CN218782367U

CN218782367U - Withstand voltage testing device of discrete semiconductor device

Info

Publication number: CN218782367U
Application number: CN202223062463.XU
Authority: CN
Inventors: 林振; 陈林; 曹丙平; 吴富友
Original assignee: Shenzhen Shenwei Semiconductor Co ltd
Current assignee: Shenzhen Shenwei Semiconductor Co ltd
Priority date: 2022-11-18
Filing date: 2022-11-18
Publication date: 2023-03-31
Anticipated expiration: 2032-11-18

Abstract

The utility model relates to the technical field of a withstand voltage test device of a semiconductor discrete device, and discloses a withstand voltage test device of a semiconductor discrete device, which comprises a device body; the semiconductor discrete device is placed along the edge of one side of a fixing plate which is fixedly connected to the device body through a connecting cylindrical block, and limiting springs fixed on the two sides perform corresponding limiting clamping on the semiconductor discrete device under the action of the fixing plate, so that the semiconductor discrete device is convenient to take when being tested; through rotating the connecting block, make the testing arrangement connector through the hinge overturn along articulated piece, make the one side upset to the front with the connecting block coincidence, the discrete semiconductor device that awaits measuring is compressed tightly between the device body is inside and two articulated covers, controls the resistance to pressure that begins to test discrete semiconductor device through the control operation panel, and is spacing relatively when testing discrete semiconductor device, is convenient for when the test, improves the accuracy of monitoring.

Description

Withstand voltage testing device of discrete semiconductor device

Technical Field

The utility model relates to a withstand voltage testing arrangement technical field of semiconductor discrete device specifically is a withstand voltage testing arrangement of semiconductor discrete device.

Background

There are two major branches in the semiconductor industry: the discrete device is widely applied to the fields of consumer electronics, computers, peripheral equipment, network communication, automobile electronics, led display screens and the like, and the discrete semiconductor device needs to be subjected to strict electrical performance test before leaving a factory, which can affect the use performance of the semiconductor.

The current china patent publishes a withstand voltage test device of discrete semiconductor device on the net, and the public number of authorizing is CN214473743U, compares with prior art, the utility model provides a withstand voltage test device of discrete semiconductor device possesses following beneficial effect:

the utility model discloses in, through the first slider that sets up, first spout, the spring mounting piece, the pull rod, a spring, the pull rod handle work of mutually supporting, make the pressure-proof testing device main part can slide from top to bottom in the pressure-proof testing device casing through the pulling pull rod handle, so that wait to detect the installation and the dismantlement of discrete semiconductor device, and can will wait to detect the part through the elasticity of spring and compress tightly, second spout through setting up, the third spout, the second slider, the pin inserted block pull rod, lock nut, screw up the handle work of mutually supporting, make discrete semiconductor device pin inserted block control and shrink about can in the second spout, the interval position of adjusting two discrete semiconductor device pin inserted blocks can detect the discrete semiconductor device of different grade type, through the anti-slip gasket who sets up, make when the position of fixed discrete semiconductor device pin inserted block more stable.

When the withstand voltage testing device of the discrete semiconductor device is in actual use, the discrete semiconductor device is very troublesome to install during testing, a large amount of time can be wasted in the process of installation and disassembly, and the withstand voltage testing device of the discrete semiconductor device is provided based on the problem.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a withstand voltage testing arrangement of discrete semiconductor device has solved a withstand voltage testing arrangement's of discrete semiconductor device problem.

In order to achieve the above object, the utility model provides a following technical scheme: a withstand voltage testing device of a semiconductor discrete device comprises a device body;

the display screen is arranged on the front surface of the device body;

the operation panel is arranged on the right section of the front surface of the device body;

the adjusting knob is arranged on the left section of the front surface of the device body;

and the operation assembly is arranged at the top of the device body and comprises a covering part connected with the device body, and the top of the device body is connected with a limiting part.

Preferably, the cover part comprises a first hinged cover hinged to the right side of the top of the device body, a second hinged cover is hinged to the left side of the top of the device body, a reset spring is fixedly connected to the inner wall of a limit groove formed in one end of the inner side of the second hinged cover, a connecting block is fixedly connected to the outer end of the reset spring, a limit clamping plate is fixedly connected to the outer end of the connecting block through a connecting rod, and a push block is fixedly connected to the top of the connecting block.

