CN218726945U

CN218726945U - Probe for flaw detector

Info

Publication number: CN218726945U
Application number: CN202222513546.XU
Authority: CN
Inventors: 汤文彬; 张天池
Original assignee: Ruiteng Testing Tianjin Co ltd
Current assignee: Ruiteng Testing Tianjin Co ltd
Priority date: 2022-09-22
Filing date: 2022-09-22
Publication date: 2023-03-24
Anticipated expiration: 2032-09-22

Abstract

The utility model discloses a probe that flaw detector used, wherein, a probe that flaw detector used includes the probe shell, the upper end fixedly connected with connecting pipe of probe shell, the surface of connecting pipe is provided with the connector, a plurality of mounting groove has been seted up to the lateral wall of connecting pipe, the inside fixedly connected with reset spring of mounting groove, reset spring's one end fixedly connected with stationary hump, the standing groove has been seted up to the inside of connector, a plurality of fixed slot has been seted up to the lateral wall of standing groove, the inside of probe shell is provided with sound absorbing material layer, damping piece, probe wafer, protection film, the upper end of probe wafer is connected with the connecting wire, sound absorbing material layer's lower surface is provided with the damping piece, the lower surface of damping piece is provided with the probe wafer. Through setting up reset spring, fixed bulge, fixed slot, mounting groove, need not to carry out accurate location, make things convenient for the quick installation of probe, the change of the probe of being convenient for simultaneously.

Description

Probe for flaw detector

Technical Field

The utility model relates to a flaw detector technical field, in particular to probe that flaw detector used.

Background

Ultrasonic flaw detection is a method for detecting the flaw of a part by using the characteristic that ultrasonic energy penetrates into the depth of a material and is reflected from the edge of an interface when the ultrasonic beam enters another section from the section.

The installation of current flaw detector probe is comparatively inconvenient with the change, need carry out accurate counterpoint, and the inefficiency of installation and change wastes time and energy. Therefore, a probe for a flaw detector is proposed to solve the above problems.

SUMMERY OF THE UTILITY MODEL

The utility model discloses an order provides a probe that flaw detector used, can install fast.

To achieve the above object, there is provided a probe for a flaw detector, comprising: the utility model discloses a probe shell, probe shell's upper end fixedly connected with connecting pipe, the surface of connecting pipe is provided with the connector, a plurality of mounting groove has been seted up to the lateral wall of connecting pipe, the inside fixedly connected with reset spring of mounting groove, reset spring's the fixed arch of one end fixedly connected with, the standing groove has been seted up to the inside of connector, a plurality of fixed slot has been seted up to the lateral wall of standing groove.

According to the probe for the flaw detector, the fixing bulge is in a hemispherical shape. Has the advantages that: the fixing protrusion through the hemispheroid is convenient to match with the fixing groove, and the fixing effect is achieved.

According to the probe for the flaw detector, the fixing groove is hemispherical. Has the advantages that: through hemispherical fixed slot, conveniently cooperate with fixed arch, realize fixed effect.

According to the probe for the flaw detector, the fixing protrusion is movably clamped with the fixing groove. Has the beneficial effects that: the installation and the dismantlement of probe are convenient.

According to the probe for the flaw detector, the sound absorption material layer, the damping block, the probe wafer and the protective film are arranged inside the probe shell, and the upper end of the probe wafer is connected with the connecting wire.

According to a probe that flaw detector used, the lower surface on sound absorbing material layer is provided with the damping piece, the lower surface of damping piece is provided with the probe wafer, the lower surface of probe wafer is provided with the protection film.

The utility model aims to solve one of the technical problem that exists among the prior art at least, provide a probe that flaw detector was used, main innovation point:

through setting up reset spring, fixed bulge, fixed slot, mounting groove, need not to carry out accurate location, make things convenient for the quick installation of probe, the change of the probe of being convenient for simultaneously.

Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.

Drawings

The present invention will be further described with reference to the accompanying drawings and examples;

fig. 1 is a perspective view of a probe for a flaw detector according to the present invention;

fig. 2 is a cross-sectional view of a probe for a flaw detector according to the present invention;

fig. 3 is a schematic structural diagram of a point a in fig. 2 according to the present invention;

fig. 4 is a cross-sectional view of a connector of a probe for a flaw detector according to the present invention.

