CN218630080U - Case and test equipment - Google Patents
Case and test equipment Download PDFInfo
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- CN218630080U CN218630080U CN202222505681.XU CN202222505681U CN218630080U CN 218630080 U CN218630080 U CN 218630080U CN 202222505681 U CN202222505681 U CN 202222505681U CN 218630080 U CN218630080 U CN 218630080U
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- circuit board
- support
- top cover
- chassis
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- 238000012360 testing method Methods 0.000 title claims abstract description 99
- 230000009471 action Effects 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 12
- 230000017525 heat dissipation Effects 0.000 description 6
- 238000009434 installation Methods 0.000 description 5
- 238000009423 ventilation Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 230000005484 gravity Effects 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
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Abstract
The utility model provides a quick-witted case and test equipment arranges the inside of quick-witted case in with test circuit board, avoids test circuit board to expose, plays the guard action to test circuit board, guarantees holistic electromagnetic shield and electromagnetic compatibility performance simultaneously, the good reliability.
Description
Technical Field
The utility model relates to a hardware equipment technical field especially relates to a machine case and test equipment.
Background
The structure of the chassis for the related test equipment causes the test circuit board to be exposed outside the chassis, and has the problems of easy damage of the test circuit board, poor electromagnetic shielding effect and the like.
SUMMERY OF THE UTILITY MODEL
In view of the above, an object of the present invention is to provide a chassis and a testing apparatus, so as to solve the above problems.
Based on the above-mentioned purpose, the utility model provides a machine case, include:
the first surface of the shell is provided with an opening; and
a top cover for covering the first face of the housing, wherein,
the shell is used for accommodating a test circuit board, the test circuit board comprises at least one test interface, and the test interface is used for connecting a daughter card to be tested;
the top cover is provided with a first opening matched with the test interface; when the top cover covers the shell, the test interface passes through the first opening and is exposed outside the shell; and the top cover is provided with a daughter card support for fixedly connecting to a daughter card to be tested on the test interface.
From the above, can see, the utility model provides a quick-witted case and test equipment arranges test circuit board in the inside of quick-witted case, avoids test circuit board to expose, plays the guard action to test circuit board, guarantees holistic electromagnetic shield and electromagnetic compatibility performance simultaneously, the good reliability.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention or the related art, the drawings required to be used in the description of the embodiments or the related art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a chassis according to an embodiment of the present invention.
Fig. 2 is an exploded schematic view of the chassis according to the embodiment of the present invention.
Fig. 3 is a schematic diagram of the chassis according to an embodiment of the present invention connected to a daughter card to be tested.
Fig. 4 is a schematic structural view of the housing and the top cover according to the embodiment of the present invention.
Fig. 5 is a schematic structural diagram of a top cover with a test circuit board installed thereon according to an embodiment of the present invention.
Fig. 6 is a schematic diagram illustrating a chassis according to an embodiment of the present invention connected to another daughter card to be tested.
Fig. 7 is a schematic structural diagram of a daughter card support according to an embodiment of the present invention.
Wherein the reference numerals include: the device comprises a shell 1, a top cover 2, a daughter card support 3, a test circuit board 4, a vent hole 5, a fan 6, a daughter card to be tested 7, a second opening 1-1, a shell clamping groove 1-2, a first opening 2-1, a top cover buckle 2-2, a positioning pin 2-3, a fixing support 3-1, an adjustable support 3-2, a waist-shaped hole 3-3, a fixing hole 3-4, a test interface 4-1 and a connecting interface 4-2.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in detail with reference to the accompanying drawings.
It should be noted that unless otherwise defined, technical or scientific terms used in the embodiments of the present invention should have the ordinary meaning as understood by those having ordinary skill in the art to which the present disclosure belongs. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
The daughter card is a computer expansion component, can add functions to a computer, and is widely applied to the computer, for example, common independent display cards, network cards and the like all belong to the daughter card.
