CN218724835U - Mica temperature resistant testing arrangement - Google Patents
Mica temperature resistant testing arrangement Download PDFInfo
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- CN218724835U CN218724835U CN202222305230.1U CN202222305230U CN218724835U CN 218724835 U CN218724835 U CN 218724835U CN 202222305230 U CN202222305230 U CN 202222305230U CN 218724835 U CN218724835 U CN 218724835U
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Abstract
The utility model relates to a mica temperature resistant test technical field discloses mica temperature resistant testing arrangement. Mica temperature resistant testing arrangement includes: a support frame; the mica part is horizontally placed on the placing plate, and the placing plate is made of a material with a temperature resistance value of 1200-1300 ℃; the first sensor is arranged on the placing plate and used for detecting the temperature of the placing plate, and the second sensor is placed on the top end face of the mica piece and used for detecting the temperature of the top end face of the mica piece; the controller is in control connection with the heating element and is used for controlling the heating element to heat according to the detection value of the first sensor and for differentiating and judging the temperature values detected by the first sensor and the second sensor. The mica temperature-resistant testing device can systematically test the heat insulation performance of the mica part at high temperature.
Description
Technical Field
The utility model relates to a mica temperature resistant test technical field especially relates to mica temperature resistant testing arrangement.
Background
The mica part has good fire resistance, and can produce better thermal-insulated effect to can be in each product through setting up the conduction of mica part in order to avoid the temperature. The mica is specifically an object made of mica material or a composite of mica material and other materials.
The heat insulation performance of each mica element needs to be specifically tested by a testing device; however, the current testing device can only test the heat insulation performance of the mica part in a low temperature state (0-500 ℃) and cannot systematically test the heat insulation performance of the mica part in a high temperature state.
Therefore, a mica temperature resistance testing device is needed to solve the above problems.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a mica temperature resistant testing arrangement can test the heat insulation performance of mica spare under the high temperature systematically.
To achieve the purpose, the utility model adopts the following technical proposal:
mica temperature resistant testing arrangement for the performance of test mica spare separation temperature conduction includes:
a support frame;
the mica part is horizontally placed on the placing plate, and the placing plate is made of a material with a temperature resistance value of 1200-1300 ℃;
a first sensor disposed on the placing plate for detecting a temperature of the placing plate, and a second sensor disposed on a top end surface of the mica member for detecting a temperature of the top end surface of the mica member;
the controller is in control connection with the heating element and is used for controlling the heating element to heat according to the detection value of the first sensor and differentiating and judging the temperature values detected by the first sensor and the second sensor.
Further, the first sensor and/or the second sensor is a thermocouple temperature sensor.
Further, mica temperature resistant testing arrangement still includes:
the temperature sensing piece, the temperature sensing piece respectively with first sensor with second sensor signal connection, the temperature sensing piece is used for the record and stores first sensor with the temperature value that the second sensor passed to, the temperature sensing piece with controller signal connection.
Further, the first sensor with the second sensor all through the metal connecting wire with the temperature-sensing piece is connected, the metal connecting wire can be crooked, the metal connecting wire is made by high temperature resistant metal.
Further, the placement plate is made of a quenched stainless steel material.
Further, the placing plate is provided with an installation clamping hole, and the first sensor is clamped in the installation clamping hole.
Further, the support frame includes:
a base;
the vertical plate is vertically arranged on the base, the placing plate is arranged on the vertical plate, the placing plate is parallel to the base, and the placing plate can move on the vertical plate along the vertical direction.
Further, one of the vertical plate and the placing plate is provided with a sliding rail, and the other one of the vertical plate and the placing plate is provided with a sliding block, wherein the sliding block can slide on the sliding rail.
Further, the base and the riser are both made of stainless steel.
Further, mica temperature resistant testing arrangement still includes:
the manipulator is in control connection with the controller, and the controller is used for controlling the manipulator to grab the second sensor to the top end face of the mica part.
