CN218727776U

CN218727776U - MOS manages high temperature test mechanism

Info

Publication number: CN218727776U
Application number: CN202222801109.8U
Authority: CN
Inventors: 马尧
Original assignee: Shenzhen Dingruicheng Industrial Co ltd
Current assignee: Shenzhen Dingruicheng Industrial Co ltd
Priority date: 2022-10-24
Filing date: 2022-10-24
Publication date: 2023-03-24
Anticipated expiration: 2032-10-24

Abstract

The utility model relates to a MOS manages high temperature test mechanism, including testing arrangement, testing arrangement's front is fixed with display screen and button, testing arrangement's front is equipped with the cooling body who is used for cooling off high temperature state MOS pipe, testing arrangement's front is equipped with the protection machanism who is used for protecting display screen and button, testing arrangement's front is fixed with fixing base and fixed case, the roof of fixed incasement chamber is fixed with the motor, the outside of motor output shaft is fixed with the pivot. This MOS pipe high temperature test mechanism, through semiconductor radiator, radiating fin and fan under cooling body's effect to the MOS pipe that high temperature detected the end cool off fast, make MOS pipe surface temperature reduce rapidly to the degree that can hand to make the workman can take out and place new MOS pipe in the short time and test, and then improved efficiency of software testing, also reduced the possibility that the workman was scalded and sent.

Description

MOS manages high temperature test mechanism

Technical Field

The utility model relates to a MOS manages test technical field, specifically is a MOS manages high temperature test mechanism.

Background

Because the service condition of the automobile circuit board is complex, before leaving the factory, the MOS tube is taken as an important component of the circuit board, and can work under different temperature conditions frequently, and in order to select the MOS tube better, the MOS tube needs to be subjected to high-temperature test before being used.

The embodiment china patent CN212808499U, this utility model relates to a MOS pipe testing arrangement for car belongs to auto parts detection area, this MOS pipe testing arrangement for car, including testboard, heating device and test circuit, the side of testboard is offered and is used for placing the rectangular channel of MOS pipe the rectangular channel is provided with and matches respectively the first stiff end, second stiff end and the third stiff end of three pins of MOS pipe, first stiff end, second stiff end and third stiff end are connected respectively on the test circuit, heating device sets up the below of rectangular channel, the lower surface of rectangular channel have with the heat conduction portion of heating device contact, the MOS pipe is placed on the heat conduction portion, this utility model has the beneficial effects of, adjust the temperature of MOS pipe through heating device to conveniently realize through the test circuit that the test to the performance of MOS pipe under the different temperatures improves test quality, thereby reduces the fault rate in the use, this novel use need use in the use carry out the temperature test to the MOS pipe with different temperatures, when the test temperature is too high, the back is accomplished the test to the unable cooling device that makes the performance test of MOS pipe under the different temperatures of MOS pipe under the temperature can's the time, thereby can's temperature again reduce the efficiency greatly, thereby can not take out the MOS pipe again, and can not reduce the efficiency again, and the efficiency after this time can not reduce its test.

SUMMERY OF THE UTILITY MODEL

The utility model provides a not enough to prior art, the utility model provides a MOS manages high temperature test mechanism possesses advantages such as efficiency of software testing height, has solved and has waited just can take out it and carry out the problem of the test of one side down after the temperature on the MOS pipe reduces.

In order to achieve the above object, the utility model provides a following technical scheme: a high-temperature testing mechanism for an MOS (metal oxide semiconductor) tube comprises a testing device, wherein a display screen and a button are fixed on the front surface of the testing device, a cooling mechanism for cooling the MOS tube in a high-temperature state is arranged on the front surface of the testing device, and a protection mechanism for protecting the display screen and the button is arranged on the front surface of the testing device;

the front of testing arrangement is fixed with fixing base and fixed case, the roof of fixed incasement chamber is fixed with the motor, the outside of motor output shaft is fixed with the pivot, the outside of pivot is fixed with the connecting plate, the front of connecting plate is fixed with the connecting box, the left side of connecting box is fixed with the cooler bin, the left side of connecting box is fixed with the semiconductor radiator and is located the inside of cooler bin, the left and right sides of semiconductor radiator all is fixed with radiating fin, the roof and the diapire of connecting box inner chamber all are fixed with the dust screen, the diapire of connecting box inner chamber is fixed with the fan.

Further, a mounting groove is formed in one side, opposite to the fixing seat and the fixing box, of the mounting groove, a first bearing is fixed inside the mounting groove, and the rotating shaft is fixed inside the first bearing.

