and an air cylinder, but the circuit breaker is only limited to automatic switching of a limited phase sequence and cannot complete any phase sequence switching, for example, only the automatic switching of an AB phase, an AC phase, an ABC phase and an ABCN phase can be completed.

Therefore, it is desirable to provide a circuit breaker testing current commutation device and a circuit breaker testing apparatus to solve the above problems.

SUMMERY OF THE UTILITY MODEL

According to the utility model discloses an aspect, the utility model provides a circuit breaker test current commutation device can realize the test of the arbitrary looks of circuit breaker, simple structure, reliable operation.

To achieve the purpose, the utility model adopts the following technical proposal:

the circuit breaker testing current commutation device comprises a circuit breaker to be tested, a power supply and a switch assembly, wherein the switch assembly comprises K1, K2, K3, K4, K5, K6, K7, K8, K9 and K10, the circuit breaker to be tested comprises an A pole, a B pole, a C pole and an N pole, and the power supply comprises a power supply anode Vcc and a power supply cathode 0V;

the power supply positive pole Vcc, the K1, the A pole, the K6, the K10 and the power supply negative pole 0V are sequentially connected in series to form an A-phase test loop;

the power supply positive pole Vcc, the K2, the B pole, the K6, the K10 and the power supply negative pole 0V are sequentially connected in series to form a B-phase test loop;

the power supply positive pole Vcc, the K3, the C pole, the K10 and the power supply negative pole 0V are sequentially connected in series to form a C-phase test loop;

the power supply positive pole Vcc, the K4, the N pole, the K10 and the power supply negative pole 0V are sequentially connected in series to form an N-phase test loop;

one end of the K5 is connected between the K2 and the B pole, the other end of the K5 is connected between the K3 and the C pole, one end of the K6 is connected between the end of the A pole far away from the K1 and the end of the B pole far away from the K2, the other end of the K6 is connected between the C pole and the K10 and between the N pole and the K10, one end of the K7 is connected between the K4 and the N pole, the other end of the K7 is connected with the power negative pole of 0V, one end of the K8 is connected between the K3 and the C pole, the other end of the K8 is connected with the power negative pole of 0V, one end of the K9 is connected between the K2 and the B pole, and the other end of the K9 is connected with the power negative pole of 0V;

independently closing the K1 and the K9 to form an AB phase test loop in which the power supply positive pole Vcc, the K1, the A pole, the B pole, the K9 and the power supply negative pole 0V are sequentially connected in series;

independently closing the K1, the K6 and the K8 to form an AC phase test loop in which the power supply positive pole Vcc, the K1, the A pole, the K6, the C pole, the K8 and the power supply negative pole 0V are sequentially connected in series;

independently closing the K2, the K6 and the K8 to form a BC-phase test loop in which the power supply positive pole Vcc, the K2, the B pole, the K6, the C pole, the K8 and the power supply negative pole 0V are sequentially connected in series;

independently closing the K1, the K6 and the K7 to form AN AN phase test loop in which the power supply positive pole Vcc, the K1, the A pole, the K6, the N pole, the K7 and the power supply negative pole 0V are sequentially connected in series;

independently closing the K2, the K6 and the K7 to form a BN phase test loop formed by sequentially connecting a power supply positive pole Vcc, the K2, the B pole, the K6, the N pole, the K7 and a power supply negative pole 0V in series;

independently closing the K3 and the K7 to form a CN-phase test loop in which the power supply positive pole Vcc, the K3, the C pole, the N pole, the K7 and the power supply negative pole 0V are sequentially connected in series;

independently closing the K1, the K5 and the K10 to form an ABC phase test loop with a power supply positive pole Vcc, the K1, the A pole, the B pole, the K5, the C pole, the K10 and a power supply negative pole connected in series at 0V in sequence;

and independently closing the K1, the K5 and the K7 to form an ABCN phase test loop in which the power supply positive pole Vcc, the K1, the A pole, the B pole, the K5, the C pole, the N pole, the K7 and the power supply negative pole 0V are sequentially connected in series.

