CN218647886U

CN218647886U - Testing mechanism of semiconductor testing and braiding all-in-one machine

Info

Publication number: CN218647886U
Application number: CN202223264334.9U
Authority: CN
Inventors: 李凡凡; 随秀丽; 随云鹏
Original assignee: Shenzhen Guandahong Technology Co ltd
Current assignee: Shenzhen Guandahong Technology Co ltd
Priority date: 2022-12-05
Filing date: 2022-12-05
Publication date: 2023-03-17
Anticipated expiration: 2032-12-05

Abstract

The utility model relates to a semiconductor test equipment technical field, concretely relates to accredited testing organization of semiconductor test braid all-in-one, including the accredited testing organization body, set up first movable block and second movable block on accredited testing organization both sides and evenly set up first connecting hole and second connecting hole on first movable block and second movable block respectively, still including installing two sets of deckle boards on first movable block and second movable block top, set up clamping mechanism on two sets of deckle boards and with two sets of drive assembly of two sets of clamping mechanism transmission meshing, can realize pressing from both sides the connecting hole of fixing on semiconductor test braid all-in-one accredited testing organization with connecting wire, avoided connecting wire to receive to drag and lead to the phenomenon that the test of semiconductor test braid all-in-one to the semiconductor to appear interrupting from the downthehole roll-off of connecting, the stability of semiconductor test braid all-in-one, and easy operation, the staff's operation of being convenient for is convenient for.

Description

Testing mechanism of semiconductor testing and braiding all-in-one machine

Technical Field

The utility model relates to a semiconductor test equipment technical field, concretely relates to accredited testing organization of semiconductor test braid all-in-one.

Background

The semiconductor is a material with conductivity between a conductor and an insulator at normal temperature, and the semiconductor is a material with controllable conductivity ranging from the insulator to the conductor. From the viewpoint of scientific and technical and economic development, semiconductors affect people's daily work and life, and this material was not learned until the 30 s in the 20 th century.

Chinese patent net has disclosed a accredited testing organization utility model patent of semiconductor test braid all-in-one in 2022.05.03, and its publication number is CN216435871U, comprising a base plate, the upper surface of bottom plate is provided with adjusting part, adjusting part's inside is provided with first clamping part, the upper surface of bottom plate is provided with fixed subassembly, fixed subassembly's inside is provided with the second clamping part, and first clamping part's position is corresponding with the position of second clamping part.

Although the above patent can make the device fixedly contact the pins of the semiconductors with different sizes when in use by adjusting the positions of the first clamping part and the second clamping part, compared with a conventional testing mechanism, the device can only test the semiconductors with one specification, and different testing bases need to be replaced when testing the semiconductors with multiple specifications, the device is more convenient and fast to use, but when testing the semiconductors by using the semiconductor testing and taping integrated machine, a connecting wire needs to be inserted into a connecting hole on the testing mechanism, but the connecting hole of the testing mechanism in the above patent is not provided with any structure for clamping and fixing the connecting wire, so that when testing the semiconductors by using the semiconductor testing and taping integrated machine, the stability of the connecting wire inserted into the connecting hole is poor, the connecting wire is easy to be pulled out of the connecting hole, and the normal test of the semiconductor by using the semiconductor testing and taping integrated machine is affected.

Therefore, the testing mechanism of the semiconductor testing and braiding all-in-one machine is necessary.

SUMMERY OF THE UTILITY MODEL

Therefore, the utility model provides a testing mechanism of semiconductor test braid all-in-one, can realize through clamping mechanism and drive assembly that the connecting wire presss from both sides tight connecting hole of fixing on semiconductor test braid all-in-one testing mechanism, avoided connecting wire to receive to pull and lead to the phenomenon emergence that semiconductor test braid all-in-one appears the test of interrupt to the semiconductor from the downthehole roll-off of connecting, do not set up any structure of pressing from both sides tight fixed to connecting wire in connecting hole department on solving semiconductor test braid all-in-one testing mechanism, make the connecting wire receive easily to pull and lead to the test of semiconductor test braid all-in-one to the semiconductor to appear the interrupt phenomenon from the connecting hole is gone out, the problem of.