During the manufacture of the daughter cards, the daughter cards need to be tested before they are shipped from the factory to determine whether they meet factory standards. When testing the daughter card, the daughter card needs to be connected to a test apparatus having a test circuit board to test an electrical signal of the daughter card.
In the related art, the top of the test circuit board needs to be welded with various test connectors, and the top cover of the case is used as a back support structure of the test circuit board to ensure the strength of the test circuit board when the daughter card is pulled out, so that the test circuit board is arranged outside the case in an exposed manner, but the test circuit board exposed outside the case is easily damaged biologically. In addition, the test circuit board exposed outside does not have the electromagnetic shielding function, the electromagnetic compatibility is poor, and the reliability of the test equipment is reduced.
Based on foretell expose in the outside problem that the physics damaged and do not have electromagnetic shield function of easily sending out of quick-witted case's test circuit board, the utility model provides a machine case and test equipment.
The embodiment of the utility model provides a quick-witted case and test equipment can arrange test circuit board in the inside of quick-witted case, avoids test circuit board to expose, plays the guard action to test circuit board, guarantees holistic electromagnetic shield and electromagnetic compatibility performance simultaneously, the good reliability.
Fig. 1 to fig. 3 respectively show a schematic structural diagram and an explosion diagram of a chassis provided by an embodiment of the present invention, and a schematic diagram of the chassis connecting a daughter card 7 to be tested.
As shown in fig. 1, an embodiment of the present invention provides a chassis, which includes a housing 1 and a top cover 2. As shown in fig. 2, the first surface of the housing 1 is open, and the top cover 2 may be used to cover the first surface of the housing 1 and may correspondingly cover the opening of the first surface. In fig. 2, the first side is the top side. In some embodiments, the opening of the housing 1 may further comprise another face adjacent to the first face.
As shown in fig. 2, the housing 1 may be used to accommodate a test circuit board 4, the test circuit board 4 includes at least one test interface 4-1, and the test interface 4-1 may be used to connect a daughter card 7 to be tested (see fig. 3), so that the test circuit board 4 may be used to test the daughter card 7 to be tested.
As shown in FIG. 2, the top cover 2 may be provided with a first opening 2-1 that mates with the test interface 4-1; when the top cover 2 is covered on the housing 1, the test interface 4-1 may pass through the first opening 2-1 and be exposed outside the housing 1. A daughter card support 3 may be provided on the top cover 2 for securing a daughter card 7 to be tested (shown with reference to fig. 3) connected to the test interface 4-1.
Therefore, the test circuit board 4 is arranged inside the shell 1, and the test interface 4-1 is exposed outside, on one hand, the top cover 2 and the shell 1 jointly form a shell capable of protecting the test circuit board 4, so that the test circuit board 4 is protected, on the other hand, the electric connection between the test circuit board 4 and the daughter card 7 to be tested is not influenced, and the test is convenient. In some embodiments, the materials of the top cover 2 and the housing 1 may be metal materials, so that the chassis has good electromagnetic shielding performance.
As an alternative embodiment, as shown in FIG. 2, the test circuit board 4 may further include at least one connection interface 4-2, the connection interface 4-2 being used for connecting a test instrument (e.g., an oscillograph).
The housing 1 is provided with a second opening 1-1 matching the connection interface 4-2, through which second opening 1-1 the connection interface 4-2 can pass and be exposed outside the housing 1.
During testing, the daughter card 7 to be tested is connected with the test circuit board 4 through the test interface 4-1, the test circuit board 4 is connected with the test instrument through the connection interface 4-2, and the test instrument receives the electric signal output by the test circuit board 4 and analyzes the electric signal to obtain the test result of the daughter card 7 to be tested.
Fig. 4 shows a schematic structural diagram of the housing 1 and the top cover 2 according to the embodiment of the present invention.