Optionally, the circuit breaker to be tested and the switch assembly are hard-connected through a connection bar; and/or:

the power supply is hard connected with the switch assembly through a connecting bar.

Optionally, the connecting row is a copper row.

Optionally, the method further comprises:

a primary support including a first layer and a second layer arranged in a stacked manner, the K1, the K2, the K3 and the K4 being arranged in the second layer, and the K7, the K8 and the K9 being arranged in the first layer;

first auxiliary support and second auxiliary support set up respectively the both sides of main support, A utmost point includes A1 and A2, B utmost point includes B1 and B2, C utmost point includes C1 and C2, N utmost point includes N1 and N2, K5 sets up on the first auxiliary support, A1B 1C 1 with N1 sets up K5's top, K6 with K10 all sets up on the second auxiliary support, A2B 2C 2 with N2 all sets up K6 with K10's top.

Optionally, the K1 comprises:

an insulating base plate;

two fixed contacts are arranged on the insulating base plate at intervals;

the mounting frame is arranged on the insulating bottom plate;

the fixed end of the driving piece is arranged on the mounting rack;

the moving contact component comprises a moving contact, the output end of the driving component is in driving connection with the moving contact component, the driving component can drive the moving contact component to move along the vertical direction, so that two ends of the moving contact are respectively in contact with or separated from two fixed contacts, when the two ends of the moving contact are respectively in contact with the two fixed contacts, the two fixed contacts are conducted, at the moment, the K1 is closed, when the two ends of the moving contact are respectively separated from the two fixed contacts, the two fixed contacts are disconnected, and at the moment, the K1 is disconnected.

Optionally, the movable contact assembly further includes:

the connecting plate is connected with the output end of the driving piece;

the guide post penetrates through the connecting plate in a sliding manner along the vertical direction, and one end of the guide post is fixedly connected with the moving contact;

and the reset elastic element is sleeved outside the guide post and is positioned between the moving contact and the connecting plate.

Optionally, the movable contact assembly further includes:

and the guard plates are connected with the connecting plate and are positioned on two sides of the moving contact.

Optionally, a silver point is arranged on the contact surface of the moving contact and the fixed contact; and/or:

and a silver point is arranged on the contact surface of the static contact and the moving contact.

Optionally, the movable contact is provided with a plurality of movable contacts, and the plurality of movable contacts are arranged side by side.

According to the utility model discloses an in another aspect, the utility model provides a circuit breaker test equipment for test circuit breaker's instantaneous operating characteristic or time delay operating characteristic, including any one of the above-mentioned technical scheme circuit breaker test current commutation device and controller, the controller can control each test circuit and switch on.

The utility model has the advantages that:

the utility model provides a circuit breaker test current commutation device, including circuit breaker, power and the switch module that awaits measuring, the switch module includes K1, K2, K3, K4, K5, K6, K7, K8, K9 and K10, and the circuit breaker that awaits measuring includes the A utmost point, the B utmost point, the C utmost point and the N utmost point, and the power includes anodal Vcc of power and power negative pole 0V. By controlling the opening and closing of K1, K2, K3, K4, K5, K6, K7, K8, K9 and K10, the random switching among the A phase test loop, the B phase test loop, the C phase test loop, the N phase test loop, the AB phase test loop, the AC phase test loop, the BC phase test loop, the AN phase test loop, the BN phase test loop, the CN phase test loop, the ABC phase test loop and the ABCN phase test loop can be realized. The circuit breaker testing current phase-changing device is simple in structure and reliable in work.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required to be used in the description of the embodiments of the present invention will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the contents of the embodiments of the present invention and the drawings without creative efforts.

Fig. 1 is a schematic circuit diagram of a circuit breaker testing current commutation device according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of a circuit breaker testing current commutation device according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of K1 at a first viewing angle according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of K1 at a second viewing angle according to an embodiment of the present invention.