Further, the shape of cooling box and connecting box is the cuboid that inside cavity and right side lacked, the length of connecting plate is less than the length of connecting box.

Furthermore, the through-hole has been seted up in the left side of connecting box, the right side radiating fin pegs graft in the inside of through-hole, and the ventilation hole has all been seted up to the upper surface and the lower surface of connecting box, the interior wall in ventilation hole is fixed to the dust screen.

Furthermore, the protection mechanism comprises two fixed blocks fixed on the front side of the testing device, a rotating rod is rotatably connected between one opposite side of the fixed blocks, a protection box is fixed on the outer side of the rotating rod, a positioning block is fixed on the right side of the protection box, a positioning box is inserted into the outer side of the positioning block, a screw rod is in threaded connection with the inner parts of the positioning block and the positioning box, and a rotating plate is fixed at the right end of the screw rod.

Further, two standing grooves are formed in the opposite sides of the fixing blocks, second bearings are fixed inside the standing grooves, and the rotating rods are fixed inside the second bearings.

Furthermore, the right side of the positioning block is provided with a thread groove for threaded connection of the screw rod, the right side of the positioning box is provided with a threaded hole for penetration of the screw rod, and the screw rod is in threaded connection with the positioning box through the threaded hole.

Compared with the prior art, the technical scheme of the application has the following beneficial effects:

1. this MOS pipe high temperature test mechanism, through semiconductor radiator, radiating fin and fan under cooling body's effect to the MOS pipe that high temperature detected the end cool off fast, make MOS pipe surface temperature reduce rapidly to the degree that can hand to make the workman can take out and place new MOS pipe in the short time and test, and then improved efficiency of software testing, also reduced the possibility that the workman was scalded and sent.

2. This MOS manages high temperature test mechanism, protection machanism protects the display screen through the protective housing, avoids it to be strikeed and damage by the object when not using, protects the button simultaneously, prevents that it from receiving to lead to testing arrangement to carry out wrong operation after strikeing to make the protective housing unable removal under the cooperation of locating piece, fixed box, commentaries on classics board and screw rod, thereby ensure that it can not remove when receiving the striking and lead to display screen and button to expose.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic view of the cooling mechanism of the present invention;

fig. 3 is a schematic view of the protection mechanism of the present invention.

In the figure: the device comprises a cooling mechanism 1, a cooling box 101, a fan 102, a dust screen 103, radiating fins 104, a fixed seat 105, a rotating shaft 106, a connecting plate 107, a fixed box 108, a motor 109, a connecting box 110, a semiconductor radiator 111, a testing device 2, a protection mechanism 3, a positioning block 301, a fixed box 302, a rotating plate 303, a screw 304, a rotating rod 305, a fixed block 306, a protection box 307, a 4-display screen and a 5-button.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1, a high temperature testing mechanism for MOS transistors in this embodiment includes a testing device 2, a display screen 4 and a button 5 are fixed on a front surface of the testing device 2, a cooling mechanism 1 for cooling MOS transistors in a high temperature state is disposed on the front surface of the testing device 2, a protection mechanism 3 for protecting the display screen 4 and the button 5 is disposed on the front surface of the testing device 2, electrical components appearing therein are electrically connected to a main controller and a power supply, the main controller can be a conventional known device controlled by a computer, and a conventional disclosed power connection technology is not described herein.

Referring to fig. 2, in order to rapidly cool the MOS transistor, a fixing seat 105 and a fixing box 108 are fixed on the front surface of the testing device 2 in this embodiment, a motor 109 is fixed on the top wall of an inner cavity of the fixing box 108, a rotating shaft 106 is fixed on the outer side of an output shaft of the motor 109, a connecting plate 107 is fixed on the outer side of the rotating shaft 106, a connecting box 110 is fixed on the front surface of the connecting plate 107, the motor 109 drives the rotating shaft 106 to rotate through the output shaft, the rotating shaft 106 drives the connecting plate 107 to rotate ninety degrees, and the connecting box 110 is driven to rotate through the connecting plate 107 to ninety degrees to be attached to the testing device 2, a cooling box 101 is fixed on the left side of the connecting box 110, a semiconductor radiator 111 is fixed on the left side of the connecting box 110 and located inside the cooling box 101, radiating fins 104 are fixed on the left and right sides of the semiconductor radiator 111, the semiconductor radiator 111 absorbs and releases heat located inside the connecting box 110 through the radiating fins 104 to the cooling box 101, a dust screen 103 is fixed on the top wall and the bottom wall of the inner cavity of the connecting box 110, a bottom wall of the inner cavity of the connecting box 110 is fixed with a fan 102, the fan 102 which absorbs heat released from the radiating fins 104 and cools the cooling box 101, thereby rapidly cooling fin 104 to rapidly absorb the heat inside the cooling fin 110.