The utility model has the advantages that:
the mica piece is horizontally placed on the placing plate through arranging the placing plate on the supporting frame, the placing plate is heated to a testing temperature by the heating element, the temperature of the placing plate is detected by the first sensor, the temperature of the top end face of the mica piece is detected by the second sensor, temperature values of two opposite faces of the bottom end face and the top end face of the mica piece can be respectively obtained, the temperature values of the two faces of the bottom end face and the top end face of the mica piece are subjected to difference comparison, the larger the difference is, the better the performance of temperature conduction of the mica piece is blocked is, namely, the temperature is difficult to be conducted to other parts or other positions through the mica piece; wherein the placing plate is made of a material with a temperature resistance value of 1200-1300 ℃ so as to be resistant to high temperature; the controller can control the heating element to heat according to the detection value of the first sensor, so that the heating element can heat the placing plate to any high-temperature test temperature value, and the heat insulation performance of the mica part at any high-temperature test temperature value can be obtained; in this way, the temperature insulation performance of the mica part at high temperature can be systematically tested to obtain the temperature insulation performance of the mica part at different high temperature values.
Drawings
Fig. 1 is a side view of the mica temperature resistance testing device provided by the present invention;
fig. 2 is a top view of the mica temperature-resistant testing device provided by the utility model.
Reference numerals:
10-a support frame; 1-a base; 2-a vertical plate; 3, placing a plate; 4-a first sensor; 5-a second sensor; 6-Yun Mujian; 7-temperature sensing piece; 8-metal connecting lines; 9-a controller.
Detailed Description
In order to make the technical problem solved by the present invention, the technical solution adopted by the present invention and the technical effect achieved by the present invention clearer, the technical solution of the present invention will be further explained by combining the drawings and by means of the specific implementation manner.
In the description of the present invention, unless expressly stated or limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, e.g., as meaning permanently connected, detachably connected, or integral to one another; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or may be connected through the use of two elements or the interaction of two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
In the present disclosure, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact between the first and second features, or may comprise contact between the first and second features not directly. Also, the first feature "on," "above" and "over" the second feature may include the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
In the description of the present embodiment, the terms "upper", "lower", "left", "right", and the like are used based on the orientations and positional relationships shown in the drawings only for convenience of description and simplification of operation, and do not indicate or imply that the structures or elements referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used only for descriptive purposes and are not intended to have a special meaning.
At present, a testing device can only test the heat insulation performance of the mica part in a low-temperature state generally, and cannot systematically test the heat insulation performance of the mica part in a high-temperature state.
Therefore, the embodiment provides a mica temperature resistance testing device, which can comprehensively test the temperature insulation performance of the mica component at low temperature and high temperature for a system so as to obtain the temperature insulation performance of the mica component at different temperature values; the heat insulation performance of the mica part specifically refers to the performance of the mica part in blocking temperature conduction. The mica is specifically an object made of mica material or a composite of mica material and other materials. The mica temperature resistant testing device in the embodiment can also be used for testing the temperature insulation performance of objects made of other high temperature resistant materials.
Specifically, as shown in fig. 1 and 2, the mica temperature resistance testing device comprises a supporting frame 10, a heating element, a placing plate 3, a first sensor 4, a second sensor 5 and a controller 9; the placing plate 3 is arranged on the supporting frame 10, the heating element is connected with the placing plate 3 and used for heating the placing plate 3 to a testing temperature, the mica element 6 is horizontally placed on the placing plate 3, and the placing plate 3 is made of a material with a temperature resistance value of 1200-1300 ℃, namely the placing plate 3 has high temperature resistance; the first sensor 4 is arranged on the placing plate 3, the first sensor 4 is used for detecting the temperature of the placing plate 3, the second sensor 5 is placed on the top end face of the mica piece 6, and the second sensor 5 is used for detecting the temperature of the top end face of the mica piece 6; the controller 9 is in control connection with the heating element, and the controller 9 can control the heating element to heat according to the detection value of the first sensor 4 so as to ensure that the heating element can accurately heat the placing plate 3 to a test temperature value; and the controller 9 can also be used for making a difference between the temperature values detected by the first sensor 4 and the second sensor 5 and judging the difference so as to obtain the specific heat insulation performance of the mica element 6. Wherein, the specific value of the test temperature needs to be determined according to the actual test requirement. The controller 9 in this embodiment is a control structure that is common in the prior art, and therefore, detailed descriptions of the specific structure and the control principle of the controller 9 are omitted here.