In the figure:

111. a1; 112. a2; 121. b1; 122. b2; 131. c1; 132. c2; 141. n1; 142. n2; 210. a power supply positive electrode Vcc; 220. the negative electrode of the power supply is 0V;

301. k1; 3011. an insulating base plate; 3012. carrying out static contact; 3013. a mounting frame; 30131. a fixing plate; 30132. supporting legs; 3014. a drive member; 3015. a moving contact assembly; 30151. a moving contact; 30152. a connecting plate; 30153. a guide post; 30154. a restoring elastic member; 30155. a guard plate;

302. k2; 303. k3; 304. k4; 305. k5; 306. k6; 307. k7; 308. k8; 309. k9; 310. k10; 400. a connecting row; 500. a main support; 510. a first layer; 520. a second layer; 610. a first auxiliary support; 620. a second secondary support.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.

In the description of the present invention, unless otherwise explicitly specified or limited, the terms "connected", "connected" and "fixed" are to be construed broadly, e.g., as being fixedly connected, detachably connected, or integrated; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

In the present application, unless expressly stated or limited otherwise, the recitation of a first feature "on" or "under" a second feature may include the recitation of the first and second features being in direct contact, and may also include the recitation of the first and second features not being in direct contact, but being in contact with another feature between them. Also, the first feature "on," "above" and "over" the second feature may include the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.

In the description of the present embodiment, the terms "upper", "lower", "left", "right", and the like are used in the orientation or positional relationship shown in the drawings only for convenience of description and simplicity of operation, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used only for descriptive purposes and are not intended to have a special meaning.

The utility model provides a circuit breaker test current commutation device can realize the test of the arbitrary looks of circuit breaker, simple structure, reliable operation.

Specifically, as shown in fig. 1 to 4, the circuit breaker test current commutation device comprises a circuit breaker to be tested, a power supply and a switch assembly. The switching assembly comprises K1, K2, K3, K4, 304, K5, K6, K7, K8, K9 and K10, the circuit breaker to be tested comprises an A pole, a B pole, a C pole and an N pole, and the power supply comprises a power supply positive pole Vcc210 and a power supply negative pole 0V220. With continued reference to fig. 1, the positive power supply Vcc210, K1 301, a, K6, K10, and the negative power supply 0V220 are serially connected in sequence to form an a-phase test loop. The power supply positive pole Vcc210, the power supply negative pole K2 302, the power supply negative pole B, the power supply negative pole K6, the power supply negative pole K10 and the power supply negative pole 0V220 are sequentially connected in series to form a B-phase test loop. The power supply positive pole Vcc210, the power supply positive pole K3 303, the power supply positive pole C, the power supply negative pole K10 and the power supply negative pole 0V220 are sequentially connected in series to form a C-phase test loop. The power supply positive pole Vcc210, the power supply K4 304, the power supply N pole, the power supply K10 and the power supply negative pole 0V220 are sequentially connected in series to form an N-phase test loop. K5 305 one end is connected between K2 302 and the B utmost point, the other end is connected between K3 303 and the C utmost point, K6 one end is connected simultaneously in the A utmost point and is kept away from K1 one end and the B utmost point and keep away from K2 one end, the other end is connected simultaneously between C utmost point and K10 310 and between the N utmost point and K10 310, K7 one end is connected between K4 304 and the N utmost point, the other end is connected in power negative pole 0V220, K8 one end is connected between K3 303 and the C utmost point, the other end is connected in power negative pole 0V220, K9 one end is connected between K2 302 and the B utmost point, the other end is connected in power negative pole 0V220. And (3) independently closing the K1 and the K9 309 to form an AB phase test loop in which a power supply positive pole Vcc210, the K1, an A pole, a B pole, the K9 309 and a power supply negative pole 0V220 are sequentially connected in series. And (3) independently closing the K1, the K6 and the K8 to form an AC phase test loop in which a power supply positive pole Vcc210, the K1 301, an A pole, the K6, a C pole, the K8 and a power supply negative pole 0V220 are sequentially connected in series. And (3) independently closing the K2, the K6 and the K8 to form a BC-phase test loop in which a power supply positive pole Vcc210, the K2 302, a B pole, the K6, a C pole, the K8 and a power supply negative pole 0V220 are sequentially connected in series. And (3) independently closing the K1, the K6 and the K7 to form AN AN phase test loop with the power supply positive pole Vcc210, the K1 301, the A pole, the K6, the N pole, the K7 and the power supply negative pole 0V220 connected in series in sequence. And (3) closing the K2, the K6 and the K7 separately to form a BN phase test loop in which a power supply positive pole Vcc210, the K2 302, a B pole, the K6, an N pole, the K7 and a power supply negative pole 0V220 are sequentially connected in series. And (3) closing the K3 and the K7 separately to form a CN-phase test loop in which a power supply positive pole Vcc210, the K3 303, a C pole, an N pole, the K7 307 and a power supply negative pole 0V220 are sequentially connected in series. And (3) independently closing the K1, the K5 and the K10 to form an ABC phase test loop with the power supply positive pole Vcc210, the K1 301, the A pole, the B pole, the K5 305, the C pole, the K10 and the power supply negative pole 0V220 connected in series in sequence. And (3) independently closing the K1, the K5 and the K7 to form an ABCN phase test loop with a power supply positive pole Vcc210, a K1 301, an A pole, a B pole, a K5, a C pole, an N pole, a K7 307 and a power supply negative pole 0V220 connected in series in sequence.