As shown in fig. 4, in some embodiments, the opposite side of the second opening 1-1 of the housing 1 may also be open, and the top cover 2 may also cover the opposite side of the second opening 1-1. Optionally, a top cover buckle 2-2 may be arranged on the top cover 2, a housing clamping groove 1-2 is arranged on the housing 1, the top cover buckle 2-2 and the housing clamping groove 1-2 may be installed in a matching manner, after the top cover buckle 2-2 is placed into the housing clamping groove 1-2 from above, the top cover 2 is slid along the housing clamping groove 1-2 to form a clamping connection between the top cover buckle 2-2 and the housing clamping groove 1-2, so as to complete the installation, and after the installation is completed, the top cover 2 may completely cover the first surface of the housing 1.
Like this, realize the cooperation installation of top cap 2 and casing 1 through the joint, can realize casing 1 and top cap 2 can dismantle and be connected easy to assemble and dismantlement. In some embodiments, the top cover 2 and the housing 1 can be fixed by screws after the installation, so as to form a stable connection.
Fig. 5 shows a schematic structural diagram of the top cover 2 with the test circuit board 4 installed therein according to the embodiment of the present invention.
As shown in fig. 5, the test circuit board 4 may be mounted on the top cover 2 in advance, and then the top cover 2 is mounted with the housing 1. In some embodiments, alignment pins 2-3 may be provided on top cover 2 so that alignment pins 2-3 may be used to position test circuit board 4 on top cover 2 and to secure test circuit board 4 to top cover 2 by screws. When the top cover 2 mounted with the test circuit board 4 is installed in the housing 1, the test interface 4-1 passes through the first opening 2-1 from the side of the top cover 2 facing the housing 1 and is exposed out of the housing 1; then, the top cover buckle 2-2 is placed into the shell clamping groove 1-2, the top cover 2 slides along the shell clamping groove 1-2, the connecting interface 4-2 penetrates through the second opening 1-1, and the top cover 2 completely covers the first surface of the shell 1 to finish installation.
Fig. 6 is a schematic diagram illustrating the chassis according to the embodiment of the present invention connected to another daughter card to be tested 7.
As shown in fig. 3 and 6, different daughter cards may have different height specifications, such as a half-height specification or a full-height specification, the daughter card 7 to be tested in fig. 3 being a full-height specification daughter card, and the daughter card 7 to be tested in fig. 6 being a half-height specification daughter card. Therefore, in order to stabilize and fix the daughter card with different height specifications, the embodiment of the present invention can further set the daughter card support 3 to have a height adjusting function.
Fig. 7 shows a schematic structural diagram of the daughter card holder 3 according to an embodiment of the present invention.
As an alternative embodiment, the daughter card support 3 may further include a fixed support 3-1, a height adjustment assembly, and an adjustable support 3-2, as shown in fig. 7.
Referring to fig. 1, a fixed bracket 3-1 may be provided on a top cover 2, an adjustable bracket 3-2 may be fixed on the fixed bracket 3-1 by a height adjusting assembly, and the adjustable bracket 3-2 may adjust a height with respect to the top cover 2 by the height adjusting assembly. Optionally, as shown in fig. 3, a fixing hole 3-4 may be formed in the top of the adjustable bracket 3-2, and one side of the to-be-tested daughter card 7 away from the test interface 4-1 may be fixed at the fixing hole 3-4 by a bolt, so as to prevent the to-be-tested daughter card from shaking or even falling off during the test process, which may affect the test result.
As an alternative embodiment, as shown in FIG. 7, the height adjusting assembly may include a waist-shaped hole 3-3 opened on the adjustable bracket 3-2 and a fixing member provided on the fixing bracket 3-1.
The fixing piece can penetrate through the waist-shaped hole 3-3 to fix the fixing support 3-1 and the adjustable support 3-2, so that the height of the adjustable support 3-2 is different according to different fixing devices of the fixing piece and the waist-shaped hole 3-3.
Therefore, the relative position between the fixed support 3-1 and the adjustable support 3-2 is limited through the fastening effect of the fixing piece, and the adjustable support 3-2 is ensured not to generate displacement due to self gravity and gravity of the daughter card 7 to be tested, so that the fixing effect of the daughter card 7 to be tested is not influenced.