In order to achieve the above object, the present invention provides the following technical solutions: the testing mechanism of the semiconductor testing and braiding all-in-one machine comprises a testing mechanism body, a first moving block, a second moving block, a first connecting hole, a second connecting hole, two groups of frame plates, clamping mechanisms and two groups of driving assemblies, wherein the first moving block and the second moving block are arranged on two sides of the testing mechanism body, the first connecting hole and the second connecting hole are evenly formed in the first moving block and the second moving block respectively, the two groups of frame plates are arranged on the tops of the first moving block and the second moving block, the clamping mechanisms are arranged on the two groups of frame plates, and the two groups of driving assemblies are in transmission engagement with the two groups of clamping mechanisms.

Preferably, the two groups of frame plates are respectively and fixedly installed at the top ends of the first moving block and the second moving block, and four groups of sliding grooves are uniformly and symmetrically arranged on two sides of the two groups of frame plates.

Preferably, clamping mechanism includes two-way lead screw, two-way lead screw symmetry is rotated and is installed in the both sides of deckle board, and is two sets of two-way lead screw transmission cooperation is connected, and is a set of fixed mounting elastic component on the two-way lead screw middle part is provided with a set of elastic component one of two-way lead screw serve fixed mounting have vice bevel gear, two sets of the both ends symmetry threaded connection of two-way lead screw has splint.

Preferably, two sets of two-way lead screw all fixed mounting have the sprocket on keeping away from vice bevel gear, and two sets of the sprocket passes through chain drive cooperation and connects.

Preferably, elastic component includes worker's shape wheel, worker's shape wheel fixed mounting is on a set of two-way lead screw middle part of installing vice bevel gear, sliding sleeve is equipped with the coil spring on the worker's shape wheel, the both ends of coil spring are equallyd divide and are do not fixed the embedding setting in worker's shape wheel and deckle board, the coil spring is in compression state.

Preferably, two ends of the two groups of clamping plates are respectively arranged in the sliding grooves at the corresponding positions in a sliding mode, and the auxiliary bevel gears are in transmission engagement with the driving assemblies at the corresponding positions.

Preferably, drive assembly includes the pivot, the pivot is rotated and is installed in the one corner that the deckle gear is close to the deckle plate, fixed mounting has main bevel gear on the bottom of pivot, main bevel gear and the transmission meshing of deckle gear, the top fixed mounting of pivot has hexagonal piece, and hexagonal piece sets up the top at the deckle plate, be provided with the cross recess on the hexagonal piece.

The utility model has the advantages that: the connecting hole for clamping and fixing the connecting wire on the semiconductor testing braid all-in-one machine testing mechanism can be realized through the clamping mechanism and the driving assembly, the phenomenon that the connecting wire is dragged to slide out from the connecting hole to cause the semiconductor testing braid all-in-one machine to interrupt the test of a semiconductor is avoided, the stability of the semiconductor testing braid all-in-one machine on the semiconductor test is ensured, the operation is simple, the operation is convenient for workers, and the practicability is high.

Drawings

Fig. 1 is a top view of a testing mechanism provided by the present invention;

fig. 2 is a connection structure diagram of the frame plate, the clamping mechanism and the driving assembly provided by the present invention;

FIG. 3 is an enlarged view of the area A in FIG. 1 according to the present invention;

fig. 4 is a perspective view of the hexagonal block provided by the present invention.

In the figure: 1-testing mechanism body, 2-first moving block, 3-second moving block, 4-first connecting hole, 5-second connecting hole, 6-frame plate, 7-clamping plate, 8-sliding groove, 9-chain wheel, 10-chain, 11-coil spring, 12-I-shaped wheel, 13-auxiliary bevel gear, 14-main bevel gear, 15-rotating shaft, 16-hexagonal block, 17-cross groove and 18-bidirectional screw rod.

Detailed Description

The preferred embodiments of the present invention will be described in conjunction with the accompanying drawings, and it will be understood that they are presented herein only to illustrate and explain the present invention, and not to limit the present invention.

Referring to the accompanying drawings 1-4, the utility model provides a testing mechanism of semiconductor test braid all-in-one, including testing mechanism body 1, set up first movable block 2 and second movable block 3 on the testing mechanism both sides and evenly set up first connecting hole 4 and second connecting hole 5 on first movable block 2 and second movable block 3 respectively, still including installing two sets of deckle boards 6 on first movable block 2 and second movable block 3 top, set up clamping mechanism on two sets of deckle boards 6 and with two sets of clamping mechanism transmission meshing's two sets of drive assembly.