The on-off of each test loop is controlled by setting K1, K2, K3, K4, K5, K6, K7, K8, K9 and K10 to control the on-off of each test loop, the test of any phase of the circuit breaker to be tested can be realized, and compared with the semi-automatic test mode in the prior art which can only realize the switching of a limited phase sequence, the test efficiency is higher, the structure is simple, and the work is reliable.

Preferably, in the prior art, the connection between the test loops is generally realized through a flexible connecting line, and when multiple flexible connecting lines are interwoven together and pass through a large current, the flexible connecting line generates heat seriously, so that the output current cannot meet the test requirement during the test. Based on above-mentioned problem, in this embodiment, through connecting row 400 rigid connection between the circuit breaker that awaits measuring and the switch module, compare through the flexible connecting line connection among the prior art, the ability of bearing current is stronger, and the radiating effect preferred has improved output current's during the test stability and reliability. Of course, the power source and the switch assembly can be hard-wired through the connection bar 400, and the connection bar can be set according to actual needs.

Optionally, the connecting row 400 can be a copper bar, the copper bar has the advantages of low resistivity, large bending degree and the like, the size can be flexibly adjusted during use, and the operation is simple.

Further, the circuit breaker testing current commutation device further includes a main bracket 500, a first auxiliary bracket 610, and a second auxiliary bracket 620. The main support 500 includes a first layer 510 and a second layer 520, which are stacked, wherein K1, K2, K3, and K4 are disposed in the second layer 520, and K7, K8, and K9 are disposed in the first layer 510. The first and second sub-brackets 610 and 620 are respectively disposed at both sides of the main bracket 500, the a pole includes A1 and A2 111, the B pole includes B1 and B2 122, the C pole includes C1 and C2 132, the N pole includes N1 141 and N2 142, K5 is disposed on the first sub-bracket 610, A1, B1 121, C1 131 and N1 141 are disposed above K5 305, K6 and K10 are disposed on the second sub-bracket 620, and A2 112, B2 122, C2 132 and N2 142 are disposed above K6 and K10 310. The structure design can make the structure of the circuit breaker testing current phase changing device more compact, and improve the aesthetic degree of the circuit breaker testing current phase changing device.