Optionally, the fixing part may be a bolt-nut structure, the height of the adjustable support 3-2 is adjusted according to the height of the connected daughter card 7 to be tested, so that the adjustable support 3-2 abuts against the fixing part of the daughter card 7 to be tested, then the fixing support 3-1 and the adjustable support 3-2 are fixed, and then the daughter card 7 to be tested is fixed on the adjustable support 3-2, thereby realizing the stable fixation of the daughter card 7 to be tested.
As another alternative, the height adjusting assembly may also include a sliding groove formed on the fixed bracket 3-1 and a sliding block formed on the adjustable bracket 3-2.
Thus, the sliding block is matched with the sliding groove to form sliding connection between the fixed bracket 3-1 and the adjustable bracket 3-2.
Optionally, the height adjustment assembly may further comprise a clamping means for securing the fixed bracket 3-1 or releasing the adjustable bracket 3-2. Clamping device can be spring clamping device, also can be buckle clamping device, to clamping device's type, the embodiment of the utility model provides a do not do the injecion.
When the daughter card 7 to be tested is fixed, the height of the adjustable support 3-2 is adjusted according to the height sliding block of the connected daughter card 7 to be tested, so that the adjustable support 3-2 abuts against the fixed part of the daughter card 7 to be tested, then the fixed support 3-1 and the adjustable support 3-2 are clamped through the clamping device, and the daughter card 7 to be tested is fixed on the adjustable support 3-2, so that the daughter card 7 to be tested is stably fixed.
As another alternative, the height adjustment assembly may also include a sleeve that mates with the fixed bracket 3-1.
Thus, the sleeve is fixedly connected with the adjustable support 3-2 and sleeved on the periphery of the fixed support 3-1 to form sliding connection between the fixed support 3-1 and the adjustable support 3-2.
Optionally, the height adjustment assembly may further comprise a clamping means for securing the fixed bracket 3-1 or releasing the adjustable bracket 3-2. Clamping device can be spring clamping device, also can be buckle clamping device, to clamping device's type, the embodiment of the utility model provides a do not do the restriction.
When the sub card 7 to be tested is fixed, the adjustable support 3-2 is slid according to the height of the connected sub card 7 to be tested, the height of the adjustable support 3-2 is adjusted, the adjustable support 3-2 is abutted to the fixed portion of the sub card 7 to be tested, then the fixed support 3-1 and the adjustable support 3-2 are clamped through the clamping device, and then the sub card 7 to be tested is fixed on the adjustable support 3-2, so that the sub card 7 to be tested is stably fixed.
As an alternative embodiment, as shown in fig. 2, the housing 1 may be provided with at least one ventilation hole 5.
Therefore, the heat dissipation performance of the chassis is improved by arranging the vent holes 5, and the test circuit board 4 is prevented from being overheated during working to influence the test.
Optionally, the housing 1 may further include a third surface and a fourth surface connected to the first surface, the third surface and the fourth surface are disposed opposite to each other, and the third surface and the fourth surface may be respectively provided with at least one ventilation hole 5.
Like this, set up ventilation hole 5 on third face and fourth face can provide bigger amount of wind, carries out more effective heat dissipation.
As another alternative, as shown in fig. 2, the chassis may further include a fan 6, and the fan 6 is fixed inside the housing 1.
In this way, the fan 6 is arranged to perform forced ventilation and heat dissipation on the test circuit board 4, and the heat dissipation efficiency is improved.
Alternatively, the fan 6 may be located at the ventilation hole 5, and both together perform heat dissipation, further improving heat dissipation efficiency.
Based on the same concept, corresponding to any embodiment, the utility model also provides a test device, which comprises the case in any embodiment and a test circuit board 4; the test circuit board 4 is arranged inside the chassis and is used for connecting the daughter card 7 to be tested.