Two sets of deckle boards 6 are fixed mounting respectively on first movable block 2 and second movable block 3 top, and the both sides of two sets of deckle boards 6 all evenly are provided with four groups of spouts 8 of symmetry.

The clamping mechanism comprises two-way screw rods 18, the two-way screw rods 18 are symmetrically and rotatably arranged in two sides of a frame plate 6, two groups of two-way screw rods 18 are in transmission fit connection, an elastic component is fixedly arranged in the middle of one group of two-way screw rods 18, an auxiliary bevel gear 13 is fixedly arranged at one end of the group of two-way screw rods 18 provided with the elastic component, clamping plates 7 are symmetrically and threadedly connected at two ends of the two groups of two-way screw rods 18, the two groups of clamping plates 7 can move in the horizontal direction by virtue of the rotation of the two groups of two-way screw rods 18 and the threaded connection of the two groups of clamping plates 7, the moving directions are opposite, so that connecting wires are clamped and fixed at a connecting hole through the two groups of clamping plates 7, chain wheels 9 are fixedly arranged at one ends of the two groups of two-way screw rods 18 far away from the auxiliary bevel gear 13, the two groups of chain wheels 9 are in transmission fit connection through chains 10, and can realize the synchronous rotation of the two groups of two-way screw rods 18, and the rotation directions are opposite, the elastic component comprises an I-shaped wheel 12, the I-shaped wheel 12 is fixedly arranged on the middle part of a group of bidirectional screw rods 18 provided with secondary bevel gears 13, a coil spring 11 is sleeved on the I-shaped wheel 12 in a sliding manner, the arranged coil spring 11 is used for driving the two groups of bidirectional screw rods 18 to reversely rotate and reset, so that the two groups of bidirectional screw rods 18 have better stability under the condition of no manual operation, namely, the two groups of clamping plates 7 have better stability for fixing connecting wire clamps, the two ends of the coil spring 11 are uniformly and respectively fixedly embedded in the I-shaped wheel 12 and the frame plate 6, the coil spring 11 is in a compression state, the two ends of the two groups of clamping plates 7 are uniformly and respectively arranged in the sliding grooves 8 at the corresponding positions in a sliding manner, the secondary bevel gears 13 are in transmission engagement with the driving components at the corresponding positions, the secondary bevel gears 13 are driven to rotate by the driving components, and the two groups of bidirectional screw rods 18 are rotated.

The drive assembly comprises a rotating shaft 15, the rotating shaft 15 is rotatably installed in one corner of the frame plate 6 close to the auxiliary bevel gear 13, a main bevel gear 14 is fixedly installed at the bottom end of the rotating shaft 15, the main bevel gear 14 rotates to drive the auxiliary bevel gear 13 to rotate, the main bevel gear 14 is in transmission engagement with the auxiliary bevel gear 13, a hexagonal block 16 is fixedly installed at the top end of the rotating shaft 15, the hexagonal block 16 is arranged above the frame plate 6, the set hexagonal block 16 is convenient for a worker to rotate the hexagonal block 16 through a wrench to realize rotation of the rotating shaft 15 and the main bevel gear 14, a cross groove 17 is formed in the hexagonal block 16, and the set cross groove 17 is convenient for the worker to rotate the hexagonal block 16 through a screwdriver to realize rotation of the rotating shaft 15 and the main bevel gear 14.

The utility model discloses a use as follows: when testing semiconductor, the pins on the semiconductor are clamped and fixed by the testing mechanism body 1, and the specific operation can refer to the utility model patent of the testing mechanism of the semiconductor testing and taping integrated machine disclosed in the Chinese patent network on 2022.05.03, the disclosure number is CN216435871U, then a worker rotates the hexagonal block 16 by a wrench or inserts the hexagonal block 16 into the cross slot 17 by a screwdriver to rotate the hexagonal block 16, the hexagonal block 16 rotates the technical drop rotating shaft 15 and the main bevel gear 14, the main bevel gear 14 rotates to drive the auxiliary bevel gear 13 to rotate, the auxiliary bevel gear 13 rotates to enable the bidirectional screw rod 18 provided with the auxiliary bevel gear 13 to rotate, because the chain wheels 9 are fixedly arranged on the two groups of bidirectional screw rods 18, the two groups of chain wheels 9 are in transmission fit connection through the chains 10, that is, two sets of bidirectional screw rods 18 rotate synchronously and in opposite directions, and the i-shaped wheel 12 rotates along with the rotation of the bidirectional screw rods 18, two sets of clamping plates 7 slide to the side far away from the center of the frame plate 6, and the coil spring 11 is further compressed, then the connecting wire is inserted into the first connecting hole 4 or the second connecting hole 5 at the corresponding position, then the hexagonal block 16 is loosened, the working force of the coil spring 11 drives the H-shaped wheel 12 to rotate reversely and reset, namely, the two groups of bidirectional screw rods 18 are reversely rotated and reset, namely, the two groups of clamping plates 7 are moved to one side close to the center of the frame plate 6, the connecting lead can be clamped and fixed by the two groups of clamping plates 7, thereby avoiding the phenomenon that the semiconductor testing braid all-in-one machine is interrupted in the semiconductor testing caused by the fact that the connecting lead slides out of the connecting hole due to pulling, the stability of inserting the connecting wire into the connecting hole is better, the stability of the semiconductor testing and taping all-in-one machine for testing the semiconductor is ensured, the operation is simple, and the operation by workers is convenient.