Further, with continued reference to fig. 3 and 4, K1 includes an insulating base 3011, a stationary contact 3012, a mounting block 3013, a driving component 3014, and a movable contact component 3015. Two static contacts 3012 are provided, and the two static contacts 3012 are disposed on the insulating base 3011 at intervals. The mounting block 3013 is disposed on the insulating base 3011. The fixed end of the driving member 3014 is disposed on the mounting block 3013. Moving contact component 3015 includes moving contact 30151, and the output of driving piece 3014 is connected with moving contact component 3015 drive, is used for driving moving contact component 3015 along vertical direction motion to make the both ends of moving contact 30151 contact with two static contacts 3012 respectively or separate. When two ends of the moving contact 30151 are respectively in contact with the two stationary contacts 3012, the moving contact 30151 serves as a bridge, so that the two stationary contacts 3012 are conducted, and the K1 is in a closed state; when the two ends of the moving contact 30151 are separated from the two stationary contacts 3012, the two stationary contacts 3012 are disconnected, and K1 is in a disconnected state. In the test loop, the stationary contact 3012 is used to be electrically connected to other components, and the driving unit 3014 is controlled to operate to control the on/off of the K1, so as to implement the automatic test of the circuit breaker test current commutation device. Alternatively, the structures of K2, K3 303, K4 304, K5, K6, K7 307, K8, K9, and K10 310 may be the same as K1 301.

Alternatively, in this embodiment, the mounting block 3013 includes a fixing plate 30131 and supporting legs 30132, one end of the supporting legs 30132 is connected to the insulating base plate 3011, the other end is connected to the fixing plate 30131, and the fixed end of the driving member 3014 is fixed on the fixing plate 30131. The supporting legs 30132 may be provided in plurality to improve the stability of the fixing plate 30131, and in this embodiment, the supporting legs 30132 are provided in four, and four supporting legs 30132 are provided at four corners of the fixing plate 30131. In other embodiments, the number and the arrangement mode of the support legs 30132 may be other, and the support legs may be arranged according to actual needs.

Preferably, the movable contact assembly 3015 further includes a connection plate 30152, a guide post 30153 and a return elastic element 30154. Wherein, the connecting plate 30152 is connected with the output end of the driving piece 3014. The guide post 30153 is slidably disposed through the connection board 30152 along a vertical direction, and one end of the guide post 30153 is fixedly connected to the moving contact 30151. The reset elastic component 30154 is sleeved outside the guide post 30153 and is located between the movable contact 30151 and the connecting board 30152. By providing the connection plate 30152 as a bridge connecting the output end of the driving element 3014 and the movable contact 30151, the connection strength between the driving element 3014 and the movable contact 30151 can be improved. By arranging the reset elastic component 30154 between the moving contact 30151 and the connecting plate 30152, the contact force between the moving contact 30151 and the stationary contact 3012 comes from the elastic force of the reset elastic component 30154, so as to prevent the moving contact 30151 and the stationary contact 3012 from being damaged due to hard contact, the reset elastic component 30154 may be a spring, and the downward pressure of the moving contact 30151 on the stationary contact 3012 may be adjusted by adjusting the specification and model of the spring. By arranging the guide post 30153, a guiding effect can be exerted on the movement of the moving contact 30151, which is beneficial to improving the reliability of the operation of the moving contact 30151.

Further, with reference to fig. 4, when K1 is closed, two ends of the moving contact 30151 need to be in contact with two fixed contacts 3012, so that two ends of the connecting plate 30152 are provided with the guiding post 30153 and the elastic restoring component 30154, so as to improve the stress uniformity of the moving contact 30151, and further improve the reliability of the operation of the moving contact 30151.

Furthermore, the moving contacts 30151 may be provided in plurality, and the plurality of moving contacts 30151 are arranged side by side, which is beneficial to increase the contact area between the moving contacts 30151 and the stationary contact 3012, and further improves the current-carrying capacity.

Preferably, in an embodiment, a silver dot is disposed on a contact surface of moving contact 30151 and stationary contact 3012, so as to increase a current-carrying capacity in the test loop when K1 is closed. In another embodiment, silver dots may be disposed on the surface of the stationary contact 3012 in contact with the movable contact 30151. In other embodiments, silver dots may be plated on the surfaces of the stationary contact 3012 and the movable contact 30151 that are in contact with each other, and the silver dots may be arranged according to actual needs.