Optionally, the test circuit board 4 may set the type of the test interface 4-1 according to an interface of the daughter card to be tested, for example, a PCIe interface, an m.2 interface, a SATA interface; the interface type on the same test circuit board 4 can be the same also can be different, to the interface type on the test circuit board 4, the embodiment of the utility model provides a do not limit.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, is limited to these examples; within the idea of the invention, also technical features in the above embodiments or in different embodiments can be combined, steps can be implemented in any order, and there are many other variations of the different aspects of the invention as described above, which are not provided in detail for the sake of brevity.
The present embodiments are intended to embrace all such alternatives, modifications and variances which fall within the broad scope of the appended claims. Therefore, any omission, modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included within the protection scope of the present invention.
Claims (10)
1. A chassis, comprising:
a housing, a first side of the housing being open; and
a top cover for covering the first face of the housing, wherein,
the shell is used for accommodating a test circuit board, the test circuit board comprises at least one test interface, and the test interface is used for connecting a daughter card to be tested;
the top cover is provided with a first opening matched with the test interface; when the top cover covers the shell, the test interface penetrates through the first opening and is exposed outside the shell; and the top cover is provided with a daughter card support which is used for fixedly connecting the daughter card to be tested on the test interface.
2. A cabinet according to claim 1,
the test circuit board further comprises at least one connecting interface, and the connecting interface is used for connecting a test instrument;
the shell is provided with a second opening matched with the connecting interface, and the connecting interface penetrates through the second opening and is exposed outside the shell.
3. A chassis according to claim 1, wherein the daughter card support includes a fixed support, a height adjustment assembly and an adjustable support;
the fixed support is arranged on the top cover, and the adjustable support is fixed on the fixed support through the height adjusting assembly and can adjust the height relative to the top cover.
4. The chassis of claim 3, wherein the height adjustment assembly comprises a slotted hole formed in the adjustable bracket and a fixing member disposed on the fixing bracket;
the fixing piece penetrates through the waist-shaped hole to fix the fixing support and the adjustable support, and the height of the adjustable support is different according to different fixing positions of the fixing piece and the waist-shaped hole.
5. The chassis of claim 3, wherein the height adjustment assembly includes a slide slot disposed on the fixed bracket and a slide block disposed on the adjustable bracket;
the sliding block is matched with the sliding groove to form sliding connection between the fixed support and the adjustable support.
6. The chassis of claim 3, wherein the height adjustment assembly includes a sleeve that mates with the fixed bracket;
the sleeve is fixedly connected with the adjustable support, and is sleeved on the periphery of the fixed support to form sliding connection between the fixed support and the adjustable support.
7. A cabinet according to claim 5 or 6, further comprising clamping means for securing the fixed bracket or releasing the adjustable bracket.
8. The chassis of claim 1, wherein the housing further comprises a third surface and a fourth surface connected to the first surface, the third surface and the fourth surface being disposed opposite to each other, and at least one vent hole being formed on each of the third surface and the fourth surface.
9. The chassis of claim 8, further comprising a fan secured within the housing at the vent.
10. A test apparatus, comprising:
the chassis of any of claims 1-9;
testing the circuit board; the test circuit board is arranged in the case and is used for connecting a daughter card to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222505681.XU CN218630080U (en) | 2022-09-21 | 2022-09-21 | Case and test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222505681.XU CN218630080U (en) | 2022-09-21 | 2022-09-21 | Case and test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218630080U true CN218630080U (en) | 2023-03-14 |
Family
ID=85465980
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222505681.XU Active CN218630080U (en) | 2022-09-21 | 2022-09-21 | Case and test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218630080U (en) |
-
2022
- 2022-09-21 CN CN202222505681.XU patent/CN218630080U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20231128 Address after: 201306 building C, No. 888, Huanhu West 2nd Road, Lingang New District, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai Patentee after: Xinhuazhang Intelligent Technology (Shanghai) Co.,Ltd. Address before: 18th floor, building 01, Huachuang Road, Jiangbei new district, Nanjing, Jiangsu Province Patentee before: Xinhuazhang Technology Co.,Ltd. |