The mounting groove has all been seted up to one side that fixing base 105 and fixed box 108 are relative, the inside of mounting groove is fixed with first bearing, pivot 106 is fixed in the inside of first bearing, pivot 106 rotates with fixing base 105 and fixed box 108 through first bearing and is connected, the shape of cooler bin 101 and connecting bin 110 is the cuboid of inside cavity and right side disappearance, the length of connecting plate 107 is less than the length of connecting bin 110, the through-hole has been seted up in the left side of connecting bin 110, right side radiating fin 104 pegs graft in the inside of through-hole, the ventilation hole has all been seted up to the upper surface and the lower surface of connecting bin 110, dust screen 103 is fixed at the inner wall in ventilation hole, prevent through dust screen 103 that the dust from getting into the inside disturbing fan 102 and radiating fin 104 of cooler bin 101, the utility model discloses a control mode is controlled through the controller, the control circuit of controller can be realized through the simple programming of technical staff in this field, the supply also belongs to the common general knowledge in this field, and the utility model discloses mainly be used for protecting mechanical device, so the utility model discloses no longer explain control mode in detail and circuit connection.

It should be noted that, the cooling mechanism 1 rapidly cools the MOS tube after high temperature detection through the semiconductor heat sink 111, the heat dissipation fins 104 and the fan 102, so that the surface temperature of the MOS tube is rapidly reduced to a degree that the MOS tube can be held by hand, and thus a worker can take out the MOS tube and place a new MOS tube for testing in a short time, thereby improving the testing efficiency and reducing the possibility that the worker is scalded.

Referring to fig. 3, in order to protect the display screen 4 and the button 5, the protection mechanism 3 in this embodiment includes two fixing blocks 306 fixed on the front of the testing device 2, a rotating rod 305 is rotatably connected between opposite sides of the two fixing blocks 306, a protection box 307 is fixed on an outer side of the rotating rod 305, the protection box 307 is a rectangular parallelepiped with a hollow interior and a missing back, a positioning block 301 is fixed on a right side of the protection box 307, a positioning box 302 is inserted in an outer side of the positioning block 301, the positioning box 302 is a rectangular parallelepiped with a hollow interior and a missing left side, a front side and a back side, a length of the positioning block 301 is adapted to a length of an inner cavity of the positioning box 302, a screw 304 is threadedly connected to each of the insides of the positioning block 301 and the positioning box 302, and a rotating plate 303 is fixed on a right end of the screw 304.

The opposite sides of the two fixing blocks 306 are provided with placing grooves, a second bearing is fixed inside the placing grooves, the rotating rod 305 is fixed inside the second bearing, the rotating rod 305 is rotatably connected with the fixing blocks 306 through the second bearing, the right side of the positioning block 301 is provided with a threaded groove for threaded connection of the screw 304, the right side of the positioning box 302 is provided with a threaded hole for penetration of the screw 304, the screw 304 is in threaded connection with the positioning box 302 through the threaded hole, and the screw 304 connects the positioning block 301 and the positioning box 302 together through the matching of the threaded groove and the threaded hole.

It should be noted that the protection mechanism 3 protects the display screen 4 through the protection box 307, so as to prevent the display screen 4 from being damaged by an object when not in use, protects the button 5, prevents the testing device 2 from performing an erroneous operation after the button is impacted, and prevents the protection box 307 from moving under the cooperation of the positioning block 301, the positioning box 302, the rotating plate 303 and the screw 304, so as to ensure that the display screen 4 and the button 5 are not exposed when the button is impacted.