Preferably, the limiting part comprises a connecting cylindrical block fixedly connected to the inner wall of a limiting groove formed in the device body, the front surface of the connecting cylindrical block is fixedly connected with a fixing plate, the inner wall of the limiting groove formed in the device body is fixedly connected with a limiting spring, the inner wall of the device body is slidably connected with a connecting plate, and the connecting plate is hinged to a testing device connector through a hinge.

Preferably, the top of the second hinged cover is provided with a limiting opening, and the push block is connected to the inner wall of the limiting opening in a sliding manner.

Preferably, a limiting bayonet is formed in one end of the inner side of the first hinged cover, and the limiting clamping plate is clamped to the inner wall of the limiting bayonet.

Preferably, the testing end of the connector of the testing device is overlapped with the connecting plate.

Preferably, the device body is electrically connected to the test device connector.

Preferably, the connecting plate is connected with the device body through a limiting sliding block, and the limiting sliding block is connected in a limiting sliding groove formed in the device body in a sliding mode.

The utility model provides a withstand voltage testing arrangement of discrete device of semiconductor. The withstand voltage testing device of the semiconductor discrete device has the following beneficial effects:

1. this withstand voltage testing arrangement of discrete semiconductor device places along fixed plate one side edgewise that fixed plate one side through connecting cylinder piece fixed connection with discrete semiconductor device along fixed connection at the device body, and the spacing spring of fixing in both sides passes through the effect of fixed plate, carries out corresponding spacing clamp tightly to discrete semiconductor device, when testing discrete semiconductor device, the facility of taking.

2. This withstand voltage testing arrangement of discrete semiconductor device, through rotating the connecting block, make the testing arrangement connector through the hinge overturn along articulated piece, make one side upset to the front with the connecting block coincidence, even make test one end orientation front, the discrete semiconductor device who waits to detect is compressed tightly between inside and two articulated covers of device body, control the resistance to pressure that begins test discrete semiconductor device through the control operation board, through spacing relatively to discrete semiconductor device when the test, be convenient for when the test, improve the accuracy of monitoring.

Drawings

FIG. 1 is a three-dimensional schematic view of the structure of the present invention;

FIG. 2 is a schematic view of the back side of the structure of the present invention;

FIG. 3 is an enlarged schematic view of the point A in the structure diagram of the present invention in FIG. 2;

FIG. 4 is a schematic view of a structural part of the present invention;

fig. 5 is a schematic view of a side portion of the structure of the present invention.

In the figure: 1. the device comprises a device body 2, an operation plate 3, a display screen 4, an adjusting knob 5, an operation component 51, a covering part 511, a first hinged cover 512, a second hinged cover 513, a return spring 514, a connecting block 515, a connecting rod 516, a limiting clamping plate 517, a pushing block 52, a limiting part 521, a connecting cylindrical block 522, a fixing plate 523, a limiting spring 524, a connecting plate 525, a hinge 526 and a testing device connector.

Detailed Description

As shown in fig. 1-5, the utility model provides a technical solution: a withstand voltage test device of a semiconductor discrete device comprises a device body 1; a display screen 3 arranged on the front surface of the device body 1; an operation panel 2 arranged on the right section of the front surface of the device body 1; an adjusting knob 4 arranged on the left section of the front side of the device body 1; and an operation component 5 arranged on the top of the device body 1, the operation component 5 comprises a covering part 51 connected with the device body 1, the covering part 51 comprises a first hinged cover 511 hinged on the right side of the top of the device body 1, the left side of the top of the device body 1 is hinged with a second hinged cover 512, the top of the second hinged cover 512 is provided with a limit opening, a push block 517 is connected with the inner wall of the limit opening in a sliding way, the inner wall of a limit groove arranged at one end of the inner side of the second hinged cover 512 is fixedly connected with a reset spring 513, the outer end of the reset spring 513 is fixedly connected with a connecting block 514, the outer end of the connecting block 514 is fixedly connected with a limit clamping plate 516 through a connecting rod 515, one end of the inner side of the first hinged cover 511 is provided with a limit clamping opening, and the limit clamping plate 516 is clamped on the inner wall of the limit clamping opening, connecting block 514 top fixedly connected with ejector pad 517, 1 top of device body is connected with spacing portion 52, spacing portion 52 includes the connection cylinder piece 521 of fixed connection at the spacing inslot wall that device body 1 seted up, connect the positive fixedly connected with fixed plate 522 of cylinder piece 521, the spacing inslot wall fixedly connected with spacing spring 523 that device body 1 seted up, 1 inner wall sliding connection of device body has connecting plate 524, connecting plate 524 is connected through spacing slider with device body 1, spacing slider sliding connection is in the spacing spout that device body 1 seted up, connecting plate 524 articulates through hinge 525 has testing arrangement connector 526, testing arrangement connector 526 tests one end and the mutual coincidence of connecting plate 524, device body 1 passes through the electricity with testing arrangement connector 526 and is connected.