Illustration of the drawings:

1. a probe housing; 2. a connecting pipe; 3. a fixed protrusion; 4. a connector; 5. a sound absorbing material layer; 6. a damping block; 7. a connecting wire; 8. a probe wafer; 9. a protective film; 10. mounting grooves; 11. a return spring; 12. a placement groove; 13. and fixing the grooves.

Detailed Description

This section will describe in detail the embodiments of the present invention, preferred embodiments of the present invention are shown in the attached drawings, which are used to supplement the description of the text part of the specification with figures, so that one can intuitively and vividly understand each technical feature and the whole technical solution of the present invention, but they cannot be understood as the limitation of the protection scope of the present invention.

Referring to fig. 1-4, the embodiment of the utility model provides a probe that flaw detector used, it includes probe shell 1, probe shell 1's upper end fixedly connected with connecting pipe 2, the surface of connecting pipe 2 is provided with connector 4, a plurality of mounting groove 10 has been seted up to the lateral wall of connecting pipe 2, the inside fixedly connected with reset spring 11 of mounting groove 10, reset spring 11's one end fixedly connected with fixed bulge 3, standing groove 12 has been seted up to connector 4's inside, a plurality of fixed slot 13 has been seted up to the lateral wall of standing groove 12, through setting up reset spring 11, fixed bulge 3, fixed slot 13, mounting groove 10, need not to carry out accurate location, make things convenient for the quick installation of probe, the change of the probe of being convenient for simultaneously.

Stationary hump 3 is "hemisphere", stationary hump 3 through the hemisphere, conveniently cooperate with fixed slot 13, realize fixed effect, fixed slot 13 is "hemisphere", through hemispherical fixed slot 13, conveniently cooperate with stationary hump 3, realize fixed effect, stationary hump 3 and fixed slot 13 activity joint, make things convenient for the installation and the dismantlement of probe, the inside of probe shell 1 is provided with sound absorbing material layer 5, damping piece 6, probe wafer 8, protection film 9, probe wafer 8's upper end is connected with connecting wire 7, sound absorbing material layer 5's lower surface is provided with damping piece 6, through setting up sound absorbing material layer 5, absorb the noise that the ultrasonic wave multiple reflection produced, through setting up damping piece 6, be used for supporting probe wafer 8, make the vibration of probe wafer 8 stop as early as possible, damping piece 6's lower surface is provided with probe wafer 8, probe wafer 8's lower surface is provided with protection film 9.

The working principle is as follows: when the probe is installed, the placing groove 12 of the connector 4 is sleeved on the outer surface of the connecting pipe 2 on the probe shell 1 and moves downwards, the connector 4 extrudes the fixing protrusion 3, the fixing protrusion 3 extrudes the reset spring 11, and the reset spring 11 contracts to enable the fixing protrusion 3 to enter the installation groove 10; in use, transverse waves are transmitted and received through the probe wafer 8 to perform flaw detection work.

The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art.

Claims

1. A probe for a flaw detector, comprising: probe shell (1), upper end fixedly connected with connecting pipe (2) of probe shell (1), the surface of connecting pipe (2) is provided with connector (4), a plurality of mounting groove (10) have been seted up to the lateral wall of connecting pipe (2), inside fixedly connected with reset spring (11) of mounting groove (10), the one end fixedly connected with stationary hump (3) of reset spring (11), standing groove (12) have been seted up to the inside of connector (4), a plurality of fixed slot (13) have been seted up to the lateral wall of standing groove (12).

2. The probe for flaw detector according to claim 1, wherein the fixing projection (3) is in the form of a "hemisphere".

3. The probe for flaw detector according to claim 1, wherein the fixing groove (13) is formed in a "hemispherical shape".

4. The probe for flaw detector according to claim 1, wherein the fixing protrusion (3) is movably engaged with the fixing groove (13).

5. The probe for flaw detector according to claim 1, wherein the probe case (1) is provided therein with a sound absorbing material layer (5), a damping block (6), a probe wafer (8), and a protective film (9), and the probe wafer (8) has a connecting wire (7) connected to an upper end thereof.

6. The probe for flaw detector according to claim 5, wherein the lower surface of the sound-absorbing material layer (5) is provided with a damping block (6), the lower surface of the damping block (6) is provided with a probe wafer (8), and the lower surface of the probe wafer (8) is provided with a protective film (9).