Preferably, the movable contact assembly 3015 further includes a cover 30155, and the cover 30155 is disposed on two sides of the movable contact 30151. By arranging the protection plate 30155, the moving contact component 3015 can be protected, and a worker is prevented from accidentally touching and damaging the moving contact component 3015.

The utility model also provides a circuit breaker test equipment for test circuit breaker's instantaneous operating characteristic or time delay operating characteristic, including foretell circuit breaker test current commutation device and controller, the controller can control each test circuit and switch on.

For ease of understanding, the operation of the circuit breaker testing apparatus described above will now be briefly described:

s1: and respectively and fixedly and electrically connecting A1, B1 121, C1 131, N1 141, A2 112, B2 122, C2 132 and N2 142 of the circuit breaker to be tested with corresponding parts on the clamp of the test equipment, and keeping stable contact.

S2: the constant current source outlet end is respectively electrically connected with a power supply anode Vcc210 and a power supply cathode 0V220.

S3: when the A phase of the circuit breaker to be tested is tested, the controller controls the K1, the K6 and the K10 to be closed, so that the test current flows through the A pole independently to form an A phase test loop;

when the B phase of the circuit breaker to be tested is tested, the controller controls the K2, the K6 and the K10 to be closed, so that the test current flows through the B pole independently to form a B phase test loop;

when the C phase of the circuit breaker to be tested is tested, the controller controls the K3 303 and the K10 310 to be closed, so that the test current independently flows through the C pole to form a C phase test loop;

when the N phase of the circuit breaker to be tested is tested, the controller controls the K4 and the K10 to be closed, so that the test current independently flows through the N phase to form an N-phase test loop;

when the AB phase of the circuit breaker to be tested is tested, the controller controls the K1 and the K9 to be closed, so that test current flows through the A pole and the B pole in sequence to form an AB phase test loop;

when the AC phase of the circuit breaker to be tested is tested, the controller controls the K1, the K6 and the K8 to be closed, so that the test current sequentially flows through the A pole and the C pole to form an AC phase test loop;

when the BC phase of the circuit breaker to be tested is tested, the controller controls the K2, the K6 and the K8 to be closed, so that the test current sequentially flows through the B pole and the C pole to form a BC phase test loop;

when the AN phase of the circuit breaker to be tested is tested, the controller controls the K1, the K6 and the K7 to be closed, so that the test current sequentially flows through the A pole and the N pole to form AN AN phase test loop;

when the BN phase of the circuit breaker to be tested is tested, the controller controls K2, K6 and K7 to be closed, so that test current sequentially flows through a B pole and an N pole to form a BN phase test loop;

when testing the CN phase of the circuit breaker to be tested, the controller controls the K3 303 and the K7 307 to be closed, so that the test current sequentially flows through the C pole and the N pole to form a CN phase test loop;

when testing the ABC phase of the circuit breaker to be tested, the controller controls the K1, the K5 and the K10 to be closed, so that the test current sequentially flows through the A pole, the B pole and the C pole to form an ABC phase test loop;

when the ABCN phase of the circuit breaker to be tested is tested, the controller controls the K1, the K5 and the K7 to be closed, so that the test current sequentially flows through the A pole, the B pole, the C pole and the N pole, and an ABCN phase test loop is formed.

S4: after the test is finished, the constant current source stops outputting, the controller controls the K1, the K2, the K3, the K4 304, the K5, the K6, the K7, the K8, the K9 and the K10 to be switched off, and the current output to the circuit breaker is stopped.

It is to be understood that the above-described embodiments of the present invention are merely examples for clearly illustrating the present invention and are not intended to limit the embodiments of the present invention. Numerous obvious variations, rearrangements and substitutions will now occur to those skilled in the art without departing from the scope of the invention. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.