Compared with the prior art, the mica temperature-resistant testing device in the embodiment adopts the high-temperature-resistant placing plate 3 to place the mica element 6, and systematically controls the whole testing process through the controller 9; the temperature of the placing plate 3 is detected by the first sensor 4, the temperature of the top end face of the mica element 6 is detected by the second sensor 5, namely, the temperature values of two opposite faces of the bottom end face and the top end face of the mica element 6 can be respectively obtained, the temperature values of the two faces of the bottom end face and the top end face of the mica element 6 are subjected to difference comparison, and the larger the difference value is, the better the performance of the mica element 6 for obstructing temperature conduction is, namely, the temperature is difficult to be conducted to other parts or other positions through the mica element 6; wherein, the placing plate 3 is made of a material with a temperature resistance value of 1200-1300 ℃ so that the placing plate 3 can resist high temperature; the controller 9 can control the heating element to heat according to the detection value of the first sensor 4, so that the heating element can heat the placing plate 3 to any high-temperature test temperature value, and the heat insulation performance of the mica element 6 at any high-temperature test temperature value can be obtained; in this way, the thermal insulation performance of the mica element 6 at high temperature can be systematically tested to obtain the thermal insulation performance of the mica element 6 at different high temperature values.
It should be noted that, since the placing plate 3 is made of a material having a temperature resistance value of 1200-1300 ℃, it indicates that the placing plate 3 can withstand a low-temperature environment of 0-500 ℃, that is, the testing temperature range in this embodiment may be 0-1300 ℃, so that the heating element can heat the placing plate 3 to any low-temperature or high-temperature testing temperature value of 0-1300 ℃, and further can obtain the temperature insulation performance of the mica component 6 at any low-temperature or high-temperature testing temperature value; in this way, the thermal insulation performance of the mica part 6 at various temperatures can be systematically and comprehensively tested, so that the thermal insulation performance of the mica part 6 at different temperature values can be obtained.
In this embodiment, the heating element may be an electric heater. In other embodiments, the heating element may have other heating structures, and the specific structure of the heating element is not limited herein as long as the placing plate 3 can be heated to any temperature value of 0 ℃ to 1300 ℃.
Furthermore, the first sensor 4 and/or the second sensor 5 are thermocouple temperature sensors, and the thermocouple temperature sensors can detect temperature values at high temperature, and have the characteristics of large temperature measurement range, stable performance, simple structure and convenience in use.
Specifically, as shown in fig. 1 and fig. 2, the mica temperature-resistant testing device further includes a temperature sensing element 7, the temperature sensing element 7 is in signal connection with the first sensor 4 and the second sensor 5 respectively, and the temperature sensing element 7 can record and store temperature values transmitted by the first sensor 4 and the second sensor 5; and the temperature sensing piece 7 is in signal connection with the controller 9, so that the controller 9 can acquire each temperature value in the temperature sensing piece 7, the controller 9 can compare the temperature values transmitted by the first sensor 4 and the second sensor 5 in a difference mode, and the blocking temperature conduction performance of the mica piece 6 at each temperature value is obtained according to the difference value. In this embodiment, the temperature sensing component 7 is a temperature structure commonly found in the prior art, and herein, detailed descriptions of the specific structure and the working principle of the temperature sensing component 7 are omitted.
Further, as shown in fig. 1 and 2, the first sensor 4 and the second sensor 5 are both connected with the temperature sensing member 7 through a metal connecting wire 8, so that the detection values of the first sensor 4 and the second sensor 5 can be transmitted to the temperature sensing member 7 through the metal connecting wire 8; and the metal connecting wire 8 can be bent, so that the flexibility of connection between the temperature sensing member 7 and the first sensor 4 and the second sensor 5 is increased, and the connection between the temperature sensing member 7 and the first sensor 4 and the second sensor 5 does not influence the respective normal use performances of the temperature sensing member 7, the first sensor 4 and the second sensor 5.
Specifically, the metal connecting wire 8 is made of a high temperature resistant metal or a high temperature resistant metal alloy, so that the metal connecting wire 8 can be used normally in an environment where the temperature of the placing plate 3 is high. Wherein, the high temperature resistant metal can be tungsten.