The working principle of the embodiment is as follows:

(1) After testing MOS tube under high temperature environment, motor 109 is started, motor 109 drives rotating shaft 106 through output shaft to rotate, rotating shaft 106 drives connecting plate 107 to rotate ninety degrees, and drive connecting box 110 through connecting plate 107 to rotate ninety degrees and to be attached to testing device 2, then semiconductor radiator 111 is started, semiconductor radiator 111 absorbs and releases the heat in connecting box 110 to the inside of cooling box 101 through radiating fin 104, and fan 102 is started simultaneously, fan 102 blows the heat released by radiating fin 104 out of cooling box 101 and cools down left side radiating fin 104, thereby right side radiating fin 104 accelerates to absorb the heat in connecting box 110 to complete quick cooling, cooling mechanism 1 is through semiconductor radiator 111, radiating fin 104 and fan 102 to quickly cool the MOS tube that has been tested at high temperature, make MOS tube surface temperature quickly reduce to the degree that can be taken by hand, thereby make the worker take out and place new MOS tube in a short time for testing, and further improve testing efficiency, and also reduce the possibility of scalding workers.

(2) Rotate and change board 303 during operation testing arrangement 2, make it drive screw 304 and rotate, screw 304 pivoted while separates with locating piece 301 gradually, it can to make display screen 4 and button 5 appear to rotate protection box 307 to the front after screw 304 and locating piece 301 separate completely, protection machanism 3 protects display screen 4 through protection box 307, avoid it to be strikeed and damage by the object when not using, protect button 5 simultaneously, prevent that it from receiving to lead to testing arrangement 2 to carry out wrong operation after strikeing, and at locating piece 301, locating box 302, it makes the unable removal of protection box 307 to change board 303 and screw 304's cooperation, thereby ensure that it can not remove when receiving the striking and lead to display screen 4 and button 5 to expose.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising a," "8230," "8230," or "comprising" does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a MOS manages high temperature test mechanism, includes testing arrangement (2), its characterized in that: a display screen (4) and a button (5) are fixed on the front surface of the testing device (2), a cooling mechanism (1) for cooling the MOS tube in a high-temperature state is arranged on the front surface of the testing device (2), and a protection mechanism (3) for protecting the display screen (4) and the button (5) is arranged on the front surface of the testing device (2);

the front of testing arrangement (2) is fixed with fixing base (105) and fixed case (108), the roof of fixed case (108) inner chamber is fixed with motor (109), the outside of motor (109) output shaft is fixed with pivot (106), the outside of pivot (106) is fixed with connecting plate (107), the front of connecting plate (107) is fixed with connecting box (110), the left side of connecting box (110) is fixed with cooling box (101), the left side of connecting box (110) is fixed with semiconductor radiator (111) and is located the inside of cooling box (101), the left and right sides of semiconductor radiator (111) all is fixed with radiating fin (104), the roof and the diapire of connecting box (110) inner chamber all are fixed with dust screen (103), the diapire of connecting box (110) inner chamber is fixed with fan (102).

2. The MOS tube high-temperature testing mechanism of claim 1, wherein: the fixing base (105) and the relative one side of fixed case (108) have all been seted up the mounting groove, the inside of mounting groove is fixed with first bearing, the inside at first bearing is fixed in pivot (106).

3. The MOS tube high-temperature testing mechanism of claim 1, wherein: the shape of cooling box (101) and connecting box (110) is the cuboid that inside cavity and right side lacked, the length of connecting plate (107) is less than the length of connecting box (110).

4. The MOS tube high-temperature testing mechanism of claim 1, wherein: the left side of the connecting box (110) is provided with a through hole, the right side of the connecting box is provided with the radiating fins (104) which are inserted in the through hole, the upper surface and the lower surface of the connecting box (110) are provided with vent holes, and the dustproof net (103) is fixed on the inner wall of the vent holes.

5. The MOS tube high-temperature testing mechanism of claim 1, wherein: protection machanism (3) are including fixing two fixed blocks (306) at testing arrangement (2) front, two it is connected with bull stick (305) to rotate between the relative one side of fixed block (306), the outside of bull stick (305) is fixed with protection box (307), the right side of protection box (307) is fixed with locating piece (301), the outside of locating piece (301) is pegged graft and is had locating box (302), the equal threaded connection in inside of locating piece (301) and locating box (302) has screw rod (304), the right-hand member of screw rod (304) is fixed with commentaries on classics board (303).

6. The MOS tube high-temperature testing mechanism of claim 5, wherein: two fixed blocks (306) relative one side all seted up the standing groove, the inside of standing groove is fixed with the second bearing, bull stick (305) are fixed in the inside of second bearing.

7. The MOS tube high-temperature testing mechanism of claim 5, wherein: the right side of the positioning block (301) is provided with a thread groove for the threaded connection of the screw rod (304), the right side of the positioning box (302) is provided with a threaded hole for the penetration of the screw rod (304), and the screw rod (304) is in threaded connection with the positioning box (302) through the threaded hole.