The above description is only a preferred embodiment of the present invention, and any person skilled in the art may modify the present invention or modify it into an equivalent technical solution by using the technical solutions described above. Therefore, any simple modifications or equivalent replacements made according to the technical solution of the present invention belong to the scope of the claimed invention as far as possible.

Claims

1. Testing mechanism of semiconductor test braid all-in-one, including accredited testing organization body (1), first movable block (2) and second movable block (3) of setting on accredited testing organization both sides and respectively evenly set up first connecting hole (4) and second connecting hole (5) on first movable block (2) and second movable block (3), its characterized in that: the device is characterized by further comprising two groups of frame plates (6) arranged on the tops of the first moving block (2) and the second moving block (3), clamping mechanisms arranged on the two groups of frame plates (6) and two groups of driving components in transmission engagement with the two groups of clamping mechanisms.

2. The testing mechanism of the semiconductor testing and taping all-in-one machine of claim 1, wherein: the two groups of frame plates (6) are respectively and fixedly arranged at the top ends of the first moving block (2) and the second moving block (3), and four groups of sliding grooves (8) are uniformly and symmetrically arranged on two sides of the two groups of frame plates (6).

3. The testing mechanism of the semiconductor testing and taping all-in-one machine of claim 2, wherein: clamping mechanism includes two-way lead screw (18), two-way lead screw (18) symmetry is rotated and is installed in the both sides of framed bent (6), and is two sets of two-way lead screw (18) transmission fit connects, and is a set of fixed mounting elastic component on two-way lead screw (18) middle part is provided with a set of elastic component one of two-way lead screw (18) serve fixed mounting have vice bevel gear (13), two sets of the both ends symmetry threaded connection of two-way lead screw (18) has splint (7).

4. The testing mechanism of the semiconductor testing and taping all-in-one machine of claim 3, wherein: two sets of two-way lead screw (18) are kept away from one end of vice bevel gear (13) and are all fixed mounting have sprocket (9), and two sets of sprocket (9) are through chain (10) transmission cooperation connection.

5. The testing mechanism of the semiconductor testing and taping all-in-one machine of claim 3, wherein: elastic component is including worker shape wheel (12), worker shape wheel (12) fixed mounting is on a set of two-way lead screw (18) middle part of installing vice bevel gear (13), sliding sleeve is equipped with wind spring (11) on worker shape wheel (12), the both ends of wind spring (11) are equallyd divide and are do not fixed the embedding setting in worker shape wheel (12) and frame plate (6), wind spring (11) are in compression state.

6. The testing mechanism of the semiconductor testing and taping all-in-one machine of claim 3, wherein: two ends of the two groups of clamping plates (7) are respectively arranged in the sliding grooves (8) at the corresponding positions in a sliding mode, and the auxiliary bevel gears (13) are in transmission engagement with the driving assemblies at the corresponding positions.

7. The testing mechanism of the semiconductor testing and taping all-in-one machine of claim 6, wherein: drive assembly includes pivot (15), pivot (15) rotate and install in the one corner that declivity bevel gear (13) is close to declivity bevel gear (6), fixed mounting has main bevel gear (14) on the bottom of pivot (15), main bevel gear (14) and declivity bevel gear (13) transmission meshing, the top fixed mounting of pivot (15) has hexagonal piece (16), and hexagonal piece (16) set up the top in declivity bevel gear (6), be provided with cross recess (17) on hexagonal piece (16).