Further, the placing plate 3 is made of stainless steel material subjected to quenching processing, so that the placing plate 3 has good high-temperature resistance; and can make place board 3 have better bending resistance, place board 3 promptly and can remain the horizontality throughout, can not take place crooked to can avoid placing mica piece 6 after placing on placing board 3, place board 3 and appear the problem of downwarping, with guarantee that mica piece 6 can be placed on placing board 3 all the time horizontally, and then can guarantee the capability test result to mica piece 6. The shape of the placing plate 3 may be square or circular.
Specifically, a mounting hole is provided in the mounting plate 3, and the first sensor 4 is engaged with the mounting hole to accurately detect the temperature of the mounting plate 3. In other embodiments, other connection methods may be used to dispose the first sensor 4 on the placing plate 3.
Further, as shown in fig. 1, the support frame 10 includes a base 1 and a riser 2; wherein, riser 2 sets up perpendicularly on base 1, places board 3 and sets up on riser 2, and places board 3 and base 1 and be parallel to each other, places board 3 and can move along vertical direction on riser 2. Wherein, riser 2 passes through the bolt fastening setting on base 1.
By moving the placing plate 3 in the vertical direction on the vertical plate 2, on the one hand, the position of the placing plate 3 on the vertical plate 2 can be specifically adjusted according to the weight, placing position and shape of the mica element 6 on the placing plate 3, so that the placing stability of the mica element 6 on the placing plate 3 can be coordinated; on the other hand can move placing plate 3 to suitable height to directly place mica piece 6 on placing plate 3, so that the operation of placing mica piece 6 is comparatively simple and convenient.
Specifically, a slide rail is provided on one of the vertical plate 2 and the placement plate 3, and a slider is provided on the other, the slider being slidable on the slide rail so that the placement plate 3 can move in the vertical direction on the vertical plate 2. The sliding of the sliding block on the sliding rail specifically means that the sliding block can slide on the sliding rail under the pushing action of an external force; when the external pushing action is not available, the sliding block can stop on the sliding rail, so that the placing plate 3 can move on the vertical plate 2 along the vertical direction and can also stop at any position on the vertical plate 2.
Further, base 1 and riser 2 are made by stainless steel to make base 1 and riser 2's support intensity higher, thereby can guarantee to place board 3 and place the support intensity of mica 6 on the board 3 higher.
Specifically, the mica temperature resistant testing device further comprises a manipulator, the manipulator is in control connection with the controller 9, and the controller 9 is used for controlling the manipulator to grab the second sensor 5 to the top end face of the mica piece 6, so that the second sensor 5 can detect the temperature of the top end face of the mica piece 6. In this embodiment, the robot is a six-axis robot having high flexibility. Wherein the second sensor 5 can also be taken manually to place the second sensor 5 on the top end face of the mica piece 6.
The specific test process of the mica temperature resistance test device in the embodiment is as follows:
firstly, fixedly clamping a first sensor 4 in a mounting clamping hole on a placing plate 3, so that the first sensor 4 can detect the temperature of the placing plate 3 in real time; then, the mica member 6 is placed on the placing plate 3, and the controller 9 controls the heating of the heating member according to the detection value of the first sensor 4, so that the heating member heats the placing plate 3 to the preset test temperature; waiting for 3s-5s to stabilize the temperature value of the placing plate 3 at the preset test temperature, namely the temperature value detected by the first sensor 4 is the preset test temperature value; simultaneously, first sensor 4 can be with the temperature value that detects real-time to temperature-sensing piece 7, and temperature-sensing piece 7 carries out the record and the storage with the temperature value that first sensor 4 detected.
Then, the controller 9 controls the operation of the manipulator, so that the manipulator grabs the second sensor 5 and places the second sensor on the top end surface of the mica piece 6, and the second sensor 5 detects the temperature of the top end of the mica piece 6; meanwhile, the second sensor 5 transmits the detected temperature value to the temperature sensing part 7 in real time, and the temperature sensing part 7 records and stores the temperature value detected by the second sensor 5.