When the pressure-resistant testing device of the discrete semiconductor device is in practical use, firstly, the connecting block 524 is rotated, the testing device connector 526 which passes through the hinge 525 is turned over along the hinged block, one surface which coincides with the connecting block 524 is turned over to the front surface, namely, one testing end faces to the front surface, the discrete semiconductor device is placed along one side of the fixing plate 522 which is fixedly connected to the device body 1 through the connecting cylindrical block 521, the limiting springs 523 which are fixed at two sides perform corresponding limiting clamping on the discrete semiconductor device under the action of the fixing plate 522, the discrete semiconductor device is rotated through the first hinged cover 511 and the second hinged cover 512 which are hinged to the device body 1, the push block 517 is pushed, the connecting block 514 which is fixedly connected drives the connecting rod 515 and the limiting clamping block 516 which is fixedly connected to the connecting rod 515 to move outwards, when the two hinged covers coincide with the device body 1, the push block 517 is released, the limiting pushing block 516 is clamped to the limiting clamping joint with the limiting clamping opening which is formed in the first hinged cover 511 under the action of the reset spring 513, the device body 1 is electrified, the discrete semiconductor device to be tested is pressed between the hinged cover 1 and the two hinged covers, and the operation of the discrete semiconductor device 2 is controlled to start the pressure-resistant testing.

Claims

1. A withstand voltage test device of a semiconductor discrete device comprises a device body (1);

the display screen (3) is arranged on the front surface of the device body (1);

the operation plate (2) is arranged on the right section of the front surface of the device body (1);

an adjusting knob (4) arranged on the left section of the front surface of the device body (1);

and an operating assembly (5) arranged on the top of the device body (1), characterized in that: the operation assembly (5) comprises a covering part (51) connected to the device body (1), and a limiting part (52) is connected to the top of the device body (1).

2. A withstand voltage test apparatus of a semiconductor discrete device according to claim 1, characterized in that: lid portion (51) contains to articulate first articulated lid (511) on device body (1) top right side, device body (1) top left side articulates there is articulated lid of second (512), spacing inslot wall fixedly connected with reset spring (513) that the inboard one end of articulated lid of second (512) was seted up reset spring (513) outer end fixedly connected with connecting block (514), connecting block (514) outer end is through connecting rod (515) the spacing cardboard of fixedly connected with (516), connecting block (514) top fixedly connected with ejector pad (517).

3. The apparatus for testing withstand voltage of a semiconductor discrete device according to claim 1, wherein: spacing portion (52) are including fixed connection at the connection cylinder piece (521) of the spacing inslot wall that device body (1) was seted up, connect the positive fixedly connected with fixed plate (522) of cylinder piece (521), spacing inslot wall fixedly connected with spacing spring (523) that device body (1) was seted up, device body (1) inner wall sliding connection has connecting plate (524), connecting plate (524) are articulated through hinge (525) have testing arrangement connector (526).

4. A withstand voltage test apparatus of a semiconductor discrete device according to claim 2, characterized in that: the top of the second hinged cover (512) is provided with a limiting opening, and the push block (517) is connected to the inner wall of the limiting opening in a sliding manner.

5. A withstand voltage test apparatus of a semiconductor discrete device according to claim 2, characterized in that: a limiting bayonet is formed in one end of the inner side of the first hinged cover (511), and the limiting clamping plate (516) is clamped on the inner wall of the limiting bayonet.

6. A withstand voltage test apparatus of a semiconductor discrete device according to claim 3, characterized in that: the testing device connector (526) has one testing end coinciding with the connecting plate (524).

7. A withstand voltage test apparatus of a semiconductor discrete device according to claim 3, characterized in that: the device body (1) is electrically connected with a testing device connector (526).

8. A withstand voltage test apparatus of a semiconductor discrete device according to claim 3, characterized in that: the connecting plate (524) is connected with the device body (1) through a limiting slide block, and the limiting slide block is connected in a limiting slide groove formed in the device body (1) in a sliding mode.