Claims (10)

1. The circuit breaker testing current commutation device is characterized by comprising a circuit breaker to be tested, a power supply and a switch assembly, wherein the switch assembly comprises K1 (301), K2 (302), K3 (303), K4 (304), K5 (305), K6 (306), K7 (307), K8 (308), K9 (309) and K10 (310), the circuit breaker to be tested comprises an A pole, a B pole, a C pole and an N pole, and the power supply comprises a power supply positive pole Vcc (210) and a power supply negative pole 0V (220);

the power supply positive pole Vcc (210), the K1 (301), the A pole, the K6 (306), the K10 (310) and the power supply negative pole 0V (220) are sequentially connected in series to form an A-phase test loop;

the power supply positive pole Vcc (210), the K2 (302), the B pole, the K6 (306), the K10 (310) and the power supply negative pole 0V (220) are sequentially connected in series to form a B-phase test loop;

the power supply positive pole Vcc (210), the K3 (303), the C pole, the K10 (310) and the power supply negative pole 0V (220) are sequentially connected in series to form a C-phase test loop;

the power supply positive pole Vcc (210), the K4 (304), the N pole, the K10 (310) and the power supply negative pole 0V (220) are sequentially connected in series to form an N-phase test loop;

one end of the K5 (305) is connected between the K2 (302) and the B pole, the other end of the K5 (305) is connected between the K3 (303) and the C pole, one end of the K6 (306) is connected between the A pole end far away from the K1 (301) and the B pole end far away from the K2 (302), the other end of the K6 (306) is connected between the C pole and the K10 (310) and between the N pole and the K10 (310), one end of the K7 (307) is connected between the K4 (304) and the N pole, the other end of the K7 is connected to the power negative pole 0V (220), one end of the K8 (308) is connected between the K3 (303) and the C pole, the other end of the K9 (309) is connected between the K2 (302) and the B pole, and the other end of the K9 is connected to the power negative pole 0V (220);

independently closing the K1 (301) and the K9 (309) to form an AB phase test loop in which the power supply positive pole Vcc (210), the K1 (301), the A pole, the B pole, the K9 (309) and the power supply negative pole 0V (220) are sequentially connected in series;

independently closing the K1 (301), the K6 (306) and the K8 (308) to form an AC phase test loop in which the power supply positive pole Vcc (210), the K1 (301), the A pole, the K6 (306), the C pole, the K8 (308) and the power supply negative pole 0V (220) are sequentially connected in series;

closing the K2 (302), the K6 (306) and the K8 (308) separately to form a BC-phase test loop in which the power supply positive pole Vcc (210), the K2 (302), the B pole, the K6 (306), the C pole, the K8 (308) and the power supply negative pole are connected in series in sequence at 0V (220);

closing the K1 (301), the K6 (306) and the K7 (307) separately to form AN AN phase test loop in which the power supply positive pole Vcc (210), the K1 (301), the A pole, the K6 (306), the N pole, the K7 (307) and the power supply negative pole 0V (220) are connected in series in sequence;

separately closing the K2 (302), the K6 (306) and the K7 (307) to form a BN phase test loop in which the power supply positive pole Vcc (210), the K2 (302), the B pole, the K6 (306), the N pole, the K7 (307) and the power supply negative pole 0V (220) are sequentially connected in series;

independently closing the K3 (303) and the K7 (307) to form a CN-phase test loop in which the power supply positive pole Vcc (210), the K3 (303), the C pole, the N pole, the K7 (307) and the power supply negative pole 0V (220) are sequentially connected in series;

closing the K1 (301), the K5 (305) and the K10 (310) separately to form an ABC phase test loop in which the power supply positive pole Vcc (210), the K1 (301), the A pole, the B pole, the K5 (305), the C pole, the K10 (310) and the power supply negative pole 0V (220) are connected in series in sequence;

and independently closing the K1 (301), the K5 (305) and the K7 (307) to form an ABCN phase test loop in which the power supply positive pole Vcc (210), the K1 (301), the A pole, the B pole, the K5 (305), the C pole, the N pole, the K7 (307) and the power supply negative pole 0V (220) are sequentially connected in series.