Finally, the controller 9 can compare the temperature values detected by the first sensor 4 and the second sensor 5 recorded in the temperature sensing part 7, and the larger the difference value is, the better the performance of the mica part 6 for obstructing temperature conduction is; the steps are repeated, so that the heat insulation performance of the mica part 6 at a plurality of different test temperatures can be obtained.
Through the test process, the heat insulation performance of the mica part 6 at any low temperature or high temperature test temperature value of 0-1300 ℃ can be obtained, namely, the heat insulation performance of the mica part 6 at each temperature can be systematically and comprehensively tested, so that the heat insulation performance of the mica part 6 at different temperature values can be obtained.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention, and it is to be understood that the present invention is not limited to the above embodiments, but may be modified within the scope of the present invention.
Claims (10)
1. Mica temperature resistant testing arrangement for the performance of test mica spare (6) separation temperature conduction, its characterized in that includes:
a support frame (10);
the heating device is arranged on the supporting frame (10), the placing plate (3) is connected with the placing plate (3), the heating device is used for heating the placing plate (3) to a test temperature, the Yun Mujian (6) is horizontally placed on the placing plate (3), and the placing plate (3) is made of a material with a temperature resistance value of 1200-1300 ℃;
a first sensor (4) and a second sensor (5), the first sensor (4) is arranged on the placing plate (3) for detecting the temperature of the placing plate (3), the second sensor (5) is placed on the top end face of the Yun Mujian (6) for detecting the temperature of the top end face of the Yun Mujian (6);
the controller (9) is in control connection with the heating element, and the controller (9) is used for controlling the heating of the heating element according to the detection value of the first sensor (4) and is used for differentiating and judging the temperature values detected by the first sensor (4) and the second sensor (5).
2. The mica temperature resistance test device of claim 1, characterized in that the first sensor (4) and/or the second sensor (5) is a thermocouple temperature sensor.
3. The mica temperature resistance test device of claim 1, further comprising:
temperature-sensing spare (7), temperature-sensing spare (7) respectively with first sensor (4) with second sensor (5) signal connection, temperature-sensing spare (7) are used for the record and store first sensor (4) with the temperature value that second sensor (5) arrived, temperature-sensing spare (7) with controller (9) signal connection.
4. The mica temperature resistance test device according to claim 3, characterized in that the first sensor (4) and the second sensor (5) are connected with the temperature sensing member (7) through metal connecting wires (8), the metal connecting wires (8) can be bent, and the metal connecting wires (8) are made of high temperature resistant metal.
5. The mica temperature resistance test device according to claim 1, characterized in that the placing plate (3) is made of quenched stainless steel material.
6. The mica temperature resistance test device according to claim 1, characterized in that the placing plate (3) is provided with a mounting hole, and the first sensor (4) is clamped in the mounting hole.
7. The mica temperature resistance test device of any one of claims 1-6, wherein the support frame (10) comprises:
a base (1);
the base comprises a vertical plate (2), wherein the vertical plate (2) is vertically arranged on the base (1), a placing plate (3) is arranged on the vertical plate (2), the placing plate (3) is parallel to the base (1), and the placing plate (3) can move on the vertical plate (2) along the vertical direction.
8. The mica temperature resistance test device of claim 7, characterized in that one of the vertical plate (2) and the placing plate (3) is provided with a slide rail, and the other is provided with a slide block which can slide on the slide rail.
9. The mica temperature resistance test device of claim 7, wherein the base (1) and the riser (2) are made of stainless steel.
10. The mica temperature resistance test device of any one of claims 1-6, further comprising:
the manipulator is in control connection with the controller (9), and the controller (9) is used for controlling the manipulator to grab the second sensor (5) to the top end face of the mica part (6).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222305230.1U CN218724835U (en) | 2022-08-31 | 2022-08-31 | Mica temperature resistant testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222305230.1U CN218724835U (en) | 2022-08-31 | 2022-08-31 | Mica temperature resistant testing arrangement |
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| Publication Number | Publication Date |
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| CN218724835U true CN218724835U (en) | 2023-03-24 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202222305230.1U Active CN218724835U (en) | 2022-08-31 | 2022-08-31 | Mica temperature resistant testing arrangement |
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| CN (1) | CN218724835U (en) |
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- 2022-08-31 CN CN202222305230.1U patent/CN218724835U/en active Active
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