2. The circuit breaker test current commutation apparatus of claim 1, wherein the circuit breaker under test is hard-wired to the switch assembly by a connection bar (400); and/or:

the power supply is hard-wired to the switch assembly via a connection bank (400).

3. The circuit breaker test current commutation device of claim 2, wherein the connecting bar (400) is a copper bar.

4. The circuit breaker test current commutation apparatus of claim 1, further comprising:

a primary support (500) including a first layer (510) and a second layer (520) arranged in a stacked manner, the K1 (301), the K2 (302), the K3 (303), and the K4 (304) being arranged in the second layer (520), and the K7 (307), the K8 (308), and the K9 (309) being arranged in the first layer (510);

a first sub-bracket (610) and a second sub-bracket (620) respectively disposed at both sides of the main bracket (500), the A pole includes A1 (111) and A2 (112), the B pole includes B1 (121) and B2 (122), the C pole includes C1 (131) and C2 (132), the N pole includes N1 (141) and N2 (142), the K5 (305) is disposed on the first sub-bracket (610), the A1 (111), the B1 (121), the C1 (131) and the N1 (141) are disposed above the K5 (305), the K6 (306) and the K10 (310) are disposed on the second sub-bracket (620), the A2 (112), the B2 (122), the C2 (132) and the N2 (142) are disposed above the K6 (306) and the K10 (310).

5. The circuit breaker test current commutation apparatus of any one of claims 1-4, wherein the K1 (301) comprises:

an insulating base plate (3011);

two static contacts (3012), wherein the two static contacts (3012) are arranged on the insulating base plate (3011) at intervals;

a mounting block (3013) disposed on the insulating base plate (3011);

the fixed end of the driving piece (3014) is arranged on the mounting rack (3013);

the moving contact component (3015) comprises a moving contact (30151), an output end of the driving component (3014) is in driving connection with the moving contact component (3015), the driving component (3014) can drive the moving contact component (3015) to move in the vertical direction, so that two ends of the moving contact (30151) are respectively in contact with or separated from two static contacts (3012), when two ends of the moving contact (30151) are respectively in contact with the two static contacts (3012), the two static contacts (3012) are conducted, at the moment, the K1 (301) is closed, when two ends of the moving contact (30151) are respectively separated from the two static contacts (3012), the two static contacts (3012) are disconnected, and at the moment, the K1 (301) is disconnected.

6. The circuit breaker test current commutation device of claim 5, wherein the movable contact assembly (3015) further comprises:

a connecting plate (30152) connected with the output end of the driving piece (3014);

the guide post (30153) is slidably arranged through the connecting plate (30152) along a vertical direction, and one end of the guide post (30153) is fixedly connected with the moving contact (30151);

and the reset elastic piece (30154) is sleeved outside the guide post (30153) and is positioned between the moving contact (30151) and the connecting plate (30152).

7. The circuit breaker test current commutation device of claim 6, wherein the movable contact assembly (3015) further comprises:

and the protective plates (30155) are connected with the connecting plate (30152) and are positioned on two sides of the movable contact (30151).

8. The circuit breaker testing current commutation device of claim 5, wherein a silver point is arranged on a surface of the movable contact (30151) contacting the fixed contact (3012); and/or:

and a silver point is arranged on the contact surface of the static contact (3012) and the moving contact (30151).

9. The circuit breaker testing current commutation device of claim 5, wherein the plurality of movable contacts (30151) are arranged side by side, and the plurality of movable contacts (30151) are arranged side by side.

10. A circuit breaker testing apparatus for testing the transient or delayed action characteristics of a circuit breaker, comprising the circuit breaker testing current commutation apparatus of any one of claims 1 to 9 and a controller capable of controlling each testing circuit to switch on.

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